Clamp for ferroelectric analyzer single crystal sample in-plane polarization test and ferroelectric analyzer

Abstract

The utility model discloses a kind of clamp and ferroelectric analyzer for ferroelectric analyzer single crystal sample in-plane polarization test, clamp includes: first electrode plate, with first conductive layer, second conductive layer, first channel;Second electrode plate, with third conductive layer, fourth conductive layer, second channel;First conductive layer and third conductive layer correspond and are equipotential body;Second conductive layer and fourth conductive layer correspond and are equipotential body;First electrode plate and second electrode plate are configured as clamping sample, and sample respectively with first conductive layer, second conductive layer, third conductive layer, fourth conductive layer abuts. Upper surface of sample third conductive layer and fourth conductive layer between the upper electric field are formed, the lower electric field is formed between first conductive layer and second conductive layer of sample lower surface, sample is located between upper electric field and lower electric field, not only form more uniform electric field, more extensive parallel electric field, can measure thicker sample.

Description

Technical Field

[0001] This utility model relates to the field of ferroelectric measurement technology, and in particular to a fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer and a ferroelectric analyzer. Background Technology

[0002] When testing the electrical properties of organic crystals (especially single crystals), the small size and limited contact surface of organic crystals mean that many cannot be plated with electrodes and must be placed on pre-made electrodes. Using silver paste to plate electrodes can easily lead to delamination and breakage of the organic crystal sample, and the uncontrollable spacing between the two silver paste electrodes can also cause short circuits. Therefore, it is recommended to prepare two electrodes first, then place the organic crystal sample on the electrodes for testing.

[0003] In existing technologies, an organic crystal sample is placed on a prepared electrode. The organic crystal sample has a certain thickness, and the two electrodes form a nearly parallel electric field within a certain height range. If the organic crystal sample is too thick, the difference in electric field between the upper and lower surfaces of the organic crystal sample is large, resulting in poor test results.

[0004] Therefore, existing technologies still need improvement and development. Utility Model Content

[0005] The technical problem to be solved by this utility model is to provide a fixture and a ferroelectric analyzer for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, in order to address the above-mentioned deficiencies of the prior art and solve the problem of poor testing results for thicker organic crystal samples in the prior art.

[0006] The technical solution adopted by this utility model to solve the technical problem is as follows: A fixture for in-plane polarization testing of single-crystal samples in a ferroelectric analyzer, comprising: The first electrode plate has a first conductive layer and a second conductive layer, and a first channel is formed between the first conductive layer and the second conductive layer. The second electrode plate has a third conductive layer and a fourth conductive layer, and a second channel is formed between the third conductive layer and the fourth conductive layer; Wherein, the position of the first conductive layer corresponds to the position of the third conductive layer, and the first conductive layer and the third conductive layer are equipotential bodies; The position of the second conductive layer corresponds to the position of the fourth conductive layer, and the second conductive layer and the fourth conductive layer are equipotential bodies; The first electrode plate and the second electrode plate are configured to hold the sample, and the sample abuts against the first conductive layer, the second conductive layer, the third conductive layer, and the fourth conductive layer, respectively.

[0007] The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, wherein the positions of the first channel and the second channel correspond to each other.

[0008] The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, wherein the first conductive layer and the third conductive layer are connected by a first BNC port; The second conductive layer and the fourth conductive layer are connected via a second BNC port.

[0009] The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer includes a first through-hole formed at the position of the first conductive layer on the first electrode plate and a second through-hole formed at the position of the second conductive layer on the first electrode plate. A third through-hole is formed at the location of the third conductive layer on the second electrode plate, and a fourth through-hole is formed at the location of the fourth conductive layer on the second electrode plate. The first BNC port includes: The first connecting post and the first connecting end are interconnected; The first connecting post passes through the first through hole and the third through hole, and abuts against the first conductive layer and the third conductive layer, respectively. The second BNC port includes: The second connecting post and the second connecting end are interconnected; The second connecting post passes through the second through hole and the fourth through hole, and abuts against the second conductive layer and the fourth conductive layer, respectively.

[0010] The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer includes a fifth through hole formed at the position of the first conductive layer on the first electrode plate and a sixth through hole formed at the position of the second conductive layer on the first electrode plate. A seventh through hole is formed at the position of the third conductive layer on the second electrode plate, and an eighth through hole is formed at the position of the fourth conductive layer on the second electrode plate. The fifth through hole and the seventh through hole are provided with first conductive posts, and the first conductive posts abut against the first conductive layer and the third conductive layer respectively; The sixth and eighth through holes are provided with second conductive posts, and the second conductive posts abut against the second conductive layer and the fourth conductive layer, respectively.

