An FCT test fixture

Abstract

The utility model relates to FCT test fixture field, concretely relates to a kind of FCT test fixture, including frame body, frame body is equipped with lower plate subassembly, lower plate subassembly is equipped with placement area and is equipped with multiple positioning passageways, circuit board is placed in placement area, the side of circuit board and the opening of positioning passageway are tangent;Frame body is equipped with lifting drive subassembly, the drive end of lifting drive subassembly is fixed with upper plate subassembly, upper plate subassembly and / or lower plate subassembly are equipped with test needle;Upper plate subassembly is equipped with downwardly extending guide pillar, guide pillar corresponds with positioning passageway, guide pillar plays the role of position detection to the four around of circuit board in downlink process, guide pillar and the side of circuit board convex part mutually abut, to circuit board, in the mutual contact of test needle and circuit board, multiple guide pillars are positioned to circuit board in the side of circuit board around, realize the position rectification of circuit board in the process of clamping mould.

Description

Technical Field

[0001] This utility model relates to the field of FCT testing fixtures, and specifically to an FCT testing fixture. Background Technology

[0002] The FCT (Functional Circuit Test Fixture) is an automated functional testing device used in the electronics manufacturing industry, primarily for comprehensive testing of the electrical performance of semi-finished or finished products. Its core value lies in simulating the actual operating environment of the product to verify the functionality of the unit under test (UUT), ensuring that product quality meets design standards. It offers three control modes: manual, semi-automatic, and fully automatic, with fully automatic control becoming the mainstream choice due to its high-speed testing and accurate data. The testing system comprises four core modules: a data storage unit responsible for collecting and storing test data; a control center coordinating process scheduling and result judgment; execution components that build the test environment and simulate manual operation; and a data measurement system that verifies the data by comparing measured data with standard values.

[0003] Most existing FCT test fixtures have slots on the base to support the circuit board and position it to ensure accurate docking between the test probe and the circuit board. However, during the mold closing process of the test fixture, there is a lack of position detection of the circuit board. When the position of the circuit board in the slot is deviated, it affects the accuracy of docking between the test probe and the circuit board. Utility Model Content

[0004] The purpose of this invention is to provide an FCT test fixture, which aims to improve the problem that conventional FCT test fixtures lack position detection of the circuit board during the mold closing process, and affect the accuracy of the docking between the test probe and the circuit board when the position of the circuit board deviates in the slot.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] An FCT testing fixture includes a frame, a lower plate assembly inside the frame, a placement area on the lower plate assembly and multiple positioning channels, a circuit board placed in the placement area, the positioning channels being distributed around the placement area, and the side of the circuit board being tangent to the opening of the positioning channel.

[0007] The frame is equipped with a lifting drive assembly. The drive end of the lifting drive assembly extends downward through the frame and is fixed with an upper plate assembly. The upper plate assembly corresponds to the lower plate assembly. The upper plate assembly and / or the lower plate assembly are equipped with test probes. The upper plate assembly is equipped with a guide post extending downward, and the guide post corresponds to the positioning channel.

[0008] Furthermore, the bottom of the guide post is provided with a guide surface, which is connected end to end and is in the shape of a frustum with a larger top and a smaller bottom. The upper diameter of the guide surface is larger than the opening diameter of the positioning channel.

[0009] Furthermore, the upper plate assembly includes a top plate and an upper pad plate. A test probe is provided on the upper plate assembly, and the top of the test probe and the top of the guide post are both fixedly connected to the top plate.

[0010] The upper pad has an upper clearance channel and an installation channel. The test probes are respectively inserted into the upper clearance channel. The installation channel has an outwardly protruding installation ring. The guide post has an installation ring groove on its periphery. The installation ring is embedded in the installation ring groove.

[0011] Furthermore, the lower plate assembly includes a lower pad, the placement area is disposed on the top surface of the lower pad, the lower pad has a placement groove in the placement area, and the circuit board is placed in the placement groove.

[0012] Furthermore, the lower plate assembly also includes a base plate, on which an elastic support member and a first guide post are provided, and the lower pad is disposed on the elastic support member, and the first guide post passes through the lower pad.

[0013] The lower plate assembly is equipped with test pins, the bottom end of which is fixedly connected to the base plate. The lower pad is provided with a lower clearance channel, and the test pins correspond one-to-one with the lower clearance channels.

[0014] Furthermore, the base plate includes an annular plate and a lifting plate disposed within the inner annular surface of the annular plate, and the bottom end of the test needle is fixedly connected to the lifting plate;

[0015] The bottom surface of the lifting plate is provided with an ejection drive assembly, which drives the lifting plate to rise or fall.

[0016] Furthermore, it also includes a base, the frame and lower plate assembly are mounted on the base, the ejection drive assembly is mounted inside the base, and the drive end of the ejection drive assembly passes through the base and is driven to connect with the lifting plate.

