Double crown spring assembly test probe device

Abstract

The utility model discloses a double crown spring assembly formula test probe device, including casing main part, riveting terminal and probe subassembly, through adopting riveting terminal, make this product can rivet with the end of connecting wire, replaced the traditional welding mode, make the assembly connection more efficient, and good stability, not easy to appear short circuit phenomenon because of the high density, simultaneously through the one end of riveting terminal is inserted into first plug -in hole and is positioned and is connected by first crown spring and is conducted, again cooperation fixed body one end inserts into second plug -in hole and is positioned and is connected by second crown spring and is conducted, like this makes casing main part, riveting terminal and probe subassembly form three -segment type quick -release assembly structure, can conveniently user is adjusted on the application scene nimblely, crown spring assembly is quick -release structure, guarantees good conductivity while saving assembly work time, can also satisfy user's follow -on replacement maintenance, can replace riveting terminal and probe subassembly according to need, bring the convenience for use.

Description

Technical Field

[0001] This utility model relates to the field of probe technology, and in particular to a double crown spring assembled test probe device. Background Technology

[0002] Test probes are core tools in the field of electronic testing used to establish temporary electrical connections, primarily for circuit testing, signal transmission, and device functionality verification. They achieve the transmission and analysis of current, voltage, or signals through physical contact with the object under test (such as circuit boards or component pins). Test probes are widely used in consumer electronics testing, automotive electronics testing, and aerospace testing, among other fields.

[0003] The current test probe mainly consists of a sleeve body, a probe body, and a spring. The sleeve body has a receiving hole at its front end, into which the probe body is telescopically positioned, with its front end extending beyond the receiving hole. The spring, located within the receiving hole, propels the probe body forward, providing elastic pressure to ensure stable contact between the probe body's front end and the test point, while preventing excessive pressure from damaging components. During assembly, the sleeve body is fixed to the PCB board, and the ends of external connecting wires are soldered and connected to the rear end of the sleeve body.

[0004] However, the aforementioned test probes require soldering to connect to the wiring. This spot soldering process is time-consuming, inefficient, and unstable. When the test probes are densely packed and there is excessive solder, short circuits can easily occur between adjacent probes. Furthermore, during high-frequency testing, the ends of the test probes are prone to damage. Since the test probes are non-removable, damage to either end necessitates the replacement of the entire probe, making subsequent maintenance very cumbersome. Therefore, it is necessary to improve the current test probes. Utility Model Content

[0005] In view of this, the present invention addresses the shortcomings of the existing technology and its main objective is to provide a double-crowned spring assembled test probe device, which can effectively solve the problems of low efficiency, poor stability, and troublesome replacement and maintenance of existing test probes that require welding and assembly with connecting wires.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] A double-crowned spring assembled test probe device includes a sleeve body, a rivet terminal, and a probe assembly. One end of the sleeve body has a first insertion hole with a first crown spring disposed therein, and the other end of the sleeve body has a second insertion hole with a second crown spring disposed therein. One end of the rivet terminal is inserted into the first insertion hole and held and positioned by the first crown spring, and is electrically connected. The other end of the rivet terminal has a riveting portion for riveting to the end of a connecting wire. The probe assembly includes a fixing body, a probe body, and a spring. One end of the fixing body is inserted into the second insertion hole and held and positioned by the second crown spring, and is electrically connected. The other end of the fixing body has a receiving hole. The probe body is movably disposed in the receiving hole, extending and retracting inwards and outwards. The spring is disposed in the receiving hole and causes the probe body to move outwards.

[0008] As a preferred embodiment, the first crown spring has a constricted structure, and one end of the rivet terminal is a first connecting part. The first connecting part is mushroom-shaped and is clamped and positioned by the first crown spring and is conductively connected to the first crown spring.

[0009] As a preferred embodiment, the second crown spring has a constricted structure, and one end of the fixing body is a second connecting part, which is mushroom-shaped. The second connecting part is clamped and positioned by the second crown spring and is conductively connected to the second crown spring.

[0010] As a preferred embodiment, the riveting part is cylindrical and has a riveting hole inside for inserting and fixing the end of the connecting wire.

