An interface structure for quick replacement of a measuring head

CN224790073UActive Publication Date: 2026-09-22HANGZHOU ZHONGSHI TECH CO LTD
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Patent Information

Application Number
CN202522330347.9
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-11-03
Publication Date
2026-09-22
Estimated Expiration
2035-11-03

AI Technical Summary

Technical Problem

[0004]本实用新型的目的是针对现有技术中表面粗糙度仪的接口与测头的操作方式存在连接效率低、易因对准偏差导致连接失败及插针、接口电路损坏的问题,提出一种快速更换测头的接口结构

Benefits of technology

本实用新型利用定位插杆、导向滑架、半球形定位筒、支撑托块等结构的配合,使用表面粗糙度仪时,将杆状测头的定位插杆卡入半球形定位筒,杆状测头嵌入弧形托槽初步限位。推动拨动块带动导向滑架沿T形卡块滑动,第二凸板与T形卡块吸合固定,实现杆状测头与接口精准对接。无需手动反复对准,提升更换效率,避免对准偏差导致的连接失败,防止强行按压造成的插针损坏。

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Abstract

The utility model relates to surface roughness testing equipment technical field especially relates to an interface structure of quick replacement measuring head, its technical scheme includes surface roughness appearance and the interface that opens at surface roughness appearance, the inside installation of interface has pole measuring head, still includes the positioning plug rod of fixed connection in pole measuring head one end, the back of surface roughness appearance is equipped with guide carriage, the utility model discloses the cooperation of positioning plug rod, guide carriage, hemispherical positioning cylinder, support block etc. structure, when using surface roughness appearance, the positioning plug rod of pole measuring head is inserted into hemispherical positioning cylinder, and pole measuring head is embedded in arc -shaped support groove preliminary limit. Push the driving block and drive guide carriage along T -shaped clamping block sliding, second lug and T -shaped clamping block suction fixed, realize pole measuring head and interface accurate butt joint. Without manual repeatedly aligning, improve the replacement efficiency, avoid the connection failure caused by alignment deviation, prevent the damage of pin caused by forcible pressing.
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Description

Technical Field

[0001] This utility model relates to the technical field of surface finish testing equipment, and in particular to an interface structure for quick-change probes. Background Technology

[0002] A surface roughness tester is a precision measuring instrument used to measure the microscopic unevenness of a workpiece surface to obtain surface roughness parameters, thereby evaluating the surface finish. One end of the instrument has a dedicated interface for mounting a rod-shaped probe, the core measuring component. The probe's internal end has multiple sockets, and correspondingly, the roughness tester's interface contains pins precisely matched to these sockets. Only by precisely aligning and connecting the probe's sockets with the interface pins can the circuit between them be ensured, guaranteeing stable and accurate transmission of the measurement signal. This is a necessary prerequisite for accurate surface roughness measurement.

[0003] However, in actual operation, operators usually need to manually adjust the relative position of the probe and the surface roughness tester interface to complete the alignment. This operating mode has significant drawbacks: First, the connection efficiency is low. Manual alignment requires repeated adjustments to match the socket and pin, making it impossible to quickly install the probe. This can seriously affect the overall progress of the measurement work, especially in scenarios involving batch testing or frequent probe changes. Second, if alignment deviation occurs during manual adjustment, it will directly lead to circuit failure and mechanical fixation failure, resulting in probe and instrument connection failure and the inability to carry out the measurement work. Furthermore, if the operator forcibly presses the probe when it is not aligned, the pin will be subjected to non-axial lateral force, which can cause physical damage such as bending and deformation of the pin. Utility Model Content

[0004] The purpose of this invention is to address the problems of low connection efficiency, easy connection failure due to alignment deviation, and damage to pins and interface circuits in the operation mode of the interface and probe of the existing surface roughness meter, and to propose an interface structure for quick probe replacement.

[0005] The technical solution of this utility model is as follows: an interface structure for quick probe replacement, including a surface roughness meter and an interface formed on the surface roughness meter. A rod-shaped probe is installed inside the interface. It also includes a positioning rod fixedly connected to one end of the rod-shaped probe. A guide slide is provided on the back of the surface roughness meter, and a positioning mechanism is provided at one end of the guide slide to hold the positioning rod. A support block mechanism is slidably connected to the guide slide and corresponds to the positioning mechanism. The support block mechanism and the positioning mechanism are used to align the rod-shaped probe with the interface. A support mechanism is provided on the back of the surface roughness meter to support the horizontal sliding of the support block mechanism and the positioning mechanism.

