Connector pin inspection device

Abstract

The utility model discloses a connector pin needle inspection device, it includes base, first mobile mechanism is set on the base, test head is used for with connector butt joint, is set on the base through first mobile mechanism, with the drive of first mobile mechanism can reciprocatingly move along first direction relative to base, and first scale is set on at least one of base and first mobile mechanism, to can read the distance of test head relative to base and move along first direction. Therefore, can through the first scale of test head relative to base and move along first direction distance that sets on first mobile mechanism whether pin needle is retreated pin's mode, to judge whether pin needle is qualified, thereby guarantee the consistency and efficiency of judgment.

Description

Technical Field

[0001] This utility model relates to the field of connector technology, and specifically to a connector pin inspection device. Background Technology

[0002] Currently, the determination of whether connector pins are qualified mainly relies on visual inspection, that is, by observing whether the pins are obviously too low.

[0003] However, this method has obvious shortcomings: on the one hand, there are often cases where the actual holding force of the pin does not meet the requirements but is mistakenly judged as unqualified, resulting in an abnormally high scrap rate; on the other hand, visual inspection is easily affected by the operator's visual fatigue, which not only leads to poor consistency in judgment but also low efficiency.

[0004] Therefore, it is necessary to introduce a more accurate detection device to replace the current high-precision detection method that relies on manual visual inspection. Utility Model Content

[0005] To address at least one of the aforementioned problems, according to one aspect of the present invention, a connector pin inspection device is provided.

[0006] The connector pin inspection device includes a base; a first moving mechanism disposed on the base; a test head for mating with the connector, disposed on the base via the first moving mechanism so as to be able to reciprocate relative to the base in a first direction under the drive of the first moving mechanism; and a first scale disposed on at least one of the base and the first moving mechanism so as to be able to read the distance the test head moves relative to the base in the first direction.

[0007] Therefore, by using the above-mentioned inspection device, the test head set on the first moving mechanism can move relative to the base along the first direction by a distance marked on the first scale to test whether the pin retracts when subjected to a preset force, thereby determining whether the pin is qualified, thus ensuring the consistency and efficiency of the judgment.

[0008] In some embodiments, the connector pin inspection device further includes a second moving mechanism; the test head is disposed on the first moving mechanism via the second moving mechanism; the second moving mechanism is configured to drive the test head to reciprocate relative to the first moving mechanism in a first direction, and the second moving mechanism is provided with a second scale that can read the distance the test head moves relative to the first moving mechanism.

[0009] Therefore, the first moving mechanism can drive the test head on the second moving mechanism to move towards the side where the pin is located. When the test head abuts against the pin and reaches the preset holding force requirement, the values ​​of the first and second scales are observed. Then, the first moving mechanism continues to drive the test head on the second moving mechanism to move towards the side where the pin is located. At this time, since the test head abuts against the pin, the second moving mechanism will drive the test head to move away from the side where the pin is located relative to the first moving mechanism. Thus, based on whether the difference between the first distance moved by the first moving mechanism and the second distance moved by the second moving mechanism after the test head abuts against the pin for a certain period of time is within the set range, it can be determined whether the pin has retracted. Moreover, the use of the connector pin inspection device of this application provides reliable data support for the release of connector pins.

[0010] In some embodiments, the second moving mechanism is a telescopic pressure gauge, which is configured to test the pressure borne on the test head along the first direction, and the telescopic pressure gauge is also provided with a pressure display area that can display the test pressure value.

[0011] Because the telescopic pressure gauge can displace the test head along the pressure direction when it is subjected to pressure in the first direction (this displacement can be read through the second scale), and can apply a reaction force to the component against the test head as it displaces (this reaction force can be displayed through the pressure value), it can determine whether the difference between the aforementioned first distance and the second distance is within the set range when the reaction force reaches the lower limit value required by the pin product design, so as to accurately determine whether the pin has retracted; moreover, since the second moving mechanism is a telescopic pressure gauge, it can also test the value of the pin holding force, avoiding the unreasonable judgment standard of using height as the only judgment value, and reducing the defect rate caused by misjudgment.

[0012] In some implementations, the test head is integrated into the telescopic pressure gauge. This allows the probe on the telescopic pressure gauge to be used as the test head, simplifying the structure of the connector pin inspection device.

