A formed component testing device with a multi-sample preparation cartridge

Abstract

The formed component detection device with a multi-sample preparation box comprises a formed component detection chip placed on an A bearing assembly, the formed component detection chip comprising a microscopic sample containing cavity for containing a microscopic sample; an A camera assembly for acquiring a microscopic enlarged image of the microscopic sample; a pipette assembly of a sample transfer device, the pipette assembly operating a B sample preparation box and / or a C sample preparation box to prepare a sample into the microscopic sample; the sample transfer device transferring the microscopic sample to the formed component detection chip; the B sample preparation box comprising a test tube containing cavity and a reagent containing cavity; the C assembly comprising a sample stirring module, the C sample preparation box comprising a sampling stirring spoon, one end of the sampling stirring spoon comprising a stirring shaft head, the sample stirring module comprising a rotating shaft and a driving motor, the driving motor being used to drive the rotating shaft to rotate; the rotating shaft being capable of being coupled with the stirring shaft head to drive the sampling stirring spoon to rotate; and a D assembly being in electrical signal connection with each assembly for controlling a detection process.

Description

Technical Field

[0001] This application belongs to the field of medical testing equipment technology, and relates to formed element detection devices, particularly to formed element detection devices with sample preparation capabilities. Background Technology

[0002] Formed element detection devices are high-precision, highly complex medical instruments that include sophisticated microscopic imaging systems and image analysis and processing systems. They are a comprehensive integration of disciplines such as biotechnology, medical technology, high-precision instruments, computer science, and artificial intelligence graphics analysis technology. The systems are complex and require numerous sensors, control devices, and detection components.

[0003] The applicant has pioneered a method and device for the analysis of formed elements in the industry. By adding a suspension to a detection chip, the formed elements in the suspension are directly imaged under a microscope, and the formed elements are detected and analyzed based on the microscopic images.

[0004] The applicant has also pioneered an integrated detection method and device for multiple samples (blood, urine, and feces) in the industry. One detection device can simultaneously detect multiple different types of biological samples, providing clients with a very economical integrated solution.

[0005] However, before the applicant can perform detection and analysis on biological samples using the integrated detection method and device, a corresponding processing procedure is required. Previously provided detection chips required sample preparation outside the device, necessitating sample processing using additional equipment or manually.

[0006] Integrating the sample preparation process within the device is a significant challenge. The technical problem this application aims to solve is how to further integrate various sample handling procedures into a unified detection method and device, designing a formed element detection device capable of simultaneously preparing and detecting samples. Summary of the Invention

[0007] To address the shortcomings of existing formed element analysis devices that require external or manual sample preparation, a formed element analysis device integrating sample preparation is designed. This device can simultaneously complete the preparation and detection of multiple different types of samples, representing a more integrated formed element detection device and method suitable for the integrated preparation of samples with various properties and types.

[0008] The technical solution of this application to solve the above-mentioned technical problems is a formed element detection device, including component A, component B, component C, component D, and component E; component A includes an imaging component A and a carrier component A, the carrier component A being used to place the formed element detection chip; the formed element detection chip includes a microscopic sample receiving cavity, the microscopic sample receiving cavity being used to receive the microscopic sample; the imaging component A is used to acquire a magnified microscopic image of the microscopic sample; component B includes a carrier component B, the carrier component B being used to carry a sample preparation box B; the sample preparation box B includes a test tube receiving cavity and a reagent receiving cavity; the test tube receiving cavity is used to receive test tubes, and the reagent receiving cavity is used to receive detection reagents; component C includes a carrier component C and a sample stirring module, the carrier component C being used to carry the sample preparation module C. The sample preparation box (C) includes a sampling stirring spoon, one end of which includes a stirring shaft head. The sample agitation module includes a rotating shaft and a drive motor, which drives the rotating shaft to rotate. The rotating shaft can be coupled to the stirring shaft head to drive the sampling stirring spoon to rotate. Component E includes a sample transfer device, which includes a pipette assembly. The pipette assembly is used to operate the sample preparation boxes (B and / or C) to prepare samples for microscopic examination. The sample transfer device transfers the microscopic samples to the formed element detection chip. Component D is a detection control component, electrically connected to component A, component B, component C, and component E. Component D is used to control the detection process.