[0017] Furthermore, the frame body is provided with two opposing second guide posts, which pass through the upper plate assembly.

[0018] By adopting the above technical solution, this utility model has the following advantages compared with the prior art:

[0019] The lifting drive assembly drives the upper plate assembly downwards, and the guide pillars move towards the positioning channel. The positioning channel is tangent to the side of the circuit board. During the downward movement, the guide pillars play a role in detecting the position of the circuit board around its perimeter. The guide pillars abut against the side of the protruding part of the circuit board, pushing the circuit board in the opposite direction. When the test probe contacts the circuit board, multiple guide pillars position the circuit board around its perimeter, thus correcting the position of the circuit board during the mold closing process and preventing deviations in the contact position between the circuit board and the test probe after the mold is closed. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the structure of the FCT testing fixture described in this utility model;

[0021] Figure 2 This is a schematic diagram of the rear structure of the FCT testing fixture described in this utility model;

[0022] Figure 3 This is a cross-sectional structural diagram of the FCT testing fixture described in this utility model;

[0023] Figure 4 This is a schematic diagram of the upper pad structure of the FCT test fixture described in this utility model;

[0024] Figure 5 This is a schematic diagram of the lower plate assembly structure of the FCT test fixture described in this utility model;

[0025] Figure 6 This is an exploded structural diagram of the lower plate assembly of the FCT test fixture described in this utility model.

[0026] Explanation of reference numerals in the attached figures:

[0027] 1. Frame; 11. Lifting drive assembly; 12. Second guide column;

[0028] 2. Upper plate assembly; 21. Top plate; 22. Upper pad plate; 221. Upper clearance channel; 222. Mounting channel; 2221. Mounting protrusion ring; 23. Test probe; 24. Guide post; 241. Guide curved surface; 242. Mounting ring groove;

[0029] 3. Lower plate assembly; 31. Lower pad plate; 311. Placement area; 312. Placement slot; 313. Positioning channel; 314. Lower clearance channel; 32. Base plate; 321. Annular plate; 3211. Elastic support component; 3212. First guide column; 322. Lifting plate;

[0030] 4. Base; 41. Housing; 411. Ejection drive assembly; 42. Cover;

[0031] 5. Circuit board; 51. Positioning notch. Detailed Implementation

[0032] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this utility model and are not intended to limit this utility model.

[0033] Additionally, it should be noted that the terms "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer" are all based on the orientation or positional relationship shown in the accompanying drawings. They are merely for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element of this utility model must have a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0034] When an element is referred to as being "fixed to," "set on," or "contained on" another element, it can be directly on or indirectly on that other element. When an element is referred to as being "connected to," it can be directly connected to or indirectly connected to that other element.

[0035] Unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0036] Example

[0037] Please refer to Figure 1-6 As shown, this embodiment provides an FCT testing fixture, including a frame 1. A lower plate assembly 3 is provided within the frame 1. The lower plate assembly 3 has a placement area 311 and multiple positioning channels 313. A circuit board 5 is placed within the placement area 311. The positioning channels 313 are distributed around the placement area 311, and the side of the circuit board 5 is tangent to the opening of the positioning channel 313. A lifting drive assembly 11 is provided on the frame 1. The drive end of the lifting drive assembly 11 extends downward through the frame 1 and is fixed to an upper plate assembly 2. The upper plate assembly 2 corresponds to the lower plate assembly 3. Test probes 23 are provided on the upper plate assembly 2 and / or the lower plate assembly 3. A downwardly extending guide post 24 is provided on the upper plate assembly 2, and the guide post 24 corresponds to the positioning channel 313.

[0038] The lifting drive assembly 11 drives the upper plate assembly 2 downwards, and the guide column 24 moves towards the positioning channel 313. The positioning channel 313 is tangent to the side of the circuit board 5. During the downward movement, the guide column 24 plays the role of position detection around the circuit board 5. The guide column 24 and the side of the protruding part of the circuit board 5 abut against each other, pushing the circuit board 5 in the opposite direction. When the test needle 23 contacts the circuit board 5, multiple guide columns 24 position the circuit board 5 around the side of the circuit board 5, realizing the position correction of the circuit board 5 during the mold closing process, and avoiding the deviation of the contact position between the circuit board 5 and the test needle 23 after the mold is closed.

[0039] Please refer to Figure 3 As shown, the bottom of the guide post 24 is provided with a guide surface 241. The guide surface 241 is connected end to end, forming a frustum shape that is larger at the top and smaller at the bottom. The upper diameter of the guide surface 241 is larger than the opening diameter of the positioning channel 313. This frustum-shaped bottom maximizes clearance for the side of the circuit board 5 during the downward movement of the guide post 24, improving the adjustment capability of the circuit board 5. When the deviation of the circuit board 5 is too large, the bottom surface of the guide post 24 abuts against the circuit board 5 and triggers an alarm. When the deviation of the circuit board 5 is within the adjustment range of the guide post 24, the guide surface 241 abuts against the side of the circuit board 5. As the guide post 24 moves downward, the guide surface 241 applies an inward force to the circuit board 5, pushing the circuit board 5 to correct its position.

