A solid sample holder for a terahertz time-domain spectrometer

Abstract

The utility model relates to solid sample test stand technical field discloses a solid sample test stand of terahertz time -domain spectrometer, the utility model includes a hard shell that is equipped with spectrometer emission module, still is equipped with signal line plug for the spectrometer emission module matching on the hard shell, the opposite side of spectrometer emission module is equipped with spectrometer receiving module in the hard shell, still is equipped with test stand vertical adjusting part and test stand horizontal adjusting part on the hard shell, wherein the test stand vertical adjusting part includes a support platform for placing sample, the support platform slides and adjusts height, test stand horizontal adjusting part horizontal adjustment left and right interval. The utility model through test stand vertical adjusting part and test stand horizontal adjusting part carry out accurate position adjustment to sample in horizontal position and vertical position, make spectrometer emission module can carry out detection to the different parts of sample.

Description

Technical Field

[0001] This utility model relates to the field of solid sample testing rack technology, and in particular to a solid sample testing rack for a terahertz time-domain spectrometer. Background Technology

[0002] The existing patent publication number (CN214585016U) discloses a sample holder for energy-dispersive X-ray fluorescence spectrometry. The proposed solution includes a base with a first connecting plate and a second connecting plate fixedly connected to its top. A mounting plate is slidably connected to one side of the second connecting plate. A second mounting cavity is formed inside the mounting plate, and two clamping plates are rotatably connected to the inner wall of the second mounting cavity. An opening is provided on one side of the mounting plate, communicating with the second mounting cavity. This invention has a simple structure. Pushing the pull rod clamps the object being tested. Pushing the rod not only adjusts the height of the mounting plate but also ensures a tighter fit between the tested object and the light source, solving the problem of difficulty in clamping small tested objects in existing technologies. It is simple to operate and improves practicality.

[0003] However, the test position of this patent (CN214585016U) is not easy to adjust, and it cannot perform multi-part adjustment tests on the sample. Utility Model Content

[0004] This utility model provides a solution to the technical problems mentioned in the background art.

[0005] A solid sample test fixture for a terahertz time-domain spectrometer includes a rigid housing with a spectrometer emission module. The rigid housing is also equipped with a signal line plug for the spectrometer emission module. A spectrometer receiving module is located inside the rigid housing on the opposite side of the spectrometer emission module. The rigid outer shell is also provided with a vertical adjustment part and a horizontal adjustment part for the test frame. The vertical adjustment part includes a support platform for placing the sample. The support platform can be adjusted up and down to adjust the height. The horizontal adjustment part adjusts the horizontal spacing. The sample placed on the support platform is in the light path emitted by the spectrometer emission module.

[0006] Preferably, the horizontal adjustment part of the test frame includes a bottom slide, a horizontal slide rail, a second control rod, a second handwheel, and a second nut sleeve. The second handwheel is fixed to the shaft end of the second control rod, and the second control rod is provided with a coarse thread. The second nut sleeve is fixed to the bottom slide, and the coarse thread and the second nut sleeve are threadedly connected. The bottom slide is slidably engaged with the horizontal slide rail. Specifically, when the second handwheel is rotated, the coarse thread and the second nut sleeve generate a helical pair rotation, driving the bottom slide to move horizontally along the horizontal slide rail.

[0007] Preferably, the vertical adjustment part of the test frame includes a handwheel, a control lever, a vertical adjustment stroke frame, a vertical guide rail, a support plate, and a nut sleeve. Two vertical guide rails are provided and symmetrically fixed to the inner wall of the vertical adjustment stroke frame. The support plate slides vertically with the vertical guide rails. The nut sleeve is fixed to the support plate. The control lever has a fine thread, which is threadedly connected to the nut sleeve. Specifically, rotating the handwheel causes the fine thread and the nut sleeve to engage in a helical pair, allowing the support plate to move upwards or downwards along the vertical guide rail.

[0008] Preferably, the upper limit position of the support plate is located above the spectrometer emission module.

[0009] Preferably, the lower limit position of the support plate is located below the spectrometer emission module.

[0010] Preferably, the coarse thread and the fine thread are coated with grease.

[0011] The advantages and positive effects of this utility model are: The vertical adjustment section 13 and the horizontal adjustment section 14 of the test frame allow for precise position adjustment of the sample in both horizontal and vertical positions, enabling the spectrometer emission module 11 to detect different parts of the sample. This provides a test frame that is easy to adjust and has high precision.

[0012] The fine thread provides a high degree of tightness, which improves the accuracy of this device when adjusting its position. Attached Figure Description

[0013] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0014] Figure 1 This is a three-dimensional structural schematic diagram of the present invention; Figure 2 This is a schematic diagram of the main structure of this utility model; Figure 3 This is a top view of the structure of this utility model; Figure 4yes Figure 1 Enlarged structural diagram at point A in the middle.

[0015] The attached diagram shows the following markings: 10. Rigid outer shell; 11. Spectrometer emission module; 12. Signal cable plug; 13. Vertical adjustment part of the test frame; 14. Horizontal adjustment part of the test frame; 15. Handwheel 1; 16. Control lever 1; 17. Fine thread; 18. Vertical adjustment travel frame; 19. Vertical guide rail; 20. Support plate; 21. Nut sleeve 1; 22. Horizontal slide rail; 23. Control lever 2; 24. Coarse thread; 25. Handwheel 2; 26. Bottom slide; 27. Nut sleeve 2. Detailed Implementation

[0016] The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, illustrating only the basic structure of the present invention, and therefore only show the components relevant to the present invention.

