Memory grain test fixture and memory grain test apparatus

Abstract

The utility model discloses a kind of memory grain test fixture and memory grain testing equipment, it is related to memory grain test technical field, and wherein, memory grain test fixture includes pedestal and compression unit, compression unit includes mounting bracket and briquetting component, mounting bracket is rotatably connected to pedestal, to make compression unit can be rotated and switched between opening position and closing position, briquetting component includes mounting seat and multiple briquetting of being located at mounting seat, mounting seat can be moved along first direction relative to mounting bracket, to make briquetting exert pressure to memory grain on mainboard.The technical scheme provided by the utility model can improve the use convenience of memory grain test fixture.

Description

Technical Field

[0001] This utility model relates to the field of memory chip testing technology, and in particular to a memory chip testing fixture and a memory chip testing device. Background Technology

[0002] In related technologies, the clamping block assembly of a memory chip testing fixture typically includes a mounting bracket and clamping blocks mounted on the mounting bracket. The mounting bracket is rotatably mounted on the main body of the testing fixture. Because the clamping block assembly requires a certain amount of rotation space, typically only one row of clamping blocks is arranged along the axis of rotation to avoid severe interference between the clamping blocks and the memory chips during rotation. It can be understood that if multiple rows of clamping blocks are arranged on the mounting bracket, the row of clamping blocks furthest from the axis of rotation will not contact the memory chip, while the row of clamping blocks closest to the axis of rotation will already be severely interfering with their corresponding memory chips. When testing a dozen or even dozens of memory chips simultaneously, multiple mounting bracket flipping operations are required, resulting in cumbersome and time-consuming operations.

[0003] To address the aforementioned issues, an alternative installation method has emerged: the mounting bracket is detachably mounted to the main body of the test fixture using screws. This prevents severe interference between the mounting brackets and memory chips, thus avoiding damage to the memory chips, even with multiple rows of pressure blocks on the mounting bracket. However, disassembling and assembling the pressure block assembly requires tools to remove and install multiple screws, making the operation cumbersome and time-consuming. Utility Model Content

[0004] The main purpose of this utility model is to provide a memory chip testing fixture and a memory chip testing device, which aims to improve the ease of use of the memory chip testing fixture.

[0005] To achieve the above objectives, the present invention provides a memory chip testing fixture, comprising: base; and The pressing unit includes a mounting bracket and a pressing block assembly. The mounting bracket is rotatably connected to the base so that the pressing unit can rotate between an open position and a closed position. The pressing block assembly includes a mounting base and a plurality of pressing blocks disposed on the mounting base. The mounting base is movable relative to the mounting bracket in a first direction so that the pressing blocks apply pressure to the memory chips on the motherboard.

[0006] In one embodiment, the mounting bracket has opposing first and second sides, the first side being rotatably connected to the base, and the pressing unit further includes a locking member rotatably disposed on the second side. The locking member includes a locking portion and an operating portion connected to each other. The locking portion can engage with the base to constrain the pressing unit in the closed position, and the operating portion is used for push-pull operation.

[0007] In one embodiment, the engaging member further includes a rotating portion connected between the engaging portion and the operating portion, the rotating portion being rotatably connected to the mounting bracket; the pressing unit further includes a first elastic member connected between the rotating portion and the mounting bracket, and used to give the engaging member a tendency to rotate toward a locked position; the memory chip testing fixture further includes a second elastic member connected between the pressing unit and the base, so as to give the pressing unit a tendency to rotate toward the open position.

[0008] In one embodiment, there are two of each of the snap-fit ​​portion, the rotating portion, and the first elastic member, and the first elastic member and the rotating portion are arranged in a one-to-one correspondence. The two rotating portions are respectively arranged at opposite ends of the second side. The operating portion is configured as an operating rod spaced above the mounting bracket, and the operating rod is connected between the two rotating portions.

[0009] In one embodiment, the first elastic element is configured as a compression spring, the rotating part is provided with a first blind hole, the mounting bracket is provided with a second blind hole, one end of the first elastic element is inserted into the first blind hole, and the other end of the first elastic element is inserted into the second blind hole.

[0010] In one embodiment, the base is provided with a snap-fit ​​protrusion, and the memory chip testing fixture further includes a locking member movably disposed on the base. When the snap-fit ​​part is snapped into the snap-fit ​​protrusion, the locking member can abut against the side of the snap-fit ​​member opposite to the snap-fit ​​protrusion to restrict the snap-fit ​​member from disengaging from the locking position.

[0011] In one embodiment, the second elastic element is configured as a pneumatic spring, with one end of the second elastic element rotatably connected to the side of the mounting bracket and the other end of the second elastic element rotatably connected to the base.

[0012] In one embodiment, two second elastic elements are provided, and the two second elastic elements are respectively disposed on opposite sides of the mounting bracket.

