Hot wire testing device

Abstract

The present disclosure relates to the field of photovoltaic and semiconductor technology, in particular to a hot wire testing device, which solves the problem of low accuracy of temperature detection of the hot wire testing device. The hot wire testing device comprises at least two clamping assemblies and a temperature detection assembly. The at least two clamping assemblies are oppositely arranged along a first direction. The at least two clamping assemblies are capable of clamping two ends of the hot wire respectively. At least one clamping assembly is capable of generating a pulling force along the first direction on the hot wire, so that the hot wire extends along the first direction and is in a straightened state. In the state that the hot wire is electrified and generates heat, since the hot wire is in the straightened state, the heat radiation of the hot wire itself is avoided, and the uniformity of the temperature of the hot wire is improved. Therefore, when the temperature of the hot wire is detected by the temperature detection assembly, the accuracy of the temperature detection of the hot wire is improved.

Description

Technical Field

[0001] This disclosure relates to the fields of photovoltaic and semiconductor technology, and more specifically to a testing device for a hot wire. Background Technology

[0002] In the manufacturing processes of semiconductor and photovoltaic products, heat treatment is an indispensable one. Currently, the industry typically uses high-temperature equipment for heat treatment, where the thermal field components of the equipment are used to heat the internal components and the products. The hot wire is a crucial component of the thermal field assembly, and its lifespan directly affects the overall lifespan of the thermal field assembly. Temperature is one of the factors influencing the lifespan of the hot wire. Currently, the industry commonly uses hot wire testing equipment to detect the temperature of the hot wire, obtain test data, and determine the lifespan of the hot wire based on this data.

[0003] However, when the hot wire testing device of the relevant technology conducts high-temperature tests on the hot wire, the hot wire is U-shaped. This U-shaped hot wire generates U-shaped thermal radiation, resulting in uneven temperature distribution of the hot wire. Under these uneven temperature conditions, temperature detection of the hot wire becomes less accurate, thus affecting the accuracy of determining the lifespan of the hot wire. Utility Model Content

[0004] In view of this, the present disclosure provides a hot wire testing device that solves the problem of low accuracy in detecting the temperature of the hot wire in the hot wire testing device.

[0005] This disclosure provides a testing device for a hot wire, comprising: at least two clamping assemblies disposed opposite each other along a first direction, wherein the at least two clamping assemblies are respectively capable of clamping both ends of a hot wire, and at least one clamping assembly is capable of generating a pulling force on the hot wire along the first direction, so that the hot wire extends along the first direction and is in a straightened state; wherein the first ends of the at least two clamping assemblies are respectively electrically connected to both ends of the hot wire, and the second ends of the at least two clamping assemblies are respectively electrically connected to a first electrode and a second electrode, wherein the first electrode and the second electrode have opposite polarities, so that the first electrode, the at least two clamping assemblies, the hot wire, and the second electrode form a closed loop; wherein, when the closed loop is in a conductive state, the hot wire generates heat; and a temperature detection assembly configured to detect the temperature of the hot wire.

[0006] In some embodiments, the testing device for the hot wire further includes: a support component configured to support the clamping component; wherein a first clamping component is fixedly disposed relative to the support component, and a second clamping component is slidably connected to the support component along the first direction; wherein the clamping component is insulated from the support component; a fixed pulley disposed on the side of the second clamping component away from the first clamping component and rotatably connected to the support component; wherein the rotation axis of the fixed pulley intersects the first direction; a counterweight located below the fixed pulley; and a suspension rope, a first end of which is insulated from the second clamping component, and a second end of which passes around the fixed pulley and is connected to the counterweight; wherein the counterweight exerts a pulling force on the suspension rope under the action of gravity, causing the suspension rope to pull the second clamping component to slide along the first direction, thereby straightening the hot wire as it extends along the first direction.

[0007] In some embodiments, the clamping assembly includes: a first clamping member having a first groove; and a second clamping member detachably connected to the first clamping member and having a second groove, wherein the first groove is disposed on the side of the first clamping member near the second clamping member, the second groove is disposed on the side of the second clamping member near the first clamping member, the first groove and the second groove are disposed opposite to each other, and the second groove and the first groove form a slot, the end of the hot wire can extend into the slot so that the first clamping member and the second clamping member clamp the end of the hot wire; wherein the first clamping member of the first clamping assembly is insulated from the carrier assembly, and the first clamping member of the second clamping assembly is slidably connected to the carrier assembly along the first direction.

[0008] In some embodiments, the cross-sectional shape of the hot wire is circular, the cross-sectional shape of the first groove is semi-circular, and the cross-sectional shape of the second groove is semi-circular, so that the cross-sectional shape of the slot is circular, wherein the diameter of the slot is smaller than the diameter of the hot wire.

[0009] In some embodiments, the testing device for the hot wire further includes: a current detection module configured to detect the current value flowing through the closed loop; and a voltage detection module configured to detect the voltage value between the two ends of the hot wire.

