An operating platform for integrated circuit chip detection

Abstract

The utility model belongs to integrated circuit chip detection technical field especially relates to an operating platform for integrated circuit chip detection, including operating platform and integrated circuit chip detector, still include: fixed shell, fixed shell fixed mounting in the top of operating platform, integrated circuit chip detector fixed mounting in the top of operating platform, the transparent plate of sliding installation has on the operating platform, the upper end of transparent plate extends to the fixed shell, and transparent plate and fixed shell plug -in cooperation, two fixed blocks, two fixed blocks all fixed mounting are on integrated circuit chip detector, the power cavity is opened in the operating platform, two limit rods are symmetrically slidably installed in the power cavity, four limit rods are located two sides of two fixed blocks respectively, dust cannot enter integrated circuit chip detector, prolongs the service life of integrated circuit chip detector, simultaneously, the convenient integrated circuit chip detector of dismounting installation is installed, and the operation is simple, need not use the tool.

Description

Technical Field

[0001] This utility model belongs to the field of integrated circuit chip testing technology, and in particular relates to an operating table for integrated circuit chip testing. Background Technology

[0002] Integrated circuit chips are miniature electronic devices that integrate transistors, resistors, capacitors, and other components and interconnects onto a silicon wafer using semiconductor technology. They are the core of electronic devices, with functions such as processing, storing, and transmitting signals. They are widely used in fields such as computers, communications, and consumer electronics, and have driven the miniaturization and intelligentization of information technology.

[0003] Existing integrated circuit chip testing workbenches have several drawbacks. For example, the detectors are bolted to the workbench, requiring disassembly and repair with tools, which is time-consuming. Furthermore, dust accumulates on the detectors when not in use, necessitating cleaning and wiping, which can damage the detector mounts due to physical friction. Therefore, we propose a new integrated circuit chip testing workbench. Utility Model Content

[0004] The purpose of this invention is to provide an operating platform for testing integrated circuit chips, so as to solve the problems mentioned in the background art.

[0005] In view of this, the present invention provides an operating table for testing integrated circuit chips, including an operating table and an integrated circuit chip testing instrument, and further comprising: A fixed housing is fixedly installed on the top of the operating table, and the integrated circuit chip detector is fixedly installed on the top of the operating table. A transparent plate is slidably installed on the operating table, and the upper end of the transparent plate extends into the fixed housing, and the transparent plate is inserted into the fixed housing. Two fixed blocks are fixedly installed on the integrated circuit chip tester. A power cavity is opened in the operating table. Two limit rods are symmetrically slidably installed in the power cavity. The four limit rods are located on both sides of the two fixed blocks, and the four limit rods are in close contact with the two fixed blocks respectively. A fixing component, located within a fixing housing, is used to fix the position of the transparent plate; A drive assembly, located within the control panel, is used to drive the four limit rods to slide.

[0006] In this technical solution, when it is necessary to test the integrated circuit chip, the transparent plate can be pulled down by the fixed component, and then the staff can place the integrated circuit chip tester for testing. When testing is not required, the transparent plate can be pulled up and the position of the transparent plate can be fixed by the fixed component. The transparent plate prevents dust from entering the integrated circuit chip tester and extends the service life of the integrated circuit chip tester. When the integrated circuit chip tester needs to be repaired, the drive component can drive the four limit rods to slide. When the four limit rods are no longer in contact with the two fixed blocks, the integrated circuit chip tester can be removed, making it easy to disassemble. The integrated circuit chip tester can also be fixed by reversing the above operation. The operation is simple and does not require tools.

[0007] In the above technical solution, the fixing component further includes: A limiting groove is formed inside a fixed shell. A sliding strip is slidably installed inside the limiting groove. Two connecting rods are rotatably installed at one end of the sliding strip. A limiting block is rotatably installed at one end of each of the two connecting rods. A tension spring is fixed to the inner wall of the limiting groove at the far ends of the two limiting blocks. The lower ends of the two limiting blocks pass through the limiting groove and extend into the transparent plate. The lower ends of the two limiting blocks are inserted into the transparent plate.