[0006] Optionally, the positioning mechanism includes a hemispherical positioning cylinder fixedly connected to one end of the guide slide, and the end of the hemispherical positioning cylinder away from the guide slide has a groove for tightly locking the positioning rod.

[0007] Optionally, the support block mechanism includes a support block, on which an arc-shaped groove is formed to tightly engage the outer wall of the rod-shaped probe. A limiting slider is also fixedly connected to the support block. A limiting groove is formed on the guide slide for the limiting slider to slide. An elliptical block is fixedly connected to the end of the limiting slider away from the support block to engage the guide slide. A rubber pad is provided on the inner wall of the arc-shaped groove.

[0008] Optionally, the support mechanism includes a T-shaped locking block fixedly connected to the back of the surface roughness meter, the T-shaped locking block being slidably engaged with the limiting groove.

[0009] Optionally, a second convex plate is fixedly connected to the middle of the guide carriage and attracts the T-shaped block. The second convex plate and the T-shaped block are made of permanent magnets.

[0010] Optionally, a first convex plate is fixedly connected to the end of the guide carriage away from the hemispherical positioning cylinder, and the first convex plate and the second convex plate adopt the same structural configuration.

[0011] Optionally, the end of the guide carriage away from the first convex plate is fixedly connected to a toggle block corresponding to the hemispherical positioning cylinder.

[0012] Optionally, the end of the positioning rod away from the rod-shaped probe is configured with a spherical structure.

[0013] In summary, this application includes at least one of the following beneficial technical effects: This invention utilizes a combination of a positioning rod, a guide slide, a hemispherical positioning cylinder, and a support block. When using a surface roughness tester, the positioning rod of the rod-shaped probe is inserted into the hemispherical positioning cylinder, and the rod-shaped probe is initially positioned by embedding it into the arc-shaped groove. Pushing the actuating block causes the guide slide to slide along the T-shaped locking block, and the second convex plate engages and fixes with the T-shaped locking block, achieving precise docking between the rod-shaped probe and the interface. This eliminates the need for repeated manual alignment, improving replacement efficiency, avoiding connection failures due to alignment deviations, and preventing damage to the pins caused by forced pressing. Attached Figure Description

[0014] Figure 1 A schematic diagram of the first state structure of the interface structure for quick probe replacement according to this utility model is given; Figure 2 A schematic diagram of the second state structure of the interface structure for quick probe replacement according to this utility model is provided; Figure 3 A schematic diagram of the third state structure of the interface structure for quick probe replacement according to this utility model is provided; Figure 4 for Figure 3 A schematic diagram of the split structure.

[0015] Reference numerals in the attached drawings: 1. Surface roughness tester; 11. Interface; 2. Rod-shaped probe; 21. Positioning rod; 3. Guide slide; 31. First convex plate; 32. Second convex plate; 33. Limiting slide groove; 34. Actuating block; 35. Hemispherical positioning cylinder; 36. Elliptical block; 37. Support block; 38. Limiting slider; 39. T-shaped locking block; 4. Arc-shaped groove. Detailed Implementation

[0016] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of this utility model, but not all embodiments.

[0017] The components of the present invention embodiments described and shown in the accompanying drawings can typically be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention.

[0018] Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0019] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0020] It should be noted that the terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. In this specification, illustrative expressions of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0021] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0022] Example like Figures 1 to 4 As shown, this utility model proposes a quick-change probe interface structure, including a surface roughness meter 1 and an interface 11 formed on the surface roughness meter 1. The interface 11 is a component that docks with the rod-shaped probe 2, used for signal transmission and mechanical connection. The rod-shaped probe 2 is installed inside the interface 11. The rod-shaped probe 2 is used to contact the surface to be measured for roughness measurement, and its positioning rod 21 assists in achieving precise docking with the equipment. One end of the rod-shaped probe 2 is fixedly connected to the positioning rod 21, which can be inserted into a hemispherical positioning cylinder 35 to provide a positioning reference for the rod-shaped probe 2. The end of the positioning rod 21 furthest from the rod-shaped probe 2 is designed with a spherical structure. This spherical structure can fit into the groove of the hemispherical positioning cylinder 35. On the one hand, the spherical contact increases the tolerance space during positioning, allowing the rod-shaped probe 2 to be finely adjusted within a small range, facilitating quick insertion into the positioning cylinder. On the other hand, the spherical structure reduces frictional resistance with the inner wall of the positioning cylinder, making the insertion and removal of the rod smoother, while avoiding jamming or component wear caused by angular deviation, thus improving positioning accuracy and ease of operation. The back of the surface roughness tester 1 is equipped with a guide slide 3, which moves the rod-shaped probe 2 to achieve docking with the interface 11, integrating various auxiliary structures.

