A coaxial spring needle for chip testing

Abstract

The utility model provides a coaxial elastic needle for chip test, the coaxial elastic needle is composed of upper needle head, lower needle head and spring, upper needle head and lower needle head are hollow cylinder structure of coaxial arrangement, the upper needle head lower end embeds the upper end inside of lower needle head, the lower end outside of upper needle head and the upper end inside of lower needle head interference contact connection, the upper end of spring and upper needle head fixed connection, the lower end of spring and lower needle head fixed connection, the lower end of upper needle head is always located in the inside of lower needle head and can slide up and down relative to lower needle head. Have the advantages such as low cost, test signal transmission capacity is strong, and the higher signal of more stable advantage.

Description

Technical Field

[0001] This utility model relates to the technical field of chip testing equipment, specifically a coaxial spring for chip testing. Background Technology

[0002] Semiconductor test probes are tools used to test the electrical performance of chips. They connect to the chip through contacts to transmit and detect electrical signals, and can detect chip defects that may exist during the manufacturing process, thus ensuring chip quality.

[0003] Commonly used test needles typically consist of an upper needle tip 1, a lower needle tip 2, a syringe barrel 4, and a spring 3. See the attached diagram for its structural diagram. Figure 1 Because existing test needle assembly parts are all solid metal components machined by machine tools, their production cost is relatively high. Furthermore, since the upper needle 1 and lower needle 2 in the test needle are typically electrically connected via a spring 3 and a syringe 4, the excessive number of connecting parts and the small contact area result in weak test signal transmission capability. Poor contact may even occur, leading to unstable test signal transmission. Utility Model Content

[0004] To address the shortcomings of existing test springs in the prior art, this invention provides a coaxial spring for chip testing.

[0005] To solve the above-mentioned technical problems, this utility model provides the following technical solution: This utility model discloses a coaxial spring-loaded probe for chip testing. The coaxial spring-loaded probe consists of an upper needle head, a lower needle head, and a spring. The upper needle head and the lower needle head are coaxial hollow cylindrical structures. The lower end of the upper needle head is embedded inside the upper end of the lower needle head. The outer side of the lower end of the upper needle head is in interference contact with the inner side of the upper end of the lower needle head. The upper end of the spring is fixedly connected to the upper needle head, and the lower end of the spring is fixedly connected to the lower needle head. The lower end of the upper needle head is always located inside the lower needle head and can slide up and down relative to the lower needle head.

[0006] Preferably, the spring includes an upper fixed part, a lower fixed part, and an elastic movable part located in the middle, wherein the inter-spring spacing of the elastic movable part is greater than that of the upper fixed part and the lower fixed part.

[0007] Preferably, the upper needle head is provided with an upper locking protrusion, which is fixedly engaged within the spring spacing of the upper fixing part, and the lower needle head is provided with a lower locking protrusion, which is fixedly engaged within the spring spacing of the lower fixing part.

[0008] Preferably, both the upper needle and the lower needle are integrally rolled from a planar metal material.

[0009] The beneficial effects of this utility model are: The upper and lower needles of this coaxial spring needle are both cylindrical, which greatly reduces material and processing costs compared to existing solid metal parts. The upper and lower needles of this coaxial spring needle are nested together by a hollow cylindrical structure. Compared with the existing test spring needles where the upper and lower needles are electrically connected by a spring and a syringe, this has the advantages of a large contact area and strong test signal transmission capability. This utility model of a coaxial spring needle consists of three components: an upper needle head, a lower needle head, and a spring. Compared with existing spring needles that have at least four components, it avoids the technical problem of test signal transmission attenuation caused by too many connecting parts, and has the advantages of higher reliability and more stable signal. Attached Figure Description

[0010] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings: Figure 1 This is a structural diagram of existing technology; Figure 2 This is an overall structural diagram of a coaxial spring for chip testing according to the present invention; Figure 3 This is an exploded view of the structure of a coaxial spring for chip testing according to this utility model; Figure 4 This is a partial cross-sectional view of a coaxial spring for chip testing according to the present invention. In the diagram: 1. Upper needle; 11. Upper retaining protrusion; 2. Lower needle; 21. Lower retaining protrusion; 3. Spring; 31. Upper fixing part; 32. Lower fixing part; 33. Elastic movable part; 4. Syringe. Detailed Implementation

