Chip testing device

Abstract

The utility model provides a kind of chip testing device, including base, support structure, drive assembly and light source structure, base is used to install test fixture lower cover, the test fixture lower cover is used to place chip, support structure is fixed to base, drive assembly is installed in the support structure, and it is set to the above of the test fixture lower cover, the drive assembly can output vertical direction movement, light source structure is detachably connected in the movement end of the drive assembly, and the side of the light source structure facing the base is used to install test fixture upper cover.The utility model provides a kind of chip testing device, by the movement end detachably connected of light source structure and drive assembly, so that light source structure can be detached from drive assembly, replace different light source structure, so, this chip testing device can be adapted to different light source structure, correspondingly can be adapted to different test fixture.

Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, and more specifically, relates to a chip testing device. Background Technology

[0002] CMOS image sensors, also known as CIS chips, are image sensors manufactured using CMOS technology. They convert light signals into electrical signals, ultimately forming digital images. Due to their advantages of low power consumption, high integration, low cost, high speed, and compatibility with standard CMOS processes, CIS chips have completely replaced CCDs as the preferred choice for the vast majority of imaging applications.

[0003] During the research and development phase, CIS chips need to be tested. Manual testing fixtures are usually used to test the chips to quickly verify their performance. However, commonly used manual testing devices have the following problems: they are not compatible with light sources of different sizes, which means that different light sources require different testing devices. Utility Model Content

[0004] The purpose of this utility model embodiment is to provide a chip testing device to solve the technical problem that existing chip testing devices cannot be compatible with different light sources.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is: to provide a chip testing device, comprising:

[0006] A base for mounting the lower cover of a test fixture, the lower cover of which is used to place the chip;

[0007] A support structure is fixed to the base;

[0008] A drive assembly is mounted on the bracket structure and positioned above the lower cover of the test fixture; the drive assembly is capable of outputting vertical movement.

[0009] The light source structure is detachably connected to the moving end of the drive assembly, and the side of the light source structure facing the base is used to install the test fixture cover.

[0010] Optionally, the moving end of the driving component is a mounting plate, and the light source structure and the mounting plate are connected by a light source fixing block.

[0011] Optionally, the light source fixing block has a first connecting hole and a second connecting hole, the mounting plate is connected to the light source fixing block through the first connecting hole, and the light source structure is connected to the light source fixing block through the second connecting hole.

[0012] Optionally, the drive assembly includes a mounting bracket, a handle, a connecting rod, a sliding rod, and a mounting plate. The mounting bracket is fixed to the support structure. The handle is rotatably connected to both the mounting bracket and the connecting rod. The end of the connecting rod away from the handle is rotatably connected to the sliding rod. The sliding rod is slidably disposed on the mounting bracket in a vertical direction. The mounting plate is fixedly connected to the sliding rod, and the light source structure is fixed to the mounting plate.

[0013] Optionally, the mounting bracket includes a first mounting part, a second mounting part, and a connecting part. The connecting part is fixed to the bracket structure. One end of the first mounting part is connected to the connecting part, and the other end of the first mounting part is hinged to the handle. One end of the second mounting part is connected to the connecting part, and the other end of the second mounting part has a sliding hole, through which the sliding rod passes.

[0014] Optionally, the handle includes an operating part and a hinge part connected to each other, one end of the hinge part is hinged to the mounting bracket, and the other end of the hinge part is hinged to the sliding rod, and the operating part is for gripping.

[0015] Optionally, the drive assembly further includes a guide assembly, which includes a slide rail fixed to the bracket structure, a slide frame slidably disposed on the slide rail in a vertical direction, and a guide rod fixed to the base and passing through the mounting plate, wherein the slide frame is fixedly connected to the mounting plate.

[0016] Optionally, an elastic element is sleeved on the guide rod, and the two ends of the elastic element abut against the mounting plate and the base, respectively.

[0017] Optionally, there are two connecting rods, which are respectively located on opposite sides of the handle.

[0018] Optionally, the chip testing apparatus further includes an upper cover and a lower cover of the testing fixture, wherein the upper cover is detachably connected to the driving assembly, and the lower cover is detachably connected to the base.

