SSD card testing device and SSD card production line

Abstract

The utility model provides a kind of SSD card testing equipment and SSD card production line, it is related to hard disk technical field.The SSD card testing equipment includes multiple test devices, first conveying device and clamping device, multiple test devices at least include opening card cabinet, RDT test cabinet and BIT test cabinet, first opening card cabinet, the RDT test cabinet and the BIT test cabinet are sequentially arranged along first direction;First conveying device is used to convey test carrier in first direction;Wherein, in the conveying direction of the first conveying device, BIT test cabinet is located in the upstream of the opening card cabinet;Clamping device can transfer test carrier between first conveying device and multiple test devices any two between it.The SSD card testing equipment provided by the utility model can replace artificial turnover, save time and effort, can realize standardization production, effectively improve production efficiency.

Description

Technical Field

[0001] This utility model relates to the field of hard disk technology, and in particular to an SSD card testing device and an SSD card production line. Background Technology

[0002] Before leaving the factory, solid-state drives (SSDs) need to undergo a simulated high-temperature environment and be subjected to stable voltage for read and write tests. By testing the SSDs under this high-temperature environment and stable voltage, products with potential problems or instability are screened out, thereby ensuring that the performance and parameters of the products leaving the factory meet industry usage requirements.

[0003] Currently, most testing methods on the market involve manually inserting SSD cards into test fixtures, then manually loading the test fixtures with inserted SSD cards into the card opening cabinet, RDT test cabinet, and BIT test cabinet for testing. After testing, the SSD cards are manually removed from the test fixtures, and this process is repeated. This method requires manual handling of the test fixtures with inserted SSD cards between the card opening cabinet, RDT test cabinet, and BIT test cabinet. Especially when retesting is required, the number of handling steps increases, making the entire testing process time-consuming, labor-intensive, and inefficient. Utility Model Content

[0004] In view of this, the purpose of this utility model is to overcome the shortcomings of the prior art and provide an SSD card testing device that can replace manual handling, save time and effort, achieve standardized production, and effectively improve production efficiency. Additionally, an SSD card production line using the aforementioned SSD card testing equipment is provided.

[0005] This utility model provides the following technical solution: According to a first aspect of the present invention, an SSD card testing device is provided, the SSD card testing device comprising: Multiple testing devices, the multiple testing devices including at least a first card opening cabinet, an RDT testing cabinet and a BIT testing cabinet, the card opening cabinet, the RDT testing cabinet and the BIT testing cabinet being arranged sequentially along a first direction; A first conveying device is used to convey a test vehicle in the first direction; wherein, in the conveying direction of the first conveying device, the BIT test cabinet is located upstream of the card opening cabinet; A gripping device capable of transferring the test carrier between any two of the first conveying device and the plurality of test devices.

[0006] Furthermore, the SSD card testing equipment also includes a second conveying device, wherein the first conveying device and the second conveying device convey in opposite directions; the second conveying device is used to receive and convey the test carrier conveyed by the clamping device.

[0007] Furthermore, the gripping device is capable of transferring the test carrier between any two of the first conveying device, the second conveying device, and the plurality of test devices.

[0008] Furthermore, the SSD card testing equipment also includes: An identification device is electrically connected to the clamping device. The identification device is capable of acquiring the next process information of the test carrier on the first conveying device and sending a control command to the clamping device according to the next process information to clamp the test carrier to the test device corresponding to the next process information.

[0009] Furthermore, the identification device includes: A barcode scanner is installed on the moving path of the test vehicle on the first conveying device, and the barcode scanner is capable of reading the tag code on the test vehicle.

[0010] Furthermore, one of the first conveying device and the second conveying device is located above the other.

[0011] Furthermore, the SSD card testing equipment also includes: Card loading machine and card unloading and sorting machine; the card loading machine and the card unloading and sorting machine are respectively located downstream of the first card opening cabinet and the BIT test cabinet; wherein The gripping device is capable of transferring the test carrier between any two of the first conveying device, the card loading machine, the card unloading and sorting machine, and the plurality of test devices.

