Test fixture for polymer waveguide loss

Abstract

The utility model discloses a kind of polymer waveguide loss testing tool.The polymer waveguide loss testing tool includes at least one probe and at least one radiation structure, the radiation structure includes radiator and feed part, the radiator is connected with the feed part;The first end of the probe is used to contact with the feed part, and the radiator is used to be coupled with the polymer waveguide;Test equipment is connected with the second end of the probe, for testing the loss of the polymer waveguide.The utility model can improve the accuracy of polymer waveguide loss test and the comprehensiveness of frequency coverage.

Description

Technical Field

[0001] This utility model relates to the field of waveguide loss testing technology, and in particular to a testing fixture for polymer waveguide loss. Background Technology

[0002] Polymer waveguides can transmit not only light waves but also millimeter waves. Due to their lower cost, polymer waveguides are increasingly used in modern radio frequency technology, chip manufacturing, and other fields. Consequently, the testing of polymer waveguide losses is becoming increasingly important.

[0003] In related technologies, when testing the loss of polymer waveguides, the connection method between the vector network analyzer and the polymer waveguide is as follows: first, the vector network analyzer is connected to the WR-15 module so that the vector network analyzer can output V-band signals; then, the WR-15 module is connected to a circular waveguide converter, which is used to convert the rectangular waveguide interface of the WR-15 into a circular waveguide structure; finally, the circular waveguide converter is connected to a custom waveguide converter, which is used to connect to the polymer waveguide to achieve impedance matching and mode conversion. However, the above method is quite sensitive to assembly and processing. The modules need to be fixed with bolts, resulting in high assembly sensitivity, which makes the measurement results not completely match the actual situation and has low accuracy. Furthermore, it cannot accurately assess the loss in the low-frequency band (below 55 GHz). Utility Model Content

[0004] This invention provides a testing fixture for polymer waveguide loss, thereby improving the accuracy and frequency coverage of polymer waveguide loss testing.

[0005] According to one aspect of the present invention, a testing fixture for polymer waveguide loss is provided, the testing fixture comprising:

[0006] At least one probe and at least one radiating structure, the radiating structure including a radiator and a feed section, the radiator being connected to the feed section; a first end of the probe is used to contact the feed section, and the radiator is used to couple with the polymer waveguide;

[0007] The testing equipment is connected to the second end of the probe and is used to test the loss of the polymer waveguide.

[0008] Optionally, the at least one probe includes a first probe and a second probe, and the at least one radiating structure includes a first radiating structure and a second radiating structure;

[0009] The first end of the first probe is used to contact the feed portion of the first radiating structure, and the radiator of the first radiating structure is used to couple to the first end of the polymer waveguide.

[0010] The first end of the second probe is used to contact the feed portion of the second radiating structure, and the radiator of the second radiating structure is used to couple to the second end of the polymer waveguide;

[0011] The testing equipment is connected to the second end of the first probe and the second end of the second probe.

[0012] Optionally, the radiating structure further includes a first substrate and a ground layer, with the radiator and the ground layer located on opposite sides of the first substrate; the power supply section is on the same layer as the radiator.

[0013] The first end of the probe includes a signal pin and a ground pin, the power supply part includes a signal part and a ground part, the signal part is connected to the radiator, and the ground part is connected to the grounding layer.

[0014] Optionally, the radiating structure further includes a microstrip line connected between the signal unit and the radiator.

[0015] Optionally, the radiating structure further includes a gradient waveguide, the first end of which is fixed to the first substrate and covers the radiator, and the second end of which is used to connect to the polymer waveguide.

[0016] The gradient waveguide includes a gradient segment with a gradually changing cross-sectional area.

[0017] Optionally, the probe includes a main body, a connecting frame, and a connecting handle; the connecting handle is fixed to one end of the main body, and the connecting frame is fixed to the other end of the main body; the connecting frame is provided with a plurality of fixing holes;

[0018] The first end and the second end of the probe are fixed to the connecting handle.

[0019] According to another aspect of the present invention, a method for testing the loss of a polymer waveguide is provided, which is performed by the polymer waveguide testing apparatus described above, the method comprising:

[0020] Test the loss of at least two polymer waveguides under test;

[0021] The loss of the polymer waveguide of a preset length is determined based on the loss of the at least two polymer waveguides to be tested.

