Test fixture

Abstract

The utility model discloses a kind of test fixtures, comprising: first placement station, for placing drive plate;Second placement station, for placing lamp plate;First probe group, including first input and first output, the first input and the first output are electrically connected to the drive plate;Second probe group, the second probe group includes second input and second output, the second input and the second output are electrically connected to the lamp plate;Wherein, the first probe group and the second probe group are electrically connected, to make the drive plate can control the lamp plate.The test fixture of the utility model can test drive plate and lamp plate simultaneously, to improve test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of circuit board testing technology, and in particular to a testing fixture. Background Technology

[0002] In related technologies, after production, circuit boards need to be tested to verify their functionality. These boards can be, for example, driver boards or LED boards. Furthermore, existing testing fixtures typically use a dedicated driver board testing fixture for testing driver boards and a dedicated LED board testing fixture for testing LED boards. However, this approach leads to low testing efficiency. Utility Model Content

[0003] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a testing fixture that can simultaneously test the driver board and the lamp board, thereby improving testing efficiency.

[0004] The test fixture according to an embodiment of the present invention includes: The first placement station is used to place the driver board; The second placement station is used to place the light panel; The first probe group includes a first input terminal and a first output terminal, both of which are used to electrically connect to the driver board. The second probe group includes a second input terminal and a second output terminal, both of which are used to electrically connect to the lamp board. The first probe group and the second probe group are electrically connected so that the driver board can control the lamp board.

[0005] The testing fixture according to the embodiments of this utility model has at least the following beneficial effects: the driver board can be placed on a first placement station, the lamp board can be placed on a second placement station, the first input terminal and the first output terminal of the first probe group are both electrically connected to the driver board, the second input terminal and the second output terminal of the second probe group are both electrically connected to the lamp board, and the first probe group and the second probe group are electrically connected. Thus, when testing the driver board and the lamp board, the driver board and the lamp board can form a circuit, which facilitates simultaneous testing of the driver board and the lamp board, improving testing efficiency. Specifically, the testing fixture can simultaneously test the driver board and the lamp board, thereby improving testing efficiency.

[0006] According to some embodiments of the present invention, the test fixture includes a first component, the first component includes a first placement member, the first placement member is provided with a first placement groove, and the first placement groove is configured as a first placement station.

[0007] According to some embodiments of the present invention, the test fixture has multiple first placement slots, which are spaced apart along the length of the first placement member.

[0008] According to some embodiments of the present invention, the test fixture includes a second component, the second component includes a second placement member, the second placement member is provided with a second placement groove, and the second placement groove is configured as a second placement station.

[0009] According to some embodiments of the present invention, the test fixture has multiple second placement slots, which are spaced apart along the length of the second placement member.

[0010] According to some embodiments of the present invention, the test fixture includes a first moving part connected to the first probe group. The first moving part is capable of movement to move the first probe group closer to or away from the first placement station.

[0011] According to some embodiments of the present invention, the test fixture of the first component further includes a first operating member, a first fixing member, and a first rotating member. The first fixing member is provided with a first through hole, and the first moving member is disposed in the first through hole. The first operating member includes a first operating part and a first connecting part that are connected to each other. The two ends of the first rotating member are respectively rotatably connected to one end of the first moving member and one end of the first connecting part. The other end of the first connecting part is rotatably connected to the first fixing member. By operating the first operating part, the first operating member can drive the first rotating member to rotate, so that the first moving member slides in the first through hole.

[0012] According to some embodiments of the present invention, the test fixture includes a second moving part connected to the second probe group. The second moving part is capable of movement to move the second probe group closer to or away from the second placement station.

[0013] According to some embodiments of the present invention, the test fixture of the second component further includes a second operating member, a second fixing member, and a second rotating member. The second fixing member is provided with a second through hole, and the second moving member is disposed in the second through hole. The second operating member includes a second operating part and a second connecting part that are connected to each other. The two ends of the second rotating member are respectively rotatably connected to one end of the second moving member and one end of the second connecting part. The other end of the second connecting part is rotatably connected to the second fixing member. By operating the second operating part, the second operating member can drive the second rotating member to rotate, so that the second moving member slides in the second through hole.

