An optical module one-stop processing device
Patent Information
- Application Number
- CN202522347827.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-05
- Publication Date
- 2026-09-22
- Estimated Expiration
- 2035-11-05
AI Technical Summary
[0003]并且,生产过程较为依赖采样示波器等昂贵设备,这无疑大幅增加了生产设备成本
[0014]本实用新型的有益效果:通过测试模块测试板简化安装;光源测试板与第一误码测试仪提供标准信号;衰减器模拟多样传输环境;消光比测试仪保障信号质量评估;第二误码测试仪全面检测误码,整体降低设备成本、减少工序,提升产能与效率。
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Figure CN224790649U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of optical module processing and production technology, and in particular to a one-stop optical module processing device. Background Technology
[0002] Currently, mainstream optical module manufacturing processes still employ a single-function, multi-station model. Under this model, completing the manufacturing of a single optical module requires several to a dozen different processes.
[0003] Furthermore, the production process relies heavily on expensive equipment such as sampling oscilloscopes, which undoubtedly increases the cost of production equipment significantly. At the same time, the multi-step nature of the process limits processing efficiency to the number of workstations and operators, making it difficult to increase production capacity.
[0004] Furthermore, the numerous processes and equipment involved increase the complexity of production management and impact overall production efficiency. Therefore, simplifying the optical module manufacturing process, reducing equipment costs, and increasing production capacity have become pressing technical challenges in the optical module manufacturing industry. Utility Model Content
[0005] The purpose of this invention is to address the shortcomings of existing technologies by providing a one-stop processing device for optical modules. The device simplifies installation through a test module test board; the light source test board and the first bit error rate tester provide standard signals; the attenuator simulates various transmission environments; the extinction ratio tester ensures signal quality assessment; and the second bit error rate tester comprehensively detects bit errors. Overall, this device reduces equipment costs, streamlines processes, and improves production capacity and efficiency.
[0006] To achieve the above objectives, this utility model provides a one-stop optical module processing device, comprising a first bit error rate tester, a light source test board, an attenuator, an extinction ratio tester, a test module test board, and a second bit error rate tester. The test module test board is used to insert the optical module to be tested; The first bit error rate tester is electrically connected to the light source test board, which is used to send test sequence optical signals to the receiving end of the optical module. The attenuator is disposed between the light source test board and the test module test board. The output terminal of the light source test board is electrically connected to the input terminal of the attenuator, and the output terminal of the attenuator is electrically connected to the test module test board. The extinction ratio tester is electrically connected to the test board of the test module and is used to measure the extinction ratio of the test sequence optical signal; The second bit error rate tester is electrically connected to the test module test board and is used to receive the test sequence optical signal transmitted through the output end of the optical module.
[0007] Preferably, a first optical switch is provided between the light source test board and the attenuator; One end of the first optical switch is electrically connected to the output end of the light source test board, and the other end of the first optical switch is electrically connected to the input end of the attenuator.
[0008] Preferably, a second optical switch and a third optical switch are provided between the extinction ratio tester and the optical module; The first optical switch, the second optical switch, and the third optical switch are all provided with a common terminal and a throw terminal; The throwing terminal of the first optical switch is electrically connected to the light source test board, and the common terminal of the first optical switch is electrically connected to the attenuator. The common terminal of the second optical switch is electrically connected to the receiving terminal of the optical module, and the throwing terminal of the second optical switch is electrically connected to the throwing terminal of the third optical switch. The common terminal of the third optical switch is electrically connected to the receiving terminal of the extinction ratio tester, and the throwing terminal of the third optical switch is electrically connected to the throwing terminal of the second optical switch.
[0009] Preferably, the throwing terminal of the second optical switch is electrically connected to the throwing terminal of the first optical switch.
[0010] Preferably, the first optical switch, the second optical switch, and the third optical switch are each provided with one common terminal and four throw terminals.
