Particle detection device

Abstract

The formed component detection device comprises a formed component detection assembly, the formed component detection assembly comprises an A camera assembly; the formed component detection chip comprises a microscope sample containing cavity for containing a microscope sample; the A camera assembly is used for acquiring a microscopic magnified image of the microscope sample; a B bearing assembly is used for bearing a sample preparation box; the sample preparation box comprises a test tube containing cavity, a reagent containing cavity and a reagent preparation cavity; a C assembly is in electrical signal connection with the A assembly and the B assembly; the C assembly is used for controlling a detection process. A sample to be detected is added into a test tube, and the test tube is placed into the test tube containing cavity; a pipette gun assembly is used for respectively sucking the sample to be detected in the test tube and a detection reagent in the reagent containing cavity and adding them into the reagent preparation cavity; after the sample to be detected and the detection reagent are mixed in the reagent preparation cavity, a microscope sample is formed; the microscope sample is sucked by the pipette gun assembly and added into the microscope sample containing cavity; the formed component detection chip is photographed to obtain the microscopic magnified image of the microscope sample.

Description

Technical Field

[0001] This application belongs to the field of medical testing equipment technology, and relates to formed element detection devices, particularly to formed element detection devices with sample preparation capabilities. Background Technology

[0002] Formed element detection devices are high-precision, highly complex medical instruments, including sophisticated microscopic imaging systems and image analysis and processing systems. They are a comprehensive integration of disciplines such as biotechnology, medical technology, high-precision instruments, computer science, and artificial intelligence graphics analysis technology. The systems are complex and require numerous sensors, control devices, and detection components.

[0003] The applicant has pioneered a method and device for the analysis of formed elements in the industry. By adding a suspension to a detection chip, the formed elements in the suspension are directly imaged under a microscope, and the formed elements are detected and analyzed based on the microscopic images.

[0004] The applicant has also pioneered an integrated detection method and device for multiple samples (blood, urine, and feces) in the industry. One detection device can simultaneously detect multiple different types of biological samples, providing clients with a very economical integrated solution.

[0005] However, before the applicant can perform detection and analysis on biological samples using the integrated detection method and device, a corresponding processing procedure is required. Previously provided detection chips required sample preparation outside the device, necessitating sample processing using additional equipment or manually.

[0006] Integrating the sample preparation process into the device itself is a significant challenge. The technical problem this application aims to solve is how to further integrate sample handling into an integrated detection method and apparatus, designing a formed element detection device capable of simultaneously preparing and detecting samples. Summary of the Invention

[0007] To address the shortcomings of existing formed element analysis devices that require external or manual sample preparation, a formed element analysis device integrating sample preparation and formed element detection has been designed. This device is a more integrated formed element detection device and method that can simultaneously complete sample preparation and formed element detection.

[0008] The technical solution of this application to solve the above-mentioned technical problems is a formed element detection device, including component A, component B, and component C; component A is a formed element detection component, including an imaging component A and a carrier component A, the carrier component A being used to place a formed element detection chip; the formed element detection chip includes a microscopic sample receiving cavity, the microscopic sample receiving cavity being used to receive a microscopic sample; the imaging component A is used to acquire a magnified microscopic image of the microscopic sample; component B includes a sample transfer device and a carrier component B, the carrier component B being used to carry a sample preparation box; the sample preparation box includes a test tube receiving cavity and a reagent receiving cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, and the reagent receiving cavity is used to receive detection reagents; the sample transfer device is used to manipulate the sample in the sample preparation box, mixing the sample with the detection reagents to prepare a microscopic sample; the sample transfer device transfers the microscopic sample to the formed element detection chip; component C is a detection control component, component C is electrically connected to component A; component C is electrically connected to component B; component C is used to control the detection process.

[0009] The sample transfer device may include a gantry crane transfer assembly and a pipette assembly; the gantry crane transfer assembly includes a horizontal rail B; the pipette assembly includes a pipette, the pipette assembly is mounted on the horizontal rail B, and the pipette assembly is capable of moving horizontally; the pipette assembly transfers the microscopic sample to the formed element detection chip.

[0010] Alternatively, the sample transfer device may include a pendant transfer assembly and a pipette assembly; the pendant transfer assembly includes a rotating support column and a horizontal arm; the pipette assembly is mounted on the horizontal arm, and the rotating support column can drive the horizontal arm to rotate in the horizontal direction.