[0014] According to some embodiments of the present invention, the test fixture includes a first plate and a second plate, the first plate being connected to the second probe group, the second plate being connected to the second moving part, and the first plate and the second plate being detachably connected.

[0015] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0016] The present invention will be further described below with reference to the accompanying drawings and embodiments, wherein: Figure 1 This is a schematic diagram of the test fixtures for some embodiments of the present invention; Figure 2 This is a schematic diagram of the first placement component in the test fixture of some embodiments of the present invention; Figure 3 This is a schematic diagram of the second placement component in the test fixture of some embodiments of the present invention; Figure 4 This is a schematic diagram of the first component in the test fixture of some embodiments of the present invention; Figure 5 This is a schematic diagram of the second component in the test fixture of some embodiments of the present invention.

[0017] Figure label: Test fixture 10, first placement station 100, second placement station 200, first component 300, first placement piece 310, first moving piece 320, first operating piece 330, first operating part 331, first connecting part 332, first fixing piece 340, first rotating piece 350, second component 400, second placement piece 410, second moving piece 420, second operating piece 430, second operating part 431, second connecting part 432, second fixing piece 440, second rotating piece 450, first plate 460, second plate 470. Detailed Implementation

[0018] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.

[0019] In the description of this utility model, it should be understood that the directional descriptions, such as up, down, front, back, left, right, etc., indicate the directional or positional relationship based on the directional or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0020] In the description of this utility model, "several" means one or more, "multiple" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0021] In the description of this utility model, unless otherwise explicitly defined, terms such as "setting," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this utility model in conjunction with the specific content of the technical solution.

[0022] In the description of this utility model, the terms "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this utility model. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0023] In related technologies, after production, circuit boards need to be tested to verify their functionality. These boards can be, for example, driver boards or LED boards. Furthermore, existing test fixtures 10 use a dedicated driver board test fixture for testing driver boards and a dedicated LED board test fixture for testing LED boards. However, this approach leads to low testing efficiency. Therefore, this application proposes a test fixture 10.

[0024] Please refer to Figures 1 to 5In some embodiments, the test fixture 10 includes: a first placement station 100, a second placement station 200, a first probe group, and a second probe group. The first placement station 100 is used to place the driver board; for example, the first placement station 100 can be a recess in which the driver board can be placed. The bottom wall of the recess can be hollowed out to facilitate the placement and removal of the driver board. The second placement station 200 is used to place the lamp board. For example, the second placement station 200 can be a recess in which the lamp board can be placed. The bottom wall of the recess can be hollowed out to facilitate the placement and removal of the lamp board. The first probe group includes a first input terminal and a first output terminal, both of which are used for electrical connection to the driver board. The second probe group includes a second input terminal and a second output terminal, both of which are used for electrical connection to the lamp board. The first probe group and the second probe group are electrically connected so that the driver board can control the lamp board. Specifically, the driver board can be placed on the first placement station 100, and the lamp board can be placed on the second placement station 200. The first input and first output terminals of the first probe group are electrically connected to the driver board, and the second input and second output terminals of the second probe group are electrically connected to the lamp board. The first probe group and the second probe group are electrically connected. Thus, when testing the driver board and the lamp board, they can form a circuit, which facilitates simultaneous testing of both and improves testing efficiency. Specifically, the testing fixture 10 can simultaneously test the driver board and the lamp board, thereby improving testing efficiency.

[0025] Furthermore, it should be noted that the testing fixture 10 can communicate with a computer. After the communication connection is established, the driver board can be controlled via the computer. For example, commands can be input to the driver board, which then controls the lamp board, thereby controlling the brightness, intensity, or color of the light. During the testing of the driver board and lamp board, several scenarios exist: the driver board may be damaged, the lamp board may be damaged, or both may be damaged. Therefore, when testing the driver board and lamp board, the first step is to electrically connect the first and second probe groups to test for damage, for example, by observing the light emitted by the lamp board. If both the driver board and lamp board respond, then both have passed the test. If the light does not illuminate or there is no response, the first probe group can be electrically connected to an ammeter and a voltmeter to test the parameters of the driver board. Similarly, the second probe group can be electrically connected to the power supply to test the lamp board's lighting independently.