[0013] In one embodiment, the pressure block assembly further includes a third elastic element. The pressure block is movably mounted on the mounting base. The pressure block has a pressing portion that protrudes from the bottom surface of the mounting base. The third elastic element connects the pressure block and the mounting base and is used to give the pressing portion a tendency to move along the first direction.

[0014] In one embodiment, the mounting base is provided with a mounting through hole, the mounting through hole including a first hole segment and a second hole segment that are sequentially distributed and connected along the first direction, the pressure block is also provided with a mounting part, the mounting part is connected to the upper side of the pressing part and slidably disposed in the second hole segment, so that the pressing part can extend and retract in the lower opening of the second hole segment; the pressure block assembly also includes a pressure adjusting member, the pressure adjusting member is threadedly connected to the first hole segment and extends into the second hole segment to push against the third elastic member.

[0015] In one embodiment, the third elastic element is configured as a compression spring, and the pressure block assembly further includes a support plate disposed on the end face of the third elastic element, with one end of the pressure adjusting element extending into the second hole section abutting against the support plate.

[0016] In one embodiment, multiple third elastic elements and multiple pressure regulating elements are provided, and the third elastic elements, the pressure regulating elements and the pressure blocks are installed in a one-to-one correspondence.

[0017] In one embodiment, the mounting base includes a main support and a plurality of secondary supports. The main support is rotatably connected to the base. The pressure block assembly is mounted on the main support via the secondary supports. Each secondary support has a corresponding number of pressure block assemblies mounted on it. The secondary supports are detachably connected to the main support.

[0018] In one embodiment, the pressing unit further includes a push-pull clamp, which includes a mounting cylinder, a telescopic rod, a swing arm, and a handle. The mounting cylinder is fixedly mounted on the mounting bracket, the telescopic rod slides through the mounting cylinder, and the handle has a first hinge portion and a second hinge portion. The lower end of the telescopic rod is connected to the mounting base, the upper end of the telescopic rod is hinged to the first hinge portion, the upper end of the swing arm is hinged to the second hinge portion, and the lower end of the swing arm is hinged to the mounting cylinder.

[0019] In one embodiment, the pressing unit further includes a pressing drive member with a telescopic rod, the telescopic rod of the pressing drive member being driven to be connected to the mounting bracket to drive the mounting bracket to move along the first direction or away from the first direction. In one embodiment, the mounting bracket is provided with a guide post extending along the first direction, and the mounting base is provided with a linear bearing, the linear bearing being slidably sleeved on the guide post.

[0020] In one embodiment, one pressing unit is equipped with N pressing blocks, and each pressing block is used to press one memory chip. The value of N is in the range of 30≤N≤150.

[0021] This utility model also proposes a memory chip testing device, comprising: The housing has a storage cavity and a window communicating with the storage cavity; and The aforementioned memory chip testing fixture has a motherboard housed in the receiving cavity, with at least the pressing unit and the memory chips on the motherboard exposed through the window.

[0022] The technical solution of this utility model employs a dual-degree-of-freedom approach: the rotational degree of freedom of the pressing unit and the translational degree of freedom of the pressing block assembly. This allows multiple pressing blocks to move synchronously toward the memory chips, thus pressing them firmly. This avoids severe interference between the pressing blocks and the memory chips during the closing operation of the pressing unit, preventing memory chip damage. Furthermore, compared to the mounting bracket's detachable installation method using screw fastening, this application reduces operation time and improves operational convenience.

[0023] Based on this, the test fixture of this application allows for a larger number of pressing blocks and more rows of pressing blocks to be loaded on the same pressing unit. That is, a single pressing unit closing operation can allow a large number of pressing blocks to be pressed onto different memory chips simultaneously, thereby improving the ease of operation of the test fixture and reducing operation time. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0025] Figure 1 A schematic diagram of the structure of an embodiment of the memory chip testing fixture provided by this utility model in one state; Figure 2 for Figure 1 Side view of the structure shown; Figure 3 for Figure 1 The illustrated embodiment is shown in a structural diagram of another state; Figure 4 for Figure 3 Side view of the structure shown; Figure 5 for Figure 1 The illustrated embodiment is a structural diagram in another state; Figure 6 for Figure 5 Side view of the structure shown; Figure 7 for Figure 3 Top view of the structure shown; Figure 8 for Figure 7 Sectional view at point AA; Figure 9 for Figure 7 Sectional view at point BB; Figure 10 for Figure 9 A magnified view of a section at point C; Figure 11 for Figure 9 The diagram shows the structure of the mounting base and pressure block assembly; Figure 12 for Figure 11 A bottom view of the structure shown; Figure 13 for Figure 11 Side view of the structure shown; Figure 14 for Figure 11 An exploded view of a secondary support and its pressure block assembly shown; Figure 15 A schematic diagram of an embodiment of the memory chip testing equipment provided by this utility model.