[0011] Alternatively, the horizontal arm may include a C-shaped horizontal rail, on which the pipette assembly is mounted, and the pipette assembly is capable of moving in the horizontal direction.

[0012] It may also include a B-support track, wherein the B-support component is disposed on the B-support track and can move on the B-support track.

[0013] Alternatively, the sample preparation box may include a pipette tip receiving cavity; or the B-support assembly may include a pipette tip receiving cavity, the pipette tip receiving cavity accommodating a pipette tip.

[0014] The sample preparation box may include a light-transmitting detection cavity A, which is used to contain the detection sample; component B includes an optical detection component, which includes a detection light source A and an optical detection module A; the detection light source A is used to emit detection light, which passes through the light-transmitting detection cavity A, and the optical detection module A is used to detect the detection light.

[0015] Alternatively, the sample preparation box may include a B-transmittance detection cavity for containing a detection sample; the B component may include a B-camera component, which may include a B-detection light source and a B-camera module; the B-detection light source may emit illumination light, which illuminates the B-transmittance detection cavity; and the B-camera module may capture layered images of the detection sample inside the B-transmittance detection cavity.

[0016] Alternatively, the sample preparation kit may include a test strip receiving cavity for receiving test strips; component B may include a camera component C, which includes a camera module C and a carrier component C; the camera module C may be used to capture images of the test strips inside the test strip receiving cavity.

[0017] Alternatively, the C-bearing component may include a C-support column and a C-rotating arm, with one end of the C-rotating arm connected to the C-support column, and the C-camera module located at the other end of the C-rotating arm, allowing the C-rotating arm to rotate around the C-support column.

[0018] Alternatively, the sample preparation kit may include a reagent preparation chamber; the reagent preparation chamber is used to mix the sample to be tested and the test reagent to form a microscopic sample.

[0019] Alternatively, the A-bearing component may include a bearing platform and an X-axis slide, with the bearing platform disposed on the X-axis slide and including a detection chip receiving slot.

[0020] Alternatively, the A-type support component may include a Y-axis slide, and the X-axis slide support platform may be mounted on the Y-axis slide.

[0021] The technical solution of this application to solve the above-mentioned technical problems can also be a formed element detection method, including the steps of using a formed element detection chip and a sample preparation box; the formed element detection chip includes a microscopic sample receiving cavity, which is used to receive microscopic samples; the sample preparation box includes a test tube receiving cavity, a reagent receiving cavity, and a reagent preparation cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, and the reagent receiving cavity is used to receive detection reagents; Step A: Add the sample to be tested to a test tube and place the test tube into the test tube receiving cavity; Step B: Use a pipette assembly to aspirate the sample to be tested from the test tube and the detection reagent from the reagent receiving cavity, and add them to the reagent preparation cavity; Step C: After the sample to be tested and the detection reagent are mixed in the reagent preparation cavity, a microscopic sample is formed; Step D: Use a pipette assembly to aspirate the microscopic sample and add it to the microscopic sample receiving cavity; Step E: Take a picture of the formed element detection chip to obtain a magnified microscopic image of the microscopic sample.

[0022] The technical solution of this application to solve the above-mentioned technical problems can also be a detection method, including the steps of using a formed element detection chip and a sample preparation box; the formed element detection chip includes a microscopic sample receiving cavity, which is used to receive microscopic samples; the sample preparation box includes a test tube receiving cavity, a reagent receiving cavity, a reagent preparation cavity, and a test strip receiving cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, the reagent receiving cavity is used to receive detection reagents, and the test strip receiving cavity is used to receive test strips; Step A1: Place the sample to be tested... Step B1: Place the test tube into the test tube receiving cavity; Step C2: Use a pipette assembly to draw the sample to be tested from the test tube and the test reagent from the reagent receiving cavity, and add them to the reagent preparation cavity; Step D1: Mix the sample to be tested and the test reagent in the reagent preparation cavity to form a microscopic sample; Step E1: Use a pipette assembly to draw the microscopic sample and add it to the test strip in the reagent receiving cavity; Step F1: Take a picture of the test strip to obtain an image of the test strip; Step F1: Analyze the image to obtain the test result.

[0023] The test strip may be a pH test strip or a colloidal gold test strip.