[0011] As a preferred embodiment, a first limiting ring is formed at the opening of the first insertion hole, which limits the first crown spring within the opening of the first insertion hole.

[0012] As a preferred embodiment, the inner diameter of the front end of the second insertion hole is larger than the inner diameter of the rear end. The sleeve body is concave on the outside and convex on the inside, and a second limiting ring is formed at the middle position of the second insertion hole. The second limiting ring limits the second crown spring at the middle position of the second insertion hole.

[0013] As a preferred embodiment, the sleeve body is a machined part.

[0014] As a preferred embodiment, the other end of the fixing body is concave on the outside and convex on the inside, forming a third limiting ring in the receiving hole. The third limiting ring is close to the opening of the receiving hole. The rear end of the probe body has a limiting part. The third limiting ring limits the limiting part in the receiving hole. The two ends of the spring abut against the bottom surface of the receiving hole and the end face of the limiting part, respectively.

[0015] Compared with the prior art, this utility model has obvious advantages and beneficial effects. Specifically, as can be seen from the above technical solution:

[0016] By employing riveting terminals, this product can be riveted to the ends of connecting wires, replacing the traditional welding method. This makes assembly and connection more efficient and stable, and less prone to short circuits due to high density. Furthermore, by inserting one end of the riveting terminal into the first insertion hole and holding it in place and connected by the first crown spring, and then inserting the other end of the fixing body into the second insertion hole and holding it in place and connected by the second crown spring, the sleeve body, riveting terminal, and probe assembly form a three-section quick-release assembly structure. This allows users to flexibly adjust the assembly according to application scenarios. The crown spring assembly is a quick-release structure, ensuring good conductivity while saving assembly time. It also allows users to replace and maintain the components as needed, making it convenient to use.

[0017] To more clearly illustrate the structural features and effects of this utility model, the following detailed description of this utility model is provided in conjunction with the accompanying drawings and specific embodiments. Attached Figure Description

[0018] Figure 1 This is a three-dimensional assembly diagram of a preferred embodiment of the present invention;

[0019] Figure 2 This is an exploded view of a preferred embodiment of the present invention;

[0020] Figure 3 This is a cross-sectional view of a preferred embodiment of the present invention;

[0021] Figure 4 yes Figure 3 Enlarged view of position A in the middle;

[0022] Figure 5 yes Figure 3 Enlarged view of position B in the middle;

[0023] Figure 6 This is a perspective view of the preferred embodiment of the present invention in use.

[0024] Explanation of reference numerals in the attached diagram:

[0025] 10. Sleeve body 11. First crown spring

[0026] 12. Second crown spring 101. First insertion hole

[0027] 102. Second insertion hole; 103. First limiting ring

[0028] 104, Second limiting ring 20, Riveting terminal

[0029] 21. Riveting part; 22. First connecting part

[0030] 23. First limiting boss 201, rivet hole

[0031] 202, First vent hole 30, Probe assembly

[0032] 31. Fixing body 311. Second connecting part

[0033] 312, Second limiting boss; 32, Probe body

[0034] 321. Limiting part; 322. Contact head

[0035] 33. Spring 301, Receiving Hole

[0036] 302, Second vent; 303, Third limiting ring

[0037] 40. PCB board; 41. Mounting holes. Detailed Implementation

[0038] Please refer to Figures 1 to 6 As shown, it illustrates the specific structure of a preferred embodiment of the present invention, including a sleeve body 10, a rivet terminal 20, and a probe assembly 30.

[0039] The sleeve body 10 has a first insertion hole 101 at one end, in which a first crown spring 11 is disposed. The sleeve body 10 also has a second insertion hole 102 at the other end, in which a second crown spring 12 is disposed. In this embodiment, the sleeve body 10 is machined, allowing for precise assembly and good conductivity. It can also be produced in different lengths and diameters to meet various user needs, providing flexibility for user use. The sleeve body 10 is an overall metal cylindrical structure. A first limiting ring 103 is formed at the inwardly recessed opening of the first insertion hole 101, which limits the first crown spring 11 within the opening of the first insertion hole 101. Furthermore, the inner diameter of the front end of the second insertion hole 102 is larger than the inner diameter of the rear end. A second limiting ring 104 is formed at the middle position of the second insertion hole 102 on the sleeve body 10, which is concave on the outside and convex on the inside. This second limiting ring 104 limits the second crown spring 12 to a position near the center of the second insertion hole 102. Additionally, both the first crown spring 11 and the second crown spring 12 have a constricted opening structure.