[0026] Explanation of icon numbers: 101. Memory chips; 102. Case; 103. Window; 104. Motherboard; 200. Base; 201. Substrate; 202. Mounting block; 203. Snap-fit ​​protrusion; 204. Relief opening; 300. Pressing unit; 310. Mounting bracket; 311. Second blind hole; 312. Guide post; 320. Pressing block assembly; 321. Mounting base; 321a. Main support; 321b. Secondary support; 321c. First mounting plate; 321d. Second mounting plate; 322. Pressing block; 322a. Pressing part; 322b. Mounting part; 323. Third elastic element; 324. Pressure adjusting element; 325. Support plate; 326. Adjusting nut; 328. Linear bearing; 329. Mounting through hole; 329a, first hole section; 329b, second hole section; 329c, third hole section; 329d, fourth hole section; 329e, fifth hole section; 329f, sixth hole section; 330, engaging element; 331, engaging part; 332, rotating part; 333, operating part; 340, first elastic element; 350, push-pull clamp; 351, mounting cylinder; 352, telescopic rod; 353, swing arm; 354, handle; 355, first hinge part; 356, second hinge part; 400, Second elastic element; 500, Locking element.

[0027] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0029] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0030] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the use of "and / or" or "and / or" throughout the text includes three parallel solutions. For example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0031] In related technologies, the clamping block assembly of a memory chip testing fixture typically includes a mounting bracket and clamping blocks mounted on the mounting bracket. The mounting bracket is rotatably mounted on the main body of the testing fixture. Because the clamping block assembly requires a certain amount of rotation space, typically only one row of clamping blocks is arranged along the axis of rotation to avoid severe interference between the clamping blocks and the memory chips during rotation. It can be understood that if multiple rows of clamping blocks are arranged on the mounting bracket, the row of clamping blocks furthest from the axis of rotation will not contact the memory chip, while the row of clamping blocks closest to the axis of rotation will already be severely interfering with their corresponding memory chips. When testing a dozen or even dozens of memory chips simultaneously, multiple mounting bracket flipping operations are required, resulting in cumbersome and time-consuming operations.

[0032] To address the aforementioned issues, an alternative installation method has emerged: the mounting bracket is detachably mounted to the main body of the test fixture using screws. This prevents severe interference between the mounting brackets and memory chips, thus avoiding damage to the memory chips, even with multiple rows of pressure blocks on the mounting bracket. However, disassembling and assembling the pressure block assembly requires tools to remove and install multiple screws, making the operation cumbersome and time-consuming.

[0033] Alternatively, a mounting bracket can be used for rotational mounting, with the pressure block retractably mounted on the bracket via a spring. This allows the spring compression to support the rotational space required for the pressure block. However, this method presents other problems. For instance, when the mounting bracket has multiple rows of pressure blocks, the spring compression corresponding to the row of pressure blocks closest to the rotation axis is already significant when the row furthest from the rotation axis just contacts the memory chip. This makes it difficult for the mounting bracket to be pressed down and locked into the cover position.

[0034] In view of this, the present invention proposes a memory chip testing fixture for use in memory chip testing equipment.

[0035] Please see Figures 1 to 6 ,in, Figure 1 and Figure 2 The pressing unit 300 shown is in the open position, and the pressing block assembly 320 is in the avoidance position; Figure 3 and Figure 4 The pressing unit 300 shown is in the closed position, and the pressing block assembly 320 is in the clearance position; Figure 5 and Figure 6 The pressing unit 300 shown is in the closed position, and the pressing block assembly 320 is in the pressing position.

[0036] exist Figures 1 to 6 In the illustrated embodiment, the memory chip testing fixture includes a base 200 and a pressing unit 300. The pressing unit 300 includes a mounting bracket 310 and a pressing block assembly 320. The mounting bracket 310 is rotatably connected to the base 200 so that the pressing unit 300 can rotate and switch between an open position and a closed position. The pressing block assembly 320 includes a mounting base 321 and a plurality of pressing blocks 322 disposed on the mounting base 321. The mounting base 321 can move relative to the mounting bracket 310 in a first direction so that the pressing blocks 322 apply pressure to the memory chip 101 on the motherboard 104.

[0037] The mounting base 321 is movable along or away from the first direction to switch the pressure block assembly 320 between a pressing position and a clearance position. When the mounting base 321 moves along the first direction, the pressure block assembly 320 moves from the clearance position to the pressing position, and multiple pressure blocks 322 simultaneously translate toward the memory chip 101. When the mounting base 321 moves away from the first direction, the pressure block assembly 320 moves from the pressing position to the clearance position, and multiple pressure blocks 322 simultaneously translate away from the memory chip 101. When the pressing unit 300 is in the closed position and the pressure block assembly 320 is in the clearance position, the pressure blocks 322 are spaced apart above the memory chip 101. When the pressing unit 300 is in the closed position and the pressure block assembly 320 is in the pressing position, the pressure blocks 322 can push against the memory chip 101 to apply pressure, thereby achieving the function of the test fixture pressing the memory chip 101. When the pressing unit 300 is in the open position, the pressing unit 300 is located on the side of the memory chip 101 so that the memory chip 101 can be exposed, making it convenient to put in and take out the memory chip 101.