[0011] Preferably, the first bit error rate tester is electrically connected to the light source test board via a coaxial cable.
[0012] Preferably, the second bit error rate tester is electrically connected to the test module test board via a coaxial cable.
[0013] Preferably, both the first bit error rate tester and the second bit error rate tester are four-channel 10G bit error rate testers.
[0014] The beneficial effects of this utility model are as follows: the test module test board simplifies installation; the light source test board and the first bit error rate tester provide standard signals; the attenuator simulates various transmission environments; the extinction ratio tester ensures signal quality assessment; and the second bit error rate tester comprehensively detects bit errors, thereby reducing overall equipment costs, reducing processes, and improving production capacity and efficiency. Attached Figure Description
[0015] Figure 1 This is a schematic diagram of the structure of this utility model.
[0016] The reference numerals in the figures include: 1. First bit error rate tester; 2. Light source test board; 3. Attenuator; 4. Extinction ratio tester; 5. Test module test board; 6. Second bit error rate tester; 7. First optical switch; 8. Second optical switch; 9. Third optical switch. Detailed Implementation
[0017] The present invention will now be described in detail with reference to the accompanying drawings.
[0018] like Figure 1 As shown, the present invention provides a one-stop optical module processing device, which includes a first bit error rate tester 1, a light source test board 2, an attenuator 3, an extinction ratio tester 4, a test module test board 5, and a second bit error rate tester 6.
[0019] Test module test board 5 is used to insert the optical module to be tested. Test module test board 5 provides a test position for the optical module, allowing the entire testing process to revolve around it, simplifying the installation steps and improving testing efficiency. Test module test board 5 is an SFP-based cage test board, which can work well with optical modules with SFP interfaces, providing stable mechanical and electrical connections. Specifically, when an optical module with an SFP interface is inserted into the cage, the module's outer shell contacts the cage's metal shielding layer, forming a Faraday cage effect to shield against external interference. Simultaneously, the optical module's gold-plated pins mate with the cage's 20-pin connector core, achieving a low-impedance electrical connection through gold-plated contacts. A locking mechanism holds the optical module's tail to prevent accidental dislodgement. If heat dissipation is required, the cage conducts heat from the optical module to the PCB or an external cooling system through a heat sink.
[0020] The first bit error rate tester 1 is electrically connected to the light source test board 2. The light source test board 2 is used to send test sequence optical signals to the receiving end of the optical module. The light source test board 2 provides a test signal source for the optical module, ensuring that subsequent tests have a standard signal input and guaranteeing the accuracy of the test. The first bit error rate tester 1 is either an Anritsu MD1230A bit error rate tester or a Spirent SmartBits series bit error rate tester.
[0021] Attenuator 3 is positioned between the light source test board 2 and the test module test board 5. The output of the light source test board 2 is electrically connected to the input of attenuator 3, and the output of attenuator 3 is electrically connected to the test module test board 5. By adjusting the optical signal intensity through attenuator 3, different transmission environments can be simulated, making the test more closely resemble actual application scenarios and enhancing the comprehensiveness of the test. Specifically, attenuator 3 is a JDSU Variable Optical Attenuator 3 (VOA) module.
[0022] The extinction ratio tester 4 is electrically connected to the test module test board 5 and is used to measure the extinction ratio of the optical signal in the test sequence. The extinction ratio tester 4 measures the extinction ratio, which can evaluate the quality of the optical signal, promptly identify problems with the optical module's extinction ratio, and ensure the performance of the optical module. Specifically, the extinction ratio tester 4 is an EXFO FVA-3000 extinction ratio tester 4.
[0023] The second bit error rate tester 6 is electrically connected to the test module test board 5 and is used to receive the test sequence optical signal transmitted through the output end of the optical module. The second bit error rate tester 6 can detect the bit error rate of the optical module's output signal, facilitating a comprehensive evaluation of the optical module's transmission performance and improving product quality. Specifically, the second bit error rate tester 6 is either an Anritsu MD1230A bit error rate tester or a Spirent SmartBits series bit error rate tester.