[0024] The technical solution of this application to solve the above-mentioned technical problems can also be a detection method, including the steps of using a formed element detection chip and a sample preparation box; the formed element detection chip includes a microscopic sample receiving cavity, which is used to receive microscopic samples; the sample preparation box includes a test tube receiving cavity, a reagent receiving cavity, a reagent preparation cavity, and a detection liquid receiving cavity; the test tube receiving cavity is used to receive test tubes, and the test tubes are used to receive samples; the reagent receiving cavity is used to receive detection reagents; and the detection liquid receiving cavity is used to receive detection liquid; step A2: place the sample to be tested... Step B2: Add the sample to a test tube and place the test tube into the test tube receiving cavity; Step C2: Use a pipette assembly to draw the sample to be tested from the test tube and the test reagent from the reagent receiving cavity, and add them to the reagent preparation cavity; Step D2: Mix the sample to be tested and the test reagent in the reagent preparation cavity to form a test solution; Step E2: Use a pipette assembly to draw the test solution and add it to the test solution receiving cavity; Step F2: Detect the optical properties of the microscopic sample test solution; Step F2: Analyze the optical properties to obtain the test results.

[0025] Alternatively, the optical characteristic can be light absorption characteristic. In step E2, the detection light is transmitted through the detection liquid, and the light intensity signal is obtained by the photoelectric sensor. The absorption characteristics of the detection liquid to the detection light are obtained based on the light intensity signal.

[0026] The technical solution of this application to solve the above-mentioned technical problems can also be a detection method, including the steps of using a formed element detection chip and a sample preparation box; the formed element detection chip includes a microscopic sample receiving cavity, which is used to receive microscopic samples; the sample preparation box includes a test tube receiving cavity, a reagent receiving cavity, a reagent preparation cavity, and a detection liquid receiving cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, the reagent receiving cavity is used to receive detection reagents, and the detection liquid receiving cavity is used to receive detection liquid; step A3: add the sample to be tested to the test tube. Step B3: Place the test tube into the test tube receiving cavity; Step B4: Use a pipette assembly to draw the sample to be tested from the test tube and the test reagent from the reagent receiving cavity, and add them to the reagent preparation cavity; Step C5: Mix the sample to be tested and the test reagent in the reagent preparation cavity to form a test solution; Step D6: Use a pipette assembly to draw the test solution and add it to the test solution receiving cavity; Wait for the test solution to precipitate and separate into layers; Step E7: Take an image of the test solution receiving cavity; Step F8: Analyze the image and obtain the height of each layer based on the image.

[0027] One of the technical effects of the above-mentioned technical solution is that component B has sample transfer and sample preparation functions. When integrated with components A and C, it improves the integration of the formed element detection device and ushers in an era of automated sample preparation for formed element detection.

[0028] One of the technical effects of the above-mentioned technical solution is that the gantry crane transfer assembly can facilitate sample transfer and realize the connection between sample preparation and sample testing.

[0029] One of the technical advantages of the above-mentioned solution is that the gantry-type transfer assembly facilitates sample transfer, enabling seamless integration between sample preparation and sample testing. Furthermore, its range of motion is greater and more flexible compared to the gantry-type transfer assembly.

[0030] One of the technical effects of the above-mentioned technical solution is that the C-shaped horizontal hanging rail further expands the range of movement, making sample transfer more flexible.

[0031] One of the technical effects of the above-mentioned technical solution is that the B-bearing component can move on the B-bearing track, which facilitates the movement of the sample preparation box and makes sample preparation easier.

[0032] One of the technical advantages of the above-mentioned solution is that the sample preparation kit includes a pipette tip receiving cavity, which facilitates the fit between the pipette body and the pipette tip, and makes it easy to replace the pipette tip. Multiple pipette tip receiving cavities can be provided to hold different types of pipette tips; such as pipette tips of different sizes or capacities; or different types of pipette tips, such as those made of different materials; or pipette tips in different usage states, such as used and unused tips.

[0033] One of the technical advantages of the above-mentioned technical solution is that the sample preparation box includes a light transmission detection cavity A and a light transmission detection cavity B, and can also directly detect the optical properties of the sample based on the sample preparation box, thus integrating multiple detection methods in one device.

[0034] One of the technical advantages of the above solution is that the A-type and B-type light-transmitting detection chambers are suitable for different detection methods, allowing for the integration of more detection methods into a single device. The B-type camera component can acquire and analyze layered images. The A-type light detection module can detect component content based on Lambert-Beer density.

[0035] One of the technical effects of the above-mentioned technical solution is that the X-axis slide in the A-bearing component facilitates movement in the X-axis direction, which facilitates microscopic imaging of a larger area for the detection and analysis of formed elements.