[0038] Specifically, before placing the memory chip 101 onto the motherboard 104, the clamping unit 300 is rotated to the open position to expose the area on the motherboard 104 used for mounting the memory chip 101. At this time, the clamping block assembly 320 is in a clearance position. Then, the memory chip 101 is placed onto the motherboard 104, and the clamping unit 300 is rotated to the closed position. Because the clamping block assembly 320 is in the clearance position, there is a gap between the clamping block 322 and the memory chip 101. Therefore, during the rotation of the clamping unit 300 from the open position to the closed position, the clamping block assembly 320 will not interfere with the memory chip 101, thus preventing damage to the memory chip 101. After the clamping unit 300 is rotated to the closed position, the clamping block assembly 320 is moved along the first direction to the clamping position so that the clamping block 322 can press the memory chip 101 firmly. This completes one loading of the memory chip 101.

[0039] Before removing the memory chip 101 from the motherboard 104, the clamping assembly 320 is moved away from the first direction and from the clamping position to a clearance position, so that the clamping block 322 is suspended above the memory chip 101. Then, the clamping unit 300 is rotated to the open position to expose the area on the motherboard 104 used for installing the memory chip 101. The memory chip 101 is then removed from the motherboard 104 for reloading and testing of the next batch of memory chips 101. This completes one unloading of the memory chip 101.

[0040] The technical solution of this utility model employs a dual-degree-of-freedom approach, namely, the rotational degree of freedom of the pressing unit 300 and the translational degree of freedom of the pressing block assembly 320. This allows multiple pressing blocks 322 to synchronously translate towards the memory chips 101, thereby pressing the memory chips 101 firmly. This avoids severe interference between the pressing blocks 322 and the memory chips 101 during the closing operation of the pressing unit 300, preventing damage to the memory chips 101. Furthermore, compared to the mounting bracket 310's detachable installation via screw fastening, this application reduces operation time and improves operational convenience. Additionally, compared to the mounting bracket 310's rotational installation and the pressing blocks 322's retractable mounting on the mounting bracket 310 via springs, the closing operation of the pressing unit 300 and the pressing operation of the pressing blocks 322 in this application are both time-saving and labor-saving, thus improving operational convenience.

[0041] Based on this, the test fixture of this application allows for a larger number of pressing blocks 322 and more rows of pressing blocks 322 to be loaded on the same pressing unit 300. That is, a single closing operation of the pressing unit 300 can allow a large number of pressing blocks 322 to be pressed onto different memory chips 101 at the same time, thereby improving the ease of operation of the test fixture and reducing the operation time.

[0042] Optionally, in some embodiments, a pressing unit 300 is equipped with N pressing blocks 322, each pressing block 322 corresponding to pressing a memory chip 101, and the value of N is in the range of 30≤N≤150. Further, the value of N can be in the range of 50≤N≤100. For example, N can be 60, 70, 80 or 90, etc.

[0043] Please see Figures 11 to 14 In this embodiment, the mounting base 321 includes a main support 321a and four secondary supports 321b. The main support 321a has a frame-like structure and is rotatably connected to the base 200. The pressing block assembly 320 is mounted on the main support 321a through the secondary supports 321b. Each secondary support 321b has two rows of pressing block assemblies 320, with each row containing 10 pressing block assemblies 320. That is, 80 pressing blocks 322 are mounted on one pressing unit 300, which can simultaneously press 80 memory chips 101.

[0044] Please see Figures 1 to 4Optionally, in some embodiments, the mounting bracket 310 has opposing first and second sides. The first side is rotatably connected to the base 200. The pressing unit 300 further includes a locking member 330 rotatably disposed on the second side. The locking member 330 includes a connected locking portion 331 and an operating portion 333. The locking portion 331 can engage with the base 200 to constrain the pressing unit 300 in the closed position. The operating portion 333 is used for push-pull operation. That is, when opening the pressing unit 300, it is only necessary to release the locking relationship between the locking member 330 and the base 200, and then rotate the pressing unit 300. When closing the pressing unit 300, it is only necessary to rotate the pressing unit 300, and then re-lock the locking member 330 with the base 200. In this way, the disassembly and assembly steps of the pressing unit 300 can be simplified, and the operation is more convenient.

[0045] Please see Figure 2 Optionally, in some embodiments, the engaging member 330 further includes a rotating part 332 connected between the engaging part 331 and the operating part 333, the rotating part 332 being rotatably connected to the mounting bracket 310, and the pressing unit 300 further includes a first elastic member 340 connected between the rotating part 332 and the mounting bracket 310, and used to give the engaging member 330 a tendency to rotate toward the locking position.

