Aging test circuit and aging test device for multiple devices

Abstract

The application provides an aging test circuit and an aging test device for multiple devices. The aging test circuit comprises: multiple devices under test connected in series through a line assembly and connected to a test voltage end; a load connected in series with each device under test through the line assembly; multiple aging test stations connected to corresponding devices under test to obtain test conditions of the corresponding devices under test; and multiple bypass switch assemblies connected in parallel across the corresponding devices under test. When the devices under test work normally, the corresponding bypass switch assemblies are disconnected. When the devices under test work abnormally, the corresponding bypass switch assemblies are connected. When the devices under test fail during the aging test, the bypass switch assemblies provide a bypass circuit to ensure the circulation of current, improve the aging test efficiency, and reduce the aging test cost.

Description

Technical Field

[0001] This application belongs to the field of circuit testing technology, and relates to an aging test technology, particularly an aging test circuit and aging test device for multiple devices. Background Technology

[0002] Aging testing refers to the process of simulating the operating conditions of electronic devices and testing their total operating time to evaluate the durability of electronic devices. To improve testing efficiency and reduce testing costs, multiple electronic devices under test are usually connected in series in an aging test circuit to achieve batch aging testing of multiple devices.

[0003] It should be noted that, because the devices under test (DUTs) are connected in series, if any DUT fails and causes an open circuit, the current loop of the entire aging test circuit will be broken, resulting in test interruption. In this case, manual troubleshooting and reconfiguration of the test circuit are usually required to continue testing. However, for the systematic testing of large batches of devices, reconfiguring the test circuit requires a significant amount of time and manpower, resulting in low efficiency, high cost, and inconvenience in aging testing.

[0004] Therefore, how to quickly and conveniently restore the operation of the aging test circuit when the device under test is disconnected is a technical problem that urgently needs to be solved by those skilled in the art. Summary of the Invention

[0005] The purpose of this application is to provide an aging test circuit and aging test device for multiple devices, in order to solve the problem in the prior art that when the devices under test are connected in series for aging test, the failure of individual devices will cause circuit interruption, requiring circuit reconstruction to continue the test, which results in high time and labor costs.

[0006] In a first aspect, this application provides an aging test circuit, comprising: a plurality of devices under test (DUTs) connected in series via a circuit assembly and connected to a test voltage terminal; a load connected in series with each of the DUTs via the circuit assembly; a plurality of aging test benches respectively connected to the corresponding DUTs to obtain the test status of the corresponding DUTs; and a plurality of bypass switch assemblies respectively connected in parallel across the two ends of the corresponding DUTs; when the DUTs are working normally, the corresponding bypass switch assembly is open; when the DUTs malfunction, the corresponding bypass switch assembly is closed.

[0007] In one embodiment of this application, a single bypass switch assembly includes: at least one electromagnetic relay, one end of the electromagnetic coil of the electromagnetic relay being grounded, and the two ends of the contact switch of the electromagnetic relay being respectively connected to the two ends of the corresponding device under test; and a control switch connected between an external power supply and the other end of the electromagnetic coil.

[0008] In one embodiment of this application, the control switch is a holding switch.

[0009] In one embodiment of this application, the device under test is a charging pile; the circuit assembly includes multiple circuits, and each charging pile is connected to each circuit; a single bypass switch assembly includes multiple electromagnetic relays, and the electromagnetic coils of each electromagnetic relay are connected in parallel between the control switch and the grounding terminal; the two ends of the contact switches of each electromagnetic relay are respectively connected to each circuit, corresponding to the two ends of the device under test.

[0010] In one embodiment of this application, the bypass switch assembly further includes a display element connected between the external power supply and the electromagnetic relay; the electromagnetic relay further includes a display switch, one end of which is connected to the display element and the other end is grounded.

[0011] In one embodiment of this application, the bypass switch assembly further includes a display element connected in series between the external power supply and each of the electromagnetic relays; each of the electromagnetic relays includes a display switch, and each of the display switches is connected in series between the display element and a ground terminal.

[0012] In one embodiment of this application, the circuit assembly further includes a grounding protection wire, which is connected in series with each of the devices under test and the load.

[0013] In one embodiment of this application, the device under test is provided with an internal switching assembly.

[0014] In one embodiment of this application, the internal switch assembly includes at least one internal switch, and the internal switch corresponds one-to-one with each line of the circuit assembly.

[0015] Secondly, this application provides an aging test device, wherein the aging test circuit inside the aging test device is the aging test circuit as described above.

