Device for the detection of formed elements with sample preparation

Abstract

The device for detecting formed elements with sample preparation comprises an A bearing assembly for placing a formed element detection chip; a microscopic sample containing cavity of the formed element detection chip for containing a microscopic sample; a camera assembly for acquiring a microscopic enlarged image of the microscopic sample; a B bearing assembly for placing a sample preparation box; a sample preparation module for operating a sample in the sample preparation box to prepare the sample into the microscopic sample; a sample transfer device for transferring the microscopic sample to the formed element detection chip; a C assembly is a detection control assembly, the C assembly is in electrical signal connection with the A assembly; the C assembly is in electrical signal connection with the B assembly, and the C assembly is used for controlling a detection process. The sample preparation module operates the sample in the sample preparation box to prepare the sample into the microscopic sample; the sample transfer assembly transfers the microscopic sample to the formed element detection chip; and the camera assembly shoots the formed element detection chip to obtain the microscopic enlarged image of the microscopic sample.

Description

Technical Field

[0001] This application belongs to the field of medical testing equipment technology, and relates to formed element detection devices, particularly to formed element detection devices with sample preparation capabilities. Background Technology

[0002] Formed element detection devices are high-precision, highly complex medical instruments that include sophisticated microscopic imaging systems and image analysis and processing systems. They are a comprehensive integration of disciplines such as biotechnology, medical technology, high-precision instruments, computer science, and artificial intelligence graphics analysis technology. The systems are complex and require numerous sensors, control devices, and detection components.

[0003] The applicant has pioneered a method and device for the analysis of formed elements in the industry. By adding a suspension to a detection chip, the formed elements in the suspension are directly imaged under a microscope, and the formed elements are detected and analyzed based on the microscopic images.

[0004] The applicant has also pioneered an integrated detection method and device for multiple samples (blood, urine, and feces) in the industry. One detection device can simultaneously detect multiple different types of biological samples, providing clients with a very economical integrated solution.

[0005] However, before the applicant can perform detection and analysis on biological samples using the integrated detection method and device, a corresponding processing procedure is required. Previously provided detection chips required sample preparation outside the device, necessitating sample processing using additional equipment or manually.

[0006] Integrating the sample preparation process into the device itself is a significant challenge. The technical problem this application aims to solve is how to further integrate sample handling into an integrated detection method and apparatus, designing a formed element detection device capable of simultaneously preparing and detecting samples. Summary of the Invention

[0007] To address the shortcomings of existing formed element analysis devices that require external or manual sample preparation, a formed element analysis device integrating sample preparation and formed element detection has been designed. This device is a more integrated formed element detection device and method that can simultaneously complete sample preparation and formed element detection.

[0008] The technical solution of this application to solve the above-mentioned technical problems is a formed element detection device, including component A, component B, and component C; component A includes an imaging component and a carrier component A, the carrier component A being used to place a formed element detection chip; the formed element detection chip includes a microscopic sample receiving cavity, the microscopic sample receiving cavity being used to contain a microscopic sample; the imaging component is used to acquire a magnified microscopic image of the microscopic sample; component B includes a sample preparation module, a sample transfer device, and a carrier component B; the carrier component B is used to place a sample preparation box; the sample preparation module is used to manipulate the sample in the sample preparation box to prepare the sample into a microscopic sample; the sample transfer device is used to transfer the microscopic sample to the formed element detection chip; component C is a detection control component, component C is electrically connected to component A; component C is electrically connected to component B, and component C is used to control the detection process.

[0009] The sample transfer device may include a gantry crane transfer assembly and a pipette assembly; the gantry crane transfer assembly includes a horizontal rail B; the pipette assembly includes a pipette, the pipette assembly is mounted on the horizontal rail B, and the pipette assembly is capable of moving in the horizontal direction; the pipette assembly is used to transfer the microscopic sample to the formed element detection chip.

[0010] The sample transfer device may include a pendant transfer assembly and a pipette assembly; the pendant transfer assembly includes a rotating support column and a horizontal arm; the pipette assembly includes a pipette, the pipette assembly is mounted on the horizontal arm, and the rotating support column can drive the horizontal arm to rotate in the horizontal direction.