[0046] The base 200 is provided with a snap-fit ​​protrusion 203, and the engaging member 330 can rotatably switch between a locked position and an unlocked position to engage or disengage with the snap-fit ​​protrusion 203. When the pressing unit 300 is in the closed position and the engaging member 330 is in the locked position, the engaging member 330 is snapped and fixed to the snap-fit ​​protrusion 203 of the base 200 to restrict the rotation of the pressing unit 300. When the pressing unit 300 is in the closed position and the engaging member 330 is in the unlocked position, the engaging member 330 disengages from the snap-fit ​​protrusion 203 of the base 200, allowing the pressing unit 300 to rotate freely.

[0047] In this embodiment, by providing a first elastic element 340, the locking element 330 can be automatically reset to the locked position, thereby improving the ease of operation of the test fixture. Specifically, the first elastic element 340 can be a compression spring, the rotating part 332 has a first blind hole, the mounting bracket 310 has a second blind hole 311, one end of the first elastic element 340 is inserted into the first blind hole, and the other end of the first elastic element 340 is inserted into the second blind hole 311. This results in a simple structure and facilitates the installation of the first elastic element 340. Of course, in other embodiments, the first elastic element 340 may not be provided.

[0048] Please see Figure 1 and Figure 3Optionally, in some embodiments, two locking portions 331, two rotating portions 332, and two first elastic members 340 are provided, with the first elastic members 340 and the rotating portions 332 arranged in a one-to-one correspondence. The two rotating portions 332 are respectively located at opposite ends of the second side, and the operating portion 333 is configured as an operating rod spaced above the mounting bracket 310, connected between the two rotating portions 332. Thus, by providing two locking portions 331, two rotating portions 332, and two first elastic members 340, the structural strength and rotational stability of the locking member 330 can be improved. Furthermore, the structure of the operating rod facilitates the user's grip and application of operating force to achieve the flipping unlocking of the locking member 330. Of course, in other embodiments, only one first elastic member 340 may be provided.

[0049] Please see Figure 1 and Figure 3 Optionally, in some embodiments, the base 200 is provided with a snap-fit ​​protrusion 203, and the memory chip testing fixture also includes a locking member 500 movably disposed on the base 200. When the snap-fit ​​portion 331 snaps into the snap-fit ​​protrusion 203, the locking member 500 can abut against the side of the engaging member 330 opposite to the snap-fit ​​protrusion 203 to restrict the engaging member 330 from disengaging from the locked position. That is, one side of the engaging member 330 hooks onto the snap-fit ​​protrusion 203, and the other side of the engaging member 330 is blocked by the locking member 500, thereby constraining the engaging member 330 in the locked position. Optionally, the locking member 500 can be movably mounted on the base 200 in the left-right direction. In this way, the structure is simple and easy to operate. Of course, in other embodiments, the locking member 500 may not be provided.

[0050] Please see Figure 1 and Figure 3 Optionally, in some embodiments, the memory chip testing fixture further includes a second elastic element 400, which is connected between the pressing unit 300 and the base 200, so that the pressing unit 300 tends to rotate toward the open position. Thus, the second elastic element 400 enables the pressing unit 300 to automatically open. When the locking member 330 is released from its locking relationship with the base 200, the pressing unit 300 will rotate from the closed position toward the open position under the action of the second elastic element 400, making operation more convenient. Of course, in other embodiments, the second elastic element 400 may not be provided.

[0051] Please see Figure 1 and Figure 3Optionally, in some embodiments, the second elastic element 400 is configured as a pneumatic spring, with one end rotatably connected to the side of the mounting bracket 310 and the other end rotatably connected to the base 200. This results in a simple structure and stable, reliable operation. More importantly, using a pneumatic spring allows the pressing unit 300 to mount a larger number of pressing blocks 322. Of course, in other embodiments, other forms can be used as the second elastic element 400, such as a compression spring or a torsion spring.

[0052] Please see Figure 7 Optionally, in some embodiments, two second elastic elements 400 are provided, with the two second elastic elements 400 respectively disposed on opposite sides of the mounting bracket 310. This improves the smoothness and stability of the rotation of the pressing unit 300 and allows the pressing unit 300 to mount a larger number of pressing blocks 322. Of course, in other embodiments, only one second elastic element 400 may be provided.

[0053] Please see Figure 9 and Figure 10 Optionally, in some embodiments, the pressure block assembly 320 further includes a third elastic element 323. The pressure block 322 is movably mounted on the mounting base 321. The pressure block 322 has a pressing portion 322a that protrudes from the bottom surface of the mounting base 321. The third elastic element 323 connects the pressure block 322 and the mounting base 321 and is used to give the pressing portion 322a a tendency to move along a first direction. That is, the design of the elastic pressure block 322 in this embodiment allows the pressure block 322 to adapt to memory chips 101 of different thicknesses, improving the adaptability and versatility of the test fixture. Furthermore, the third elastic element 323 provides buffering, which better protects the memory chips 101 compared to traditional rigid pressing. Of course, in other embodiments, the third elastic element 323 may not be provided.