[0040] Please refer to Figure 1-4 As shown, specifically, the upper plate assembly 2 includes a top plate 21 and an upper pad plate 22. The upper plate assembly 2 is equipped with test pins 23, the tops of which, and the tops of the guide posts 24, are fixedly connected to the top plate 21. The upper pad plate 22 has upper clearance channels 221 and mounting channels 222, and multiple test pins 23 are respectively inserted into the multiple upper clearance channels 221. Please refer to... Figure 3 and Figure 4 As shown, the mounting channel 222 has an outwardly protruding mounting ring 2221, and the guide post 24 has a mounting ring groove 242 on its periphery. The mounting ring 2221 is embedded in the mounting ring groove 242. In this embodiment, the guide post 24 is a plastic guide post 24, that is, the guide post 24 has moderate hardness. During the assembly process, the frustum-shaped bottom can better fit into the mounting ring 2221. The mounting ring 2221 presses against the side of the guide post 24 and is engaged in the mounting ring groove 242, realizing the installation between the guide post 24 and the upper pad 22. Multiple guide posts 24 support the upper pad 22, ensuring that the upper pad 22 and the top plate 21 are parallel to each other, and ensuring that the test pins 23 installed on the upper pad 22 and the top plate 21 are perpendicular to each other. When the test pins 23 abut against the circuit board 5, they provide horizontal support for the test pins 23, improving the overall structural strength.

[0041] Please refer to Figure 1 and Figure 2 As shown, the frame 1 is provided with two opposing second guide columns 12. The second guide columns 12 pass through the upper plate assembly 2. In this embodiment, the top plate 21 protrudes from the upper pad plate 22. The second guide columns 12 pass through the top plate 21. The lifting drive assembly 11 drives the top plate 21 to reciprocate linearly along the extension direction of the second guide columns 12, thereby improving the accuracy of the movement path of the top plate 21.

[0042] Please refer to Figure 1-6 As shown, specifically, the lower plate assembly 3 includes a lower pad 31, a placement area 311 disposed on the top surface of the lower pad 31, and a placement groove 312 formed on the placement area 311 of the lower pad 31. The circuit board 5 is placed in the placement groove 312; and a positioning channel 313 is formed on the lower pad 31. The placement groove 312 is provided to accommodate the circuit board 5 and further define the position of the circuit board 5. In this embodiment, the size of the circuit board 5 is the same as the size of the placement groove 312, and a positioning notch 51 is formed on the circuit board 5, which corresponds one-to-one with the positioning channel 313. While ensuring that the sidewall of the circuit board 5 fits against the inner sidewall of the placement groove 312, and the placement groove 312 limits the position of the circuit board 5, the guide post 24 moves downward to correct the position of the positioning notch 51 of the circuit board 5, realizing dual position confirmation of the circuit board 5 and maximizing the accuracy of the contact position between the circuit board 5 and the test probe 23. Similarly, a smaller circuit board 5 can be set, meaning there is no need to limit the structure of the circuit board 5. It can be a conventional polygonal plate structure, and the position of the side of the circuit board 5 can be directly detected by the guide post 24.

[0043] The lower plate assembly 3 also includes a base plate 32, on which an elastic support member 3211 and a first guide post 3212 are provided. A lower pad 31 is disposed on the elastic support member 3211, and the first guide post 3212 passes through the lower pad 31. In this embodiment, the elastic support member 3211 is a spring, which supports the lower pad 31. When the test probe 23 mounted on the top plate 21 abuts against the circuit board 5, the lower pad 31 compresses the elastic support member 3211, preventing hard contact between the circuit board 5 and the test probe 23, thus avoiding damage to both. Furthermore, the first guide post 3212 guides the movement of the lower pad 31, ensuring that the lower pad 31 performs reciprocating linear motion in the vertical direction, thereby improving the accuracy of the movement path of the lower pad 31.

[0044] Furthermore, the lower plate assembly 3 is provided with test pins 23, the bottom end of which is fixedly connected to the base plate 32. The lower pad 31 has a lower clearance channel 314, and the test pins 23 correspond one-to-one with the lower clearance channels 314. That is, in this embodiment, both the upper plate assembly 2 and the lower plate assembly 3 are provided with test pins 23. Similarly, test pins 23 can be provided only on the upper plate assembly 2 or only on the lower plate assembly 3. The test pins 23 located on the base plate 32 pass through the lower clearance channels 314. When the lower pad 31 compresses the elastic support member 3211, they abut against the test points on the bottom surface of the circuit board 5, realizing double-sided testing and improving testing efficiency.