[0023] Among them, such as Figures 1 to 4As shown, one end of the guide slide 3 is provided with a positioning mechanism that holds the positioning rod 21. The positioning mechanism includes a hemispherical positioning cylinder 35 fixedly connected to one end of the guide slide 3. The groove on the hemispherical positioning cylinder 35 is used to accommodate the positioning rod 21 for initial positioning of the rod-shaped probe 2. The end of the hemispherical positioning cylinder 35 away from the guide slide 3 has a groove that tightly holds the positioning rod 21. The end of the guide slide 3 away from the hemispherical positioning cylinder 35 is fixedly connected to a first protruding plate 31. The first protruding plate 31 is moved by the operator during the sliding of the guide slide 3 to drive the guide slide 3 to slide along the limiting groove 33 and the T-shaped locking block 39. The first protruding plate 31 and the second protruding plate 32 adopt the same structure, which is to maintain consistent force characteristics during sliding limiting and fixed engagement, thereby enhancing the stability of the overall structure. The end of the guide slide 3 away from the first convex plate 31 is fixedly connected to a toggle block 34 corresponding to the hemispherical positioning cylinder 35. The toggle block 34 is also for the operator to toggle, so as to drive the guide slide 3 to slide along the limiting slide groove 33 and the T-shaped locking block 39.

[0024] In addition, such as Figures 1 to 4 As shown, a support block mechanism corresponding to the positioning mechanism is slidably connected to the guide slide 3. The support block mechanism and the positioning mechanism are used to align the rod-shaped probe 2 with the interface 11. The support block mechanism includes a support block 37, which supports the rod-shaped probe 2 through an arc-shaped groove 4, and works with the positioning rod 21 to enhance its stability. The support block 37 has an arc-shaped groove 4 that tightly clamps the outer wall of the rod-shaped probe 2. The rubber pad on the inner wall of the arc-shaped groove 4 increases friction and clamps the rod-shaped probe 2 to assist in positioning and support. A limit slider 38 is also fixedly connected to the support block 37. The limit slider 38 slides along the limit groove 33 to ensure that the support block 37 moves smoothly. The guide slide 3 has a limit groove 33 for the limit slider 38 to slide. The limit groove 33 provides a track for the sliding of the guide slide 3 and the support block 37, limiting their sliding direction. The end of the limiting slider 38 furthest from the supporting block 37 is also fixedly connected to an elliptical block 36 that holds the guide slide 3. The elliptical block 36 prevents the supporting block 37 from falling off the guide slide 3, thus providing a limiting and protective function. The inner wall of the arc-shaped groove 4 is provided with a rubber pad. The rubber pad increases the friction with the outer wall of the rod-shaped probe 2, enhancing the clamping stability of the probe and preventing the probe from sliding or shifting during positioning and docking. At the same time, the rubber material is elastic, which can buffer the contact impact between the probe and the groove, avoiding wear on the probe surface caused by hard contact, thus protecting the probe. It can also adapt to the slight dimensional differences of probes of different diameters, improving compatibility.

[0025] It is worth noting that, such as Figures 2 to 4As shown, the surface roughness tester 1 has a horizontally sliding support mechanism on its back, which includes a support block mechanism and a positioning mechanism. The support mechanism includes a T-shaped locking block 39 fixedly connected to the back of the surface roughness tester 1. The T-shaped locking block 39 provides a track for the sliding of the guide slide 3 and is fixedly engaged with the second protrusion 32. The T-shaped locking block 39 is slidably engaged with the limiting slide groove 33.

[0026] Furthermore, such as Figures 2 to 4 As shown, a second protruding plate 32 is fixedly connected to the middle of the guide slide 3 and is attracted to the T-shaped locking block 39. The second protruding plate 32 and the T-shaped locking block 39 (both are made of permanent magnets) attract each other, thus fixing the guide slide 3 in a designated position. The second protruding plate 32 and the T-shaped locking block 39 are made of permanent magnets. The permanent magnets utilize their magnetic attraction properties to quickly and firmly connect when the guide slide 3 slides to the designated position. Positioning and fixing can be completed without additional locking parts, simplifying the operation steps and improving the efficiency of probe replacement.

