Probe structure, jig detection device and jig point detection machine

Abstract

The utility model belongs to jig detection technical field relates to a kind of probe structure, jig detection device and jig spot inspection machine.The probe structure includes probe, guide sleeve, guide column, elastic member and first locking piece, the guide sleeve is provided with guide hole, the guide hole has the first opening and the second opening opposite along the first direction, the guide column is movably installed in the guide sleeve along the first direction, and at least part of the guide column is located in the guide hole;The probe is threadedly connected with the guide column and exposes in the first opening;The first locking piece is threadedly connected with the guide sleeve and can be plugged to the second opening, the elastic member is arranged in the guide hole, and the elastic member is elastically supported between the first locking piece and guide column.The probe structure can make the replacement of probe more simple and fast.

Description

Technical Field

[0001] This utility model belongs to the field of fixture testing technology, and in particular relates to a probe structure, a fixture testing device, and a fixture inspection machine. Background Technology

[0002] The probes on the fixture inspection machine will generally wear down during fixture inspection, and need to be replaced in time when the wear is significant. However, existing probes are generally mounted on the probe mounting structure in a fixed connection manner. If the probe needs to be replaced, the probe and the probe mounting structure must be replaced together, which is quite difficult. Utility Model Content

[0003] The technical problem to be solved by this utility model is to provide a probe structure, a fixture testing device, and a fixture inspection machine, addressing the technical problem of the difficulty in replacing probes in the prior art.

[0004] To address the aforementioned technical problems, in one aspect, this utility model provides a probe structure, including a probe, a guide sleeve, a guide post, an elastic element, and a first locking element. The guide sleeve has a guide hole with a first opening and a second opening opposite each other along a first direction. The guide post is movably mounted on the guide sleeve along the first direction, and at least a portion of the guide post is located within the guide hole. The probe is threaded to the guide post and protrudes from the first opening. The first locking element is threadedly connected to the guide sleeve and can seal the second opening. The elastic element is disposed in the guide hole and is elastically supported between the first locking element and the guide post.

[0005] According to the probe structure of this utility model embodiment, by threading the probe to the guide post, the replacement of the probe is simpler and faster. In addition, since the elastic element is elastically supported between the first locking element and the guide post, the elastic deformation of the elastic element can buffer the probe during probe detection, which can effectively reduce probe wear and save replacement costs.

[0006] Optionally, the guide hole wall is provided with a first limiting part, and the guide post is provided with a second limiting part. The second limiting part cooperates with the first limiting part to prevent the guide post from coming out of the first opening.

[0007] Optionally, the guide hole includes a first hole segment and a second hole segment that communicate along a first direction, the first opening is located on the side of the first hole segment away from the second hole segment, and the second opening is located on the side of the second hole segment away from the first hole segment; the cross-sectional area of ​​the first hole segment is smaller than the cross-sectional area of ​​the second hole segment, and a first limiting surface is formed at the position where the first hole segment and the second hole segment meet; The guide post includes a first column segment and a second column segment. The second column segment is disposed within the second hole segment, and the first column segment is connected to the side of the second column segment away from the second opening. The cross-sectional area of ​​the first column segment is smaller than that of the second column segment, and a second limiting surface is formed at the junction of the first column segment and the second column segment. The first limiting surface can abut against the second limiting surface; The probe is threadedly connected to the first column segment, and the elastic element is elastically supported between the first locking element and the second column segment.

[0008] Optionally, the guide post further includes a third column segment, which is connected to the side of the second column segment away from the first column segment. One end of the elastic member is sleeved on the third column segment and elastically abuts against the second column segment, while the other end of the elastic member elastically abuts against the first locking member.

[0009] Optionally, a portion of the guide post is located within the guide hole, while the remaining portion of the guide post extends out of the guide sleeve through the first opening.

[0010] Optionally, at least a portion of the first locking fastener is threaded into the guide hole.

[0011] Optionally, the first locking fastener includes a first part and a second part connected along a first direction, the first part being threaded into the guide hole, and the second part extending out of the guide sleeve from the second opening; The probe structure further includes a second locking member, which is threadedly connected to the outer wall of the second part and can abut against the guide sleeve.

[0012] Optionally, the probe structure further includes a conductive element, through which the probe is threadedly connected to the guide post.