[0013] In some embodiments, the test head has a cylindrical or needle-like structure. This facilitates the reciprocating movement of the test head along the first direction.

[0014] In some embodiments, the connector pin inspection device further includes a locking mechanism; the locking mechanism is configured such that, in its locked state, the first moving mechanism cannot drive the telescopic pressure gauge to reciprocate along the first direction; and in its unlocked state, the first moving mechanism can drive the telescopic pressure gauge to reciprocate along the first direction.

[0015] Therefore, when the pressure value displayed on the telescopic pressure gauge reaches the lower limit required by the pin product design, the first moving mechanism can be locked by a locking mechanism to prevent the pressure on the pin from becoming unstable due to the reciprocating motion of the telescopic pressure gauge in the first direction. At this time, if the pin does not retract, the pressure value displayed on the telescopic pressure gauge will not decrease; if the pressure value displayed on the telescopic pressure gauge decreases and is less than the set value (e.g., 0.5 mm), it indicates that the pin has retracted.

[0016] In some embodiments, the first moving mechanism includes a first guide rail and a first slider that are adapted to each other; the first guide rail is arranged along a first direction; and a telescopic pressure gauge is disposed on the first slider. This simplifies the structure of the first moving mechanism and ensures the stability of the first moving mechanism in driving the test head to reciprocate along the first direction.

[0017] In some embodiments, the locking mechanism includes a first screw hole on the first slider and a first screw adapted to the first screw hole; the first screw hole communicates with the first guide rail. Thus, the first slider can be locked relative to the first guide rail by pressing the first screw against it; the first slider can also be unlocked relative to the first guide rail by separating the first screw from it, making operation convenient.

[0018] In some embodiments, the connector pin inspection device further includes a fourth moving mechanism; the second moving mechanism is disposed on the first moving mechanism via the fourth moving mechanism, or the first moving mechanism is disposed on the base via the fourth moving mechanism; the fourth moving mechanism is configured to drive the second moving mechanism to reciprocate relative to the base along a second direction, the second direction being non-parallel to the first direction.

[0019] Therefore, the second moving mechanism and the test head mounted thereon can perform planar motion under the combined action of the first moving mechanism and the fourth moving mechanism. This planar motion is defined by the first direction and the second direction and is parallel to the first direction and the second direction.

[0020] In some embodiments, the connector pin inspection device further includes a fifth moving mechanism, with the second moving mechanism mounted on the first moving mechanism via the fifth moving mechanism. The fifth moving mechanism is configured to drive the second moving mechanism to reciprocate relative to the base along a third direction, which is perpendicular to the first direction. Thus, the second moving mechanism and the test head mounted thereon can perform planar motion under the combined action of the first and fifth moving mechanisms. This planar plane is defined by the first and third directions and is parallel to both directions. When the connector pin inspection device further includes a fourth moving mechanism, the second moving mechanism and the test head mounted thereon can also perform three-dimensional motion within the three-dimensional space formed by the first, second, and third directions under the combined action of the first, fourth, and fifth moving mechanisms.

[0021] In some embodiments, the base is provided with a positioning structure for defining the position of the connector. Therefore, when it is necessary to inspect the pins on the connector, the connector can be placed on the positioning structure of the base of the connector pin inspection device to ensure consistent inspection.

[0022] In some embodiments, the positioning structure includes an abutment portion disposed on the side of the connector opposite to the first moving mechanism. Thus, when the first moving mechanism moves the test head toward the connector, the connector can remain stationary under the action of the abutment portion.