[0011] The fixture for in-plane polarization testing of single-crystal samples in a ferroelectric analyzer further includes: Clamping components; The clamping assembly is configured to clamp the first electrode plate and the second electrode plate.

[0012] The fixture for in-plane polarization testing of single-crystal samples in a ferroelectric analyzer, wherein the clamping assembly includes: A support bracket is used to hold the first electrode plate; A pressure plate, used to be placed on the second electrode plate; A pressure bar is connected to the bracket and presses down on the pressure plate.

[0013] The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, wherein the pressure plate has a first guide hole and a second guide hole at both ends, and the support includes: Connecting plate; The first guide bolt and the second guide bolt are respectively connected to both ends of the connecting plate; A base plate for placing the first electrode plate, wherein a first notch and a second notch are formed at both ends of the base plate; The rod portion of the first guide bolt passes through the first guide hole; The rod portion of the second guide bolt passes through the second guide hole; The first notch engages with the rod portion of the first guide bolt and is limited by the cap portion of the first guide bolt; The second notch engages with the rod portion of the second guide bolt and is limited by the cap portion of the second guide bolt.

[0014] The fixture for in-plane polarization testing of single-crystal samples in a ferroelectric analyzer further includes: A protective cover encloses the clamping assembly, the first electrode plate, and the second electrode plate.

[0015] A ferroelectric analyzer, comprising a fixture as described in any of the above for in-plane polarization testing of single-crystal samples in a ferroelectric analyzer.

[0016] Beneficial effects: An upper electric field is formed between the third and fourth conductive layers on the upper surface of the sample, and a lower electric field is formed between the first and second conductive layers on the lower surface of the sample. The sample is located between the upper and lower electric fields, which not only forms a more uniform electric field, but also a parallel electric field over a larger range, allowing for the measurement of thicker samples. Attached Figure Description

[0017] Figure 1 This is a front view of the fixture used for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, as described in this embodiment of the present invention.

[0018] Figure 2 yes Figure 1 Enlarged view of point A in the middle.

[0019] Figure 3This is a schematic diagram of the electric field formed by the first electrode plate and the second electrode plate in an embodiment of this utility model.

[0020] Figure 4 This is a schematic diagram of the first structure of the fixture used for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, as described in this embodiment of the present invention.

[0021] Figure 5 This is a schematic diagram of the second structure of the fixture used for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, as described in this embodiment of the present invention.

[0022] Figure 6 This is a schematic diagram of the structure of the first electrode plate, the second electrode plate, the conductive column, the BNC port, and the sample in an embodiment of this utility model.

[0023] Figure 7 This is a schematic diagram of the first structure of the first electrode plate and the second electrode plate in an embodiment of this utility model.

[0024] Figure 8 This is a schematic diagram of the second structure of the first electrode plate and the second electrode plate in an embodiment of this utility model.

[0025] Figure 9 This is a schematic diagram of the structure of the first electrode plate in an embodiment of this utility model.

[0026] Figure 10 This is a schematic diagram of the structure of the first guide bolt in an embodiment of this utility model.

[0027] Figure 11 This is a schematic diagram of the structure of the base plate in an embodiment of this utility model.

[0028] Figure 12 This is a schematic diagram of the pressure plate in an embodiment of this utility model.

[0029] Figure 13 This is a schematic diagram of the connecting plate in an embodiment of this utility model.

[0030] Figure 14 This is a schematic diagram of the third structure of the fixture used for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, as described in this embodiment of the present invention.

[0031] Explanation of reference numerals in the attached figures: 10. First electrode plate; 11. First conductive layer; 111. First through hole; 112. Fifth through hole; 12. Second conductive layer; 121. Second through hole; 122. Sixth through hole; 13. First channel; 20. Second electrode plate; 21. Third conductive layer; 211. Third through hole; 212. Seventh through hole; 22. Fourth conductive layer; 221. Fourth through hole; 222. Eighth through hole; 23. Second channel; 30. First BNC port; 31. First connecting post; 32. First connecting end; 40. Second BNC port; 41. Second connecting post; 42. Second connecting end; 51. First conductive post; 52. Second conductive post; 60. Clamping assembly; 61. Bracket; 611. Connecting plate; 612. First guide bolt; 613. Second guide bolt; 614. Base plate; 6141. First notch; 6142. Second notch; 62. Pressure plate; 621. First guide hole; 622. Second guide hole; 63. Pressure rod; 70. Protective shield; 80. Sample. Detailed Implementation

[0032] To make the objectives, technical solutions, and advantages of this utility model clearer and more explicit, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0033] Please also refer to Figures 1-14 This utility model provides some preferred embodiments of a fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer.

