A kind of plate type denitration catalyst substrate thickness measuring device

CN224838852UActive Publication Date: 2026-10-09DATANG NANJING ENVIRONMENTAL PROTECTION TECH
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Patent Information

Application Number
CN202521879688.5
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-02
Publication Date
2026-10-09
Estimated Expiration
2035-09-02

AI Technical Summary

Technical Problem

[0003]在板式基材厚度检测领域,传统测厚设备多采用接触式测量方式,通过测头与基材表面直接接触获取厚度数据,这类设备在测量过程中易对基材表面造成磨损,不仅影响基材质量,还会因表面损伤导致测量精度下降,尤其不适用于脆性或表面易损基材

Benefits of technology

1.通过采用测量台结构,利用测量台旋转可改变基材的测厚点位,配合上下设置的测量仪,对基材不同点位测厚,提高了测量精度,不需要反复拆卸、调整基材的固定位置并重新校准,操作简单高效,提高了检测效率;

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Abstract

This invention provides a thickness measuring device for plate-type denitrification catalyst substrates, relating to the field of catalyst substrate testing technology. The device includes: a base, on which a rotating rod is arranged perpendicularly; a measuring platform for placing the plate-type denitrification catalyst substrate is connected to the top of the rotating rod; a hollow measuring groove is formed on the measuring platform; a connecting rod arranged parallel to the rotating rod is arranged on the outer side of the rotating rod; the outer periphery of the connecting rod is rotatably connected to the rotating rod via a connecting frame; symmetrical fixing rods are vertically connected to both ends of the connecting rod; a measuring instrument is mounted at the end of the fixing rod; two measuring instruments are aligned on the upper and lower sides of the measuring platform, and the emitted laser light can pass through the measuring groove. This device can conveniently measure the thickness of different points on the substrate without repeatedly disassembling, adjusting the fixed position of the substrate, and recalibrating, making operation simple and efficient, and improving testing efficiency.
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Description

Technical Field

[0001] This utility model relates to the field of catalyst substrate testing technology, and in particular to a plate-type denitrification catalyst substrate thickness measuring device. Background Technology

[0002] Metal sheets are the core substrate of plate-type denitrification catalysts. They are mostly made of corrosion-resistant alloys such as titanium alloys and stainless steel. After rolling and surface pretreatment, they are coated with a variety of active coatings. Their thinness and lightness facilitate contact with flue gas. Through precise arrangement, they form flow channels and have both structural stability and resistance to flue gas corrosion. They are the key carriers to ensure the efficiency of denitrification reaction.

[0003] In the field of sheet substrate thickness testing, traditional thickness measuring equipment mostly adopts contact measurement methods, which obtain thickness data by directly contacting the probe with the substrate surface. Such equipment is prone to causing wear on the substrate surface during the measurement process, which not only affects the quality of the substrate, but also leads to a decrease in measurement accuracy due to surface damage. It is especially unsuitable for brittle or easily damaged substrates.

[0004] While existing laser thickness measurement technology can achieve non-contact measurement and avoid wear problems, its structural design has the following limitations: during measurement, the substrate and the measuring instrument must be strictly fixed. When it is necessary to detect the thickness of different points on the substrate, the substrate must be repeatedly disassembled, the fixed position of the substrate must be adjusted and recalibrated. The operation is cumbersome and time-consuming, which makes it difficult to meet the requirements of efficient and automated detection and restricts the improvement of the detection efficiency of the production line.

[0005] In view of the above reasons, this utility model proposes a plate-type denitrification catalyst substrate thickness measuring device to solve the above technical problems. Utility Model Content

[0006] The purpose of this invention is to provide a plate-type denitrification catalyst substrate thickness measuring device. This device can conveniently measure the thickness of different points on the substrate without repeatedly disassembling, adjusting the fixed position of the substrate and recalibrating. It is simple and efficient to operate and improves the detection efficiency.

[0007] This utility model provides a thickness measuring device for a plate-type denitrification catalyst substrate, comprising: a base, on which a rotating rod is arranged perpendicularly; a measuring platform for placing the plate-type denitrification catalyst substrate is connected to the top of the rotating rod; a hollow measuring groove is formed on the measuring platform; a connecting rod arranged parallel to the rotating rod is provided on the outer side of the rotating rod; the outer periphery of the connecting rod is rotatably connected to the rotating rod through a connecting frame; symmetrical fixing rods are respectively vertically connected to both ends of the connecting rod; a measuring instrument is provided at the end of the fixing rod; two measuring instruments are arranged opposite each other on the upper and lower sides of the measuring platform, and the emitted laser can pass through the measuring groove.

