PCIe optical module test board, device and system

Abstract

The application provides a PCIe optical module test board, device and system, and relates to the technical field of optical fiber communication.In the application, the first optical module is used for converting the PCIe signal received by the first PCIe optical module interface unit into an optical signal, and outputting the optical signal through the first PCIe optical module interface unit; the second optical module is used for converting the optical signal received by the second PCIe optical module interface unit from the first PCIe optical module interface unit into a PCIe signal, and outputting the PCIe signal through the second PCIe optical module interface unit; the micro control unit is used for respectively communicating with the connected first optical module and the connected second optical module through the first PCIe optical module interface unit and the second PCIe optical module interface unit, and completing the test on the first optical module and the second optical module.Based on the above, the problem that the PCIe optical module is difficult to be effectively tested in the prior art can be solved.

Description

Technical Field

[0001] This application relates to the field of optical fiber communication technology, and more specifically, to a PCIe optical module test board, device, and system. Background Technology

[0002] With the development of AI and big data technologies, PCIe (Peripheral Component Interconnect Express) remains a widely used high-speed signal transmission protocol. In traditional technologies, PCIe signal transmission via copper cables has short transmission distances and high losses. PCIe optical modules, using optical signals, offer advantages such as longer transmission distances, higher bandwidth, and stronger anti-interference capabilities, gradually replacing copper cable transmission solutions. In systems relying on copper cables for PCIe signal transmission, ensuring that the attenuation of the electrical signal by the copper cable is within acceptable limits is sufficient to achieve distortion-free PCIe signal transmission; no additional evaluation system is needed for operational testing of the copper cable.

[0003] However, the inventors discovered that the PCIe optical module, as a key component for high-speed data transmission, involves an internal process of converting electrical signals to optical signals and then back to electrical signals. This process includes electrical signal equalization compensation and electro-optical signal conversion. Its performance stability and protocol correctness directly affect the data transmission quality and efficiency of the entire system. Therefore, PCIe optical modules need to be tested; however, existing technologies present difficulties in effectively testing them. Summary of the Invention

[0004] In view of this, the purpose of this application is to provide a PCIe optical module test board, device and system to improve the problem of difficulty in effectively testing PCIe optical modules in the prior art.

[0005] To achieve the above objectives, this application adopts the following technical solution: A PCIe optical module test board, comprising: The first PCIe optical module interface unit is used to connect to the first optical module to be tested. The first optical module is used to convert the PCIe signal received by the first PCIe optical module interface unit into an optical signal and output the optical signal through the first PCIe optical module interface unit. The second PCIe optical module interface unit is used to connect to the second optical module to be tested, and the second PCIe optical module interface unit is connected to the first PCIe optical module interface unit through an optical fiber. The second optical module is used to convert the optical signal received by the second PCIe optical module interface unit from the first PCIe optical module interface unit into a PCIe signal, and output the PCIe signal through the second PCIe optical module interface unit. A microcontroller unit, wherein the microcontroller unit is communicatively connected to the first PCIe optical module interface unit and the second PCIe optical module interface unit respectively, the microcontroller unit is used to communicate with the connected first optical module through the first PCIe optical module interface unit, and is used to communicate with the connected second optical module through the second PCIe optical module interface unit respectively, so as to complete the testing of the first optical module and the second optical module.

[0006] In a preferred embodiment of this application, in the aforementioned PCIe optical module test board, the first PCIe optical module interface unit is packaged in the form of OSFP-XD, OSFP, QSFP-DD, or QSFP.

[0007] In a preferred embodiment of this application, in the aforementioned PCIe optical module test board, the second PCIe optical module interface unit is packaged in the form of OSFP-XD, OSFP, QSFP-DD, or QSFP.

[0008] In a preferred embodiment of this application, the PCIe optical module test board further includes: The first PCIe interface unit is communicatively connected to the first PCIe optical module interface unit, and the first PCIe interface unit is also used to connect to the PCIe interface of an external input-side component to transmit the PCIe signal input by the input-side component to the first PCIe optical module interface unit. The second PCIe interface unit is communicatively connected to the second PCIe optical module interface unit, and the second PCIe interface unit is also used to connect to the PCIe interface of an external output-side component to transmit the PCIe signal output by the second PCIe optical module interface unit to the output-side component.