[0024] During operation, the optical module to be tested is inserted into the test module test board 5; the first bit error rate tester 1 is electrically connected to the light source test board 2 and starts working. The light source test board 2 generates a test sequence optical signal according to a preset rule and sends the signal to the receiving end of the optical module that has been inserted into the test module test board 5, providing a standard input test signal for the optical module. Since the actual transmission environment may have signal attenuation, the attenuator 3 set between the light source test board 2 and the test module test board 5 starts to work, adjusting the intensity of the test sequence light signal output by the light source test board 2, simulating different transmission conditions, so that the test is more in line with the actual application scenario. The extinction ratio tester 4 is connected to the test module test board 5 to measure the extinction ratio of the optical signal in the test sequence after possible adjustments. The quality of the optical signal is evaluated by measuring the extinction ratio, thus determining the performance of the optical module in terms of optical signal characteristics. The second bit error rate tester 6 is connected to the test board 5 of the test module and receives the test sequence optical signal transmitted through the output end of the optical module. The second bit error rate tester 6 compares the received signal with the original test sequence to detect whether bit errors occur during the transmission process and calculates the bit error rate to comprehensively evaluate the transmission performance of the optical module. After completing the above tests, the optical module is assessed for compliance with quality standards based on the extinction ratio measurement and bit error rate detection results. If it meets the standards, the optical module passes the test and can proceed to subsequent production or use stages; if it does not meet the standards, further analysis and debugging are required, or the optical module may be treated as a non-conforming product.
[0025] In this embodiment, a first optical switch 7 is provided between the light source test board 2 and the attenuator 3; by controlling the opening and closing of the first optical switch 7, the transmission of the optical signal from the light source test board 2 to the attenuator 3 can be flexibly controlled.
[0026] One end of the first optical switch 7 is electrically connected to the output end of the light source test board 2, and the other end of the first optical switch 7 is electrically connected to the input end of the attenuator 3. This establishes a switching control link for the optical signal transmission path, facilitating the control of the on / off state of the light source test board 2 and the attenuator 3. This increases the flexibility of optical signal transmission path control, allowing for selection of whether the optical signal passes through the attenuator 3 according to different testing requirements, reducing unnecessary operational steps, improving testing efficiency, and lowering the risk of equipment damage.
[0027] In this embodiment, a second optical switch 8 and a third optical switch 9 are provided between the extinction ratio tester 4 and the optical module. By controlling the on / off state of these two optical switches, the transmission path of the optical signal can be flexibly selected. When it is necessary to measure the extinction ratio, the optical signal is guided to the extinction ratio tester 4; when it is not necessary to measure, the path can be switched to avoid unnecessary interference or loss to the extinction ratio tester 4.
[0028] The first optical switch 7, the second optical switch 8, and the third optical switch 9 are all equipped with a common terminal and a throw terminal; this structural design allows the optical switches to switch between different throw terminals, realizing diversified selection of optical signal transmission paths.
[0029] The throwing terminal of the first optical switch 7 is electrically connected to the light source test board 2, and the common terminal of the first optical switch 7 is electrically connected to the attenuator 3; it is used to control whether the light signal emitted by the light source test board 2 enters the attenuator 3.
[0030] The common terminal of the second optical switch 8 is electrically connected to the receiving end of the optical module, and the throwing terminal of the second optical switch 8 is electrically connected to the throwing terminal of the third optical switch 9; the common terminal of the third optical switch 9 is electrically connected to the receiving end of the extinction ratio tester 4, and the throwing terminal of the third optical switch 9 is electrically connected to the throwing terminal of the second optical switch 8. This enables flexible transmission of optical signals from the receiving end of the optical module to the extinction ratio tester 4.