[0022] The loss of the polymer waveguide under test is tested, including:

[0023] Control the coupling between the radiator and the polymer waveguide under test;

[0024] Control the probe to contact the power supply section;

[0025] The test equipment is controlled to output a test signal, and the loss of the polymer waveguide under test is tested based on the feedback signal.

[0026] Optionally, controlling the probe to contact the feed section includes:

[0027] The probe is aligned with the feed section in a first direction and a second direction, and then separated upwards in a third direction.

[0028] The probe is controlled to move along the third direction and come into contact with the power supply section.

[0029] Optionally, the radiating structure further includes a first substrate and a ground layer, with the radiator and the ground layer located on opposite sides of the first substrate; the first end of the probe includes a signal pin and a ground pin, the feed section includes a signal section and a ground section, the signal section is connected to the radiator, and the ground section is connected to the ground layer;

[0030] The control of coupling the radiator with the polymer waveguide under test includes:

[0031] Connect the polymer waveguide to be tested to the radiator;

[0032] Alternatively, the radiating structure may further include a gradient waveguide, the first end of which is fixed to the first substrate and covers the radiator, and the second end of which is used to connect to the polymer waveguide; the gradient waveguide includes a gradient segment with a gradually changing cross-sectional area.

[0033] The control of coupling the radiator with the polymer waveguide under test includes:

[0034] The polymer waveguide under test is controlled to be connected to the second end of the graded waveguide.

[0035] Optionally, determining the loss of the polymer waveguide of a preset length based on the losses of the at least two polymer waveguides under test includes:

[0036] The difference in loss between the two polymer waveguides under test is taken as the loss of the polymer waveguide of the preset length; wherein, the preset length is the length difference between the two polymer waveguides.

[0037] The technical solution of this embodiment employs a polymer waveguide loss testing fixture comprising at least one probe and at least one radiating structure. The radiating structure includes a radiator and a feed section, with the radiator connected to the feed section. A first end of the probe is used to contact the feed section, and the radiator is used to couple with the polymer waveguide. A testing device is connected to the second end of the probe and is used to test the loss of the polymer waveguide. Since no mechanical connection is required, and instead an electrical connection between the probe and the radiating structure is used, the contact performance between the probe and the radiating structure can be ensured to be similar in each test, thereby guaranteeing the accuracy of the test results. The probe and the radiating structure can excite a TEM mode electric field on the end face of the polymer waveguide. This electric field can excite TE modes within the polymer waveguide in low-frequency bands, V-band, W-band, D-band, and terahertz bands, with low reflection and loss. Therefore, the testing fixture of this embodiment can also improve the comprehensiveness of frequency coverage.

[0038] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this utility model, nor is it intended to limit the scope of this utility model. Other features of this utility model will become readily apparent from the following description. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0040] Figure 1 A schematic diagram of the structure of a polymer waveguide loss testing fixture provided for an embodiment of this utility model;

[0041] Figure 2 An exploded view of a radial structure provided in an embodiment of this utility model;

[0042] Figure 3 A schematic diagram of the structure of a probe provided in an embodiment of this utility model;

[0043] Figure 4 A partially enlarged schematic diagram of a probe provided for an embodiment of this utility model;

[0044] Figure 5 A schematic diagram of another polymer waveguide loss testing fixture provided for an embodiment of this utility model;

[0045] Figure 6 A schematic diagram of the structure of a test fixture for testing a second polymer waveguide provided in an embodiment of this utility model;

[0046] Figure 7 This is a schematic diagram of the test results of the polymer waveguide loss test fixture provided by the embodiments of this utility model;

[0047] Figure 8 A flowchart illustrating a method for testing polymer waveguide loss according to an embodiment of this utility model. Detailed Implementation

[0048] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0049] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the utility model described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0050] Figure 1 This is a schematic diagram of the structure of a polymer waveguide loss testing fixture provided in an embodiment of the present invention. Figure 2 This is an exploded view of a radial structure provided in an embodiment of the present invention. Figure 3 This is a schematic diagram of the structure of a probe provided in an embodiment of the present invention. Figure 4 This is a partially enlarged schematic diagram of a probe provided in an embodiment of the present invention, with reference to... Figures 1 to 4 The test fixture includes at least one probe 1, at least one radiating structure 2, and a test device. The radiating structure 2 includes a radiator 21 and a feed section 22, with the radiator 21 connected to the feed section 22. The first end of the probe 1 is used to contact the feed section 22, and the radiator 21 is used to couple with the polymer waveguide 3. The test device is connected to the second end of the probe 1 and is used to test the loss of the polymer waveguide.