[0009] In a preferred embodiment of this application, the PCIe optical module test board further includes: A clock unit, wherein the clock unit is used to provide a first clock signal; A clock signal multiplexing unit is provided, wherein the clock signal multiplexing unit is connected to the clock unit to obtain the first clock signal, the clock signal multiplexing unit is further configured to be connected to the clock signal output port of the input-side component to obtain the second clock signal, and the clock signal multiplexing unit is also connected to the microcontroller unit, so that the microcontroller unit controls the output of the first clock signal and the second clock signal through the clock signal multiplexing unit.

[0010] In a preferred embodiment of this application, the PCIe optical module test board further includes: The first power consumption monitoring unit includes a current detection chip and is connected to the first PCIe optical module interface unit to monitor the power consumption of the first optical module connected to the first PCIe optical module interface unit. The second power consumption monitoring unit includes a current detection chip and is connected to the second PCIe optical module interface unit to monitor the power consumption of the second optical module connected to the second PCIe optical module interface unit.

[0011] In a preferred embodiment of this application, the PCIe optical module test board further includes: The power supply unit is also connected to the first PCIe optical module interface unit, the second PCIe optical module interface unit, and the microcontroller unit, respectively, for supplying power to the first optical module, the second optical module, and the microcontroller unit. The power supply unit includes a power supply and a voltage converter, and the voltage converter is used to step down the input voltage of the power supply and then output the power supply.

[0012] In a preferred embodiment of this application, the PCIe optical module test board further includes: The display unit is connected to the microcontroller unit and is used to display abnormal results of the microcontroller unit's tests on the first optical module and the second optical module.

[0013] Based on the above, this application also provides a PCIe optical module testing device, comprising: The aforementioned PCIe optical module test board; The input-side component connected to the PCIe optical module test board; The output-side component connected to the PCIe optical module test board.

[0014] Based on the above, this application also provides a PCIe optical module test board system, including: The aforementioned PCIe optical module testing equipment; The first optical module connected to the PCIe optical module testing equipment; A second optical module connected to the PCIe optical module testing equipment.

[0015] In the PCIe optical module test board, device, and system provided in this application, a first optical module converts the PCIe signal received by a first PCIe optical module interface unit into an optical signal and outputs the optical signal through the first PCIe optical module interface unit; a second optical module converts the optical signal from the first PCIe optical module interface unit into a PCIe signal and outputs the PCIe signal through the second PCIe optical module interface unit; a microcontroller unit communicates with the connected first optical module and the connected second optical module respectively through the first PCIe optical module interface unit and the second PCIe optical module interface unit to complete the testing of the first and second optical modules. Based on the above, by setting up the first and second PCIe optical module interface units, the first and second optical modules can be effectively connected, and the connected microcontroller unit can communicate with both the first and second optical modules, thereby realizing the testing of the optical module's service performance and performance indicators. Therefore, it can improve the problem of difficulty in effectively testing PCIe optical modules in the prior art. Attached Figure Description

[0016] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings.

[0017] Figure 1 This is a schematic diagram of a PCIe optical module test board provided in an embodiment of this application.

[0018] Figure 2 This is a schematic diagram of a PCIe optical module performance testing device provided in an embodiment of this application.

[0019] Figure 3 This is a schematic diagram of a PCIe optical module performance testing system provided in an embodiment of this application. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0021] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0022] like Figure 1 As shown in the figure, this application embodiment provides a PCIe optical module test board. The PCIe optical module test board may include a first PCIe optical module interface unit, a second PCIe optical module interface unit, and a microcontroller unit.