[0010] In some embodiments, the testing apparatus for the hot wire further includes: an AC power supply; a silicon controlled rectifier (SCR) voltage regulator, the input terminal of which is electrically connected to the AC power supply; a transformer, the primary terminal of which is electrically connected to the output terminal of the SCR voltage regulator, the secondary terminal of which is electrically connected to the first electrode and the second electrode respectively, and the transformer is configured to provide voltage to the first electrode and the second electrode to make the closed loop open.

[0011] In some embodiments, the testing device for the hot wire further includes: a controller, communicatively connected to the temperature detection component, the current detection module, and the voltage detection module, respectively, and configured to receive the temperature value of the hot wire sent by the temperature detection component, the current value sent by the current detection module, and the voltage value sent by the voltage detection module; and an analog input / output module, communicatively connected to the controller and the thyristor voltage regulator; wherein the controller is further configured to perform proportional-integral-differential operations based on the received temperature value, current value, voltage value, and preset temperature value, and send an analog signal to the analog input / output module based on the operation result; the analog input / output module is configured to receive the analog signal and send the analog signal to the thyristor voltage regulator; and the thyristor voltage regulator is configured to receive the analog signal and adjust the conduction angle of the thyristor voltage regulator based on the analog signal to adjust the voltage between the first electrode and the second electrode.

[0012] In some embodiments, the temperature detection assembly includes an infrared thermometer; wherein the testing device for the hot wire further includes: a main frame; a plurality of door panels, each detachably connected to the main frame to form a receiving cavity, the receiving cavity being configured to receive the clamping assembly, the clamping assembly being insulated from the door panels and the main frame; wherein the receiving cavity is capable of being in a sealed state and an open state, wherein at least one of the door panels has a transparent area through which the infrared thermometer can be aligned with the hot wire to detect the temperature of the hot wire; and a plurality of insulation components, each disposed on one of the plurality of door panels.

[0013] In some embodiments, the testing apparatus for the hot wire further includes: a displacement detection component disposed on the support component and configured to detect the movement distance of the second clamping component along the first direction to determine the elongation of the hot wire.

[0014] In some embodiments, the testing device for the hot wire further includes: a slide rail connected to the bearing assembly and extending along the first direction; a slider insulated from the first clamping member of the second clamping assembly and slidably connected to the slide rail; and / or, the clamping assembly has a plurality of first grooves and a plurality of second grooves, the plurality of first grooves and the plurality of second grooves are sequentially arranged along a second direction, the plurality of first grooves and the plurality of second grooves correspond one-to-one to form a plurality of slots; wherein, the second direction is perpendicular to the first direction; wherein, the plurality of slots of the two clamping assemblies correspond one-to-one so that the two clamping assemblies can clamp a plurality of hot wires simultaneously; and / or, the side of the first clamping member away from the second clamping member has a first fin; and / or, the side of the second clamping member away from the first clamping member has a second fin.

[0015] The hot wire testing apparatus provided in this embodiment utilizes at least two clamping components arranged opposite each other along a first direction to clamp both ends of the hot wire, and at least one clamping component can generate a pulling force on the hot wire along the first direction, so that the hot wire extends along the first direction and is in a straightened state. Because the hot wire is in a straightened state, its own heat radiation is avoided, improving the uniformity of the hot wire temperature. Therefore, when using a temperature detection component to detect the temperature of the hot wire, the accuracy of temperature detection is improved. Attached Figure Description

[0016] Figure 1 The diagram shown is a schematic representation of a testing apparatus for a hot wire and a hot wire structure according to an embodiment of this disclosure.

[0017] Figure 2 The diagram shown is a schematic representation of a testing apparatus for a hot wire and a hot wire structure according to another embodiment of this disclosure.

[0018] Figure 3 As shown Figure 2 The test setup for the hot wire and a magnified view of the hot wire in region A are shown.

[0019] Figure 4 The diagram shown is a structural schematic of a first clamping member provided in an embodiment of this disclosure.

[0020] Figure 5 The diagram shown is a structural schematic of a second clamping member provided in an embodiment of this disclosure.

[0021] Figure 6 The diagram shown is a structural schematic of an AC power supply, a thyristor voltage regulator, a transformer, a first electrode, and a second electrode provided in an embodiment of this disclosure.

[0022] Figure 7The diagram shown is a schematic diagram of the structure of a hot wire testing device provided in an embodiment of this disclosure, excluding the clamping assembly.

[0023] Figure 8 The diagram shown is a schematic representation of a testing apparatus for a hot wire and a hot wire structure according to another embodiment of this disclosure.

[0024] Figure 9 The diagram shown is a structural schematic of a test device for a hot wire in a sealed state according to an embodiment of this disclosure.