[0009] The sample transfer device may include a gantry crane transfer assembly and a pipette assembly; the gantry crane transfer assembly includes a horizontal rail A; the pipette assembly includes a pipette, the pipette assembly is mounted on the horizontal rail A, and the pipette assembly is capable of moving horizontally; the pipette transfers the microscopic sample to the formed element detection chip.

[0010] Alternatively, the sample transfer device may include a pendant transfer assembly and a pipette assembly; the pendant transfer assembly includes a rotating support column and a horizontal arm; the pipette assembly includes a pipette, the pipette assembly is mounted on the horizontal arm, and the rotating support column can drive the horizontal arm to rotate in the horizontal direction.

[0011] Alternatively, the horizontal arm may include a horizontal rail B, on which the pipette is mounted and can move horizontally.

[0012] Alternatively, component B may include a support track B, the support component B may be disposed on the support track B, and the support component B may be movable on the support track B.

[0013] Alternatively, the B sample preparation box may include a pipette tip receiving cavity; or the B carrier assembly may include a pipette tip receiving cavity, the pipette tip receiving cavity accommodating a pipette tip.

[0014] Alternatively, the B sample preparation box may include a B1 light-transmitting detection cavity, which is used to contain the detection sample; the B component may include a B optical detection component, which may include a B1 detection light source and a B1 light detection module; the B1 detection light source is used to emit detection light, which passes through the light-transmitting detection cavity, and the B1 light detection module is used to detect the detection light.

[0015] Alternatively, the B sample preparation box may include a B2 transmissive detection cavity for containing a detection sample; the B component may include a B2 camera component, which includes a B2 light source and a B2 camera module; the B2 light source may emit illumination light, which illuminates the B2 transmissive detection cavity; and the B2 camera module in the B2 camera component may capture layered images of the detection sample inside the B2 transmissive detection cavity.

[0016] Alternatively, the B sample preparation kit may include a B test strip receiving cavity for receiving test strips; the B component may include a B3 camera component, which may include a B3 camera module; the B3 camera module may be used to capture images of the test strips inside the B test strip receiving cavity.

[0017] Alternatively, the B3 camera assembly may include a B support column and a B rotating arm, with one end of the B rotating arm connected to the B support column and the B3 camera module located at the other end of the B rotating arm, allowing the B rotating arm to rotate around the B support column.

[0018] Alternatively, the A-bearing component may include a bearing platform and an X-axis slide, with the bearing platform disposed on the X-axis slide and including a detection chip receiving slot.

[0019] Alternatively, the A-bearing component may include a Y-axis slide, and the X-axis slide may be disposed on the Y-axis slide.

[0020] Alternatively, the sample agitation module may include a support frame, a rotating shaft, and a drive motor; the support frame is mounted on the C-bearing component or the C-sample preparation box, and the rotating shaft and the drive motor are mounted on the support frame.

[0021] Alternatively, the sample agitation module may include a rotating shaft and a drive motor; the sample agitation module and the sample transfer device may share a support frame; the support frame may be used to support the pipette, the rotating shaft, and the drive motor.

[0022] The sample preparation box (C) may include a light-transmitting detection cavity (C1) for containing a sample to be tested; the component (C) may include an optical detection component (C1) for a detection light source and a light detection module (A); the detection light source (C1) emits detection light, which passes through the light-transmitting detection cavity, and the light detection module (A) detects the detection light.

[0023] Alternatively, the C sample preparation box may include a C2 transmissive detection cavity, which is used to contain the detection sample; the C component may include a C2 camera component, which includes a C2 light source and a C camera module; the C2 light source is used to emit illumination light, which illuminates the C2 transmissive detection cavity, and the C2 camera module in the C2 camera component is used to capture layered images of the detection sample inside the C2 transmissive detection cavity.

[0024] The technical solution to the above-mentioned technical problem can also be a formed element detection method, including the steps of using a formed element detection chip, a B sample preparation box, and a C sample preparation box; the formed element detection chip includes a microscopic sample receiving cavity for receiving microscopic samples; the C sample preparation box includes a sampling stirring spoon, one end of which includes a stirring shaft head, which can drive the sampling stirring spoon to rotate; step A: add the test sample to the C sample preparation box and drive the stirring spoon to stir the test sample to prepare an intermediate sample; step B: use a pipette to pick up the intermediate sample and add it to the B sample preparation box; step C: wait for the intermediate sample to mix with the test reagent to prepare a microscopic sample; step D: use a pipette to pick up the microscopic sample and add it to the microscopic sample receiving cavity on the formed element detection chip; step E: photograph the formed element detection chip to obtain a magnified microscopic image of the microscopic sample.