[0011] Alternatively, the horizontal arm may include a C-shaped horizontal rail, the pipette assembly may be mounted on the C-shaped horizontal rail, and the pipette assembly may be movable in the horizontal direction.

[0012] Alternatively, the sample preparation box may include a sampling stirring spoon, one end of which includes a stirring shaft head. The sample preparation module may include a rotation drive shaft and a drive motor, wherein the drive motor is used to drive the rotation drive shaft to rotate. The rotation drive shaft may be coupled to the stirring shaft head to drive the sampling stirring spoon to rotate.

[0013] Alternatively, the sample preparation module may include a B1 support frame; the B1 support frame is mounted on the B bearing assembly, and the rotation drive shaft and drive motor are mounted on the B1 support frame.

[0014] Alternatively, the sample preparation module may include a B2 support frame; the B2 support frame is used to support the pipette, the rotation drive shaft, and the drive motor.

[0015] Alternatively, the sample preparation box may include a pipette tip receiving cavity; or the B-support assembly may include a pipette tip receiving cavity, the pipette tip receiving cavity accommodating a pipette tip.

[0016] Alternatively, the sample preparation box may include a light-transmitting detection cavity for containing the detection sample.

[0017] Alternatively, the A-bearing component may include a bearing platform and an X-axis slide, with the bearing platform disposed on the X-axis slide and including a detection chip receiving slot.

[0018] Alternatively, the A-type support component may include a Y-axis slide, and the X-axis slide support platform may be mounted on the Y-axis slide.

[0019] The technical solution of this application to solve the above-mentioned technical problems can also be a formed element detection method, including: step C: the sample preparation module operates on the sample in the sample preparation box to prepare the sample into a microscopic sample; step D: the sample transfer component transfers the microscopic sample to the formed element detection chip; step E: the camera component captures the formed element detection chip to obtain a magnified microscopic image of the microscopic sample.

[0020] Alternatively, step C may include: step C0: coupling the rotation drive shaft with the stirring shaft head; step C1: driving the sampling stirring spoon to rotate.

[0021] Step D may include: Step D0: drive the pipette to move to the pipette tip receiving cavity, and the pipette obtains the pipette tip; Step D1: drive the pipette to move to the sample preparation box, and drive the pipette to aspirate the microscopic sample; Step D2: drive the pipette to move to the formed element detection chip, and drive the pipette to inject the microscopic sample into the formed element detection chip.

[0022] It is possible that step A is included before step C: adding the test sample to the sample preparation box; and step B: placing the formed element detection chip and the sample preparation box into the sample preparation box respectively.

[0023] One of the technical effects of the above-mentioned technical solution is that component B has a sample preparation function, which, when integrated with components A and C, improves the integration of the formed element detection device and ushers in an era of automated sample preparation for formed element detection.

[0024] One of the technical effects of the above-mentioned technical solution is that the gantry crane transfer assembly can facilitate sample transfer and realize the connection between sample preparation and sample testing.

[0025] One of the technical advantages of the above-mentioned solution is that the gantry-type transfer assembly facilitates sample transfer, enabling seamless integration between sample preparation and sample testing. Furthermore, its range of motion is greater and more flexible compared to the gantry-type transfer assembly.

[0026] One of the technical effects of the above-mentioned technical solution is that the C-shaped horizontal hanging rail further expands the range of movement, making sample transfer more flexible.

[0027] One of the technical effects of the above-mentioned technical solution is that the setting of the sampling stirring spoon allows for mechanized control of mixing operations such as stirring, reducing human intervention and improving the consistency of sample preparation.

[0028] One of the technical effects of the above technical solution is that the B1 support frame is installed on the B bearing component, and the rotation drive shaft and drive motor are installed on the B1 support frame, making the driving of the sampling stirring spoon more direct and convenient.

[0029] One of the technical effects of the above technical solution is that the B2 support frame is used to support the pipette, the rotating drive shaft, and the drive motor; the B2 support frame also serves to support the pipette and drive the sampling and stirring spoon, resulting in higher integration.

