Connector interface testing device
Patent Information
- Application Number
- CN202522163715.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-13
- Publication Date
- 2026-10-09
- Estimated Expiration
- 2035-10-13
AI Technical Summary
[0014]本申请实施例的有益效果是:本申请提供一种连接器接口测试装置,测试装置中的导体部件是通过与待测试连接器接口中的插针的端部抵接的方式进行检测,这样有效避免现有检测方式中车载摄像头的连接器接口中的插针与主控电路板上的接口的导电金属完全包裹插接连接,这样可以有效减低测试装置中导体部件的磨损,以及降低连接器接口中的插针的磨损,有效延长测试装置的使用寿命。
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Figure CN224840481U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing technology, and in particular to a connector interface testing device. Background Technology
[0002] With the development of vehicle intelligence, in-vehicle cameras are increasingly used in vehicles, especially in intelligent driving systems. As a key component of fusion perception, in-vehicle cameras have high performance requirements. Before leaving the factory, in-vehicle cameras usually need to undergo performance testing to screen out products that do not meet the performance standards. Utility Model Content
[0003] This application provides a connector interface testing device that can test the connector interface of an automotive camera. The device performs testing through end contact, reducing wear and tear from insertion and removal and effectively extending the service life of the testing device.
[0004] This application provides a connector interface testing device, including a mounting frame and a testing assembly. The testing assembly includes a plurality of conductor components disposed on the mounting frame along a first direction, which is the insertion direction between the testing assembly and the connector interface to be tested. Each conductor component includes a fixed member and a movable member. The fixed member is connected to the mounting frame, and the movable member is sleeved inside the fixed member. The movable member can move relative to the fixed member along the first direction and is configured to abut against the end of a pin of the connector interface to be tested.
[0005] In some embodiments, the conductor component further includes an elastic element that connects the fixed element and the movable element, and the elastic element is configured to drive the movable element to a reset movement.
[0006] In some embodiments, the mounting bracket is provided with a first fastening part, and the fastener is provided with a second fastening part, the first fastening part and the second fastening part being detachably or non-detachably connected; the fastener is provided with a first limiting part, which is configured to abut against the mounting bracket.
[0007] In some embodiments, along a first direction, the movable member has a first end and a second end, the first end being configured to abut a pin of the connector interface to be tested, and the second end being configured to be electrically connected to an external control device; the first end is provided with a receiving groove, the receiving groove having an opening and a bottom disposed opposite each other in the first direction, the inner diameter of at least a portion of the receiving groove gradually decreasing along the direction from the opening to the bottom, and the bottom being configured to abut an end of a pin of the connector interface to be tested.
[0008] In some embodiments, the test assembly further includes a sensor disposed inside the fixed member, the sensor abutting against a second end of the movable member, and the sensor being configured to detect the displacement and force acting on the movable member.
[0009] In some embodiments, the mounting bracket includes a body and a enclosure, the enclosure extending from the body along a first direction, the enclosure and the body enclosing a plug-in area, a test component being disposed in the plug-in area, and a fastener being disposed on the body.
[0010] In some embodiments, the enclosure is a metal structure, and the enclosure is grounded to form a shielded space in which the test component is located; and / or, the connector interface testing apparatus further includes a grounding element disposed on the inner side of the enclosure, the grounding element being configured to be grounded to form a shielded space in which the test component is located.
[0011] In some embodiments, the enclosure is provided with a first guide portion configured to guide the first housing of the connector interface to be tested into the mating area; and / or, the end of the fixing member away from the body is provided with a positioning portion configured to positionally connect with the second housing of the connector interface to be tested; and / or, the slot is provided with a second guide portion configured to guide the pins of the connector interface to be tested into the receiving slot.
[0012] In some embodiments, the connector interface testing device further includes a telescopic assembly, which includes a driving component and a telescopic rod. The telescopic rod is connected to the driving component, and the driving component drives the telescopic rod to reciprocate along a first direction. The telescopic rod is connected to the mounting bracket.
[0013] In some embodiments, the connector interface testing device further includes a base, a telescopic component disposed on the base, and a limiting component provided on the base. The limiting component can move and be fixed relative to the base, and the limiting component defines a test area for placing the connector to be tested.
