A multi-functional transistor test fixture

Abstract

The utility model discloses a multifunctional transistor test fixture, including installation box and test board, the top outer wall of installation box is fixedly connected with installation frame, and the fixedly connected with support frame between the many sides inner wall of installation frame, and the every two sides inner wall of support frame is rotatably connected with the clamping plate through the rotating shaft, one side of clamping plate is equipped with the third sliding slot, one side of support frame is rotatably installed with the threaded rod through the embedded joint bearing, and the outer wall threaded connection of threaded rod has the taper block, and the outer wall of taper block is equipped with a plurality of second sliding slots, and the sliding rod is slidably connected in the second sliding slot, and one end of sliding rod is slidably inserted with installation frame one side. The utility model discloses through the rotation of threaded rod driven by screwing knob, to drive the taper block movement, and then make the sliding rod move in the second sliding slot, to make the connecting pin move in the third sliding slot, and then make a plurality of clamping plates gather to the middle, so the column body of transistor is clamped tightly, and the accuracy of test is improved.

Description

Technical Field

[0001] This utility model relates to the field of transistor technology, and in particular to a multifunctional transistor test fixture. Background Technology

[0002] A transistor is a solid-state semiconductor device, including diodes, triodes, field-effect transistors, thyristors, etc. Sometimes it specifically refers to bipolar devices. It has multiple functions such as detection, rectification, amplification, switching, voltage regulation, and signal modulation. When testing finished transistors, it is necessary to perform electrical tests on each of the transistor's terminals to complete the quality inspection of the transistor.

[0003] Currently, existing transistors with standardized specifications can only be clamped and fixed during testing, resulting in a lack of effective constraint on the device itself. This makes them prone to slight wobbling due to external forces during testing. Although this wobbling is difficult to detect with the naked eye, it can significantly affect high-precision parameter measurements. Therefore, in order to better achieve wobbling-free transistor testing, promote technological progress in the industry, and improve core technological competitiveness, this application proposes a new implementation scheme for transistor testing fixtures that differs from existing technologies. Utility Model Content

[0004] The purpose of this invention is to solve the problem of the lack of effective constraints on the existing device body, and to propose a multifunctional transistor test fixture.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: A multifunctional transistor test fixture includes a mounting box and a test board. A mounting frame is fixedly connected to the top outer wall of the mounting box. A support frame is fixedly connected between the multiple inner walls of the mounting frame. A clamping plate is rotatably connected between the inner walls of each side of the support frame via a rotating shaft. A third sliding groove is provided on one side of the clamping plate. A threaded rod is rotatably mounted on one side of the support frame via an interlocking bearing. A conical block is threadedly connected to the outer wall of the threaded rod. A plurality of second sliding grooves are provided on the outer wall of the conical block. A sliding rod is slidably connected in the second sliding groove. One end of the sliding rod is slidably inserted into one side of the mounting frame. Connecting pins are fixedly connected to both sides of the sliding rod, and the connecting pins slide in the third sliding groove.

[0006] Furthermore, a knob is fixedly connected to one end of the threaded rod, and the outer wall of the knob is provided with an anti-slip groove.

[0007] Furthermore, the top of the mounting box is fixedly connected to two support rods, and a hollow support block is fixedly connected between the two support rods. Multiple suction cups are embedded in the top of the support block, and the suction cups are in communication with the support block.

[0008] Furthermore, an air pump is fixedly connected to the bottom inner wall of the mounting box, and an air inlet pipe is sealed and inserted into the air inlet end of the air pump. The other end of the air inlet pipe is sealed and inserted into the bottom of the support block. Multiple air outlets are provided on one side of the mounting box.

[0009] Furthermore, guide rods are fixedly connected to both outer walls of the conical block, and the guide rods are slidably connected to one side of the mounting frame.

[0010] Furthermore, the top outer wall of the mounting box is provided with two first sliding grooves, and the test plate is slidably connected between the two first sliding grooves.

[0011] Furthermore, a connecting plate is fixedly connected to one side of the outer wall of the test plate, and a positioning pin is slidably inserted into the top of the connecting plate, with the bottom end of the positioning pin inserted into the top of the mounting box.

[0012] The beneficial effects of this utility model are as follows: 1. By turning the knob, the threaded rod rotates, which in turn moves the conical block, causing the slide bar to move in the second slide groove, which in turn moves the connecting pin in the third slide groove, causing multiple clamping plates to converge in the middle, thus clamping the transistor's shaft and improving the accuracy of the test.

