Energy storage device hardware-in-the-loop test device based on battery analog channel multiplexing

Abstract

The utility model discloses a kind of hardware-in-the-loop test devices of energy storage equipment based on battery simulation channel multiplexing, comprising: mainframe cabinet, slave board car and slave cabinet;The mainframe cabinet is electrically connected with slave cabinet by slave board car;The mainframe cabinet is used to control the voltage simulation channel number and different channel simulated voltage of slave cabinet;The slave cabinet is used to provide battery cell simulation channel and temperature simulation channel.Affirmative effect: this flexibility greatly expands the application range of single test device.In multiplexing scheme, it is specially ensured that the sampling signal of at least one BMU (such as BMU1) is independent, and is not multiplexed with other BMUs.

Description

Technical Field

[0001] This utility model relates to the field of new energy, and in particular to a hardware-in-the-loop testing device for energy storage equipment based on battery simulation channel reuse. Background Technology

[0002] Hardware-in-the-loop (HIL) testing is a crucial step in the development and validation of a battery management system (BMS). It uses a battery simulator to simulate the voltage and temperature signals of each cell in a real battery pack, replacing the actual battery, thereby enabling thorough and safe testing of the BMS's functionality, performance, and reliability in a laboratory environment.

[0003] Currently, among the closest existing technical solutions in the industry, the construction of HIL testing equipment follows a strict one-to-one correspondence. That is, each cell simulation channel of the battery simulator is individually and uniquely associated with and connected to a sampling channel of a slave control unit (BMU) in the BMS.

[0004] Existing technological limitations: Due to the large number of battery cells that an energy storage BMS needs to manage, existing HIL (High-Intensity Interval) testing equipment must have a massive number of battery simulator channels. This rigid "one-to-one" connection method results in an exceptionally large hardware scale and physical volume for HIL testing equipment. Furthermore, the expensive battery simulator hardware constitutes a major portion of project expenditures. For example, to simulate the aforementioned 384 battery cells, even with highly integrated racks, multiple slave racks are often required to meet the channel requirements. This not only significantly increases equipment purchase costs but also occupies a large amount of laboratory space, restricting testing efficiency and deployment flexibility. Utility Model Content

[0005] Purpose of the utility model: The purpose of this utility model is to solve the problems in the prior art and provide a hardware-in-the-loop test device for energy storage devices based on battery simulation channel reuse.

[0006] Technical solution: A hardware-in-the-loop test device for energy storage devices based on battery simulated channel reuse is proposed, comprising:

[0007] Main unit cabinet, slave cart, and slave cabinet;

[0008] The main cabinet is electrically connected to the slave cabinet via a trolley.

[0009] The main cabinet is used to control the number of voltage simulation channels of the slave cabinet and the voltage values ​​simulated by different channels. In addition, the main cabinet also provides power to the device under test (BMU) (some BMUs require an external power supply, which is provided by the main cabinet).

[0010] The slave cabinet is used to provide cell simulation channels and temperature simulation channels;

[0011] in,

[0012] The slave cart is equipped with HARTING connectors and terminal blocks. The HARTING connectors and terminal blocks are electrically connected to the external BMU slave control board and slave cabinet, respectively, so that the cell simulation channel and temperature simulation channel can be multiplexed and connected to the BMU slave control board by manually plugging and unplugging the HARTING connectors into the terminal blocks.

[0013] Preferably, the slave cabinet is provided with three HARTING connection slots, the slave cart is provided with three HARTING connection slots, and the slave cabinets are electrically connected to each other via three HARTING connection lines.

[0014] Preferably, the main unit cabinet is provided with a HARTING connection slot, the slave trolley is provided with a HARTING connection slot, and the main unit cabinet is electrically connected to the slave trolley via a HARTING connection cable.

[0015] Preferably, the slave cabinet includes a battery cell analog power supply and a temperature analog board;

[0016] Each cell simulation power supply has a cell simulation channel, and each channel can simulate cell voltage between 0 and 6V;

[0017] The temperature simulation board integrates a RES temperature simulation channel for simulating cell temperature.

