An electronic component testing fixture

CN224840358UActive Publication Date: 2026-10-09SHENZHEN SUTTER MICROELECTRONICS TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202521857158.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-08-29
Publication Date
2026-10-09
Estimated Expiration
2035-08-29

AI Technical Summary

Technical Problem

[0007]本实用新型提供电子元件测试治具,可以解决现有技术中传统测试治具存在的固定式探针无法自适应不同形状的电子元件的问题

Benefits of technology

[0020]本实用新型通过液压控制管调节液压室内部液压,由于所有的液压筒均与同一液压室连通,使所有的液压室压力相同,在对不同形状的电子元件进行检测时,通过液压室的液压推动液压筒内部的内杆体伸出,内杆体推动探针与电子元件的检测点接触,各个干伸缩杆体的伸缩长度不同,但是推动探针与电子元件接触压力相同,保证探针接触良好的同时,适应不同形状的电子元件;

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Abstract

The utility model relates to electronic component's testing arrangement technical field, and disclose a kind of electronic component testing fixture, including base, testing fixture is arranged on the base, testing fixture is fixedly installed with hydraulic chamber, several telescopic rod bodies are distributed on the upper part of hydraulic chamber, telescopic rod body includes hydraulic cylinder and telescopic inner rod, telescopic inner rod includes inner rod body and piston, and inner rod body is slidably connected with hydraulic cylinder.The electronic component testing fixture, the hydraulic pressure inside hydraulic chamber is adjusted by hydraulic control pipe, since all hydraulic cylinders are communicated with the same hydraulic chamber, so that all hydraulic chamber pressure is same, when detecting different shape electronic components, the inner rod body inside hydraulic cylinder is pushed out by the hydraulic pressure of hydraulic chamber, the detection point of inner rod body is contacted with probe and electronic component, the telescopic length of each telescopic rod body is different, but the contact pressure of probe and electronic component is same, ensure that probe contact is good, while, adapt to different shape electronic components.
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Description

Technical Field

[0001] This utility model relates to the technical field of testing devices for electronic components, specifically to a testing fixture for electronic components. Background Technology

[0002] Electronic component test fixtures are key equipment used to test the electrical performance and quality of electronic components. By testing parameters such as conductivity, insulation, and signal transmission of electronic components, they ensure that the components meet design standards and usage requirements.

[0003] In modern electronics manufacturing, as components become increasingly miniaturized and high-density, accurate and reliable testing is crucial for ensuring product quality and production efficiency.

[0004] Existing electronic component test fixtures typically employ a fixed probe array structure, consisting of a base, a test platform, probe modules, and a pressing mechanism. The probe module contains multiple rigid probes, which are mechanically pressed together to make contact with the component's test points for electrical testing. While this structure is simple and reliable, it has significant limitations in practical applications.

[0005] The shortcomings of traditional test fixtures are: fixed probes cannot adapt to electronic components of different shapes. When there are height differences or curvatures on the surface of the component, some probes may have excessive contact pressure, leading to accelerated wear, while others may have poor contact. At the same time, after long-term use, probe wear will further deteriorate contact reliability, affecting test accuracy and consistency, and restricting the versatility of the test fixture.

[0006] Therefore, we propose an electronic component testing fixture to address the problems mentioned above. Utility Model Content

[0007] This invention provides an electronic component testing fixture, which can solve the problem that the fixed probes in traditional testing fixtures cannot adapt to electronic components of different shapes.

[0008] To solve the above-mentioned technical problems, this utility model provides the following technical solution:

[0009] An electronic component testing fixture includes a base, on which a testing fixture is mounted. A hydraulic chamber is fixedly installed on the testing fixture. Several telescopic rods are distributed on the upper part of the hydraulic chamber. Each telescopic rod includes a hydraulic cylinder and a telescopic inner rod. The telescopic inner rod includes an inner rod body and a piston. The inner rod body is slidably connected to the hydraulic cylinder and extends to the outside of the hydraulic cylinder. The piston is slidably connected to the inside of the hydraulic cylinder. A probe is fixedly installed at one end of the inner rod body outside the hydraulic cylinder. The probe is electrically connected to the testing fixture. The ends of all hydraulic cylinders away from the inner rod bodies are connected to the inside of the hydraulic chamber. A hydraulic control pipe is fixedly connected to the side of the hydraulic chamber.

[0010] Preferably, a first electrically controlled rotating seat is fixedly installed on the test fixture, and an electric telescopic rod is fixedly installed on the first electrically controlled rotating seat.