[0036] One of the technical advantages of the above-mentioned technical solution is that the Y-axis slide facilitates movement in the Y-axis direction, enabling microscopic imaging of a larger area for the detection and analysis of formed elements.

[0037] One of the technical effects of the above-mentioned technical solution is that the reagent preparation chamber allows the preparation of microscopic samples to be completed by the machine in the sample preparation box, thereby improving the integration of the detection process.

[0038] One of the technical effects of the above-mentioned technical solution is that the C-camera module is used to capture images of the test strip inside the test strip containing cavity, which can integrate more detection methods in one device and further improve the automation level of the device.

[0039] One of the technical effects of the above-mentioned technical solution is that the pipette and pipette tip are configured and moved inside the equipment, which further improves the automation level of the equipment.

[0040] One of the technical advantages of the above-mentioned solution is that the complex process of sample preparation can be completed inside the device with the help of the sample preparation kit and related components. It supports fully automated detection of formed elements.

[0041] One of the technical advantages of the above solution is that the complex process of sample preparation can be completed inside the device with the help of the sample preparation kit and related components. It also supports fully automated test strip image detection.

[0042] One of the technical advantages of the above-mentioned solution is that the complex process of sample preparation can be completed inside the device with the help of the sample preparation kit and related components. It also supports fully automated optical property detection.

[0043] One of the technical advantages of the above solution is that the complex process of sample preparation can be completed inside the device with the help of a sample preparation kit and related components. It also supports fully automated layered image detection. Attached Figure Description

[0044] Figure 1 This is a schematic block diagram of a formed element detection device with sample preparation. Figure 2 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 3 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 4 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 5 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 6 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 7 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 8 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 9 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 10 This is a partial schematic block diagram of a formed element detection device with sample preparation capabilities; Figure 11 This is a schematic diagram of one embodiment of a formed element detection chip; Figure 12 This is a schematic diagram of a second embodiment of a formed element detection chip; Figure 13 This is a flowchart illustrating a method for detecting formed elements. Detailed Implementation

[0045] The contents of this application will be further described in detail below with reference to the accompanying drawings.

[0046] It should be noted that the following description of preferred embodiments of this application does not constitute any limitation on this application. The description of preferred embodiments is merely an illustration of the general principles of this application. The embodiments described in this application are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0047] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the equipment or component referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. Furthermore, the terms "first," "second," and technical features numbered with Arabic numerals 1, 2, 3, etc., and designations such as "A" and "B," are used for descriptive purposes only, for ease of explanation, and do not represent a temporal or spatial order; they should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, features defined with "first," "second," and numbered with Arabic numerals 1, 2, 3, etc., may explicitly or implicitly include one or more of that feature. In the description of this application, "several" means two or more, unless otherwise expressly and specifically defined.

[0048] like Figures 1 to 3 A formed element detection device includes component A 100, component B 200, and component C 300. Component A 100 is a formed element detection component, including an A-camera component 110 and an A-support component 120. The A-support component 120 is used to place a formed element detection chip 160. The formed element detection chip 160 includes a microscopic sample receiving cavity for receiving a microscopic sample. The A-camera component 110 is used to acquire a magnified microscopic image of the microscopic sample. Component B 200 includes a sample transfer device 600 and a B-support component 210 for carrying a sample preparation box 500. The A-camera component 110 includes a microscope 111 and an A-camera module 112.

[0049] like Figure 2 The sample preparation box 500 includes a test tube receiving cavity 510 and a reagent receiving cavity 520; the test tube receiving cavity 510 is used to receive test tubes, the test tubes are used to receive samples, and the reagent receiving cavity 520 is used to receive detection reagents.

[0050] like Figure 3 The sample transfer device 600 is used to operate on the sample in the sample preparation box 500, mix the sample with the detection reagent, and prepare a microscopic sample; the sample transfer device 600 transfers the microscopic sample to the formed element detection chip.

[0051] like Figure 1Component C 300 is a detection and control component. Component C 300 is electrically connected to component A 100 and to component B 200. Component C 300 is used to control the detection process.