[0012] Furthermore, the clamping device includes: A first clamping mechanism is capable of clamping an empty test carrier conveyed by the first conveying device to the card loading machine; and the first clamping mechanism is also capable of clamping the test carrier with the SSD card inserted by the card loading machine to the first card opening cabinet; The second clamping mechanism is capable of clamping the test carrier opened by the first card opening cabinet into the RDT test cabinet; and the second clamping mechanism is also capable of clamping the test carrier after being tested by the RDT test cabinet into the BIT test cabinet. The third clamping mechanism is capable of clamping the test carrier tested by the BIT test cabinet to the automatic card removal and sorting machine; and the third clamping mechanism is also capable of clamping the test carrier conveyed by the second conveying device to the automatic card removal and sorting machine.

[0013] Furthermore, the clamping device also includes a fourth clamping mechanism, which is capable of clamping the test carrier from which the SSD card has been removed by the automatic card sorting machine to the first conveying device.

[0014] Furthermore, the first gripping mechanism, the second gripping mechanism, the third gripping mechanism, and the fourth gripping mechanism are all multi-axis manipulators.

[0015] Furthermore, the multiple testing devices also include a second card opening cabinet, which is located downstream of the BIT testing cabinet. At least one of the third clamping mechanism and the fourth clamping mechanism is capable of clamping the test carrier after it has been opened by the second card opening cabinet to the first conveying device.

[0016] According to a second aspect disclosed in this utility model, an SSD card production line is provided, the SSD card production line including any of the SSD card testing equipment described in the present invention.

[0017] The embodiments of this utility model have the following advantages: Using SSD card testing equipment, multiple testing devices can be centrally set up. The test carriers are transported in reverse along the testing process flow via a first conveyor device. The test carriers can be pre-inserted manually or by a card insertion device, enabling the first conveyor device to continuously transport the test carriers with inserted SSD cards to the first card opening cabinet at the first process. Subsequently, the test carriers with inserted SSD cards can be sequentially clamped into the first card opening cabinet, RDT test cabinet, and BIT test cabinet by a clamping device for testing. In addition, if there are test problems in a single process step, the test carriers with inserted SSD cards in that process step need to be clamped into the first conveyor device by the clamping device to return to the upstream process. When the test carriers with inserted SSD cards that need to be retested move to the target process, the clamping device can clamp them into the test device of the corresponding process.

[0018] Therefore, the entire testing process does not require manual intervention, effectively improving production efficiency and avoiding human error in placing the test carrier of the inserted SSD card that needs to be retested in the wrong test device.

[0019] In addition, this utility model also relates to an SSD card production line. Since the above-mentioned SSD card testing equipment has the above-mentioned technical effects, the SSD card production line including the SSD card testing equipment should have the same technical effects, which will not be repeated here.

[0020] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings. Attached Figure Description

[0021] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 This diagram illustrates the assembly of the test carrier and the SSD in the SSD card testing equipment provided in this embodiment of the present invention. Figure 2 A schematic diagram of the structure of the SSD card testing device provided in this embodiment of the present invention is shown; Figure 3 An assembly diagram of the first conveying device and the second conveying device is shown; Figure 4 A schematic diagram of the structure of a multi-axis robot is shown.

[0023] Explanation of key component symbols: 100-Test carrier; 110-Gold finger; 120-Label code; 200-SSD card; 300-Card loading machine; 400-First card opening cabinet; 500-Multi-axis robot arm; 600-RDT test cabinet; 700-BIT test cabinet; 800-Card unloading and sorting machine; 900-Fourth gripping mechanism; 1000-Third gripping mechanism; 1100-Second card opening cabinet; 1200-Second conveying device; 1300-Second gripping mechanism; 1400-First gripping mechanism; 1500-Bar scanner; 1600-First conveying device. Detailed Implementation

[0024] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.

[0025] It should be noted that when an element is said to be "fixed" to another element, it can be directly on the other element or there may be an intervening element. When an element is said to be "connected" to another element, it can be directly connected to the other element or there may be an intervening element. Conversely, when an element is said to be "directly" on another element, there is no intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0026] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0027] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the template description is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0029] In related technologies, SSD card 200 generally refers to solid-state drive (SSD). A solid-state drive (SSD) is a hard drive made of solid-state electronic storage chip arrays. An SSD consists of a control unit and storage units (FLASH chips, DRAM chips). Before leaving the factory, SSD manufacturers simulate a high-temperature environment and provide stable voltage to perform read and write tests on the SSD. This high-temperature environment and stable voltage testing screens out potentially problematic or unstable products, ensuring that the performance and parameters of the finished products meet industry requirements.

