Aging test cabinet

Abstract

The application provides an aging test cabinet, wherein the aging test cabinet comprises a plurality of aging test units arranged in a matrix; a single aging test unit comprises an operation area and a storage area fixedly connected together; the operation area comprises a closed box body, the closed box body comprises a test panel, and a test circuit is arranged in the closed box body; the test panel is provided with various operation members; the storage area comprises an open box body, the open box body comprises three side plates and a bottom plate, and the top and one side in a first direction are open; the open box body further comprises a horizontal strip, the height of the horizontal strip is a first preset height, the horizontal strip is fixedly arranged on the upper surface of the bottom plate and located at one side in the first direction; the horizontal strip with the first preset height is arranged, so that the charging pile is placed in the storage area at a specific inclination angle, so as to facilitate the staff to check.

Description

Technical Field

[0001] This application belongs to the field of electronic device evaluation technology, and relates to an aging test technology, particularly an aging test cabinet. Background Technology

[0002] Aging tests on charging stations are a crucial step in assessing their long-term operational reliability and safety. Generally, aging test equipment for charging stations is typically a cabinet-style structure with two or more layers to house multiple charging stations and conduct aging tests on multiple AC or DC charging stations simultaneously.

[0003] Chinese Patent Publication No. CN307924818S, published on March 21, 2023, entitled "AC Charging Pile Aging Test Stand," discloses the specific structure of the charging pile aging test stand. When the charging pile aging test stand is used for aging tests, each charging pile needs to be placed horizontally, and the charging piles will block the operation panel of the aging test stand. When the staff checks the operating status of the charging pile, interface information, or adjusts parameters, they often need to bend over, squat down, or even take the charging pile out of the aging test cabinet. This is inconvenient to operate and can easily lead to test interruption, affecting test efficiency. Summary of the Invention

[0004] The purpose of this application is to provide an aging test cabinet to solve the problem that in the prior art, it is inconvenient for staff to operate and the testing efficiency is low when checking the operating status of charging piles, interface information or adjusting parameters.

[0005] In a first aspect, this application provides an aging test cabinet, comprising a plurality of aging test units arranged in a matrix; each aging test unit includes an operating area and a storage area fixedly connected together;

[0006] The operating area includes a closed box, the closed box includes a test panel and is equipped with a test circuit inside, and the test panel is equipped with various operating components.

[0007] The storage area includes an open box body, which includes three side panels and a bottom panel, with the top and one side in a first direction open; the open box body also includes a horizontal bar, which has a height of a first preset height, is fixedly set on the upper surface of the bottom panel, and is located on one side in the first direction.

[0008] In one embodiment of this application, the base plate has a recess on one side in the first direction.

[0009] In one embodiment of this application, the storage area further includes a cable storage drawer, which is located directly below the base plate and is open on one side in the first direction.

[0010] In one embodiment of this application, the cable storage drawer includes a baffle; the baffle has a second preset height and is fixedly disposed above the lower surface of the cable storage drawer, located on the edge of one side in the first direction.

[0011] In one embodiment of this application, the cable storage drawer has a cable channel on one side in the second direction.

[0012] In one embodiment of this application, the enclosed box further includes a hinged door, which is hinged to and fixed to the back plate of the enclosed box.

[0013] In one embodiment of this application, a bottom housing is also included, located below each of the aging test units.

[0014] In one embodiment of this application, at least four mechanical locking wheels are also included, with the at least four mechanical locking wheels located at the four corners of the bottom of the aging test cabinet.

[0015] In one embodiment of this application, at least two retractable feet are also included at the bottom of the aging test cabinet.

[0016] In one embodiment of this application, the test panel is provided with at least one switch mounting position, an indicator light mounting position, a gun holder mounting position, a socket assembly mounting position, a wire clip assembly mounting position, and a banana plug mounting position, wherein the banana plug mounting position is located above the socket assembly mounting position and the wire clip assembly mounting position.

