A multifunctional interface integrated isolation device automatic test system test fixture

Abstract

The utility model discloses a kind of test fixture of multifunctional interface integrated isolation device automatic test system in the technical field of automation testing.It includes automatic test system and the interface of automatic test system is matched and is inserted by the test system general board card and adapter plate of several connector pads, and includes: PCB, the connector pad of several connector pads fixed on PCB, for with the connector pad of corresponding test system general board card is inserted;Modular test circuit component fixed on PCB, for with the wiring on PCB constitutes test circuit;Circuit clamp, clamping to be tested circuit board, and after clamping to be tested circuit board, so that the to-be-tested circuit board is conducted with connector pad and test circuit.The development based on test system general board card, using a large number of modularization and generalization design, the effective clamping and testing of certain multifunctional interface integrated isolation device are realized, and the accurate electrical connection of measured circuit and test system is guaranteed.

Description

Technical Field

[0001] This utility model relates to a test fixture for an automatic test system of a multifunctional interface integrated isolation device, belonging to the field of automated testing technology. Background Technology

[0002] In common testing processes, the circuit under test (DUT) usually needs to be connected to the test bench or test system via a test fixture. In more complex automated test systems, the DUT not only needs to be connected to the test board via a test fixture, but also needs to interact with the host computer to exchange various data collected by the test board.

[0003] Traditional test fixtures use general-purpose plastic clamps to connect to the circuit under test. However, they are inadequate in terms of clamping tightness, connection reliability, and mass production durability. In addition, when tested in extreme environments such as high and low temperatures, aging, and random vibration, the clamp body is prone to aging or mechanical stress damage, which can cause deviations in test results and, in severe cases, damage to the circuit under test.

[0004] Traditional test fixtures and test systems are often connected by soldering wires or using connectors such as aviation plugs. This method has shortcomings in terms of soldering reliability, connector connection reliability, and connector procurement cost during mass production. In addition, longer wire connections may introduce additional problems such as mutual interference and loss of the tested signals, as well as heat dissipation issues with multi-strand cables. Summary of the Invention

[0005] The technical problem to be solved by this utility model is to overcome the defects of the prior art and provide a test fixture for an automatic test system for multifunctional interface integrated isolation devices.

[0006] To solve the above-mentioned technical problems, the present invention is implemented using the following technical solution.

[0007] This utility model discloses a test fixture for a multifunctional interface integrated isolation device automatic test system, comprising: an automatic test system and a universal test system board that matches the interface of the automatic test system and is connected by several connector pads; and further comprising: an adapter board, wherein the adapter board includes: PCB Several connector pads fixed on the PCB are used to connect with corresponding connector pads on the general board of the test system. Modular test circuit components fixed on the PCB are used to form test circuits with the traces on the PCB. A circuit fixture holds a circuit board to be tested, and after clamping the circuit board to be tested, makes the circuit board to be tested connected to the connector pads and the test circuit.

[0008] Furthermore, the modular test circuit assembly includes resistors, capacitors, inductors, diodes, transistors, crystal oscillators, and relays packaged as individual modules with uniform external dimensions.

[0009] The above technical solution encapsulates common small discrete components such as resistors, capacitors, inductors, diodes, transistors, crystal oscillators, and relays into a single module with a uniform external size. This module, together with the traces on the PCB, forms a test circuit. Its advantages include easy replacement, and the added plastic casing protects the components, preventing damage from impacts during large-scale production testing, thus improving the reliability of this test fixture.

[0010] Furthermore, the circuit fixture includes a hinged upper cover and a base; The upper cover is provided with a locking mechanism and a pressing part; The base is provided with a mounting slot for placing the circuit board to be tested and a slot for engaging with the card. The mounting slot is provided with several rows of pin holes and elastic probes disposed in the pin holes. After the circuit fixture clamps the circuit board to be tested, the elastic probes are in a compressed state to connect the circuit board to be tested and the test circuit.