[0018] Preferably, the trolley includes a first terminal block, a second terminal block, a third terminal block, and a fourth terminal block;

[0019] The three HARTING connection slots connected to the slave cabinet are respectively connected to the plug-in components that can be inserted into the first terminal block, the second terminal block, the third terminal block and the fourth terminal block on the slave cart;

[0020] The first terminal block, the second terminal block, and the third terminal block are electrically connected to the external BMU slave control board through three HARTINGs, respectively, to provide the required multi-channel voltage and temperature sampling to the BMU slave control board.

[0021] The fourth terminal block is connected to the main unit cabinet via a HARTING connection slot, so that the main unit cabinet and the slave unit cabinet can be connected.

[0022] Preferably, the first terminal block is connected to a HARTING battery analog channel slot;

[0023] The second terminal block passes through a HARTING first temperature simulation channel slot;

[0024] The third terminal block is connected to a HARTING second temperature simulation channel slot.

[0025] Preferably, the main unit cabinet includes a power management module and a CAN communication module;

[0026] The power management module and the CAN communication module are both electrically connected to the slave cabinet via a connection cable connected to the slave cart, and are used to adjust the parameters of the cell simulation channel and the temperature simulation channel.

[0027] Beneficial effects:

[0028] Coverage of a large number of BMS sampling channels has been achieved with minimal hardware. What previously required multiple slave cabinets can now be implemented with just one slave cabinet and a simple slave cart. This significantly reduces the footprint and physical size of the entire HIL test setup, saving valuable laboratory space. The manually configurable terminal blocks inside the slave cart allow for flexible connections between analog channels and BMU sampling channels. When the architecture of the BMS under test changes (e.g., the number of BMUs or channels), there's no need to purchase new simulator hardware; engineers can simply rewire the slave cart to quickly and cost-effectively adapt to new testing requirements. This flexibility greatly expands the application scope of a single test setup. In the multiplexing scheme, at least one BMU (e.g., BMU1) is intentionally ensured to have an independent sampling signal, not multiplexed with other BMUs. This design ensures that the test setup can still perfectly execute test cases that require independent changes to the voltage of individual cells (e.g., simulating overvoltage or undervoltage faults in a specific cell), thus guaranteeing that the coverage and accuracy of the test cases remain unaffected. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of the system structure of this utility model;

[0030] Figure 2 This is a schematic diagram of the main unit cabinet structure of this utility model;

[0031] Figure 3 This is a schematic diagram of the specific structure of the main unit cabinet and the slave unit cabinet of this utility model;

[0032] Figure 4 This is a schematic diagram of the structure of this utility model from one side of the flatbed cart;

[0033] Figure 5 This is a schematic diagram of the structure of this utility model from the other side of the flatbed cart;

[0034] Figure 6This is a schematic diagram of the internal structure of the flatbed cart of this utility model;

[0035] Figure 7 This is a schematic diagram of the connection structure of the main unit cabinet, slave cart, and slave cabinet of this utility model;

[0036] Figure 8 This is a schematic diagram of the terminal block structure of this utility model.

[0037] Figure label:

[0038] 1. Main unit cabinet; 2. Slave cart; 3. Slave cabinet; 4. BMU slave control board; 5. HARTING45 connection slot; 6. Temperature simulation board; 7. Cell simulation power supply; 8. First terminal block; 9. Second terminal block; 10. Third terminal block; 11. Fourth terminal block; 12. Battery simulation channel slot; 13. First temperature simulation channel slot; 14. Second temperature simulation channel slot; 15. Power management module; 16. CAN communication module. Detailed Implementation

[0039] To make the technical solution of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0040] Example 1

[0041] To make the technical solution of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0042] To make the objectives, technical solutions, and advantages of this utility model clearer, the technical solutions in the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model. Unless otherwise defined, the technical or scientific terms used herein should have the ordinary meaning understood by one of ordinary skill in the art to which this utility model pertains. The terms "comprising" and similar expressions used herein mean that the element or object preceding the word covers the element or object listed following the word and its equivalents, but does not exclude other elements or objects.