[0031] The configuration and connection of the first optical switch 7, the second optical switch 8, and the third optical switch 9 increase the flexibility and controllability of the entire testing system. It can quickly adjust the optical signal transmission path according to different testing requirements, reduce the number of operation steps in the testing process, improve testing efficiency, and at the same time reduce equipment wear and tear and reduce production costs.
[0032] Specifically, the first optical switch 7, the second optical switch 8, and the third optical switch 9 can all be JDSU's 1×N electro-optic optical switch modules, utilizing the electro-optic effect to change the transmission path of optical signals. Electro-optic optical switches have advantages such as fast response speed and low insertion loss, and can be used for testing high-speed optical communication systems, meeting the requirements of scenarios with high testing speed and accuracy.
[0033] In this embodiment, the throwing terminal of the second optical switch 8 is electrically connected to the throwing terminal of the first optical switch 7, thus establishing an associated channel for the optical signal transmission path.
[0034] The first optical switch 7 controls whether the optical signal from the light source test board 2 enters subsequent attenuation stages, while the second optical switch 8 is responsible for switching the path of the optical signal at the optical module receiver. With their terminals connected, the flow of the optical signal in different testing stages can be more flexibly adjusted, allowing the entire testing system to quickly replan the optical signal transmission path according to different testing requirements.
[0035] This connection method significantly improves the flexibility and adaptability of the testing system, reducing the time and cost associated with rebuilding test lines or replacing equipment. It can efficiently meet the needs of diverse testing scenarios, improve testing efficiency, and reduce the complexity and error probability during the testing process.
[0036] In this embodiment, the first optical switch 7, the second optical switch 8, and the third optical switch 9 are each equipped with one common terminal and four throw terminals. This allows each optical switch to have more selectable optical signal transmission paths. In the optical module testing system, by controlling the connection status between the common terminal and each throw terminal of different optical switches, the optical signal can be flexibly guided to transmit between different testing devices (such as the light source test board 2, attenuator 3, extinction ratio tester 4, optical module, etc.), realizing the switching of multiple test modes and processes.
[0037] This significantly enhances the flexibility and versatility of the testing system, meeting the complex and diverse testing needs of optical modules. Test plans can be quickly adjusted without frequent hardware replacements or rebuilding of test circuits, improving testing efficiency, reducing testing costs and error rates, and enhancing the overall adaptability and scalability of the testing system.
[0038] In this embodiment, the first bit error rate tester 1 and the light source test board 2 are electrically connected via a coaxial cable. The coaxial cable has excellent shielding performance and stable signal transmission characteristics. The coaxial cable's characteristics allow the electrical signal generated by the first bit error rate tester 1 to be accurately and stably transmitted to the light source test board 2, providing precise test data excitation and ensuring that the light source test board 2 generates an optical signal that meets the test requirements based on this signal.
[0039] This connection method effectively reduces signal interference and attenuation during transmission, improves the quality and reliability of signal transmission, and thus enhances the accuracy and stability of the entire optical module testing system, helping to more accurately test and evaluate the performance of optical modules.
[0040] In this embodiment, the second bit error rate tester 6 and the test module test board 5 are electrically connected via a coaxial cable. The coaxial cable possesses excellent shielding performance, effectively resisting external electromagnetic interference while stably transmitting electrical signals. The coaxial cable's characteristics ensure that the electrical signal output from the second bit error rate tester 6 is accurately and stably transmitted to the test module test board 5, providing a reliable test signal input and guaranteeing that the test signal is not distorted and experiences minimal attenuation during transmission.
[0041] This connection method significantly improves the quality and reliability of signal transmission, reduces test errors caused by signal interference and attenuation, and thus improves the accuracy and stability of the entire test system for testing the bit error rate performance of optical modules, helping to more accurately evaluate the performance indicators of optical modules.