[0011] Preferably, the electrically controlled rotating base includes a stepper motor and a bearing housing, the bearing housing being mounted on the upper part of the test fixture, and the bearing being used for the rotational connection between the electric telescopic rod and the test fixture.

[0012] Preferably, the stepper motor is fixedly installed inside the test fixture, and the shaft of the stepper motor is fixedly connected to the electric telescopic rod.

[0013] Preferably, the telescopic end of the electric telescopic rod is fixedly equipped with an adjustment seat, which is located on one side of the test fixture.

[0014] Preferably, positioning base plates are symmetrically arranged on both sides of the adjustment base, and positioning grooves are formed on the positioning base plates for placing electronic components.

[0015] Preferably, the positioning substrate has detection holes corresponding to the probe distribution.

[0016] Preferably, a pressure testing mechanism is provided above the hydraulic chamber, which is used to push the positioning substrate and electronic components closer to the probe.

[0017] Preferably, the pressure testing mechanism includes a support frame, which is located outside the test fixture and its lower end is fixedly connected to the base. A telescopic cylinder is fixedly installed in the middle of the upper end of the support frame. A pressure plate is installed at the telescopic end of the telescopic cylinder. An air cushion is provided on the side of the pressure plate near the probe. Guide blocks are provided on both sides of the pressure plate. Guide grooves that cooperate with the guide blocks are provided on both sides of the positioning base plate. A position sensing switch is provided between the guide blocks and the guide grooves.

[0018] Preferably, an automatic loading and unloading assembly is provided on the outer side of the positioning substrate. The automatic loading and unloading assembly includes a second electrically controlled rotating seat, on which an electric push rod is installed. A rotating arm is fixedly installed at the telescopic end of the electric push rod, and an electrically controlled suction cup is fixedly connected to both ends of the rotating arm. The electrically controlled suction cup is used to pick up electronic components.

[0019] Compared with the prior art, the beneficial effects achieved by this utility model are:

[0020] This invention regulates the hydraulic pressure inside the hydraulic chamber through a hydraulic control pipe. Since all hydraulic cylinders are connected to the same hydraulic chamber, the pressure in all hydraulic chambers is the same. When testing electronic components of different shapes, the hydraulic pressure in the hydraulic chamber pushes the inner rod inside the hydraulic cylinder to extend. The inner rod pushes the probe to contact the detection point of the electronic component. The extension and retraction lengths of each telescopic rod are different, but the pressure that pushes the probe to contact the electronic component is the same, ensuring good probe contact while adapting to electronic components of different shapes.

[0021] During operation, a stepper motor drives an electric telescopic rod to rotate via a shaft, causing the adjusting seat to switch positions on both sides of the positioning substrate. When one positioning substrate rotates to above the probe for testing, the other simultaneously rotates to the loading area for material loading. Simultaneously, the electric telescopic rod can raise and lower the adjusting seat, allowing the electronic components on the positioning substrate to precisely approach the probe of the test fixture for testing. This design, through rotary switching between two stations, achieves simultaneous testing and loading, significantly improving testing efficiency.

[0022] When the positioning plate rotates above the probe, the telescopic cylinder on the support frame drives the pressure plate to press down. The air cushion on the pressure plate elastically presses the component, while the guide block slides along the guide groove to ensure positioning accuracy, so that the component can stably contact the probe to complete the test. Attached Figure Description

[0023] Figure 1 This is a schematic diagram of the overall front structure of this utility model;

[0024] Figure 2 This is a schematic diagram of the unfolded structure of the test fixture of this utility model;

[0025] Figure 3 This is a schematic diagram of the overall rear structure of this utility model;

[0026] Figure 4 This is a side sectional view of the present invention.

[0027] The components include: 1. Base; 2. Test fixture; 3. Hydraulic chamber; 4. Telescopic rod; 9. Probe; 10. Hydraulic control pipe; 11. First electrically controlled rotating seat; 12. Electric telescopic rod; 13. Stepper motor; 14. Bearing seat; 15. Adjusting seat; 16. Positioning base plate; 17. Positioning groove; 18. Detection hole; 20. Support frame; 21. Telescopic cylinder; 22. Pressure plate; 23. Air cushion; 24. Guide block; 25. Guide groove; 26. Position sensing switch; 28. Second electrically controlled rotating seat; 29. ​​Electric push rod; 30. Rotating arm; 31. Electrically controlled suction cup. Detailed Implementation

[0028] The specific embodiments of this utility model are described in detail below, but it should be understood that the protection scope of this utility model is not limited to the specific embodiments.