[0017] As described above, this application provides an aging test cabinet. By setting a horizontal bar of a first preset height, the charging pile is placed in the storage area at a specific tilt angle, and the operation area and the storage area are on the same plane, which makes it easy for staff to see. It is convenient, quick and easy to operate. When applied to the actual application scenario of charging pile aging test, it helps to improve the efficiency of aging test and save labor costs. Attached Figure Description

[0018] Figure 1 The diagram shown is a structural schematic of an aging test cabinet as described in an embodiment of this application.

[0019] Figure 2 The diagram shown is a structural schematic of an aging test unit as described in an embodiment of this application.

[0020] Figure 3 The diagram shown is a structural schematic of a backplate according to an embodiment of this application.

[0021] Figure 4 The diagram shows the distribution of the test panel operation components as described in an embodiment of this application.

[0022] Explanation of reference numerals in the attached figures

[0023] 10: Aging test unit; 100: Operation area; 110: Enclosed housing; 111: Test panel; 112: Switch mounting position; 113: Indicator light mounting position; 114: Gun holder mounting position; 115: Socket assembly mounting position; 116: Wiring clip assembly mounting position; 117: Banana socket mounting position; 118: Back panel; 119: Hinged door; 200: Storage area; 210: Open housing; 211: Side panel; 212: Bottom panel; 2121: Recess; 213: Horizontal bar; 220: Cable management drawer; 221: Baffle; 20: Bottom housing; 30: Mechanical locking wheel; 40: Main power interface; 50: Main communication interface. Detailed Implementation

[0024] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0025] It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this application. Therefore, the illustrations only show the components related to this application and are not drawn according to the number, shape and size of the components in actual implementation. In actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0026] Existing aging test cabinets typically place the charging piles undergoing aging tests horizontally on a shelf, with the control panel perpendicular to and located behind the shelf. This obstructs the connection or inspection of the control panel by the shelf area, and the cables are arranged haphazardly, making operation inconvenient. When checking the status of the charging piles, staff often need to bend over, squat down, or even remove the charging piles from the aging test cabinet, which can sometimes lead to test interruptions and affect the efficiency of the aging test.

[0027] To address the technical problems existing in the prior art, the following embodiments of this application provide an aging test cabinet. By setting a horizontal bar 213 with a first preset height, the charging pile can be placed at a certain angle in the aging test cabinet, so that the staff can view the operating status and interface information of the charging pile. The operation is simple and quick, effectively improving the testing efficiency of aging test and achieving better testing results.

[0028] The following will describe in detail the principle and implementation of an aging test cabinet according to the accompanying drawings, so that those skilled in the art can understand the aging test cabinet for multiple devices according to this embodiment without creative effort.

[0029] like Figure 1 As shown, this embodiment provides an aging test cabinet to improve the aging test efficiency of charging piles. Specifically, the aging test cabinet includes multiple aging test units 10 arranged in a matrix, wherein the matrix arrangement means that each aging test unit 10 is distributed in a matrix with a preset number of rows and columns. For example, as shown... Figure 1 As shown, the six aging test units 10 are arranged in a matrix of two rows and three columns. Each aging test unit 10 is used to perform aging tests on a single charging pile, thereby enabling the aging test cabinet to perform aging tests on multiple charging piles simultaneously, thus improving the aging test efficiency of the charging piles.

[0030] Furthermore, such as Figure 2 As shown, a single aging test unit 10 includes an operation area 100 and a storage area 200 fixedly connected together. The operation area 100 is used to enclose and house the test circuit required for the charging pile aging test, and has operable operating components attached to its surface to realize the aging test of the charging pile. Specifically, the operation area 100 includes a sealed housing 110, which is used to seal and house the test circuit required for the charging pile aging test; that is, the test circuit is disposed inside. It also includes a test panel 111, on which various operating components are disposed for executing and controlling the aging test process of the charging pile. Exemplarily, the operating components on the test panel 111 include, but are not limited to, switches, indicator lights, gun holders, socket assemblies, wiring clamp assemblies, and banana plugs.