[0025] Alternatively, the B sample preparation kit may include a reagent receiving cavity; the reagent receiving cavity is used to contain the detection reagent; in step B: the intermediate sample is drawn up with a pipette and added to the reagent receiving cavity of the B sample preparation kit.

[0026] The sample preparation kit B may include a test tube containing cavity; the test tube containing cavity is used to contain test tubes, and the test tubes are used to contain samples; in step B: the intermediate sample is drawn up with a pipette and added to the test tube in the test tube containing cavity of the sample preparation kit B.

[0027] It is possible that the B sample preparation kit includes a preparation chamber; in step B: use a pipette to draw up the intermediate sample and add it to the sample preparation chamber in the B sample preparation kit.

[0028] Alternatively, in step B, the reagent containing cavity may include a staining reagent; or the preparation cavity may include a staining reagent; or the test tube containing cavity may include a staining reagent.

[0029] Alternatively, step B may include using a pipette to draw up the staining reagent and add it to the sample preparation chamber, the reagent container chamber, or the test tube container chamber.

[0030] One of the technical effects of the above-mentioned technical solution is that the combination of multiple components has the functions of sample transfer and multiple sample preparation. The B sample preparation box and the C sample preparation box are suitable for the preparation process of samples with different properties, which improves the integration of the formed element detection device and opens up the era of automated preparation of multiple samples for formed element detection.

[0031] One of the technical effects of the above-mentioned technical solution is that the gantry crane transfer assembly can facilitate sample transfer and realize the connection between sample preparation and sample testing.

[0032] One of the technical advantages of the above-mentioned solution is that the gantry-type transfer assembly facilitates sample transfer, enabling seamless integration between sample preparation and sample testing. Furthermore, its range of motion is greater and more flexible compared to the gantry-type transfer assembly.

[0033] One of the technical effects of the above-mentioned technical solution is that the C-shaped horizontal hanging rail further expands the range of movement, making sample transfer more flexible.

[0034] One of the technical effects of the above-mentioned technical solution is that the B-bearing component can move on the B-bearing track, which facilitates the movement of the sample preparation box and makes sample preparation easier.

[0035] One of the technical advantages of the above-mentioned solution is that the sample preparation kit includes a pipette tip receiving cavity, which facilitates the fit between the pipette body and the pipette tip, and makes it easy to replace the pipette tip. Multiple pipette tip receiving cavities can be provided to hold different types of pipette tips; such as pipette tips of different sizes or capacities; or different types of pipette tips, such as those made of different materials; or pipette tips in different usage states, such as used and unused tips.

[0036] One of the technical advantages of the above-mentioned technical solution is that the sample preparation box includes a B1 light transmission detection cavity and a B2 light transmission detection cavity, and can also directly detect the optical properties of the sample based on the sample preparation box, thus integrating multiple detection methods in one device.

[0037] One of the technical advantages of the above-mentioned solution is that the B1 and B2 light transmission detection chambers are suitable for different detection methods, allowing for the integration of more detection methods into a single device. The B2 camera module can perform layered image acquisition and analysis. The B1 light detection module can detect component content based on Lambert-Beer density.

[0038] One of the technical effects of the above-mentioned technical solution is that the X-axis slide in the A-bearing component facilitates movement in the X-axis direction, which facilitates microscopic imaging of a larger area for the detection and analysis of formed elements.

[0039] One of the technical advantages of the above-mentioned technical solution is that the Y-axis slide facilitates movement in the Y-axis direction, enabling microscopic imaging of a larger area for the detection and analysis of formed elements.

[0040] One of the technical effects of the above-mentioned technical solution is that the reagent preparation chamber allows the preparation of microscopic samples to be completed by the machine in the sample preparation box, thereby improving the integration of the detection process.

[0041] One of the technical effects of the above-mentioned technical solution is that the B3 camera module is used to capture images of the test strip inside the test strip containing cavity, which can integrate more detection methods in one device and further improve the automation level of the device.

[0042] One of the technical effects of the above-mentioned technical solution is that the pipette and pipette tip are configured and moved inside the equipment, which further improves the automation level of the equipment.