[0013] Optionally, the probe has a limiting protrusion on its outer periphery, and the conductive element is clamped between the limiting protrusion and the guide post along the first direction.

[0014] On the other hand, this utility model embodiment provides a fixture testing device, including a mounting frame, a driving component, a camera component, and the probe structure described above. The driving component is mounted on the mounting frame, and the output end of the driving component is connected to the probe structure. The driving component is used to drive the probe structure to move along the first direction. The camera component is movably mounted on the mounting frame along the first direction, and the camera component is used to capture and position the fixture.

[0015] According to the fixture testing device of this utility model embodiment, the probe structure connects the probe threaded to the guide post, making the replacement of the probe simpler and faster. In addition, since the elastic element is elastically supported between the first locking fastener and the guide post, the elastic deformation of the elastic element can buffer the probe during probe testing, which can effectively reduce probe wear and save replacement costs.

[0016] In another aspect, this utility model embodiment provides a fixture inspection machine, including an inspection platform and the aforementioned fixture detection device. The inspection platform is used to place the fixture, the camera component is used to capture and position the fixture on the inspection platform, and the probe structure is used to inspect the fixture on the inspection platform.

[0017] According to the present invention, the fixture inspection machine has a probe structure that connects the probe threadedly to the guide post, making probe replacement simpler and faster. In addition, since the elastic element is elastically supported between the first locking fastener and the guide post, the elastic deformation of the elastic element can buffer the probe during probe inspection, effectively reducing probe wear and saving replacement costs. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of a probe structure provided in an embodiment of the present invention; Figure 2 This is a cross-sectional view of a probe structure provided in an embodiment of the present invention; Figure 3 This is an exploded view of a probe structure provided in an embodiment of the present invention; Figure 4 yes Figure 3 A cross-sectional view of the guide sleeve in the middle; Figure 5 This is a schematic diagram of a fixture testing device provided in an embodiment of the present invention.

[0019] The reference numerals in the accompanying drawings are as follows: 10. Probe structure; 1. Probe; 11. Limiting protrusion; 2. Guide sleeve; 21. Guide hole; 21a. First opening; 21b. Second opening; 211. First hole section; 212. Second hole section; 213. First limiting surface; 3. Guide post; 31. First post segment; 32. Second post segment; 33. Third post segment; 34. Second limiting surface; 4. Elastic components; 5. First locking component; 51. First part; 52. Second part; 6. Second locking device; 7. Conductive components; 20. Mounting bracket; 30. Drive assembly; 40. Camera assembly; z, First direction. Detailed Implementation

[0020] To make the technical problems solved, technical solutions, and beneficial effects of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0021] like Figures 1 to 4 As shown, the probe structure 10 provided in this embodiment of the present invention includes a probe 1, a guide sleeve 2, a guide post 3, an elastic element 4, and a first locking element 5. A guide hole 21 is provided inside the guide sleeve 2, and the guide hole 21 has a first opening 21a and a second opening 21b opposite each other along a first direction z. The guide post 3 is movably mounted on the guide sleeve 2 along the first direction z, and at least a portion of the guide post 3 is located within the guide hole 21. The probe 1 is threadedly connected to the guide post 3 and protrudes from the first opening 21a.

[0022] The first locking fastener 5 is threadedly connected to the guide sleeve 2 and can seal the second opening 21b. The elastic element 4 is disposed in the guide hole 21 and is elastically supported between the first locking fastener 5 and the guide post 3 along the first direction z.

[0023] For example, the connection between the first locking component 5 and the guide sleeve 2 is a threaded connection. The first locking component 5 can be installed or removed from the guide sleeve 2 by rotating it clockwise or counterclockwise. Further, it can be as follows... Figures 1 to 4 In the embodiment shown, an external thread is provided on the outer surface of the first locking fastener 5, and an internal thread is provided on the hole wall of the guide hole 21. The threaded connection is achieved through the external thread of the first locking fastener 5 and the internal thread of the guide sleeve 2. Alternatively, in other embodiments not shown in the figure, an external thread can also be provided on the outer surface of the guide sleeve, and the first locking fastener can be selected as a cap-type structure with internal threads (similar to a bottle cap with internal threads). The threaded connection is achieved through the external thread of the guide sleeve and the internal thread of the first locking fastener.