[0034] like Figure 1 and Figure 2 As shown, the fixture used for in-plane polarization testing of single crystal samples in a ferroelectric analyzer includes: The first electrode plate 10 has a first conductive layer 11 and a second conductive layer 12, and a first channel 13 is formed between the first conductive layer 11 and the second conductive layer 12. The second electrode plate 20 has a third conductive layer 21 and a fourth conductive layer 22, and a second channel 23 is formed between the third conductive layer 21 and the fourth conductive layer 22; Wherein, the position of the first conductive layer 11 corresponds to the position of the third conductive layer 21, and the first conductive layer 11 and the third conductive layer 21 are equipotential bodies; the position of the second conductive layer 12 corresponds to the position of the fourth conductive layer 22, and the second conductive layer 12 and the fourth conductive layer 22 are equipotential bodies; the first electrode plate 10 and the second electrode plate 20 are configured to hold the sample 80, and the sample 80 abuts against the first conductive layer 11, the second conductive layer 12, the third conductive layer 21, and the fourth conductive layer 22, respectively.

[0035] Specifically, four electrodes are used, located on the upper and lower surfaces of the left and right ends of the sample 80, respectively. The four electrodes are the first conductive layer 11, the second conductive layer 12, the third conductive layer 21, and the fourth conductive layer 22. The four electrodes are formed on two electrode plates, and the sample 80 is clamped between the two electrode plates. The clamping force of the two electrode plates makes the sample 80 in closer contact with the electrodes, maintaining good electrical contact and conductivity.

[0036] like Figure 3 This design creates an upper electric field between the two electrodes on the upper surface of sample 80 (e.g., the third conductive layer 21 and the fourth conductive layer 22), and a lower electric field between the two electrodes on the lower surface of sample 80 (e.g., the first conductive layer 11 and the second conductive layer 12). Sample 80 is positioned between these upper and lower electric fields, resulting in a more uniform and wider-ranging parallel electric field, allowing for the measurement of thicker samples. The electrodes on the upper and lower surfaces at the left end (e.g., the first conductive layer 11 and the third conductive layer 21) are equipotential bodies, as are the electrodes on the upper and lower surfaces at the right end (e.g., the second conductive layer 12 and the fourth conductive layer 22). This makes the upper and lower electric fields of sample 80 more similar in direction and intensity.

[0037] The first conductive layer 11 and the second conductive layer 12 are separated by the first channel 13, and the first conductive layer 11 and the second conductive layer 12 are not electrically connected (no short circuit). The third conductive layer 21 and the fourth conductive layer 22 are separated by the second channel 23, and the third conductive layer 21 and the fourth conductive layer 22 are not electrically connected (no short circuit). The first electrode plate 10 and the second electrode plate 20 can adopt the same structure and are arranged with their conductive surfaces facing each other.

[0038] In a preferred embodiment of this utility model, please also refer to... Figures 1-3 The position of the first channel 13 corresponds to the position of the second channel 23.

[0039] Specifically, the positions of the first channel 13 and the second channel 23 are opposite to each other, the positions of the first conductive layer 11 and the third conductive layer 21 are opposite to each other, and the positions of the second conductive layer 12 and the fourth conductive layer 22 are opposite to each other.

[0040] In a preferred embodiment of this utility model, please also refer to... Figure 1 , Figure 2 and Figure 4 The first conductive layer 11 and the third conductive layer 21 are connected by a first BNC port 30; the second conductive layer 12 and the fourth conductive layer 22 are connected by a second BNC port 40.

[0041] Specifically, the BNC port refers to an interface used for coaxial cable connection. The electrode and cable are electrically connected through the BNC port, facilitating the separation of the electrode and cable. The first conductive layer 11 and the third conductive layer 21 are connected through the first BNC port 30, forming an equipotential body. The second conductive layer 12 and the fourth conductive layer 22 are connected through the second BNC port 40, forming an equipotential body.

[0042] In a preferred embodiment of this utility model, please also refer to... Figures 7-9 A first through hole 111 is formed at the position of the first conductive layer 11 on the first electrode plate 10; a third through hole 211 is formed at the position of the third conductive layer 21 on the second electrode plate 20.