[0054] Please see Figure 10 Optionally, in some embodiments, the mounting base 321 is provided with a mounting through hole 329, which includes a first hole segment 329a and a second hole segment 329b that are sequentially distributed and connected along a first direction. The pressure block 322 is also provided with a mounting part 322b, which is connected to the upper side of the pressing part 322a and slidably disposed in the second hole segment 329b, so that the pressing part 322a can extend and retract in the lower opening of the second hole segment 329b. The pressure block assembly 320 also includes a pressure adjusting member 324, which is threadedly connected to the first hole segment 329a and extends into the second hole segment 329b to push against the third elastic member 323.

[0055] Specifically, by tightening or loosening the pressure adjusting member 324, the length of the pressure adjusting member 324 extending into the second hole section 329b can be changed, thereby changing the pre-compression amount of the third elastic member 323 in the initial state, and thus changing the initial pressure of the third elastic member 323 on the pressure block 322. That is, the initial pressure of each pressure block 322 can be adjusted by tightening or loosening the screw. When facing memory chips 101 of different thicknesses, by adjusting this initial pressure, the pressure block 322 can be tightly pressed against the memory chip 101 without causing great resistance to the translation of the pressure block assembly 320, thereby improving the ease of operation. Of course, in other embodiments, the pressure adjusting member 324 may not be provided.

[0056] Please see Figures 10 to 14 Optionally, the mounting base 321 includes a main support 321a, a secondary support 321b, and an adjusting nut 326. The main support 321a is rotatably connected to the base 200, and the pressure block assembly 320 is mounted on the main support 321a via the secondary support 321b. The secondary support 321b includes a first mounting plate 321c and a second mounting plate 321d. The first mounting plate 321c is detachably mounted on the upper surface of the second mounting plate 321d by screws. The adjusting nut 326 is fixedly mounted on the upper surface of the first mounting plate 321c. The threaded hole of the adjusting nut 326 is configured as a first hole segment 329a, and the second hole segment 329b includes a third hole segment 329c, a fourth hole segment 329d, a fifth hole segment 329e, and a sixth hole segment 329f that are connected in sequence. The third hole segment 329c and the fourth hole segment 329d are formed on the first mounting plate 321c, and the fifth hole segment 329e and the sixth hole segment 329f are formed on the second mounting plate 321d. The first hole segment 329a connects to the upper side of the third hole segment 329c. The diameters of the fourth hole segment 329d and the sixth hole segment 329f are both smaller than the diameter of the fifth hole segment 329e, and the diameter of the third hole segment 329c is smaller than the diameter of the fourth hole segment 329d. The mounting part 322b is slidably disposed in the fifth hole segment 329e, and the pressing part 322a extends and retracts within the sixth hole segment 329f.

[0057] Please see Figure 10 Optionally, in some embodiments, the third elastic member 323 is configured as a compression spring, and the pressure block assembly 320 further includes a support plate 325, which is disposed on the end face of the third elastic member 323. One end of the pressure adjusting member 324 extending into the second hole 329b abuts against the support plate 325. Specifically, the support plate 325 is disposed in the fourth hole 329d, the upper end of the third elastic member 323 extends into the fourth hole 329d and abuts against the lower surface of the support plate 325, and the lower end of the third elastic member 323 extends into the fifth hole 329e and abuts against the upper surface of the mounting portion 322b.

[0058] Please see Figure 10Optionally, in some embodiments, the pressure adjusting member 324 may be a set screw, which is threaded onto the adjusting nut 326, and the tip of the set screw passes sequentially through the first hole section 329a and the third hole section 329c, and extends into the fourth hole section 329d. The tip of the set screw indirectly pushes against the third elastic member 323 by pushing against the support plate 325, so as to change the amount of compression deformation of the third elastic member 323.

[0059] Please see Figure 10 and Figure 14 Optionally, in some embodiments, multiple third elastic elements 323 and pressure regulating elements 324 are provided, and the third elastic elements 323 and pressure regulating elements 324 are installed in a one-to-one correspondence with the pressure blocks 322. In this way, each pressure block 322 floats independently, and its initial pressure can be adjusted independently.

[0060] Please see Figure 12 and Figure 14 Optionally, in some embodiments, a secondary support 321b is equipped with multiple pressure block assemblies 320, and the secondary support 321b is detachably connected to the main support 321a. Thus, through modular design, the secondary support 321b and the pressure block assemblies 320 mounted thereon are treated as a single module, allowing for quick installation, disassembly, and replacement, which is beneficial for subsequent maintenance of the test fixture. Furthermore, the secondary support 321b is configured with a detachable first mounting plate 321c and a second mounting plate 321d, which also facilitates the installation, disassembly, and replacement of the pressure block assemblies 320.