[0011] The above technical solution facilitates the replacement of the circuit board to be tested through hinge and snap-fit ​​connections, and the pressing part can press the elastic probe to enhance conductivity.

[0012] Furthermore, the elastic probe includes a lower pin fixed inside the pinhole and extending downward out of the pinhole for electrical connection with the test circuit, and an upper pin elastically connected to the lower pin via a spring, wherein the upper pin extends out of the pinhole in a free state.

[0013] The above technical solution, through the combination of upper needle, lower needle and spring, can achieve elasticity while cooperating with the pressing part to achieve reliable electrical conductivity.

[0014] Furthermore, the pressing part is fixed to the upper cover by fasteners, and the pressing part is a raised structure provided on the upper surface of the circuit board to be tested.

[0015] The above technical solution, by setting a raised structure according to the shape of the upper surface of the circuit board to be tested, can cover the upper surface of the circuit board to be tested, thereby making the circuit board to be tested uniformly stressed and compacted at the same time.

[0016] Furthermore, the surface of the protruding structure is provided with a soft layer.

[0017] The above technical solution can reduce damage to the surface of the circuit board to be tested by setting a flexible layer.

[0018] Furthermore, the raised structure has a weight-reducing groove, and a through hole penetrating the upper cover is provided in the middle of the raised structure.

[0019] The above technical solution, by setting weight-reducing grooves and through holes, can reduce weight while improving the heat dissipation of the circuit board under test during the testing process.

[0020] Furthermore, the connector pads on the PCB are configured according to the layout of the corresponding connector pads on the general-purpose board of the test system.

[0021] The above technical solution, through the corresponding layout of the connector pads, can realize the conversion function of the adapter board, and achieve effective clamping and testing of multi-functional interface integrated isolation devices without changing the general board of the test system.

[0022] Furthermore, multiple circuit fixtures are provided on the PCB according to the size of the circuit board to be tested.

[0023] The above technical solution can improve the application range and utilization rate of the adapter board by setting multiple circuit fixtures corresponding to different circuit board sizes.

[0024] The beneficial effects achieved by this utility model are: This utility model's test fixture is developed based on a general-purpose test system board. It employs extensive modular and universal design, enabling effective clamping and testing of a certain type of multi-functional interface integrated isolation device. This ensures precise electrical connection between the circuit under test and the test system, exhibiting excellent connection reliability and signal integrity under various testing environments. It also combines maintainability and low cost for mass production. Compared to manual equipment adjustment testing, this test system significantly improves testing efficiency. Attached Figure Description

[0025] Figure 1 This is a structural block diagram of the testing fixture of this utility model; Figure 2 This is a structural diagram of a general-purpose board for the test system; Figure 3 This is a structural diagram of the adapter plate; Figure 4 This is a schematic diagram of the circuit fixture. Figure 5 This is a perspective view of the circuit fixture.

[0026] In the diagram: 1. Automatic testing system; 2. General-purpose testing system board; 3. Adapter board; 4. 31. PCB; 32. Circuit fixture; 321. Top cover; 322. Card; 323. Pressing part; 324. Mounting slot; 325. Card slot; 326. Pinhole; 327. Elastic probe; 328. Base; 3231. Weight reduction slot; 3232. Through hole; 3271. Upper pin; 3272. Lower pin. Detailed Implementation

[0027] The present invention will be further described below with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and should not be used to limit the scope of protection of the present invention.

[0028] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature. In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0029] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0030] Example 1, as Figure 1 As shown, this embodiment introduces a test fixture for a multifunctional interface integrated isolation device automatic test system, including: an automatic test system 1, a test system general board 2 that matches the interface of the automatic test system 1 and is plugged in through several connector pads, and an adapter board 3; in this embodiment, the automatic test system 1 is the isolation device interface test system (specifically model STS6100 automatic test system) in Chinese patent application CN119667340A - An Isolation Device Interface Test System and Test Method, and the test system general board 2 is an existing general board with multiple different types of connector pads.