[0026] Further, please refer to Figure 2In some embodiments, the test fixture 10 includes a first component 300, which includes a first placement member 310. The first placement member 310 is provided with a first placement groove, which is configured as a first placement station 100. Specifically, the shape of the first placement groove can be adapted to the drive plate. For example, if the drive plate is a cuboid, the first placement groove is designed as a corresponding cuboid recess, and the groove wall is provided with a slight guide slope to facilitate the quick and smooth placement of the drive plate. The first placement member 310 can be manufactured using milling, grinding, or other processes, which can ensure the flatness and dimensional accuracy of the first placement groove, ensuring that the drive plate can be placed stably and accurately. A silicone pad can also be provided at the bottom of the first placement groove to prevent the drive plate from making hard contact with the placement groove, causing surface scratches or damage.

[0027] Furthermore, in some embodiments, there are multiple first placement slots. Multiple first placement slots are spaced apart along the length of the first placement member 310. Specifically, there may be two, three, four, five, eight, or ten first placement slots, etc. The spaced arrangement of multiple first placement slots facilitates the placement of multiple driver boards, thereby enabling simultaneous testing of multiple driver boards and improving testing efficiency.

[0028] Further, please refer to Figure 3 In some embodiments, the test fixture 10 includes a second component 400, which includes a second placement member 410. The second placement member 410 is provided with a second placement groove, which is configured as a second placement station 200. Specifically, the shape of the second placement groove can be adapted to the lamp board. For example, if the lamp board is a cuboid, the second placement groove is designed as a corresponding cuboid recess, and the groove wall is provided with a slight guide slope to facilitate the quick and smooth placement of the lamp board. The second placement member 410 can be manufactured using milling, grinding, or other processes, which can ensure the flatness and dimensional accuracy of the second placement groove, ensuring that the lamp board can be placed stably and accurately. A silicone pad can also be provided at the bottom of the second placement groove to prevent the lamp board from making hard contact with the bottom of the groove, causing surface scratches or damage.

[0029] Furthermore, in some embodiments, there are multiple second placement slots, spaced apart along the length of the second placement member 410. Specifically, there may be two, three, four, five, eight, or ten second placement slots. The spaced arrangement of multiple second placement slots facilitates the placement of multiple light panels, enabling simultaneous testing of multiple light panels and improving testing efficiency.

[0030] Further, please refer to Figure 1 and Figure 4In some embodiments, the first component 300 includes a first moving element 320. The first moving element 320 is connected to the first probe group and is movable to move the first probe group closer to or away from the first placement station 100. Specifically, the movement of the first moving element 320 can smoothly move the first probe group closer to the drive board on the first placement station 100 until the probes make close contact with the test points on the drive board. After the test is completed, the first moving element 320 can move in the opposite direction, moving the first probe group away from the first placement station 100, facilitating the operator to remove the drive board. The first moving element 320 can be securely connected to the first probe group, for example, by bolts or welding, ensuring that there is no relative displacement between the two during movement. The first moving element 320 can be driven by a motor or cylinder, or it can be manually driven.