[0008] Preferably, a rotating seat is provided in the middle of the base surface, and the bottom end of the rotating rod is rotatably connected to the rotating seat.

[0009] Preferably, the measuring platform is arranged horizontally parallel to the base, and the measuring slot is arranged symmetrically with respect to the center of the measuring platform.

[0010] Preferably, the connecting frame is U-shaped, with one end rotatably connected to the middle of the connecting rod and the other end rotatably connected to the rotating rod.

[0011] Preferably, limit rings are provided on both the upper and lower sides of the joint between the connecting frame and the connecting rod and the rotating rod, and the limit rings are integrally connected to the outer circumference of the connecting rod or the rotating rod.

[0012] Preferably, the surface of the measuring platform is provided with a detachable auxiliary support plate, and a connecting clip is connected to one side of the auxiliary support plate. The connecting clip is U-shaped and can be snapped onto the side of the measuring platform.

[0013] Preferably, the base surface is provided with a limiting mechanism to restrict the rotation of the connecting rod.

[0014] Preferably, the limiting mechanism includes a hinge frame disposed on the surface of the base and a limiting clamp rotatably connected thereto, which can limit the position of the fixing rod when the limiting clamp rotates to the vertical position.

[0015] Preferably, the limiting clamp is U-shaped and is rotatably connected to the hinge frame via a rotating shaft. When the limiting clamp rotates to the horizontal direction, the fixing rod can rotate with the connecting rod.

[0016] Preferably, a torsion spring is fitted around the outer periphery of the rotating shaft. When the torsion spring is in its natural state, the limiting clamp is located in the vertical direction. By applying a torsional force to the torsion spring, the limiting clamp can be rotated to the horizontal direction.

[0017] Compared with the prior art, the present invention has the following beneficial effects: 1. By adopting a measuring stage structure, the thickness measurement points of the substrate can be changed by rotating the measuring stage. With the measuring instruments set at the top and bottom, the thickness of the substrate can be measured at different points, which improves the measurement accuracy. It eliminates the need to repeatedly disassemble and adjust the fixed position of the substrate and recalibrate, making the operation simple and efficient and improving the inspection efficiency. 2. By setting a measuring slot on the measuring platform, the measuring instruments above and below can simultaneously emit lasers from the upper and lower sides of the substrate, thereby realizing the thickness measurement, which is convenient to use. Attached Figure Description

[0018] To more clearly illustrate the specific embodiments of this utility model or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the overall three-dimensional structure of the thickness measuring device of this utility model. Figure 1 ; Figure 2 This is an exploded structural diagram of the thickness measuring device of this utility model; Figure 3 This is a schematic diagram of the overall three-dimensional structure of the thickness measuring device of this utility model. Figure 2 ; Explanation of reference numerals in the attached figures: 1. Base; 2. Rotary seat; 3. Rotating rod; 4. Measuring platform; 5. Auxiliary support plate; 6. Connecting clamp; 7. Connecting frame; 8. Connecting rod; 9. Fixing rod; 10. Measuring instrument; 11. Measuring groove; 12. Hinge frame; 13. Limiting clamp; 14. Torsion spring; 15. Limiting ring. Detailed Implementation

[0020] The technical solution of this utility model will be clearly and completely described below with reference to the embodiments. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0021] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0022] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the stated features. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified. Furthermore, the terms "installed," "connected," and "linked" should be interpreted broadly; for example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0023] like Figure 1-3 As shown, this utility model provides a thickness measuring device for a plate-type denitrification catalyst substrate, comprising: a base 1, which is disc-shaped, and a rotating rod 3 arranged perpendicularly to the base 1. The top end of the rotating rod 3 is connected to a measuring platform 4 for placing the plate-type denitrification catalyst substrate. The measuring platform 4 can rotate in the horizontal plane relative to the base 1 with the rotating rod 3. A hollow measuring groove 11 is provided on the measuring platform 4. The measuring groove 11 is the measuring area of ​​the substrate. Therefore, before measuring the thickness, the area to be measured needs to be placed in the measuring groove 11. A connecting rod 8 is arranged parallel to the rotating rod 3 on its outer side. The outer periphery of the connecting rod 8 is rotatably connected to the rotating rod 3 through a connecting frame 7. The two ends of the connecting rod 8 are respectively vertically connected to symmetrical fixing rods 9. A measuring instrument 10 is provided at the end of the fixing rod 9. The two measuring instruments 10 are arranged opposite each other on the upper and lower sides of the measuring platform 4. The measuring instruments 10 achieve distance measurement by laser reflection, and the emitted laser can pass through the measuring groove 11. It is used to measure the thickness of the substrate on both sides of the same point by laser reflection.