[0016] As described above, this application provides an aging test circuit and aging test device for multiple devices. By using a bypass switch component, a bypass circuit is provided when each device under test fails during aging testing to ensure current flow. Aging tests of other devices under test can be resumed without circuit reconstruction, avoiding the large time and manpower costs required for circuit reconstruction, improving aging test efficiency, reducing aging test costs, and achieving good aging test results. Attached Figure Description

[0017] Figure 1 The diagram shown is a structural schematic of an aging test circuit according to an embodiment of this application.

[0018] Figure 2 The diagram shown is a structural schematic of a bypass switch assembly according to an embodiment of this application.

[0019] Figure 3 The diagram shown is a structural schematic of another bypass switch assembly described in an embodiment of this application.

[0020] Figure 4 The diagram shown is a structural schematic of another aging test circuit described in an embodiment of this application.

[0021] Explanation of reference numerals in the attached figures

[0022] 10: Circuit assembly; 11: Grounding protection wire; 20: Device under test; 21: Internal switch assembly; 211: Internal switch; 30: Load; 40: Bypass switch assembly; 41: Control switch; 42: Electromagnetic relay; 421: Electromagnetic coil; 422: Contact switch; 423: Display switch; 43: Display component. Detailed Implementation

[0023] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0024] It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this application. Therefore, the drawings only show the components related to this application and are not drawn according to the actual number, shape and size of the components in the actual implementation. In the actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0025] Existing aging test circuits for electronic devices often connect multiple devices under test (DUTs) in series to achieve batch testing. However, when one or more DUTs in the series circuit fail, the test circuit will break, leading to test interruption. To resume testing, staff need to reconstruct the circuit, resulting in high time and labor costs for aging tests. This, in turn, leads to higher production costs for the DUTs, hindering their practical application.

[0026] To address the technical problems existing in the prior art, the following embodiments of this application provide an aging test circuit and aging test device for multiple devices. By setting a bypass switch component to close when the device under test fails, the bypass switch component replaces the faulty device under test to provide a current path, thereby keeping the aging test circuit open without the need to reconstruct the circuit to continue the aging test of each device under test, effectively improving the testing efficiency of the devices and reducing the testing cost of the devices.

[0027] The following embodiments of this application provide an aging test circuit and aging test device for multiple devices, including but not limited to aging tests of electronic devices such as charging piles, relays, AC contactors, DC contactors, and wireless signal smart switches. To facilitate understanding of the technical solution of this application, the following description will take the aging test of a charging pile as an example.

[0028] The following will describe in detail, with reference to the accompanying drawings, the principle and implementation of an aging test circuit and aging test device for multiple devices according to this embodiment, so that those skilled in the art can understand the aging test circuit and aging test device for multiple devices according to this embodiment without creative effort.

[0029] like Figure 1 As shown, this embodiment provides an aging test circuit for realizing batch aging tests of multiple devices. Specifically, the aging test circuit includes several devices under test 20 and a load 30 connected in series through a circuit assembly 10. Each device under test 20 is connected to a corresponding aging test bench (not shown in the figure), and the two ends of each device under test 20 are connected together through a corresponding bypass switch assembly 40. When a device under test 20 fails, the corresponding bypass switch assembly 40 closes to ensure the continuity of the aging test circuit, so that the aging test of each device under test can continue without reconfiguring the circuit, thereby improving test efficiency and saving test costs.

[0030] Each device under test (DUT) 20 is connected in series via a circuit assembly and connected to a test voltage terminal for aging testing. For example, the DUT 10 is a charging pile. A load 30 is connected in series with each DUT 20 to simulate the working conditions of the DUT 20 during actual use, thereby ensuring the accuracy of the aging test. Each aging test bench is connected to its corresponding DUT 20 to acquire the test status of the DUT 20, thus reflecting the performance of each DUT 20. It should be noted that the aging test bench is configured based on the performance requirements of the DUT 20. Specifically, those skilled in the art should understand the specific configuration and principles of the aging test bench; this embodiment will not elaborate on these details.

[0031] The bypass switch assembly 40 is connected in parallel across the corresponding device under test 20. When the corresponding device under test 20 is working normally, the bypass switch assembly 40 is open to form a path for the aging circuit through the device under test 20. When the corresponding device under test 20 fails, the bypass switch assembly 40 is closed to form a path for the aging circuit through the bypass switch assembly 40.

[0032] For example, such as Figure 2 As shown, the bypass switch assembly 40 includes a control switch 41, which is used by the operator to open or close the bypass switch assembly 40. Furthermore, the control switch 41 is a holding switch to avoid the operator needing to continuously press the switch to maintain the open or closed state of the bypass switch assembly 40, thereby improving the practicality of the aging test circuit.

