Test mechanism for a turret sorting device

Abstract

The utility model provides a kind of testing mechanism for turret sorting equipment. The testing mechanism for turret sorting equipment is arranged at turret sorting equipment and adjacent thereto, and the testing mechanism includes bottom plate, pressing assembly and debugging assembly. The pressing assembly and debugging assembly are fixedly connected to the bottom plate. The pressing assembly has a pressure head that can push and shove the suction nozzle. The debugging assembly has a positioning seat for placing workpieces. The adjusting assembly can adjust the position of the positioning seat in horizontal direction, lateral direction and longitudinal direction. The testing mechanism for turret sorting equipment is accurate.

Description

Technical Field

[0001] This utility model relates to the field of mechanical technology, and more specifically to a testing mechanism for turret-type sorting equipment. Background Technology

[0002] Turret-type test and sorting equipment is a key piece of equipment in integrated circuit testing. It uses a rotating turret to carry multiple moving units, sequentially passing them through loading, testing, and sorting stations to achieve high-speed parallel testing. However, this equipment faces several challenges affecting yield during the testing phase: 1. Low testing efficiency: All chips, regardless of their quality, must undergo all tests, which takes too long and is costly.

[0003] 2. Unstable dynamic contact: Small fluctuations in the pressure of the nozzle's pick-up and drop action, the vacuum level, and the vibration when the turret stops rotating can all affect the contact quality between the chip and the test probe, leading to drift or failure of test parameters.

[0004] 3. Differences between stations: The machining and assembly errors of multiple moving units (nozzles) on the turret cause inconsistencies in the center coordinates, height, and rotation angle of each station, resulting in positional deviations when the chip is placed in the test socket, causing poor contact and false tests.

[0005] 4. Difficulty in pinpointing the problem: Traditional methods typically involve independently calibrating the mechanical parts of the equipment and optimizing the test procedures, but lack the means to deeply correlate mechanical motion parameters with real-time test data. When yield issues arise, troubleshooting the root cause is time-consuming. Utility Model Content

[0006] The purpose of this invention is to address the aforementioned problems in existing technologies by providing a testing mechanism for turret-type sorting equipment with high testing accuracy.

[0007] To achieve the above objectives, this utility model can be implemented through the following technical solutions: A testing mechanism for a turret sorting device, the turret sorting device including a turret and a plurality of suction nozzles circumferentially connected to the outside of the turret, the testing mechanism being disposed at and adjacent to the turret sorting device, characterized in that the testing mechanism includes a base plate, a pressing component, and an adjustment component, the pressing component and the adjustment component being fixedly connected to the base plate, the pressing component having a pressure head capable of pushing the suction nozzles, the adjustment component having a positioning seat for placing workpieces, and the adjustment component being capable of adjusting the position of the positioning seat in the horizontal and vertical directions in the horizontal direction.

[0008] In the aforementioned testing mechanism for turret-type sorting equipment, the pressing component includes a column and a linear motor. The column is vertically arranged and its lower end is fixedly connected to the base plate. The linear motor is fixedly connected to the column, and its output end can press against the suction nozzle after it is activated.

[0009] In the aforementioned testing mechanism for turret-type sorting equipment, the debugging component includes a base, a first guide rail, a first slider, a second guide rail, a second slider, and a connecting seat. The base is fixed to the bottom plate. The first guide rail is horizontally arranged on the upper part of the base. The lower part of the slider is connected to the first guide rail. The second guide rail is vertically arranged on the upper part of the first slider. The lower part of the second slider is connected to the second guide rail. The connecting seat is located on the upper part of the second slider and is recessed into the slider. The positioning seat is connected to the connecting seat.

[0010] In the aforementioned testing mechanism for turret-type sorting equipment, the inner cavity of the connecting seat is square, and two adjacent sides of the connecting seat are respectively threaded with locking component one and locking component two, the inner ends of the locking component one and locking component two can abut against the side of the positioning seat.

[0011] In the aforementioned test mechanism for turret-type sorting equipment, the number of locking elements on one side of the connecting seat is at least two.

[0012] In the aforementioned test mechanism for turret-type sorting equipment, the number of locking elements on the other side of the connecting seat is at least two.

[0013] In the aforementioned testing mechanism for turret-type sorting equipment, an adjusting component is fixedly connected to the base, and the output end of the adjusting component is fixedly connected to the slider.

[0014] In the aforementioned testing mechanism for turret-type sorting equipment, an adjusting component two is also fixedly connected to the base, and the output end of the adjusting component two is fixedly connected to the slider two.