[0019] The advantages of the chip testing device provided by this utility model are as follows: Compared with the prior art, the chip testing device of this utility model includes a base, a support structure, a driving component, and a light source structure. The support structure is fixed on the base, the driving component is mounted on the support structure, the lower cover of the test fixture is mounted on the base, and the upper cover of the test fixture is mounted on the light source structure. The driving component drives the light source structure and the upper cover of the test fixture to move until they are in close contact with the lower cover of the test fixture, thereby testing the chip inside the test fixture. By detachably connecting the light source structure to the moving end of the driving component, the light source structure can be removed from the driving component and replaced with different light source structures. In this way, the chip testing device can be adapted to different light source structures and correspondingly adapted to different test fixtures. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 A three-dimensional structural schematic diagram of the chip testing device provided in the embodiments of this utility model;

[0022] Figure 2 A partial three-dimensional structural schematic diagram of the chip testing device provided in the embodiments of this utility model;

[0023] Figure 3 A schematic diagram of the mounting plate, light source fixing block, and light source structure provided in an embodiment of this utility model;

[0024] Figure 4 A side view of the chip testing device provided in an embodiment of this utility model;

[0025] Figure 5 A perspective view of the mounting bracket provided in an embodiment of this utility model;

[0026] Figure 6 A perspective view of the handle provided in an embodiment of this utility model.

[0027] The following are the labeling elements in the figure:

[0028] 10-Base; 20-Bracket structure; 30-Drive assembly; 31-Mounting bracket; 311-First mounting part; 312-Second mounting part; 3121-Sliding hole; 313-Connecting part; 32-Handle; 321-Hinge part; 322-Operating part; 33-Connecting rod; 34-Sliding rod; 35-Mounting plate; 351-Third connecting hole; 36-Guide assembly; 361-Guide rod; 362-Slide rail; 363-Sliding frame; 364-Elastic element; 40-Light source structure; 41-Fourth connecting hole; 50-Test fixture; 51-Test fixture upper cover; 52-Test fixture lower cover; 60-Light source fixing block; 61-First connecting hole; 62-Second connecting hole. Detailed Implementation

[0029] To make the technical problems, technical solutions, and beneficial effects of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0030] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly on that other component. When a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0031] It should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", and "outer" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0032] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0033] CMOS image sensors, also known as CIS chips, are image sensors manufactured using CMOS technology. They convert light signals into electrical signals, ultimately forming digital images. Due to their advantages of low power consumption, high integration, low cost, high speed, and compatibility with standard CMOS processes, CIS chips have completely replaced CCDs as the preferred choice for the vast majority of imaging applications.

[0034] During the research and development phase, CIS chips require testing. Manual testing fixtures are typically used to quickly verify chip performance. However, commonly used manual testing equipment has several drawbacks: it is incompatible with light sources of different sizes, requiring different testing fixtures for different light sources. Furthermore, different light sources are usually compatible with different testing fixtures. Therefore, when a light source is incompatible with a manual testing device, it also cannot be compatible with the corresponding testing fixture, resulting in poor versatility of manual testing fixtures.

[0035] To alleviate or solve the above-mentioned technical problems, this utility model proposes a chip testing device, including a base 10, a support structure 20, a driving component 30, and a light source structure 40. The support structure 20 is fixed to the base 10, the upper cover 51 of the test fixture is installed on the light source structure 40, and the lower cover 52 of the test fixture is installed on the base 10. When the driving component 30 is working, it can drive the light source structure 40 to move towards the lower cover 52 of the test fixture, thereby realizing the testing of the chip. By making the light source structure 40 detachably connected to the driving component 30, the light source structure 40 can be replaced, thereby making the chip testing device adaptable to different light source structures 40, and thus adaptable to different test fixtures 50.

[0036] The chip testing device provided in the embodiments of this utility model will now be described. The chip testing device is used to test chips, such as testing the electrical performance of chips.

[0037] Please refer to the following: Figure 1 and Figure 2 The chip testing equipment includes:

[0038] The base 10 is used to install the test fixture lower cover 52, which is used to place the chip.

[0039] The bracket structure 20 is fixed to the base 10;

[0040] The drive assembly 30 is mounted on the bracket structure 20 and positioned above the lower cover 52 of the test fixture. The drive assembly 30 is capable of outputting vertical movement.

[0041] The light source structure 40 is detachably connected to the moving end of the drive assembly 30, and the side of the light source structure 40 facing the base 10 is used to install the test fixture cover 51.

[0042] The chip testing apparatus is used to test chips. Generally, during chip testing, the chip is placed in a test fixture 50, and then the chip within the test fixture 50 is tested. The test fixture 50 includes a lower cover 52 and an upper cover 51. The base 10 is the bottom support structure of the chip testing apparatus. The base 10 can be plate-shaped, block-shaped, bracket-shaped, etc., and its specific structure is not limited here. The lower cover 52 can be mounted on the base 10.