[0031] Furthermore, the following describes how the first moving part 320 moves. Please refer to... Figure 1 and Figure 4Specifically, in some embodiments, the first component 300 further includes a first operating member 330, a first fixing member 340, and a first rotating member 350. The first fixing member 340 serves as the mounting base for the entire first component 300 and is typically fixed to the frame of the test fixture 10. Its material can be a metal, such as aluminum alloy or stainless steel, to ensure sufficient structural strength and stability. The first fixing member 340 is provided with a first through hole, which provides a smooth guide surface for the sliding of the first moving member 320. The wall of the first through hole extends vertically. The first moving member 320 is tightly fitted into the first through hole, ensuring smooth sliding while preventing excessive radial wobble. The first operating member 330 includes a first operating part 331 and a first connecting part 332 connected to each other, and the first operating part 331 and the first connecting part 332 can be bent to connect. The first operating part 331 is designed for easy gripping by the operator, such as a circular handle or a rod-like structure with anti-slip texture, facilitating the application of force. The first connecting part 332 uses a rigid metal rod to ensure that it will not deform when transmitting power. The two ends of the first rotating member 350 are respectively rotatably connected to one end of the first moving member 320 and one end of the first connecting part 332, and the other end of the first connecting part 332 is rotatably connected to the first fixing member 340. Operating the first operating part 331 causes the first operating member 330 to drive the first rotating member 350 to rotate, so that the first moving member 320 slides in the first through hole. Specifically, when the operator operates the first operating part 331, such as pressing down or lifting the first operating part 331, it will drive the first connecting part 332 to rotate around its connection point with the first fixing member 340, thereby pushing or pulling the first moving member 320 through the first rotating member 350, so that the first moving member 320 slides smoothly along the axial direction in the first through hole, ultimately realizing the action of the first probe group moving closer to or away from the first placement station 100. This allows users to easily move the first probe group closer to or further away from the driver board.

[0032] Further, please refer to Figure 1 and Figure 5In some embodiments, the second component 400 includes a second moving member 420. The second moving member 420 is connected to the second probe group and is movable to move the second probe group closer to or away from the second placement station 200. Specifically, the movement of the second moving member 420 can smoothly move the second probe group closer to the lamp panel on the second placement station 200 until the probes make close contact with the test points on the lamp panel. After the test is completed, the second moving member 420 can move in the opposite direction, moving the second probe group away from the second placement station 200, facilitating the operator to remove the lamp panel. The second moving member 420 can be securely connected to the second probe group, for example, by bolts or welding, ensuring that there is no relative displacement between the two during movement. The second moving member 420 can be driven by a motor or cylinder, or it can be manually driven.

[0033] Furthermore, the movement of the second moving part 420 is described below. Please refer to... Figure 1 and Figure 5Specifically, in some embodiments, the second component 400 further includes a second operating member 430, a second fixing member 440, and a second rotating member 450. The second fixing member 440 serves as the mounting base for the entire second component 400 and is typically fixed to the frame of the test fixture 10. Its material can be a metal, such as aluminum alloy or stainless steel, to ensure sufficient structural strength and stability. The second fixing member 440 is provided with a second through hole, which provides a smooth guide surface for the sliding of the second moving member 420. The wall of the second through hole extends vertically. The second moving member 420 is tightly fitted into the second through hole, ensuring smooth sliding while preventing excessive radial wobble. The second operating member 430 includes a second operating part 431 and a second connecting part 432 connected to each other, and the second operating part 431 and the second connecting part 432 can be bent to connect. The second operating part 431 is designed for easy gripping by the operator, such as a round handle or a rod-like structure with anti-slip texture, facilitating the application of force. The second connecting part 432 uses a rigid metal rod to ensure that it will not deform when transmitting power. The two ends of the second rotating member 450 are respectively rotatably connected to one end of the second moving member 420 and one end of the second connecting part 432, and the other end of the second connecting part 432 is rotatably connected to the second fixing member 440. Operating the second operating part 431 causes the second operating member 430 to drive the second rotating member 450 to rotate, so that the second moving member 420 slides in the second through hole. Specifically, when the operator operates the second operating part 431, such as pressing down or lifting the second operating part 431, it will drive the second connecting part 432 to rotate around its connection point with the second fixing member 440, thereby pushing or pulling the second moving member 420 through the second rotating member 450, so that the second moving member 420 slides smoothly along the axial direction in the second through hole, ultimately realizing the movement of the second probe group closer to or further away from the second placement station 200. This allows users to easily move the second probe group closer to or further away from the lamp panel.