[0043] Specifically, a first through-hole 111 is formed on the first electrode plate 10, and the first through-hole 111 is located at the position of the first conductive layer 11. A third through-hole 211 is formed on the second electrode plate 20, and the third through-hole 211 is located at the position of the third conductive layer 21. The positions of the first through-hole 111 and the third through-hole 211 correspond to each other.

[0044] In a preferred embodiment of this utility model, please also refer to... Figure 4 and Figure 6 The first BNC port 30 includes: The first connecting post 31 and the first connecting end 32 are interconnected; The first connecting post 31 passes through the first through hole 111 and the third through hole 211, and abuts against the first conductive layer 11 and the third conductive layer 21, respectively.

[0045] Specifically, a BNC (Bayonet Neill-Concelman) connector may include a connecting post and a connecting end, which may be male or female. The connecting post connects to an electrode, the connecting end connects to an adapter, and the adapter connects to a cable. When the connecting end is male, the adapter is female; when the connecting end is female, the adapter is male. In the first BNC port 30, the first connecting post 31 passes through the first through hole 111 and the third through hole 211, achieving an electrical connection between the first conductive layer 11 and the third conductive layer 21, making the first conductive layer 11 and the third conductive layer 21 form an equipotential body.

[0046] In a preferred embodiment of this utility model, please also refer to... Figures 7-9 A second through hole 121 is formed at the position of the second conductive layer 12 on the first electrode plate 10; a fourth through hole 221 is formed at the position of the fourth conductive layer 22 on the second electrode plate 20.

[0047] Specifically, a second through-hole 121 is formed on the first electrode plate 10, and the second through-hole 121 is located at the position of the second conductive layer 12. A fourth through-hole 221 is formed on the second electrode plate 20, and the fourth through-hole 221 is located at the position of the fourth conductive layer 22. The positions of the second through-hole 121 and the fourth through-hole 221 correspond to each other.

[0048] In a preferred embodiment of this utility model, please also refer to... Figure 4 and Figure 6 The second BNC port 40 includes: The second connecting post 41 and the second connecting end 42 are interconnected; The second connecting post 41 passes through the second through hole 121 and the fourth through hole 221, and abuts against the second conductive layer 12 and the fourth conductive layer 22, respectively.

[0049] Specifically, in the second BNC port 40, the second connecting post 41 passes through the second through hole 121 and the fourth through hole 221 to realize the electrical connection between the second conductive layer 12 and the fourth conductive layer 22, so that the second conductive layer 12 and the fourth conductive layer 22 form an equipotential body.

[0050] In a preferred embodiment of this utility model, please also refer to... Figures 7-9 A fifth through hole 112 is formed at the position of the first conductive layer 11 on the first electrode plate 10, and a seventh through hole 212 is formed at the position of the third conductive layer 21 on the second electrode plate 20. A first conductive post 51 is inserted into the fifth through hole 112 and the seventh through hole 212, and the first conductive post 51 abuts against the first conductive layer 11 and the third conductive layer 21, respectively.

[0051] Specifically, a fifth through-hole 112 is formed on the first electrode plate 10, located at the position of the first conductive layer 11. A seventh through-hole 212 is formed on the second electrode plate 20, located at the position of the third conductive layer 21. The positions of the fifth through-hole 112 and the seventh through-hole 212 correspond to each other. The first conductive post 51 passes through the fifth through-hole 112 and the seventh through-hole 212, realizing the electrical connection between the first conductive layer 11 and the third conductive layer 21, further strengthening the formation of an equipotential body between the first conductive layer 11 and the third conductive layer 21.

[0052] In a preferred embodiment of this utility model, please also refer to... Figures 7-9 A sixth through hole 122 is formed at the position of the second conductive layer 12 on the first electrode plate 10, and an eighth through hole 222 is formed at the position of the fourth conductive layer 22 on the second electrode plate 20. A second conductive post 52 is inserted into the sixth through hole 122 and the eighth through hole 222, and the second conductive post 52 abuts against the second conductive layer 12 and the fourth conductive layer 22, respectively.

[0053] Specifically, a sixth through-hole 122 is formed on the first electrode plate 10, located at the position of the second conductive layer 12. An eighth through-hole 222 is formed on the second electrode plate 20, located at the position of the fourth conductive layer 22. The positions of the sixth through-hole 122 and the eighth through-hole 222 correspond to each other. The second conductive post 52 passes through the sixth through-hole 122 and the eighth through-hole 222, realizing the electrical connection between the second conductive layer 12 and the fourth conductive layer 22, further strengthening the formation of an equipotential body between the second conductive layer 12 and the fourth conductive layer 22.