[0013] 2. By using an air pump, the gas between the suction cup and the transistor pillar is drawn into the hollow support block, and then discharged through the air inlet and outlet, thereby adsorbing the transistor pillar and further fixing the transistor, thus improving the fixing effect. Attached Figure Description

[0014] Figure 1 This is a three-dimensional structural diagram of a multifunctional transistor test fixture proposed in this utility model; Figure 2 This is a side view of the clamping part of a multifunctional transistor test fixture proposed in this utility model. Figure 3 This is a rear view structural diagram of the clamping part of a multifunctional transistor test fixture proposed in this utility model; Figure 4 This is a partial three-dimensional structural diagram of a multifunctional transistor test fixture proposed in this utility model; Figure 5 This is a schematic cross-sectional view of the clamping plate structure of a multifunctional transistor test fixture proposed in this utility model; Figure 6 This is a schematic diagram of the suction cup section of a multifunctional transistor test fixture proposed in this utility model.

[0015] In the diagram: 1. Mounting box; 2. First slide groove; 3. Test plate; 4. Connecting plate; 5. Positioning pin; 6. Suction pump; 7. Support rod; 8. Support block; 9. Suction cup; 10. Air inlet pipe; 11. Mounting frame; 12. Support frame; 14. Threaded rod; 15. Conical block; 16. Second slide groove; 17. Clamping plate; 18. Slide rod; 19. Third slide groove; 20. Connecting pin. Detailed Implementation

[0016] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0017] Reference Figures 1-6 A multifunctional transistor test fixture includes a mounting box 1 and a test board 3. The test board 3 is a Digilent 410-413 transistor test board. The top outer wall of the mounting box 1 is fixed with a mounting frame 11 by bolts. The multiple inner walls of the mounting frame 11 are fixed with a support frame 12 by bolts. The inner walls of each side of the support frame 12 are rotatably connected with a clamping plate 17 by a rotating shaft. One end of the clamping plate 17 is glued with a rubber pad to increase the friction with the transistor and ensure that the transistor will not easily slip when fixed. A threaded rod 14 is rotatably mounted on one side of the support frame 12 via an interlocking bearing. A knob is fixed to one end of the threaded rod 14 by a bolt. A tapered block 15 is threadedly connected to the outer wall of the threaded rod 14. Multiple second sliding grooves 16 are provided on the outer wall of the tapered block 15. A sliding rod 18 is slidably connected in the second sliding groove 16. One end of the sliding rod 18 is slidably inserted into one side of the mounting frame 11. Connecting pins 20 are integrally formed on both sides of the sliding rod 18. A third slide groove 19 is provided on one side of the clamping plate 17. The connecting pin 20 slides in the third slide groove 19. Turning the knob drives the threaded rod 14 to rotate, thereby driving the conical block 15 to move, which in turn causes the slide rod 18 to move in the second slide groove 16, thereby causing the connecting pin 20 to move in the third slide groove 19, which in turn causes the multiple clamping plates 17 to converge in the middle, thus clamping the transistor's pillar.

[0018] The outer wall of the knob is provided with anti-slip grooves, which facilitates the operation of the threaded rod 14.

[0019] The top of the mounting box 1 is fixed with two support rods 7 by bolts. A hollow support block 8 is fixed between the two support rods 7 by bolts. The support rods 7 provide support for the support block 8. Multiple suction cups 9 are embedded in the top of the support block 8 and are connected to the support block 8. The bottom inner wall of the mounting box 1 is fixed with a suction pump 6 by bolts. The suction pump 6 is a miniature vacuum pump with model VP-1024. The air inlet end of the suction pump 6 is sealed and inserted with an air inlet pipe 10. The other end of the air inlet pipe 10 is sealed and inserted with the bottom of the support block 8. The mounting box 1 has multiple air vents on one side. Under the action of the air pump 6, the gas in the space between the suction cup 9 and the transistor pillar is drawn into the hollow support block 8 and then discharged through the air inlet pipe 10 and the air vents, thereby adsorbing the transistor pillar and further fixing the transistor.

[0020] Guide rods are fixed to both outer walls of the conical block 15 by bolts. The guide rods are slidably connected to one side of the mounting frame 11, thereby providing guidance for the movement of the conical block 15 and improving the stability of the transistor clamping.