[0029] Example 1:

[0030] Please see Figure 1-4 This utility model provides a technical solution:

[0031] An electronic component testing fixture includes a base 1, on which a testing fixture is mounted. A hydraulic chamber 3 is fixedly installed on the testing fixture. Several telescopic rods 4 are distributed on the upper part of the hydraulic chamber 3. Each telescopic rod 4 includes a hydraulic cylinder and a telescopic inner rod. The telescopic inner rod includes an inner rod body and a piston. The inner rod body is slidably connected to the hydraulic cylinder and extends to the outside of the hydraulic cylinder. The piston is slidably connected to the inside of the hydraulic cylinder. A probe 9 is fixedly installed at the end of the inner rod body located outside the hydraulic cylinder. The probe 9 is electrically connected to the testing fixture. The ends of all hydraulic cylinders furthest from the inner rod bodies are connected to the inside of the hydraulic chamber 3. A hydraulic control pipe 10 is fixedly connected to the side of the device. The hydraulic pressure inside the hydraulic chamber 3 is adjusted through the hydraulic control pipe 10. Since all hydraulic cylinders are connected to the same hydraulic chamber 3, the pressure in all hydraulic chambers 3 is the same. When testing electronic components of different shapes, the hydraulic pressure in the hydraulic chamber 3 pushes the inner rod inside the hydraulic cylinder to extend. The inner rod pushes the probe 9 to contact the detection point of the electronic component. The extension lengths of each telescopic rod 4 are different, but the pressure that pushes the probe 9 to contact the electronic component is the same, ensuring good contact of the probe 9 while adapting to electronic components of different shapes.

[0032] In the above scheme, a hydraulic chamber 3 is fixedly installed on the test fixture 2 on the base 1. Multiple telescopic rods 4 are distributed on the hydraulic chamber 3. Each telescopic rod 4 consists of a hydraulic cylinder and a telescopic inner rod. The telescopic inner rod includes an inner rod body and a piston. The inner rod body slides to the outside of the hydraulic cylinder and mounts a probe 9. The piston slides inside the hydraulic cylinder. All hydraulic cylinders are connected to the hydraulic chamber 3. The pressure in the hydraulic chamber 3 is adjusted through the hydraulic control pipe 10 to ensure uniform pressure in each hydraulic cylinder. During testing, the hydraulic pressure in the hydraulic chamber 3 pushes the piston, causing the inner rod body to extend the probe 9. Due to the uniform hydraulic pressure, each probe 9 can adaptively contact the detection points of electronic components of different shapes with the same pressure, ensuring good electrical connection while adapting to surface undulations of the components.

[0033] A first electrically controlled rotating seat 11 is fixedly mounted on the test fixture, and an electric telescopic rod 12 is fixedly mounted on the first electrically controlled rotating seat 11. The electric telescopic rod 12 is rotated by the first electrically controlled rotating seat 11. The electrically controlled rotating seat includes a stepper motor 13 and a bearing seat 14. The bearing seat 14 is mounted on the upper part of the test fixture, and the bearing is used for the rotational connection between the electric telescopic rod 12 and the test fixture. The stepper motor 13 is fixedly mounted inside the test fixture, and the rotating shaft of the stepper motor 13 is fixedly connected to the electric telescopic rod 12. An adjusting seat 15 is fixedly mounted on the telescopic end of the electric telescopic rod 12, and the adjusting seat 15 is located on one side of the test fixture.

[0034] Positioning base plates 16 are symmetrically arranged on both sides of the adjustment base 15. Positioning base plates 16 have positioning grooves 17 for placing electronic components. Detection holes 18 corresponding to the distribution of probes 9 are also provided on the positioning base plates 16.

[0035] The electric telescopic rod 12 pushes the adjusting seat 15 to adjust its height. The adjusting seat 15 drives the electronic components inside the positioning base plate 16 and positioning groove 17 to move closer to the probe 9 on the test fixture for electronic component detection. The first electrically controlled rotating seat 11 drives the electric telescopic rod 12 and adjusting seat 15 to rotate. The electronic components inside the positioning base plate 16 and positioning groove 17 rotate with the adjusting seat 15. Since the positioning base plate 16 is symmetrically arranged on both sides of the adjusting seat 15, the position of the two positioning base plates 16 can be switched. When one positioning base plate 16 is above the probe 9, the other positioning base plate 16 is in the feeding area, thereby realizing the simultaneous operation of detection and feeding and improving detection efficiency.