[0052] like Figure 3 and Figure 4 The sample transfer device 600 includes a gantry-type transfer assembly 610 and a pipette assembly 620; the gantry-type transfer assembly 610 includes a horizontal rail 630; the pipette assembly 620 includes a pipette, the pipette assembly 620 is mounted on the horizontal rail 630, and the pipette assembly 620 is capable of moving in the horizontal direction; the pipette assembly 620 transfers the microscopic sample to the formed element detection chip 160. Figure 11 and Figure 12 Two different formed element detection chips 160 were demonstrated.

[0053] like Figure 5 The sample transfer device 600 includes a pendant transfer assembly 650 and a pipette assembly 620; the pendant transfer assembly 650 includes a rotating support column 651 and a horizontal arm 652; the pipette assembly 620 is mounted on the horizontal arm 652, and the rotating support column 651 can drive the horizontal arm 652 to rotate in the horizontal direction.

[0054] like Figure 5 The horizontal arm 652 includes a C-shaped horizontal rail 653, and the pipette assembly 620 is mounted on the C-shaped horizontal rail 653. The pipette assembly 620 is capable of moving in the horizontal direction.

[0055] like Figure 2 and Figure 3 A shaped component detection device, wherein component B 200 further includes component B support track 220, wherein component B support 210 is disposed on component B support track 220 and component B support 210 can move on component B support track 220.

[0056] like Figure 3 A formed element detection device, wherein the sample preparation box 500 includes a pipette tip receiving cavity 530.

[0057] In some embodiments of the formed element detection device not shown in the accompanying drawings, the B-bearing assembly 210 includes a pipette tip receiving cavity, which houses a pipette tip.

[0058] like Figure 2 and Figure 6 A formed element detection device, wherein the sample preparation box 500 includes a light-transmitting detection cavity 550 for containing the detection sample. Figure 2 , Figure 6 and Figure 10 Component B 200 includes an optical detection component 700, which includes an A detection light source 710 and an A light detection module 720. The A detection light source 710 is used to emit detection light, which passes through the A light-transmitting detection cavity 550. The A light detection module 720 is used to detect the detection light.

[0059] like Figure 2 and Figure 6 A formed element detection device, wherein the sample preparation box 500 includes a B-transmittance detection cavity 560 for containing a detection sample; the B component 200 includes a B-camera component 800, which includes a B-detection light source 810 and a B-camera module 820; the B-detection light source 810 is used to emit illumination light, which illuminates the B-transmittance detection cavity 560; and the B-camera module 820 is used to capture layered images of the detection sample inside the B-transmittance detection cavity 560.

[0060] like Figure 2 A formed element detection device, wherein the sample preparation box 500 includes a test strip receiving cavity 580 for receiving test strips; the test strip receiving cavity 580 includes an A test strip receiving cavity 581 and a B test strip receiving cavity 582 symmetrically arranged on both sides of the sample preparation box 500.

[0061] like Figure 3 , Figure 7 and Figure 10 A formed element detection device, wherein component B 200 includes camera component C 900, camera component C 900 includes camera module C 910 and carrier component C 920; camera module C 910 is used to capture images of the test strip inside the test strip receiving cavity 580.

[0062] like Figure 7 A shaped component detection device, wherein the C-bearing component 920 includes a C-support column 921 and a C-rotating arm 922, one end of the C-rotating arm 922 is connected to the C-support column 921, and the C-camera module 910 is disposed at the other end of the C-rotating arm 922, and the C-rotating arm 922 can rotate around the C-support column 921.

[0063] like Figure 2 A formed element detection device, wherein the sample preparation box 500 includes a reagent preparation chamber 570; the reagent preparation chamber 570 is used to mix the sample to be tested and the detection reagent to form a microscopic sample.

[0064] like Figure 1 and Figure 8A formed element detection device, wherein the A-support component 120 includes a support platform 121 and an X-axis slide 122, the support platform 121 being disposed on the X-axis slide 122, and the support platform 121 including a detection chip receiving slot 123. The A-support component 120 also includes a Y-axis slide 125, and the X-axis slide 122 support platform is disposed on the Y-axis slide 125.

[0065] like Figures 1 to 3 ,and Figure 8 and Figure 9 A shaped component detection device includes a bracket 130 for supporting and fixing a camera assembly 110. The bracket 130 includes a vertical column 131 and a horizontal support arm 132; the camera module 112 is fixed to one end of the horizontal support arm 132; one end of the vertical column 131 is connected to the horizontal support arm 132; the other end of the vertical column 131 is connected to a load-bearing assembly 120. The vertical column 131 can be directly fixed to the base 400. Alternatively, it can be... Figure 8 Vertical column 131 is fixed on load-bearing component 120.

