Clamping fixture for testing photoelectric characteristics of optical devices

Abstract

The utility model is suitable for photoelectric characteristic test technical field of optical device, provides a kind of optical device photoelectric characteristic test's clamping fixture, it include: test unit, short pipe seat subassembly, long pipe seat subassembly, pipe seat unit and laser instrument;In the utility model, reliable electrical connection and high-precision positioning between laser instrument pin and circuit board are realized, claw spring structure provides stable clamping force in the process of plugging, effectively prevent pin shaking or contact bad, to ensure the accuracy of photoelectric signal acquisition, simultaneously, the guide along of short pipe seat and long pipe seat, boss and recess design can be quickly switched between different specifications optical device, without additional adjustment, greatly improve test efficiency, reduce the operation complexity and repetitive workload, overall structure is stable, can withstand frequent plugging, prolong the service life of device, satisfy the test demand of high reliability in production or experimental environment.

Description

Technical Field

[0001] This utility model belongs to the field of optoelectronic characteristic testing technology of optical devices, and particularly relates to a clamping fixture for testing the optoelectronic characteristics of optical devices. Background Technology

[0002] With the rapid development of information technology, the demand for optical devices used for information transmission has surged. At the same time, the production process of optical devices is complex. Among the complex production processes, the testing of the photoelectric characteristics of optical devices during the production process is an essential step.

[0003] However, some problems still exist in the above solutions:

[0004] 1. With the widespread application of optoelectronic devices in communication, sensing and laser applications, higher precision and efficiency requirements have been placed on the testing of optoelectronic characteristics of optical devices. Traditional testing methods often rely on manual fixtures or general test sockets, which usually suffer from problems such as inaccurate positioning of optical devices, easy loosening of pins and poor test repeatability. These defects not only affect the accuracy of test results, but also increase the labor intensity of operators and limit the realization of batch and rapid testing of optical devices. In particular, for optical devices of different specifications and sizes, traditional devices require frequent adjustment of fixtures or replacement of bases, resulting in low testing efficiency and failing to meet the needs of rapid production and quality inspection of modern optoelectronic products.

[0005] 2. In addition, the existing optical device testing equipment is not reasonably designed in terms of electrical connection and guidance. The contact between the pins and the test board often relies on simple springs or pins, lacking effective guidance and stable clamping structure, which can easily cause poor contact or signal interference, affecting the reliability of test results. The design of guide holes and mounting holes is not uniform, and the fitting accuracy between short tube sockets and long tube sockets is insufficient, which causes the device to loosen or be damaged during repeated insertion and removal. Utility Model Content

[0006] This invention provides a clamping fixture for testing the photoelectric characteristics of optical devices, aiming to solve the problems mentioned in the background art.

[0007] This utility model is implemented as follows: a clamping fixture for testing the photoelectric characteristics of optical devices includes: a test unit, a short tube socket assembly, a long tube socket assembly, a tube socket unit, and a laser.

[0008] The test unit is used to test the photoelectric properties of the laser;

[0009] The socket unit is used to realize the electrical connection between the laser and the test unit, and can be repeatedly plugged in and out to ensure rapid switching and efficient testing of optical devices of different specifications.

[0010] Preferably, the test unit includes a circuit board and a test base, and the circuit board and the test base are fixed together by screws to achieve stable installation;

[0011] The test base is provided with a test base positioning hole and a threaded hole for fixing with the components of the tube base unit.

[0012] Preferably, the socket unit includes a short socket assembly and a long socket assembly, which can be plugged into each other to achieve a reliable electrical connection between the laser pins and the circuit board and to ensure positioning accuracy.

[0013] Preferably, the short tube socket assembly includes a short tube socket body, a claw spring, and a pin body;

[0014] The claw spring is installed in the pin hole of the pin body by interference fit and is fixed to the short tube seat body by glue;

[0015] The claw spring includes a claw ring and a claw flap. The claw flap has an elastic inverted conical structure to provide a stable clamping force when inserting the pin.

[0016] The pin body has a pin end face and a pin core tube end, and the pin core tube is used to make electrical connection with the circuit board.