[0043] The support structure 20 is fixed to the base 10. The support structure 20 is used to install the drive assembly 30. Through the setting of the support structure 20, the drive assembly 30 can be installed above the base 10. The support structure 20 can be column-shaped, bracket-shaped, block-shaped, plate-shaped, etc., and its specific structure is not limited here.

[0044] The drive assembly 30 is a power component that can output movement in the vertical direction. The fixed end of the drive assembly 30 is installed on the bracket structure 20, while the moving end of the drive assembly 30 outputs movement in the vertical direction, driving the light source structure 40 and the test fixture cover 51 to move in the vertical direction.

[0045] The light source structure 40 provides light to the chip within the test fixture 50 to assist in chip testing. The light source structure 40 is detachably connected to the moving end of the drive assembly 30, and the side of the light source structure 40 facing the base 10 is used to mount the test fixture cover 51.

[0046] When the chip needs to be tested, first install the lower cover 52 of the test fixture onto the base 10, and install the upper cover 51 of the test fixture onto the light source structure 40. The light source structure 40 is installed on the moving end of the drive component 30. Then, place the chip on the lower cover 52 of the test fixture. The drive component 30 works, driving the light source structure 40 and the upper cover 51 of the test fixture to move down until the lower cover 52 of the test fixture contacts the upper cover 51 of the test fixture. At this time, the chip can be tested.

[0047] When using different light source structures 40, the existing light source structure 40 on the driving component 30 can be removed and replaced with a different light source structure 40, so that different light source structures 40 can be adapted to the chip testing device of this utility model.

[0048] The chip testing device in the above embodiment includes a base 10, a support structure 20, a driving component 30, and a light source structure 40. The support structure 20 is fixed on the base 10, the driving component 30 is mounted on the support structure 20, the lower cover of the test fixture 50 is mounted on the base 10, and the upper cover of the test fixture 50 is mounted on the light source structure 40. The driving component 30 drives the light source structure 40 and the upper cover of the test fixture 50 to move until they are in close contact with the lower cover 52 of the test fixture, thereby testing the chip inside the test fixture 50. By detachably connecting the moving end of the light source structure 40 to the driving component 30, the light source structure 40 can be removed from the driving component 30 and replaced with different light source structures 40. In this way, the chip testing device can be adapted to different light source structures 40, and correspondingly, can be adapted to different test fixtures 50.

[0049] Please refer to some embodiments of this utility model. Figures 1 to 3 The moving end of the drive assembly 30 is the mounting plate 35, and the light source structure 40 and the mounting plate 35 are connected by a light source fixing block 60. When the drive assembly 30 is working, the mounting plate 35 moves up and down, causing the light source structure 40 to move up and down. The light source structure 40 is detachably connected to the mounting plate 35. The light source structure 40 and the mounting plate 35 are connected by the light source fixing block 60, which can be understood as the light source fixing block 60 being positioned between the light source structure 40 and the mounting plate 35, and simultaneously connected to both the light source structure 40 and the mounting plate 35.

[0050] By using the light source fixing block 60, it is easier to connect the light source structure 40 to the mounting plate 35. Specifically, both the mounting plate 35 and the light source structure 40 have mounting structures. When the model of the light source structure 40 changes, the position or size of its mounting structure will also change, which may cause the light source structure 40 to be unable to be directly connected to the mounting plate 35. By setting a transition mounting structure on the light source fixing block 60, different light source structures 40 can be connected to the mounting plate 35.

[0051] In some embodiments, the mounting plate 35 and the light source fixing block 60 are detachably connected by screws. The screw connection is more stable and also convenient for disassembly and assembly.

[0052] In some embodiments, the light source fixing block 60 and the light source structure 40 are detachably connected by screws. The screw connection is more stable and also convenient for disassembly and assembly.

[0053] Please refer to some embodiments of this utility model. Figure 3The light source fixing block 60 has a first connecting hole 61 and a second connecting hole 62. The mounting plate 35 is connected to the light source fixing block 60 through the first connecting hole 61, and the light source structure 40 is connected to the light source fixing block 60 through the second connecting hole 62. The first connecting hole 61 is the mounting structure for connecting the light source fixing block 60 to the mounting plate 35, and the second connecting hole 62 is the mounting structure for connecting the light source fixing block 60 to the light source structure 40. Specifically, the mounting plate 35 is provided with a third connecting hole 351, through which screws pass to connect the mounting plate 35 to the light source fixing block 60. The light source structure 40 is provided with a fourth connecting hole 41, through which screws pass to connect the light source structure 40 to the light source fixing block 60.