[0027] In this embodiment, when using the interface structure for quick probe replacement, such as Figure 3 As shown, first push the first convex plate 31 and the elliptical block 36, so that the guide carriage 3 and the support block 37 move to the position shown. Figure 2 In the state shown, the positioning rod 21 of the rod-shaped probe 2 is first placed into the groove of the hemispherical positioning cylinder 35 on the guide slide 3. At the same time, the outer wall of the rod-shaped probe 2 is engaged in the arc-shaped groove 4 on the support block 37. The rubber pad on the inner wall of the arc-shaped groove 4 can increase the friction with the rod-shaped probe 2, initially achieving the limiting support of the rod-shaped probe 2. Then, the toggle block 34 is moved, causing the guide slide 3 to slide horizontally along the T-shaped locking block 39 on the back of the surface roughness meter 1 through the limiting slide groove 33. During this process, the support block 37 slides synchronously in the limiting slide groove 33 through the limiting slider 38, always supporting and positioning the rod-shaped probe 2. When the guide slide 3 slides to the designated position, the second protrusion 32 on the guide slide 3 and the T-shaped locking block 39 attract each other. Both are made of permanent magnet material, which fixes the guide slide 3. At this time, the rod-shaped probe 2 is precisely aligned with the interface 11 of the surface roughness meter 1, completing the rapid positioning and docking. When the elliptical block 36 abuts against the surface roughness tester 1, it will remain stationary, supporting the rod-shaped probe 2. At this time, the rod-shaped probe 2 will also slide within the arc-shaped support groove 4. If the rod-shaped probe 2 needs to be removed, the actuating block 34 is reversed to separate the second protruding plate 32 from the T-shaped locking block 39, and the guide slide 3 is pulled away from the interface 11, allowing the rod-shaped probe 2 to be easily removed. When it is necessary to replace the rod-shaped probe 2 of different specifications, the above operation is repeated. At the same time, the elliptical block 36 can prevent the support block 37 from falling off the guide slide 3, ensuring that the entire replacement process is stable and orderly, and effectively avoiding the inefficiency and component damage caused by manual alignment.

[0028] The preferred embodiments of this utility model described above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to any specific implementation. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.

Claims

1. A quick-change probe interface structure, comprising a surface roughness tester (1) and an interface (11) formed on the surface roughness tester (1), wherein a rod-shaped probe (2) is installed inside the interface (11), characterized in that, Also includes: A positioning rod (21) is fixedly connected to one end of the rod-shaped probe (2). A guide slide (3) is provided on the back of the surface roughness meter (1). A positioning mechanism for locking the positioning rod (21) is provided at one end of the guide slide (3). The block support mechanism is slidably connected to the guide carriage (3) and corresponds to the positioning mechanism. The block support mechanism and the positioning mechanism are used to align the rod-shaped probe (2) with the interface (11). The support mechanism is set on the back of the surface roughness meter (1) to support the block mechanism and the positioning mechanism for horizontal sliding.

2. The interface structure for quick probe replacement according to claim 1, characterized in that, The positioning mechanism includes a hemispherical positioning cylinder (35) fixedly connected to one end of the guide slide (3), and the end of the hemispherical positioning cylinder (35) away from the guide slide (3) has a groove that tightly locks the positioning rod (21).

3. The interface structure for quick probe replacement according to claim 1, characterized in that, The support block mechanism includes a support block (37), on which an arc-shaped groove (4) is provided to tightly clamp the outer wall of the rod-shaped probe (2). A limiting slider (38) is also fixedly connected to the support block (37). A limiting groove (33) is provided on the guide slide (3) for the limiting slider (38) to slide. An elliptical block (36) is fixedly connected to the end of the limiting slider (38) away from the support block (37). A rubber pad is provided on the inner wall of the arc-shaped groove (4).

4. The interface structure for quick probe replacement according to claim 1, characterized in that, The support mechanism includes a T-shaped locking block (39) fixedly connected to the back of the surface roughness meter (1), and the T-shaped locking block (39) is slidably engaged with the limiting slide groove (33).

5. The interface structure for quick probe replacement according to claim 4, characterized in that, The guide slide (3) is fixedly connected to a second convex plate (32) that attracts the T-shaped block (39). The second convex plate (32) and the T-shaped block (39) are made of permanent magnets.

6. The interface structure for quick probe replacement according to claim 2, characterized in that, The guide slide (3) is fixedly connected to a first convex plate (31) at the end away from the hemispherical positioning cylinder (35), and the first convex plate (31) and the second convex plate (32) adopt the same structure.

7. The interface structure for quick probe replacement according to claim 6, characterized in that, The guide slide (3) is fixedly connected to a toggle block (34) corresponding to the hemispherical positioning cylinder (35) at one end away from the first convex plate (31).

8. The interface structure for quick probe replacement according to claim 1, characterized in that, The end of the positioning rod (21) away from the rod-shaped probe (2) is designed with a spherical structure.