[0017] The short tube seat body is provided with a short tube seat mounting hole, a short tube seat top surface, a short tube seat insertion guide hole, a short tube seat upper guide edge, a short tube seat lower guide edge, a short tube seat boss bottom surface, and a short tube seat boss outer wall, which are used to guide the insertion of the long tube seat assembly and achieve stable positioning.

[0018] Preferably, the long tube socket assembly includes a long tube socket body, a claw spring, and a contact pin;

[0019] The claw spring is installed in the contact pin hole of the contact pin by interference fit and is fixed to the long tube seat body by glue;

[0020] The contact pin has a contact pin end face, a contact pin hole bottom face, and a contact pin core tube, which are used to contact the laser pin and conduct current.

[0021] The long tube base body has a long tube base sidewall, a long tube base side surface, a first long tube base guide edge, a second long tube base guide edge, a long tube base groove inner wall, a long tube base bottom surface, a long tube base guide inner cavity upper surface, a long tube base mounting hole, and a long tube base top surface, which are used to guide the contact pin and fix the laser base.

[0022] Preferably, the pin body of the short tube socket assembly is electrically connected to the circuit board by soldering.

[0023] Preferably, the contact pins of the long tube socket assembly correspond to the laser pins, which are inserted through the guide holes of the long tube socket and contact the claw flaps of the claw spring.

[0024] Preferably, the long tube socket assembly is inserted into the short tube socket guide hole of the short tube socket assembly, and the contact pin core tube contacts the claw flap of the short tube socket assembly.

[0025] Preferably, the long tube seat body of the long tube seat assembly cooperates with the upper guide edge, lower guide edge, and outer wall of the short tube seat boss of the short tube seat assembly, and is stably positioned by being guided by the first guide edge and the second guide edge of the long tube seat.

[0026] Preferably, a screw is installed in the threaded hole of the test base to tighten the long tube base body. Compared with related technologies, the clamping fixture for testing the photoelectric characteristics of optical devices provided by this utility model has the following advantages:

[0027] 1. In this utility model, reliable electrical connection and high-precision positioning between laser pins and circuit boards are achieved. The claw spring structure provides stable clamping force during insertion and removal, effectively preventing pin shaking or poor contact, thereby ensuring the accuracy of photoelectric signal acquisition. At the same time, the guide edge, boss and groove design of short and long tube sockets can quickly switch between different specifications of optical devices without additional adjustment, which greatly improves testing efficiency, reduces operation complexity and repetitive workload. The overall structure is stable and can withstand frequent insertion and removal, extending the service life of the device and meeting the high reliability testing requirements in production or experimental environments.

[0028] 2. In this utility model, stable support for optical devices is achieved during the testing process, effectively reducing measurement errors caused by vibration or positional displacement. The device is easy to operate, and optical devices can be quickly disassembled and replaced, facilitating continuous testing of various models. At the same time, the electrical connection between the pin body and the contact pin ensures the stability of signal transmission, enabling high-precision acquisition of photoelectric characteristic parameters and providing reliable data support for optical device quality evaluation and performance analysis. This design not only improves the repeatability and reliability of the test, but also enhances the applicability and versatility of the device, and has significant practical value. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of the structure of this utility model;

[0030] Figure 2 This is a schematic diagram of the structure of the test unit part of this utility model;

[0031] Figure 3 This is a schematic diagram of the laser part of this utility model;

[0032] Figure 4 This is a schematic diagram of the short tube seat assembly of this utility model;

[0033] Figure 5 This is a partial structural diagram of the short tube seat assembly of this utility model;

[0034] Figure 6 This is a partial structural diagram of the long tube seat assembly of this utility model;

[0035] Figure 7 This is a schematic diagram of the top surface of the long tube seat of this utility model.