[0030] In most markets, the process involves manually inserting the SSD card 200 into the test carrier 100, then manually loading the test carrier 100 with the SSD card 200 into the card opening cabinet, RDT test cabinet 600, and BIT test cabinet 700 for testing. After testing, the SSD card 200 is manually removed from the test carrier 100, and this cycle is repeated. This method requires manual handling of the test carrier 100 with the SSD card 200 between the card opening cabinet, RDT test cabinet 600, and BIT test cabinet 700. Especially when retesting is required, the number of handling cycles increases, making the entire testing process time-consuming, labor-intensive, and inefficient. Specifically, the card opening cabinet is used for RDT card opening, primary card opening, and secondary card opening of the SSD test carrier 100; the RDT test cabinet 600 is used for RDT testing or BIT testing of the SSD test carrier 100; and the BIT test cabinet 700 is used for BIT testing of the SSD test carrier 100.

[0031] Among them, RDT testing (Reliability Demonstration Test) is a product testing method that verifies the mean time between failures (MTBF) of a product through a large sample. It closely approximates real-world usage scenarios, ensuring that the product does not experience large-scale software and hardware anomalies during mass production. RDT testing references the JEDEC standard: JESD218: Solid-State Drive (SSD) Requirements and Endurance Test Method, which defines the usage conditions and corresponding durability (lifespan) verification requirements for consumer-grade and enterprise-grade SSDs. JESD219: Solid State Drive (SSD) Endurance Workloads. This standard defines workloads for SSD endurance testing. Enterprise-grade SSD workloads are used in conjunction with the operating conditions defined in JESD218. JESD 22-A108: Temperature, Bias, and Operating Life defines the performance of High Temperature Operating Life (HTOL) testing to determine the reliability of equipment operating under high temperature conditions for extended periods. RDT testing employs a mixed sequential and random read / write IO load (this complex process involves big data scraping and analysis to approximate real user scenarios). Through theoretical derivation, the TBW acceleration factor is determined to correspond to the daily data write volume. The test is conducted continuously with power outages every day, and some key projects are strictly monitored.

[0032] Built-in testing (BIT) is a self-diagnostic function embedded in a system or device to detect and report internal faults or abnormal states. BIT testing primarily assesses the power consumption / performance compliance, full disk read / write operations for various I / O operations, power supply bias testing, and power management of solid-state drives (SSDs).

[0033] The BIB (Burn in Board) test substrate is a process that applies external stimuli such as temperature and voltage to solid-state drives (SSDs) to detect early failures.

[0034] As shown in Figures 1 and 2, in order to solve the above-mentioned technical problems, according to the first aspect of the present invention, an SSD card testing device is provided. The SSD card 200 testing device includes multiple testing devices, a first conveying device 1600, and a clamping device. The multiple testing devices include at least a first card opening cabinet 400, an RDT testing cabinet 600, and a BIT testing cabinet 700. The first card opening cabinet 400, the RDT testing cabinet 600, and the BIT testing cabinet 700 are arranged sequentially along a first direction. The first conveying device 1600 is used to convey the test carrier 100 in the first direction. In the conveying direction of the first conveying device 1600, the BIT testing cabinet 700 is located upstream of the first card opening cabinet 400. The clamping device is capable of transferring the test carrier 100 between the first conveying device 1600 and any two of the multiple testing devices.

[0035] The aforementioned first card opening cabinet 400, RDT test cabinet 600, and BIT test cabinet 700 are all existing equipment, and their functions have not changed. That is to say, the RDT test cabinet 600 is used for RDT testing or BIT testing of the SSD test carrier 100; the BIT test cabinet 700 is used for BIT testing of the SSD test carrier 100. Therefore, for those skilled in the art, how to use the first card opening cabinet 400, RDT test cabinet 600, and BIT test cabinet 700 is a routine operation.