[0054] By providing a first connecting hole 61 and a second connecting hole 62 on the light source fixing block 60, the light source structure 40 and the mounting plate 35 are connected. The structure of the connecting holes is relatively simple and easy to manufacture, which can reduce the manufacturing cost of the light source fixing block 60 and reduce the difficulty of assembling and disassembling the light source fixing block 60, the light source structure 40, and the mounting plate 35. When it is necessary to replace the light source structure 40, the light source structure 40 can be removed from the light source fixing block 60. If the mounting structure of the new light source structure 40 is different from that of the original light source structure 40, the light source fixing block 60 can be removed from the mounting plate 35 and replaced with the new light source fixing block 60 and the new light source structure 40.

[0055] In some embodiments, there are multiple first connecting holes 61 and multiple second connecting holes 62. Both the first connecting holes 61 and the second connecting holes 62 are provided through the light source fixing block 60, which facilitates screw connection.

[0056] Please refer to some embodiments of this utility model. Figures 4 to 6The drive assembly 30 includes a mounting frame 31, a handle 32, a connecting rod 33, a sliding rod 34, and a mounting plate 35. The mounting frame 31 is fixed to the support structure 20. The handle 32 is rotatably connected to both the mounting frame 31 and the connecting rod 33. The end of the connecting rod 33 away from the handle 32 is rotatably connected to the sliding rod 34. The sliding rod 34 is slidably mounted on the mounting frame 31 in a vertical direction. The mounting plate 35 is fixedly connected to the sliding rod 34, and the light source structure 40 is fixed to the mounting plate 35. The handle 32 is the drive part of the drive assembly 30. The handle 32 is generally manually driven by the user, causing the handle 32 to swing. When the handle 32 swings, the connecting rod 33 rotates, causing the sliding rod 34 to slide within the mounting frame 31. The sliding direction of the sliding rod 34 is vertical. Under the constraint and guidance of the handle 32, the connecting rod 33 drives the sliding rod 34 to move in the vertical direction. The crank-slider structure comprises a handle 32, a connecting rod 33, a sliding rod 34, and a mounting bracket 31. The handle 32 is the driving component, equivalent to the crank in the crank-slider structure, and the sliding rod 34 is the driven component, equivalent to the slider in the crank-slider structure. The sliding rod 34 and the mounting bracket 31 are fixedly connected, and the sliding rod 34 and the mounting bracket 31 move synchronously.

[0057] By configuring the drive assembly 30 as a mounting bracket 31, handle 32, connecting rod 33, sliding rod 34, and mounting plate 35, the handle 32 swings, causing the connecting rod 33 to rotate, and the sliding rod 34 slides on the mounting bracket 31, thereby causing the mounting plate 35 to move the light source structure 40 vertically. Therefore, when chip testing is required, rotating the handle 32 causes the mounting plate 35 to move the light source structure 40 and the upper cover 51 of the test fixture downwards, pressing against the lower cover 52 of the test fixture to test the chip. After testing, rotating the handle 32 in the opposite direction causes the mounting plate 35 to move the light source structure 40 and the test fixture 50 upwards, moving them away from the lower cover 52 of the test fixture.

[0058] Please refer to some embodiments of this utility model. Figures 4 to 6The mounting bracket 31 includes a first mounting portion 311, a second mounting portion 312, and a connecting portion 313. The connecting portion 313 is fixed to the bracket structure 20. One end of the first mounting portion 311 is connected to the connecting portion 313, and the other end of the first mounting portion 311 is hinged to the handle 32. One end of the second mounting portion 312 is connected to the connecting portion 313, and the other end of the second mounting portion 312 has a sliding hole 3121 through which a sliding rod 34 passes. The connecting portion 313 is used to connect the first mounting portion 311 and the second mounting portion 312. Specifically, both ends of the connecting portion 313 are connected to the first mounting portion 311 and the second mounting portion 312, respectively. The end of the first mounting portion 311 away from the connecting portion 313 is hinged to the handle 32. The sliding hole 3121 is located at the end of the second mounting portion 312 away from the connecting portion 313. The axial direction of the sliding hole 3121 is vertical, providing vertical guidance for the sliding rod 34.