[0036] In the diagram: 100, Test unit; 200, Tube seat unit; 300, Laser; 101, Circuit board; 102, Test base; 103, Base positioning hole; 104, Threaded hole; 111, Short tube seat body; 112, Claw spring; 113, Pin body; 114, Pin hole; 115, Pin end face; 116, Claw ring; 117, Claw flap; 118, Pin end; 119, Pin core tube; 120, Short tube seat insertion hole; 121, Short tube seat top surface; 122, Short tube seat guide hole; 123, Short tube seat upper guide edge; 124, Short tube seat boss bottom surface; 125, Short tube seat lower guide edge; 128, Short tube seat. 210. Outer wall of the boss; 250. Short tube seat assembly; 251. Long tube seat assembly; 252. Long tube seat body; 253. Contact needle body; 254. Contact needle end face; 255. Connecting needle body hole; 256. Bottom surface of the needle hole; 257. Guide hole of the long tube seat; 258. First guide edge of the long tube seat; 259. Side wall of the long tube seat; 260. Mounting hole of the long tube seat; 261. Top surface of the long tube seat; 262. Guide edge of the second long tube seat; 263. Inner wall of the groove of the long tube seat; 264. Bottom surface of the long tube seat; 265. Upper surface of the guide cavity of the long tube seat; 266. Contact needle core tube; 301. Tube foot; 302. Mounting base. Detailed Implementation

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having," and any variations thereof, in the specification, claims, and foregoing drawings of this application are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the specification, claims, or foregoing drawings of this application are used to distinguish different objects, not to describe a particular order.

[0038] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0039] Example 1

[0040] A preferred embodiment of the clamping fixture for testing the photoelectric characteristics of optical devices provided by this utility model is, for example... Figures 1 to 7 As shown: A clamping fixture for testing the photoelectric characteristics of optical devices includes: a test unit 100, a short tube socket assembly 210, a long tube socket assembly 250, a tube socket unit 200, and a laser 300;

[0041] The test unit 100 is used to test the photoelectric characteristics of the laser 300;

[0042] The socket unit 200 is used to realize the electrical connection between the laser 300 and the test unit 100, and can be repeatedly plugged in and out to ensure rapid switching and efficient testing of optical devices of different specifications.

[0043] In a further preferred embodiment of the present invention, the test unit 100 includes a circuit board 101 and a test base 102. The circuit board 101 and the test base 102 are fixedly connected by screws to achieve stable installation.

[0044] The test base 102 is provided with a test base positioning hole and a threaded hole 104 for fixing with the components of the tube base unit 200.

[0045] Preferably, the socket unit 200 includes a short socket assembly 210 and a long socket assembly 250, which can be plugged into each other to achieve a reliable electrical connection between the laser 300 pin 301 and the circuit board 101 and to ensure positioning accuracy.

[0046] In this embodiment, the socket unit 200 realizes the electrical connection between the laser 300 and the test unit 100 and enables quick plugging and unplugging to adapt to the efficient testing of optical devices of different specifications, while improving the work efficiency of operators and reducing the test error rate.

[0047] In a further preferred embodiment of the present invention, the short tube seat assembly 210 includes a short tube seat body 111, a claw spring, and a pin body;

[0048] The claw spring is installed in the pin hole of the pin body by interference fit and is fixed to the short tube seat body 111 by glue;

[0049] The claw spring includes a claw ring 116 and a claw flap 117. The claw flap 117 is an elastic inverted conical structure used to provide a stable clamping force when the pin 301 is inserted.

[0050] The pin body has a pin end face 115 and a pin core tube 119 end, and the pin core tube 119 is used to make an electrical connection with the circuit board 101.

[0051] The short tube seat body 111 is provided with a short tube seat mounting hole, a short tube seat top surface 121, a short tube seat insertion guide hole 122, a short tube seat upper guide edge 123, a short tube seat lower guide edge 125, a short tube seat boss bottom surface 124, and a short tube seat boss outer wall 128, which are used to guide the insertion of the long tube seat assembly 250 and achieve stable positioning.

[0052] In this embodiment, the socket unit 200 includes a short socket assembly 210 and a long socket assembly 250, which can be plugged into each other to achieve a reliable electrical connection between the laser 300 pin 301 and the circuit board 101 and ensure positioning accuracy. The design structure is reasonable and can adapt to the rapid switching of optical devices of different specifications, ensuring that the test device maintains high stability and high repeatability during repeated operations, while extending the service life of the device.

[0053] In a further preferred embodiment of the present invention, the long tube seat assembly 250 includes a long tube seat body 251, a claw spring, and a contact pin;

[0054] The claw spring is installed in the contact pin hole of the contact pin by interference fit and is fixed to the long tube seat body 251 by glue;

[0055] The contact pin has a contact pin end face 115, a contact pin hole bottom face 255 and a contact pin core tube 119, which are used to contact the laser pin 301 and conduct current.