[0014] The beneficial effects of the embodiments of this application are as follows: This application provides a connector interface testing device. The conductor component in the testing device is tested by abutting against the end of the pin in the connector interface to be tested. This effectively avoids the complete encapsulation and plugging connection between the pin in the connector interface of the vehicle camera and the conductive metal of the interface on the main control circuit board in the existing testing method. This can effectively reduce the wear of the conductor component in the testing device and reduce the wear of the pin in the connector interface, and effectively extend the service life of the testing device. Attached Figure Description
[0015] To more clearly illustrate the technical solutions in the specific embodiments of this application, the accompanying drawings used in the description of the specific embodiments will be briefly introduced below. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn to scale.
[0016] Figure 1 This is a schematic diagram of a connector interface testing device according to an embodiment of this application; Figure 2 yes Figure 1 A magnified view of part A in the middle; Figure 3 This is a schematic diagram of the test components and mounting bracket of the connector interface testing device according to an embodiment of this application; Figure 4 This is a cross-sectional view of the test components and mounting bracket of the connector interface testing apparatus according to an embodiment of this application; Figure 5 This is a cross-sectional view of the connector interface testing device according to an embodiment of this application when the test component is connected to the connector interface; Figure 6 yes Figure 5 A magnified view of part B in the middle; Figure 7 This is a cross-sectional view of the test components and mounting bracket of a connector interface testing apparatus according to another embodiment of this application. Detailed Implementation
[0017] To facilitate understanding of this application, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as "connected" to another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "upper," "lower," "inner," "outer," "vertical," "horizontal," etc., used in this specification indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0018] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.
[0019] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.
[0020] With the development of vehicle intelligence, in-vehicle cameras are increasingly being used in vehicles, especially in intelligent driving systems. As a key component for fusion perception, in-vehicle cameras have high performance requirements. Before leaving the factory, in-vehicle cameras usually need to undergo performance testing to eliminate products that do not meet the performance standards.
[0021] The current testing process involves connecting the connector interface 200 of the vehicle-mounted camera to the interface on a dedicated automotive-grade testing main control circuit board. Specifically, the pins 201 of the vehicle-mounted camera's connector interface 200 are completely encased in the conductive metal of the interface on the main control circuit board. Each vehicle-mounted camera requires one insertion and removal. However, this testing process has the following problems: According to automotive standards, the cable interface's lifespan is approximately 25 insertions and removals. This means that the interface on the main control circuit board needs to be replaced after 25 insertions and removals to meet requirements. Furthermore, repeated insertions and removals can easily cause wear and loosening of the interface on the main control circuit board, potentially leading to poor contact between the vehicle-mounted camera's connector interface 200 and the interface on the main control circuit board, thus affecting testing accuracy.
[0022] To address the aforementioned issues, this application provides a connector interface testing device 100. The conductor component 21 in the testing device 100 is tested by contacting the end of the pin 201 in the connector interface 200 to be tested. This effectively avoids the complete encapsulation and insertion connection of the pin 201 in the connector interface 200 of the vehicle camera with the conductive metal of the interface on the main control circuit board in the existing testing method. This can effectively reduce the wear of the conductor component 21 in the testing device 100 and the wear of the pin 201 in the connector interface 200, and effectively extend the service life of the testing device 100.
[0023] Please see Figure 1 and Figure 2 The connector interface 200 includes a plurality of pins 201 and a first housing 202 surrounding the plurality of pins 201, such that the plurality of pins 201 form a set of connectors. Furthermore, a second housing 203 is provided on the outside of each pin 201, and the second housing 203 provides further protection for the pins 201 inside.
[0024] Please see Figure 1 and Figure 3This application provides a connector interface testing device 100, which includes a mounting frame 10 and a testing component 20. The testing component 20 is fixed on the mounting frame 10 and is used to insert with the connector interface 200 to be tested for detection. The testing component 20 includes a plurality of conductor parts 21 disposed on the mounting frame 10 along a first direction X, where the first direction X is the insertion direction between the testing component 20 and the connector interface 200 to be tested.
[0025] The conductor component 21 includes a fixed member 211 and a movable member 212. The fixed member 211 is connected and fixed to the mounting bracket 10. The movable member 212 is sleeved inside the fixed member 211 and can move relative to the fixed member 211 along a first direction X. The movable member 212 is electrically connected to an external testing system. The movable member 212 is configured to abut against the end of the pin 201 of the connector interface 200 under test, thereby enabling electrical conduction between the movable member 212 and the pin 201 to achieve detection.
[0026] With the above-described structure, when the test component 20 is plugged into the connector interface 200, the movable part 212 abuts against the end of the pin 201, thus enabling electrical conductivity detection between the two. Since the movable part 212 does not cover the side wall of the pin 201, it will not cause wear or compression to the side wall of the pin 201. This extends the service life of both the pin 201 and the test component 20.