[0031] Storage area 200 is used to place charging stations to be tested. It should be noted that, to facilitate staff monitoring the testing status of the charging stations, they are placed at an angle in storage area 200. Specifically, as follows... Figure 2As shown, the storage area 200 includes an open box 210 for placing a charging pile. The open box 210 includes three side panels 211 and a bottom plate 212, with the top and one side facing a first direction open. When a charging pile is placed in the open box 210, staff can observe its testing status through the opening on the first direction side. For example, each side panel 211 is made of plastic to avoid scratching the charging pile. The open box 210 also includes a horizontal bar 213, which is fixedly mounted on the upper surface of the bottom plate 212. This allows the charging pile placed in the open box 210 to rest against the horizontal bar 213, thus placing it at an angle in the storage area 200 for easy viewing by staff. The height of the horizontal bar 213 is a first preset height, located on one side of the bottom plate 212 facing the first direction, so that the charging pile is placed at a specific angle towards the first direction within the open box 210. Furthermore, those skilled in the art can set the height of the horizontal bar 213 according to actual needs; this embodiment does not impose specific limitations.

[0032] Furthermore, for ease of operation, the storage area 200 and the test panel 111 are on the same plane on one side surface in the first direction.

[0033] In some optional embodiments, the storage area 200 also includes a cable storage drawer 220 located directly below the base plate 212 for storing the charging pile cables to maintain a neat and aesthetically pleasing appearance, preventing the cables of the upper charging piles from obstructing the lower charging piles, and improving the operator's field of vision and ease of operation. Specifically, the cable storage drawer 220 is open on one side in the first direction. Exemplarily, the upper surface of the cable storage drawer 220 is actually the base plate 212.

[0034] It should be noted that, since the power cord of the charging pile is relatively thick and stiff, in order to prevent the cable from popping out of the cable storage drawer 220 during testing, a baffle 221 is also provided on the lower surface of the cable storage drawer 220 on the edge located in the first direction to prevent the cable from popping out. The height of the baffle 221 is a second preset height, which, for example, is one-third of the height of the cable storage drawer 220.

[0035] Furthermore, the cable storage drawer 220 has a cable channel (not shown in the figure) on one side in the second direction to store the internal wiring of the test circuit, preventing the internal wiring of the test circuit from being squeezed by charging gun wires, etc., and keeping it neat and tidy, preventing the wiring from getting tangled. For example, the second direction and the first direction are opposite directions, and the cable channel is a square channel.

[0036] In some optional embodiments, the base plate 212 has a recess 2121 on one side in the first direction. This recess 2121 is located above the cable storage drawer 220, so that the charging pile cable can be stored in the cable storage drawer 220 through the recess 2121, and the power inlet and outlet at the lower end of the charging pile can be prevented from being blocked, thus avoiding difficulties in connecting the cable. For example, the recess 2121 is located at the center of the edge of the base plate 212 on one side in the first direction. Furthermore, those skilled in the art can set the width and length of the recess 2121 according to actual needs, combined with the width of the base plate 212 and the height of the crossbar 213. This embodiment does not impose specific limitations here.

[0037] In some alternative implementations, such as Figure 3 As shown, to facilitate inspection and maintenance of the test circuits in the maintenance operation area 100, the enclosed housing 110 also includes a hinged door 119 hinged to the back plate 118 of the enclosed housing 110. This hinged door 119 can be opened when the test circuits need inspection and maintenance, allowing personnel to operate it. Furthermore, a mechanical lock is installed on the hinged door to facilitate opening by personnel while preventing other personnel from accidentally opening the door, thus improving safety. Exemplarily, the test panel 111 and the back plate 118 are two opposing surfaces.