[0056] The long tube base body 251 is provided with a long tube base side wall 258, a long tube base side surface 259, a first long tube base guide edge 257, a second long tube base guide edge 262, a long tube base groove inner wall 263, a long tube base bottom surface 264, a long tube base guide inner cavity upper surface 265, a long tube base mounting hole 260, and a long tube base top surface 261, which are used to guide the contact pin and fix the laser 300 base.

[0057] In this embodiment, the short tube socket assembly 210 includes a short tube socket body 111, a claw spring, and a pin body. The claw spring is installed in the pin hole of the pin body by interference fit and is fixed to the short tube socket body 111 by glue. The claw spring includes a claw ring 116 and a claw flap 117. The claw flap 117 is an elastic inverted conical structure that provides a stable clamping force when the pin 301 is inserted. The pin body is provided with a pin end face 115 and a pin core tube 119 end for electrical connection with the circuit board 101. The short tube socket body 111 is provided with a short tube socket mounting hole, a short tube socket top surface 121, a short tube socket insertion guide hole 122, a short tube socket upper guide edge 123, a short tube socket lower guide edge 125, a short tube socket boss bottom surface 124, and a short tube socket boss outer wall 128 for guiding the insertion of the long tube socket assembly 250 and achieving stable positioning.

[0058] In a further preferred embodiment of the present invention, the pin body of the short tube socket assembly 210 is electrically connected to the circuit board 101 by soldering.

[0059] In this embodiment, the pin body of the short tube socket assembly 210 is electrically connected to the circuit board 101 by soldering to ensure the stability of electrical signal transmission, reduce contact resistance, and improve test accuracy to ensure the reliability and repeatability of each test result.

[0060] In a further preferred embodiment of the present invention, the contact pin of the long tube seat assembly 250 corresponds to the pin 301 of the laser 300. The pin 301 is inserted through the guide hole 256 of the long tube seat and contacts the claw flap 117 of the claw spring.

[0061] In this embodiment, the contact pin of the long tube socket assembly 250 corresponds to the pin 301 of the laser 300. The pin 301 is inserted through the guide hole 256 of the long tube socket and contacts the claw flap 117 of the claw spring, ensuring that a stable and reliable electrical connection structure is formed between the pin 301 of the laser 300 and the contact pin, while maintaining high contact accuracy and low impedance, thereby improving the accuracy of test data.

[0062] Example 2

[0063] Based on Example 1, a preferred embodiment of the clamping fixture for testing the photoelectric characteristics of optical devices provided by this utility model is as follows: Figures 3 to 6 As shown: the long tube socket assembly 250 is inserted into the short tube socket guide hole 122 of the short tube socket assembly 210, and the contact pin core tube 119 contacts the claw flap 117 of the short tube socket assembly 210.

[0064] In this embodiment, the long tube socket assembly 250 is inserted into the short tube socket guide hole 122 of the short tube socket assembly 210, and the contact pin core tube 119 contacts the claw flap 117 of the short tube socket assembly 210, thereby ensuring the stability and accuracy of the electrical connection between the contact pin and the pin body, reducing possible deviations during insertion and removal, and improving the overall reliability of the device.

[0065] In a further preferred embodiment of the present invention, the long tube seat body 251 of the long tube seat assembly 250 cooperates with the short tube seat upper guide edge 123, the short tube seat lower guide edge 125 and the short tube seat boss outer wall 128 of the short tube seat assembly 210, and achieves stable positioning by being guided by the first long tube seat guide edge 257 and the second long tube seat guide edge 262.

[0066] In this embodiment, the long tube seat body 251 of the long tube seat assembly 250 cooperates with the short tube seat upper guide edge 123, the short tube seat lower guide edge 125, and the short tube seat boss outer wall 128 of the short tube seat assembly 210. Stable positioning is achieved by the guidance of the first long tube seat guide edge 257 and the second long tube seat guide edge 262, ensuring that the long tube seat is accurately positioned and does not shift after being inserted into the short tube seat, thereby improving the reliability of the testing device in repeated operations.

