A metallographic specimen observation face leveler

Abstract

The utility model belongs to the field of metallographic analysis, concretely relates to a metallographic sample observation surface leveler, including base, chuck, pillar, leveling knob, spring, self -locking device, elastic tablet and anvil, the centre of chuck has the light hole that goes in, is equipped with the arm that protrudes in the outer edge, is equipped with arm hole in the tail end of protruding arm, one end of pillar is connected with base, and the other end is connected with chuck, leveling knob is matched with the aperture on base, spring is located between the cylindrical blind hole screw hole of base and leveling knob, the inner wall of self -locking device forms clearance fit with pillar, and the upper half of outer wall is turned to have the thread, one end thread of elastic tablet is matched with the outer wall thread of self -locking device, and the other end is processed with the light hole that goes through wall thickness, and the diameter of anvil bottom column body forms interference fit with the light hole diameter of elastic tablet, the utility model discloses simple structure, and the manufacturing cost is low, can complete the fixation and leveling of sample fast, ensures the sustained precision in the detection process, satisfies the diversified sample use demand.

Description

Technical Field

[0001] This utility model belongs to the field of metallographic analysis, specifically relating to a leveler for the observation surface of a metallographic sample. Background Technology

[0002] In the fields of modern materials science and high-end manufacturing, the microstructure of materials is a key factor that determines the core indicators such as mechanical properties, corrosion resistance, and fatigue life. Its test results directly serve as the core basis for product manufacturing process optimization, quality control, and new material research and development, and are of paramount importance to the reliability of products in key fields such as automobile manufacturing, aerospace, and high-end equipment.

[0003] In actual testing procedures, defect rate and metallographic structure evaluation and grading are important testing components: 1. Defect rate detection: First, according to the technical standards, cut a cross-section sample from the product and prepare a standard metallographic sample. Then, collect metallographic images under a stereomicroscope at a specific magnification. Finally, import the images into professional analysis software, and calculate the defect rate after grayscale processing, binarization conversion and threshold segmentation. The result is directly related to the product qualification judgment.

[0004] 2. Metallographic structure evaluation and grading: First, metallographic images are obtained using a high-powered microscope. Then, the structure type, phase category, and defect type are classified. Finally, the structure grade is evaluated by comparing with the standard atlas. This is the core basis for assessing the rationality of the material process and the stability of its performance.

[0005] In the above-mentioned testing process, extremely high requirements are placed on the uniformity of illumination, image clarity and detail integrity of metallographic images. All of this is based on the premise that the observation surface of the metallographic sample is perpendicular to the incident light from the microscope. Otherwise, it will directly lead to uneven brightness and distortion of details in the image, which will affect the accuracy of defect rate calculation and the reliability of microstructure grading, and may even cause misjudgment, resulting in significant losses to production or research and development.

[0006] In current testing methods, laboratories commonly use a "clay bonding + flattening press" method to fix samples: clay is kneaded into a lump and placed at the bottom of the sample; the shape of the clay is manually adjusted to make the sample observation surface approximately horizontal; then, a flattening press is used to gently press the sample surface to complete the positioning. This method has three major drawbacks: 1. Low operational efficiency: Each time a sample is changed, the clay needs to be kneaded and its shape adjusted again, which is cumbersome and time-consuming, making it unsuitable for batch testing scenarios.

[0007] 2. Poor stability: With long-term use, modeling clay is prone to losing water, hardening, and cracking, gradually losing its plasticity. This causes the observation surface of the sample to slowly deviate from the horizontal state, making it impossible to guarantee continuous accuracy during the testing process.

[0008] 3. Risk of sample damage: During the pressing process, the flattener is prone to friction or collision with the observation surface of the sample, causing surface scratches, directly damaging the integrity of the sample and affecting the imaging effect.

[0009] Therefore, under the development trend of intelligent manufacturing and high-precision material analysis, there is an urgent need to design a device that can quickly and perpendicularly position the sample observation surface with the incident light without relying on clay and flatteners. This device can ensure the quality of metallographic images from the source, meet the multiple requirements of modern material research and development for detection accuracy, efficiency and sample protection, and provide core support for the reliability of material analysis results. Utility Model Content

[0010] This invention proposes a metallographic sample observation surface leveler to solve the problems of low operating efficiency and poor stability in the prior art.