[0024] Specifically, a rotating seat 2 is provided in the middle of the surface of the base 1. The rotating seat 2 has a central hole. The bottom end of the rotating rod 3 is rotatably connected to the central hole of the rotating seat 2 through rotating components such as bearings. The rotating seat 2 can improve the stability of the rotation of the rotating rod 3. The measuring platform 4 is arranged horizontally parallel to the base 1. The measuring groove 11 is arranged symmetrically with respect to the center of the measuring platform 4. The measuring groove 11 is circular in shape, and a non-hollowed-out truncated cone is provided in its center to support the substrate. The two sides of the truncated cone are connected to the inner wall of the measuring groove 11 through ribs, which not only ensures effective support for the substrate, but also allows the two measuring instruments 10 to simultaneously measure the distance from the top and bottom of the substrate, and finally obtain the substrate thickness data.

[0025] In this embodiment, the connecting frame 7 is U-shaped, with one end rotatably connected to the middle of the connecting rod 8 and the other end rotatably connected to the rotating rod 3. Limiting rings 15 are provided on both the upper and lower sides of the joint between the connecting frame 7 and the connecting rod 8 and the rotating rod 3. The limiting rings 15 are integrally connected to the outer circumference of the connecting rod 8 or the rotating rod 3, so that the vertical height of the connecting frame 7 relative to the connecting rod 8 and the rotating rod 3 remains unchanged, thereby ensuring that the measurement data of the measuring instrument 10 is accurate and stable.

[0026] In this embodiment, a detachable auxiliary support plate 5 is provided on the surface of the measuring platform 4. A connecting clip 6 is connected to one side of the auxiliary support plate 5. The connecting clip 6 is U-shaped and can be snapped onto the side of the measuring platform 4. When measuring a flat substrate, the auxiliary support plate 5 can be placed on the measuring platform 4, and the substrate can be placed on the auxiliary support plate 5. The thickness can be measured by simply activating the measuring instrument 10 located above it. The thickness data is the distance from the measuring instrument 10 to the surface of the measuring platform 4 minus the measured distance from the measuring instrument 10 to the upper surface of the substrate. This measurement method is simple and efficient.

[0027] In this embodiment, a limiting mechanism is provided on the surface of the base 1 to restrict the rotation of the connecting rod 8. The limiting mechanism includes a hinge frame 12 disposed on the surface of the base 1 and a limiting clamp 13 rotatably connected thereto. When the limiting clamp 13 rotates to the vertical position, it can clamp and limit the position of the fixed rod 9. The limiting clamp 13 is U-shaped and is rotatably connected to the hinge frame 12 via a rotating shaft. When the limiting clamp 13 rotates to the horizontal position, the fixed rod 9 can rotate with the connecting rod 8.

[0028] Furthermore, a torsion spring 14 is fitted around the outer circumference of the rotating shaft. When the torsion spring 14 is in its natural state, the limiting clamp 13 is in the vertical direction. By applying further torsional force to the torsion spring 14, the limiting clamp 13 can be rotated to the horizontal direction. At this time, the position of the measuring instrument 10 can be adjusted by rotating the connecting rod 8. During measurement, the limiting clamp 13 needs to hold the lower fixing rod 9 to ensure that the position of the measuring instrument 10 will not move when the measuring table 4 rotates, thus improving the stability of the measurement.