[0067] In a further preferred embodiment of this utility model, a screw is provided in the threaded hole 104 of the test base 102 for tightening the long tube seat body 251.

[0068] In this embodiment, a screw is provided in the threaded hole 104 of the test base 102 to tighten the long tube base body 251, ensuring that the long tube base assembly 250 will not loosen or shift after installation, while improving the stability and durability of the fixture during long-term use, making the optical device testing process safer and more efficient.

[0069] In summary, the optical device photoelectric characteristic testing fixture of the present invention mainly includes a testing unit 100, a tube socket unit 200, and a laser 300. Its core function is to achieve high-precision measurement of the photoelectric characteristics of the optical device through the synergistic effect of each component. The testing unit 100 consists of a circuit board 101 and a testing base 102. The circuit board 101 serves as the core for signal reception and measurement and is fixedly mounted on the testing base 102 for stable support. The testing base 102 is provided with positioning holes and threaded holes 104 for precise alignment and fixation with the components of the tube socket unit 200, thereby ensuring that the optical device maintains a stable position during the test. The tube socket unit 200 consists of a short tube socket assembly 210 and a long tube socket assembly 250, which are connected by a single thread. A reliable electrical connection is formed between the laser 300 pin 301 and the circuit board 101 through a plug-in mating process. The short tube socket assembly 210 consists of a short tube socket body 111, a claw spring, and a pin body. The claw spring is installed in the pin hole of the pin body and is fixed to the short tube socket body 111 with glue. The claw flap 117 of the claw spring has an elastic inverted conical structure, which provides a stable clamping force when the pin 301 is inserted, ensuring precise contact between the short tube socket assembly 210 and the pin 301. The pin body has a pin end face 115 and a pin core tube 119 end, which can achieve a reliable electrical connection with the circuit board 101. The short tube socket body 111 guides the long tube through the mounting hole, top surface, insertion guide hole, upper guide edge, lower guide edge, bottom surface of the boss, and outer wall of the boss. The insertion of the base assembly 250 achieves positioning and stable support. The long tube base assembly 250 consists of a long tube base body 251, a claw spring, and a contact pin. The claw spring is installed in the contact pin hole of the contact pin and is fixed to the long tube base body 251 with glue. The end face of the contact pin, the bottom surface 255 of the pin hole, and the core tube contact the pin 301 of the laser 300 and conduct current, ensuring smooth transmission of photoelectric signals. The long tube base body 251 guides the contact pin through its side wall, side surface, first guide edge, second guide edge, inner wall of the groove, bottom surface, upper surface of the guide cavity, mounting hole, and top surface, while fixing the laser 300 base to ensure the stability of the optical device during testing. During operation, the pin 301 of the laser 300 is connected through the long tube base 251. The guide hole 256 of the tube socket enters the pin structure of the long tube socket assembly 250 and the short tube socket assembly 210 to form a complete circuit and realize the acquisition of photoelectric signals. The guide edge, boss and groove structure between the short tube socket assembly 210 and the long tube socket assembly 250 ensures the positioning accuracy during repeated insertion and removal. The elastic structure of the claw spring ensures the reliable clamping of the pin 301 during insertion and removal. The entire device is fixed with screws through the threaded hole 104 of the test base 102, which enhances the overall stability and keeps the optical device in a fixed state during the test, thereby ensuring the accuracy and repeatability of photoelectric parameter measurement. The present invention has a reasonable structure, is easy to operate, and can be quickly adapted to optical devices of different specifications to achieve efficient and accurate photoelectric characteristic testing.

[0070] It is worth noting that the circuits, electronic components, and modules involved in this utility model are all existing technologies, which can be fully implemented by those skilled in the art, and need not be elaborated upon. The content protected by this utility model does not involve any improvement to the software and methods.

[0071] It should be understood that the disclosed apparatus can be implemented in other ways, given the several embodiments provided in this application. For example, the apparatus embodiments described above are merely illustrative; the division of units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or communication connections shown or discussed may be through some interfaces; the indirect coupling or communication connections between devices or units may be telecommunications or other forms.