[0051] Specifically, the test fixture in this embodiment is used to test the loss of the polymer waveguide, specifically to test the loss of the polymer waveguide at a preset band and a preset length. The polymer waveguide is, for example, a polymer waveguide capable of transmitting millimeter waves. The preset band is, for example, V-band, W-band, D-band, terahertz band, or a low-frequency band below V-band. The preset length is, for example, 5 mm, 1000 mm, 2000 mm, or 3000 mm, etc., and this embodiment does not specifically limit these values. The polymer waveguide is a non-metallic structure. During testing, the polymer waveguide 3 is coupled to the radiator 21. The test equipment can output a test signal, which is transmitted to the radiating structure 2 through the probe 1 and radiated through the radiator 21. The polymer waveguide receives the test signal radiated by the radiator 21. The test signal is transmitted within the polymer waveguide 3 and returns to the test equipment via a return path. Therefore, the test equipment can calculate the insertion loss of the polymer waveguide based on the output test signal and the received return signal. In some embodiments, the test fixture may include a radiating structure 2 for radiating a test signal, where the radiator 21 in this radiating structure 2 can be understood as a transmitting antenna. In other embodiments, the test fixture may also include a radiating structure 2 for receiving a test signal transmitted through a polymer waveguide, where the radiator 21 in this radiating structure 2 can be understood as a receiving antenna. It is understood that the test signal is a frequency-sweeping signal located in a preset band and having a certain power.

[0052] Probe 1, for example, is a coplanar waveguide probe. When probe 1 contacts the radiating structure 2, the contact position between probe 1 and the feed section 22 on the radiating structure 2 can be precisely controlled using a microscope, and the contact pressure can also be precisely controlled, thus ensuring high consistency in the electrical performance of probe 1 and the radiating structure 2 in each test. When the electrical connection performance of probe 1 and the radiating structure 2 is consistent, the consistency of the signal radiated by the radiator 21 is also high, and consequently, the consistency of the signal coupled into the polymer waveguide is also high. In addition, probe 1 has low insertion loss (e.g., insertion loss less than 0.5dB) and minimal parasitic effects. Through micro-coaxial integration and other methods, signal reflection and radiation leakage can be reduced, thereby further improving repeatability. In contrast, in related technologies, the WR-15 module and the circular waveguide converter are mechanically connected, and the circular waveguide converter and the custom waveguide converter are also mechanically connected. Even a small offset in mechanical connection can excite higher-order modes, increasing insertion loss and reflection; and ensuring the consistency of the mechanical connection state in each repeated test is also difficult. Therefore, related technologies are highly sensitive to assembly. In this embodiment, no mechanical connection is required. Instead, the electrical connection between probe 1 and radiating structure 2 is used, and the test signal is coupled into polymer waveguide 3 by radiating electromagnetic waves through radiator 21. The sensitivity of the contact between probe 1 and radiating structure 2 is low, which ensures that the contact performance between probe 1 and radiating structure 2 is similar in each test, thereby ensuring the accuracy of the test results.

[0053] Furthermore, in related technologies, customized waveguide converters convert modes propagating in metallic waveguides to modes propagating in dielectric waveguides, and this structure exhibits good conversion efficiency at specific frequencies. However, for low-frequency bands, the wavelength of electromagnetic waves is longer, resulting in poor mode conversion and potentially exciting higher-order modes or radiating modes, leading to inaccurate test results. In this embodiment, probe 1 and radiating structure 2 can excite a TEM mode electric field at the end face of the polymer waveguide. This electric field excites a TE mode within the polymer waveguide, exhibiting low reflection and loss. Even at low frequencies, it can excite a stable TE mode within the polymer waveguide, while higher-order modes attenuate rapidly and do not propagate within the polymer waveguide. Therefore, the test fixture in this embodiment can also improve the comprehensiveness of frequency coverage.