[0038] In some alternative implementations, such as Figure 4 As shown, the operating components on the test panel 111 include a switch mounting position 112, an indicator light mounting position 113, a gun holder mounting position 114, a socket assembly mounting position 115, a wire clamp assembly mounting position 116, and a banana plug mounting position 117.

[0039] Specifically, two switches are installed on the switch mounting position 112, which are used to control whether the corresponding test circuit is turned on and whether the corresponding test circuit is bypassed. Both switches are toggle switches.

[0040] Three indicator lights are installed on the indicator light mounting position 113, which correspond to different states of the charging pile during the aging test, so that staff can monitor the aging test process; for example, the three indicator lights are located in the upper left of the test panel 111 for easy viewing by staff.

[0041] Three gun mounts are installed on gun mount mounting position 114, all of which are used to connect the charging guns of the charging pile. The three gun mounts correspond to the Chinese national standard, European standard and American standard respectively, so that the aging test cabinet can test the Chinese national standard, European standard and American standard, thus improving the practicality of the aging test cabinet.

[0042] The socket assembly mounting position 115 has two sockets, both used to supply power to the charging pile. The two sockets correspond to two three-hole sockets of 10A and 16A respectively, to match the charging current of various charging piles. Furthermore, the socket assembly mounting position 115 is also equipped with two switches, each corresponding to one of the two three-hole sockets, to control whether the socket is powered on.

[0043] Five connectors are installed on the connector assembly mounting position 116. These connectors correspond to different power lines, such as neutral, live, and ground, for constructing the power supply circuit of the charging pile. The five connectors are compatible with three-phase five-wire and single-phase three-wire systems to meet the testing requirements of different types of charging piles. Furthermore, each connector is set with a different color to distinguish its corresponding power line. Even further, a transparent protective cover is installed on the connector assembly mounting position 116 to cover and isolate the five connectors, protecting them and their connected wires from being pulled or bumped and detached, and preventing workers from accidentally touching the connectors and getting electric shocks, thus improving safety. For example, the connector assembly mounting position 116 is located below the socket assembly mounting position 115.

[0044] Three banana-shaped connectors are installed on the banana-shaped connector mounting position 117, respectively used to connect the signal lines corresponding to the CP signal (Control Pilot), CC signal (Connection Confirm, charging gun insertion confirmation signal), and PE signal (Protective Earth, grounding signal) to provide feedback on the connection status and grounding safety of the processor charging pile. Furthermore, the banana-shaped connector mounting position 117 is located above the socket assembly mounting position 115 and the wiring clamp assembly mounting position 116. Because the banana-shaped connectors connect to a lower voltage, while the sockets connect to a higher voltage, when the wiring is pulled or bumped and becomes detached, the lower voltage signal line falls onto the higher voltage power line, which is safer than the higher voltage power line falling onto the lower voltage signal line.

[0045] Based on this, the various operating components on the test panel 111 of the operation area 100 are reasonably distributed, which facilitates operation and enhances safety.

[0046] In some alternative implementations, such as Figure 1As shown, the aging test cabinet also includes a bottom cabinet 20 located below each aging test unit 10. The bottom cabinet 20 is an internally conductive space used to house equipment including, but not limited to, leakage protection devices and aging load devices. The aging load devices simulate the actual working conditions of a charging pile to achieve aging testing, while the leakage protection devices provide leakage protection. Placing the equipment in the bottom cabinet 20 avoids the difficulties of storage and organization when the equipment is placed externally, and also reduces the risk of damage, extending the service life of the aging test equipment. Simultaneously, the bottom cabinet 20 can also be equipped with an emergency stop switch and a main switch to further ensure the safety of the aging test.

[0047] In some optional embodiments, the aging test cabinet also includes four mechanical locking wheels 30 located at the bottom of the aging test cabinet, used to move and fix the aging test cabinet, thereby improving the convenience of the aging test cabinet. Specifically, each mechanical locking wheel 30 includes a locking structure, which opens when the aging test cabinet needs to be moved and locks after the aging test cabinet is moved to the desired position, thereby fixing the position of the aging test cabinet. It should be noted that more mechanical locking wheels 30 may be provided at the bottom of the aging test cabinet, but this embodiment does not impose specific limitations.