[0011] To achieve the above objectives, the present invention proposes the following technical solution: A metallographic specimen observation surface leveler includes a base, a chuck, a support, a leveling knob, a spring, a self-locking device, an elastic pressure plate, and a pressure head; The base is an isosceles triangle with countersunk threaded through holes on the three corners. A threaded blind hole is located directly below the countersunk threaded through hole on the apex of the isosceles triangle. The leveling knob is set on the countersunk threaded through hole of the cylindrical surface by a spring. One end of the support column is connected to the threaded blind hole of the base, and the other end is connected to the chuck. The self-locking device is tubular, with its inner wall forming a clearance fit with the support column, and its upper half of the outer wall being threaded. One end of the elastic pressure plate is provided with a locking hole and the inner wall of the locking hole is threaded to match the outer wall thread of the self-locking device. The other end is machined with a smooth hole, and the pressure head is set on the smooth hole.

[0012] Preferably, the chuck has a light inlet hole at its center, an extension arm on its outer edge, an arm hole at the end of the extension arm, threads on the inner wall of the arm hole, a flat surface on the lower side of the chuck, and a conical surface on the upper side of the chuck.

[0013] Preferably, the outer edge thickness of the conical surface of the chuck is 1 mm, and the inner edge thickness is 0.5 mm.

[0014] Preferably, there are three chucks, and the light inlet apertures of the chucks are different in diameter, and they are all installed on the support column through the arm hole.

[0015] Preferably, the top of the pressure head is a sphere, and the middle and bottom are both columns, with the diameter of the bottom column being slightly larger than the diameter of the light hole in the elastic pressure plate.

[0016] Preferably, the pressure head is made of highly elastic rubber.

[0017] Preferably, the base, chuck, support, leveling knob, spring, self-locking device, and elastic pressure plate are made of carbon steel.

[0018] The advantages of this utility model are: This invention proposes a metallographic sample observation surface leveler, which adopts a mechanical structure for fixing and leveling, quickly completing the fixing and leveling of the sample; it uses reliable materials as the support structure to ensure that the sample observation surface does not deviate from the horizontal state, ensuring continuous accuracy during the testing process; it uses multi-specification chucks, which can be adapted to metallographic samples of different sizes and shapes without replacing the entire set of devices, meeting the diverse sample usage needs; it has a simple structure and low manufacturing cost. Attached Figure Description

[0019] The accompanying drawings, which form part of this specification, are used to provide a further understanding of this utility model. The illustrative embodiments and descriptions of this utility model are used to explain this utility model and do not constitute an undue limitation thereof. In the drawings: Figure 1 This is a structural diagram of a metallographic specimen observation surface leveler. Figure 2 A partial cross-sectional view of a metallographic specimen observation surface leveler; Figure 3 This is a schematic diagram of the base structure; Figure 4 This is a schematic diagram of the chuck structure; Figure 5 This is a schematic diagram of the chuck's cross-section; Figure 6 This is a schematic diagram of the support structure; Figure 7 This is a schematic diagram of the self-locking device structure; Figure 8 This is a schematic diagram of an elastic compression tablet structure; Figure 9 This is a schematic diagram of the pressure head structure. Detailed Implementation

[0020] The present invention will now be described in detail with reference to the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features described herein can be combined with each other.

[0021] The following detailed description is exemplary and intended to provide further detailed explanation of the present invention. Unless otherwise specified, all technical terms used in this invention have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this invention is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this invention. Example

[0022] Please see Figure 1 , 2 As shown, this utility model provides a metallographic sample observation surface leveler, including a base 1, a chuck 2, a support column 3, a leveling knob 4, a spring 5, a self-locking device 6, an elastic pressure plate 7, and a pressure head 8; like Figure 3 As shown, the base 1 is an isosceles triangle with countersunk threaded through holes 1-1 on the three corners. A threaded blind hole 1-2 is provided directly below the countersunk threaded through hole 1-1 on the apex of the isosceles triangle.