[0025] Figure 10 The diagram shown is a schematic diagram of the arrangement of a testing device with multiple hot wires according to an embodiment of this disclosure.

[0026] Figure label: 10. Testing device for hot wire; 100. Clamping assembly; 101. First clamping assembly; 102. Second clamping assembly; 110. First clamping element; 1101. First groove; 1102. First fin; 120. Second clamping element; 1201. Second groove; 1202. Second fin; 1001. Slot; 1002. Receiving cavity; 200. Temperature detection assembly; 210. Infrared thermometer; 300. Bearing assembly; 400. Fixed pulley; 500. Counterweight; 600. Suspension rope; 700. Current detection module; 800. Voltage detection module; 90. 0. AC power supply; 1000. Thyristor voltage regulator; 1100. Transformer; 1200. Controller; 1300. Analog input / output module; 1400. Main frame; 1500. Door panel; 1501. Transparent area; 1600. Insulation component; 1700. Displacement detection component; 1800. Slide rail; 1900. Slider; 2000. First electrode; 2100. Second electrode; 2200. Connecting component; 2300. Suspension rope connector; 2400. Relay; 2500. Step-down resistor; X1. First direction; X2. Second direction; 2. Heating wire. Detailed Implementation

[0027] The technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0028] Figure 1 The diagram shown is a schematic representation of a testing apparatus and a hot wire structure according to an embodiment of this disclosure. Figure 1As shown, the hot wire testing device 10 includes at least two clamping components 100 and a temperature detection component 200. The at least two clamping components 100 are arranged opposite each other along a first direction X1, and the at least two clamping components 100 are respectively capable of clamping both ends of the hot wire 2. At least one clamping component 100 is capable of generating a pulling force on the hot wire 2 along the first direction X1, so that the hot wire 2 extends along the first direction X1 and is in a straightened state.

[0029] The clamping assembly 100 is made of a conductive material. The first ends of at least two clamping assemblies 100 are electrically connected to both ends of the hot wire 2, and the second ends of at least two clamping assemblies 100 are electrically connected to the first electrode 2000 and the second electrode 2100, respectively. The first electrode 2000 and the second electrode 2100 have opposite polarities, so that the first electrode 2000, the at least two clamping assemblies 100, the hot wire 2, and the second electrode 2100 form a closed circuit. When the closed circuit is in a conductive state, the hot wire 2 generates heat. The temperature detection assembly 200 is configured to detect the temperature of the hot wire 2.

[0030] The hot wire testing apparatus 10 provided in this embodiment utilizes at least two clamping components 100 arranged opposite each other along a first direction X1 to clamp both ends of the hot wire 2, and at least one clamping component 100 can generate a pulling force on the hot wire 2 along the first direction X1, so that the hot wire 2 extends along the first direction X1 and is in a straightened state. Because the hot wire 2 is in a straightened state, its own heat radiation is avoided, and the temperature uniformity of the hot wire 2 is improved. Therefore, when the temperature of the hot wire 2 is detected using the temperature detection component 200, the accuracy of the temperature detection of the hot wire 2 is improved.

[0031] In addition, in the fields of photovoltaic and semiconductor technology, when testing the lifespan of a hot wire, the hot wire is first energized, and its temperature is raised to a first preset temperature within a first preset time. Then, the temperature is maintained at the first preset temperature for a second preset time. Finally, the power is turned off, and the hot wire remains de-energized for a third preset time, allowing it to cool down. This completes one heating and cooling process of the hot wire. This process is repeated until the hot wire breaks. The total time from the start of the test to the hot wire breaking is determined as the lifespan of the hot wire. If the accuracy of the temperature detection of the hot wire is low, it will affect the accuracy of the test, thereby affecting the accuracy of the lifespan determination. Therefore, the hot wire testing apparatus 10 provided in this embodiment improves the accuracy of the temperature detection of the hot wire 2, thereby improving the accuracy of the lifespan determination of the hot wire 2.

[0032] For example, such as Figure 1As shown, the hot wire testing device 10 includes two clamping assemblies 100, which are arranged opposite each other along a first direction X1, and each clamping assembly 100 clamps both ends of the hot wire 2. Exemplarily, one clamping assembly 100 can generate a pulling force on the hot wire 2 along the first direction X1, so that the hot wire 2 extends along the first direction X1 and is in a straightened state. Exemplarily, both clamping assemblies 100 can generate a pulling force on the hot wire 2 along the first direction X1, and the directions of the pulling forces generated by the two clamping assemblies 100 on the hot wire 2 are opposite, so that the hot wire 2 extends along the first direction X1 and is in a straightened state.

[0033] For example, such as Figure 1 As shown, the two clamping components 100 are the first clamping component 101 and the second clamping component 102, respectively. The first electrode 2000, the first clamping component 101, the hot wire 2, the second clamping component 102 and the second electrode 2100 are sequentially electrically connected to form a closed circuit.