[0015] In the aforementioned testing mechanism for turret-type sorting equipment, both the first and second adjusting components are micrometers.

[0016] In the aforementioned testing mechanism for turret-type sorting equipment, the base plate has a guide rail three, the lower part of the base is connected to the guide rail three, and a driving component is also fixedly connected to the base plate, which can drive the base to translate along the guide rail three.

[0017] Compared with existing technologies, the testing mechanism for turret-type sorting equipment has the following advantages: 1. The position of the debugging components can be calibrated and adjusted, demonstrating a high degree of integration; 2. The XY position and angle are adjusted using a micrometer, which improves the adjustment accuracy and allows for linear continuous fine-tuning before and during testing.

[0018] 3. By optimizing the consistency of test contacts, the accuracy of test results was ensured, thereby guaranteeing the quality of products leaving the factory.

[0019] 4. The structure is stable, which can effectively improve the test yield by about 5%. Attached Figure Description

[0020] Figure 1 This is a three-dimensional structural diagram of the testing mechanism used in turret-type sorting equipment.

[0021] Figure 2 This is a 3D structural diagram of the debugging component.

[0022] Figure 3 This is a three-dimensional structural diagram of the debugging component from another direction.

[0023] In the picture: 1. Turret; 2. Suction nozzle; 3. Base plate; 4. Column; 5. Linear motor; 6. Base; 7. Guide rail one; 8. Slider one; 9. Guide rail two; 10. Slider two; 11. Connecting seat; 12. Positioning seat; 13. Locking component one; 14. Locking component two; 15. Adjusting component one; 16. Adjusting component two; 17. Guide rail three; 18. Drive component. Detailed Implementation

[0024] The following are specific embodiments of the present invention, and the technical solution of the present invention will be further described in conjunction with the accompanying drawings.

[0025] like Figure 1-3 As shown, the turret sorting device includes a turret 1 and several suction nozzles 2 circumferentially connected to the outside of the turret 1.

[0026] The testing mechanism for the turret sorting equipment is located at and adjacent to the turret sorting equipment.

[0027] This testing mechanism includes a base plate 3, a pressing component, and an adjustment component. The pressing component and the adjustment component are both fixedly connected to the base plate 3. The pressing component has a pressure head that can push the suction nozzle, and the adjustment component has a positioning seat 12 for placing the workpiece. The adjustment component can adjust the position of the positioning seat 12 in the horizontal and vertical directions.

[0028] The chips used in the testing process are placed at position 12.

[0029] In the initial state, the pressing component and the adjustment component are positioned at the upper and lower parts of the nozzle 2, respectively. The function of the pressing component is to apply a pushing force to the nozzle 2. After being compressed, the nozzle 2 moves downward, ensuring stable contact with the adjustment component.

[0030] The adjustment component has the ability to adjust the horizontal position of the positioning seat 12, thereby ensuring stable contact between the nozzle 2 and the chip at the positioning seat 12.

[0031] The pressing component includes a column 4 and a linear motor 5. The column 4 is vertically arranged and its lower end is fixedly connected to the base plate 3. The linear motor is fixedly connected to the column 4 and its output end can press against the suction nozzle 2 after it is activated.

[0032] The column 4 enables the linear motor 5 to be stably positioned above the nozzle 2.

[0033] The debugging assembly includes a base 6, a guide rail 7, a slider 8, a guide rail 9, a slider 10, and a connecting seat 11. The base 6 is fixed to the base plate 3. The guide rail 7 is horizontally arranged on the upper part of the base 6. The lower part of the slider 8 is connected to the guide rail 7. The guide rail 9 is vertically arranged on the upper part of the slider 8. The lower part of the slider 10 is connected to the guide rail 9. The connecting seat 11 is located on the upper part of the slider 10 and is recessed into the slider 10. The positioning seat 12 is connected to the connecting seat 11.

[0034] Slider 8 moves along guide rail 7, enabling the positioning seat 12 to move stably in the horizontal direction.

[0035] Slider 10 moves along guide rail 9, enabling the positioning seat 12 to move stably in the horizontal direction.

[0036] Connector 11 provides sufficient space for positioning base 12 to connect.

[0037] The inner cavity of the connecting seat 11 is square. Two adjacent sides of the connecting seat 11 are respectively threaded with locking member 13 and locking member 24. The inner ends of the locking member 13 and locking member 24 can abut against the side of the positioning seat 12.