[0033] In some alternative implementations, since the operating voltage is typically high during aging tests of devices such as charging piles, to improve test safety and avoid the potential risk of electric shock from direct mechanical switch control, such as... Figure 2 As shown, the bypass switch assembly 40 includes a control switch 41 and at least one electromagnetic relay 42. The electromagnetic relay 42 includes an electromagnetic coil 421 and several contact switches 422. Specifically, the two ends of each contact switch 422 are connected to the two ends of the corresponding device under test 20. Each contact switch 422 includes a movable spring and two fixed contacts. When there is no external force, the movable spring is electrically connected only to one fixed contact and disconnected from the other fixed contact, thus the bypass switch assembly 40 is off. The electromagnetic coil 421 generates an electromagnetic field after being energized, thereby attracting the movable spring of the contact switch 422 through the magnetic field, making it electrically contact the other fixed contact, thus turning on the bypass switch assembly 40.

[0034] The control switch 41 is manually operated by the operator and is connected between the external power supply and the electromagnetic coil 421. The external power supply provides the operating voltage for the electromagnetic relay 42. The control switch 41 controls whether the electromagnetic coil 421 is energized, thereby controlling the opening and closing of the contact switch 422. It should be noted that the other end of the electromagnetic coil 421 is grounded. For example, the voltage of the external power supply is set according to the operating voltage of the electromagnetic coil; for instance, the electromagnetic relay 42 is powered by a 12V external low-voltage power supply.

[0035] Based on this, when the device under test 20 is working normally, the device under test 20 forms the path of the aging test circuit. When the device under test 20 fails, the bypass switch component enables the aging test circuit to continue. This allows the aging test of other devices under test 20 to continue without reconstructing the circuit when one device under test 20 fails, effectively improving the testing efficiency of the devices and reducing the testing cost of the devices.

[0036] In some alternative implementations, such as Figure 2 As shown, the bypass switch assembly 40 also includes a display element 43, which is used to display whether the corresponding device under test 20 is in a fault state. Specifically, the display element 43 is connected between the external power supply and the electromagnetic relay 42. When the electromagnetic relay 42 is energized, that is, when the corresponding device under test 20 is faulty, the display element 43 is also energized. At this time, the display element 43 displays that the device under test 20 is faulty.

[0037] For example, the electromagnetic relay 42 also includes a display switch 423. One end of the display switch 423 is connected to the display element 43, and the other end is grounded. The display switch 423 enables the display element 43 to be connected. Specifically, please refer to the contact switch 422. The display switch 423 includes a movable spring and two fixed contacts. When there is no external force, the movable spring is electrically connected only to the fixed contact on one side and disconnected from the fixed contact on the other side. At this time, the display switch 423 is disconnected, and the display element 43 is also in a de-energized state. After the electromagnetic coil 421 is energized, the movable spring of the display switch 423 also makes electrical contact with the fixed contact on the other side. At this time, the display switch 423 is turned on, and the display element 43 is also in a energized state.

[0038] Optionally, the display element 43 is a photodiode. When the device under test 20 fails, the photodiode is energized, that is, the photodiode emits light, and the corresponding device under test 20 is in a fault state.

[0039] It should be noted that in some embodiments, the device under test 20 is connected to multiple lines. For example, when the device under test 20 is a charging pile, such as... Figure 3 As shown, the charging station is connected to a three-phase circuit to work normally. Based on this, the charging station is usually connected to multiple lines, namely three live wires and one neutral wire.

[0040] Therefore, in order to accommodate the device under test 20 which requires multiple lines to operate normally, the circuit assembly 10 includes multiple lines, and these lines correspond one-to-one with the lines that the device under test 20 needs to connect to.

[0041] Furthermore, the contact switches 422 of the electromagnetic relay 42 in the bypass switch assembly 40 are also configured in multiple ways, and each corresponds to a line in the line assembly 10.

[0042] For example, to increase the number of contact switches 422, each bypass switch assembly 40 includes multiple electromagnetic relays 42, each electromagnetic relay 42 including an electromagnetic coil 421 to control each contact switch 422 within the corresponding electromagnetic relay 42. Specifically, the electromagnetic coils 421 of each electromagnetic relay 42 are connected in parallel between the control switch 41 and the ground terminal. When the control switch 41 is closed, each electromagnetic coil 421 is energized and generates an electromagnetic field to control the closure of the corresponding contact switches 422. Each contact switch 422 is connected in parallel to each line of the corresponding device under test 20, that is, the two ends of each contact switch 422 are connected to each line corresponding to the two ends of the device under test 20, so as to realize the conduction of each line when the device under test 20 fails.

