A new type of test fixture

CN224802642UActive Publication Date: 2026-09-25CHENGDU TAC-GENRAY OPTOELECTRONICS TECH CO LTD +1
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Patent Information

Application Number
CN202522137982.5
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-10-10
Publication Date
2026-09-25
Estimated Expiration
2035-10-10

AI Technical Summary

Technical Problem

[0005]本实用新型第一方面的目的是解决现有测试治具在过于局限无法实现多种环境变量测试的技术问题,提供了一种新型测试治具,能够提前对多种光路进行搭建和测试

Benefits of technology

[0014]本实用新型的有益效果在于:将待测光器件和转接组件分别设置在指定的耦合组件上,使得转接组件能先在光路耦合调整台上单独进行光路检测,再将待测光器件放置于物料调整台上通过测试部进行光路检测,通过待测光器件放置前后的光路检测数值差即可获得测试结果,可以对光路方案进行提前搭建和测试验证。

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Abstract

The utility model relates to a novel test fixture, including base, light source part, function control part and test part, light source part, function control part and test part set up on the base, the function control part includes coupling assembly and adapter assembly, the light source part is used to provide broadband light source, coupling assembly includes optical path coupling adjustment platform and material adjustment platform, and optical path coupling adjustment platform is used for setting adapter assembly, and material adjustment platform is used for setting the optical device of measuring, adapter assembly connects test part, the utility model discloses through with the optical device of measuring and adapter assembly respectively setting on the specified coupling assembly, makes adapter assembly can first carry out optical path detection alone on optical path coupling adjustment platform, then places the optical device of measuring on material adjustment platform and carries out optical path detection through test part, obtains the test result through the optical path detection numerical difference of the optical device of measuring before and after placing, can carry out early construction and test verification to optical path scheme.
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Description

Technical Field

[0001] This utility model relates to the field of optical testing equipment technology, specifically to a novel testing fixture. Background Technology

[0002] To ensure the normal operation and accuracy of optical devices, it is necessary to test the pass-stop band, insertion loss, and isolation parameters of optical devices under different angles, wavelengths, and temperatures using test fixtures.

[0003] The core function of the incident light collimator is to correct the propagation direction of the incident light. If the collimator has performance defects, it will directly destroy the entire optical system. Testing the optical incident light collimator is to avoid subsequent optical path failures or errors due to substandard device performance. Essentially, it is to screen qualified parts in advance and eliminate the risk of failure.

[0004] However, existing test fixtures are difficult to control variables for testing in various environments, and a new type of test fixture is needed to improve the testing diversity of optical devices. Utility Model Content

[0005] The first aspect of this utility model aims to solve the technical problem that existing test fixtures are too limited to achieve testing of multiple environmental variables, and provides a new type of test fixture that can build and test multiple optical paths in advance.

[0006] To achieve the above objectives, this utility model provides a novel testing fixture, including a base, a light source, a function control unit, and a testing unit. The light source, function control unit, and testing unit are disposed on the base. The function control unit includes a coupling component and a transfer component. The light source includes a broadband light source for providing the broadband light required for testing. The coupling component includes an optical path coupling adjustment stage and a material adjustment stage. The optical path coupling adjustment stage is used to set the transfer component, and the material adjustment stage is used to set the optical device under test (DUT). The transfer component connects to the testing unit. This solution sets the DUT and the transfer component separately on designated coupling components, allowing the transfer component to first undergo optical path testing independently on the optical path coupling adjustment stage. Then, the DUT is placed on the material adjustment stage and subjected to optical path testing by the testing unit. The test result is obtained by the difference in optical path testing values ​​before and after the DUT is placed, enabling pre-construction and testing verification of the optical path scheme.

[0007] Preferably, the adapter assembly includes an input collimator and an output collimator, and the coupling assembly includes two optical path coupling adjustment stages. The two optical path coupling adjustment stages are arranged opposite to each other, and the input collimator and the output collimator are respectively placed on the two optical path coupling adjustment stages. The optical device under test is positioned between the input collimator and the output collimator. The two separate optical path coupling adjustment stages are used to adjust the relative positions of the input collimator and the output collimator, achieving optical path alignment between the output collimator and the input collimator.