[0030] One of the technical advantages of the above-mentioned solution is that the sample preparation kit includes a pipette tip receiving cavity, which facilitates the fit between the pipette body and the pipette tip, and makes it easy to replace the pipette tip. Multiple pipette tip receiving cavities can be provided to hold different types of pipette tips; such as pipette tips of different sizes or capacities; or different types of pipette tips, such as those made of different materials; or pipette tips in different usage states, such as used and unused tips.

[0031] One of the technical advantages of the above-mentioned technical solution is that the sample preparation box includes a light-transmitting detection cavity, and can also directly detect the optical properties of the sample based on the sample preparation box, thus integrating multiple detection methods in one device.

[0032] One of the technical effects of the above-mentioned technical solution is that the X-axis slide in the A-bearing component facilitates movement in the X-axis direction, which facilitates microscopic imaging of a larger area for the detection and analysis of formed elements.

[0033] One of the technical advantages of the above-mentioned technical solution is that the Y-axis slide facilitates movement in the Y-axis direction, enabling microscopic imaging of a larger area for the detection and analysis of formed elements.

[0034] One of the technical effects of the above-mentioned technical solution is that the preparation of microscopic examination samples is completed by machine in the sample preparation kit, which improves the integration of the detection process.

[0035] One of the technical effects of the above-mentioned technical solution is that the sampling stirring spoon can be rotated by machine control, which further improves the automation level of the equipment.

[0036] One of the technical effects of the above-mentioned technical solution is that the pipette and pipette tip are configured and moved inside the equipment, which further improves the automation level of the equipment. Attached Figure Description

[0037] Figure 1 This is a schematic block diagram of a formed element detection device with sample preparation. Figure 2 This is a partial schematic block diagram of a formed element detection device with sample preparation capabilities; Figure 3 This is a schematic diagram of a formed element detection device with sample preparation capabilities; Figure 4 This is a partial schematic block diagram of a formed element detection device with sample preparation capabilities; Figure 5 This is a partial schematic diagram of a formed element detection device with sample preparation capabilities; Figure 6 This is a schematic diagram of a formed element detection device with sample preparation capabilities; Figure 7 This is an exploded schematic diagram of a local component B of a formed element detection device with sample preparation. Figure 8 This is a schematic diagram of the sample preparation kit; Figure 9 This is a cross-sectional schematic diagram of one embodiment of the sample preparation kit; Figure 10 This is a schematic diagram of one embodiment of the sampling stirring spoon; Figure 11 This is a cross-sectional schematic diagram of the second embodiment of the sample preparation kit; Figure 12 This is a schematic diagram of the second embodiment of the sampling stirring spoon; Figure 13 This is a schematic diagram of the third embodiment of the sample preparation kit; Figure 14 This is an exploded schematic diagram of a local component B of a formed element detection device with sample preparation. Figure 15 This is an exploded schematic diagram of a partial A component of a formed element detection device with sample preparation capabilities; Figure 16 This is a schematic diagram of a partial A component combination of a formed element detection device with sample preparation; Figure 17 This is a schematic diagram of one embodiment of a formed element detection chip; Figure 18This is a schematic diagram of a second embodiment of a formed element detection chip; Figure 19 This is a flowchart illustrating a method for detecting formed components. Figure 20 This is a flowchart illustrating a method for detecting formed components. Figure 21 This is a flowchart illustrating a method for detecting formed elements. Detailed Implementation

[0038] The contents of this application will be further described in detail below with reference to the accompanying drawings.

[0039] It should be noted that the following description of preferred embodiments of this application does not constitute any limitation on this application. The description of preferred embodiments is merely an illustration of the general principles of this application. The embodiments described in this application are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0040] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the equipment or component referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. Furthermore, the terms "first," "second," and technical features numbered with Arabic numerals 1, 2, 3, etc., and designations such as "A" and "B," are used for descriptive purposes only, for ease of explanation, and do not represent a temporal or spatial order; they should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, features defined with "first," "second," and numbered with Arabic numerals 1, 2, 3, etc., may explicitly or implicitly include one or more of that feature. In the description of this application, "several" means two or more, unless otherwise expressly and specifically defined.