[0038] Under the action of locking element 13 and locking element 2 14, the positioning seat 12 can be stably positioned and connected in the connecting seat 11.

[0039] The number of locking elements 13 on one side of the connecting seat 11 is at least two.

[0040] The number of locking elements 14 on the other side of the connecting seat 11 is at least two.

[0041] Multiple locking elements 13 and 14 can effectively improve the connection stability between the positioning seat 12 and the connecting seat 11.

[0042] An adjusting member 15 is fixedly connected to the base 6, and the output end of the adjusting member 15 is fixedly connected to the slider 8.

[0043] An adjusting component 2 16 is also fixedly connected to the base 6, and the output end of the adjusting component 2 16 is fixedly connected to the slider 2 10.

[0044] Both the first adjusting element 15 and the second adjusting element 16 are micrometers.

[0045] The micrometer can precisely adjust the movement of the positioning seat, ensuring that the suction nozzle 2 can stably contact the workpiece on the positioning seat 12 after it moves down.

[0046] The base plate 3 has a guide rail 17, and the lower part of the base 6 is connected to the guide rail 17. The base plate 3 is also fixedly connected to a driving component 18, which can drive the base 6 to move along the guide rail 17.

[0047] Driven by the drive unit 18, the debugging component can quickly enter the debugging position of the turret sorting device and quickly exit from the debugging position.

[0048] The above-described technical solution of this utility model addresses the problem that existing technical solutions are too simplistic and provides a solution that is significantly different from existing technologies. The parts not covered in this application's technical solution are the same as or can be implemented using existing technologies, and will not be described in detail here.

[0049] The technical solutions in the above embodiments have clearly and completely described the content of this utility model. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

Claims

1. A testing mechanism for a turret-type sorting device, the turret-type sorting device comprising a turret and a plurality of suction nozzles circumferentially connected to the outside of the turret, the testing mechanism being disposed at and adjacent to the turret-type sorting device, characterized in that, This testing mechanism includes a base plate, a pressing component, and an adjustment component. The pressing component and the adjustment component are both fixedly connected to the base plate. The pressing component has a pressure head that can push the suction nozzle, and the adjustment component has a positioning seat for placing the workpiece. The adjustment component can adjust the position of the positioning seat in the horizontal and vertical directions in the horizontal direction.

2. The testing mechanism for a turret-type sorting device according to claim 1, characterized in that, The pressing component includes a column and a linear motor. The column is vertically arranged and its lower end is fixedly connected to the base plate. The linear motor is fixedly connected to the column and its output end can press against the suction nozzle after it is activated.

3. The testing mechanism for a turret-type sorting device according to claim 2, characterized in that, The debugging assembly includes a base, a first guide rail, a first slider, a second guide rail, a second slider, and a connecting seat. The base is fixed to the bottom plate. The first guide rail is horizontally arranged on the upper part of the base. The lower part of the slider is connected to the first guide rail. The second guide rail is vertically arranged on the upper part of the first slider. The lower part of the second slider is connected to the second guide rail. The connecting seat is located on the upper part of the second slider and is recessed into the slider. The positioning seat is connected to the connecting seat.

4. The testing mechanism for a turret-type sorting device according to claim 3, characterized in that, The inner cavity of the connecting seat is square, and two adjacent sides of the connecting seat are respectively threaded with locking component one and locking component two. The inner ends of locking component one and locking component two can abut against the side of the positioning seat.

5. The testing mechanism for a turret-type sorting device according to claim 4, characterized in that, The number of locking elements on one side of the connector is at least two.

6. The testing mechanism for a turret-type sorting device according to claim 5, characterized in that, The number of locking elements on the other side of the connector is at least two.

7. The testing mechanism for a turret-type sorting device according to claim 6, characterized in that, An adjusting component is fixedly connected to the base, and the output end of the adjusting component is fixedly connected to the slider.

8. The testing mechanism for a turret-type sorting device according to claim 7, characterized in that, An adjusting component two is also fixedly connected to the base, and the output end of the adjusting component two is fixedly connected to the slider two.

9. The testing mechanism for a turret-type sorting device according to claim 8, characterized in that, Both the first and second adjustment components are micrometers.

10. The testing mechanism for a turret-type sorting device according to claim 9, characterized in that, The base plate has a guide rail three, and the lower part of the base is connected to the guide rail three. A driving component is also fixedly connected to the base plate, and the driving component can drive the base to translate along the guide rail three.

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