[0043] In response to the problems existing in the current technology, combined with Figure 1 and Figure 7 A hardware-in-the-loop testing device for energy storage devices based on battery simulated channel multiplexing, characterized in that it includes:

[0044] Main unit cabinet 1, slave cart 2, and slave unit cabinet 3;

[0045] The main cabinet 1 is electrically connected to the slave cabinet 3 via the slave cart 2;

[0046] The main cabinet 1 is used to control the number of voltage analog channels of the slave cabinet 3 and the voltage values ​​simulated by different channels;

[0047] The slave cabinet 3 is used to provide cell simulation channels and temperature simulation channels;

[0048] in,

[0049] The slave carriage 2 is equipped with a HARTING connector and a terminal block. The HARTING connector and the terminal block are electrically connected to the external BMU slave control board 4 and the slave cabinet 3, respectively, so that the cell simulation channel and temperature simulation channel can be multiplexed and connected to the BMU slave control board 4 by manually plugging and unplugging the HARTING connector on the terminal block.

[0050] Specifically, based on the requirements, the main unit cabinet 1 controls the corresponding number of power supplies and voltage values ​​of the corresponding channels from the board 2, so that different voltages can be freely plugged in according to the requirements later.

[0051] The board 2 is connected to the BMU slave control board 4 for testing, which facilitates the provision of voltage, temperature and voltage values ​​for different channels to the BMU slave control board 4;

[0052] Compared to the existing single use of the board 2, this application, through the use of existing connectors and terminal blocks, can freely combine and reuse the voltage and temperature generated by the host, and thus can reuse more power and voltage channels for use by the BMU slave control board 4.

[0053] In some specific embodiments, the slave cabinet 3 is provided with three HARTING150 connection slots, the slave cart 2 is provided with three HARTING150 connection slots, and the slave cabinet 3 and the slave cabinet 3 are electrically connected through three HARTING connection lines.

[0054] Specifically, such as Figure 4 As shown and as Figure 6 As shown, Figure 4 The three HARTING150 connector slots and Figure 6The three HARTING150 connection slots correspond to each other, respectively acquiring the temperature analog signal and voltage analog signal generated by cabinet 3. From left to right in the figure, the HARTING150 slave cabinet 3 144 series battery cell resources are directly connected to the broadcast device of board 2, the HARTING150 slave cabinet 3 NTC1-64 resources plus two CAN channels are directly connected to the broadcast device of board 2, and the HARTING150 slave cabinet 3 NTC65-128 resources are directly connected to the connector of board 2.

[0055] In some specific embodiments, the main unit cabinet 1 is provided with a HARTING45 connection slot 5, the slave cart 2 is provided with a HARTING45 connection slot 5, and the main unit cabinet 1 is electrically connected to the slave cart 2 through a HARTING connection cable.

[0056] Specifically, in combination Figure 2 and Figure 5 , is the connecting slot for connecting to the flatbed 2.

[0057] In some specific embodiments, the slave cabinet 3 includes six battery cell analog power supplies 7 and a temperature analog board 6;

[0058] Each cell simulation power supply 7 has 24 cell simulation channels, and each channel can simulate cell voltage between 0 and 6V.

[0059] The temperature simulation board 6 integrates 128 RES temperature simulation channels for simulating cell temperature.

[0060] Specifically, such as Figure 3 and Figure 7 The single slave unit 3 simulates the power channel signal, the voltage value simulated according to the requirements, and the temperature channel signal, and connects to the terminal block on the slave unit 2 through three HARTING150 connection slots.

[0061] In some specific embodiments, the trolley 2 includes a first terminal block 8, a second terminal block 9, a third terminal block 10, and a fourth terminal block 11;

[0062] The three HARTING150 connection slots connected to the slave cabinet 3 are respectively connected to the slave cart 2 to the plugs that can be inserted into the first terminal block 8, the second terminal block 9, the third terminal block 10 and the fourth terminal block 11;

[0063] The first terminal block 8, the second terminal block 9, and the third terminal block 10 are electrically connected to the external BMU slave control board 4 via three HARTING150 devices to provide the required multi-channel voltage and temperature sampling to the BMU slave control board 4.