[0024] The probe structure 10 provided in this embodiment of the invention makes the replacement of probe 1 simpler and faster by threading probe 1 to guide post 3. Furthermore, since the elastic element 4 is elastically supported between the first locking fastener 5 and guide post 3, the elastic deformation of the elastic element 4 can buffer probe 1 during detection, and the elastic force of the elastic element 4 can be adjusted by adjusting the first locking fastener 5, effectively reducing wear on probe 1 and saving replacement costs. In addition, since the first locking fastener 5 can seal the second opening 21b, it can prevent guide post 3 from slipping out of the guide sleeve 2 through the second opening 21b.

[0025] In one embodiment, such as Figure 2 As shown, the guide hole 21 has a first limiting part 21c on its wall and a second limiting part 3a on its guide post 3. The second limiting part 3a and the first limiting part 21c are mutually limiting and cooperating to prevent the guide post 3 from coming out of the first opening 21a.

[0026] By providing a first limiting part 21c and a second limiting part 3a on the hole wall of the guide hole 21 and the guide post 3 respectively, the guide post 3 can be limited by the second limiting part 3a and the first limiting part 21c to prevent it from falling out of the guide sleeve 2.

[0027] In one embodiment, such as Figure 2 and Figure 3 As shown, the guide hole 21 includes a first hole segment 211 and a second hole segment 212 that are connected along a first direction z. A first opening 21a is located on the side of the first hole segment 211 away from the second hole segment 212, and a second opening 21b is located on the side of the second hole segment 212 away from the first hole segment 211. The cross-sectional area of ​​the first hole segment 211 is smaller than the cross-sectional area of ​​the second hole segment 212. A first limiting surface 213 is formed at the junction of the first hole segment 211 and the second hole segment 212. The first limiting part 21c is formed by the first limiting surface 213.

[0028] The guide post 3 includes a first post segment 31 and a second post segment 32. The second post segment 32 is disposed within the second hole segment 212, and the first post segment 31 is connected to the side of the second post segment 32 away from the second opening 21b. The cross-sectional area of ​​the first post segment 31 is smaller than that of the second post segment 32, and a second limiting surface 34 is formed at the junction of the first post segment 31 and the second post segment 32. The second limiting part 3a is formed by the second limiting surface 34.

[0029] The first limiting surface 213 can abut against the second limiting surface 34.

[0030] The probe 1 is threaded to the first column segment 31, and the elastic element 4 is elastically supported between the first locking element 5 and the second column segment 32.

[0031] By abutting the first limiting surface 213 and the second limiting surface 34, the guide sleeve 2 limits the guide post 3, preventing the guide post 3 from coming out of the first opening 21a and out of the guide sleeve 2.

[0032] In one embodiment, such as Figure 2 and Figure 4 As shown, the guide post 3 also includes a third post segment 33, which is connected to the side of the second post segment 32 away from the first post segment 31. One end of the elastic member 4 is sleeved on the third post segment 33 and elastically abuts against the second post segment 32, and the other end of the elastic member 4 elastically abuts against the first locking member 5.

[0033] By setting the third column segment 33, the installation of the elastic element 4 can be limited, preventing the elastic element 4 from moving relative to the guide column 3.

[0034] In one embodiment, such as Figure 2 As shown, part of the guide post 3 is located inside the guide hole 21, and the rest of the guide post 3 extends out of the guide sleeve 2 through the first opening 21a.

[0035] At this time, part of the guide post 3 is located inside the guide sleeve 2, and part of it is exposed outside the guide sleeve 2, which facilitates the installation of the probe 1.

[0036] In one embodiment, such as Figure 2 As shown, at least a portion of the first locking fastener 5 is threaded into the guide hole 21.

[0037] By threading at least a portion of the first locking fastener 5 to the wall of the guide hole 21, the first locking fastener 5 is connected to the guide sleeve 2. Simultaneously, the first locking fastener 5 can seal the second opening 21b, preventing the guide post 3 from dislodging from the second opening 21b and exiting the guide sleeve 2. Furthermore, when the first locking fastener 5 is threaded to the guide sleeve 2 via the first portion 51, the compression of the elastic element 4 can be adjusted by adjusting the length of the threaded connection of the first locking fastener 5 to the guide hole 21, thereby adjusting the pressure of the probe 1. In addition, since the elastic element 4 is elastically supported between the first locking fastener 5 and the guide post 3 along the first direction z, the thread gap between the first locking fastener 5 and the guide sleeve 2 can be eliminated by the elastic element 4.