[0034] For example, the hot wire testing device 10 includes a first electrode 2000 and a second electrode 2100.

[0035] In some embodiments, such as Figure 2 As shown, the hot wire testing device 10 also includes a support assembly 300, a fixed pulley 400, a counterweight 500, and a suspension rope 600. The support assembly 300 is configured to support a clamping assembly 100. A first clamping assembly 101 is fixedly disposed relative to the support assembly 300, and a second clamping assembly 102 is slidably connected to the support assembly 300 along a first direction X1. The clamping assembly 100 is insulated from the support assembly 300. The fixed pulley 400 is disposed on the side of the second clamping assembly 102 away from the first clamping assembly 101 and is rotatably connected to the support assembly 300. The rotation axis of the fixed pulley 400 intersects the first direction X1. The counterweight 500 is located below the fixed pulley 400. The first end of the suspension rope 600 is insulatedly connected to the second clamping assembly 102, and the second end of the suspension rope 600 passes over the fixed pulley 400 and is connected to the counterweight 500.

[0036] The counterweight 500 exerts a pulling force on the suspension rope 600 under the action of gravity, causing the suspension rope 600 to pull the second clamping assembly 102 to slide along the first direction X1, so as to straighten the hot wire 2 as it extends along the first direction X1.

[0037] The second clamping assembly 102 is driven to slide along the first direction X1 by using a fixed pulley 400, a counterweight 500, and a lifting rope 600. The driving method is simple and reliable.

[0038] For example, the clamping assembly 100 is made of aluminum or copper. Aluminum and copper have good electrical conductivity to reduce power loss. In addition, aluminum and copper have good thermal conductivity, which can improve the cooling efficiency of the hot wire testing device 10 and the hot wire 2.

[0039] For example, such as Figure 2 As shown, the hot wire testing device 10 also includes two connecting components 2200. One connecting component 2200 is insulatedly connected to the second end of the first clamping component 101 and the carrier component 300. The other connecting component 2200 is insulatedly connected to the second end of the second clamping component 102 and is slidably connected to the carrier component 300 along the first direction X1. For example, the material of the connecting component 2200 can be a non-metallic material such as ceramic or plastic.

[0040] For example, such as Figure 2 As shown, the hot wire testing device 10 also includes a suspension rope connector 2300, which is connected to the connecting assembly 2200. The connecting assembly 2200 is insulated from the second end of the second clamping assembly 102, and the first end of the suspension rope 600 is connected to the suspension rope connector 2300 to achieve an insulated connection between the first end of the suspension rope 600 and the second clamping assembly 102. The connection method is simple and reliable.

[0041] For example, such as Figure 2 As shown, the rotation axis of the fixed pulley 400 is perpendicular to the first direction X1.

[0042] In some embodiments, the first direction can be horizontal or vertical. The clamping assembly 100 includes a first clamping member 110 and a second clamping member 120. The first clamping member 110 has a first groove 1101, and the second clamping member 120 is detachably connected to the first clamping member 110 and has a second groove 1201. The first groove 1101 is disposed on the side of the first clamping member 110 near the second clamping member 120, and the second groove 1201 is disposed on the side of the second clamping member 120 near the first clamping member 110. The first groove 1101 and the second groove 1201 are disposed opposite to each other, and the second groove 1201 and the first groove 1101 form a slot 1001. The end of the hot wire 2 can extend into the slot 1001 so that the first clamping member 110 and the second clamping member 120 clamp the end of the hot wire 2. The first clamping member 110 of the first clamping assembly 101 is insulatedly connected to the carrier assembly 300, and the first clamping member 110 of the second clamping assembly 102 is slidably connected to the carrier assembly 300 along the first direction X1.

[0043] For example, such as Figures 2 to 5As shown, the first direction X1 is horizontal. The first end of the first clamping member 110 has a first groove 1101 with an upward opening. The second clamping member 120 is located above the first clamping member 110 and is detachably connected to the first clamping member 110, and has a second groove 1201 with a downward opening. The second groove 1201 and the first groove 1101 form a slot 1001, into which the end of the hot wire 2 can extend, so that the first clamping member 110 and the second clamping member 120 clamp the end of the hot wire 2. The first clamping member 110 of the first clamping assembly 101 is insulated from the carrier assembly 300, and the first clamping member 110 of the second clamping assembly 102 is slidably connected to the carrier assembly 300 along the first direction X1.

[0044] The clamping assembly 100 has a simple structure and uses a clamping method to achieve electrical connection with the hot wire 2, which is convenient.

[0045] For example, such as Figure 2 As shown, the second end of the first clamping member 110 of the first clamping assembly 101 is insulated from a connecting assembly 2200, which is connected to the carrier assembly 300, thus achieving an insulated connection between the first clamping member 110 of the first clamping assembly 101 and the carrier assembly 300. The second end of the first clamping member 110 of the second clamping assembly 102 is insulated from another connecting assembly 2200, which is slidably connected to the carrier assembly 300 along a first direction X1, thus achieving a slidable connection between the first clamping member 110 of the second clamping assembly 102 and the carrier assembly 300 along the first direction X1.