[0027] For the mounting bracket 10 mentioned above, please refer to... Figure 3 and Figure 4 The mounting bracket 10 includes a body 11 and a surrounding wall 12. The body 11 is a flat plate structure with a certain thickness in the first direction X to facilitate the mounting of the test assembly 20. The surrounding wall 12 extends from the surface of the body 11 along the first direction X, and the surrounding wall 12 and the body 11 together enclose a insertion area 121. The conductor component 21 of the test assembly 20 is disposed within the insertion area 121, and the fixing member 211 is disposed on the body 11. Figure 5 As shown, when the test component 20 and the connector interface 200 are inserted in the first direction X, the enclosure 12 can first position and mate with the first housing 202 of the connector interface 200, so that the connector interface 200 is positioned within the insertion area 121.
[0028] In further embodiments, please refer to... Figure 4 The end of the enclosure 12 away from the main body 11 is provided with a first guide part 122. The first guide part 122 has the function of positioning and guiding the first housing 202 of the connector interface 200, further improving the accuracy and convenience of insertion and reducing the difficulty of insertion.
[0029] In some embodiments, please continue reading Figure 3The enclosure 12 is a metal structure, and the enclosure 12 is grounded to form a shielded space, in which the test component 20 is located; and / or, the connector interface test device 100 further includes a grounding element 30, which is disposed on the inner side of the enclosure 12 and configured to be grounded to form a shielded space, in which the test component 20 is located.
[0030] Multiple conductor components 21 are provided in the insertion area 121, and the distance between the conductor components 21 is relatively close, which can easily cause crosstalk between signals. In this application, by setting a grounding structure, a shielding space can be formed, reducing the probability of signal crosstalk between conductor components 21 and improving detection accuracy.
[0031] For test component 20 mentioned above, please refer to... Figure 3 The test component 20 includes several conductor components 21, each conductor component 21 corresponding to a pin 201 of the connector interface 200. The arrangement of the multiple conductor components 21 can be adapted according to the pin 201 of the connector interface 200. As an example, every four conductor components 21 form a group.
[0032] In some embodiments, please refer to Figure 4 A portion of the fastener 211 is fixedly connected to the body 11, and a portion of the fastener 211 extends out of the body 11. Further, the body 11 of the mounting bracket 10 is provided with a first fastening part 111, and the fastener 211 is provided with a second fastening part 2111. The first fastening part 111 and the second fastening part 2111 are connected to each other so that the fastener 211 can be installed and fixed on the mounting bracket 10. It is understood that the first fastening part 111 and the second fastening part 2111 can be connected by non-removable methods such as welding, riveting, bonding, or interference fit, or by detachable methods such as screwing, snap-fitting, fastening, or insertion.
[0033] As an example, please refer to Figure 4 The first fastening part 111 includes a threaded hole that extends through the thickness of the body 11 of the mounting bracket 10. The second fastening part 2111 includes an external thread on the outer surface of the fastener 211, and the fastener 211 is threaded into the threaded hole of the body 11 via the external thread. When the fastener 211 is tightened, it is fixed to the body 11 of the mounting bracket 10. When the fastener 211 is loosened, it can be detached from the body 11 of the mounting bracket 10. This allows for quick and easy removal of the fastener 211 from the mounting bracket 10 when it needs to be replaced, reducing the difficulty of disassembly. In other examples, the first fastening part 111 includes a first latch, and the second fastening part 2111 includes a second latch, with the first and second latches engaging.
[0034] In some embodiments, please refer to Figure 4 The fastener 211 is provided with a first limiting part 2112, which is configured to abut against the body 11 of the mounting bracket 10. As an example, the first limiting part 2112 is an annular boss with a diameter larger than the diameter of the rest of the fastener 211. In this way, during the screwing process between the fastener 211 and the body 11 of the mounting bracket 10, the annular boss abuts against the inner wall of the body 11 of the mounting bracket 10, which can limit and tighten the fastener 211 onto the body 11 of the mounting bracket 10.
[0035] In some embodiments, please refer to Figures 4 to 6 The end of the fixing member 211 away from the body 11 is provided with a positioning part 2113. The positioning part 2113 is configured to be positioned and connected with the second housing 203 of the connector interface 200 to be tested. This can further improve the insertion accuracy of the pin 201 located in the second housing 203 and the movable part 212 located inside the fixing member 211.