[0043] In some optional embodiments, when a single bypass switch assembly 40 includes multiple electromagnetic relays 42, the display element 43 in the bypass switch assembly 40 is connected in series with each electromagnetic relay 42 to display whether the corresponding device under test 20 is in a fault state. Specifically, each electromagnetic relay 42 includes a display switch 423, which is connected in series between the display element 43 and the ground terminal. That is, the display element 43, each display switch 423, and the ground terminal are connected in series by a wire so that each display switch 423 is closed. That is, when the device under test 20 is faulty, the fault state of the device under test 20 is displayed on the display element 43.

[0044] In some optional embodiments, the circuit assembly 10 further includes a grounding protection line 11, on which each device under test 20 and load 30 are connected in series to ground each device under test 20 and load 30, thereby reducing contact risk and protecting equipment safety and improving the safety of device aging tests.

[0045] In some optional embodiments, each device under test 20 is provided with an internal switch assembly 21 to control the opening or closing of the corresponding device under test 20. Specifically, after connecting each device under test 20 to the aging test circuit, the internal switch assembly 21 of each device under test 20 is turned on to start the test.

[0046] For example, for a device under test 20 that needs to connect multiple lines, the internal switch assembly 21 includes multiple internal switches 211, and each internal switch 211 corresponds to each line.

[0047] To facilitate a better understanding of the aging test circuit described in this embodiment by those skilled in the art, such as Figure 4 As shown, the following will take the device under test 20 as a charging pile as an example for specific explanation.

[0048] Specifically, several devices under test (DUTs) 20 and loads 30 are connected in series on the circuit assembly 10. The DUTs 20 are charging piles, and the loads 30 simulate batteries being charged. The charging piles require a three-phase circuit to simulate normal operation. To simulate the actual use of the charging piles, the circuit assembly 10 is a three-phase four-wire system, including four lines L1, L2, L3, and N. Lines L1, L2, and L3 are live wires, while line N is the neutral wire. Several charging piles and loads 30 are connected in series on each line. Furthermore, the circuit assembly 10 also includes a grounding protection wire 11 to reduce contact risks and protect equipment safety, improving the safety of device aging tests. Specifically, each charging pile and load 30 is connected in series via the grounding protection wire 11 to ensure that each charging pile and load 30 is grounded.

[0049] Furthermore, the charging station also includes four internal switches 211, each corresponding to one of the four lines. When all internal switches 211 are closed, the charging station begins to output power to the load 30, and the aging test begins.

[0050] Furthermore, the charging guns of each charging station are connected to an aging test bench (not shown in the figure) to display the aging test results.

[0051] It should be noted that, in order to avoid the charging pile disconnecting when an individual charging pile fails, causing the series circuit to be interrupted and the aging test to be unable to continue, the aging test circuit provided in this embodiment also includes a bypass switch component 40 corresponding to each charging pile, so as to open the corresponding bypass switch component 40 when the charging pile fails, thereby realizing the path of the aging test circuit through the bypass switch component 40.

[0052] The bypass switch assembly 40 includes a single bypass switch combination to enable the conduction of the aging test circuit. The bypass switch assembly 40 includes a control switch 41 and an electromagnetic relay group connected sequentially between the external power supply terminal and the ground terminal. Further, the electromagnetic relay group includes two electromagnetic relays 42 connected in parallel, each of which includes an electromagnetic coil 421 and contact switches 422. One end of the electromagnetic coil 421 is connected to the control switch 41, and the other end is grounded. Each contact switch 422 is in an open state without external force. When the charging station malfunctions, the corresponding control switch 41 is opened, energizing the electromagnetic coil 421 to generate an electromagnetic field, thereby causing the contact switches to close.

[0053] Specifically, the two electromagnetic relays 42 are electromagnetic relays K1-1 and K1-2, respectively. When the switch between contacts 1 and 8 of electromagnetic relay K1-1 is closed, line L1 is connected through the path between these two contacts. Similarly, line L2 is connected through the switch between contacts 2 and 7 of electromagnetic relay K1-1, line L3 is connected through the switch between contacts 1 and 8 of electromagnetic relay K1-2, and line L4 is connected through the switch between contacts 2 and 7 of electromagnetic relay K1-2. Based on this, all four lines L1, L2, L3, and N in the circuit assembly 10 are connected, and aging tests of each charging pile can continue without circuit reconstruction.