[0046] For example, such as Figure 2 , Figure 4 and Figure 5 As shown, both the first clamping member 110 and the second clamping member 120 are elongated plate-like structures and extend along the second direction X2. The length of the first clamping member 110 is greater than the length of the second clamping member 120, so as to facilitate the installation of the connecting assembly 2200 at the second end of the first clamping member 110.

[0047] In some embodiments, the cross-sectional shape of the hot wire 2 is circular, the cross-sectional shape of the first groove 1101 is semi-circular, and the cross-sectional shape of the second groove 1201 is semi-circular, so that the cross-sectional shape of the slot 1001 is circular, and the diameter of the slot 1001 is smaller than the diameter of the hot wire 2.

[0048] By adapting the shape of the slot 1001 to the cross-sectional shape of the hot wire 2, and by making the diameter of the slot 1001 smaller than the diameter of the hot wire 2, the inner walls of the first groove 1101 and the second groove 1201 can be completely fitted to the outer surface of the hot wire 2, so that the slot 1001 can stably hold the end of the hot wire 2, thereby enabling the first clamping member 110 and the second clamping member 120 to stably hold the end of the hot wire 2 and prevent the hot wire 2 from falling off the clamping assembly 100.

[0049] In addition, the contact area between the card slot 1001 and the end of the hot wire 2 was increased as much as possible. When the closed circuit is in the conducting state, the current flow path is increased and the current density is reduced, thereby reducing the contact resistance.

[0050] In some embodiments, such as Figure 1 and Figure 2 As shown, the hot wire testing device 10 also includes a current detection module 700 and a voltage detection module 800. The current detection module 700 is configured to detect the current value flowing through the closed loop, and the voltage detection module 800 is configured to detect the voltage value between the two ends of the hot wire 2.

[0051] The current detection module 700 is used to detect the current value flowing through the closed loop, and the voltage detection module 800 is used to detect the voltage value between the two ends of the hot wire 2, so as to obtain the power of the hot wire 2 under different temperatures.

[0052] In addition, the voltage supplied to the first electrode 2000 and the second electrode 2100 can be adjusted according to the obtained current and voltage values ​​to achieve the effect of making the hot wire 2 reach the preset temperature within a preset time.

[0053] In some embodiments, such as Figure 6 As shown, the hot wire testing apparatus 10 also includes an AC power supply 900, a thyristor voltage regulator 1000, and a transformer 1100. The input terminal of the thyristor voltage regulator 1000 is electrically connected to the AC power supply 900, the primary terminal of the transformer 1100 is electrically connected to the output terminal of the thyristor voltage regulator 1000, and the secondary terminal of the transformer 1100 is electrically connected to the first electrode 2000 and the second electrode 2100, respectively. The transformer 1100 is configured to provide voltage to the first electrode 2000 and the second electrode 2100 to make the closed loop conduct.

[0054] For example, based on the obtained current value flowing through the closed loop and the voltage value between the two ends of the hot wire 2, the conduction angle of the thyristor voltage regulator 1000 is adjusted to adjust the output voltage of the thyristor voltage regulator 1000, thereby adjusting the input voltage of the primary end of the transformer 1100, and further adjusting the output voltage of the secondary end of the transformer 1100, ultimately achieving the effect of adjusting the magnitude of the voltage supplied to the first electrode 2000 and the second electrode 2100.

[0055] Specifically, the larger the conduction angle of the SCR voltage regulator 1000, the later it turns on, and the lower its output voltage. Conversely, the smaller the conduction angle of the SCR voltage regulator 1000, the earlier it turns on, and the higher its output voltage.

[0056] In some embodiments, such as Figure 7 As shown, the hot wire testing device 10 also includes a controller 1200 and an analog input / output module 1300. The controller 1200 is communicatively connected to the temperature detection component 200, the current detection module 700, and the voltage detection module 800, and is configured to receive the temperature value of the hot wire 2 sent by the temperature detection component 200, the current value sent by the current detection module 700, and the voltage value sent by the voltage detection module 800. The analog input / output module 1300 is communicatively connected to the controller 1200 and the thyristor voltage regulator 1000. The controller 1200 is further configured to perform proportional-integral-differential calculations based on the received temperature value, current value, voltage value, and preset temperature value, and send an analog signal to the analog input / output module 1300 based on the calculation result. The analog input / output module 1300 is configured to receive analog signals and send analog signals to the thyristor voltage regulator 1000. The thyristor voltage regulator 1000 is configured to receive an analog signal and adjust the conduction angle of the thyristor voltage regulator 1000 based on the analog signal to adjust the voltage between the first electrode 2000 and the second electrode 2100. Figure 7 In the diagram, dashed lines represent communication connections between two structures, while solid lines represent electrical connections between them.