[0040] One end of the rivet terminal 20 is inserted into the first insertion hole 101 and held and positioned by the first crown spring 11, and is electrically connected. The other end of the rivet terminal 20 has a riveting portion 21 for riveting to the end of the connecting wire. In this embodiment, the rivet terminal 20 is a metal cylindrical structure. One end of the rivet terminal 20 is a first connecting portion 22, which is mushroom-shaped. The first connecting portion 22 is held and positioned by the first crown spring 11 and is electrically connected to the first crown spring 11 to better achieve convenient and efficient assembly. At the same time, it ensures that the rivet terminal 20 has a certain clamping force after insertion, making it less likely to be pulled out due to vibration or other problems, thus ensuring the "easy to insert, difficult to remove" characteristic of the rivet terminal 20, which can meet various user application scenarios and reliability tests. The riveting portion 21 is cylindrical, and has a rivet hole 201 inside for the end of the connecting wire to be inserted and riveted for fixation. Furthermore, the outer surface of the rivet terminal 20 extends radially to form a first limiting boss 23, which abuts against the end face of the sleeve body 10 and covers the opening of the first insertion hole 101. In addition, the outer surface of the rivet terminal 20 is provided with a first vent hole 202, which communicates with the rear end of the rivet hole 201 to better rivet and fix the end of the connecting wire.

[0041] The probe assembly 30 includes a fixing body 31, a probe body 32, and a spring 33. One end of the fixing body 31 is inserted into the second insertion hole 102 and held and positioned by the second crown spring 12, and is electrically connected. The other end of the fixing body 31 has a receiving hole 301. The probe body 32 is movably disposed in the receiving hole 301, extending and retracting inwards. The spring 33 is disposed in the receiving hole 301, and the spring 33 causes the probe body 32 to move outwards. Specifically:

[0042] The fixing body 31 is an overall metal cylindrical structure. One end of the fixing body 31 is a second connecting part 311, which is mushroom-shaped. The second connecting part 311 is clamped and positioned by a second crown spring 12 and is conductively connected to the second crown spring 12 to better achieve convenient and efficient assembly. At the same time, it ensures that the fixing body 31 has a certain clamping force after insertion, making it less likely to be pulled out due to vibration or other problems, thus ensuring the "easy to insert but difficult to remove" characteristic of the fixing body 31, which can meet the needs of users in various usage scenarios and reliability tests. In addition, the outer surface of the fixing body 31 extends radially to form a second limiting boss 312, which abuts against the end face of the sleeve body 10 and covers the opening of the second insertion hole 102. Furthermore, the outer surface of the fixing body 31 has a second vent hole 302, which is connected to the rear end of the second insertion hole 102, so that the probe body 32 can move smoothly in and out of the receiving hole 301. In addition, the other end of the fixing body 31 is concave on the outside and convex on the inside, forming a third limiting ring 303 in the receiving hole 301, which is close to the opening of the receiving hole 301.

[0043] The probe body 32 is an overall metal cylindrical structure. The rear end of the probe body 32 has a limiting portion 321. The third limiting ring 303 limits the limiting portion 321 within the receiving hole 301, preventing the probe body 32 from completely detaching from the receiving hole 301. The probe body 32 has a contact head 322, which is cylindrical. The outer diameter of the contact head 322 is larger than the inner diameter of the receiving hole 301, so that the contact head 322 remains outside the receiving hole 301.

[0044] The spring 33 is a metal spring to ensure conductivity. The two ends of the spring 33 abut against the bottom surface of the receiving hole 301 and the end surface of the limiting part 321, respectively.

[0045] The usage method of this embodiment is described in detail below:

[0046] In use, the sleeve body 10 is inserted into the fixing hole 41 of the PCB board 40 and fixed. Then, the end of the connecting wire is inserted into the riveting hole 201 and riveted to the riveting part 21 to achieve the conductive connection between the connecting wire and the riveting terminal 20. During testing, the workpiece to be tested is brought close to and contacted with the contact head 322 of the probe body 32.