[0008] Preferably, a material adjustment stage is disposed between the optical path coupling adjustment stages; and / or, the coupling component includes two material adjustment stages; and / or, the coupling component adopts a six-dimensional coupling platform. Distributing the material adjustment stage between the two optical path coupling adjustment stages allows the optical device under test (DUT) acting on the material adjustment stage to receive the optical path from the adapter component. Distributing two material adjustment stages allows for the placement of two different DUTs for synchronous testing.

[0009] Preferably, the function control unit further includes a polarizer, the light source unit is connected to the polarizer, and the polarizer is connected to the incident collimator of the adapter assembly. In this solution, the light source unit and the polarizer allow for adjustment of the polarization state of the broadband light source emitted from the light source via the polarizer.

[0010] Preferably, the testing unit includes an optical power meter and a spectrometer. The output collimator is connected to the optical power meter, or the output collimator is connected to the spectrometer. Both the output collimator and the optical power meter, and the output collimator and the spectrometer, are detachably connected via jumpers. When connected to the output collimator, the optical power meter detects and identifies the maximum power state of the collimator's output light. The spectrometer measures the spectrum of the output light from the output collimator after the optical power meter identifies the maximum power state. The optical power meter measures the power, and the spectrometer measures the spectral curve. At this point, the fiber optic connector at the output end is removed and connected to the spectrometer. The spectrometer scans and tests the initial spectral condition of the current state, and the data is saved.

[0011] To ensure the reliability of the final test results, a calibration component is preferably included. This calibration component comprises an assembly measuring component and a reference optics component. The calibration component acts on the base, and the reference optics component acts on the functional control unit. Alternatively, the assembly measuring component may be a dial indicator, micrometer, laser level, or flatness tester. The assembly measuring component is used to calibrate the base platform, ensuring a consistent testing environment for each test. Before formal operation, the reference optics component must be used to test the test fixture to determine the reliability of the test fixture's results. Any abnormalities can be adjusted promptly.

[0012] Preferably, the material adjustment table is equipped with a test carrier for placing the optical device under test. Placing the optical device under test on the material adjustment table using the test carrier facilitates the placement of the optical device under test, and allows for rapid testing of different optical devices under test by changing the test carrier.

[0013] The second aspect of this invention aims to solve the technical problem that existing test fixtures cannot regulate temperature. Further, the test fixture includes a fixture body, a thermistor, and a thermoelectric cooler. Both the thermistor and the thermoelectric cooler are integrated onto the fixture body. The thermistor is used to detect the real-time operating temperature of the fixture body, and the thermoelectric cooler is used to regulate the cooling or heating of the fixture body. The thermistor measures the cold surface temperature of the fixture body and determines whether its temperature is within a preset temperature range. By adjusting the current of the thermoelectric cooler, the test temperature of the fixture body is controlled, thereby enabling spectral testing of different optical devices under test under different temperature conditions.

[0014] The beneficial effects of this utility model are as follows: the optical device under test and the adapter component are respectively set on the designated coupling component, so that the adapter component can first be tested on the optical path coupling adjustment stage, and then the optical device under test is placed on the material adjustment stage and tested by the test unit. The test result can be obtained by the difference of the optical path test values ​​before and after the optical device under test is placed, which allows the optical path scheme to be built and tested in advance. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of the present invention. Figure 1 .

[0016] Figure 2 This is a schematic diagram of the structure of the present invention. Figure 2 .

[0017] Figure 3 This is a schematic diagram of the test vehicle of this utility model.

[0018] Figure 4 This is a flowchart illustrating the structure of this utility model.

[0019] The reference numerals in the attached figures include: 1. Broadband light source; 2. Coupling assembly; 21. Optical path coupling adjustment stage; 22. Material adjustment stage; 3. Adapter assembly; 31. Entrance collimator; 32. Exit collimator; 4. Polarizer; 5. Test carrier; 6. Test section; 7. Base; 8. Jumper wire; 9. Optical device under test. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0021] In this disclosure, unless otherwise stated, directional terms such as "inner" and "outer" are defined based on the contours of the corresponding components. Terms such as "first" and "second" used in this disclosure are for distinguishing one element from another and do not indicate sequence or importance.