[0036] In some embodiments, such as Figure 7 As shown, the interior of the fixing member 211 is hollow. Along the first direction X, the two ends of the movable member 212 extend out of the two ends of the fixing member 211 respectively. One end of the movable member 212 is used to abut against the pin 201 of the connector interface 200 to be tested, and the other end is used to electrically connect with the external control device so that the external control device can obtain the insertion status through the movable member 212.
[0037] In some embodiments, please refer to Figure 4 The fixing member 211 has a partially hollow structure. Along the first direction X, the movable member 212 has a first end 2121 and a second end 2122. The first end 2121 extends out of the end of the fixing member 211 to abut against the pin 201 of the connector interface 200 to be tested. The test assembly 20 also includes a sensor 22, which is disposed inside the fixing member 211. The sensor 22 abuts against the second end 2122 of the movable member 212 and is electrically connected to an external testing device.
[0038] Sensor 22 is configured to detect the displacement of movable member 212 along a first direction X, and to detect the force exerted on movable member 211 in the first direction X, thereby determining the contact status between movable member 212 and pin 201 based on the displacement. As an example, the sensor is a fiber optic grating (FBG) sensor.
[0039] Further, please refer to Figures 4 to 6The first end 2121 of the movable part 211 is provided with a receiving groove 2123. The receiving groove 2123 has a slot opening 2124 and a bottom 2125 disposed opposite to each other in the first direction X. Along the direction from the slot opening 2124 to the bottom 2125, the inner diameter of at least part of the receiving groove 2123 gradually decreases, that is, a part of the receiving groove 2123 is flared. The bottom 2125 is configured to abut against the end of the pin 201 of the connector interface 200 to be tested.
[0040] During the manufacturing process of the connector interface 200 of the vehicle camera, the internal pins 201 are usually straight. However, during transportation or placement, the pins 201 may be tilted or bent due to external forces. When the tilted or bent pins 201 are inserted into the moving part 212, the posture of the pins 201 can be corrected by the groove wall of the receiving groove 2123 of the moving part 212 to restore them to a straight or nearly straight state. That is, the flared groove wall can correct the posture of the pins 201 to guide the end of the pins 201 to abut against the bottom 2125 of the receiving groove 2123.
[0041] Understandably, if the bending angle of the pin 201 is too large and it cannot enter the receiving slot 2123, the pin 201 cannot make contact with the conductor component 21 to form electrical continuity, or even the connector interface 200 cannot be connected to the test component 20. In this case, the test device 100 can identify that the conductor component 21 has not formed electrical continuity, and then issue an identification signal to remind the staff to check the condition of the connector interface 200 in time.
[0042] In some embodiments, please refer to Figure 4 The area of the groove wall of the receiving groove 2123 near the bottom 2125 is a vertical wall 2126 extending perpendicular to the bottom 2125. The diameter of the vertical wall 2126 is larger than the diameter of the pin 201 of the connector interface 200, so that the pin 201 is spaced apart from the vertical wall 2126 of the receiving groove 2123 in the radial direction as much as possible, and only the axial end of the pin 201 is in contact with the bottom 2125 of the receiving groove 2123. This can reduce the wear and tear of the pin 201 caused by the vertical wall 2126 of the receiving groove 2123.
[0043] In some embodiments, please refer to Figure 4 The slot 2124 is provided with a second guide 2127, which is configured to guide the pins 201 of the connector interface 200 under test into the receiving slot 2123. By adding the second guide 2127 at the slot 2124, the guiding effect on the pins 201 can be further improved, thereby improving the mating accuracy. The second guide 2127 also helps to correct bent or misaligned pins 201.
[0044] In some embodiments, please refer to Figure 4 and Figure 7 The conductor component 21 also includes an elastic element 213, which connects the fixed component 211 and the movable component 212. The elastic element 213 is configured to drive the movable component 212 to a reset position. Due to manufacturing and assembly tolerances, the ends of the pins 201 in the connector interface 200 may not be in the same plane. In this application, by axially movably mounting the movable component 212 inside the fixed component 211 and by providing the elastic element 213 to connect the fixed component 211 and the movable component 212, each movable component 212 can abut against the end of the corresponding pin 201. Under the elastic force of the elastic element 213, the movable component 212 remains in contact with the end of the pin 201, thereby forming a good and stable electrical connection. After the connector has completed testing and been removed, the elastic element 213 drives the movable component 212 to a reset position. As an example, the elastic element 213 is a spring.