[0023] In some embodiments, the positioning structure is a frame mounted on the base and adapted to the outer periphery of the connector. At least one of the sides of the frame facing away from the base and the side facing the first moving mechanism has a first opening for the connector to be placed or removed. Thus, when the first moving mechanism moves the test head toward the connector, the connector can remain in its original position under the action of the frame; after the connector has completed the test, it can be removed from the frame through the first opening. Attached Figure Description

[0024] Figure 1 A schematic diagram of a qualified connector with pins in the prior art; Figure 2 This is a schematic diagram of a connector with pins that are too short in the prior art. Figure 3 This is a schematic diagram of the module structure of a connector pin inspection device according to an embodiment of this application; Figure 4 This is a schematic diagram of the connector pin inspection device according to one embodiment of this application; Figure 5 for Figure 4 A schematic diagram of the connector pin inspection device from another perspective; Figure 6 for Figure 4 Another structural schematic diagram of the connector pin inspection device shown. Figure 7 This is a top view schematic diagram of the connector pin inspection device according to an embodiment of this application; Figure 8 for Figure 7 A schematic diagram of the connector pin inspection device from another perspective; Figure 9 for Figure 7 Another structural schematic diagram of the connector pin inspection device shown. Figure 10 for Figure 7 A structural schematic diagram of the connector pin inspection device shown from another perspective. Reference numerals: 21, base; 211, positioning structure; 2111, abutment; 2112, frame; 2113, first opening; 22, first moving mechanism; 221, first guide rail; 222, first slider; 23, test head; 24, first scale; 25, second scale; 26, telescopic pressure gauge; 27, pressure display area; 28, locking mechanism; 281, first screw hole; 282, first screw; 29, fourth moving mechanism; 291, fourth guide rail; 292, fourth slider; 30, connector; 300, domain controller; 31, housing; 32, pin; 40, fifth moving mechanism; 41, fifth guide rail; 42, fifth slider; 43, second screw. Detailed Implementation

[0025] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other.

[0026] It should also be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising" or "including" include not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element. The terminology used herein is generally that commonly used by those skilled in the art; in case of any discrepancy with commonly used terminology, the terminology used herein shall prevail.

[0027] In this application, the term "connector pin" refers to a device in the electronics industry used to connect two lines, and a pin is a metal lead in a connector used for electrical connection. "Pin ejection," also commonly abbreviated as "pin ejection" or "terminal ejection," refers to the phenomenon where the metal pin (or "terminal") inside a connector (plug) moves backward or completely disengages from its original, locked position for some reason. A normal connector consists of two parts: a plastic shell, which provides insulation, protection, and positioning; and a metal terminal, the "pin," which is the core component responsible for conducting electricity. Each terminal is firmly secured in its corresponding hole in the plastic shell by a precise retaining structure (usually a barb or spring on the terminal). When "pin ejection" occurs, it means that the retaining structure of the terminal has failed and can no longer be secured in the plastic shell.

[0028] Furthermore, for ease of description, spatial relative terms such as “below,” “under,” “lower,” “above,” and “upper” may be used herein to describe the relationship between one element or component and another (or other) element or component as shown in the figure. In addition to the orientation shown in the figure, spatial relative terms are intended to include different orientations of the device during use or operation. The device may be oriented in other ways (rotated 90 degrees or in other orientations), and the spatial relative descriptors used herein can be interpreted accordingly.

[0029] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0030] Currently, the determination of whether the pins 32 of connector 30 are qualified mainly relies on visual inspection, that is, by observing whether the pins 32 are significantly lower than normal. For example, under visual inspection, Figure 1 The pins 32 of the connector 30 shown are all at the same height, based on visual inspection. Figure 1 The pin 32 of the connector 30 shown is qualified; Figure 2 In the connector 30 shown, the height of the selected pin 32 is significantly lower than the height of the other pins 32 or the housing 31. Based on visual judgment... Figure 2The pin 32 of the connector 30 shown is defective. However, this visual judgment method often results in situations where the actual holding force of the pin 32 meets the requirements but is mistakenly judged as defective, leading to an abnormally high scrap rate. Furthermore, it is easily affected by operator visual fatigue, resulting in poor judgment consistency and low efficiency.

[0031] To address at least one of the aforementioned problems, according to one aspect of the present invention, a connector pin inspection device is provided.

[0032] Figures 3 to 10 The connector pin inspection device according to a first embodiment of the present invention is schematically shown.

[0033] like Figure 5 , Figure 6 and Figure 8 As shown, the connector pin inspection device includes a base 21, a test head 23, and a first guide rail 221 and a first slider 222 that are mutually adapted to each other; the first guide rail 221 is fixedly disposed relative to the base 21 and is disposed along the first direction X; the test head 23 is used to mate with the connector and is disposed on the first slider 222; at least one of the first guide rail 221 and the base 21 is provided with a first scale 24, which is disposed along the first direction X, and the smallest scale unit of the first scale 24 can be selected as needed, for example, mm.