[0022] like Figures 1-4 As shown, this utility model provides a novel testing fixture, including a base 7, a light source, a function control unit, and a testing unit 6. The light source, function control unit, and testing unit 6 are disposed on the base 7. The function control unit includes a coupling component 2 and a transition component 3. The light source includes a broadband light source 1, which is used to provide broadband light required for testing. The coupling component 2 includes an optical path coupling adjustment stage 21 and a material adjustment stage 22. The optical path coupling adjustment stage 21 is used to set the transition component 3, and the material adjustment stage 22 is used to set the optical device 9 to be tested. The transition component 3 is connected to the testing unit 6.

[0023] In this embodiment, the optical device under test 9 and the adapter component 3 are respectively placed on the designated coupling component 2, so that the adapter component 3 can first perform optical path detection on the optical path coupling adjustment stage 21, and then the optical device under test 9 is placed on the material adjustment stage 22 and the optical path is detected by the test unit 6. The test result can be obtained by the difference in the optical path detection values ​​before and after the optical device under test 9 is placed, which allows for the advance construction and testing verification of the optical path scheme.

[0024] In this embodiment, the light source is provided by a highly stable broadband light source 1, which can provide high broadband light from 1250nm to 1650nm.

[0025] like Figure 2 As shown, the adapter assembly 3 includes an input collimator 31 and an output collimator 32. The coupling assembly 2 includes two optical path coupling adjustment stages 21, which are arranged opposite to each other. The input collimator 31 and the output collimator 32 are respectively placed on the two optical path coupling adjustment stages 21. The optical device 9 to be tested is placed between the input collimator 31 and the output collimator 32. The two separate optical path coupling adjustment stages 21 are used to adjust the relative positions of the input collimator 31 and the output collimator 32 to achieve optical path alignment between the output collimator 32 and the input collimator 31.

[0026] The material adjustment stage 22 is disposed between the optical path coupling adjustment stages 21. The coupling component 2 includes two material adjustment stages 22 and adopts a six-dimensional coupling platform. The material adjustment stage 22 is disposed between the two optical path coupling adjustment stages 21 so that the optical device under test 9 acting on the material adjustment stage 22 can receive the optical path of the adapter component 3.

[0027] Furthermore, two material adjustment stages 22 are provided, which can accommodate two different optical devices 9 under test for simultaneous testing, allowing for the construction of more diverse optical path schemes. One or both material adjustment stages 22 can be used depending on the actual testing requirements.

[0028] The coupling component 2 adopts a six-dimensional coupling platform, which can adjust the X, Y, Z, and θ orientation pose of the platform at the output end of the six-dimensional coupling platform.

[0029] The functional control unit also includes a polarizer 4, which is connected to the light source unit. The polarizer 4 is connected to the incident collimator 31 of the adapter assembly 3. In this solution, the polarizer 4 allows for the adjustment of the polarization state of the light emitted from the broadband light source 1.

[0030] The testing unit 6 includes an optical power meter and a spectrometer. The light-emitting collimator 32 is connected to the optical power meter or the light-emitting collimator 32 is connected to the spectrometer. The light-emitting collimator 32 and the optical power meter, and the light-emitting collimator 32 and the spectrometer are detachably connected via jumpers 8. When the optical power meter is connected to the light-emitting collimator 32, it is used to detect and identify the maximum power state of the collimator output light. The spectrometer is used to test the spectrum of the light output light of the light-emitting collimator 32 after the optical power meter identifies the maximum power state.

[0031] The optical power meter is used to measure the power, and the spectrometer is used to measure the spectral curve. During the test, the output collimator 32 is first connected to the optical power meter via jumper 8. After adjusting the optical path to the maximum power state, the fiber optic connector at the output end is removed, the optical power meter is disconnected, and then the spectrometer is connected via jumper 8 to test the spectrum. The initial spectral condition of the current state is obtained by scanning with the spectrometer, and the data is saved.