[0008] In this technical solution, when testing an integrated circuit chip, pulling the sliding bar causes two connecting rods to rotate. These connecting rods then drive two limiting blocks to slide and move closer together. Each limiting block pulls two tension springs, which extend. When both limiting blocks have slid to the appropriate position, the transparent plate can be pulled down, allowing the operator to place the integrated circuit chip on the integrated circuit chip tester for testing. When testing is not required, pulling the transparent plate upwards causes it to compress the two limiting blocks, causing them to slide and move closer together. Simultaneously, the two tension springs extend. When the transparent plate reaches the appropriate position, the tension of the two springs causes the two limiting blocks to slide and move closer together, locking them inside the transparent plate and fixing its position. The transparent plate prevents dust from entering the integrated circuit chip tester, extending its lifespan.

[0009] In the above technical solution, the driving component further includes: The motor is fixedly installed in the power chamber. The output shaft of the motor is fixedly installed with a gear. Both sides of the gear are meshed with racks. The top of each rack is fixedly installed with a sliding plate. Each sliding plate has two guide grooves. Each of the four guide grooves has a guide post slidably installed. The four guide posts are located at the bottom of four limit rods and are fixedly connected to the four limit rods.

[0010] In this technical solution, when the integrated circuit chip tester needs to be repaired, the motor is first started. The motor is powered on and drives the gear to rotate. The gear drives the two meshing racks to slide and move away from each other. The two racks drive the two sliding plates to slide respectively. The two sliding plates drive the four guide posts to slide respectively through the four guide grooves. The four guide posts drive the four limit rods to slide respectively. When the four limit rods are no longer in contact with the two fixed blocks, the integrated circuit chip tester can be removed, which facilitates the disassembly of the integrated circuit chip tester. The integrated circuit chip tester can also be fixed by the above reverse operation. The operation is simple and does not require the use of tools.

[0011] In the above technical solution, both of the limiting blocks are slidably connected to the limiting groove, the gear is rotatably connected to the power cavity, and both racks and two sliding plates are slidably connected to the power cavity.

[0012] In this technical solution, it is ensured that both limit blocks can slide within the limit groove, the gear can rotate within the power cavity, and both racks and two sliding plates can slide within the power cavity.

[0013] In the above technical solution, two guide blocks are further fixedly installed on the top of the operating table, the upper ends of the two guide blocks extend into the two fixed blocks respectively, and the two guide blocks are respectively inserted into the two fixed blocks.

[0014] In this technical solution, the position of the integrated circuit chip tester can be pre-positioned by the guide block, which facilitates the fixing of the integrated circuit chip tester.

[0015] In the above technical solution, the cross-section of the limiting rod is L-shaped.

[0016] In this technical solution, when the four limiting rods contact the two fixing blocks, the positions of the two fixing blocks can be fixed.

[0017] Furthermore, in the above technical solution, the guide post and the corresponding limiting rod are integrally formed.

[0018] In this technical solution, it is ensured that the guide post and the corresponding limit rod can be used stably.

[0019] The beneficial effects of this utility model are: 1. This integrated circuit chip testing workbench allows for the following functionality: When testing an integrated circuit chip, a transparent plate can be pulled down using a fixed component, allowing the operator to place the chip on the integrated circuit chip tester for testing. When testing is no longer required, the transparent plate can be pulled up, and the fixed component will retain its position. The transparent plate prevents dust from entering the integrated circuit chip tester, thus extending its lifespan.

[0020] 2. This integrated circuit chip testing workbench allows the integrated circuit chip tester to be repaired by using a drive assembly that can move four limit rods. When the four limit rods are no longer in contact with the two fixed blocks, the integrated circuit chip tester can be removed, facilitating its disassembly. The integrated circuit chip tester can also be fixed by reversing the above operation. The operation is simple and requires no tools. Attached Figure Description

[0021] Figure 1 This is one of the overall structural schematic diagrams of this utility model; Figure 2 This is the second schematic diagram of the overall structure of this utility model; Figure 3 This is one of the schematic diagrams of the cross-sectional structure of the fixed shell of this utility model; Figure 4 This is the second schematic diagram of the cross-sectional structure of the fixed shell of this utility model; Figure 5 This is the utility model Figure 4 Enlarged structural diagram at point A; Figure 6 This is a schematic diagram of the regional structure of the integrated circuit chip detector of this utility model; Figure 7 This is a schematic diagram of the guide block area structure of this utility model; Figure 8 This is one of the schematic diagrams of the cross-sectional structure of the operating table of this utility model; Figure 9 This is the second schematic diagram of the cross-sectional structure of the operating table of this utility model; Figure 10 This is a schematic diagram of the partial explosion structure of this utility model.