[0043] One of the technical advantages of the above-mentioned solution is that the complex process of sample preparation can be completed within the device by utilizing the sample preparation kit and related components. It supports fully automated formed element detection, fully automated test strip image detection, fully automated optical characteristic detection, and fully automated layered image detection.

[0044] One of the technical effects of the above-mentioned technical solution is that the setting of the sampling stirring spoon allows for mechanized control of mixing operations such as stirring, reducing human intervention and improving the consistency of sample preparation.

[0045] One of the technical effects of the above technical solution is that the support frame is installed on the B bearing component, and the rotating shaft and drive motor are installed on the support frame, making the driving of the sampling stirring spoon more direct and convenient to control.

[0046] One of the technical advantages of the above-mentioned technical solution is that a single support frame can simultaneously support the pipette, the rotating shaft, and the drive motor, resulting in a higher degree of integration. Attached Figure Description

[0047] Figure 1 This is a schematic block diagram of a formed element detection device with a multi-sample preparation kit; Figure 2 This is a partial schematic block diagram of a formed element detection device with a multi-sample preparation kit; Figure 3 This is a partial schematic block diagram of a formed element detection device with a multi-sample preparation kit; Figure 4This is a schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 5 This is a partial schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 6 This is a partial schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 7 This is a partial schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 8 This is a partial schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 9 This is a partial schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 10 This is a partially exploded schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 11 This is a partial schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 12 This is a schematic diagram of one embodiment of a formed element detection chip; Figure 13 This is a schematic diagram of a second embodiment of a formed element detection chip; Figure 14 This is a partially exploded schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 15 This is a schematic diagram of the combined state of the C sample preparation box; Figure 16 This is a cross-sectional schematic diagram of one embodiment of the C sample preparation kit; Figure 17 This is a schematic diagram of one embodiment of the sampling stirring spoon; Figure 18 This is a cross-sectional schematic diagram of Example 2 of the C sample preparation kit; Figure 19 This is a schematic diagram of the second embodiment of the sampling stirring spoon; Figure 20 This is a schematic diagram of Example 3 of the C sample preparation kit; Figure 21 This is a partially exploded schematic diagram of a formed element detection device with a multi-sample preparation kit; Figure 22 This is a flowchart illustrating a method for detecting formed elements. Detailed Implementation

[0048] The contents of this application will be further described in detail below with reference to the accompanying drawings.

[0049] It should be noted that the following description of preferred embodiments of this application does not constitute any limitation on this application. The description of preferred embodiments is merely an illustration of the general principles of this application. The embodiments described in this application are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0050] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the equipment or component referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. Furthermore, the terms "first," "second," and technical features numbered with Arabic numerals 1, 2, 3, etc., and designations such as "A" and "B," are used for descriptive purposes only, for ease of explanation, and do not represent a temporal or spatial order; they should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, features defined with "first," "second," and numbered with Arabic numerals 1, 2, 3, etc., may explicitly or implicitly include one or more of that feature. In the description of this application, "several" means two or more, unless otherwise expressly and specifically defined.

[0051] like Figures 1 to 4 A formed element detection device with multi-sample preparation includes components A, B, C, D, and E. Component A includes an A-camera component 110 and an A-support component 120, with the A-support component 120 used to hold a formed element detection chip 160. The formed element detection chip 160 includes a microscopic sample receiving cavity for receiving microscopic samples. The A-camera component 110 is used to acquire magnified microscopic images of the microscopic samples. The A-support component 120 is disposed on a base 400.

[0052] like Figures 1 to 9 A formed element detection device with multi-sample preparation capability, comprising a B component including a B carrier component 210 for carrying a B sample preparation box 500; and a C component including a C carrier component 320 and a sample agitation module 330 for carrying a C sample preparation box 700. The B carrier component 210 and the C carrier component 320 are mounted on a base 400.

[0053] like Figure 5 and Figure 6 The B sample preparation kit 500 includes a test tube receiving cavity 510 and a reagent receiving cavity 520; the test tube receiving cavity 510 is used to receive test tubes, and the reagent receiving cavity 520 is used to receive test reagents.