[0064] The fourth terminal block 11 is connected to the main unit cabinet 1 through a HARTING45 connection slot 5, so that the main unit cabinet 1 and the slave unit cabinet 3 can be connected.

[0065] Specifically, such as Figure 5 , Figure 8 The first terminal block 8 connects 7 HARTING150 units in parallel with NTC65-128; the second terminal block 9 connects 7 HARTING150 units in parallel with NTC1-64; the third terminal block 10 connects 7 HARTING150 units in parallel with CELL1-144; and the fourth terminal block 11 connects 1 HARTING42 main cabinet resource.

[0066] In some specific embodiments, the first terminal block 8 passes through 7 HARTING150 battery analog channel slots 12;

[0067] The second terminal block 9 passes through 7 HARTING150 first temperature simulation channel slots 13;

[0068] The third terminal block 10 is connected to seven HARTING150 second temperature simulation channel slots 14.

[0069] Specifically, there are 7 HARTING150 parallel first temperature simulation channel slots 13NTC65-128, 7 HARTING150 parallel second temperature simulation channel slots 14NTC1-64, and 7 HARTING150 parallel battery simulation channel slots 12Cell 1-144.

[0070] In some specific embodiments, the main unit cabinet 1 includes a power management module 15 and a CAN communication module 16;

[0071] The power management module 15 and the CAN communication module 16 are both electrically connected to the slave cabinet 3 via a connection cable connected to the slave cart 2, and are used to adjust the parameters of the cell simulation channel and the temperature simulation channel.

[0072] For example:

[0073] Take a large-scale energy storage battery management system (BMS) with one master control unit and 24 slave control units (BMUs), and each BMU has 16 cell sampling channels as an example.

[0074] Limitations of traditional HIL testing solutions:

[0075] Based on the traditional one-to-one connection method, this test system requires the configuration of battery simulation channels that correspond exactly to the number of BMU sampling channels, i.e., 24 (number of BMUs) × 16 (channels per BMU) = 384 cell simulation channels. If a single slave rack can accommodate 144 simulation channels, then a total of 3 slave racks are needed to meet the requirements, resulting in a large size and high cost for the entire HIL test device.

[0076] The reuse scheme of this invention:

[0077] This invention achieves the reuse of battery simulation channels through its designed slave rack, enabling testing of all 24 BMUs using no more than 144 cell simulation channels (requiring only one slave rack). The specific reuse strategy is as follows (please refer to...). Figure 8 (as shown)

[0078] Independent Channel Groups: The 16 sampling channels of BMU1 independently use cell simulation channels 1 to 16. This design ensures a completely independent testing environment for test cases that require individual changes to the voltage of a single cell (such as accuracy verification or single-cell fault simulation), guaranteeing the accuracy of test results.

[0079] Multiplexing Channel Group: The remaining 23 BMUs (BMU2 to BMU24) share the cell analog channel in a grouped parallel configuration. The grouping strategy strictly adheres to the drive capability limit of a single analog channel (in this example, the number of parallel connections does not exceed 7), and the specific connection relationship is as follows:

[0080] BMU2 to BMU8: The sampling inputs of these 7 BMUs are connected in parallel to the cell analog channels 17 to 32.

[0081] BMU9 to BMU12: The sampling inputs of these four BMUs are connected in parallel to the cell analog channels 33 to 48.

[0082] BMU13 to BMU16: The sampling inputs of these four BMUs are connected in parallel to the cell analog channels 49 to 64.

[0083] BMU17 to BMU20: The sampling inputs of these four BMUs are connected in parallel to the cell analog channels 65 to 80.

[0084] BMU21 to BMU24: The sampling inputs of these four BMUs are connected in parallel to the cell analog channels 81 to 96.