[0054] The technical solution of this embodiment employs a polymer waveguide loss testing fixture comprising at least one probe and at least one radiating structure. The radiating structure includes a radiator and a feed section, with the radiator connected to the feed section. A first end of the probe is used to contact the feed section, and the radiator is used to couple with the polymer waveguide. A testing device is connected to a second end of the probe and is used to test the loss of the polymer waveguide. Since no mechanical connection is required, and instead an electrical connection between the probe and the radiating structure is utilized, the contact performance between the probe and the radiating structure can be ensured to be approximately consistent during each test, thereby guaranteeing the accuracy of the test results. The probe and the radiating structure can excite a TEM mode electric field at the end face of the polymer waveguide. This electric field can excite TE modes within the polymer waveguide in low-frequency, V-band, W-band, D-band, and terahertz bands, with low reflection and loss. Therefore, the testing fixture of this embodiment can also improve the comprehensiveness of frequency coverage.

[0055] Optionally, Figure 5 A schematic diagram of another polymer waveguide loss testing fixture provided in an embodiment of this utility model is shown below. Figure 5 .exist Figure 5 The polymer waveguide in the test is, for example, a first polymer waveguide 31 to be tested. At least one probe includes a first probe 1A and a second probe 1B, and at least one radiating structure includes a first radiating structure 2A and a second radiating structure 2B. A first end of the first probe 1A is used to contact the feed portion of the first radiating structure 2A, and the radiator of the first radiating structure 2A is used to couple to the first end of the polymer waveguide. A first end of the second probe 1B is used to contact the feed portion of the second radiating structure 2B, and the radiator of the second radiating structure 2B is used to couple to the second end of the polymer waveguide. The test equipment is connected to the second ends of the first probe 1A and the second ends of the second probe 1B.

[0056] Specifically, in this embodiment, both the transmission and return paths of the test signal are implemented using probes and radiating structures. For example, the first probe 1A is connected to the signal output terminal of the test equipment. The signal output by the test equipment is coupled to the first radiating structure 2A via the first probe 1A. The radiator of the first radiating structure 2A excites an electric field of TEM mode at the first end of the polymer waveguide 31 under test, thereby exciting a TE mode inside the polymer waveguide 31 under test. The TE mode at the second end of the polymer waveguide 31 under test, in turn, excites an electric field of TEM mode on the second radiating structure 2B. This TEM mode is transmitted within the second radiating structure 2B and, after passing through the second probe 1B, is transmitted to the signal input terminal of the test equipment. The test equipment compares the output signal with the input signal to obtain the insertion loss of the polymer waveguide 31 under test. In this embodiment, both the transmission and return paths of the test signal include probes and radiating structures, ensuring high repeatability and bandwidth of both the transmission and return paths. Of course, in some other embodiments, the first probe 1A and the first radiating structure 2A can be used as the return path, and the second probe 1B and the second radiating structure 2B can be used as the transmission path.

[0057] Optionally, in the above embodiments, the testing equipment can be a vector network analyzer. The testing equipment can test the S-parameters of the polymer waveguide, which can be S11 parameters, S21 parameters, etc.

[0058] Optionally, in some embodiments, the loss of the polymer waveguide at a preset length can be obtained by testing the losses of at least two polymer waveguides of different lengths. The preset length is the length difference between the two polymer waveguides being tested. This method eliminates interference terms such as coupling loss between probe 1 and the radiating structure 2, ensuring that the final result represents the loss of the polymer waveguide. More specifically, Figure 6 This is a schematic diagram of the structure of a test fixture for a polymer waveguide, provided in an embodiment of the present invention, when testing a second polymer waveguide to be tested. Figure 5 This can be understood as a structural schematic diagram of the test fixture when testing the first polymer waveguide under test. The first polymer waveguide under test 31 and the second polymer waveguide under test 32 have different lengths. For example, the length of the first polymer waveguide under test 31 is L1, and the length of the second polymer waveguide under test 32 is L2. The difference between their lengths is |L1-L2|. The loss of the first polymer waveguide under test 31 obtained by the test fixture is, for example, S(1), and the loss of the second polymer waveguide under test 32 is, for example, S(2). Then, when the length of the polymer waveguide is |L1-L2|, its loss is |S(1)-S(2)|. In some embodiments, the losses of multiple polymer waveguides under test can be tested, and the losses of the polymer waveguides at different lengths can be fitted according to the difference in length.