[0034] In some embodiments, to facilitate the reciprocating movement of the test head 23 along the first direction, such as Figures 4 to 6 As shown, the test head 23 has a columnar or needle-like structure.

[0035] In some embodiments, continue to refer to Figure 5 , Figure 6 and Figure 8 As shown, the first guide rail 221 and the first slider 222 constitute the first moving mechanism 22 of an embodiment of this application.

[0036] As another embodiment of the first moving mechanism 22, the first moving mechanism 22 includes a first optical rod and a slider that are adapted to each other; the first optical rod is fixedly disposed relative to the base 21 and is disposed along the first direction X; the slider is sleeved on the first optical rod; the second moving mechanism is disposed on the slider and is configured such that, driven by the slider, the test head disposed on the second moving mechanism can move along the extension direction of the first optical rod; the first scale 24 is disposed on at least one of the first optical rod and the base 21 and is disposed along the first direction X.

[0037] As another embodiment of the first moving mechanism 22, the first moving mechanism 22 includes a first rack and a first gear that are adapted to each other; the first rack is fixedly disposed relative to the base 21 and is disposed along the first direction X; the first gear is rotatably disposed on the test head 23; the first scale 24 is disposed on at least one of the first rack and the base 21 and is disposed along the first direction X.

[0038] In some embodiments, such as Figure 3 As shown, the connector pin inspection device also includes a second moving mechanism; the test head 23 is mounted on the first moving mechanism 22 via the second moving mechanism; the second moving mechanism is configured to drive the test head 23 to reciprocate relative to the first moving mechanism 22 along the first direction X, and the second moving mechanism is provided with a second scale 25 that can read the distance the test head 23 moves relative to the first moving mechanism 22, the second scale 25 being set along the first direction X.

[0039] For example, to facilitate distance calculation, the smallest scale unit of the second scale 25 can be the same as that of the first scale 24.

[0040] As one embodiment of the second moving mechanism, such as Figure 5 and Figure 6 As shown, the second moving mechanism is a telescopic pressure gauge 26, which is configured to test the pressure along the first direction X that the test head 23 bears. The telescopic pressure gauge 26 is also provided with a pressure display area 27 that can display the test pressure value.

[0041] As one embodiment of the telescopic pressure gauge 26, the telescopic pressure gauge 26 can be a pressure gauge commonly used in the prior art, such as a commercially available tubular force gauge, and the pressure gauge can generate displacement when subjected to pressure.

[0042] As another embodiment of the telescopic pressure gauge, the telescopic pressure gauge includes a third moving mechanism and a pressure gauge; the structure of the third moving mechanism can be similar to that of the first moving mechanism 22, for example, including a mutually adapted third guide rail and a third slider, the third guide rail being arranged along the first direction X and disposed on the first moving mechanism 22, for example, fixedly disposed relative to the first slider 222; the test head 23 is disposed on the third slider via the pressure gauge, and the test head 23 is integrally disposed on the pressure gauge, for example, the test head 23 is an integral part of the pressure gauge. Part of the pressure gauge, namely the measuring head, is the test head 23 of this application; at least one of the third guide rail and the first slider 222 is provided with a second scale 25, and the second scale 25 is set along the first direction X. The smallest scale unit of the second scale 25 can be consistent with the first scale 24; the pressure gauge can be a commonly used pressure gauge in the prior art, such as a spring gauge. The pressure on the pressure gauge is set along the first direction X, and the end of the third slider away from the pin 32 abuts against the measuring part of the pressure gauge. When the pressure gauge drives the third slider and the test head 23 to move toward the pin 32, the force exerted by the pin 32 on the third slider can be read by the pressure gauge.

[0043] As another embodiment of the telescopic pressure gauge, the telescopic pressure gauge includes a pressure gauge, and the pressure gauge is configured to move relative to the first slider 222 along the extension direction of the first guide rail 221. For example, the first slider 222 has an integrally formed or machined through hole along the extension direction of the first guide rail 221, and the through hole is adapted to the pressure gauge; the measuring head of the pressure gauge can be used as a test head.