[0045] In some embodiments, please refer to Figure 1 The connector interface testing device 100 also includes a telescopic assembly 40, which includes a drive component 41 and a telescopic rod 42. The telescopic rod 42 is connected to the drive component 41, and the drive component 41 drives the telescopic rod 42 to reciprocate along a first direction X. The telescopic rod 42 is connected to the mounting bracket 10, thus enabling automatic or controlled driving of the mounting bracket 10 to connect the testing component 20 to the connector interface 200. Compared to manual insertion and removal, the linear telescopic movement of the telescopic assembly 40 effectively reduces human offset during insertion and removal, improves insertion and removal accuracy, reduces offset wear on the connector interface 200, and eliminates the instability caused by manual operation.
[0046] In some embodiments, please refer to Figure 1 The connector interface testing device 100 also includes a base 50, a telescopic component 40 disposed on the base 50, and a limiting component 51 on the base 50. The limiting component 51 can move and be fixed relative to the base 50. The limiting component 51 defines a test area 52 on the base 50, which is used to place the connector to be tested. This allows the connector to be tested to be positioned and fixed relative to the base 50, facilitating insertion and connection with the test component 20 in the first direction X.
[0047] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.
Claims
1. A connector interface testing device, characterized in that, include: Mounting rack; The test assembly includes a plurality of conductor components disposed on the mounting bracket along a first direction, wherein the first direction is the insertion direction of the test assembly and the interface of the connector to be tested. The conductor component includes a fixed member and a movable member. The fixed member is connected to the mounting bracket, and the movable member is sleeved inside the fixed member. The movable member is movable relative to the fixed member along the first direction, and the movable member is configured to abut against the end of the pin of the connector interface to be tested.
2. The connector interface testing device according to claim 1, characterized in that, The conductor component further includes an elastic element that connects the fixed element and the movable element, and the elastic element is configured to drive the movable element to a reset movement.
3. The connector interface testing device according to claim 2, characterized in that, The mounting bracket is provided with a first fastening part, and the fastener is provided with a second fastening part. The first fastening part and the second fastening part are detachably or non-detachably connected. The fastener is provided with a first limiting part, which is configured to abut against the mounting bracket.
4. The connector interface testing device according to any one of claims 1-3, characterized in that, Along the first direction, the movable part has a first end and a second end, the first end being configured to abut against a pin of the connector interface to be tested, and the second end being configured to be electrically connected to an external control device; The first end is provided with a receiving groove, which has an opening and a bottom that are disposed opposite to each other in the first direction. The inner diameter of at least a portion of the receiving groove gradually decreases along the direction from the opening to the bottom. The bottom of the groove is configured to abut against the end of the pin of the connector interface to be tested.
5. The connector interface testing device according to claim 4, characterized in that, The test assembly also includes a sensor disposed inside the fixed member, the sensor abutting against the second end of the movable member, and the sensor being configured to detect the displacement and force acting on the movable member.
6. The connector interface testing device according to claim 4, characterized in that, The mounting frame includes a body and a surrounding wall. The surrounding wall extends from the body along a first direction and the surrounding wall and the body enclose an insertion area. The test component is disposed in the insertion area, and the fastener is disposed on the body.
7. The connector interface testing device according to claim 6, characterized in that, The enclosure is a metal structure and is grounded to form a shielded space, within which the test component is located. And / or, The connector interface testing device also includes a grounding component, which is disposed on the inner side of the enclosure and configured to be grounded to form a shielded space, within which the testing component is located.
8. The connector interface testing device according to claim 6, characterized in that, The enclosure is provided with a first guide portion, which is configured to guide the first housing of the connector interface to be tested into the mating area. And / or, The end of the fastener away from the body is provided with a positioning part, which is configured to be positioned and connected to the second housing of the connector to be tested. And / or, The slot is provided with a second guide portion, which is configured to guide the pins of the connector interface to be tested into the receiving slot.
9. The connector interface testing device according to claim 4, characterized in that, The connector interface testing device further includes a telescopic assembly, which includes a driving component and a telescopic rod. The telescopic rod is connected to the driving component, and the driving component drives the telescopic rod to reciprocate along the first direction. The telescopic rod is connected to the mounting bracket.
10. The connector interface testing device according to claim 9, characterized in that, The connector interface testing device also includes a base, the telescopic component is disposed on the base, and a limiting component is also provided on the base. The limiting component can move and be fixed relative to the base, and the limiting component defines a test area for placing the connector to be tested.