[0059] Optionally, refer to Figures 2 to 4 The radiation structure 2 also includes a first substrate 23 and a ground layer 24. The radiator 21 and the ground layer 24 are located on both sides of the first substrate 23. The power supply part 22 is on the same layer as the radiator 21. The first end of the probe 1 includes a signal pin 11 and a ground pin 12. The power supply part 22 includes a signal part 221 and a ground part 222. The signal part 221 is connected to the radiator 21, and the ground part 222 is connected to the ground layer 24.

[0060] Specifically, the probe in this embodiment is, for example, a GSG probe, including a signal pin 11 and two ground pins 12. The two ground pins 12 are located on both sides of the signal pin 11. The signal pin 11 is used to transmit radio frequency or millimeter-wave signals; the two ground pins 12 are used to provide a grounding path, reducing electromagnetic interference and parasitic capacitance, thereby ensuring signal integrity. The two ground pins 12 and the signal pin 11 form a triangular layout, constituting a coplanar waveguide structure. The GSG probe is a micro-coaxial structure, meaning that the signal pin 11 and the two ground pins 12 are connected to the corresponding structures in the coaxial line, and are all fabricated using chip technology, thereby achieving integration and miniaturization, and reducing signal leakage. In some embodiments, the spacing between the signal pin 11 and the ground pins 12 can be from 100 micrometers to 250 micrometers.

[0061] The first substrate 23 serves as insulation and support, insulating the radiator 21 and the ground layer 24. The signal section 221 and the ground section 222 in the feed section 22 can both be pads. The signal section 221 is used to contact the signal pin 11, and the ground section 222 is used to contact the ground pin 12. The spacing between the signal section 221 and the ground section 222 can be the same as the spacing between the signal pin 11 and the ground pin 12. Both the signal section 221 and the ground section 222 can be rectangular. The radiator 21 and the ground layer 24 are located on opposite sides of the substrate, giving the radiator a strong directionality in radiating signals, facilitating the excitation of corresponding electromagnetic waves within the polymer waveguide. The first substrate 23 is, for example, a PTFE (Polytetrafluoroethylene) substrate.

[0062] Optionally, in some embodiments, the radiating structure further includes a second substrate 25, which is disposed on the side of the ground layer 24 away from the first substrate 23. The second substrate 25 serves a protective function, preventing the ground layer from being exposed and damaged. The second substrate 25 is, for example, a PTFE substrate.

[0063] In some implementations, the radiating structure can be a PCB (Printed Circuit Board) structure.

[0064] Optionally, continue to refer to Figure 2The radiating structure 2 also includes a microstrip line 26, which connects the signal unit and the radiator 21.

[0065] Specifically, the microstrip line 26 can be used for impedance matching, matching the overall impedance of the polymer waveguide coupled to the radiator 21 with the impedance of the probe, for example, matching it to 50 ohms, thereby ensuring efficient signal transmission. In some embodiments, the coupling of the polymer waveguide and the radiating structure can be achieved by directly connecting the end face of the polymer waveguide to the radiator 21, for example, aligning the two. By setting parameters such as the size and shape of the radiator 21, the impedance of the radiator 21 can be matched with the impedance of the polymer waveguide, ensuring efficient signal transmission. When the polymer waveguide and the radiator 21 are coupled, the overall impedance of the polymer waveguide and the radiator 21 may not match the impedance of the probe. Therefore, impedance matching can be achieved through the microstrip line 26, thereby ensuring that the test signal can be transmitted efficiently after coupling the polymer waveguide. When the end face of the polymer waveguide is directly connected to the radiator 21 to test the polymer waveguide, the low contact between the polymer waveguide and the radiator (i.e., no fixing with bolts or the like) can reduce the impact of mechanical stress on the flexible polymer waveguide.

[0066] Alternatively, in some implementations, such as Figure 2 As shown, the radiating structure 2 also includes a gradient waveguide 27. The first end of the gradient waveguide 27 is fixed to the first substrate 23 and covers the radiator 21. The second end of the gradient waveguide 27 is used to connect to the polymer waveguide. The gradient waveguide 27 includes a gradient segment 271 with a gradually changing cross-sectional area.