[0032] Furthermore, in this embodiment, jumpers 8 are provided between the light source section, the function control section, and the test section 6 on the base 7. Specifically, an FC / APC to FC / UPC jumper 8 is used to connect the broadband light source 1 to the light input end of the polarizer 4, an FC / UPC to LC / UPC jumper 8 is used to connect the light output end of the polarizer 4 to the light input collimator 31, and an FC / UPC to LC / UPC jumper 8 is used to connect the light output collimator 32 to the test section 6.

[0033] like Figure 4As shown, in actual operation, the input collimator 31 is placed in the assembly position of one side of the optical path coupling adjustment stage 21, and the output collimator 32 is placed in the assembly position of the other side of the optical path coupling adjustment stage 21. The output collimator 32 is connected to the optical power meter. The X, Y, Z, and θ motion modules of the output optical path coupling adjustment stage are adjusted until the power in the optical power meter is at its maximum. At this time, the optical fiber connector at the output end of the jumper 8 connected to the output collimator 32 is removed and connected to the spectrometer. The scanning function on the spectrometer is used to test the initial spectral condition of the broadband light source 1 and the data is saved.

[0034] The optical device 9 to be tested is placed on the material adjustment stage 22 through the test carrier 5. The positions of the material adjustment stage 22 and the optical path coupling adjustment stages 21 on both sides are adjusted so that the optical paths of the input collimator 31 and the output collimator 32 are re-aligned after passing through the optical device 9. The output collimator 32 is re-coupled until the optical power reaches the maximum. At this time, the spectrometer is used to test again, and the spectral curve of the material can be obtained.

[0035] It is worth noting that during the test, the position of the optical path coupling adjustment stage 21 where the input collimator is placed is kept unchanged, and the optical path coupling adjustment stage 21 where the output collimator is placed and the material adjustment stage 22 are adjusted so that the optical device 9 under test is accurately connected to the optical path between the input collimator 31 and the output collimator 32.

[0036] To ensure the reliability of the final test results, this embodiment also includes a calibration component. The calibration component includes an assembly measuring component and a reference optical component. The calibration component acts on the base 7, and the reference optical component acts on the function control unit. The assembly measuring component is a dial indicator, micrometer, laser level, or flatness tester.

[0037] In the calibration assembly, the assembly measuring component is used to calibrate the flatness and levelness of the base 7, and the reference optical component is used to calibrate the optical path alignment accuracy of the transfer assembly 3 in the function control unit.

[0038] When assembling measuring components to calibrate the base 7 platform, it ensures the consistency of the test environment for each test. Before formal operation, it is necessary to test on the test fixture using reference optical components to determine whether the test fixture results are reliable. If any abnormalities occur, adjustments can be made in a timely manner.

[0039] like Figure 3 As shown, a test carrier 5 is provided on the material adjustment table 22, which is used to place the optical device 9 to be tested. Placing the optical device 9 to be tested on the material adjustment table 22 by using the test carrier 5 facilitates the placement of the optical device 9 to be tested, and different optical devices 9 to be tested can be quickly tested by changing the test carrier 5.

[0040] To address the technical problem that existing test fixtures cannot regulate temperature, the test carrier 5 in this embodiment includes a carrier body, a thermistor, and a thermoelectric cooler. Both the thermistor and the thermoelectric cooler are integrated into the carrier body. The thermistor is used to detect the real-time operating temperature of the carrier body, and the thermoelectric cooler is used for cooling or heating regulation of the carrier body.

[0041] The thermistor measures the temperature of the carrier 5 body and determines whether its temperature is within the preset temperature range. By adjusting the working current of the semiconductor cooler, the cold surface temperature of the semiconductor cooler is changed, thereby enabling spectral testing of different optical components under different temperature conditions.