[0022] The markings in the diagram are as follows: 1. Operating table; 2. Integrated circuit chip tester; 3. Fixed shell; 4. Transparent plate; 5. Fixed block; 6. Power chamber; 7. Limiting rod; 8. Limiting groove; 9. Limiting block; 10. Tension spring; 11. Sliding bar; 12. Connecting rod; 13. Motor; 14. Gear; 15. Rack; 16. Sliding plate; 17. Guide groove; 18. Guide column; 19. Guide block. Detailed Implementation

[0023] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0024] In the description of this application, it should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. For ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following drawings denote similar items, and therefore, once an item is defined in one drawing, it need not be further discussed in subsequent drawings.

[0025] It should be noted that the terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and are not limited in number; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0026] It should be noted that in the description of this application, the directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application. The directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0027] It should be noted that, in this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0028] Example 1: Please see Figure 1 - Figure 10 As shown, this embodiment provides an operating table for integrated circuit chip testing, including an operating table 1 and an integrated circuit chip testing instrument 2, and further including: The fixed housing 3 is fixedly installed on the top of the operating table 1. The integrated circuit chip detector 2 is fixedly installed on the top of the operating table 1. A transparent plate 4 is slidably installed on the operating table 1. The upper end of the transparent plate 4 extends into the fixed housing 3, and the transparent plate 4 is inserted into the fixed housing 3. Two fixed blocks 5 are fixedly installed on the integrated circuit chip detector 2. A power cavity 6 is opened in the operating table 1. Two limit rods 7 are symmetrically slidably installed in the power cavity 6. The four limit rods 7 are located on both sides of the two fixed blocks 5, and the four limit rods 7 are in close contact with the two fixed blocks 5 respectively. A fixing component is located inside the fixing housing 3 and is used to fix the position of the transparent plate 4; The drive assembly is located inside the control panel 1 and is used to drive the four limit rods 7 to slide.

[0029] When integrated circuit chips need to be tested, the transparent plate 4 can be pulled down by the fixed component, and then the staff can place the integrated circuit chip tester 2 for testing. When testing is not required, the transparent plate 4 can be pulled up and the position of the transparent plate 4 can be fixed by the fixed component. The transparent plate 4 prevents dust from entering the integrated circuit chip tester 2 and extends the service life of the integrated circuit chip tester 2. When the integrated circuit chip tester 2 needs to be repaired, the four limit rods 7 can be slid by the set drive component. When the four limit rods 7 are no longer in contact with the two fixed blocks 5, the integrated circuit chip tester 2 can be taken out, which is convenient for disassembling the integrated circuit chip tester 2. The integrated circuit chip tester 2 can also be fixed by the above reverse operation. The operation is simple and does not require the use of tools.

[0030] In this embodiment, the fixing component includes: The limiting groove 8 is formed inside the fixed shell 3. A sliding strip 11 is slidably installed inside the limiting groove 8. Two connecting rods 12 are rotatably installed at one end of the sliding strip 11. A limiting block 9 is rotatably installed at one end of each of the two connecting rods 12. A tension spring 10 is fixed to the inner wall of the limiting groove 8 at the far ends of the two limiting blocks 9. The lower ends of the two limiting blocks 9 pass through the limiting groove 8 and extend into the transparent plate 4. The lower ends of the two limiting blocks 9 are inserted into the transparent plate 4. When testing integrated circuit chips, sliding the slider 11 causes the two connecting rods 12 to rotate. The two connecting rods 12 then drive the two limiting blocks 9 to slide and move closer together. The two limiting blocks 9 pull the two tension springs 10 to extend. When both limiting blocks 9 have slid to the appropriate position, the transparent plate 4 can be pulled down, and the operator can then place the integrated circuit chip on the integrated circuit chip tester 2 for testing. When testing is not required, pulling the transparent plate 4 upward causes the transparent plate 4 to press the two limiting blocks 9 to slide and move closer together. At the same time, the two tension springs 10 are stretched. When the transparent plate 4 has slid to the appropriate position, under the tension of the two tension springs 10, the two limiting blocks 9 slide and move closer together, and the two limiting blocks 9 will be locked inside the transparent plate 4, fixing the position of the transparent plate 4. The transparent plate 4 prevents dust from entering the integrated circuit chip tester 2, extending the service life of the integrated circuit chip tester 2.