[0067] Specifically, the gradient waveguide 27 is a hollow tubular structure, and the impedance of the gradient segment 271 gradually changes, thereby achieving impedance matching between the radiator 21 and the polymer waveguide. For example... Figure 2 and Figure 5 As shown, the tapered section 271 can be a bent structure to facilitate the installation of the polymer waveguide. Furthermore, the tapered waveguide 27 also serves a fixing function to secure the polymer waveguide. In some embodiments, the material of the tapered waveguide 27 can be non-metallic, such as a polymer waveguide. In other embodiments, the tapered waveguide 27 can also be a metallic waveguide.

[0068] like Figure 2As shown, an opening 272 is provided at one end of the tapered waveguide 27 connected to the first substrate 23. The opening 272 is used to isolate the tapered waveguide 27 from the radiator 21 or the microstrip line 26, preventing the tapered waveguide 27 from contacting the radiator 21 or the microstrip line 26. After assembly, the radiator 21 is located in the hollow portion of the tapered waveguide 27, that is, the radiator 21 is located inside the orthographic projection of the tapered waveguide 27 onto the first substrate 23. In this embodiment, when testing the polymer waveguide, the radiator does not need to contact the polymer waveguide, resulting in less damage to the polymer waveguide and less impact of mechanical stress on the polymer waveguide.

[0069] Optionally, refer to Figure 3 The probe 1 includes a main body 13, a connecting frame 14, and a connecting handle 15; the connecting handle 15 is fixed to one end of the main body 13, and the connecting frame 14 is fixed to the other end of the main body 13; the connecting frame 14 is provided with a plurality of fixing holes 141; the first end and the second end of the probe are fixed to the connecting handle 15.

[0070] Specifically, the main body 13 is used to fix the signal pin 11 and the grounding pin 12, providing mechanical stability and fine-tuning capability. The main body 13 can be a rectangular or conical structure. The support frame 14 is, for example, a rectangular structure, in which the fixing hole 141 can be used to fix the probe 1 on the probe stage, thereby ensuring that the probe moves accurately in three directions in three-dimensional space. The connecting handle 15 is used to fix the first end and the second end of the probe, wherein a coaxial line 16 can be provided in the connecting handle 15, and the first end and the second end of the probe are electrically connected through the coaxial line 16. Of course, the first end and the second end of the probe can also be connected through a microstrip line. The connecting handle 15 can be at a certain angle to the arrangement direction of the main body 13 and the connecting frame 14. At this time, the signal pin and the grounding pin will also present a corresponding angle with the radiation structure, reducing damage to the radiation structure and improving the stability of the contact; this angle can be 45 degrees.

[0071] For example, Figure 7 This is a schematic diagram of the test results of the polymer waveguide loss test fixture provided by the embodiments of this utility model. Figure 7 The diagram illustrates the losses corresponding to polymer waveguide lengths of 5 mm, 1000 mm, 2000 mm, and 3000 mm. The actual test results are close to the simulation results, and the tests can be performed over a wide frequency range.

[0072] Based on the same inventive concept, this utility model also provides a method for testing polymer waveguide loss. This testing method is performed by the testing apparatus provided in any embodiment of this utility model, such as... Figure 8 As shown, Figure 8 A flowchart illustrating a method for testing the loss of a polymer waveguide, provided as an embodiment of this utility model. The testing method includes:

[0073] Step S101: Test the loss of at least two polymer waveguides to be tested; wherein, testing the loss of at least two polymer waveguides to be tested includes: controlling the radiator to be coupled to the polymer waveguide to be tested; controlling the probe to contact the feed section; controlling the test equipment to output a test signal, and testing the loss of the polymer waveguide to be tested according to the feedback signal.

[0074] Specifically, each polymer waveguide under test has a different length, allowing for sequential testing of the loss of at least two waveguides, with each waveguide capable of multiple tests. During testing, the radiator can be manually or mechanically coupled to the waveguide. The probe can be manually or mechanically controlled to contact the feed element, for example, by moving the probe under a microscope to ensure precise contact. The order of coupling the radiator to the waveguide and contacting the probe with the feed element is not limited; these two steps can be performed simultaneously. Once coupling and contact are complete, the waveguide can be tested using the testing equipment to obtain its loss.