[0042] Furthermore, the thermistor and the thermoelectric cooler are electrically connected via a control module. This control module is equipped with a processor, which can manually input or automatically set the test temperature and range based on the type of optical device under test. After detecting the temperature of the carrier body, the thermistor sends the temperature information to the control module. The control module determines whether the temperature information meets the temperature test conditions. If not, the control module controls the thermoelectric cooler to adjust the temperature of the carrier body.

[0043] The test fixture in this embodiment can be used to test optical devices such as diaphragms, isolators, and polarizers. By using broadband light sources, spectrometers, polarizers, and several coupling components to build a test platform, it is possible to test the pass-stop band, insertion loss, and isolation of optical devices under different angles, wavelengths, and temperature conditions.

[0044] The above descriptions are merely embodiments of this utility model, and common knowledge regarding specific structures and characteristics is not elaborated upon here. It should be noted that those skilled in the art can make various modifications and improvements without departing from the structure of this utility model, and these should also be considered within the scope of protection of this utility model. These modifications will not affect the effectiveness of the implementation of this utility model or the practicality of the patent. The scope of protection claimed in this application shall be determined by the content of its claims, and the specific embodiments described in the specification can be used to interpret the content of the claims.

Claims

1. A novel testing fixture, characterized in that: The device includes a base (7), a light source, a function control unit, and a test unit (6). The light source, function control unit, and test unit (6) are mounted on the base (7). The function control unit includes a coupling component (2) and a transfer component (3). The light source includes a broadband light source (1), which is used to provide broadband light required for testing. The coupling component (2) includes an optical path coupling adjustment stage (21) and a material adjustment stage (22). The optical path coupling adjustment stage (21) is used to set the transfer component (3), and the material adjustment stage (22) is used to set the optical device under test (9). The transfer component (3) is connected to the test unit (6).

2. The novel testing fixture according to claim 1, characterized in that: The adapter assembly (3) includes an input collimator (31) and an output collimator (32). The coupling assembly (2) includes two optical path coupling adjustment stages (21). The two optical path coupling adjustment stages (21) are arranged opposite to each other. The two optical path coupling adjustment stages (21) are respectively placed with the input collimator (31) and the output collimator (32). The optical device to be tested (9) is arranged between the input collimator (31) and the output collimator (32).

3. The novel testing fixture according to claim 2, characterized in that: Material adjustment stages (22) are provided between the optical path coupling adjustment stages (21); and / or, the coupling component (2) includes two material adjustment stages (22); and / or, the coupling component (2) adopts a six-dimensional coupling platform.

4. The novel testing fixture according to claim 1, characterized in that: The functional control unit also includes a polarizer (4), the light source unit is connected to the polarizer (4), and the polarizer (4) is connected to the incident collimator (31) of the adapter assembly (3).

5. A novel testing fixture according to claim 1, characterized in that: The test unit (6) includes an optical power meter and a spectrometer. The light output collimator (32) is connected to the optical power meter, or the light output collimator (32) is connected to the spectrometer. The light output collimator (32) and the optical power meter, and the light output collimator (32) and the spectrometer are detachably connected via jumpers (8). The optical power meter is used to detect and identify the maximum power state of the collimator output light when it is connected to the light output collimator (32). The spectrometer is used to test the spectrum of the light output light of the light output collimator (32) after the optical power meter identifies the maximum power state.

6. A novel testing fixture according to claim 1, characterized in that: It also includes a calibration component, which includes an assembly measuring component and a reference optical component. The calibration component acts on the base (7), and the reference optical component acts on the function control unit; and / or, the assembly measuring component is a dial indicator, micrometer, laser level or flatness tester.

7. A novel testing fixture according to claim 1, characterized in that: The material adjustment table (22) is equipped with a test carrier (5), which is used to place the optical device (9) to be tested.

8. A novel testing fixture according to claim 7, characterized in that: The test vehicle (5) includes a vehicle body, a thermistor and a semiconductor cooler. The thermistor and the semiconductor cooler are both integrated on the vehicle body. The thermistor is used to detect the real-time operating temperature of the vehicle body, and the semiconductor cooler is used to regulate the cooling or heating of the vehicle body.