[0036] In the above scheme, the first electrically controlled rotating seat 11 installed on the test fixture 2 drives the electric telescopic rod 12 to rotate. The telescopic end of the electric telescopic rod 12 is connected to the adjusting seat 15. The adjusting seat 15 has symmetrically arranged positioning base plates 16 with positioning grooves 17 on both sides. The positioning base plates 16 have detection holes 18 corresponding to the probes 9. During operation, the stepper motor 13 drives the electric telescopic rod 12 to rotate through the rotating shaft, so that the adjusting seat 15 drives the positioning base plates 16 on both sides to switch positions. When one positioning base plate 16 rotates to the position above the probe 9 for detection, the other synchronously rotates to the loading area for loading. At the same time, the electric telescopic rod 12 can push the adjusting seat 15 up and down, so that the electronic components on the positioning base plate 16 are precisely close to the probes 9 of the test fixture 2 to complete the detection. This design achieves synchronous operation of detection and loading by rotating and switching dual positions, which significantly improves the detection efficiency.

[0037] Example 2:

[0038] Please see Figure 1-4 Furthermore, in conjunction with Embodiment 1, it is further found that a pressure testing mechanism is provided above the hydraulic chamber 3, which is used to push the positioning substrate 16 and electronic components closer to the probe 9.

[0039] The pressure testing mechanism includes a support frame 20, which is located outside the test fixture and its lower end is fixedly connected to the base 1. A telescopic cylinder 21 is fixedly installed in the middle of the upper end of the support frame 20. A pressure plate 22 is installed at the telescopic end of the telescopic cylinder 21. An air cushion 23 is provided on the side of the pressure plate 22 near the probe 9. Guide blocks 24 are provided on both sides of the pressure plate 22. Guide grooves 25 that cooperate with the guide blocks 24 are provided on both sides of the positioning base plate 16. A position sensing switch 26 is provided between the guide blocks 24 and the guide grooves 25.

[0040] The pressure plate 22 covers the upper part of the positioning substrate 16. The air cushion 23 on the pressure plate 22 contacts the upper surface of the electronic component. Due to the elasticity of the air cushion 23, it is suitable for electronic components of different shapes, and applies pressure evenly to the electronic component to ensure its balance and stability.

[0041] An automatic loading and unloading assembly is provided on the outside of the positioning substrate 16. The automatic loading and unloading assembly includes a second electrically controlled rotating seat 28. An electric push rod 29 is installed on the second electrically controlled rotating seat 28. A rotating arm 30 is fixedly installed on the telescopic end of the electric push rod 29. An electrically controlled suction cup 31 is fixedly connected to both ends of the rotating arm 30. The electrically controlled suction cup 31 is used to pick up electronic components.

[0042] In the above scheme, when the positioning substrate 16 rotates above the probe 9, the telescopic cylinder 21 on the support frame 20 drives the pressure plate 22 to press down. The guide blocks 24 on both sides of the pressure plate 22 slide along the guide groove 25 of the positioning substrate 16 to ensure accurate alignment. At the same time, the position sensing switch 26 detects the positioning signal, thereby activating the electric telescopic rod 12 to retract synchronously, causing the positioning substrate 16 to descend. The air cushion 23 at the bottom of the pressure plate 22 contacts the upper surface of the electronic component, adapting to the shape of the component through elastic deformation and applying pressure evenly, so that the electronic component stably contacts the probe 9 to complete the test. Meanwhile, the positioning substrate 16 on the other side is in the loading station. The second electrically controlled rotating seat 28 drives the electric push rod 29 and the rotating arm 30 to rotate. The electrically controlled suction cups 31 at both ends of the rotating arm 30 work alternately: one suction cup picks up a new component from the feeding area, and the other suction cup places the tested component into the unloading area, realizing fully automatic cyclic loading and unloading. The entire process achieves efficient and continuous automated testing operations through the coordinated cooperation of dual-station rotation switching, flexible pressure testing with air cushion 23, and synchronous loading and unloading with robotic arms.