[0041] like Figure 1 and Figure 3A formed element detection device with sample preparation includes component A 100, component B 200, and component C 300. Component A 100 includes an imaging component 110 and a support component 120, which is used to hold a formed element detection chip 160. The formed element detection chip 160 includes a microscopic sample receiving cavity for receiving a microscopic sample. The imaging component 110 is used to acquire magnified microscopic images of the microscopic sample. The imaging component 110 includes a microscope 111 and an imaging module 112. The imaging module 112 in component A is used for acquiring microscopic images of the formed elements, which are then used for formed element detection and analysis.

[0042] like Figure 1 and Figure 3 A formed element detection device with sample preparation includes a support 130 for supporting and fixing a camera assembly 110. The support 130 includes a vertical column 131 and a horizontal support arm 132; the camera module 112 is fixed to one end of the horizontal support arm 132; one end of the vertical column 131 is connected to the horizontal support arm 132; the other end of the vertical column 131 is connected to a load-bearing assembly 120. The vertical column 131 can be directly fixed to a base 900; or it can be fixed to the load-bearing assembly 120.

[0043] like Figure 1 and Figure 3 A formed element detection device with sample preparation, wherein component B 200 includes a sample preparation module 210, a sample transfer device 220, and a component B carrier 230; a sample preparation box 260 is disposed on the component B carrier 230; the sample preparation module 210 is used to operate on the sample in the sample preparation box 260 to prepare the sample into a microscopic sample; the sample transfer device 220 is used to transfer the microscopic sample to the formed element detection chip 160.

[0044] like Figure 1 A formed element detection device with sample preparation is disclosed. Component C 300 is a detection control component, electrically connected to component A 100 and component B 200. Component C 300 is used to control the detection process. The detection control component includes a formed element detection and analysis module, which is used for the detection and analysis of formed elements in the magnified microscopic images of the sample. Component C 300... Figure 3 It was not shown in the document.

[0045] like Figure 2 and Figure 3A formed element detection device with sample preparation, the sample transfer device 220 includes a gantry-type transfer assembly 500 and a pipette assembly 600; the gantry-type transfer assembly 500 includes a horizontal rail 510; the pipette assembly 600 includes a pipette, the pipette assembly 600 is mounted on the horizontal rail 510, and the pipette assembly 600 is movable in the horizontal direction; the pipette assembly 600 is used to transfer the microscopic sample to the formed element detection chip 160. The gantry crane transfer assembly 500 also includes two B vertical columns 530; the two ends of the B horizontal rail 510 are respectively connected to the tops of the two B vertical columns 530; the bottoms of the two B vertical columns 530 are fixed to the base 900; the B load-bearing assembly 230 is fixed to the base 900; the A load-bearing assembly 120 is fixed to the base 900; the B horizontal rail 510 spans the A load-bearing assembly 120 and the B load-bearing assembly 230; the height of the A vertical column 131 is greater than the height of the B vertical columns 530; the A horizontal support arm 132 is above the B horizontal rail 510.

[0046] like Figure 4 , Figure 5 and Figure 6 A formed element detection device with sample preparation is disclosed. The sample transfer device includes a pendant-type transfer assembly 700 and a pipette assembly 600. The pendant-type transfer assembly 700 includes a rotating support column 710 and a horizontal arm 720. The pipette assembly 600 includes a pipette and is mounted on the horizontal arm 720. The rotating support column 710 can drive the horizontal arm 720 to rotate horizontally. The horizontal arm 720 includes a C-shaped horizontal rail 730, and the pipette assembly 600 is mounted on the C-shaped horizontal rail 730 and can move horizontally. The rotating support column 710 is fixed to a base 900. The area where the rotating support column 710 drives the horizontal arm 720 to rotate covers the A-shaped support assembly 120 and the B-shaped support assembly 230. The height of the rotating support column 710 is less than the height of the A-shaped vertical column 131. The A-shaped horizontal support arm 132 is above the C-shaped horizontal rail 730.

[0047] like Figures 7 to 12 The sample preparation box 260 includes a sampling stirring spoon 270, one end of which includes a stirring shaft head 271. The sample preparation module 210 includes a rotation drive shaft 211 and a drive motor. The drive motor is used to drive the rotation drive shaft 211 to rotate. The rotation drive shaft 211 can be coupled with the stirring shaft head 271 to drive the sampling stirring spoon 270 to rotate.