[0042] In this embodiment, both the first bit error rate tester 1 and the second bit error rate tester 6 are four-channel 10G bit error rate testers. The use of four-channel 10G bit error rate testers as the first and second bit error rate testers 1 and 6 allows the instrument to simultaneously perform bit error rate tests on four different signals, meeting the requirements for parallel testing of multiple signals and improving testing efficiency. The 10G rate indicates that it can meet the testing requirements of high-speed optical communication systems, enabling accurate bit error detection and analysis of high-speed transmitted signals. By accurately measuring the bit error rate that occurs during signal transmission, reliable data is provided for evaluating the performance of optical modules.
[0043] This configuration greatly enhances the parallel processing capability of the testing system and its ability to test high-speed optical modules. It can complete the bit error rate test of multiple optical modules or multiple signals of optical modules in a shorter time, improves testing efficiency, shortens the testing cycle, and ensures the accuracy and reliability of the test results. This helps to promptly identify problems in optical modules during high-speed transmission.
[0044] The above description is only a preferred embodiment of this utility model. For those skilled in the art, there will be changes in the specific implementation method and application scope based on the idea of this utility model. The content of this specification should not be construed as a limitation of this utility model.
Claims
1. A one-stop processing device for optical modules, characterized in that, It includes a first bit error rate tester (1), a light source test board (2), an attenuator (3), an extinction ratio tester (4), a test module test board (5), and a second bit error rate tester (6). The test module test board (5) is used to insert the optical module to be tested; The first bit error rate tester (1) is electrically connected to the light source test board (2), which is used to send test sequence optical signals to the receiving end of the optical module; The attenuator (3) is disposed between the light source test board (2) and the test module test board (5). The output end of the light source test board (2) is electrically connected to the input end of the attenuator (3), and the output end of the attenuator (3) is electrically connected to the test module test board (5). The extinction ratio tester (4) is electrically connected to the test module test board (5) and is used to measure the extinction ratio of the test sequence optical signal; The second bit error rate tester (6) is electrically connected to the test module test board (5) and is used to receive the test sequence optical signal transmitted through the output end of the optical module.
2. The one-stop optical module processing device according to claim 1, characterized in that, A first optical switch (7) is provided between the light source test board (2) and the attenuator (3); One end of the first optical switch (7) is electrically connected to the output end of the light source test board (2), and the other end of the first optical switch (7) is electrically connected to the input end of the attenuator (3).
3. The one-stop optical module processing device according to claim 2, characterized in that, A second optical switch (8) and a third optical switch (9) are provided between the extinction ratio tester (4) and the optical module. The first optical switch (7), the second optical switch (8), and the third optical switch (9) are all provided with a common terminal and a throw terminal; The throwing end of the first optical switch (7) is electrically connected to the light source test board (2), and the common end of the first optical switch (7) is electrically connected to the attenuator (3); The common terminal of the second optical switch (8) is electrically connected to the receiving terminal of the optical module, and the throwing terminal of the second optical switch (8) is electrically connected to the throwing terminal of the third optical switch (9). The common terminal of the third optical switch (9) is electrically connected to the receiving terminal of the extinction ratio tester (4), and the throwing terminal of the third optical switch (9) is electrically connected to the throwing terminal of the second optical switch (8).
4. The one-stop optical module processing device according to claim 3, characterized in that, The throwing terminal of the second optical switch (8) is electrically connected to the throwing terminal of the first optical switch (7).
5. The one-stop optical module processing device according to claim 3, characterized in that, The first optical switch (7), the second optical switch (8) and the third optical switch (9) are each provided with one common terminal and four throw terminals.
6. The one-stop optical module processing device according to claim 1, characterized in that, The first bit error rate tester (1) and the light source test board (2) are electrically connected via a coaxial line.
7. The one-stop optical module processing device according to claim 1, characterized in that, The second bit error rate tester (6) is electrically connected to the test module test board (5) via a coaxial cable.
8. The one-stop optical module processing device according to claim 1, characterized in that, Both the first bit error rate tester (1) and the second bit error rate tester (6) are four-channel 10G rate bit error rate testers.