[0036] For example, the first card opening cabinet 400, RDT test cabinet 600, and BIT test cabinet 700 are centrally arranged and sequentially arranged according to the testing process flow. For instance, arranging the first card opening cabinet 400, RDT test cabinet 600, and BIT test cabinet 700 in a straight line (i.e., extending in a straight line in the first direction) reduces the distance between the testing devices. Furthermore, by using a clamping device, the test carrier 100 can be transferred between adjacent testing devices, enabling continuous testing of the same test carrier 100 without batch testing. In other words, it achieves streamlined production line testing, eliminating the need to wait for each batch of test carriers 100 to complete the current process testing before moving to the next process. Alternatively, multiple testing devices can be arranged sequentially along curves, broken lines, etc.

[0037] Furthermore, by setting up the first conveyor device 1600, test carriers 100 can be continuously conveyed to the first card opening cabinet 400, eliminating the need for batch-by-batch transfers. It should be noted that the first conveyor device 1600 forms a temporary storage area, capable of temporarily storing untested test carriers 100. Of course, the first conveyor device 1600 can not only convey test carriers 100 to be tested, but also receive test carriers 100 that need to be retested, for return to the upstream process.

[0038] For example, when the RDT test cabinet 600 cannot obtain data from the SSD card 200 on the current test carrier 100, that is, the SSD card 200 on the test carrier 100 in the RDT test cabinet 600 fails to be activated, the test carrier 100 needs to be sent back to the first activation cabinet 400 for reactivation. Therefore, to avoid interfering with the working logic of the first activation cabinet 400, the test carrier 100 that needs to be reactivated can be sent to the first conveyor 1600, so that it can be returned to the first activation cabinet 400 via the first conveyor 1600. Of course, this is not the only option; for example, if the RDT test cabinet 600 encounters an error in obtaining data from the SSD card 200 inserted in the test carrier 100, it can choose to return to either the RDT test cabinet 600 or the first activation cabinet 400 depending on the cause of the error.

[0039] The SSD card testing equipment provided by this utility model centrally arranges multiple testing devices. The first conveying device 1600 reverse-flows the testing carrier 100 along the testing process. Cards can be pre-inserted into the testing carrier 100 manually or via a card insertion device. This allows the first conveying device 1600 to continuously convey the inserted SSD card 200 testing carrier 100 to the first card opening cabinet 400 at the first process stage. Subsequently, the clamping device sequentially clamps the inserted SSD card 200 testing carrier 100 to the next... The card cabinet 400, RDT test cabinet 600, and BIT test cabinet 700 are opened for testing. In addition, if there are test problems in a single process step, the test carrier 100 of the inserted SSD card 200 in that process step needs to be clamped by the clamping device to the first conveying device 1600 for return to the upstream process. When the test carrier 100 of the inserted SSD card 200 that needs to be retested moves to the target process, the clamping device can clamp it into the test device of the corresponding process.

[0040] Therefore, the entire testing process does not require manual intervention, effectively improving production efficiency and avoiding human error that could cause the test carrier 100 of the inserted SSD card 200 that needs to be retested to be placed in the wrong test device.

[0041] Based on the above embodiments, the test vehicle 100 is a BIB vehicle, which consists of a main circuit board, a transition circuit board, and a fixture. The main circuit board and the transition circuit board are connected by connectors. A single main circuit board and 16 transition circuit boards are combined to form a single BIB vehicle hardware component, which is then installed inside the fixture.

[0042] like Figure 2 As shown, based on the above embodiment, the first card opening cabinet 400 can be equipped with one BIB vehicle and automatically scan the identification QR code on the BIB vehicle to realize the transmission of card opening information between the first card opening cabinet 400 and the BIB vehicle.