[0031] like Figure 3 As shown, the adapter board 3 includes: PCB31 (printed circuit board). Several connector pads fixed on PCB31 are used to connect with corresponding connector pads on the general board of the test system. A modular test circuit assembly fixed on PCB31, used to form a test circuit with the traces on PCB31; The circuit fixture 32 holds the circuit board (chip) to be tested, and after clamping the circuit board to be tested, it makes the circuit board to be tested connected to the connector pads and the test circuit.

[0032] In this system, the host computer of the automatic test system 1 controls the built-in programmable power supply, isolation withstand voltage tester, and other equipment to generate test and control signals. These signals are transmitted to the test system general board 2 via 22 sets of DIP34 connectors, and then to the adapter board 3 via 3 sets of DIP96 connectors. The circuit fixtures and test circuits on the adapter board 3 complete the testing of a certain type of multi-functional interface integrated isolation device. The electrical signals output from the test are returned to the automatic test system 1 via the data acquisition card. The multimeter, oscilloscope, adjustable electronic load, and other equipment built into the automatic test system 1 output test data to the data acquisition card. The test data generated by the automatic test system 1, along with the test data generated by the isolation withstand voltage tester and other equipment, are summarized and sent to the host computer to generate the final test data for this type of multi-functional interface integrated isolation device.

[0033] like Figure 2 As shown, the physical dimensions of the general-purpose board for the test system are 300mm×360mm×3mm. It has 22 reserved 17×2 DIP34 connector pads, 5 32×3 DIP96 connector pads, and 1 16×2 DIP32 connector pad. Necessary connectors can be soldered according to development needs to save manufacturing costs. Its reserved positions match the interface of the automatic test system, and any connector can be firmly connected to the test system after soldering.

[0034] like Figure 3 As shown, the adapter board has physical dimensions of 170mm×260mm×3mm and three 32×3 DIP96 connector pads. After soldering the connectors, it can be firmly connected to the general board. The adapter board has one reserved circuit fixture mounting position. In subsequent development, multiple fixture mounting positions can be added according to actual needs and remaining test points. In this use, only one circuit test is involved.

[0035] like Figure 3As shown, the modular test circuit assembly encapsulates common small discrete components such as resistors, capacitors, inductors, diodes, transistors, crystal oscillators, and relays into individual modules with uniform dimensions, forming the test circuit together with the traces on the PCB board. Its advantages include ease of replacement, and the added plastic casing protects the components from damage due to impacts during large-scale production testing, improving the reliability of the test fixture. The test circuit is only designed for data acquisition, hence the simple components shown above. This design ensures the reliability of the testing process and data acquisition; integrating data processing functions and complex components onto the test board could easily introduce environmental interference during testing, affecting the final test results. like Figure 4 and Figure 5 As shown, the circuit fixture 32 includes a hinged upper cover 321 and a base 328. The upper cover 321 is provided with a locking element 322 and a pressing part 323. The base 328 is provided with a placement groove 324 for placing the circuit board to be tested and a locking slot 325 for engaging with the locking element 322. The placement groove 324 is provided with a plurality of pin holes 326 and elastic probes 327 disposed in the pin holes 326. After the circuit fixture 32 clamps the circuit board to be tested, the elastic probes 327 are in a compressed state to connect the circuit board to the test circuit. The hinge and locking mechanism facilitates the replacement of the circuit board to be tested, and the pressing part can compress the elastic probes to enhance conductivity.

[0036] The elastic probe 327 includes a lower needle 3272 fixed inside the needle hole 326 and extending downwards from the needle hole 326 for electrical connection with the test circuit, and an upper needle 3271 elastically connected to the lower needle 3272 via a spring. The upper needle extends from the upper port of the needle hole in a free state. The combination of the upper needle, lower needle, and spring achieves elasticity while ensuring reliable electrical conductivity in conjunction with the pressing part.