[0029] The usage procedure of this utility model device is as follows: When it is necessary to measure the thickness of the substrate of the plate-type denitrification catalyst, the substrate can be placed on the measuring stage 4, and the lower fixing rod 9 can be clamped by the limiting clamp 13 to ensure the structure of the measuring instrument 10 is fixed. Then, the upper and lower measuring instruments 10 are started at the same time, ensuring that the measuring instruments 10 are set to the measuring groove 11. At this time, the thickness data of the substrate at this point can be measured. The thickness data of this point is the distance between the ends of the two measuring instruments 10 minus the distance to the upper surface of the substrate measured by the upper measuring instrument 10 and the distance to the lower surface of the substrate measured by the lower measuring instrument 10. When it is necessary to measure multiple thickness data, the measuring stage 4 can be rotated to change the measuring point. During the measurement, it is necessary to ensure that the laser emitted by the lower measuring instrument 10 does not shine on the measuring stage 4. After multiple measurements, the average value is taken as the thickness data of the substrate. This measurement procedure is suitable for the thickness measurement of flat and uneven substrates. Uneven substrates refer to substrates with uneven surfaces.

[0030] This thickness measuring device enables selective measurement of substrates with different structures, improving the diversity of thickness measurement while ensuring measurement accuracy.

[0031] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this utility model.

Claims

1. A plate-type denitrification catalyst substrate thickness measuring device, characterized in that, include: A base (1) is provided with a rotating rod (3) arranged perpendicularly to it. The top of the rotating rod (3) is connected to a measuring platform (4) for placing a plate-type denitrification catalyst substrate. The measuring platform (4) has a hollow measuring groove (11). A connecting rod (8) is arranged parallel to the rotating rod (3) on its outer side. The outer periphery of the connecting rod (8) is rotatably connected to the rotating rod (3) through a connecting frame (7). The two ends of the connecting rod (8) are respectively vertically connected to symmetrical fixing rods (9). A measuring instrument (10) is provided at the end of the fixing rod (9). The two measuring instruments (10) are arranged opposite each other on the upper and lower sides of the measuring platform (4), and the emitted laser can pass through the measuring groove (11).

2. The plate-type denitrification catalyst substrate thickness measuring device according to claim 1, characterized in that, A rotating seat (2) is provided in the middle of the surface of the base (1), and the bottom end of the rotating rod (3) is rotatably connected to the rotating seat (2).

3. The plate-type denitrification catalyst substrate thickness measuring device according to claim 1, characterized in that, The measuring platform (4) is arranged horizontally parallel to the base (1), and the measuring groove (11) is arranged symmetrically with respect to the center of the measuring platform (4).

4. The plate-type denitrification catalyst substrate thickness measuring device according to claim 1, characterized in that, The connecting frame (7) is U-shaped, with one end rotatably connected to the middle of the connecting rod (8) and the other end rotatably connected to the rotating rod (3).

5. The plate-type denitrification catalyst substrate thickness measuring device according to claim 4, characterized in that, Limiting rings (15) are provided on both the upper and lower sides of the joint rotation point of the connecting frame (7), the connecting rod (8), and the rotating rod (3). The limiting rings (15) are integrally connected to the outer circumference of the connecting rod (8) or the rotating rod (3).

6. The plate-type denitrification catalyst substrate thickness measuring device according to claim 1, characterized in that, The measuring platform (4) is provided with a detachable auxiliary support plate (5). A connecting clip (6) is connected to one side of the auxiliary support plate (5). The connecting clip (6) is U-shaped and can be snapped onto the side of the measuring platform (4).

7. The plate-type denitrification catalyst substrate thickness measuring device according to claim 1, characterized in that, The base (1) surface is provided with a limiting mechanism to restrict the rotation of the connecting rod (8).

8. The plate-type denitrification catalyst substrate thickness measuring device according to claim 7, characterized in that, The limiting mechanism includes a hinge frame (12) disposed on the surface of the base (1) and a limiting clamp (13) rotatably connected thereto. When the limiting clamp (13) rotates to the vertical position, it can limit the position of the fixing rod (9).

9. The plate-type denitrification catalyst substrate thickness measuring device according to claim 8, characterized in that, The limiting clamp (13) is U-shaped and is rotatably connected to the hinge frame (12) via a rotating shaft. When the limiting clamp (13) rotates to the horizontal direction, the fixing rod (9) can rotate with the connecting rod (8).

10. The plate-type denitrification catalyst substrate thickness measuring device according to claim 9, characterized in that, The outer circumference of the rotating shaft is fitted with a torsion spring (14). When the torsion spring (14) is in its natural state, the limiting clamp (13) is located in the vertical direction. By applying a torsional force to the torsion spring (14), the limiting clamp (13) can be rotated to the horizontal direction.