[0023] Specifically, the first PCIe optical module interface unit is used to connect to the first optical module under test. The first optical module converts the PCIe signal received by the first PCIe optical module interface unit into an optical signal and outputs the optical signal through the first PCIe optical module interface unit. The second PCIe optical module interface unit is used to connect to the second optical module under test, and the second PCIe optical module interface unit is connected to the first PCIe optical module interface unit via optical fiber. The second optical module converts the optical signal received by the second PCIe optical module interface unit from the first PCIe optical module interface unit into a PCIe signal and outputs the PCIe signal through the second PCIe optical module interface unit. The microcontroller unit is communicatively connected to both the first and second PCIe optical module interface units. The microcontroller unit is used to communicate with the connected first optical module through the first PCIe optical module interface unit and with the connected second optical module through the second PCIe optical module interface unit, respectively, to complete the testing of the first and second optical modules.

[0024] Based on the above, by setting up the first PCIe optical module interface unit and the second PCIe optical module interface unit, the first optical module and the second optical module can be effectively connected, and the connected microcontroller unit can communicate with both the first optical module and the second optical module, thereby realizing the testing of the optical module's service performance and performance indicators. Therefore, it can improve the problem of the difficulty in effectively testing PCIe optical modules in the prior art.

[0025] It is understood that, in an alternative implementation, the first PCIe optical module interface unit may be packaged in the form of OSFP-XD, OSFP, QSFP-DD, or QSFP, i.e., any one of OSFP-XD, OSFP, QSFP-DD, and QSFP.

[0026] It is understood that, in an alternative implementation, the package form of the second PCIe optical module interface unit is OSFP-XD, OSFP, QSFP-DD, or QSFP, that is, any one of OSFP-XD, OSFP, QSFP-DD, and QSFP. Furthermore, it should be noted that the package form of the second PCIe optical module interface unit can be the same as that of the first PCIe optical module interface unit, or it can be different based on other requirements.

[0027] Furthermore, in order to ensure the effective access of the first optical module and the second optical module, the packaging form of the second PCIe optical module interface unit and the packaging form of the first PCIe optical module interface unit can be determined based on the packaging form of the first optical module and the packaging form of the second optical module. That is, when the packaging form of the first optical module is other, the packaging form of the first PCIe optical module interface unit can also be other. Correspondingly, when the packaging form of the second optical module is other, the packaging form of the second PCIe optical module interface unit can also be other.

[0028] It is understood that, in an alternative implementation, the PCIe optical module test board may further include a first PCIe interface unit and a second PCIe interface unit.

[0029] Specifically, the first PCIe interface unit is communicatively connected to the first PCIe optical module interface unit, and the first PCIe interface unit is also used to connect to the PCIe interface of an external input-side component (e.g., a root complex) to transmit PCIe signals input from the input-side component to the first PCIe optical module interface unit. The second PCIe interface unit is communicatively connected to the second PCIe optical module interface unit, and the second PCIe interface unit is also used to connect to the PCIe interface of an external output-side component (e.g., an end point) to transmit PCIe signals output from the second PCIe optical module interface unit to the output-side component.

[0030] It should be noted that the PCIe interfaces used by the current Root Complex (a port or component in the PCIe system that connects to the main system and is responsible for transmitting signals from the PCIe extension endpoint to the main system) and End Point (a port or component in the PCIe system that connects to peripheral devices and is responsible for receiving signals from the Root Complex and converting them into a format that the peripheral devices (such as hard disk drives, solid-state drives, etc.) can recognize and process) are incompatible with the PCIe optical module interface, making it difficult to perform service testing on PCIe optical modules. Therefore, it is urgent to find a suitable performance and service testing solution for PCIe optical modules. Based on the configuration of the first PCIe interface unit, the second PCIe interface unit, the first PCIe optical module interface unit, and the second PCIe optical module interface unit described above, both the Root Complex and the End Point can achieve effective connection to the optical module, thereby ensuring that effective performance and service testing of the optical module can be performed.

[0031] It is understood that, in an alternative implementation, the PCIe optical module test board may also include a clock unit and a clock signal multiplexing unit.