[0057] The above settings enable the hot wire testing device 10 to automatically control the temperature of the hot wire 2, further improving the automation level of the hot wire testing device 10 and the accuracy and convenience of temperature control of the hot wire 2.

[0058] Exemplarily, the hot wire testing device 10 further includes a relay 2400, which is electrically connected to the secondary terminal of the regulating transformer 1100 and to the first electrode 2000 and the second electrode 2100, and is communicatively connected to the controller 1200. The controller 1200 is further configured to send a control signal to the relay 2400, and the relay 2400 is configured to receive the control signal sent by the controller 1200 and control the relay 2400 to turn on and off based on the control signal. When the relay 2400 is on, the first electrode 2000 and the second electrode 2100 are supplied with voltage, and the closed loop is in a conducting state. When the relay 2400 is off, the first electrode 2000 and the second electrode 2100 cannot be supplied with voltage, and the closed loop is in a closed state.

[0059] In some embodiments, such as Figure 8 and Figure 9 As shown, the temperature detection assembly 200 includes an infrared thermometer 210. The hot wire testing device 10 also includes a main frame 1400, multiple door panels 1500, and multiple insulation components 1600. The multiple door panels 1500 are detachably connected to the main frame 1400 to form a receiving cavity 1002. The receiving cavity 1002 is configured to receive a clamping assembly 100, which is insulated from the door panels 1500 and the main frame 1400. The receiving cavity 1002 can be in a sealed state and an open state. At least one door panel 1500 has a transparent area 1501 through which the infrared thermometer 210 can be aligned with the hot wire 2 to detect the temperature of the hot wire 2. The multiple insulation components 1600 are respectively disposed on the multiple door panels 1500.

[0060] For example, the clamping assembly 100, the bearing assembly 300, the fixed pulley 400, the counterweight 500 and the lifting rope 600 are all disposed in the receiving cavity 1002.

[0061] For example, the infrared thermometer 210 is disposed outside the receiving cavity 1002 and is disposed opposite to the door panel 1500 having a transparent area 1501. When the receiving cavity 1002 is in a sealed state, the infrared thermometer 210 can be aligned with the hot wire 2 through the transparent area 1501 to detect the temperature of the hot wire 2.

[0062] For example, during the test, the receiving cavity 1002 can be in a sealed state or an open state as needed.

[0063] When the receiving cavity 1002 is in a sealed state, the heat transfer of the hot wire 2 to the surrounding environment can be reduced, thus reducing the heat loss of the hot wire 2 and facilitating rapid heating of the hot wire 2.

[0064] With the voltage across the hot wire 2 remaining constant, as the cross-sectional area of ​​the hot wire 2 increases, its resistance decreases, its power increases, and the amount of heat transferred from the hot wire 2 to the surrounding environment increases, leading to a rise in the temperature of the environment surrounding the hot wire 2. Therefore, to prevent excessively high temperatures in the environment surrounding the hot wire 2 from damaging the main frame 1400, door panel 1500, and insulation component 1600, at least one door panel 1500 needs to be opened to keep the receiving cavity 1002 open, facilitating the timely dissipation of heat from the receiving cavity 1002.

[0065] For example, the insulation element 1600 is disposed on the side of the corresponding door panel 1500 near the receiving cavity 1002, or the insulation element 1600 is disposed inside the corresponding door panel 1500.

[0066] In some embodiments, such as Figure 2 As shown, the hot wire testing device 10 also includes a displacement detection component 1700, which is disposed on the support component 300 and configured to detect the movement distance of the second clamping component 102 along the first direction X1 to determine the elongation of the hot wire 2.

[0067] The elongation of the hot wire 2 is also an important parameter affecting its lifespan. Therefore, using the displacement detection component 1700 to detect the elongation of the hot wire 2 is of great significance for determining its lifespan.

[0068] For example, the displacement detection component 1700 may be a laser displacement sensor, an ultrasonic displacement sensor, etc.

[0069] In some embodiments, such as Figure 2 As shown, the hot wire testing device 10 also includes a slide rail 1800 and a slider 1900. The slide rail 1800 is connected to the support assembly 300 and extends along a first direction X1. The slider 1900 is insulated from the first clamping member 110 of the second clamping assembly 102 and is slidably connected to the slide rail 1800.

[0070] By using the slide rail 1800 and the slider 1900 to guide the movement of the second clamping assembly 102 along the first direction X1, the accuracy of the movement of the second clamping assembly 102 is improved.

[0071] For example, there are two sliders 1900, which are insulated from the second end of the first clamping assembly 101 and the second end of the second clamping assembly 102, respectively. One slider 1900, insulated from the second end of the first clamping assembly 101, is connected to the carrier assembly 300 to achieve an insulated connection between the first clamping assembly 101 and the carrier assembly 300. The other slider 1900, insulated from the second end of the second clamping assembly 102, is slidably connected to the slide rail 1800 to achieve a slidable connection between the second clamping assembly 102 and the slide rail 1800.