[0066] like Figure 13 A method for detecting formed elements includes the steps of using a formed element detection chip and a sample preparation kit; the formed element detection chip includes a microscopic sample receiving cavity for receiving microscopic samples; the sample preparation kit includes a test tube receiving cavity, a reagent receiving cavity, and a reagent preparation cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, and the reagent receiving cavity is used to receive detection reagents.

[0067] like Figure 13 A method for detecting formed elements includes step A: adding the sample to be tested into a test tube and placing the test tube into the test tube receiving cavity; step B: using a pipette assembly to separately aspirate the sample to be tested from the test tube and the detection reagent from the reagent receiving cavity, and adding them into the reagent preparation cavity; step C: mixing the sample to be tested and the detection reagent in the reagent preparation cavity to form a microscopic sample; step D: using a pipette assembly to aspirate the microscopic sample and add it into the microscopic sample receiving cavity; and step E: capturing a microscopic image of the formed element detection chip to obtain a magnified microscopic image of the microscopic sample.

[0068] A detection method includes the steps of using a formed element detection chip and a sample preparation kit; the formed element detection chip includes a microscopic sample receiving cavity for receiving microscopic samples; the sample preparation kit includes a test tube receiving cavity, a reagent receiving cavity, a reagent preparation cavity, and a test strip receiving cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, the reagent receiving cavity is used to receive detection reagents, and the test strip receiving cavity is used to receive test strips.

[0069] A detection method includes step A1: adding the sample to be tested into a test tube and placing the test tube into the test tube receiving cavity; step B1: using a pipette assembly to separately aspirate the sample to be tested from the test tube and the detection reagent from the reagent receiving cavity, and adding them into the reagent preparation cavity; step C1: mixing the sample to be tested and the detection reagent in the reagent preparation cavity to form a microscopic sample; step D1: using a pipette assembly to aspirate the microscopic sample and add it onto a test strip in the reagent receiving cavity; step E1: photographing the test strip to obtain an image of the test strip; and step F1: analyzing the image to obtain the detection result. The test strip is a pH test strip or a colloidal gold test strip.

[0070] A detection method includes the steps of using a formed element detection chip and a sample preparation kit; the formed element detection chip includes a microscopic sample receiving cavity for receiving microscopic samples; the sample preparation kit includes a test tube receiving cavity, a reagent receiving cavity, a reagent preparation cavity, and a detection solution receiving cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, the reagent receiving cavity is used to receive detection reagents, and the detection solution receiving cavity is used to receive detection solutions.

[0071] A detection method includes step A2: adding the sample to be tested into a test tube and placing the test tube into the test tube receiving cavity; step B2: using a pipette assembly to separately aspirate the sample to be tested from the test tube and the detection reagent from the reagent receiving cavity, and adding them into the reagent preparation cavity; step C2: mixing the sample to be tested and the detection reagent in the reagent preparation cavity to form a detection solution; step D2: using a pipette assembly to aspirate the detection solution and adding it into the detection solution receiving cavity; step E2: detecting the optical properties of the microscopic sample detection solution; and step F2: analyzing the optical properties of the image to obtain the detection result. The optical properties are light absorption properties. In step E2, detection light is transmitted through the detection solution, and a light intensity signal is acquired by a photoelectric sensor. The absorption characteristics of the detection solution to the detection light are obtained based on the light intensity signal.

[0072] A detection method includes the steps of using a formed element detection chip and a sample preparation kit; the formed element detection chip includes a microscopic sample receiving cavity for receiving microscopic samples; the sample preparation kit includes a test tube receiving cavity, a reagent receiving cavity, a reagent preparation cavity, and a detection solution receiving cavity; the test tube receiving cavity is used to receive test tubes, the test tubes are used to receive samples, the reagent receiving cavity is used to receive detection reagents, and the detection solution receiving cavity is used to receive detection solutions.

[0073] A detection method includes step A3: adding the sample to be tested into a test tube and placing the test tube into the test tube receiving cavity; step B3: using a pipette assembly to separately aspirate the sample to be tested from the test tube and the detection reagent from the reagent receiving cavity, and adding them into the reagent preparation cavity; step C3: mixing the sample to be tested and the detection reagent in the reagent preparation cavity to form a detection solution; step D3: using a pipette assembly to aspirate the detection solution and adding it into the detection solution receiving cavity; waiting for the detection solution to precipitate and separate into layers; step E3: taking an image of the detection solution receiving cavity; step F3: analyzing the image and obtaining the height of each layer based on the image.