[0061] Please see Figures 3 to 6 , Figure 8 ,in, Figure 3 , Figure 4 and Figure 8 The schematic diagram shows that the pressure block assembly 320 is in the avoidance position, and the push-pull clamp 350 is in the first position corresponding to the avoidance position; Figure 5 and Figure 6 The pressure block assembly 320 is in the pressing position, and the push-pull clamp 350 is in the second position corresponding to the pressing position.

[0062] exist Figures 3 to 6 , Figure 8 In the illustrated embodiment, optionally, the pressing unit 300 further includes a push-pull clamp 350. The push-pull clamp 350 includes a mounting cylinder 351, a telescopic rod 352, a swing arm 353, and a handle 354. The mounting cylinder 351 is fixedly mounted on the mounting bracket 310. The telescopic rod 352 slides through the mounting cylinder 351. The handle 354 is provided with a first hinge portion 355 and a second hinge portion 356. The lower end of the telescopic rod 352 is connected to the mounting base 321. The upper end of the telescopic rod 352 is hinged to the first hinge portion 355. The upper end of the swing arm 353 is hinged to the second hinge portion 356. The lower end of the swing arm 353 is hinged to the mounting cylinder 351.

[0063] Specifically, by gripping the handle 354 and applying operating force, the handle 354 rotates relative to the mounting bracket 310, causing the telescopic rod 352 to move up and down within the mounting cylinder 351. This causes the mounting base 321, connected to the telescopic rod 352, to move up and down accordingly, thus switching the pressure block assembly 320 between the avoidance position and the pressing position. During this process, the swing arm 353 swings in an arc around its axis of rotation on the mounting bracket 310, the second hinge 356 rotates around its axis of rotation on the swing arm 353, and simultaneously the first hinge 355 rotates around its axis of rotation on the telescopic rod 352, causing the handle 354 to swing in a non-circular arc. Thus, the push-pull clamp 350 is used to achieve the up and down movement of the pressure block assembly 320, resulting in a simple structure and easy operation.

[0064] Of course, in other embodiments, the push-pull clamp 350 may not be used. For example, in some other embodiments, the pressing unit 300 further includes a pressing drive with a telescopic rod 352, the telescopic rod 352 of which is driven to be connected to the mounting bracket 310 to drive the mounting bracket 310 to move along or away from the first direction. The pressing drive includes, but is not limited to, a telescopic cylinder, a linear motor, and a telescopic hydraulic cylinder.

[0065] Please see Figure 1 and Figure 8 Optionally, in some embodiments, the mounting bracket 310 is provided with guide posts 312 extending along a first direction, and the mounting base 321 is provided with linear bearings 328, which are slidably sleeved on the guide posts 312. Specifically, in this embodiment, there are four guide posts 312 and four linear bearings 328, which are installed in a one-to-one correspondence, and the four linear bearings 328 are located at the four corners of the mounting base 321. In this way, the smoothness and stability of the movement of the pressure block assembly 320 can be improved.

[0066] Please see Figure 15 This utility model also proposes a memory chip testing device, which includes a housing 102 and a memory chip testing fixture. The specific structure of the memory chip testing fixture is as described in the above embodiments. Since this memory chip testing device adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be described in detail here.

[0067] The casing 102 has a storage cavity and a window 103 connecting the storage cavity. The motherboard 104 is housed in the storage cavity, and at least the memory chips 101 on the pressing unit 300 and the motherboard 104 are exposed in the window 103.

[0068] Please see Figure 1 and Figure 15Optionally, the base 200 includes a substrate 201 and a plurality of mounting blocks 202. The substrate 201 is installed in the receiving cavity and has a clearance opening 204 communicating with the window 103, through which the memory chip 101 is exposed. The mounting blocks 202 are exposed on the upper surface of the housing 102 and are fastened to the housing 102 and the base 200 by screws. Specifically, the two sides of the mounting bracket 310 are respectively hinged to two of the mounting blocks 202, the lower ends of the two second elastic members 400 are respectively hinged to the other two mounting blocks 202, and the snap-fit ​​protrusions 203 are installed on the remaining two mounting blocks 202.

[0069] The above description is merely an exemplary embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structural transformations made based on the technical concept of the present utility model and the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.

Claims

1. A memory chip testing fixture, characterized in that, include: Base; and The pressing unit includes a mounting bracket and a pressing block assembly. The mounting bracket is rotatably connected to the base so that the pressing unit can rotate between an open position and a closed position. The pressing block assembly includes a mounting base and a plurality of pressing blocks disposed on the mounting base. The mounting base is movable relative to the mounting bracket in a first direction so that the pressing blocks apply pressure to the memory chips on the motherboard.

2. The memory chip testing fixture as described in claim 1, characterized in that, The mounting bracket has a first side and a second side opposite to each other. The first side is rotatably connected to the base. The pressing unit also includes a locking member rotatably disposed on the second side. The locking member includes a locking part and an operating part connected to each other. The locking part can be engaged with the base to constrain the pressing unit in the closed position. The operating part is used for push-pull operation.