[0021] The top outer wall of the mounting box 1 is provided with two first sliding grooves 2, and the test board 3 is slidably connected between the two first sliding grooves 2. This design provides space for the transistor to be clamped.

[0022] A connecting plate 4 is fixed to one side of the outer wall of the test board 3 by bolts. A positioning pin 5 is slidably inserted into the top of the connecting plate 4. The bottom end of the positioning pin 5 is inserted into the top of the mounting box 1. The transistor pins are fixed after being connected to the test board 3.

[0023] The working principle of this embodiment is as follows: In use, firstly, the transistor is placed on top of the support block 8, and the end of the transistor without pins is placed between multiple clamping plates 17. Then, the knob is turned to drive the threaded rod 14 to rotate, thereby causing the guide rod to move on the mounting frame 11, which in turn drives the conical block 15 to move, thereby causing the slide rod 18 to move in the second slide groove 16, and then causing the connecting pin 20 to move in the third slide groove 19, thereby causing the multiple clamping plates 17 to converge towards the middle, thereby clamping the transistor's column body. Then, the locking nut at one end of the threaded rod 14 is tightened to lock and clamp the clamping plates 17. Then, the suction pump 6 is started. Under the action of the suction pump 6, the gas in the space between the suction cup 9 and the transistor pillar is sucked into the hollow support block 8 and then discharged through the air inlet pipe 10 and the air outlet, thereby adsorbing the transistor pillar and further fixing the transistor. Next, the test board 3 is pushed along the first slide groove 2 so that the transistor pins are inserted into the test interface of the test board 3. The test board 3 is then fixed by the positioning pin 5. Then, the transistor is tested using the test board 3. After the test is completed, pull the test board 3 outward to separate the transistor pins from the test interface of the test board 3, and then turn the knob in the opposite direction to release the clamp on the transistor.

[0024] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. A multifunctional transistor test fixture, comprising a mounting box (1) and a test board (3), characterized in that, The top outer wall of the mounting box (1) is fixedly connected to a mounting frame (11). A support frame (12) is fixedly connected between the inner walls of the mounting frame (11). A clamping plate (17) is rotatably connected between the inner walls of each side of the support frame (12) via a rotating shaft. A third sliding groove (19) is provided on one side of the clamping plate (17). A threaded rod (14) is rotatably installed on one side of the support frame (12) via an interlocking bearing. A conical block (15) is threadedly connected to the outer wall of the threaded rod (14). A plurality of second sliding grooves (16) are provided on the outer wall of the conical block (15). A sliding rod (18) is slidably connected in the second sliding groove (16). One end of the sliding rod (18) is slidably inserted into one side of the mounting frame (11). A connecting pin (20) is fixedly connected to both sides of the sliding rod (18). The connecting pin (20) slides in the third sliding groove (19).

2. The multifunctional transistor test fixture according to claim 1, characterized in that, A knob is fixedly connected to one end of the threaded rod (14), and the outer wall of the knob is provided with an anti-slip groove.

3. The multifunctional transistor test fixture according to claim 1, characterized in that, The top of the mounting box (1) is fixedly connected to two support rods (7), and a hollow support block (8) is fixedly connected between the two support rods (7). Multiple suction cups (9) are embedded in the top of the support block (8), and the suction cups (9) are connected to the support block (8).

4. A multifunctional transistor test fixture according to claim 3, characterized in that, An air pump (6) is fixedly connected to the bottom inner wall of the mounting box (1). An air inlet pipe (10) is sealed and inserted into the air inlet end of the air pump (6). The other end of the air inlet pipe (10) is sealed and inserted into the bottom of the support block (8). Multiple air outlets are provided on one side of the mounting box (1).

5. A multifunctional transistor test fixture according to claim 1, characterized in that, Guide rods are fixedly connected to both outer walls of the conical block (15), and the guide rods are slidably connected to one side of the mounting frame (11).

6. A multifunctional transistor test fixture according to claim 1, characterized in that, The top outer wall of the mounting box (1) is provided with two first sliding grooves (2), and the test plate (3) is slidably connected between the two first sliding grooves (2).

7. A multifunctional transistor test fixture according to claim 1, characterized in that, A connecting plate (4) is fixedly connected to one side of the outer wall of the test plate (3). A positioning pin (5) is slidably inserted into the top of the connecting plate (4). The bottom end of the positioning pin (5) is inserted into the top of the mounting box (1).

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