[0072] For example, the two sliders 1900 are respectively connected to the two connecting components 2200.

[0073] In some embodiments, such as Figures 2 to 5 As shown, the clamping assembly 100 has multiple first grooves 1101 and multiple second grooves 1201. The multiple first grooves 1101 and multiple second grooves 1201 are sequentially arranged along a second direction X2, which is perpendicular to the first direction X1. The multiple first grooves 1101 and multiple second grooves 1201 correspond one-to-one to form multiple slots 1001. The multiple slots 1001 of the two clamping assemblies 100 correspond one-to-one, enabling the two clamping assemblies 100 to simultaneously clamp multiple hot wires 2.

[0074] The hot wire testing device 10 can test multiple hot wires 2 simultaneously, which improves the testing efficiency of the hot wire testing device 10.

[0075] In some embodiments, such as Figures 3 to 5 As shown, the side of the first clamping member 110 away from the second clamping member 120 has a first fin 1102. The heat dissipation efficiency of the clamping assembly 100 is improved by providing the first fin 1102.

[0076] In some embodiments, such as Figures 3 to 5 As shown, the second clamping member 120 has a second fin 1202 on the side away from the first clamping member 110. The heat dissipation efficiency of the clamping assembly 100 is improved by providing the second fin 1202.

[0077] For example, such as Figure 2 and Figure 7 As shown, the hot wire testing device 10 also includes a step-down resistor 2500, which is electrically connected to the second end of the first clamping assembly 101 and the first electrode 2000, so that the step-down resistor 2500 is connected in series in a closed loop. By setting the step-down resistor 2500, the voltage between the two ends of the hot wire 2 can be reduced by using the step-down resistor 2500 to divide the voltage when the thyristor regulator 1000 cannot output an ultra-low voltage.

[0078] For example, such as Figure 10 As shown, there are multiple hot wire testing devices 10. These devices can be arranged in a row, a column, or multiple rows and columns. The multiple hot wire testing devices 10 simultaneously test multiple hot wires 2, further improving testing efficiency.

[0079] In the embodiments of this disclosure, unless otherwise specified, the connection can be a detachable connection using bolts, nuts, screws, clips, magnets, etc. In some connections where there is no particular requirement for a detachable fit, a non-detachable connection can be achieved through welding, bonding, etc.

[0080] The terms "an embodiment" or "embodiment" used in this specification indicate that the described embodiment may include a specific feature, structure, or characteristic, but not every embodiment necessarily includes that specific feature, structure, or characteristic. Furthermore, such phrases do not necessarily refer to the same embodiment. Additionally, when a specific feature, structure, or characteristic is described in connection with an embodiment, implementing such a feature, structure, or characteristic in conjunction with other embodiments, whether explicitly described or not, is within the knowledge scope of those skilled in the art.

[0081] It should be understood that “on,” “above,” and “on top of” in this disclosure should be interpreted in the broadest manner, such that “on” means not only “directly on something” but also “on something” with an intermediate feature or layer therebetween, and that “above” or “on top of” means not only “on top of something” but also “on top of something” without an intermediate feature or layer therebetween (i.e., directly on something).

[0082] Furthermore, for ease of explanation, spatial relative terms such as "below," "below," "under," "above," and "above" may be used to describe the relationship of a component or feature relative to other components or features as shown in the figures. Spatial relative terms are intended to encompass different orientations of components in use or operation other than those shown in the figures. Devices may have other orientations (rotated 90 degrees or in other orientations), and the spatial relative descriptive terms used herein may be interpreted accordingly.

[0083] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0084] The above description is merely a preferred embodiment of this disclosure and is not intended to limit this disclosure. Any modifications or equivalent substitutions made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A testing device for hot wires, characterized in that, include: At least two clamping assemblies are arranged opposite each other along a first direction, wherein each of the at least two clamping assemblies is capable of clamping both ends of a hot wire, and at least one of the clamping assemblies is capable of generating a pulling force on the hot wire along the first direction, so that the hot wire extends along the first direction and is in a straightened state; wherein the first ends of the at least two clamping assemblies are electrically connected to both ends of the hot wire, and the second ends of the at least two clamping assemblies are electrically connected to a first electrode and a second electrode, respectively, wherein the first electrode and the second electrode have opposite polarities, so that the first electrode, the at least two clamping assemblies, the hot wire, and the second electrode form a closed circuit; wherein, when the closed circuit is in a conductive state, the hot wire generates heat; A temperature detection component is configured to detect the temperature of the hot filament.