[0059] In some embodiments, the first mounting portion 311 is bent and connected to the connecting portion 313, and the second mounting portion 312 is bent and connected to the connecting portion 313, so that the mounting bracket 31 has a V-shaped structure, providing sufficient space for the rotation of the connecting rod 33 and the handle 32.

[0060] In some embodiments, the connecting part 313 is connected to the bracket structure 20 by means of screws or the like, thereby realizing the connection between the bracket structure 20 and the mounting bracket 31.

[0061] In some embodiments, the connecting portion 313, the first mounting portion 311, and the second mounting portion 312 are integrally formed, such as by casting or injection molding. This improves the overall strength of the mounting bracket 31 and eliminates the need for subsequent installation.

[0062] Please refer to some embodiments of this utility model. Figures 4 to 6 The handle 32 includes an operating part 322 and a hinge part 321 connected to each other. One end of the hinge part 321 is hinged to the mounting bracket 31, and the other end of the hinge part 321 is hinged to the sliding rod 34. The operating part 322 is for gripping. The hinge part 321 is the crank part of the crank slider mentioned above. When the user grips the operating part 322 and rotates it, the hinge part 321 can be rotated accordingly.

[0063] By setting up the operating unit 322, the user can directly hold the operating unit 322 to rotate the handle 32, making it convenient for the user to operate the handle 32.

[0064] In some embodiments, the hinge portion 321 is bent and connected to the operating portion 322, thereby changing the extension direction of the handle 32, making the angle more suitable when the hand grips and exerts force, and making it easier to rotate the handle 32.

[0065] In some embodiments, the hinge portion 321 and the operating portion 322 are integrally formed, such as by casting or injection molding. This improves the overall strength of the handle 32 and eliminates the need for subsequent installation.

[0066] In some embodiments, the operating part 322 has a concave-convex structure, which can increase the surface roughness of the operating part 322, thereby making the hand more stable when holding the operating part 322 and preventing slippage. The concave-convex structure can be a pattern, a dot, a thread shape, etc.

[0067] Please refer to some embodiments of this utility model. Figure 1 , Figure 2 and Figure 4 The drive assembly 30 also includes a guide assembly 36, which includes a slide rail 362 fixed to the bracket structure 20, a sliding frame 363 slidably disposed on the slide rail 362 in a vertical direction, and a guide rod 361 fixed to the base 10 and passing through the mounting plate 35. The sliding frame 363 is fixedly connected to the mounting plate 35. The guide assembly 36 is used to guide the vertical movement of the mounting plate 35, making the movement of the mounting plate 35 more stable. The guide rod 361 passes through the mounting plate 35, and one end of the guide rod 361 is fixed to the base 10. That is, the guide rod 361 remains fixed, and the mounting plate 35 slides vertically on the guide rod 361, thereby guiding the mounting plate 35 through the guide rod 361, making the vertical movement of the mounting plate 35 more stable. Moreover, when the mounting plate 35 slides up and down, it can drive the sliding frame 363 to move along the slide rail 362, which can further improve the stability of the movement of the mounting plate 35.

[0068] In some embodiments, there are multiple guide rods 361, which are respectively disposed on opposite sides of the mounting plate 35.

[0069] In some embodiments, please refer to Figure 1 , Figure 2 and Figure 4 An elastic element 364 is fitted onto the guide rod 361, and both ends of the elastic element 364 abut against the mounting plate 35 and the base 10, respectively. As the mounting plate 35 slides up and down along the guide rod 361, the elastic element 364 deforms accordingly. Specifically, when the handle 32 is rotated and the mounting plate 35 moves downwards, the elastic element 364 is compressed, providing force feedback when the handle 32 is rotated. This ensures that when the mounting plate 35 moves the light source structure 40 and the upper cover 51 of the test fixture downwards, the upper cover 51 of the test fixture can stably press against the lower cover 52 of the test fixture.

[0070] By setting the elastic element 364, a buffer can be generated when the upper cover 51 and the lower cover 52 of the test fixture come into contact with each other, so as to prevent the upper cover 51 of the test fixture from causing a hard impact on the lower cover 52 of the test fixture, thereby protecting the chip.

[0071] In some embodiments, the elastic element 364 is a cylindrical spring.

[0072] In some embodiments, each guide rod 361 is fitted with an elastic element 364. Alternatively, some guide rods 361 are fitted with elastic elements 364, while some guide rods 361 are not fitted with elastic elements 364.