[0072] The above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit the scope of protection of this utility model. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on these embodiments, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model. Although this utility model has been described in detail with reference to the above embodiments, those skilled in the art can still combine, add, delete, or otherwise adjust the features of the various embodiments of this utility model according to the circumstances without conflict or creative effort, thereby obtaining different technical solutions that do not fundamentally depart from the concept of this utility model. These technical solutions are also within the scope of protection of this utility model.

Claims

1. A clamping fixture for testing the photoelectric characteristics of optical devices, characterized in that, include: Test unit (100), short tube socket assembly (210), long tube socket assembly (250), tube socket unit (200) and laser (300); The test unit (100) is used to test the photoelectric properties of the laser (300); The socket unit (200) is used to realize the electrical connection between the laser (300) and the test unit (100) and can be repeatedly plugged in and out to ensure rapid switching and efficient testing of optical devices of different specifications.

2. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, The test unit (100) includes a circuit board (101) and a test base (102). The circuit board (101) and the test base (102) are fixed together by screws to achieve stable installation. The test base (102) is provided with a test base positioning hole (103) and a threaded hole (104) for fixing in conjunction with the components of the tube base unit (200).

3. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 2, characterized in that, The socket unit (200) includes a short socket assembly (210) and a long socket assembly (250), which can be plugged into each other to achieve a reliable electrical connection between the laser (300) pin (301) and the circuit board (101) and ensure positioning accuracy.

4. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, The short tube socket assembly (210) includes a short tube socket body (111), a claw spring (112), and a pin body (113); The claw spring (112) is installed in the pin hole (114) of the pin body (113) by interference fit and is fixed to the short tube seat body (111) by glue; The claw spring (112) includes a claw ring (116) and a claw flap (117), the claw flap (117) being an elastic inverted conical structure used to provide a stable clamping force when the pin (301) is inserted; The pin body (113) is provided with a pin end face (115) and a pin core tube end (118), and the pin core tube (119) is used to make an electrical connection with the circuit board (101); The short tube seat body (111) is provided with a short tube seat mounting hole (120), a short tube seat top surface (121), a short tube seat insertion guide hole (122), a short tube seat upper guide edge (123), a short tube seat lower guide edge (125), a short tube seat boss bottom surface (124), and a short tube seat boss outer wall (128), which are used to guide the insertion of the long tube seat assembly (250) and achieve stable positioning.

5. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, The long tube socket assembly (250) includes a long tube socket body (251), a claw spring (112), and a contact pin (252); The claw spring (112) is installed in the contact pin hole (254) of the contact pin (252) by interference fit, and is fixed to the long tube seat body (251) by glue; The contact pin (252) is provided with a contact pin end face (253), a contact pin hole bottom face (255) and a contact pin core tube (266) for contacting the laser (300) pin (301) and conducting current; The long tube base body (251) is provided with a long tube base side wall (258), a long tube base side surface (259), a first long tube base guide edge (257), a second long tube base guide edge (262), a long tube base groove inner wall (263), a long tube base bottom surface (264), a long tube base guide inner cavity upper surface (265), a long tube base mounting hole (260), and a long tube base top surface (261), which are used to guide the contact pin (252) and fix the laser base (302).

6. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, The pin body (113) of the short tube socket assembly (210) is electrically connected to the circuit board (101) by soldering.

7. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, The contact pin (252) of the long tube socket assembly (250) corresponds to the pin (301) of the laser (300). The pin (301) is inserted through the guide hole (256) of the long tube socket and contacts the claw flap (117) of the claw spring (112).

8. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 5, characterized in that, The long tube socket assembly (250) is inserted into the short tube socket guide hole (122) of the short tube socket assembly (210), and the contact pin core tube (266) contacts the claw flap (117) of the short tube socket assembly (210).

9. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, The long tube seat body (251) of the long tube seat assembly (250) cooperates with the short tube seat upper guide edge (123), short tube seat lower guide edge (125) and short tube seat boss outer wall (128) of the short tube seat assembly (210), and achieves stable positioning by being guided by the first long tube seat guide edge (257) and the second long tube seat guide edge (262).

10. The clamping fixture for testing the photoelectric characteristics of optical devices as described in claim 1, characterized in that, A screw is installed in the threaded hole (104) of the test base (102) to tighten the long tube seat body (251).

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