2. The testing device for hot wire according to claim 1, characterized in that, Also includes: A support component is configured to support the clamping component; wherein a first clamping component is fixedly disposed relative to the support component, and a second clamping component is slidably connected to the support component along the first direction; wherein the clamping component is insulated from the support component. A fixed pulley is disposed on the side of the second clamping assembly away from the first clamping assembly and is rotatably connected to the bearing assembly; wherein the rotation axis of the fixed pulley intersects the first direction; A counterweight is located below the fixed pulley; The suspension rope has a first end that is insulated from the second clamping assembly, and a second end that passes over the fixed pulley and is connected to the counterweight. The counterweight exerts a pulling force on the suspension rope under the action of gravity, causing the suspension rope to pull the second clamping assembly to slide along the first direction, thereby straightening the hot wire as it extends along the first direction.

3. The testing apparatus for hot wire according to claim 2, characterized in that, The clamping assembly includes: A first clamping member, the first clamping member having a first groove; The second clamping member is detachably connected to the first clamping member and has a second groove. The first groove is disposed on the side of the first clamping member near the second clamping member, and the second groove is disposed on the side of the second clamping member near the first clamping member. The first groove and the second groove are disposed opposite to each other, and the second groove and the first groove form a slot. The end of the hot wire can extend into the slot so that the first clamping member and the second clamping member clamp the end of the hot wire. In the first clamping assembly, the first clamping member is insulated from the bearing assembly, and in the second clamping assembly, the first clamping member is slidably connected to the bearing assembly along the first direction.

4. The hot filament testing apparatus according to claim 3, characterized in that, The hot wire has a circular cross-sectional shape, the first groove has a semi-circular cross-sectional shape, and the second groove has a semi-circular cross-sectional shape, so that the slot has a circular cross-sectional shape, wherein the diameter of the slot is smaller than the diameter of the hot wire.

5. The testing apparatus for hot filaments according to any one of claims 1 to 4, characterized in that, Also includes: A current detection module is configured to detect the current value flowing through the closed loop; A voltage detection module is configured to detect the voltage value between the two ends of the hot wire.

6. The testing apparatus for hot wires according to claim 5, characterized in that, Also includes: AC power supply; A thyristor voltage regulator, wherein the input terminal of the thyristor voltage regulator is electrically connected to the AC power supply; A transformer, wherein the primary end of the transformer is electrically connected to the output end of the thyristor voltage regulator, and the secondary end of the transformer is electrically connected to the first electrode and the second electrode respectively, and the transformer is configured to provide voltage to the first electrode and the second electrode to make the closed loop conduct.

7. The testing apparatus for hot filaments according to claim 6, characterized in that, Also includes: The controller is communicatively connected to the temperature detection component, the current detection module, and the voltage detection module, and is configured to receive the temperature value of the hot wire sent by the temperature detection component, the current value sent by the current detection module, and the voltage value sent by the voltage detection module. An analog input / output module is communicatively connected between the controller and the thyristor voltage regulator. The controller is further configured to perform proportional-integral-differential (PID) calculations based on the received temperature value, current value, voltage value, and preset temperature value, and send an analog signal to the analog input / output module based on the calculation result; the analog input / output module is configured to receive the analog signal and send the analog signal to the thyristor voltage regulator; the thyristor voltage regulator is configured to receive the analog signal and adjust the conduction angle of the thyristor voltage regulator based on the analog signal to adjust the voltage between the first electrode and the second electrode.

8. The testing apparatus for hot filaments according to any one of claims 1 to 4, characterized in that, The temperature detection component includes an infrared thermometer; The testing device for the hot wire also includes: Main framework; Multiple door panels are detachably connected to the main frame to form a receiving cavity, the receiving cavity being configured to accommodate the clamping assembly, the clamping assembly being insulated from the door panels and the main frame; wherein the receiving cavity can be in a sealed state and an open state, wherein at least one of the door panels has a transparent area, through which the infrared thermometer can be aligned with the hot wire to detect the temperature of the hot wire; Multiple insulation components are respectively installed on multiple door panels.

9. The testing apparatus for hot filaments according to claim 2, characterized in that, Also includes: A displacement detection component, disposed on the bearing component, is configured to detect the movement distance of the second clamping component along the first direction to determine the elongation of the hot wire.

10. The testing apparatus for hot filaments according to claim 3, characterized in that, Also includes: A slide rail is connected to the load-bearing component and extends along the first direction; The slider is insulated from the first clamping member of the second clamping assembly and slidably connected to the slide rail; And / or, The clamping assembly has multiple first grooves and multiple second grooves, which are arranged sequentially along a second direction. The multiple first grooves and multiple second grooves correspond one-to-one to form multiple slots. The second direction is perpendicular to the first direction. The multiple slots of two clamping assemblies correspond one-to-one so that the two clamping assemblies can clamp multiple hot wires simultaneously. And / or, The side of the first clamping member away from the second clamping member has a first fin; And / or, The second clamping member has a second fin on the side away from the first clamping member.

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