[0054] like Figures 1 to 4 A formed element detection device with multi-sample preparation capability includes a sample transfer device 600 (E component), which in turn includes a pipette assembly 620. The pipette assembly 620 operates on a sample preparation cartridge 500 (B component), a sample preparation cartridge 700 (C component), both sample preparation cartridges 500 and 700, or both sample preparation cartridges 700 and 500, to prepare samples for microscopic examination. The sample transfer device 600 then transfers the microscopic samples to the formed element detection chip 160. The sample transfer device 600 is mounted on a base 400.

[0055] like Figures 1 to 4 A formed element detection device with multi-sample preparation, wherein component D is a detection control component, component D is electrically connected to component A; component D is electrically connected to component B; component D is electrically connected to component C; component D is electrically connected to component E; component D is used to control the detection process.

[0056] like Figures 4 to 6 A formed element detection device, wherein the sample transfer device 600 includes a gantry-type transfer assembly 610 and a pipette assembly 620; the gantry-type transfer assembly 610 includes a horizontal rail A 630; the pipette assembly 620 includes a pipette, the pipette assembly 620 is mounted on the horizontal rail A 630, and the pipette assembly 620 is movable in the horizontal direction; the pipette 620 transfers the microscopic sample to the formed element detection chip 160. Figure 12 and Figure 13 Two different formed element detection chips 160 were demonstrated.

[0057] like Figure 7 A formed element detection device, the sample transfer device 600 includes a pendant transfer assembly 650 and a pipette assembly 620; the pendant transfer assembly 650 includes a rotating support column 651 and a horizontal arm 652; the pipette assembly 620 includes a pipette, the pipette assembly 620 is mounted on the horizontal arm 652, and the rotating support column 651 can drive the horizontal arm 652 to rotate in the horizontal direction. The horizontal arm 652 includes a B-level horizontal rail 653, the pipette assembly 620 is mounted on the B-level horizontal rail 653, and the pipette 620 can move in the horizontal direction.

[0058] like Figures 4 to 5 A shaped component detection device, wherein component B includes a support rail 220, and component B 210 is disposed on support rail 220 and can move on support rail 220.

[0059] like Figure 5 and Figure 6 A formed element detection device, wherein the sample preparation box 500 includes a pipette tip receiving cavity 530.

[0060] In some embodiments not shown in the accompanying drawings, the B-support assembly 210 includes a pipette tip receiving cavity, which houses a pipette tip.

[0061] like Figures 5 to 8 A formed element detection device, wherein the B sample preparation box 500 includes a B1 light-transmitting detection cavity 550 for containing a detection sample; the B component includes a B optical detection component 270, which includes a B1 detection light source 271 and a B1 light detection module 272; the B1 detection light source 271 is used to emit detection light, which passes through the light-transmitting detection cavity 550, and the B1 light detection module 272 is used to detect the detection light.

[0062] like Figures 5 to 8 A formed element detection device, wherein the B sample preparation box 500 includes a B2 translucent detection cavity 560 for containing a detection sample; the B component includes a B2 camera component 280, which includes a B2 light source 281 and a B2 camera module 282; the B2 light source 281 is used to emit illumination light, which illuminates the B2 translucent detection cavity 560; and the B2 camera module 282 in the B2 camera component 280 is used to capture layered images of the detection sample inside the B2 translucent detection cavity 560.

[0063] like Figures 5 to 9 A formed element detection device, wherein the B sample preparation box 500 includes a B test strip receiving cavity 580 for receiving test strips; the B component includes a B3 camera component 900, which includes a B3 camera module 910; the B3 camera module 910 is used to capture images of the test strips inside the B test strip receiving cavity 580.

[0064] like Figures 5 to 9A shaped component detection device, wherein the B3 camera assembly 900 includes a B support column 921 and a B rotating arm 922, one end of the B rotating arm 922 is connected to the B support column 921, and the B3 camera module 910 is disposed at the other end of the B rotating arm 922, and the B rotating arm 922 can rotate around the B support column 921.

[0065] like Figure 4 and Figure 5 A formed element detection device, wherein the sample preparation box 500 includes a test strip receiving cavity 580 for receiving test strips; the test strip receiving cavity 580 includes an A test strip receiving cavity 581 and a B test strip receiving cavity 582 symmetrically arranged on both sides of the sample preparation box 500.

[0066] like Figure 4 and Figure 9 A formed element detection device, wherein component B includes a camera component C 900, and the camera component C 900 includes a camera module C 910; the camera module C 910 is used to capture images of the test strip inside the test strip receiving cavity 580.