[0031] In this embodiment, the driving component includes: Motor 13 is fixedly installed in power chamber 6. Gear 14 is fixedly installed on the output shaft of motor 13. Racks 15 are meshed on both sides of gear 14. Sliding plates 16 are fixedly installed on the top of the two racks 15. Two guide grooves 17 are opened in the two sliding plates 16. Guide posts 18 are slidably installed in the four guide grooves 17. The four guide posts 18 are located at the bottom of the four limit rods 7 respectively, and the four guide posts 18 are fixedly connected to the four limit rods 7 respectively. When the integrated circuit chip tester 2 needs to be repaired, the motor 13 is started first. The motor 13 is powered on and drives the gear 14 to rotate. The gear 14 drives the two meshing racks 15 to slide and move away from each other. The two racks 15 drive the two sliding plates 16 to slide respectively. The two sliding plates 16 drive the four guide posts 18 to slide respectively through the four guide grooves 17. The four guide posts 18 drive the four limit rods 7 to slide respectively. When the four limit rods 7 are no longer in contact with the two fixing blocks 5, the integrated circuit chip tester 2 can be removed, which is convenient for disassembling the integrated circuit chip tester 2. The integrated circuit chip tester 2 can also be fixed by the above reverse operation. The operation is simple and does not require the use of tools.

[0032] Example 2: This embodiment provides an operating platform for testing integrated circuit chips, which, in addition to the technical solutions of the above embodiments, also has the following technical features.

[0033] In this embodiment, both limiting blocks 9 are slidably connected to the limiting groove 8, the gear 14 is rotatably connected to the power cavity 6, and both racks 15 and two sliding plates 16 are slidably connected to the power cavity 6.

[0034] Specifically, it ensures that both limit blocks 9 can slide within the limit groove 8, that gear 14 can rotate within the power cavity 6, and that both racks 15 and both sliding plates 16 can slide within the power cavity 6.

[0035] Example 3: This embodiment provides an operating platform for testing integrated circuit chips, which, in addition to the technical solutions of the above embodiments, also has the following technical features.

[0036] In this embodiment, two guide blocks 19 are fixedly installed on the top of the operating table 1. The upper ends of the two guide blocks 19 extend into the two fixed blocks 5 respectively, and the two guide blocks 19 are respectively inserted into the two fixed blocks 5.

[0037] The guide block 19 can be used to pre-position the integrated circuit chip detector 2, making it easier to fix the integrated circuit chip detector 2.

[0038] Example 4: This embodiment provides an operating platform for testing integrated circuit chips, which, in addition to the technical solutions of the above embodiments, also has the following technical features.

[0039] In this embodiment, the cross-section of the limiting rod 7 is L-shaped.

[0040] When the four limiting rods 7 come into contact with the two fixing blocks 5, the positions of the two fixing blocks 5 can be fixed.

[0041] Example 5: This embodiment provides an operating platform for testing integrated circuit chips, which, in addition to the technical solutions of the above embodiments, also has the following technical features.

[0042] In this embodiment, the guide post 18 and the corresponding limiting rod 7 are integrally formed.

[0043] This ensures that the guide post 18 and the corresponding limit rod 7 can be used stably.

[0044] It is worth noting that the integrated circuit chip tester 2 involved in this utility model is a tester with the product number GUT-6000B manufactured by GW Instek Suzhou Co., Ltd. The integrated circuit chip tester 2 involved in this utility model is existing technology, which can be fully implemented by those skilled in the art, and there is no need to elaborate. The content protected by this utility model does not involve any improvement to the structure and working principle of the integrated circuit chip tester 2.