[0038] In one embodiment, such as Figure 2 As shown, the first locking device 5 includes a first part 51 and a second part 52 connected along the first direction z. The first part 51 is threaded into the guide hole 21, and the second part 52 extends out of the guide sleeve 2 through the second opening 21b.

[0039] The probe structure 10 also includes a second locking member 6, which is threaded to the outer wall of the second part 52 and can abut against the guide sleeve 2.

[0040] After the first locking fastener 5 is threadedly connected to the guide sleeve 2 through the first part 51, the second locking fastener 6 can be threadedly connected to the outer wall of the second part 52 until the second locking fastener 6 abuts against the guide sleeve 2. This can further fix the position of the first locking fastener 5 relative to the guide sleeve 2 and reduce the possibility of the first locking fastener 5 undergoing slight displacement relative to the guide sleeve 2 along the first direction z under the action of the elastic member 4.

[0041] In one embodiment, such as Figure 2 As shown, the probe structure 10 also includes a conductive element 7, through which the probe 1 passes and is threadedly connected to the guide post 3.

[0042] By threading the probe 1 through the conductive element 7 and connecting it to the guide post 3, the conductive element 7 can be fixed while the probe 1 is being installed.

[0043] In one embodiment, such as Figure 2 As shown, a limiting protrusion 11 is provided on the outer periphery of the probe 1, and the conductive element 7 is clamped between the limiting protrusion 11 and the guide post 3 along the first direction z.

[0044] By setting a limiting protrusion 11 on the outer periphery of the probe 1, and enabling the limiting protrusion 11 and the guide post 3 to clamp the conductive element 7 along the first direction z, the conductive element 7 is fixed and prevented from falling off.

[0045] like Figure 5 As shown, this utility model embodiment also provides a fixture testing device, including a mounting frame 20, a driving component 30, a camera component 40, and the probe structure 10 described above. The driving component 30 is mounted on the mounting frame 20, and the output end of the driving component 30 is connected to the probe structure 10. The driving component 30 is used to drive the probe structure 10 to move along the first direction z.

[0046] The camera assembly 40 is movably mounted on the mounting bracket 20 along the first direction z, and the camera assembly 40 is used to shoot and position the fixture.

[0047] According to the fixture testing device of this utility model embodiment, its probe structure 10 connects the probe 1 to the guide post 3 by threading, making the replacement of the probe 1 simpler and faster. In addition, since the elastic element 4 is elastically supported between the first locking fastener 5 and the guide post 3, the probe 1 can be buffered by the elastic deformation of the elastic element 4 during the probe 1 testing, and the elastic force of the elastic element 4 can be adjusted by adjusting the first locking fastener 5, which can effectively reduce the wear of the probe 1 and save replacement costs.

[0048] This utility model embodiment also provides a fixture inspection machine, including an inspection platform and the above-mentioned fixture detection device. The inspection platform is used to place fixtures, the camera component 40 is used to photograph and position the fixtures on the inspection platform, and the probe structure 10 is used to inspect the fixtures on the inspection platform.

[0049] According to the fixture inspection machine of this utility model embodiment, its probe structure 10 connects the probe 1 to the guide post 3 by threading, making the replacement of the probe 1 simpler and faster. In addition, since the elastic element 4 is elastically supported between the first locking fastener 5 and the guide post 3, the probe 1 can be buffered by the elastic deformation of the elastic element 4 during the probe 1 detection, and the elastic force of the elastic element 4 can be adjusted by adjusting the first locking fastener 5, which can effectively reduce the wear of the probe 1 and save replacement costs.

[0050] In one embodiment, the fixture inspection machine may further include a frame, a first moving device, and a second moving device. The inspection platform and the first moving device are mounted on the frame, and the second moving device is mounted on the first moving device. The first moving device is used to drive the second moving device to move along a second direction. The probe structure 2 is mounted on the second moving device, and the second moving device is used to drive the probe structure 2 to move along a third direction.

[0051] The first direction z, the second direction, and the third direction are all perpendicular to each other.

[0052] For example, when the first direction z is the height direction of the fixture inspection machine, the second direction is the length direction of the fixture inspection machine, and the third direction is the width direction of the fixture inspection machine.