[0075] Step S102: Determine the loss of a polymer waveguide of a preset length based on the losses of at least two polymer waveguides to be tested.

[0076] Specifically, by detecting the losses of at least two polymer waveguides under test, interference terms such as coupling loss between the probe and the radiating structure are eliminated, so that the final result is the loss of the polymer waveguide.

[0077] The technical solution of this embodiment employs a polymer waveguide testing method comprising: testing the loss of at least two polymer waveguides to be tested; determining the loss of a preset length of polymer waveguide based on the losses of the at least two polymer waveguides to be tested; wherein, testing the loss of the polymer waveguide to be tested includes: controlling the coupling of the radiator to the polymer waveguide to be tested; controlling the probe to contact the feed section; controlling the test equipment to output a test signal, and testing the loss of the polymer waveguide to be tested based on the feedback signal. Since no mechanical connection is required, but rather an electrical connection between the probe and the radiating structure is utilized, it can be ensured that the contact performance of the probe and the radiating structure is approximately the same during each test, thereby ensuring the accuracy of the test results. The probe and the radiating structure can excite a TEM mode electric field at the end face of the polymer waveguide. This electric field can excite TE modes within the polymer waveguide in the low-frequency band, V-band, W-band, D-band, and terahertz band, with low reflection and loss. Therefore, the test fixture of this embodiment can also improve the comprehensiveness of frequency coverage.

[0078] Optionally, the contact between the control probe and the feed section includes:

[0079] The control probe is aligned with the power supply in the first and second directions, and then separated upwards in the third direction;

[0080] Specifically, the first and second directions are, for example, horizontal, and the third direction is, for example, vertical. This step can be understood as the initial alignment of the probe and the feed section. Figure 3 As shown, the main body 13 and the connecting frame 14 can control the probe 1 to be precisely positioned in the first direction, the second direction, and the third direction, thereby ensuring that the first end of the probe is aligned with the center of the power supply section. In this step, the probe can be quickly moved above the power supply section, resulting in high testing efficiency.

[0081] The control probe moves along a third direction and comes into contact with the power supply section.

[0082] Specifically, this step can be understood as precise alignment, which involves slowly moving probe 1 upwards and observing under a microscope whether the probe is in contact with the feed section. When the probe contacts the feed section, the signal pin 11 and the ground pin 12 will undergo certain deformations. Whether the probe has made contact with the feed section can be determined by judging whether the signal pin 11 and the ground pin 12 have deformed. In some embodiments, the probe is equipped with a spring or a fine-tuning control unit to control the contact force between the probe and the feed section (e.g., adjustable within the range of 1 to 5 grams) to avoid damaging the radiating structure. After contact is established, signal transmission can be performed to test the S-parameters of the polymer waveguide under test.

[0083] Optionally, in some embodiments, controlling the coupling between the radiator and the polymer waveguide under test includes:

[0084] Connect the polymer waveguide to be tested to the radiator.

[0085] Specifically, in this embodiment, the end face of the polymer waveguide under test can be directly aligned and connected to the radiator. By setting parameters such as the size and shape of the radiator 21, the impedance of the radiator 21 can be matched with the impedance of the polymer waveguide, ensuring efficient signal transmission. Directly connecting the polymer waveguide under test to the radiator eliminates the need for other fixing structures, simplifying the connection method and improving testing efficiency.

[0086] Optionally, in some other embodiments, controlling the coupling between the radiator and the polymer waveguide under test includes:

[0087] The polymer waveguide under test is connected to the second end of the graded waveguide.

[0088] Specifically, after setting up the graded waveguide, the polymer waveguide under test is fixedly connected to it. The graded waveguide can fix the polymer waveguide under test and also position it. That is to say, during each test, the end face of the polymer waveguide under test is relatively consistent with the relative position of the radiator, thereby further improving the repeatability of the test.

[0089] Optionally, determining the loss of a polymer waveguide of a predetermined length based on the losses of at least two polymer waveguides under test includes:

[0090] The difference in loss between the two polymer waveguides under test is taken as the loss of the polymer waveguide of the preset length; the preset length is the difference in length between the two polymer waveguides under test.