[0023] like Figure 4 , 5 As shown, the chuck 2 has a light inlet hole 2-1 in the center, and an extension arm 2-2 is provided on the outer edge of the chuck 2. An arm hole 2-3 is provided at the tail end of the extension arm 2-2. The inner wall of the arm hole 2-3 is threaded. The lower side of the chuck 2 is a flat surface 2-4 for attaching the alloy phase sample 9. The upper side of the chuck 2 is a conical surface 2-5 to prevent the objective lens from rubbing against the inner edge when switching objectives.

[0024] like Figure 6 As shown, the two ends of the support column 3 are threaded, one end is connected to the threaded blind hole of the base, and the other end is connected to the arm hole 2-3 of the extension arm 2-2 of the chuck 2.

[0025] The leveling knob 4 is a bolt, and there are 3 leveling knobs 4, which match the countersunk threaded through hole 1-1 on the cylindrical surface of the base 1.

[0026] There are three springs 5, located between the countersunk threaded through hole 1-1 on the cylindrical surface of the base 1 and the leveling knob 4. One end of each spring is in contact with the bottom surface of the countersunk hole, and the other end is in contact with the supporting surface of the leveling knob 4. The springs 5 ​​are in a compressed state. The elasticity of the springs 5 ​​can increase the friction between the matching threads of the leveling knob 4 and the base 1, preventing relative rotation between the two due to vibration or accidental contact.

[0027] like Figure 7 As shown, the self-locking device 6 is tubular, and the inner wall of the self-locking device 6 forms a clearance fit with the support column 3. The upper half of the outer wall is threaded, and the self-locking device 6 can slide up and down along the support column 3 when it is fitted on the support column 3.

[0028] like Figure 8 As shown, one end of the elastic pressure plate 7 is provided with a locking hole 7-1 and the inner wall of the locking hole 7-1 is threaded to match the outer wall thread of the self-locking device 6, and the other end is machined with a through hole 7-2 that penetrates the wall thickness for installing the pressure head 8; like Figure 9As shown, the top of the pressure head 8 is a sphere, and the middle and bottom are both columns. The diameter of the bottom column is slightly larger than the diameter of the light hole 7-2 of the elastic pressure plate 7, so as to ensure that it forms an interference fit with the light hole 7-2 after being inserted into it to prevent it from falling off.

[0029] In one specific embodiment, the outer edge thickness of the conical surface of the chuck 2 is 1 mm, and the inner edge thickness is 0.5 mm.

[0030] In one specific embodiment, there are 3 chucks 2, which are installed on the support column 3 at the same time. The aperture 2-1 of the light inlet of different chucks 2 is different. The chuck 2 with the corresponding aperture is selected according to the size of the metallographic sample 9.

[0031] In one specific embodiment, the pressure head 8 in the metallographic sample observation surface leveler is made of high-elasticity rubber, and the remaining parts are made of metal / high-hardness engineering plastics, such as carbon steel. Example

[0032] This embodiment provides a method for using the metallographic specimen observation surface leveler, including the following steps: Step 1: Based on the size of the metallographic sample 9, select a chuck 2 with a diameter matching the size of the light inlet 2-1 and keep it for use. Rotate the other two chucks 2 to the other side. Then, attach the ground surface of the metallographic sample 9, which has been inlaid, ground, and polished, to the side of the plane 2-4 of the chuck 2 and align the part to be analyzed with the light inlet 2-1 of the chuck 2. At the same time, ensure that the edge of the part to be analyzed is not blocked by the inner edge of the chuck 2.

[0033] Step 2: Move the self-locking device 6 so that the elastic pressure plate 7 presses the metallographic sample 9. The elastic force of the elastic pressure plate 7 should be such that the grinding surface of the metallographic sample 9 is completely in contact with the chuck 2 without relative sliding.

[0034] Step 3: Set the microscope magnification to the lowest setting, and then adjust the microscope's lifting mechanism to ensure there is enough space between the microscope objective and the worktable to place the leveler.

[0035] Step 4: Place the leveler on the microscope stage and move the leveler so that the light inlet 2-1 of the chuck 2 is aligned with the objective lens.

[0036] Step 5: Turn on the microscope power and gradually increase the light intensity. At the same time, adjust the focal length so that the focal plane is as close as possible to the observation surface of the metallographic sample 9. Observe whether the brightness of the field of view is uniform.