3. The memory chip testing fixture as described in claim 2, characterized in that, The engaging component further includes a rotating portion connected between the engaging portion and the operating portion, the rotating portion being rotatably connected to the mounting bracket. The pressing unit further includes a first elastic element connected between the rotating portion and the mounting bracket, which is used to give the engaging component a tendency to rotate toward the locking position. The memory chip testing fixture further includes a second elastic element connected between the pressing unit and the base, which gives the pressing unit a tendency to rotate toward the opening position.

4. The memory chip testing fixture as described in claim 3, characterized in that, The snap-fit ​​part, the rotating part, and the first elastic element are each provided in twos, and the first elastic element and the rotating part are provided in a one-to-one correspondence. The two rotating parts are respectively provided at opposite ends of the second side. The operating part is configured as an operating rod spaced above the mounting bracket, and the operating rod is connected between the two rotating parts. And / or, the first elastic element is configured as a compression spring, the rotating part is provided with a first blind hole, the mounting bracket is provided with a second blind hole, one end of the first elastic element is inserted into the first blind hole, and the other end of the first elastic element is inserted into the second blind hole; And / or, the base is provided with a snap-fit ​​protrusion, and the memory chip test fixture further includes a locking member movably disposed on the base. When the snap-fit ​​part is snapped into the snap-fit ​​protrusion, the locking member can abut against the side of the snap-fit ​​member opposite to the snap-fit ​​protrusion to restrict the snap-fit ​​member from disengaging from the locking position. And / or, the second elastic element is configured as a pneumatic spring, one end of the second elastic element is rotatably connected to the side of the mounting bracket, and the other end of the second elastic element is rotatably connected to the base; And / or, two second elastic elements are provided, with the two second elastic elements respectively disposed on opposite sides of the mounting bracket.

5. The memory chip testing fixture as described in claim 1, characterized in that, The pressure block assembly further includes a third elastic element. The pressure block is movably mounted on the mounting base. The pressure block has a pressing portion that protrudes from the bottom surface of the mounting base. The third elastic element connects the pressure block and the mounting base and is used to give the pressing portion a tendency to move along the first direction.

6. The memory chip testing fixture as described in claim 5, characterized in that, The mounting base is provided with a mounting through hole, which includes a first hole segment and a second hole segment that are sequentially distributed and connected along the first direction. The pressure block is also provided with a mounting part, which is connected to the upper side of the pressing part and slidably disposed in the second hole segment so that the pressing part can extend and retract within the lower opening of the second hole segment. The pressure block assembly also includes a pressure adjusting member, which is threadedly connected to the first hole segment and extends into the second hole segment to push against the third elastic member.

7. The memory chip testing fixture as described in claim 6, characterized in that, The third elastic element is configured as a compression spring, and the pressure block assembly further includes a support plate, which is disposed on the end face of the third elastic element, and one end of the pressure adjusting element extending into the second hole section abuts against the support plate. And / or, multiple third elastic elements and multiple pressure regulating elements are provided, and the third elastic elements, the pressure regulating elements and the pressure blocks are installed in a one-to-one correspondence; And / or, the mounting base includes a main support and multiple auxiliary supports, the main support is rotatably connected to the base, the pressure block assembly is mounted on the main support through the auxiliary supports, multiple pressure block assemblies are correspondingly mounted on one auxiliary support, and the auxiliary support is detachably connected to the main support.

8. The memory chip testing fixture as described in claim 1, characterized in that, The pressing unit further includes a push-pull clamp, which includes a mounting cylinder, a telescopic rod, a swing arm, and a handle. The mounting cylinder is fixedly mounted on the mounting bracket, the telescopic rod slides through the mounting cylinder, and the handle has a first hinge and a second hinge. The lower end of the telescopic rod is connected to the mounting base, the upper end of the telescopic rod is hinged to the first hinge, the upper end of the swing arm is hinged to the second hinge, and the lower end of the swing arm is hinged to the mounting cylinder. Alternatively, the pressing unit may further include a pressing drive with a telescopic rod, the telescopic rod of which is driven to be connected to the mounting bracket to drive the mounting bracket to move along the first direction or away from the first direction. And / or, the mounting bracket is provided with a guide post extending along the first direction, and the mounting base is provided with a linear bearing, the linear bearing being slidably sleeved on the guide post.

9. The memory chip testing fixture as described in any one of claims 1 to 8, characterized in that, The pressing unit is equipped with N pressing blocks, and each pressing block is used to press a memory chip. The value of N is in the range of 30≤N≤150.

10. A memory chip testing device, characterized in that, include: The housing has a storage cavity and a window communicating with the storage cavity; and According to any one of claims 1 to 9, the motherboard is housed in the receiving cavity, and at least the pressing unit and the memory chips on the motherboard are exposed through the window.

Images