[0032] Specifically, the clock unit can be used to provide a first clock signal. The clock signal multiplexing unit is connected to the clock unit to obtain the first clock signal. The clock signal multiplexing unit is also used to connect to the clock signal output port of the input-side component to obtain a second clock signal. Furthermore, the clock signal multiplexing unit is connected to the microcontroller unit, enabling the microcontroller unit to control the output of the first and second clock signals through the clock signal multiplexing unit. In other words, either the first clock signal or the second clock signal can be used as the reference clock signal for the entire device.

[0033] It is understood that, in an alternative implementation, the PCIe optical module test board may further include a first power consumption monitoring unit and a second power consumption monitoring unit.

[0034] Specifically, the first power consumption monitoring unit includes a current detection chip and is connected to the first PCIe optical module interface unit to monitor the power consumption of the first optical module connected to the first PCIe optical module interface unit. The second power consumption monitoring unit includes a current detection chip and is connected to the second PCIe optical module interface unit to monitor the power consumption of the second optical module connected to the second PCIe optical module interface unit.

[0035] It is understood that, in an alternative implementation, the PCIe optical module test board may also include a power supply unit.

[0036] In detail, the power supply unit is also connected to the first PCIe optical module interface unit, the second PCIe optical module interface unit and the microcontroller unit respectively, for supplying power to the first optical module, the second optical module and the microcontroller unit, and the power supply unit includes a power supply and a voltage converter, the voltage converter being used to step down the input voltage of the power supply and then output power.

[0037] It is understood that, in an alternative implementation, the PCIe optical module test board may also include a display unit.

[0038] Specifically, the display unit is connected to the microcontroller unit, and the display unit is used to display abnormal results of the microcontroller unit's tests on the first optical module and the second optical module. For example, the display unit may be an LED display device.

[0039] For the PCIe optical module test board mentioned above, a specific application example is also provided: The PCIe optical module test board can adopt the standard Add-in Card form defined by PCIe CEM. It is small in size and has good compatibility. It mainly includes a microcontroller unit, a power consumption monitoring unit, a power supply unit, a clock unit, a PCIe optical module interface unit, a PCIe interface unit, and a display unit, with the following functions.

[0040] Microcontroller Unit: The microcontroller unit can control the operating status of the optical module, monitor the status parameters of the optical module in real time, and monitor the link status of the optical module during PCIe communication, and report to the host computer. Simultaneously, the microcontroller unit is responsible for controlling the normal operation of the clock unit and the display unit.

[0041] Power consumption monitoring unit: Adopting a current detection chip solution, it can monitor the power consumption of the optical module on the optical module test board in real time under various states, so that testers can promptly and intuitively discover abnormalities when the optical module is working.

[0042] Power Supply Unit: The optical module test board is powered by a standard 8-pin ATX power supply, which supports a maximum load of 150W. The 12V input voltage is converted to 3.3V by a voltage converter to power the optical module and the End Point, ensuring the normal operation of each component.

[0043] Clock Unit: The optical module test board provides a 100MHz reference clock signal required by the PCIe Base protocol for PCIe transmission. It can also control the clock switching through the microcontroller unit, selecting the clock signal of the Root Complex as the reference clock signal for the entire PCIe link.

[0044] PCIe optical module interface unit: Utilizing an OSFP-XD interface, the PCIe optical module connects to the entire link. The OSFP-XD interface features 16 high-speed transceiver channels, supporting testing and verification of optical modules with up to 16 channels. It can also be replaced with an interface of the corresponding package type based on the optical module's packaging, offering high flexibility.

[0045] PCIe interface unit: It adopts a standard 16-channel PCIe interface, providing 16 high-speed signal transmission channels and 16 high-speed signal reception channels, meeting the maximum 16-channel transmission requirement proposed by the PCIe Base protocol, while being backward compatible with the transmission requirements of optical modules with different numbers of channels.

[0046] Display unit: Used as an indicator light for the status and performance abnormalities of the optical module, helping testers to quickly identify module performance abnormalities.