[0043] Based on the above embodiment, the RDT test cabinet 600 is a dual-chamber independent temperature control cabinet. Each chamber has 15 layers of guide rails, and each layer can hold one BIB carrier, for a total of 30 carriers. The 15 layers of BIB carriers are manually pushed into the chambers one by one from the trolley. At this time, the gold fingers 110 at the tail end of the BIB carrier align with the RDT test machine connector inside the chamber. After closing the cabinet's sealed door, the RDT test cabinet 600's operating interface is manually operated to achieve information transmission between the SSD card 200 inside the BIB carrier and the test machine inside the RDT test cabinet 600. The two chambers share a common hot air circulation system, which ensures that all BIB carriers within the chamber are in a constant temperature environment, with a temperature setting range of 0℃ to 85℃.

[0044] Based on the above embodiments, the BIT test cabinet 700 is a dual-chamber independent temperature control cabinet. Each chamber has 15 layers of guide rails, and each layer can hold one BIB carrier, for a total of 30 carriers. The 15 layers of BIB carriers are manually pushed into the chambers one by one from the trolley. At this time, the gold fingers 110 at the tail end of the BIB carrier align with the connector of the BIT tester inside the chamber. After closing the cabinet's sealed door, the BIT test cabinet 700's operating interface is manually operated to achieve information transmission between the SSD card 200 inside the BIB carrier and the tester inside the BIT test cabinet 700. The two chambers share a common cold air circulation and hot air circulation switching system, which can keep all BIB carriers in a constant temperature environment, with a temperature setting range of -40℃ to 85℃.

[0045] like Figure 3 As shown, based on the above embodiment, the SSD card 200 testing device further includes a second conveying device 1200, and the conveying directions of the first conveying device 1600 and the second conveying device 1200 are opposite; the second conveying device 1200 is used to receive and convey the test carrier 100 conveyed by the clamping device.

[0046] It is easy to understand that, since the testing time of each testing device has a time difference, the test carrier 100 that has been tested by the previous testing device can be clamped by the clamping device to the second conveying device 1200 for temporary storage. This allows the temporarily stored test carrier 100 to be moved to the next testing device, thereby effectively solving the problem of the test carrier 100 being stuck. At the same time, the second conveying device 1200 can work in conjunction with the clamping device to clamp the test carrier 100 on the second conveying device 1200 and load it onto the corresponding testing device, reducing the movement range of the clamping device and thus improving the loading and unloading time and production testing efficiency.

[0047] For example, since the testing time of the RDT test cabinet 600 is relatively long and the card opening time of the first card opening cabinet 400 is relatively short, the test carrier 100 opened by the first card opening cabinet 400 can be clamped onto the second conveying device 1200.

[0048] In addition, when a problem occurs with an SSD card 200 being tested in a certain testing device, the test carrier 100 with the abnormal SSD card 200 can be clamped to the second conveyor 1200 and then conveyed to the testing area via the second conveyor 1200, which is downstream of the BIT test cabinet 700 (the end of the entire testing process).

[0049] like Figure 3 As shown, based on the above embodiments, both the first conveying device 1600 and the second conveying device 1200 can be belt conveyors. Of course, they are not limited to this one type; other devices that can achieve the same function can also be used, such as chain conveyors.

[0050] Based on the above embodiments, the gripping device can transfer the test carrier 100 between any two of the first conveying device 1600, the second conveying device 1200, and the plurality of test devices.

[0051] In other words, the gripping device has the following functions: 1. The gripping device can transfer the test carrier 100 between various test devices; 2. The gripping device can transfer the test carrier 100 between the test device and the first conveying device 1600; 3. The gripping device can transfer the test carrier 100 between the test device and the second conveying device 1200.

[0052] Based on the above embodiments, the SSD card 200 testing equipment also includes an identification device, which is electrically connected to the clamping device. The identification device can obtain the next process information of the test carrier 100 on the first conveying device 1600, and send a control command to the clamping device according to the next process information to clamp the test carrier 100 to the testing device corresponding to the next process information.

[0053] It is easy to understand that the test carrier 100 has a tag code 120. When a test device tests the test carrier 100 and it malfunctions, the control system can bind the malfunction information with the tag code 120 information of the test carrier 100. Then, if the subsequent identification device identifies the malfunctioning test carrier 100 on the first conveying device 1600 that needs to be retested, it will obtain the tag code 120 information to match the test device that needs to be retested, and then use the clamping device to clamp the malfunctioning test carrier 100 into the corresponding test device for retesting.