[0067] like Figure 4 and Figure 9 A shaped component detection device, wherein the C-camera assembly 900 includes a C-support column 921 and a C-rotating arm 922, one end of the C-rotating arm 922 is connected to the C-support column 921, and the C-camera module 910 is disposed at the other end of the C-rotating arm 922, and the C-rotating arm 922 can rotate around the C-support column 921.

[0068] like Figure 4 and Figure 5 A formed element detection device, wherein the sample preparation box 500 includes a reagent preparation chamber 570; the reagent preparation chamber 570 is used to mix the sample to be tested and the detection reagent to form a microscopic sample.

[0069] like Figures 1 to 10 A formed element detection device includes an A-support assembly 120 comprising a support platform 121 and an X-axis slide 122. The support platform 121 is mounted on the X-axis slide 122 and includes a detection chip receiving slot 123. The A-support assembly 120 also includes a Y-axis slide 125, on which the X-axis slide 122 is mounted. The X-axis slide 122 and the Y-axis slide 125 are used to drive the formed element detection chip 160 on the support platform 121 to move in the X-axis or Y-axis direction, thereby adjusting the position of the formed element detection chip 160 relative to the imaging assembly 110, and thus adjusting the position of the microscopic imaging area.

[0070] like Figures 10 to 11A formed element detection device includes a support 130 for supporting and fixing an imaging assembly 110. The imaging assembly 110 includes a microscope 111 and an imaging module 112. The support 130 includes a vertical column 131 and a horizontal support arm 132; the imaging module 112 is fixed to one end of the horizontal support arm 132; one end of the vertical column 131 is connected to the horizontal support arm 132; the other end of the vertical column 131 is connected to a load-bearing assembly 120. The vertical column 131 can be directly fixed to a base 400. Alternatively, the vertical column 131 can be fixed to the load-bearing assembly 120. Figure 4 A vertical column 131 is fixed on the base 400.

[0071] like Figures 14 to 18 The C sample preparation box 700 includes a sampling stirring spoon 770, one end of which includes a stirring shaft head 771. The sample stirring module 330 includes a rotating shaft 333 and a drive motor 332. The drive motor 332 is used to drive the rotating shaft 333 to rotate. The rotating shaft 333 can be coupled with the stirring shaft head 771 to drive the sampling stirring spoon 770 to rotate.

[0072] like Figure 7 The sample stirring module 330 includes a support frame 331; the support frame 331 is mounted on the B bearing component 230, and the rotating shaft 333 and the drive motor 332 are mounted on the support frame 331.

[0073] In embodiments not shown in some of the accompanying drawings, the support frame 331 may be mounted on the C sample preparation box 700, and the rotating shaft and drive motor are mounted on the support frame.

[0074] like Figures 16 to 17 ,as well as Figures 18 to 19 The document shows an embodiment of two C sample preparation boxes 700. One end of the sampling stirring spoon 770 includes a stirring shaft head 771. The sampling stirring spoon 770 can rotate inside the C sample preparation box 700, causing the sample inside the C sample preparation box 700 to rotate, thus completing the sample preparation operation.

[0075] like Figures 16 to 17 An example of the C sample preparation kit 700, with... Figures 18 to 19 The difference between the C sample preparation kit 700 and the embodiment lies in the specific structure of the sampling stirring spoon 770.

[0076] In embodiments not shown in some of the accompanying drawings, the sample agitation module 330 includes a rotating shaft 333 and a drive motor 332; the sample agitation module 330 and the sample transfer device 600 share a support frame; the support frame is used to support the pipette assembly 620, the rotating shaft 333, and the drive motor 332.

[0077] like Figure 14 and Figure 20 The C sample preparation box 700 includes a C1 light-transmitting detection cavity 710, which is used to contain the detection sample. In embodiments not shown in the figures, the C carrier component 320 of the C component includes a C optical detection component, which includes a C1 detection light source and a C1 light detection module. The C1 detection light source is used to emit detection light, which passes through the light-transmitting detection cavity, and the C1 light detection module is used to detect the detection light.