[0053] Driven by the cooperation of the first and second moving devices, the probe structure 2 can move in a direction perpendicular to the first direction z, so as to perform spot checks on different positions of the fixture on the inspection platform.

[0054] In other embodiments, the probe structure and the first moving device can be mounted on a frame, and the second moving device can be mounted on the first moving device. The first moving device is used to drive the second moving device to move along a second direction. The inspection platform is mounted on the second moving device, and the second moving device is used to drive the inspection platform to move along a third direction. In this case, under the cooperative drive of the first and second moving devices, the inspection platform can move in a direction perpendicular to the first direction, so that the probe structure can inspect different positions of the fixture on the inspection platform.

[0055] The above are merely preferred embodiments of the present utility model and are not intended to limit the present utility model. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A probe structure, characterized in that, The device includes a probe, a guide sleeve, a guide post, an elastic element, and a first locking element. The guide sleeve has a guide hole with a first opening and a second opening opposite each other along a first direction. The guide post is movably mounted on the guide sleeve along the first direction, and at least a portion of the guide post is located within the guide hole. The probe is threaded to the guide post and protrudes from the first opening. The first locking element is threadedly connected to the guide sleeve and can seal the second opening. The elastic element is disposed in the guide hole and is elastically supported between the first locking element and the guide post.

2. The probe structure according to claim 1, characterized in that, The guide hole wall is provided with a first limiting part, and the guide post is provided with a second limiting part. The second limiting part cooperates with the first limiting part to prevent the guide post from coming out of the first opening.

3. The probe structure according to claim 1, characterized in that, The guide hole includes a first hole segment and a second hole segment that are connected along a first direction. The first opening is located on the side of the first hole segment away from the second hole segment, and the second opening is located on the side of the second hole segment away from the first hole segment. The cross-sectional area of ​​the first hole segment is smaller than the cross-sectional area of ​​the second hole segment, and a first limiting surface is formed at the position where the first hole segment and the second hole segment meet. The guide post includes a first column segment and a second column segment. The second column segment is disposed within the second hole segment, and the first column segment is connected to the side of the second column segment away from the second opening. The cross-sectional area of ​​the first column segment is smaller than that of the second column segment, and a second limiting surface is formed at the junction of the first column segment and the second column segment. The first limiting surface can abut against the second limiting surface; The probe is threadedly connected to the first column segment, and the elastic element is elastically supported between the first locking element and the second column segment.

4. The probe structure according to claim 3, characterized in that, The guide post further includes a third column segment, which is connected to the side of the second column segment away from the first column segment. One end of the elastic member is sleeved on the third column segment and elastically abuts against the second column segment, while the other end of the elastic member elastically abuts against the first locking member.

5. The probe structure according to claim 1, characterized in that, Part of the guide post is located inside the guide hole, and the remaining part of the guide post extends out of the guide sleeve through the first opening.

6. The probe structure according to claim 1, characterized in that, At least a portion of the first locking fastener is threaded into the guide hole.

7. The probe structure according to claim 6, characterized in that, The first locking device includes a first part and a second part connected along a first direction. The first part is threaded into the guide hole, and the second part extends out of the guide sleeve through the second opening. The probe structure further includes a second locking member, which is threadedly connected to the outer wall of the second part and can abut against the guide sleeve.

8. The probe structure according to claim 1, characterized in that, The probe structure also includes a conductive element, through which the probe is threadedly connected to the guide post.

9. The probe structure according to claim 8, characterized in that, The probe is provided with a limiting protrusion on its outer periphery, and the conductive element is clamped between the limiting protrusion and the guide post along the first direction.

10. A fixture testing device, characterized in that, The device includes a mounting bracket, a driving component, a camera component, and a probe structure as described in any one of claims 1-9. The driving component is mounted on the mounting bracket, and its output end is connected to the probe structure. The driving component is used to drive the probe structure to move along the first direction. The camera component is movably mounted on the mounting frame along the first direction, and the camera component is used to capture and position the fixture.

11. A fixture inspection machine, characterized in that, The device includes an inspection platform and the fixture inspection device as described in claim 10. The inspection platform is used to place the fixture, the camera assembly is used to capture and position the fixture on the inspection platform, and the probe structure is used to inspect the fixture on the inspection platform.

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