[0037] Example 2, based on the same inventive concept as Example 1, introduces a test fixture for an automatic test system of a multifunctional interface integrated isolation device. Building upon Example 1, as follows... Figure 4 and Figure 5 As shown, in this embodiment, the pressing part 323 is fixed to the upper cover 321 by fasteners (bolts, nuts, etc.), which facilitates the replacement of different pressing parts and provides a reliable electrical connection without welding, making replacement and maintenance convenient. The pressing part 323 is a raised structure provided according to the upper surface of the circuit board to be tested. By providing a raised structure according to the shape of the upper surface of the circuit board to be tested, the upper surface of the circuit board to be tested can be covered, thereby ensuring that the circuit board to be tested is subjected to uniform force while compacting the circuit board to be tested.

[0038] The surface of the protruding structure is provided with a soft layer 3233, which can reduce damage to the surface of the circuit board to be tested.

[0039] The raised structure has a weight-reducing groove 3231, and a through hole 3232 penetrating the upper cover 321 is provided in the middle of the raised structure. By setting the weight-reducing groove and the through hole, the weight can be reduced while improving the heat dissipation of the circuit board under test during the test.

[0040] The above description is only a preferred embodiment of the present utility model. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present utility model, and these improvements and modifications should also be considered within the protection scope of the present utility model.

Claims

1. A test fixture for an automated test system of a multifunctional interface integrated isolation device, comprising: An automatic test system (1) and a test system universal board (2) with an interface compatible with the automatic test system (1) and connected via a plurality of connector pads, characterized in that it further comprises: an adapter board (3), the adapter board (3) comprising: PCB (31), Several connector pads fixed on the PCB (31) are used to connect with the corresponding connector pads on the general board of the test system. A modular test circuit assembly (33) fixed on the PCB (31) is used to form a test circuit with the traces on the PCB (31); The circuit fixture (32) holds the circuit board to be tested and, after clamping the circuit board to be tested, makes the circuit board to be tested connected to the connector pads and the test circuit.

2. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 1, characterized in that, The modular test circuit assembly includes resistors, capacitors, inductors, diodes, transistors, crystal oscillators, and relays packaged as individual modules with uniform external dimensions.

3. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 1, characterized in that, The circuit clamp (32) includes a hinged top cover (321) and a base (328); The upper cover (321) is provided with a clip (322) and a pressing part (323); The base (328) is provided with a placement slot (324) for placing the circuit board to be tested and a slot (325) for engaging with the card (322). The mounting slot (324) is provided with a plurality of pin holes (326) and elastic probes (327) disposed in the pin holes (326). After the circuit fixture (32) clamps the circuit board to be tested, the elastic probes (327) are in a compressed state to connect the circuit board to be tested and the test circuit.

4. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 3, characterized in that, The elastic probe (327) includes a lower pin (3272) fixed inside the pin hole (326) and extending downward out of the pin hole (326) to be electrically connected to the test circuit, and an upper pin (3271) elastically connected to the lower pin (3272) by a spring, wherein the upper pin (3271) extends out of the upper port of the pin hole in a free state.

5. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 3, characterized in that, The pressing part (323) is fixed to the upper cover (321) by fasteners. The pressing part (323) is a raised structure provided on the upper surface of the circuit board to be tested.

6. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 5, characterized in that, The surface of the protruding structure is provided with a soft layer (3233).

7. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 5, characterized in that, The raised structure has a weight-reducing groove (3231) and a through hole (3232) that passes through the top cover (321) in the middle of the raised structure.

8. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 1, characterized in that, The connector pads on the PCB (31) are set according to the layout of the corresponding connector pads on the general board (2) of the test system.

9. The test fixture of the automatic test system for multifunctional interface integrated isolation devices according to claim 1, characterized in that, Multiple circuit fixtures (32) are provided on the PCB (31) according to the size of the circuit board to be tested.

Images