[0078] like Figure 14 and Figure 20 The C sample preparation box 700 includes a C2 light-transmitting detection cavity 720, which is used to contain the detection sample. In embodiments not shown in the figures, the C carrier component 320 of the C component includes a C2 camera component, which includes a C2 light source and a C camera module. The C2 light source is used to emit illumination light, which illuminates the C2 light-transmitting detection cavity. The C2 camera module in the C2 camera component is used to capture a layered image of the detection sample inside the C2 light-transmitting detection cavity.

[0079] like Figure 21 The B-supporting component 320 includes an A-pipette tip receiving cavity 361; the A-pipette tip receiving cavity 361 is used to receive a pipette tip 760.

[0080] A method for detecting formed elements includes the steps of using a formed element detection chip, a B sample preparation box, and a C sample preparation box; the formed element detection chip includes a microscopic sample receiving cavity for receiving microscopic samples; the C sample preparation box includes a sampling stirring spoon, one end of which includes a stirring shaft head, which can drive the sampling stirring spoon to rotate. Step A: Add the test sample to the C sample preparation box, drive the stirring spoon to stir the test sample, and prepare an intermediate sample; Step B: Use a pipette to draw up the intermediate sample and add it to the sample preparation kit B; Step C: After the intermediate sample and the test reagent are mixed evenly, a microscopic examination sample is prepared; Step D: Use a pipette to aspirate the microscopic sample and add it to the microscopic sample receiving cavity on the formed element detection chip; Step E: Capture the formed element detection chip to obtain a magnified microscopic image of the microscopic sample.

[0081] The B sample preparation kit includes a reagent receiving cavity; the reagent receiving cavity is used to contain the detection reagent; in step B: the intermediate sample is drawn up with a pipette and added to the reagent receiving cavity of the B sample preparation kit.

[0082] The B sample preparation kit includes a test tube receiving cavity; the test tube receiving cavity is used to receive test tubes, and the test tubes are used to receive samples; in step B: the intermediate sample is drawn up with a pipette and added to the test tube in the test tube receiving cavity of the B sample preparation kit.

[0083] Sample preparation kit B includes a preparation chamber; in step B: use a pipette to draw up the intermediate sample and add it to the sample preparation chamber in sample preparation kit B.

[0084] In step B, the reagent containing cavity includes staining reagent; or the preparation cavity includes staining reagent; or the test tube containing cavity includes staining reagent.

[0085] Step B also includes using a pipette to draw up the staining reagent and adding it to the sample preparation chamber, the reagent container chamber, or the test tube container chamber.

[0086] A formed element detection device and method with multiple sample preparation boxes includes: A formed element detection chip placed on a carrier component A, comprising a microscopic sample receiving cavity for receiving microscopic samples; an imaging component A acquiring magnified microscopic images of the microscopic samples; a pipette component of a sample transfer device, which operates on sample preparation boxes B and / or C to prepare microscopic samples; the sample transfer device transferring the microscopic samples to the formed element detection chip; sample preparation box B including a test tube receiving cavity and a reagent receiving cavity; component C including a sample stirring module, sample preparation box C including a sampling stirring spoon, one end of the sampling stirring spoon including a stirring shaft head, sample stirring module including a rotating shaft and a drive motor, the drive motor driving the rotating shaft to rotate; the rotating shaft can be coupled to the stirring shaft head to drive the sampling stirring spoon to rotate. Component D is electrically connected to each component for controlling the detection process.

[0087] While this application has been described and illustrated with reference to preferred embodiments and several alternatives, it is not intended to be limited to the specific descriptions herein. Other alternatives or equivalent components may also be used to practice this application.

Claims

1. A formed element detection device with a multi-sample preparation kit, characterized in that, Includes components A, B, C, D, and E; Component A includes an A camera component and an A carrier component. The A carrier component is used to place the formed element detection chip. The formed element detection chip includes a microscopic sample receiving cavity, which is used to receive the microscopic sample. The A camera component is used to acquire a magnified microscopic image of the microscopic sample. Component B includes Component B, which is used to carry Sample Preparation Kit B. The B sample preparation kit includes a test tube containing chamber and a reagent containing chamber; The test tube chamber is used to hold test tubes, and the reagent chamber is used to hold test reagents; The C component includes the C carrier component and the sample agitation module. The C carrier component is used to carry the C sample preparation kit. The C sample preparation kit includes a sampling stirring spoon, one end of which includes a stirring shaft head. The sample stirring module includes a rotating shaft and a drive motor, with the drive motor used to drive the rotating shaft to rotate. The rotating shaft can be coupled to the stirring head to drive the sampling stirring spoon to rotate; Component E includes a sample transfer device, which includes a pipette assembly for operating the sample preparation kit B and / or the sample preparation kit C to prepare a microscopic sample; the sample transfer device transfers the microscopic sample to the formed element detection chip; Component D is the detection and control component. Component D is electrically connected to component A; component D is electrically connected to component B; component D is electrically connected to component C; component D is electrically connected to component E; component D is used to control the detection process.

2. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The sample transfer device includes a gantry crane transfer assembly and a pipette assembly; the gantry crane transfer assembly includes a horizontal lifting rail (A). The pipette assembly includes a pipette, the pipette assembly is mounted on the horizontal rail A, and the pipette assembly is movable in the horizontal direction; The pipette transfers the microscopic sample to the formed element detection chip.

3. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The sample transfer device includes a pendant transfer assembly and a pipette assembly; the pendant transfer assembly includes a rotating support column and a horizontal arm; The pipette assembly includes a pipette, which is mounted on the horizontal arm, and the rotating support column can drive the horizontal arm to rotate in the horizontal direction.

4. The formed element detection device with a multi-sample preparation box according to claim 3, characterized in that, The horizontal arm includes a horizontal rail B, on which the pipette is mounted and can move horizontally.

5. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, Component B includes a bearing track B, and the bearing component B is disposed on the bearing track B and can move on the bearing track B.

6. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The B sample preparation box includes a pipette tip receiving cavity; or the B support assembly includes a pipette tip receiving cavity, the pipette tip receiving cavity accommodating a pipette tip.

7. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The B sample preparation box includes a B1 light-transmitting detection cavity, which is used to contain the detection sample; the B component includes a B optical detection component, which includes a B1 detection light source and a B1 light detection module; the B1 detection light source is used to emit detection light, which passes through the light-transmitting detection cavity, and the B1 light detection module is used to detect the detection light.

8. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The B sample preparation box includes a B2 transmissive detection cavity for containing the detection sample; the B component includes a B2 camera component, which includes a B2 light source and a B2 camera module; the B2 light source emits illumination light, which illuminates the B2 transmissive detection cavity, and the B2 camera module in the B2 camera component captures a layered image of the detection sample inside the B2 transmissive detection cavity.

9. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The B sample preparation kit includes a B test strip receiving cavity for containing test strips; the B component includes a B3 camera component, which includes a B3 camera module. The B3 camera module is used to capture images of the test paper inside the B test paper receiving cavity.

10. The formed element detection device with a multi-sample preparation box according to claim 9, characterized in that, The B3 camera assembly includes a B support column and a B rotating arm. One end of the B rotating arm is connected to the B support column, and the B3 camera module is located at the other end of the B rotating arm. The B rotating arm can rotate around the B support column.

11. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The A-type support component includes a support platform and an X-axis slide. The support platform is mounted on the X-axis slide and includes a detection chip receiving slot.

12. The formed element detection device with a multi-sample preparation box according to claim 11, characterized in that, The A-type support component includes a Y-axis slide, and the X-axis slide is mounted on the Y-axis slide.

13. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The sample agitation module includes a support frame, a rotating shaft, and a drive motor; the support frame is mounted on the C-bearing component or the C-sample preparation box, and the rotating shaft and the drive motor are mounted on the support frame.

14. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The sample agitation module includes a rotating shaft and a drive motor; the sample agitation module and the sample transfer device share a support frame; the support frame is used to support the pipette, rotating shaft, and drive motor.

15. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The C sample preparation box includes a C1 light-transmitting detection cavity, which is used to contain the detection sample; the C component includes a C optical detection component, which includes a C1 detection light source and a light detection module A; the C1 detection light source is used to emit detection light, which passes through the light-transmitting detection cavity, and the light detection module A is used to detect the detection light.

16. The formed element detection device with a multi-sample preparation box according to claim 1, characterized in that, The C sample preparation box includes a C2 transmissive detection cavity for containing the detection sample; the C component includes a C2 camera component, which includes a C2 light source and a C camera module; the C2 light source emits illumination light, which illuminates the C2 transmissive detection cavity; the C2 camera module in the C2 camera component is used to capture layered images of the detection sample inside the C2 transmissive detection cavity.

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