[0054] It should be noted that the control system is electrically connected to each testing device, the first conveying device 1600, and the identification device. Each testing device can synchronously transmit test information to the control system.

[0055] like Figure 2 As shown, based on the above embodiment, the identification device includes multiple barcode scanners 1500. The multiple barcode scanners 1500 are installed on the moving path of the test carrier 100 on the first conveying device 1600, and the multiple barcode scanners 1500 correspond one-to-one with multiple test devices. The barcode scanners 1500 can read the tag codes 120 on the test carrier 100.

[0056] Each barcode scanner 1500 is installed at a corresponding testing device, thereby acquiring the tag code 120 information of the test carrier 100 delivered to the testing device. When the barcode scanner 1500 obtains that the testing device for the next process test to be performed on the test carrier 100 is the corresponding testing device, the barcode scanner 1500 sends a signal to the control system, and the control system controls the clamping device to clamp the test carrier 100 into the testing device corresponding to the barcode scanner 1500.

[0057] Based on the above embodiment, one of the first conveying device 1600 and the second conveying device 1200 is located on top of the other. Clearly, this arrangement effectively saves space. Of course, if the production workshop has sufficient space, the first conveying device 1600 and the second conveying device 1200 can be arranged in a flat configuration.

[0058] It should be noted that vertically arranging the first conveying device 1600 and the second conveying device 1200 can reduce the movement range of the gripping device and improve gripping efficiency.

[0059] Based on the above embodiments, the SSD card 200 testing equipment also includes a card loading machine 300 and a card unloading and sorting machine 800; the card loading machine 300 and the card unloading and sorting machine 800 are respectively located downstream of the first card opening cabinet 400 and the BIT testing cabinet 700; wherein, the gripping device can transfer the test carrier 100 between any two of the first conveying device 1600, the card loading machine 300, the card unloading and sorting machine 800 and the plurality of testing devices.

[0060] In other words, a card loading machine 300 and a card unloading and sorting machine 800 are set up in the first direction, and an empty test carrier 100 is transported to the card loading machine 300 in conjunction with the first conveying device 1600. The test carrier 100 is then transported to the card loading machine 300, and the empty test carrier 100 is clamped into the card loading machine 300 by the clamping device. The card loading machine 300 can then insert the SSD card 200 into the test carrier 100, replacing the manual card insertion, which can effectively improve work efficiency and reduce manual labor. After the card loading machine 300 has inserted the card, the clamping device clamps the test carrier 100 that has been loaded by the card loading machine 300 to the second conveying device 1200 or the RDT test cabinet 600.

[0061] Similarly, the test carrier 100, which has been tested by the BIT test cabinet 700, is clamped by the clamping device and placed into the card removal and sorting machine 800, so that the tested SSD card 200 can be removed from the test carrier 100 by the card removal and sorting machine 800, in order to replace manual card removal.

[0062] Optionally, the card loading machine 300 is an automatic card loading machine 300. The automatic card loading machine 300 docks with the BIB carrier. Through the vision assistance system and multi-axis robot 500 installed in the automatic card loading machine 300, the SSD cards 200 to be tested are taken out one by one from the tray and inserted into the BIB carrier. After the multi-axis robot 500 completes the loading of the SSD cards 200 to be tested into a single BIB carrier, it works with the conveyor line to send out the BIB carrier full of SSD cards 200 to be tested, so that they can be taken out by the gripping device. The conveyor line then replenishes empty BIB carriers for product loading. After multiple cycles, the loading of the BIB carriers for the test materials of a single rack is completed.

[0063] The card sorting machine 800 is an automatic card sorting machine. It docks with the BIB carrier and, through a vision-assisted system and a multi-axis robotic arm 500 installed within it, removes the tested SSD products one by one from the BIB carrier. Then, the multi-axis robotic arm 500 moves the tested SSD cards 200 to the vision scanner within the automatic card sorting machine 800. The vision scanner identifies and analyzes the QR code on the tested SSD card 200. Based on the QR code information read by the vision scanner and the information from the multi-axis robotic arm 500... The multi-axis robot arm 500 then sorts the SSD cards 200 and places them into different trays. After the multi-axis robot arm 500 removes the tested SSD cards 200 from a single BIB carrier, it works with the conveyor line to send out empty BIB carriers. The empty BIB carriers are then picked up by the gripping device and sent to the first conveyor 1600 for return to the automatic card loading machine 300. The conveyor line then replenishes the fully loaded BIB carriers with tested SSD cards 200 for SSD card removal. After multiple cycles, the sorting and collection of tested SSD cards 200 is completed.