[0047] Based on the above configuration, optical module service testing can be implemented. The Root Complex transmits PCIe signals to the optical module test board via the PCIe interface. Inside the optical module, the PCIe signals are processed and converted into optical signals for transmission. Another optical module receives the optical signals, and internally, it converts them into electrical signals. These electrical signals then pass through the PCIe interface and finally reach the End Point. The microcontroller unit on the optical module test board communicates with the optical module, monitoring the transceiver status of the PCIe uplink and downlink. It can perform tests such as PCIe link startup and debugging, Rx channel margin, PCIe link security and robustness, and on-chip I / O port margin, facilitating the evaluation of the optical module's service performance. Simulation testing of high-speed traces ensures high-speed PCIe signal transmission, thus supporting service testing of optical modules with up to 16 channels. Furthermore, the display unit on the optical module test board provides different status prompts based on the PCIe link status.

[0048] In addition, it can also perform performance testing of optical modules. The microcontroller unit can be used to test the security and robustness of the internal firmware and IIC communication interface of the PCIe optical module. It can also control the optical module to emit PRBS signals of different codes. With the help of oscilloscopes, power meters and other testing instruments, the eye diagram, output power, BER and other performance indicators of the optical module can be tested.

[0049] Based on this, by integrating a microcontroller unit, power consumption monitoring unit, power supply unit, clock unit, PCIe optical module interface unit, PCIe interface unit, and display unit, it is possible to simultaneously perform comprehensive evaluation and testing of two 16-channel optical modules, including output power, bit error rate, power consumption, and eye diagram. The microcontroller unit can read and monitor the status information of the optical modules and the training status of the PCIe link, and evaluate the service performance of the optical modules. Based on this, various performance indicators and service test performance of the optical modules can be directly verified. In addition, the test objects should not be limited to PCIe 6.0 optical modules, but should also include PCIe 1.0, PCIe 2.0, PCIe 3.0, PCIe 4.0, PCIe 5.0, and PCIe 7.0 optical modules.

[0050] It should be noted that the specific functions of each unit in the PCIe optical module test board can be directly implemented based on existing technology. The focus of this application is to connect the units with various functions to complete the corresponding test functions. That is, the improvement of the PCIe optical module test board provided by this application is not in the implementation of each function, but in the connection and combination of each unit.

[0051] Combination Figure 2As shown in the figure, this application embodiment also provides a PCIe optical module performance testing device, wherein the PCIe optical module performance testing device may include the PCIe optical module performance testing board described above, and the PCIe optical module performance testing device may further include an input-side component connected to the PCIe optical module testing board and an output-side component connected to the PCIe optical module testing board.

[0052] In addition, the specific composition and working principle of the PCIe optical module performance testing equipment can be found in the explanation of the PCIe optical module performance testing board above.

[0053] Combination Figure 3 As shown in the figure, this application embodiment also provides a PCIe optical module performance testing system, wherein the PCIe optical module performance testing system may include the PCIe optical module testing equipment described above, and the PCIe optical module testing system may further include a first optical module connected to the PCIe optical module testing equipment and a second optical module connected to the PCIe optical module testing equipment.

[0054] In addition, the specific structure and working principle of the PCIe optical module performance testing system can be found in the explanation of the PCIe optical module performance testing board above.

[0055] In summary, in the PCIe optical module test board, device, and system provided in this application, the first optical module converts the PCIe signal received by the first PCIe optical module interface unit into an optical signal and outputs the optical signal through the first PCIe optical module interface unit; the second optical module converts the optical signal from the first PCIe optical module interface unit into a PCIe signal and outputs the PCIe signal through the second PCIe optical module interface unit; the microcontroller unit communicates with the connected first optical module and the connected second optical module respectively through the first PCIe optical module interface unit and the second PCIe optical module interface unit to complete the testing of the first and second optical modules. Based on the above, the configuration of the first and second PCIe optical module interface units allows for effective access between the first and second optical modules, enabling the connected microcontroller unit to communicate with both the first and second optical modules, thereby achieving the testing of the optical module's service performance and performance indicators. Therefore, it can improve the problem of difficulty in effectively testing PCIe optical modules in the prior art.