[0091] Specifically, the length of the first polymer waveguide 31 to be tested is, for example, L1, and the length of the second polymer waveguide 32 to be tested is, for example, L2. The length difference between the two is |L1-L2|. The loss of the first polymer waveguide 31 to be tested obtained by the test fixture is, for example, S(1), and the loss of the second polymer waveguide 32 to be tested is, for example, S(2). Then, when the length of the polymer waveguide is |L1-L2|, its loss is |S(1)-S(2)|. In some embodiments, the losses of multiple polymer waveguides to be tested can be tested, and the loss of the polymer waveguide at different lengths can be fitted according to the length difference. Of course, the loss per unit length of the polymer waveguide can also be obtained according to the difference in loss and the difference in length, that is, the ratio of the difference in loss to the difference in length represents the loss per unit length.

[0092] Alternatively, the testing methods for polymer waveguides also include:

[0093] The probe is calibrated. Calibration may include SOLT (Short, Open, Load, Through) calibration. By calibrating the interface between the probe and the polymer waveguide, it is ensured that the measured S-parameters reflect the characteristics of the polymer waveguide itself, rather than parasitic effects of the probe or its connections. Calibration can be performed using corresponding standards; it is understood that the port spacing on the standard required for calibration should be the same as the spacing between the signal pin and the ground pin inside the probe.

[0094] During open-circuit calibration, the probe is connected to an open-circuit standard to measure open-circuit reflection and calibrate parasitic capacitance and radiation effects. During short-circuit calibration, the probe is connected to a short-circuit standard to correct reflection phase errors. During load calibration, near-zero reflection is measured to correct impedance mismatch and noise. During straight-through calibration, the transmission response is measured to correct insertion loss and phase delay. It should be noted that the angle between the connecting handle and the calibration standard is the same as the angle between the connecting handle and the radiator during probe calibration. Calibration is performed before damage testing of the polymer waveguide under test.

[0095] It should be understood that the various forms of the process shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this utility model can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this utility model can be achieved, and this is not limited herein.

[0096] The specific embodiments described above do not constitute a limitation on the scope of protection of this utility model. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the scope of protection of this utility model.

Claims

1. A testing fixture for polymer waveguide loss, characterized in that, The testing fixture for polymer waveguide loss includes: At least one probe and at least one radiating structure, the radiating structure including a radiator and a feed section, the radiator being connected to the feed section; a first end of the probe is used to contact the feed section, and the radiator is used to couple with the polymer waveguide; The testing equipment is connected to the second end of the probe and is used to test the loss of the polymer waveguide.

2. The testing fixture for polymer waveguide loss according to claim 1, characterized in that, The at least one probe includes a first probe and a second probe, and the at least one radiating structure includes a first radiating structure and a second radiating structure; The first end of the first probe is used to contact the feed portion of the first radiating structure, and the radiator of the first radiating structure is used to couple to the first end of the polymer waveguide. The first end of the second probe is used to contact the feed portion of the second radiating structure, and the radiator of the second radiating structure is used to couple to the second end of the polymer waveguide; The testing equipment is connected to the second end of the first probe and the second end of the second probe.

3. The testing fixture for polymer waveguide loss according to claim 1, characterized in that, The radiating structure further includes a first substrate and a ground layer, with the radiator and the ground layer located on opposite sides of the first substrate; the power supply section is on the same layer as the radiator. The first end of the probe includes a signal pin and a ground pin, the power supply part includes a signal part and a ground part, the signal part is connected to the radiator, and the ground part is connected to the grounding layer.

4. The testing fixture for polymer waveguide loss according to claim 3, characterized in that, The radiating structure also includes a microstrip line, which connects the signal unit and the radiator.

5. The testing fixture for polymer waveguide loss according to claim 3, characterized in that, The radiating structure further includes a gradient waveguide, the first end of which is fixed to the first substrate and covers the radiator, and the second end of which is used to connect to the polymer waveguide. The gradient waveguide includes a gradient segment with a gradually changing cross-sectional area.

6. The testing fixture for polymer waveguide loss according to claim 1, characterized in that, The probe includes a main body, a connecting frame, and a connecting handle; the connecting handle is fixed to one end of the main body, and the connecting frame is fixed to the other end of the main body; the connecting frame is provided with multiple fixing holes. The first end and the second end of the probe are fixed to the connecting handle.

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