[0064] like Figure 2 As shown, based on the above embodiment, the clamping device includes a first clamping mechanism 1400, a second clamping mechanism 1300, and a third clamping mechanism 1000; the first clamping mechanism 1400 can clamp the empty test carrier 100 conveyed by the first conveying device 1600 to the card loading machine 300; and the first clamping mechanism 1400 can also clamp the test carrier 100 with the SSD card 200 inserted by the card loading machine 300 to the first card opening cabinet 400; the second clamping mechanism 1300 can clamp the empty test carrier 100 conveyed by the first conveying device 1600 to the card loading machine 300. The test carrier 100, which has been opened by the first card opening cabinet 400, is clamped into the RDT test cabinet 600; and the second clamping mechanism 1300 can also clamp the test carrier 100, which has been tested by the RDT test cabinet 600, into the BIT test cabinet 700; the third clamping mechanism 1000 can clamp the test carrier 100, which has been tested by the BIT test cabinet 700, into the card removal and sorting machine 800; and the third clamping mechanism 1000 can also clamp the test carrier 100, which has been conveyed by the second conveying device, into the card removal and sorting machine 800.

[0065] For example, the first gripping mechanism 1400 is installed between the first card opening cabinet 400 and the RDT test cabinet 600, the second gripping mechanism 1300 is installed between the RDT test cabinet 600 and the BIT test cabinet 700, and the third gripping mechanism 1000 is installed between the BIT test cabinet 700 and the card disassembly and sorting machine 800.

[0066] Based on the above embodiments, the clamping device further includes a fourth clamping mechanism 900, which is capable of clamping the test carrier 100 from which the SSD card 200 has been removed by the card sorting machine 800 to the first conveying device 1600.

[0067] In other words, the test carrier 100 with the SSD card 200 removed is placed back onto the first conveying device 1600 by the fourth clamping mechanism 900, so as to return to the card loading machine 300, thereby realizing the cyclic use of the test carrier 100 without the need for manual handling of the test carrier 100.

[0068] like Figure 4 As shown, based on the above embodiments, the first gripping mechanism 1400, the second gripping mechanism 1300, the third gripping mechanism 1000, and the fourth gripping mechanism 900 are all multi-axis robotic arms 500. For example, the multi-axis robotic arm 500 can be a six-axis robotic arm, a seven-axis robotic arm, etc.

[0069] like Figure 2 As shown, based on the above embodiment, the multiple testing devices also include a second card opening cabinet 1100, which is located downstream of the BIT test cabinet 700. At least one of the third clamping mechanism 1000 and the fourth clamping mechanism 900 is capable of clamping the test carrier 100 after it has been opened by the second card opening cabinet 1100 to the first conveying device 1600.

[0070] By setting up a second card opening cabinet 1100 downstream of the BIT test cabinet 700, the test carrier 100 with abnormal card opening in the BIT test cabinet 700 or RDT test cabinet 600 can be clamped to the second card opening cabinet 1100 for secondary card opening, without having to transfer all cards to the first card opening cabinet 400 for card opening, thus avoiding increasing the workload of the first card opening cabinet 400 and affecting the testing efficiency.

[0071] Of course, the test carrier 100 that experiences a card opening anomaly in either the BIT test cabinet 700 or the RDT test cabinet 600 can also be transported to the second card opening cabinet 1100 via the second conveyor 1200, and then clamped by the third clamping mechanism 1000 and the fourth clamping mechanism 900 to the first conveyor 1600 after undergoing a second card opening. It should be noted that the test carrier 100 that experiences a card opening anomaly in the RDT test cabinet 600 can be directly transported to the second card opening cabinet 1100 via the second conveyor 1200, bypassing the BIT test cabinet 700.