[0056] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A PCIe optical module test board, characterized in that, include: The first PCIe optical module interface unit is used to connect to the first optical module to be tested. The first optical module is used to convert the PCIe signal received by the first PCIe optical module interface unit into an optical signal and output the optical signal through the first PCIe optical module interface unit. The second PCIe optical module interface unit is used to connect to the second optical module to be tested, and the second PCIe optical module interface unit is connected to the first PCIe optical module interface unit through an optical fiber. The second optical module is used to convert the optical signal received by the second PCIe optical module interface unit from the first PCIe optical module interface unit into a PCIe signal, and output the PCIe signal through the second PCIe optical module interface unit. A microcontroller unit, wherein the microcontroller unit is communicatively connected to the first PCIe optical module interface unit and the second PCIe optical module interface unit respectively, the microcontroller unit is used to communicate with the connected first optical module through the first PCIe optical module interface unit, and is used to communicate with the connected second optical module through the second PCIe optical module interface unit, so as to complete the testing of the first optical module and the second optical module.

2. The PCIe optical module test board according to claim 1, characterized in that, The first PCIe optical module interface unit is packaged in OSFP-XD, OSFP, QSFP-DD, or QSFP.

3. The PCIe optical module test board according to claim 1, characterized in that, The second PCIe optical module interface unit is packaged in OSFP-XD, OSFP, QSFP-DD, or QSFP.

4. The PCIe optical module test board according to claim 1, characterized in that, The PCIe optical module test board also includes: The first PCIe interface unit is communicatively connected to the first PCIe optical module interface unit, and the first PCIe interface unit is also used to connect to the PCIe interface of an external input-side component to transmit the PCIe signal input by the input-side component to the first PCIe optical module interface unit. The second PCIe interface unit is communicatively connected to the second PCIe optical module interface unit, and the second PCIe interface unit is also used to connect to the PCIe interface of an external output-side component to transmit the PCIe signal output by the second PCIe optical module interface unit to the output-side component.

5. The PCIe optical module test board according to claim 4, characterized in that, The PCIe optical module test board also includes: A clock unit, wherein the clock unit is used to provide a first clock signal; A clock signal multiplexing unit is provided, wherein the clock signal multiplexing unit is connected to the clock unit to obtain the first clock signal, the clock signal multiplexing unit is further configured to be connected to the clock signal output port of the input-side component to obtain the second clock signal, and the clock signal multiplexing unit is also connected to the microcontroller unit, so that the microcontroller unit controls the output of the first clock signal and the second clock signal through the clock signal multiplexing unit.

6. The PCIe optical module test board according to any one of claims 1-5, characterized in that, The PCIe optical module test board also includes: The first power consumption monitoring unit includes a current detection chip and is connected to the first PCIe optical module interface unit to monitor the power consumption of the first optical module connected to the first PCIe optical module interface unit. The second power consumption monitoring unit includes a current detection chip and is connected to the second PCIe optical module interface unit to monitor the power consumption of the second optical module connected to the second PCIe optical module interface unit.

7. The PCIe optical module test board according to any one of claims 1-5, characterized in that, The PCIe optical module test board also includes: The power supply unit is also connected to the first PCIe optical module interface unit, the second PCIe optical module interface unit, and the microcontroller unit, respectively, for supplying power to the first optical module, the second optical module, and the microcontroller unit. The power supply unit includes a power supply and a voltage converter, and the voltage converter is used to step down the input voltage of the power supply and then output the power supply.

8. The PCIe optical module test board according to any one of claims 1-5, characterized in that, The PCIe optical module test board also includes: The display unit is connected to the microcontroller unit and is used to display abnormal results of the microcontroller unit's tests on the first optical module and the second optical module.

9. A PCIe optical module performance testing device, characterized in that, include: The PCIe optical module test board according to any one of claims 1-8; The input-side component connected to the PCIe optical module test board; The output-side component connected to the PCIe optical module test board.

10. A PCIe optical module performance testing system, characterized in that, include: The PCIe optical module testing equipment as described in claim 9; The first optical module connected to the PCIe optical module testing equipment; A second optical module connected to the PCIe optical module testing equipment.

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