[0044] When the connector pin inspection device includes a first moving mechanism 22 and a second moving mechanism, the first moving mechanism 22 can drive the test head 23 on the second moving mechanism to move towards the side where the pin 32 is located. When the test head 23 abuts against the pin 32 and reaches the preset holding force requirement, the values ​​of the first scale 24 and the second scale 25 are observed. Then, the first moving mechanism 22 continues to drive the test head 23 on the second moving mechanism to move towards the side where the pin 32 is located. At this time, since the test head 23 abuts against the pin 32, the second moving mechanism will drive the test head 23 to move relative to the first moving mechanism 22 towards the side away from the pin 32. If the pin 32 does not have a retraction situation, the test head 23 abuts against the pin 32. After step 2, the difference between the first distance (the change read on the first scale 24, i.e., the value on the first scale 24 when the test head 23 is against the pin 32 and the value on the first scale 24 after the first moving mechanism 22 has moved the test head 23 against the pin 32 for a set time (e.g., 5 seconds or 10 seconds) and the second distance (the change read on the second scale 25, i.e., the difference between the value on the second scale 25 when the test head 23 is against the pin 32 and the value on the second scale 25 after the first moving mechanism 22 has moved the test head 23 against the pin 32 for a set time (e.g., 5 seconds or 10 seconds)) is within a set range (e.g., 0.5 mm). Therefore, the connector pin inspection device of this application can be used to determine whether the pin 32 has been ejected.

[0045] When the second moving mechanism is a telescopic pressure gauge 26, the telescopic pressure gauge 26 can cause the test head 23 to be displaced relative to the first moving mechanism 22 (e.g., relative to the first slider 222) in the pressure direction when the test head 23 is subjected to pressure in the first direction (this displacement can be read through the second scale 25). It can also apply a reaction force to the component abutting against the test head 23 with the displacement it generates (this reaction force can be displayed through the pressure value). Thus, when the reaction force reaches the lower limit value of the pin 32 product design requirements (reaching the preset holding force requirement), it can determine whether the difference between the aforementioned first distance and the second distance is within the set range, so as to accurately determine whether the pin 32 has a pin retraction situation, improve the efficiency of process anomaly analysis, and thus quickly identify whether the holding force of the pin 32 of the connector 30 is qualified, thereby improving the product production yield.

[0046] In some embodiments, such as Figures 3 to 8 and Figure 10As shown, the test head 23 is integrally mounted on the telescopic pressure gauge 26. For example, the test head 23 is part of the telescopic pressure gauge 26, that is, the measuring head of the telescopic pressure gauge 26 is the test head 23 of this application, so as to simplify the structure of the connector pin inspection device.

[0047] In some embodiments, such as Figures 3 to 6 As shown, the connector pin inspection device also includes a locking mechanism 28. The locking mechanism 28 can lock and unlock the first slider 222 relative to the first guide rail 221. In the locked state, the first slider 222 will not drive the second moving mechanism and the test head 23 to reciprocate along the first direction. Thus, when the pressure value displayed on the telescopic pressure gauge 26 reaches the lower limit value required by the pin 32 product design, the locking mechanism 28 locks the first slider 222 relative to the first guide rail 221 to ensure that the pressure on the pin 32 is stable. When the locking mechanism 28 is in the unlocked state, the first moving mechanism 22 can drive the telescopic pressure gauge 26 to reciprocate along the first direction. At this time, if the pin 32 does not retract, the pressure value displayed on the telescopic pressure gauge 26 will not decrease; if the pressure value displayed on the telescopic pressure gauge 26 decreases and is less than the set value (e.g., 0.5 mm), it indicates that the pin has retracted.

[0048] As one embodiment of the locking mechanism 28, such as Figures 3 to 6 As shown, the locking mechanism 28 includes a first screw hole 281 disposed on the first slider 222 and a first screw 282 adapted in the first screw hole 281. The first screw hole 281 communicates with the first guide rail 221, so that the first slider 222 can be locked relative to the first guide rail 221 by abutting / passing the first screw 282 against / through the first guide rail 221; the first slider 222 can also be unlocked relative to the first guide rail 221 by separating the first screw 282 from the first guide rail 221, which is convenient to operate. Preferably, the first screw hole 281 is perpendicular to the extending direction of the first guide rail 221. This maximizes the contact area between the first screw 282 and the first guide rail 221 when the first screw 282 abuts against the first guide rail 221, thereby ensuring that the first screw 282 can stably lock the first slider 222 onto the first guide rail 221.