[0074] While this application has been described and illustrated with reference to preferred embodiments and several alternatives, it is not intended to be limited to the specific descriptions herein. Other alternatives or equivalent components may also be used to practice this application.

Claims

1. A formed element detection device, characterized in that, Includes component A, component B, and component C; Component A is a formed element detection component, including an A camera component and an A carrier component. The A carrier component is used to place the formed element detection chip. The formed element detection chip includes a microscopic sample receiving cavity, which is used to receive the microscopic sample. The A camera component is used to acquire a magnified microscopic image of the microscopic sample. Component B includes a sample transfer device and a carrier component, which is used to carry the sample preparation kit. The sample preparation kit includes a test tube chamber and a reagent chamber; The test tube chamber is used to hold test tubes, which are used to hold samples, and the reagent chamber is used to hold test reagents. The sample transfer device is used to manipulate the sample in the sample preparation kit, mix the sample with the detection reagent, and prepare a microscopic sample; The sample transfer device transfers the microscopic sample to the formed element detection chip; Component C is the detection and control component. Component C is electrically connected to component A; Component C is electrically connected to component B; Component C is used to control the detection process.

2. The formed element detection device according to claim 1, characterized in that, The sample transfer device includes a gantry crane transfer assembly and a pipette assembly; the gantry crane transfer assembly includes a horizontal lifting rail (B). The pipette assembly includes a pipette, the pipette assembly is mounted on the B horizontal rail, and the pipette assembly is capable of moving in the horizontal direction; The pipette assembly transfers the microscopic sample to the formed element detection chip.

3. The formed element detection device according to claim 1, characterized in that, The sample transfer device includes a pendant transfer assembly and a pipette assembly; the pendant transfer assembly includes a rotating support column and a horizontal arm; The pipette assembly is mounted on the horizontal arm, and the rotating support column can drive the horizontal arm to rotate in the horizontal direction.

4. The formed element detection device according to claim 3, characterized in that, The horizontal arm includes a C-shaped horizontal rail, on which the pipette assembly is mounted and is capable of moving horizontally.

5. The formed element detection device according to claim 1, characterized in that, It also includes a B-support track, on which the B-support assembly is disposed and can move.

6. The formed element detection device according to claim 1, characterized in that, The sample preparation box includes a pipette tip receiving cavity; or the B support assembly includes a pipette tip receiving cavity, the pipette tip receiving cavity accommodating a pipette tip.

7. The formed element detection device according to claim 1, characterized in that, The sample preparation box includes a light-transmitting detection cavity A, which is used to contain the detection sample; component B includes an optical detection component, which includes a detection light source A and an optical detection module A; the detection light source A is used to emit detection light, which passes through the light-transmitting detection cavity A, and the optical detection module A is used to detect the detection light.

8. The formed element detection device according to claim 1, characterized in that, The sample preparation box includes a B-transmittance detection cavity for containing the detection sample; the B component includes a B-camera component, which includes a B-detection light source and a B-camera module; the B-detection light source emits illumination light, which illuminates the B-transmittance detection cavity; and the B-camera module captures a layered image of the detection sample inside the B-transmittance detection cavity.

9. The formed element detection device according to claim 1, characterized in that, The sample preparation kit includes a test strip receiving cavity for containing test strips; component B includes a camera component C, which includes a camera module C and a carrier component C; the camera module C is used to capture images of the test strips inside the test strip receiving cavity.

10. The formed element detection device according to claim 9, characterized in that, The C-supporting component includes a C-support column and a C-rotating arm. One end of the C-rotating arm is connected to the C-support column, and the C-camera module is located at the other end of the C-rotating arm. The C-rotating arm can rotate around the C-support column.

11. The formed element detection device according to claim 1, characterized in that, The sample preparation kit includes a reagent preparation chamber; the reagent preparation chamber is used to mix the sample to be tested and the test reagent to form a microscopic sample.

12. The formed element detection device according to claim 1, characterized in that, The A-type support component includes a support platform and an X-axis slide. The support platform is mounted on the X-axis slide and includes a detection chip receiving slot.

13. The formed element detection device according to claim 12, characterized in that, The A-type support component includes a Y-axis slide, and the X-axis slide support platform is mounted on the Y-axis slide.

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