[0054] In a preferred embodiment of this utility model, please also refer to... Figures 1-2 The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer further includes: Clamping assembly 60; The clamping assembly 60 is configured to clamp the first electrode plate 10 and the second electrode plate 20.

[0055] Specifically, the clamping assembly 60 is used to further clamp the sample 80 by clamping the first electrode plate 10 and the second electrode plate 20.

[0056] In a preferred embodiment of this utility model, please also refer to... Figures 4-5 The clamping assembly 60 includes: Support 61 is used to place the first electrode plate 10; Pressure plate 62 is used to be placed on the second electrode plate 20; The pressure rod 63 is connected to the bracket 61 and presses down on the pressure plate 62.

[0057] Specifically, the pressure rod 63 presses against the pressure plate 62, thereby pressing the first electrode plate 10 and the second electrode plate 20 together. The pressure rod 63 and the bracket 61 can be connected by a thread. Rotating the pressure rod 63 can adjust its position, thereby changing the pressing force of the pressure rod 63 on the pressure plate 62.

[0058] In a preferred embodiment of this utility model, please also refer to... Figure 5 , Figures 10-13 The pressure plate 62 has a first guide hole 621 and a second guide hole 622 at both ends, and the bracket 61 includes: Connector plate 611; The first guide bolt 612 and the second guide bolt 613 are respectively connected to both ends of the connecting plate 611; A base plate 614 is used to place the first electrode plate 10, and a first notch 6141 and a second notch 6142 are formed at both ends of the base plate 614. The rod portion of the first guide bolt 612 passes through the first guide hole 621; the rod portion of the second guide bolt 613 passes through the second guide hole 622; the first notch 6141 is engaged with the rod portion of the first guide bolt 612 and is limited by the cap portion of the first guide bolt 612; the second notch 6142 is engaged with the rod portion of the second guide bolt 613 and is limited by the cap portion of the second guide bolt 613.

[0059] Specifically, guide bolts guide the pressure plate 62. The guide bolt includes a rod and a cap. The rod connects to the connecting plate 611, for example, via a threaded connection. A guide hole is formed on the pressure plate 62, through which the rod passes, thus guiding the movement of the pressure plate 62. The cap cannot pass through the guide hole, thus limiting the movement of the pressure plate 62. There are two guide holes: a first guide hole 621 and a second guide hole 622, located at opposite ends of the pressure plate 62. There are also two guide bolts: a first guide bolt 612 and a second guide bolt 613. The rod of the first guide bolt 612 passes through the first guide hole 621, and the rod of the second guide bolt 613 passes through the second guide hole 622. Removing the guide bolts allows for the removal and installation of the pressure plate 62. The pressure plate 62 and the base plate 614 are relatively large, capable of covering the sample 80 and applying uniform pressure to it. The through-holes on the electrode plate are located outside the pressure plate 62 and the base plate 614 to prevent interference between the BNC port and the conductive post and the pressure plate 62 and the base plate 614. The base plate 614 has a notch that can engage with the rod of the guide bolt and is limited by the cap of the guide bolt. There are two notches, namely the first notch 6141 and the second notch 6142. The first notch 6141 engages with the rod of the first guide bolt 612, and the second notch 6142 engages with the rod of the second guide bolt 613. The orientation of the first notch 6141 and the second notch 6142 are opposite, and the orientations of the first notch 6141 and the second notch 6142 are consistent with the thread direction of the pressure rod 63. For example, if the orientation of the first notch 6141 and the second notch 6142 is clockwise, when the pressure rod 63 is rotated clockwise, if the pressure rod 63 drives the pressure plate 62 and the base plate 614 to rotate clockwise, the base plate 614 and the rod of the guide bolt will come closer together.

[0060] In a preferred embodiment of this utility model, please also refer to... Figure 4 and Figure 14 The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer further includes: The protective cover 70 covers the clamping assembly 60, the first electrode plate 10, and the second electrode plate 20.

[0061] Specifically, the protective cover 70 covers the clamping assembly 60, the first electrode plate 10, and the second electrode plate 20, and also covers the sample 80 between the first electrode plate 10 and the second electrode plate 20. The bottom of the protective cover 70 has an opening and a clearance notch; the opening allows the clamping assembly 60 to pass through, and the clearance notch allows the BNC port to pass through. The connecting plate 611, the pressure plate 62, and the bottom plate 614 have arc-shaped structures at both ends, and an arc-shaped groove can be formed inside the protective cover 70, which is adapted to the arc-shaped structure.