[0037] Step 6: If the field of view is uniformly bright, adjust the focal length to make the image clear. Then gradually increase the magnification of the microscope and make the field of view uniform and the image clear at each magnification until the magnification reaches the required magnification.

[0038] Step 7: If the brightness of the field of view is not uniform, adjust the leveling knob 4 of the leveler and adjust the focal length at the same time until the brightness of the field of view is uniform and the image is clear. Then gradually increase the magnification of the microscope and make the brightness of the field of view uniform and the image clear at each magnification until the magnification reaches the required magnification.

[0039] Step 8: Move the leveler to change the microscope field of view until the field of view to be analyzed appears, adjust the brightness and sharpness, take metallographic images and save them to the storage medium.

[0040] Step 9: After the metallographic specimen 9 has been observed, move the self-locking device 6 in the opposite direction to release the elastic force of the elastic pressure plate 7, remove the metallographic specimen 9, and complete the photographing of the metallographic specimen 9.

[0041] This invention allows for convenient and rapid vertical positioning of the metallographic sample observation surface with the incident light from the microscope without scratching the observation surface, while maintaining excellent stability throughout the imaging process. The invention employs a mechanical structure for fixing and leveling, enabling rapid sample fixation and leveling. It uses a metal / high-hardness engineering plastic as the support structure to ensure the observation surface remains level, guaranteeing continuous accuracy during testing. It is highly versatile, utilizing multi-specification chucks to accommodate metallographic samples of different sizes and shapes without requiring a complete replacement of the entire device, meeting diverse sample usage needs. It is easy to manufacture, with a simple structure and low manufacturing cost.

[0042] As is known from common technical knowledge, this utility model can be implemented through other embodiments that do not depart from its spirit or essential characteristics. Therefore, the disclosed embodiments described above are merely illustrative in all respects and are not the only ones. All modifications within the scope of this utility model or its equivalents are included in this utility model.

[0043] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of this utility model and not to limit it. Although the utility model has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of this utility model. Any modifications or equivalent substitutions that do not depart from the spirit and scope of this utility model should be covered within the protection scope of the claims of this utility model.

Claims

1. A leveling device for the observation surface of a metallographic sample, characterized in that, Includes base, chuck, support, leveling knob, spring, self-locking device, elastic pressure plate and pressure head; The base is an isosceles triangle with countersunk threaded through holes on the cylindrical surfaces next to the three corners. A threaded blind hole is located directly below the countersunk threaded through hole next to the vertex of the isosceles triangle. The leveling knob is set on the countersunk threaded through hole on the cylindrical surface by a spring. One end of the support column is connected to the threaded blind hole of the base, and the other end is connected to the chuck. The self-locking device is tubular, with its inner wall forming a clearance fit with the support column, and its upper half of the outer wall being threaded. One end of the elastic pressure plate is provided with a locking hole and the inner wall of the locking hole is threaded to match the outer wall thread of the self-locking device. The other end is machined with a smooth hole, and the pressure head is set on the smooth hole.

2. The metallographic specimen observation surface leveler as described in claim 1, characterized in that, The chuck has a light inlet hole in the center, an extension arm on the outer edge of the chuck, an arm hole at the tail end of the extension arm, and threads machined on the inner wall of the arm hole. The lower side of the chuck is flat, and the upper side of the chuck is conical.

3. A metallographic specimen observation surface leveler as described in claim 2, characterized in that, The outer edge thickness of the conical surface of the chuck is 1 mm, and the inner edge thickness is 0.5 mm.

4. A metallographic specimen observation surface leveler as described in claim 2, characterized in that, The number of chucks is 3, and the aperture diameters of the light inlets of the chucks are different. They are all installed on the support column through the arm hole.

5. A metallographic specimen observation surface leveler as described in claim 1, characterized in that, The top of the pressure head is a sphere, while the middle and bottom are cylindrical, with the diameter of the bottom cylindrical part being slightly larger than the diameter of the light hole in the elastic pressure plate.

6. A metallographic specimen observation surface leveler as described in claim 1, characterized in that, The pressure head is made of highly elastic rubber.

7. A metallographic specimen observation surface leveler as described in claim 1, characterized in that, The base, chuck, support, leveling knob, spring, self-locking device, and elastic pressure plate are made of carbon steel.

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