[0085] Through the aforementioned reuse scheme, this invention achieves coverage of 384 sampling points using only 96 cell simulation channels, reducing the number of simulation channels to one-quarter of that in traditional schemes. This scheme has been applied and verified in actual testing projects, and can meet the various functional testing requirements of energy storage BMS. Furthermore, the connection relationships can be flexibly adjusted via the terminal blocks on the board, enabling the device to quickly adapt to BMS architectures of different types, greatly improving the equipment's versatility and economy.

[0086] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A hardware-in-the-loop testing device for energy storage devices based on battery simulated channel reuse, characterized in that, include: The main unit cabinet (1), the slave cart (2), and the slave cabinet (3); The main cabinet (1) is electrically connected to the slave cabinet (3) via the slave cart (2); The main cabinet (1) is used to control the number of voltage simulation channels and the voltage values ​​simulated by different channels of the slave cabinet (3); The slave cabinet (3) is used to provide cell simulation channels and temperature simulation channels; in, The slave cart (2) is equipped with a HARTING connector and a terminal block. The HARTING connector and the terminal block are electrically connected to the external BMU slave control board (4) and the slave cabinet (3) respectively, so that the cell simulation channel and temperature simulation channel can be connected to the BMU slave control board (4) by manually plugging the HARTING connector into the terminal block.

2. The hardware-in-the-loop testing device for energy storage devices based on battery simulation channel multiplexing according to claim 1, characterized in that, The slave cabinet (3) is provided with three HARTING150 connection slots, and the slave cart (2) is provided with three HARTING150 connection slots. The slave cabinet (3) and the slave cabinet (3) are electrically connected through three HARTING connection lines.

3. The hardware-in-the-loop testing device for energy storage devices based on battery simulation channel multiplexing according to claim 2, characterized in that, The main unit cabinet (1) is provided with a HARTING45 connection slot (5), and the slave cart (2) is provided with a HARTING45 connection slot (5). The main unit cabinet (1) is electrically connected to the slave cart (2) through a HARTING connection line.

4. The hardware-in-the-loop testing device for energy storage devices based on battery simulation channel multiplexing according to claim 1, characterized in that, The slave cabinet (3) includes 6 battery cell simulation power supplies (7) and a temperature simulation board (6); Each cell simulation power supply (7) has 24 cell simulation channels, and each channel can simulate cell voltage between 0 and 6V. The temperature simulation board (6) integrates 128 RES temperature simulation channels for simulating cell temperature.

5. The hardware-in-the-loop testing device for energy storage devices based on battery simulation channel multiplexing according to claim 3, characterized in that, The trolley (2) includes a first terminal block (8), a second terminal block (9), a third terminal block (10), and a fourth terminal block (11). The three HARTING150 connection slots connected to the slave cabinet (3) are respectively connected to the slave cart (2) to the plugs that can be inserted into the first terminal block (8), the second terminal block (9), the third terminal block (10) and the fourth terminal block (11); The first terminal block (8), the second terminal block (9), and the third terminal block (10) are electrically connected to the external BMU slave control board (4) through three HARTING150s, respectively, so as to provide the required multi-channel voltage sampling and temperature sampling to the BMU slave control board (4); The fourth terminal block (11) is connected to the main unit cabinet (1) through a HARTING45 connection slot (5) so that the main unit cabinet (1) and the slave unit cabinet (3) can be connected.

6. The hardware-in-the-loop testing device for energy storage devices based on battery simulation channel multiplexing according to claim 5, characterized in that, The first terminal block (8) passes through 7 HARTING150 battery analog channel slots (12); The second terminal block (9) passes through 7 HARTING150 first temperature simulation channel slots (13); The third terminal block (10) passes through seven HARTING150 second temperature simulation channel slots (14).

7. The hardware-in-the-loop testing device for energy storage devices based on battery simulation channel multiplexing according to claim 1, characterized in that, The main unit cabinet (1) includes a power management module (15) and a CAN communication module (16). The power management module (15) and the CAN communication module (16) are both electrically connected to the slave cabinet (3) via a connecting line connected to the slave cart (2) and are used to adjust the parameters of the cell simulation channel and the temperature simulation channel.

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