[0043] The working principle of this electronic component testing fixture is as follows: The hydraulic chamber 3 installed on the testing fixture 2 adjusts the pressure through the hydraulic control pipe 10, causing the pistons in all hydraulic cylinders to synchronously push the telescopic inner rod, driving the probe 9 to adaptively contact the electronic component detection point with the same pressure. The first electrically controlled rotating seat 11 drives the electric telescopic rod 12 to rotate through the stepper motor 13, causing the positioning plates 16 on both sides to switch between the testing station and the loading station. When the positioning plate 16 rotates above the probe 9, the telescopic cylinder 21 on the support frame 20 drives the pressure plate 22 to press down. The air cushion 23 on the pressure plate 22 elastically presses the component, while the guide block 24 slides along the guide groove 25 to ensure positioning accuracy, so that the component stably contacts the probe 9 to complete the test. The other positioning plate 16 synchronously rotates to the loading station, and the second electrically controlled rotating seat 28 drives the rotating arm 30 to rotate. The electrically controlled suction cups 31 at both ends of the rotating arm 30 perform the picking and unloading actions respectively, realizing automatic loading and unloading.

[0044] The above-disclosed embodiments are only a few specific examples of the present utility model. However, the embodiments of the present utility model are not limited thereto. Any changes that can be conceived by those skilled in the art should fall within the protection scope of the present utility model.

Claims

1. An electronic component testing fixture, comprising a base (1), characterized in that: A test fixture is provided on the base (1), and a hydraulic chamber (3) is fixedly installed on the test fixture. Several telescopic rods (4) are distributed on the upper part of the hydraulic chamber (3). The telescopic rod (4) includes a hydraulic cylinder and a telescopic inner rod. The telescopic inner rod includes an inner rod body and a piston. The inner rod body is slidably connected to the hydraulic cylinder and extends to the outside of the hydraulic cylinder. The piston is slidably connected to the inside of the hydraulic cylinder. A probe (9) is fixedly installed at one end of the inner rod body located outside the hydraulic cylinder. The probe (9) is electrically connected to the test fixture. The ends of all hydraulic cylinders away from the inner rod body are connected to the inside of the hydraulic chamber (3). A hydraulic control pipe (10) is fixedly connected to the side of the hydraulic chamber (3).

2. The electronic component testing fixture according to claim 1, characterized in that: The test fixture is fixedly mounted with a first electrically controlled rotating seat (11), and an electric telescopic rod (12) is fixedly mounted on the first electrically controlled rotating seat (11).

3. The electronic component testing fixture according to claim 2, characterized in that: The electrically controlled rotating base includes a stepper motor (13) and a bearing housing (14). The bearing housing (14) is mounted on the upper part of the test fixture, and the bearing is used for the rotational connection between the electric telescopic rod (12) and the test fixture.

4. The electronic component testing fixture according to claim 3, characterized in that: The stepper motor (13) is fixedly installed inside the test fixture, and the shaft of the stepper motor (13) is fixedly connected to the electric telescopic rod (12).

5. The electronic component testing fixture according to claim 4, characterized in that: The telescopic end of the electric telescopic rod (12) is fixedly equipped with an adjustment seat (15), which is located on one side of the test fixture.

6. The electronic component testing fixture according to claim 5, characterized in that: The adjustment base (15) is symmetrically provided with positioning base plates (16) on both sides. Positioning base plates (16) are provided with positioning grooves (17) for placing electronic components.

7. The electronic component testing fixture according to claim 6, characterized in that: The positioning substrate (16) has detection holes (18) that correspond to the distribution of the probes (9).

8. The electronic component testing fixture according to claim 1, characterized in that: A pressure testing mechanism is provided above the hydraulic chamber (3), which is used to push the positioning substrate (16) and electronic components closer to the probe (9).

9. The electronic component testing fixture according to claim 8, characterized in that: The pressure testing mechanism includes a support frame (20), which is located outside the test fixture and its lower end is fixedly connected to the base (1). A telescopic cylinder (21) is fixedly installed in the middle of the upper end of the support frame (20). A pressure plate (22) is installed at the telescopic end of the telescopic cylinder (21). An air cushion (23) is provided on the side of the pressure plate (22) close to the probe (9). Guide blocks (24) are provided on both sides of the pressure plate (22). Guide grooves (25) that cooperate with the guide blocks (24) are provided on both sides of the positioning base plate (16). A position sensing switch (26) is provided between the guide blocks (24) and the guide grooves (25).

10. An electronic component testing fixture according to claim 9, characterized in that: An automatic loading and unloading assembly is provided on the outside of the positioning substrate (16). The automatic loading and unloading assembly includes a second electrically controlled rotating seat (28). An electric push rod (29) is installed on the second electrically controlled rotating seat (28). A rotating arm (30) is fixedly installed on the telescopic end of the electric push rod (29). An electrically controlled suction cup (31) is fixedly connected to both ends of the rotating arm (30). The electrically controlled suction cup (31) is used to pick up electronic components.