[0017] If the embodiments of this application contain terms relating to directional indications or positional relationships (such as up, down, left, right, front, back, inside, outside, top, bottom, center, vertical, horizontal, longitudinal, transverse, length, width, counterclockwise, clockwise, axial, radial, circumferential, etc.), such terms are only used to explain the relative positional relationships and movement of the components in a specific posture (as shown in the accompanying drawings); if the specific posture changes, the directional indications or positional relationships will also change accordingly. Furthermore, the terms "first" and "second" used in the embodiments of this application are only for descriptive convenience and should not be construed as indicating or implying relative importance. The embodiments of this utility model will be further described in detail below with reference to the accompanying drawings: like Figure 1-4 As shown, the solid sample test rack of the terahertz time-domain spectrometer of this utility model includes a rigid shell 10 with a spectrometer emission module 11. The rigid shell 10 is also equipped with a signal line plug 12 for the spectrometer emission module 11. The spectrometer receiving module is located on the opposite side of the spectrometer emission module 11 inside the rigid shell 10. The rigid outer shell 10 is also provided with a test rack vertical adjustment part 13 and a test rack horizontal adjustment part 14. The test rack vertical adjustment part 13 includes a support platform for placing the sample. The support platform slides up and down to adjust the height. The test rack horizontal adjustment part 14 adjusts the horizontal spacing. The sample placed on the support platform is in the light path emitted by the spectrometer emission module 11.

[0018] Preferably, the test frame horizontal adjustment part 14 includes a bottom slide 26, a horizontal slide rail 22, a second control lever 23, a second handwheel 25, and a second nut sleeve 27. The second handwheel 25 is fixed to the shaft end of the second control lever 23. The second control lever 23 is provided with a coarse thread 24. The second nut sleeve 27 is fixed to the bottom slide 26, and the coarse thread 24 and the second nut sleeve 27 are threadedly connected. The bottom slide 26 is slidably engaged with the horizontal slide rail 22. Specifically, when the second handwheel 25 is rotated, the coarse thread 24 and the second nut sleeve 27 generate a helical pair rotation, driving the bottom slide 26 to move horizontally along the horizontal slide rail 22.

[0019] Preferably, the vertical adjustment part 13 of the test frame includes a handwheel 15, a control lever 16, a vertical adjustment stroke frame 18, a vertical guide rail 19, a support plate 20, and a nut sleeve 21. Two vertical guide rails 19 are provided and symmetrically fixed to the inner wall of the vertical adjustment stroke frame 18. The support plate 20 slides vertically with the vertical guide rails 19. The nut sleeve 21 is fixed on the support plate 20. The control lever 16 has a fine thread 17, which is threadedly connected to the nut sleeve 21. Specifically, rotating the handwheel 15 causes the fine thread 17 and the nut sleeve 21 to engage in a helical pair, allowing the support plate 20 to move upwards or downwards along the vertical guide rail 19. The high tightness of the fine thread engagement improves the accuracy of the device when adjusting its position.

[0020] Preferably, the upper limit position of the support plate 20 is located above the spectrometer emission module 11.

[0021] Preferably, the lower limit position of the support plate 20 is located below the spectrometer emission module 11.

[0022] Preferably, the coarse thread 24 and the fine thread 17 are coated with grease.

[0023] It should be emphasized that the embodiments described in this utility model are illustrative rather than limiting. Therefore, this utility model is not limited to the embodiments described in the specific implementation. Any other implementation methods derived by those skilled in the art based on the technical solutions of this utility model are also within the scope of protection of this utility model.

Claims

1. A solid sample testing fixture for a terahertz time-domain spectrometer, characterized in that: It includes a rigid housing (10) with a spectrometer transmitting module (11), and a signal line plug (12) is provided on the rigid housing (10) for the spectrometer transmitting module (11). A spectrometer receiving module is provided inside the rigid housing (10) on the opposite side of the spectrometer transmitting module (11). The rigid outer shell (10) is also provided with a test rack vertical adjustment part (13) and a test rack horizontal adjustment part (14). The test rack vertical adjustment part (13) includes a support platform for placing the sample. The support platform slides up and down to adjust the height. The test rack horizontal adjustment part (14) adjusts the horizontal spacing.

2. The solid sample test fixture for a terahertz time-domain spectrometer according to claim 1, characterized in that: The test frame horizontal adjustment part (14) includes a bottom slide (26), a horizontal slide rail (22), a second control rod (23), a second handwheel (25), and a second nut sleeve (27). The second handwheel (25) is fixed to the shaft end of the second control rod (23). The second control rod (23) is provided with a coarse thread (24). The second nut sleeve (27) is fixed to the bottom slide (26), and the coarse thread (24) and the second nut sleeve (27) are threadedly connected. The bottom slide (26) is slidably engaged with the horizontal slide rail (22).

3. A solid sample testing fixture for a terahertz time-domain spectrometer according to claim 1 or 2, characterized in that: The vertical adjustment part (13) of the test frame includes a handwheel (15), a control lever (16), a vertical adjustment stroke frame (18), a vertical guide rail (19), a support plate (20), and a nut sleeve (21). The vertical guide rail (19) is provided in two and is fixed symmetrically on the inner wall of the vertical adjustment stroke frame (18). The support plate (20) slides up and down with the vertical guide rail (19). The nut sleeve (21) is fixed on the support plate (20). The control lever (16) is provided with a fine thread (17). The fine thread (17) and the nut sleeve (21) are threadedly connected.

4. The solid sample testing fixture for a terahertz time-domain spectrometer according to claim 3, characterized in that: The upper limit position of the support plate (20) is located above the spectrometer emission module (11).

5. The solid sample testing fixture for a terahertz time-domain spectrometer according to claim 3, characterized in that: The lower limit position of the support plate (20) is located below the spectrometer emission module (11).

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