[0049] As another embodiment of the locking mechanism 28, the locking mechanism 28 includes a wedge block capable of being inserted into the gap between the first slider 222 and the first guide rail 221.

[0050] As another embodiment of the locking mechanism 28, the locking mechanism 28 includes a cylinder disposed on the first slider 222. When it is necessary to lock the first slider 222 relative to the first guide rail 221, it can be achieved by the piston rod of the cylinder abutting against the first guide rail 221 or the base 21.

[0051] As another embodiment of the locking mechanism 28, the locking mechanism 28 includes an electromagnet disposed on the first slider 222; at least one of the first guide rail 221 and the base 21 is a ferromagnetic component; when it is necessary to lock the first slider 222 relative to the first guide rail 221, the electromagnet can be energized to make the electromagnet magnetically connected to the ferromagnetic first guide rail 221 or the base 21.

[0052] In some embodiments, such as Figure 6 As shown, the connector pin inspection device also includes a fourth moving mechanism 29; the fourth moving mechanism 29 is configured to drive the second moving mechanism to reciprocate relative to the base 21 along a second direction, where the second direction Y is not parallel to the first direction. One implementation of the fourth moving mechanism 29 is as follows: Figure 6 As shown, the fourth moving mechanism 29 includes at least one set of mutually adapted fourth guide rails 291 and fourth sliders 292; the fourth guide rails 291 are fixedly disposed relative to the base 21 and extend along the second direction Y. In one implementation, the first moving mechanism 22 is disposed on the base 21 via the fourth moving mechanism 29. Specifically, the first guide rail 221 is disposed on the fourth moving mechanism 29, for example, the first guide rail 221 is fixedly disposed relative to the fourth slider 292. In another implementation, the second moving mechanism is disposed on the first moving mechanism 22 via the fourth moving mechanism 29, for example, the second moving mechanism is fixedly disposed relative to the fourth slider 292.

[0053] As another embodiment of the fourth moving mechanism, the fourth moving mechanism includes a second rack and a second gear that are mutually adapted to each other; the second gear is rotatably mounted on the base 21; the second rack is positioned in a second direction Y. A first moving mechanism 22 or a second moving mechanism is mounted on the second rack. For example, a first guide rail 221 is fixedly mounted relative to the second rack.

[0054] When using this connector pin inspection device to inspect the pins 32 on the connector 30, the first moving mechanism 22 can drive the test head 23 to move along the first direction X toward the pin 32, and the fourth moving mechanism 29 can drive the test head 23 to move along the second direction. By reading the change in the value of the first scale 24, it is determined whether the pin 32 has retracted, thereby determining whether the pin 32 is qualified. Since the connector pin inspection device of this application determines whether the pin 32 has retracted through scale, compared with visual judgment, it can ensure the consistency and efficiency of the judgment, and provide reliable data support for the release of connector pins.

[0055] In some embodiments, such as Figure 6 and Figure 8 As shown, the connector pin inspection device also includes a fifth moving mechanism 40; the second moving mechanism is mounted on the first moving mechanism 22 via the fifth moving mechanism 40, and the fifth moving mechanism 40 is configured to drive the second moving mechanism to reciprocate relative to the base 21 along a third direction Z, where the third direction Z is perpendicular to the first direction. One implementation of the fifth moving mechanism 40 is as follows: Figure 6 As shown, the fifth moving mechanism 40 includes at least one set of mutually adapted fifth guide rails 41 and fifth sliders 42; the fifth guide rails 41 extend in a third direction Z. In one implementation, the second moving mechanism is disposed on the fifth slider 42, and the fifth guide rails 41 are disposed on the first moving mechanism 22, specifically, the fifth guide rails 41 are disposed on the first slider 222; in another implementation, the fifth moving mechanism 40 is disposed on the first moving mechanism 22 via a fourth moving mechanism 29, for example, the fifth guide rails 41 of the fifth moving mechanism 40 are fixedly disposed relative to the fourth slider 292 of the fourth moving mechanism 29. Preferably, the fifth slider 42 is also threadedly connected to a second screw 43 that can abut against the fifth guide rail 41, so that the fifth slider 42 can be locked or unlocked relative to the fifth guide rail 41. In other embodiments, the fifth slider 42 may also be integrally formed or have a through groove that connects the through hole that adapts to the fifth guide rail 41 to the outside. The side walls on both sides of the through groove are connected by screws so that the fifth slider 42 can be locked relative to the fifth guide rail 41 by tightening the screws and the fifth slider 42 can be unlocked relative to the fifth guide rail 41 by loosening the screws.