[0073] Please refer to some embodiments of this utility model. Figure 1 and Figure 2 There are two connecting rods 33, which are respectively located on opposite sides of the handle 32. One end of each connecting rod 33 is hinged to the handle 32, and the other end is hinged to the sliding rod 34. The rotation axes of the handle 32 and the connecting rods 33 are parallel to the same rotation axis, and the opposite sides of the handle 32 can be understood as the opposite ends of the handle 32 on this rotation axis.

[0074] By setting the number of linkages 33 to two, the rotation of handle 32 and the sliding of sliding rod 34 can be made more stable.

[0075] Please refer to some embodiments of this utility model. Figure 1 and Figure 2 The chip testing apparatus also includes a test fixture upper cover 51 and a test fixture lower cover 52. The test fixture upper cover 51 is detachably connected to the drive assembly 30, and the test fixture lower cover 52 is detachably connected to the base 10. The test fixture lower cover 52 is used to accommodate the chip, and the test fixture upper cover 51 is used to press the test fixture lower cover 52 and the chip together, so that the chip can stably conduct with the test probes. Since the test fixture upper cover 51 is detachably connected to the drive assembly 30 and the test fixture lower cover 52 is detachably connected to the base 10, both the test fixture upper cover 51 and the test fixture lower cover 52 can be removed to replace different test fixtures 50. Thus, the chip testing apparatus can be adapted to different light source structures 40 and different test fixtures 50.

[0076] In other embodiments, different light source structures 40 can also be adapted to the same test fixture 50. When changing the light source structure 40, the light source structure 40 can be removed and replaced with a new light source structure 40, but the original test fixture 50 is still used.

[0077] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A chip testing device, characterized in that, include: A base for mounting the lower cover of a test fixture, the lower cover of which is used to place the chip; A support structure is fixed to the base; A drive assembly is mounted on the bracket structure and positioned above the lower cover of the test fixture; the drive assembly is capable of outputting vertical movement. The light source structure is detachably connected to the moving end of the drive assembly, and the side of the light source structure facing the base is used to install the test fixture cover.

2. The chip testing apparatus as described in claim 1, characterized in that, The moving end of the drive component is a mounting plate, and the light source structure and the mounting plate are connected by a light source fixing block.

3. The chip testing apparatus as described in claim 2, characterized in that, The light source fixing block has a first connecting hole and a second connecting hole. The mounting plate is connected to the light source fixing block through the first connecting hole, and the light source structure is connected to the light source fixing block through the second connecting hole.

4. The chip testing apparatus as described in claim 1, characterized in that, The drive assembly includes a mounting bracket, a handle, a connecting rod, a sliding rod, and a mounting plate. The mounting bracket is fixed to the support structure. The handle is rotatably connected to both the mounting bracket and the connecting rod. The end of the connecting rod away from the handle is rotatably connected to the sliding rod. The sliding rod is slidably mounted on the mounting bracket in a vertical direction. The mounting plate is fixedly connected to the sliding rod, and the light source structure is fixed to the mounting plate.

5. The chip testing apparatus as described in claim 4, characterized in that, The mounting bracket includes a first mounting part, a second mounting part, and a connecting part. The connecting part is fixed to the bracket structure. One end of the first mounting part is connected to the connecting part, and the other end of the first mounting part is hinged to the handle. One end of the second mounting part is connected to the connecting part, and the other end of the second mounting part has a sliding hole, through which the sliding rod passes.

6. The chip testing apparatus as described in claim 4, characterized in that, The handle includes an operating part and a hinge part connected to each other. One end of the hinge part is hinged to the mounting bracket, and the other end of the hinge part is hinged to the sliding rod. The operating part is for gripping.

7. The chip testing apparatus as described in claim 4, characterized in that, The drive assembly further includes a guide assembly, which includes a slide rail fixed to the bracket structure, a slide frame slidably disposed on the slide rail in a vertical direction, and a guide rod fixed to the base and passing through the mounting plate. The slide frame is fixedly connected to the mounting plate.

8. The chip testing apparatus as described in claim 7, characterized in that, An elastic element is sleeved on the guide rod, and the two ends of the elastic element abut against the mounting plate and the base, respectively.

9. The chip testing apparatus as described in claim 4, characterized in that, The number of links is two, and the two links are respectively located on opposite sides of the handle.

10. The chip testing apparatus according to any one of claims 1-9, characterized in that, The chip testing device further includes an upper cover and a lower cover of the testing fixture. The upper cover of the testing fixture is detachably connected to the driving component, and the lower cover of the testing fixture is detachably connected to the base.

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