[0045] Please refer to Figure 5 and Figure 6 As shown, the base plate 32 includes an annular plate 321 and a lifting plate 322 disposed within the inner annular surface of the annular plate 321. The bottom end of the test pin 23 is fixedly connected to the lifting plate 322. The elastic support member 3211 and the first guide post 3212 are both disposed on the annular plate 321. An ejection drive assembly 411 is provided on the bottom surface of the lifting plate 322, which drives the lifting plate 322 to rise or fall. The base plate 32 is configured as a split annular plate 321 and lifting plate 322. After the test is completed, the ejection drive assembly 411 ejects the lifting plate 322. The test pin 23 fixed on the lifting plate 322 acts as an ejector pin, lifting the circuit board 5 and separating the circuit board 5 from the lower pad 31, making it easier for the tester to remove the circuit board 5 and improving the testing efficiency. In this embodiment, both the ejection drive assembly 411 and the lifting drive assembly 11 are cylinders, which respectively drive the lifting plate 322 and the top plate 21 to rise and fall. Similarly, other lifting drive structures such as hydraulic cylinders can also be used to drive the lifting plate 322 and the top plate 21 to rise and fall.

[0046] Please refer to Figure 1-3 As shown, the FCT test fixture further includes a base 4, a frame 1, and a lower plate assembly 3 mounted on the base 4. An ejection drive assembly 411 is disposed within the base 4, with its drive end passing through the base 4 and connected to the lifting plate 322. The base 4 supports the lower plate assembly 3 and the frame 1, and accommodates the test components and the ejection drive assembly 411, effectively reducing the overall fixture size. Specifically, the base 4 includes a housing 41 and a cover 42 covering the housing 41. The cover 42 seals the installation space within the housing 41, ensuring a good working environment for the test components and the ejection drive assembly 411 within the installation space.

[0047] The above description is merely a preferred embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. An FCT testing fixture, characterized in that, The device includes a frame, a lower plate assembly inside the frame, a placement area on the lower plate assembly and multiple positioning channels, a circuit board placed in the placement area, the positioning channels being distributed around the placement area, and the side of the circuit board being tangent to the opening of the positioning channel. The frame is equipped with a lifting drive assembly. The drive end of the lifting drive assembly extends downward through the frame and is fixed with an upper plate assembly. The upper plate assembly corresponds to the lower plate assembly. The upper plate assembly and / or the lower plate assembly are equipped with test probes. The upper plate assembly is equipped with a guide post extending downward, and the guide post corresponds to the positioning channel.

2. The FCT testing fixture according to claim 1, characterized in that: The bottom of the guide post is provided with a guide surface, which is connected end to end and is in the shape of a frustum with a larger top and a smaller bottom. The upper diameter of the guide surface is larger than the opening diameter of the positioning channel.

3. The FCT testing fixture according to claim 2, characterized in that: The upper plate assembly includes a top plate and an upper pad plate. A test probe is provided on the upper plate assembly, and the top of the test probe and the top of the guide post are both fixedly connected to the top plate. The upper pad has an upper clearance channel and an installation channel. The test probes are respectively inserted into the upper clearance channel. The installation channel has an outwardly protruding installation ring. The guide post has an installation ring groove on its periphery. The installation ring is embedded in the installation ring groove.

4. The FCT testing fixture according to claim 1, characterized in that: The lower plate assembly includes a lower pad, the placement area is disposed on the top surface of the lower pad, the lower pad has a placement groove in the placement area, and the circuit board is placed in the placement groove.

5. The FCT testing fixture according to claim 4, characterized in that: The lower plate assembly also includes a base plate, on which an elastic support member and a first guide post are provided. The lower pad is disposed on the elastic support member, and the first guide post passes through the lower pad. The lower plate assembly is equipped with test pins, the bottom end of which is fixedly connected to the base plate. The lower pad is provided with a lower clearance channel, and the test pins correspond one-to-one with the lower clearance channels.

6. The FCT testing fixture according to claim 5, characterized in that: The base plate includes an annular plate and a lifting plate disposed within the inner annular surface of the annular plate, and the bottom end of the test needle is fixedly connected to the lifting plate. The bottom surface of the lifting plate is provided with an ejection drive assembly, which drives the lifting plate to rise or fall.

7. The FCT testing fixture according to claim 6, characterized in that: It also includes a base, the frame and lower plate assembly are mounted on the base, the ejection drive assembly is mounted inside the base, and the drive end of the ejection drive assembly passes through the base and is driven to connect with the lifting plate.

8. The FCT testing fixture according to claim 1, characterized in that: The frame is provided with two opposing second guide columns, which pass through the upper plate assembly.

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