[0056] As another embodiment of the fifth moving mechanism, the fifth moving mechanism includes a first screw and a first nut that are adapted to each other; the first screw is rotatably disposed on the first slider 222 about the central axis and is disposed along the third direction Z; the first nut is fixedly disposed relative to the second moving mechanism.

[0057] When the connector pin inspection device is used to inspect the pins 32 on the connector 30, the test head 23 can move along the first direction X and the second direction Y respectively under the drive of the first moving mechanism 22 and the fourth moving mechanism 29; it can also move along the third direction Z under the drive of the fifth moving mechanism 40, so that the test head 23 can test the pins 32 at any position in space.

[0058] In some embodiments, the base 21 is provided with a positioning structure 211 for defining the position of the connector 30. When it is necessary to inspect the pins 32 on the connector 30, the connector 30 can be placed on the positioning structure 211 of the base 21 of the connector pin inspection device to ensure the consistency of the inspection.

[0059] In some embodiments, the positioning structure 211 defines the position of the connector 30 by directly defining the housing 31 of the connector 30, for example, by integrally forming or machining a mounting groove adapted to the housing 31 of the connector 30 on the base 21. As one embodiment of the positioning structure 211, the positioning structure 211 includes an abutment portion 2111 disposed on the side of the connector 30 opposite to the first moving mechanism 22. When the first moving mechanism 22 moves the test head 23 toward the connector 30, the connector 30 can remain stationary under the action of the abutment portion 2111. As another embodiment of the positioning structure 211, the positioning structure 211 is a frame 2112 disposed on the base 21 and adapted to the outer periphery of the connector 30. At least one of the side of the frame 2112 opposite to the base 21 and the side facing the first moving mechanism 22 has a first opening 2113 for the connector 30 to be placed or removed. When the first moving mechanism 22 drives the test head 23 to move toward the connector 30, the connector 30 can remain in its original position under the action of the frame 2112; after the connector 30 completes the test, it can be taken out from the frame 2112 through the first opening 2113.

[0060] In other embodiments, such as Figures 5 to 10 As shown, the way in which the positioning structure 211 defines the position of the connector 30 can also be achieved by defining the device on which the connector 30 is installed (e.g., a domain controller).

[0061] As one embodiment of the positioning structure 211, such as Figure 5 and Figure 6 As shown, the positioning structure 211 includes an abutment 2111 disposed on the side of the domain controller 300, on which the connector 30 is mounted, away from the first moving mechanism 22. When the first moving mechanism 22 drives the test head 23 toward the domain controller 300, the domain controller 300 can remain in its original position under the action of the abutment 2111.

[0062] As another embodiment of the positioning structure 211, such as Figures 7 to 10 As shown, the positioning structure 211 is a frame 2112 mounted on the base 21 and adapted to the outer periphery of the domain controller 300 on which the connector 30 is mounted. At least one of the sides of the frame 2112 facing away from the base 21 and the side facing the first moving mechanism 22 has a first opening 2113 for the domain controller 300 to be placed and removed. When the first moving mechanism 22 moves the test head 23 toward the domain controller 300, the domain controller 300 can remain in its original position under the action of the frame 2112; after the connector 30 has completed the test, it can be removed from the frame 2112 through the first opening 2113.

[0063] In some other embodiments, the positioning structure 211 can define the position of the connector 30 by defining the circuit board on which the connector 30 is mounted.

[0064] For example, the connector pin inspection device of this application is suitable for inspecting the status of pins 32 on connectors 30 such as domain controllers, camera harness connectors, and main power connectors.