[0045] Working principle: When an integrated circuit chip needs to be tested, the sliding bar 11 is pulled to slide, which in turn pulls the two connecting rods 12 to rotate. The two connecting rods 12 drive the two limiting blocks 9 to slide and move closer to each other. The two limiting blocks 9 pull the two tension springs 10 to extend. When both limiting blocks 9 have slid to the appropriate position, the transparent plate 4 can be pulled down. Then, the staff can place the integrated circuit chip on the integrated circuit chip tester 2 for testing. When testing is not required, the transparent plate 4 is pulled up. The transparent plate 4 will squeeze the two limiting blocks 9 to slide and move closer to each other. At the same time, the two tension springs 10 are stretched. When the transparent plate 4 has slid to the appropriate position, under the action of the tension of the two tension springs 10, the two limiting blocks 9 slide and move closer to each other. The two limiting blocks 9 will be stuck in the transparent plate 4, which can fix the position of the transparent plate 4. The transparent plate 4 prevents dust from entering the integrated circuit chip tester 2, thus extending the service life of the integrated circuit chip tester 2. When the integrated circuit chip tester 2 needs to be repaired, first start the motor 13. The motor 13 is powered on and drives the gear 14 to rotate. The gear 14 drives the two meshing racks 15 to slide and move away from each other. The two racks 15 drive the two sliding plates 16 to slide respectively. The two sliding plates 16 drive the four guide posts 18 to slide respectively through the four guide grooves 17. The four guide posts 18 drive the four limit rods 7 to slide respectively. When the four limit rods 7 are no longer in contact with the two fixing blocks 5, the integrated circuit chip tester 2 can be removed, which is convenient for disassembling the integrated circuit chip tester 2. The integrated circuit chip tester 2 can also be fixed by the above reverse operation. The operation is simple and does not require the use of tools.

[0046] The embodiments of this application have been described above with reference to the accompanying drawings. Unless otherwise specified, the embodiments and features in the embodiments of this application can be combined with each other. This application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. An operating table for testing integrated circuit chips, comprising an operating table (1) and an integrated circuit chip testing instrument (2), characterized in that, Also includes: A fixed shell (3) is fixedly installed on the top of the operating table (1). The integrated circuit chip detector (2) is fixedly installed on the top of the operating table (1). A transparent plate (4) is slidably installed on the operating table (1). The upper end of the transparent plate (4) extends into the fixed shell (3), and the transparent plate (4) is inserted into the fixed shell (3). Two fixed blocks (5) are fixedly installed on the integrated circuit chip detector (2). A power cavity (6) is opened in the operating table (1). Two limit rods (7) are symmetrically slidably installed in the power cavity (6). The four limit rods (7) are located on both sides of the two fixed blocks (5) respectively, and the four limit rods (7) are in close contact with the two fixed blocks (5) respectively. A fixing component is located inside the fixing shell (3) and is used to fix the position of the transparent plate (4); A drive assembly located within the control panel (1) and used to drive the four limit rods (7) to slide.

2. The operating platform for testing integrated circuit chips according to claim 1, characterized in that, The fixing component includes: The limiting groove (8) is opened in the fixed shell (3). A sliding strip (11) is slidably installed in the limiting groove (8). Two connecting rods (12) are rotatably installed at one end of the sliding strip (11). A limiting block (9) is rotatably installed at one end of each of the two connecting rods (12). A tension spring (10) fixed to the inner wall of the limiting groove (8) is fixed at the opposite ends of the two limiting blocks (9). The lower ends of the two limiting blocks (9) penetrate the limiting groove (8) and extend into the transparent plate (4). The lower ends of the two limiting blocks (9) are inserted into the transparent plate (4).

3. The operating platform for integrated circuit chip testing according to claim 2, characterized in that, The driving component includes: The motor (13) is fixedly installed in the power chamber (6). The output shaft of the motor (13) is fixedly installed with a gear (14). Both sides of the gear (14) are meshed with racks (15). The tops of the two racks (15) are fixedly installed with sliding plates (16). Two guide grooves (17) are opened in the two sliding plates (16). Guide posts (18) are slidably installed in the four guide grooves (17). The four guide posts (18) are located at the bottom of the four limit rods (7) respectively, and the four guide posts (18) are fixedly connected to the four limit rods (7) respectively.

4. The operating platform for testing integrated circuit chips according to claim 3, characterized in that, Both of the limiting blocks (9) are slidably connected to the limiting groove (8), the gear (14) is rotatably connected to the power cavity (6), and both of the racks (15) and the two sliding plates (16) are slidably connected to the power cavity (6).

5. The operating platform for testing integrated circuit chips according to claim 1, characterized in that, Two guide blocks (19) are fixedly installed on the top of the operating table (1). The upper ends of the two guide blocks (19) extend into the two fixed blocks (5) respectively, and the two guide blocks (19) are respectively inserted into the two fixed blocks (5).

6. The operating platform for testing integrated circuit chips according to claim 1, characterized in that, The cross-section of the limiting rod (7) is L-shaped.

7. The operating platform for integrated circuit chip testing according to claim 3, characterized in that, The guide post (18) and the corresponding limiting rod (7) are integrally formed.

Images