[0047] When the rivet terminal 20 is damaged and needs to be replaced, forcefully pull the damaged rivet terminal 20 out of the first insertion hole 101, and then insert another rivet terminal 20 into the first insertion hole 101 for installation and fixation.

[0048] When the probe assembly 30 is damaged and needs to be replaced, forcefully pull the damaged probe assembly 30 out of the second insertion hole 102, and then insert another probe assembly 30 into the second insertion hole 102 for installation and fixation.

[0049] The key design feature of this invention is the use of riveting terminals, which allows the product to be riveted to the end of the connecting wire, replacing the traditional welding method. This makes assembly and connection more efficient and stable, and less prone to short circuits due to high density. Furthermore, by inserting one end of the riveting terminal into the first insertion hole and clamping and positioning it with the first crown spring, and connecting it to the wire, and then inserting the other end of the fixing body into the second insertion hole and clamping and positioning it with the second crown spring, a three-section quick-release assembly structure is formed, comprising the sleeve body, the riveting terminal, and the probe assembly. This allows users to flexibly adjust the assembly according to application scenarios. The crown spring assembly is a quick-release structure, ensuring good conductivity while saving assembly time. It also allows users to replace and maintain the components as needed, making it convenient to use.

[0050] The above description is merely a preferred embodiment of the present utility model and does not constitute any limitation on the technical scope of the present utility model. Therefore, any minor modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present utility model shall still fall within the scope of the technical solution of the present utility model.

Claims

1. A double-crowned spring assembled test probe device, characterized in that: The device includes a sleeve body, a rivet terminal, and a probe assembly. One end of the sleeve body has a first insertion hole with a first crown spring inside. The other end of the sleeve body has a second insertion hole with a second crown spring inside. One end of the rivet terminal is inserted into the first insertion hole and held and positioned by the first crown spring, providing conductive connection. The other end of the rivet terminal has a riveting portion for riveting to the end of a connecting wire. The probe assembly includes a fixing body, a probe body, and a spring. One end of the fixing body is inserted into the second insertion hole and held and positioned by the second crown spring, providing conductive connection. The other end of the fixing body has a receiving hole. The probe body is movably and telescopically disposed within the receiving hole. The spring is disposed within the receiving hole and causes the probe body to move outward.

2. The double-crowned spring assembled test probe device according to claim 1, characterized in that: The first crown spring has a constricted structure, and one end of the rivet terminal is a first connecting part. The first connecting part is mushroom-shaped and is clamped and positioned by the first crown spring and is conductively connected to the first crown spring.

3. The double-crown-spring assembled test probe device according to claim 1, characterized in that: The second crown spring has a constricted structure. One end of the fixing body is the second connecting part, which is mushroom-shaped. The second connecting part is clamped and positioned by the second crown spring and is conductively connected to the second crown spring.

4. The double-crown-spring assembled test probe device according to claim 1, characterized in that: The riveting part is cylindrical, and has a riveting hole inside for inserting and fixing the end of the connecting wire.

5. The double-crown-spring assembled test probe device according to claim 1, characterized in that: A first limiting ring is formed at the inward recess of the opening of the first insertion hole, which limits the first crown spring within the opening of the first insertion hole.

6. The double-crown spring assembled test probe device according to claim 1, characterized in that: The inner diameter of the front end of the second insertion hole is larger than the inner diameter of the rear end. The sleeve body is concave on the outside and convex on the inside, and a second limiting ring is formed at the middle position of the second insertion hole. The second limiting ring limits the second crown spring at the middle position of the second insertion hole.

7. The double-crown-spring assembled test probe device according to claim 1, characterized in that: The main body of the sleeve is a machined part.

8. The double-crown spring assembled test probe device according to claim 1, characterized in that: The other end of the fixing body is concave on the outside and convex on the inside, forming a third limiting ring in the receiving hole. The third limiting ring is close to the opening of the receiving hole. The rear end of the probe body has a limiting part. The third limiting ring limits the limiting part in the receiving hole. The two ends of the spring abut against the bottom surface of the receiving hole and the end face of the limiting part, respectively.

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