[0048] It should be noted that, to further improve the stability of the aging test cabinet, this embodiment also installs at least two feet (not shown in the figure) at the bottom of the aging test cabinet. These feet are symmetrically distributed at the bottom of the aging test cabinet to stabilize it. Furthermore, to prevent the feet from interfering with the movement of the aging test cabinet via the mechanical locking wheels 30, all feet are retractable feet, allowing them to be retracted when the aging test cabinet needs to be moved. For example, the upper part of the retractable foot is a rod-like structure with a threaded structure, connected to the bottom of the aging test cabinet via a corresponding nut. The retraction of the retractable foot is achieved by the rotation of the rod-like structure within the nut.

[0049] In some optional embodiments, the aging test cabinet also includes a main power interface 40 and a main communication interface 50 located on the side of the aging test cabinet, for powering and communicating with each aging test unit 10 in the aging test cabinet, and for connecting multiple aging test cabinets in series.

[0050] In summary, the aging test cabinet provided in this application has its storage area and operation panel on the same plane. By setting a horizontal bar 213 in the storage area 200, the charging pile is placed at a specific tilt angle, which makes it easier for staff to view the operating status and interface information of the charging pile, as well as to adjust parameters. There is no need to bend over, squat down, or take out the charging pile. The operation is simple and quick, which effectively improves the testing efficiency of the charging pile and enhances the convenience of the aging test of the charging pile. It has high industrial application value.

[0051] The descriptions of the processes or structures corresponding to the above figures each have their own emphasis. For parts of a process or structure that are not described in detail, please refer to the relevant descriptions of other processes or structures.

[0052] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. An aging test cabinet, characterized in that, It includes multiple aging test units arranged in a matrix; each aging test unit includes an operating area and a storage area fixedly connected together; The operating area includes a closed box, the closed box includes a test panel and is equipped with a test circuit inside, and the test panel is equipped with various operating components. The storage area includes an open box body, which includes three side panels and a bottom panel, with the top and one side in a first direction open; the open box body also includes a horizontal bar, which has a height of a first preset height, is fixedly set on the upper surface of the bottom panel, and is located on one side in the first direction.

2. The aging test cabinet according to claim 1, characterized in that, The base plate has a recess on one side in the first direction.

3. The aging test cabinet according to claim 1, characterized in that, The storage area also includes a cable storage drawer, which is located directly below the base plate and is open on one side in the first direction.

4. The aging test cabinet according to claim 3, characterized in that, The cable storage drawer includes a baffle; the baffle is at a second preset height and is fixedly disposed above the lower surface of the cable storage drawer, located on the edge of one side in the first direction.

5. The aging test cabinet according to claim 3, characterized in that, The cable storage drawer has a cable channel on one side in the second direction.

6. The aging test cabinet according to claim 1, characterized in that, The enclosed box also includes a hinged door, which is hinged and fixed to the back panel of the enclosed box.

7. The aging test cabinet according to claim 1, characterized in that, It also includes a bottom housing located below each of the aging test units.

8. The aging test cabinet according to claim 1, characterized in that, It also includes at least four mechanical locking wheels, which are located at the four corners of the bottom of the aging test cabinet.

9. The aging test cabinet according to claim 1, characterized in that, It also includes at least two retractable feet located at the bottom of the aging test cabinet.

10. The aging test cabinet according to claim 1, characterized in that, The test panel is provided with at least one switch mounting position, indicator light mounting position, gun holder mounting position, socket assembly mounting position, wire clip assembly mounting position and banana plug mounting position, wherein the banana plug mounting position is located above the socket assembly mounting position and the wire clip assembly mounting position.

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