[0062] Based on any of the above embodiments of the fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer, this utility model also provides a ferroelectric analyzer, including the fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer as described in any of the above embodiments, specifically as described above.

[0063] The ferroelectric analyzer provided by this utility model has all the above-mentioned beneficial effects because it is equipped with the fixture for in-plane polarization testing of single crystal samples in the ferroelectric analyzer as described in any of the above technical solutions, which will not be repeated here.

[0064] It should be understood that the application of this utility model is not limited to the examples above. Those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. A fixture for in-plane polarization testing of single-crystal samples in a ferroelectric analyzer, characterized in that, It includes: The first electrode plate has a first conductive layer and a second conductive layer, and a first channel is formed between the first conductive layer and the second conductive layer. The second electrode plate has a third conductive layer and a fourth conductive layer, and a second channel is formed between the third conductive layer and the fourth conductive layer; Wherein, the position of the first conductive layer corresponds to the position of the third conductive layer, and the first conductive layer and the third conductive layer are equipotential bodies; The position of the second conductive layer corresponds to the position of the fourth conductive layer, and the second conductive layer and the fourth conductive layer are equipotential bodies; The first electrode plate and the second electrode plate are configured to hold the sample, and the sample abuts against the first conductive layer, the second conductive layer, the third conductive layer, and the fourth conductive layer, respectively.

2. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 1, characterized in that, The position of the first channel corresponds to the position of the second channel.

3. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 1, characterized in that, The first conductive layer and the third conductive layer are connected via a first BNC port; The second conductive layer and the fourth conductive layer are connected via a second BNC port.

4. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 3, characterized in that, A first through-hole is formed at the location of the first conductive layer on the first electrode plate, and a second through-hole is formed at the location of the second conductive layer on the first electrode plate. A third through-hole is formed at the location of the third conductive layer on the second electrode plate, and a fourth through-hole is formed at the location of the fourth conductive layer on the second electrode plate. The first BNC port includes: The first connecting post and the first connecting end are interconnected; The first connecting post passes through the first through hole and the third through hole, and abuts against the first conductive layer and the third conductive layer, respectively. The second BNC port includes: The second connecting post and the second connecting end are interconnected; The second connecting post passes through the second through hole and the fourth through hole, and abuts against the second conductive layer and the fourth conductive layer, respectively.

5. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 3, characterized in that, A fifth through hole is formed at the position of the first conductive layer on the first electrode plate, and a sixth through hole is formed at the position of the second conductive layer on the first electrode plate. A seventh through hole is formed at the position of the third conductive layer on the second electrode plate, and an eighth through hole is formed at the position of the fourth conductive layer on the second electrode plate. The fifth through hole and the seventh through hole are provided with first conductive posts, and the first conductive posts abut against the first conductive layer and the third conductive layer respectively; The sixth and eighth through holes are provided with second conductive posts, and the second conductive posts abut against the second conductive layer and the fourth conductive layer, respectively.

6. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 1, characterized in that, The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer also includes: Clamping components; The clamping assembly is configured to clamp the first electrode plate and the second electrode plate.

7. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 6, characterized in that, The clamping assembly includes: A support bracket is used to hold the first electrode plate; A pressure plate, used to be placed on the second electrode plate; A pressure bar is connected to the bracket and presses down on the pressure plate.

8. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 7, characterized in that, The pressure plate has a first guide hole and a second guide hole at both ends, and the bracket includes: Connecting plate; The first guide bolt and the second guide bolt are respectively connected to both ends of the connecting plate; A base plate for placing the first electrode plate, wherein a first notch and a second notch are formed at both ends of the base plate; The rod portion of the first guide bolt passes through the first guide hole; The rod portion of the second guide bolt passes through the second guide hole; The first notch engages with the rod portion of the first guide bolt and is limited by the cap portion of the first guide bolt; The second notch engages with the rod portion of the second guide bolt and is limited by the cap portion of the second guide bolt.

9. The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer according to claim 7, characterized in that, The fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer also includes: A protective cover encloses the clamping assembly, the first electrode plate, and the second electrode plate.

10. A ferroelectric analyzer, characterized in that, It includes the fixture for in-plane polarization testing of single crystal samples in a ferroelectric analyzer as described in any one of claims 1 to 9.

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