[0011] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0012] A coaxial spring for chip testing; its overall structure diagram is attached. Figure 2 See the attached diagram for its structural decomposition. Figure 3 See attached partial sectional view. Figure 4It consists of an upper needle 1, a lower needle 2, and a spring 3. The upper needle 1 and the lower needle 2 are coaxial hollow cylindrical structures, both integrally rolled from a flat metal material. The lower end of the upper needle 1 is embedded inside the upper end of the lower needle 2. The outer side of the lower end of the upper needle 1 is in interference contact with the inner side of the upper end of the lower needle 2. The upper end of the spring 3 is fixedly connected to the upper needle 1, and the lower end of the spring 3 is fixedly connected to the lower needle 2. The lower end of the upper needle 1 is always located inside the lower needle 2 and can slide up and down relative to the lower needle 2.

[0013] In this embodiment, the spring 3 includes an upper fixed part 31, a lower fixed part 32, and an elastic movable part 33 located in the middle. The inter-spring spacing of the elastic movable part 33 is greater than that of the upper fixed part 31 and the lower fixed part 32. The upper needle 1 is provided with an upper locking protrusion 11, which is fixedly locked within the inter-spring spacing of the upper fixed part. The lower needle 2 is provided with a lower locking protrusion 21, which is fixedly locked within the inter-spring spacing of the lower fixed part. The upper fixed part 31 and the lower fixed part 32 are fixedly connected to the upper needle 1 and the lower needle 2 respectively through the upper locking protrusion 11 and the lower locking protrusion 21. The length of the spring 3 limits the lower end of the upper needle 1 so that it is always located inside the lower needle 2. The large inter-spring spacing of the elastic movable part 33 is used to form an elastic force, allowing the lower end of the upper needle 1 to slide up and down relative to the lower needle 2.

[0014] The beneficial effects of this embodiment are: The upper and lower needles of this coaxial spring needle are both cylindrical, which greatly reduces material and processing costs compared to existing solid metal parts. The upper and lower needles of this coaxial spring needle are nested together by a hollow cylindrical structure. Compared with the existing test spring needles where the upper and lower needles are electrically connected by a spring and a syringe, this has the advantages of a large contact area and strong test signal transmission capability. 3. The coaxial spring needle of this utility model consists of three components: an upper needle head, a lower needle head, and a spring. Compared with the existing spring needle which has at least four components, it avoids the technical problem of test signal transmission attenuation caused by too many connecting parts, and has the advantages of higher reliability and more stable signal.

[0015] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A coaxial spring for chip testing, characterized in that: The coaxial spring needle consists of an upper needle (1), a lower needle (2), and a spring (3). The upper needle (1) and the lower needle (2) are coaxial hollow cylindrical structures. The lower end of the upper needle (1) is embedded inside the upper end of the lower needle (2). The outer side of the lower end of the upper needle (1) is in interference contact with the inner side of the upper end of the lower needle (2). The upper end of the spring (3) is fixedly connected to the upper needle (1), and the lower end of the spring (3) is fixedly connected to the lower needle (2). The lower end of the upper needle (1) is always located inside the lower needle (2) and can slide up and down relative to the lower needle (2).

2. The coaxial spring for chip testing according to claim 1, characterized in that, The spring (3) includes an upper fixed part (31), a lower fixed part (32) and an elastic movable part (33) located in the middle. The inter-spring spacing of the elastic movable part (33) is greater than that of the upper fixed part (31) and the lower fixed part (32).

3. A coaxial spring for chip testing according to claim 2, characterized in that, The upper needle (1) is provided with an upper locking protrusion (11), which is fixedly locked within the spring spacing of the upper fixing part. The lower needle (2) is provided with a lower locking protrusion (21), which is fixedly locked within the spring spacing of the lower fixing part.

4. A coaxial spring for chip testing according to claim 1, characterized in that, Both the upper needle (1) and the lower needle (2) are integrally rolled from planar metal material.

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