[0072] Obviously, the test carrier 100 that is opened twice by the second card opening cabinet 1100 can pass through the BIT test cabinet 700 or the RDT test cabinet 600 in sequence during the return process with the first conveyor device 1600. With the corresponding identification device and clamping device, the test carrier 100 that is opened twice by the second card opening on the first conveyor device 1600 can be clamped to the corresponding test device, thereby further improving work efficiency.

[0073] According to a second aspect disclosed in this utility model, an SSD card production line is provided, which includes the aforementioned SSD card testing equipment.

[0074] Since the aforementioned SSD card 200 testing equipment has the above-mentioned technical effects, the SSD card 200 production line including the SSD card 200 testing equipment should have the same technical effects, which will not be elaborated here.

[0075] In all examples shown and described herein, any specific values ​​should be interpreted as merely exemplary and not as limitations; therefore, other examples of exemplary embodiments may have different values.

[0076] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0077] The embodiments described above are merely examples of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this utility model. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these modifications and improvements all fall within the protection scope of this utility model.

Claims

1. An SSD card testing device, characterized in that, The SSD card testing equipment includes: Multiple testing devices, the multiple testing devices including at least a first card opening cabinet, an RDT testing cabinet and a BIT testing cabinet, wherein the first card opening cabinet, the RDT testing cabinet and the BIT testing cabinet are arranged sequentially along a first direction; A first conveying device is used to convey a test vehicle in the first direction; wherein, in the conveying direction of the first conveying device, the BIT test cabinet is located upstream of the card opening cabinet; A gripping device capable of transferring the test carrier between any two of the first conveying device and the plurality of test devices; The clamping device includes a first clamping mechanism, which can clamp the empty test carrier conveyed by the first conveying device to the card loading machine; and the first clamping mechanism can also clamp the test carrier with the SSD card inserted by the card loading machine to the first card opening cabinet. The second gripping mechanism is capable of gripping the test carrier opened by the first card opening cabinet into the RDT test cabinet; and the second gripping mechanism is also capable of gripping the test carrier after testing by the RDT test cabinet into the BIT test cabinet; the first gripping mechanism and the second gripping mechanism are multi-axis robotic arms.

2. The SSD card testing device according to claim 1, characterized in that, The SSD card testing equipment also includes a second conveying device, wherein the first conveying device and the second conveying device convey in opposite directions; the second conveying device is used to receive and convey the test carrier conveyed by the clamping device.

3. The SSD card testing device according to claim 2, characterized in that, The gripping device is capable of transferring the test carrier between any two of the first conveying device, the second conveying device, and the plurality of test devices.

4. The SSD card testing device according to claim 3, characterized in that, One of the first conveying device and the second conveying device is located above the other.

5. The SSD card testing device according to claim 2, characterized in that, The SSD card testing equipment also includes: Card loading machine and card unloading and sorting machine; the card loading machine and the card unloading and sorting machine are respectively located downstream of the first card opening cabinet and the BIT test cabinet; wherein The gripping device is capable of transferring the test carrier between any two of the first conveying device, the card loading machine, the card unloading and sorting machine, and the plurality of test devices; The clamping device includes: The third clamping mechanism is capable of clamping the test carrier tested by the BIT test cabinet to the card removal and sorting machine; and the third clamping mechanism is also capable of clamping the test carrier conveyed by the second conveying device to the card removal and sorting machine. The third gripping mechanism is a multi-axis robotic arm.

6. The SSD card testing device according to claim 5, characterized in that, The clamping device further includes a fourth clamping mechanism, which is capable of clamping the test carrier from which the SSD card has been removed by the card sorting machine to the first conveying device; the fourth clamping mechanism is a multi-axis robotic arm.

7. The SSD card testing device according to claim 6, characterized in that, The multiple testing devices also include a second card opening cabinet, which is located downstream of the BIT testing cabinet. At least one of the third clamping mechanism and the fourth clamping mechanism is capable of clamping the test carrier after it has been opened by the second card opening cabinet to the first conveying device.

8. An SSD card production line, characterized in that, The SSD card production line includes the SSD card testing equipment as described in any one of claims 1 to 7.

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