[0065] In this invention, the connection or installation is a fixed connection unless otherwise specified. A fixed connection can be implemented as a detachable or non-detachable connection commonly used in the prior art. A detachable connection can be implemented using existing technologies, such as threaded connections or keyed connections. A non-detachable connection can also be implemented using existing technologies, such as welding or adhesive bonding.

[0066] The above descriptions are merely some embodiments of this utility model. For those skilled in the art, various modifications and improvements can be made without departing from the inventive concept of this utility model, and all such modifications and improvements fall within the protection scope of this utility model.

Claims

1. A connector pin inspection device, characterized in that, include: Base (21); A first moving mechanism (22) is mounted on the base (21); The test head (23) is used to mate with the connector and is set on the base (21) by the first moving mechanism (22) so that it can reciprocate relative to the base (21) in the first direction under the drive of the first moving mechanism (22); A first scale (24) is provided on at least one of the base (21) and the first moving mechanism (22) to enable reading the distance the test head (23) moves relative to the base (21) in a first direction.

2. The connector pin inspection device according to claim 1, characterized in that, It also includes a second moving mechanism; The test head (23) is mounted on the first moving mechanism (22) via the second moving mechanism; The second moving mechanism is configured to drive the test head (23) to move back and forth in a first direction relative to the first moving mechanism (22), and the second moving mechanism is provided with a second scale (25) that can read the distance the test head (23) moves relative to the first moving mechanism (22).

3. The connector pin inspection device according to claim 2, characterized in that, The second moving mechanism is a telescopic pressure gauge (26), which is configured to test the pressure on the test head (23) along the first direction. The telescopic pressure gauge (26) is also provided with a pressure display area (27) that can display the test pressure value.

4. The connector pin inspection device according to claim 3, characterized in that, The test head (23) is integrally mounted on the telescopic pressure gauge (26); and / or The test head (23) has a columnar or needle-like structure.

5. The connector pin inspection device according to claim 3, characterized in that, It also includes a locking mechanism (28); the locking mechanism (28) is configured such that, in its locked state, the first moving mechanism (22) cannot drive the telescopic pressure gauge (26) to reciprocate along the first direction; In its unlocked state, the first moving mechanism (22) can drive the telescopic pressure gauge (26) to reciprocate along the first direction.

6. The connector pin inspection device according to claim 5, characterized in that, The first moving mechanism (22) includes a first guide rail (221) and a first slider (222) that are adapted to each other; The first guide rail (221) is set along the first direction; The telescopic pressure gauge (26) is mounted on the first slider (222).

7. The connector pin inspection device according to claim 6, characterized in that, The locking mechanism (28) includes a first screw hole (281) provided on the first slider (222) and a first screw (282) adapted to the first screw hole (281); The first screw hole (281) is connected to the first guide rail (221).

8. The connector pin inspection device according to claim 2, characterized in that, It also includes a fourth moving mechanism (29); The second moving mechanism is mounted on the first moving mechanism (22) via the fourth moving mechanism (29), or the first moving mechanism (22) is mounted on the base (21) via the fourth moving mechanism (29); The fourth moving mechanism (29) is configured to drive the second moving mechanism to reciprocate relative to the base (21) along a second direction, the second direction being non-parallel to the first direction; And / or, It also includes a fifth moving mechanism (40), the second moving mechanism being mounted on the first moving mechanism (22) via the fifth moving mechanism (40); the fifth moving mechanism (40) is configured to drive the second moving mechanism to reciprocate relative to the base (21) along a third direction, the third direction being perpendicular to the first direction.

9. The connector pin inspection device according to any one of claims 1 to 8, characterized in that, The base (21) is provided with a positioning structure (211) for defining the position of the connector (30).

10. The connector pin inspection device according to claim 9, characterized in that, The positioning structure (211) includes an abutment portion (2111) disposed on the side of the connector (30) opposite to the first moving mechanism (22); or The positioning structure (211) is a frame (2112) provided on the base (21) and adapted to the outer periphery of the connector (30). At least one of the side of the frame (2112) facing away from the base (21) and the side facing the first moving mechanism (22) has a first opening (2113) for the connector (30) to be picked up and put in.

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