[0054] Furthermore, to facilitate intuitive acquisition of the fault status of each charging pile, this embodiment also includes a display element 43 for displaying the fault status of each charging pile. The display element 43 is a photodiode. Specifically, the photodiode, the display switch 423 of electromagnetic relay K1-1, and the display switch 423 of electromagnetic relay K1-2 are connected in series between the external power supply terminal and the ground terminal. When the corresponding charging pile malfunctions, the two electromagnetic relays 42 generate electromagnetic signals due to the closure of the control switch 41, causing both the display switches 423 of electromagnetic relay K1-1 and electromagnetic relay K1-2 to close. At this time, the circuit containing the photodiode is closed, meaning the photodiode emits light, indicating that the corresponding charging pile is in a fault state.

[0055] Based on this, this embodiment provides a bypass switch assembly 40 to provide a bypass circuit when each device under test 20 fails during aging testing, so as to enable the aging test circuit to continue without reconstructing the circuit, thereby improving the testing efficiency of the device under test 20 and reducing the testing cost of the device under test 20.

[0056] On the other hand, this application also provides an aging test apparatus, wherein the aging test circuit inside the aging test apparatus is the aging test circuit as described above. Since the aging test circuit includes a bypass switch assembly 40, when an individual device under test 20 fails, a bypass circuit is provided through the bypass switch assembly 40, avoiding the need for circuit reconstruction to restore the aging test of other devices under test 20, thereby improving aging test efficiency and reducing aging test costs. Specifically, the bypass switch assembly 40 can provide a bypass circuit; its working principle and implementation method are described above and will not be repeated here.

[0057] In summary, the aging test circuit provided in this application, by setting a bypass switch component 40, opens the corresponding bypass switch component 40 when the device under test 20 fails, and the current flows through the bypass switch component 40, thereby avoiding circuit interruption. The aging test of each device under test 20 can continue without circuit reconstruction, effectively improving the measurement efficiency of the device under test 20 and reducing the test cost, and has high industrial application value.

[0058] The descriptions of the processes or structures corresponding to the above figures each have their own emphasis. For parts of a process or structure that are not described in detail, please refer to the relevant descriptions of other processes or structures.

[0059] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. An aging test circuit for multiple devices, characterized in that, include: Several devices under test are connected in series through circuit components and connected to the test voltage terminal; The load is connected in series with each of the devices under test through the circuit assembly; Several aging test benches are connected to the corresponding devices under test to obtain the test status of the corresponding devices under test; Several bypass switch assemblies are connected in parallel across the corresponding terminals of the device under test; When the device under test is working normally, the corresponding bypass switch assembly is disconnected; When the device under test malfunctions, the corresponding bypass switch assembly closes.

2. The circuit according to claim 1, characterized in that, Each of the bypass switch components includes: At least one electromagnetic relay, wherein one end of the electromagnetic coil of the electromagnetic relay is grounded, and the two ends of the contact switch of the electromagnetic relay are respectively connected to the two ends of the corresponding device under test. A control switch is connected between the external power supply and the other end of the electromagnetic coil.

3. The circuit according to claim 2, characterized in that, The control switch is a holding switch.

4. The circuit according to claim 2, characterized in that, The device under test is a charging pile; the circuit assembly includes multiple lines, and each charging pile is connected to each line. Each bypass switch assembly includes multiple electromagnetic relays, with the electromagnetic coils of each electromagnetic relay connected in parallel between the control switch and the ground terminal; the two ends of the contact switches of each electromagnetic relay are respectively connected to each of the circuits, corresponding to the two ends of the device under test.

5. The circuit according to claim 2, characterized in that, The bypass switch assembly further includes a display unit connected between the external power supply and the electromagnetic relay. The electromagnetic relay also includes a display switch, one end of which is connected to the display element and the other end is grounded.

6. The circuit according to claim 4, characterized in that, The bypass switch assembly also includes a display element, which is connected in series between the external power supply and each of the electromagnetic relays; Each of the electromagnetic relays includes a display switch, and each of the display switches is connected in series between the display element and the ground terminal.

7. The circuit according to claim 1, characterized in that, The circuit assembly also includes a grounding protection wire, which is connected in series with each of the devices under test and the load.

8. The circuit according to claim 1, characterized in that, The device under test has an internal switching assembly.

9. The circuit according to claim 8, characterized in that, The internal switch assembly includes at least one internal switch, and the internal switch corresponds one-to-one with each line of the circuit assembly.

10. An aging test apparatus, characterized in that, The aging test circuit inside the aging test device is the aging test circuit as described in any one of claims 1-9.

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