[0034] Further, please refer to Figure 5In some embodiments, the second component 400 includes a first plate 460 and a second plate 470. The first plate 460 is connected to the second probe group, and the second plate 470 is connected to the second moving part 420. The first plate 460 and the second plate 470 are detachably connected. Specifically, the first plate 460 is directly connected to the second probe group, and the connection method can be a slot connection or a bolt connection, which facilitates the installation, disassembly, and replacement of the second probe group. The second plate 470 can be fixedly connected to the second moving part 420, and the connection method is usually a bolt connection, which ensures the connection strength and stability between the two. The first plate 460 and the second plate 470 are detachably connected, such as by a snap-fit ​​connection, a bolt connection, or a locating pin and bolt connection. With this detachable connection structure, when the second probe group needs to be replaced, only the first plate 460 needs to be removed from the second plate 470, and the first plate 460 with the corresponding second probe group can be replaced. There is no need to adjust or disassemble other components such as the second moving part 420, which greatly shortens the replacement time of the second probe group and improves the versatility and testing efficiency of the testing fixture 10. Furthermore, if the first board 460 or the second board 470 is damaged, the damaged component can be replaced individually, reducing maintenance costs. Additionally, it should be noted that the same configuration can also be used in the first assembly 300.

[0035] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present invention. Furthermore, the embodiments of the present invention and the features thereof can be combined with each other unless otherwise specified.

Claims

1. A testing fixture, characterized in that, include: The first placement station is used to place the driver board; The second placement station is used to place the light panels; The first probe group includes a first input terminal and a first output terminal, both of which are used to electrically connect to the driver board. The second probe group includes a second input terminal and a second output terminal, both of which are used to electrically connect to the lamp board. The first probe group and the second probe group are electrically connected so that the driver board can control the lamp board.

2. The test fixture according to claim 1, characterized in that, The test fixture includes a first component, the first component includes a first placement part, the first placement part is provided with a first placement slot, and the first placement slot is set as the first placement station.

3. The testing fixture according to claim 2, characterized in that, The first placement slot has multiple slots, which are spaced apart along the length of the first placement member.

4. The testing fixture according to claim 2, characterized in that, The test fixture includes a second component, which includes a second placement component. The second placement component is provided with a second placement slot, which is configured as a second placement station.

5. The testing fixture according to claim 4, characterized in that, The second placement slot has multiple slots, which are spaced apart along the length of the second placement member.

6. The test fixture according to claim 2, characterized in that, The first component includes a first moving part, which is connected to the first probe group. The first moving part is capable of movement to move the first probe group closer to or away from the first placement station.

7. The test fixture according to claim 6, characterized in that, The first component further includes a first operating member, a first fixing member, and a first rotating member. The first fixing member is provided with a first through hole, and the first moving member is disposed in the first through hole. The first operating member includes a first operating part and a first connecting part that are connected to each other. The two ends of the first rotating member are respectively rotatably connected to one end of the first moving member and one end of the first connecting part. The other end of the first connecting part is rotatably connected to the first fixing member. By operating the first operating part, the first operating member can drive the first rotating member to rotate, so that the first moving member slides in the first through hole.

8. The test fixture according to claim 4, characterized in that, The second component includes a second moving part connected to the second probe group. The second moving part is capable of movement to move the second probe group closer to or away from the second placement station.

9. The test fixture according to claim 8, characterized in that, The second component further includes a second operating member, a second fixing member, and a second rotating member. The second fixing member is provided with a second through hole, and the second moving member is disposed in the second through hole. The second operating member includes a second operating part and a second connecting part that are connected to each other. The two ends of the second rotating member are respectively rotatably connected to one end of the second moving member and one end of the second connecting part. The other end of the second connecting part is rotatably connected to the second fixing member. By operating the second operating part, the second operating member can drive the second rotating member to rotate, so that the second moving member slides in the second through hole.

10. The test fixture according to claim 8, characterized in that, The second component includes a first plate and a second plate, the first plate being connected to the second probe group and the second plate being connected to the second moving part, and the first plate and the second plate being detachably connected.

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