[0048] like Figure 7The sample preparation module 210 includes a B1 support frame 213; the B1 support frame 213 is mounted on the B bearing assembly 230, and the rotation drive shaft 211 and the drive motor are mounted on the B1 support frame 213.

[0049] In some embodiments not shown in the accompanying drawings, the sample preparation module 210 includes a B2 support frame; the B2 support frame is used to support the pipette, the rotation drive shaft, and the drive motor. That is, the pipette 600 and the sample preparation module 210 share a support frame.

[0050] like Figures 9 to 10 ,as well as Figures 11 to 12 The following are two embodiments of sample preparation boxes 260. One end of the sampling stirring spoon 270 includes a stirring shaft head 271. The sampling stirring spoon 270 can rotate inside the sample preparation box 260, causing the sample inside the sample preparation box 260 to rotate, thus completing the sample preparation operation.

[0051] like Figures 11 to 12 Examples of sample preparation kit 260 and Figures 9 to 10 The difference between the sample preparation kit 260 and the embodiment lies in the specific structure of the sampling stirring spoon 270.

[0052] like Figure 13 The sample preparation box 260 includes a pipette tip receiving cavity 261; the pipette tip receiving cavity 261 is used to receive a pipette tip 601.

[0053] like Figure 14 The B-supporting assembly 230 includes a B-pipette tip receiving cavity 231, which houses a pipette tip 601.

[0054] like Figure 13 The sample preparation box 260 includes a light-transmitting detection cavity 262, which is used to contain the detection sample.

[0055] like Figure 15 and Figure 16 The A-type support assembly 120 includes a support platform 121 and an X-axis slide 122. The support platform 121 is mounted on the X-axis slide 122 and includes a detection chip receiving slot 1211. The X-axis slide 122 is used to drive the support platform 121 to move in the X-axis direction. The detection chip receiving slot 1211 is used for inserting a formed component detection chip 160. Figure 17 and Figure 18 Two different formed element detection chips 160 were demonstrated.

[0056] like Figure 15 and Figure 16The A-support component 120 includes a Y-axis slide 123, and an X-axis slide 122 is mounted on the Y-axis slide 123. The Y-axis slide 123 drives the X-axis slide 122 to move in the Y-axis direction. The X-axis slide 122 and the Y-axis slide 123 drive the formed element detection chip 160 on the support platform 121 to move in the X-axis or Y-axis direction, thereby adjusting the position of the formed element detection chip 160 relative to the camera component 110, and thus adjusting the position of the microscopic imaging area.

[0057] A method for detecting formed elements includes the following steps: Step A: Adding the sample to a sample preparation box; Step B: Placing the formed element detection chip and the sample preparation box separately; Step C: The sample preparation module manipulates the sample in the sample preparation box to prepare a microscopic sample; Step D: The sample transfer component transfers the microscopic sample to the formed element detection chip; Step E: The imaging component captures an image of the formed element detection chip to obtain a magnified microscopic image of the microscopic sample.

[0058] A method for detecting formed elements, wherein step C includes: Step C0: coupling a rotation drive shaft with the stirring shaft head; Step C1: driving a sampling stirring spoon to rotate, thereby fully stirring the sample or fully mixing the sample with the reagent to obtain a microscopic sample.

[0059] A method for detecting formed elements, wherein step D includes: step D0: driving a pipette to move to the pipette tip receiving cavity, and the pipette obtaining the pipette tip; step D1: driving the pipette to move to the sample preparation box, and driving the pipette to aspirate the microscopic sample; step D2: driving the pipette to move to the formed element detection chip, and driving the pipette to inject the microscopic sample into the formed element detection chip.

[0060] While this application has been described and illustrated with reference to preferred embodiments and several alternatives, it is not intended to be limited to the specific descriptions herein. Other alternatives or equivalent components may also be used to practice this application.

Claims

1. A formed element detection device with sample preparation, characterized in that, Includes component A, component B, and component C; Component A includes a camera component and a carrier component, the carrier component being used to place the formed element detection chip; the formed element detection chip includes a microscopic sample receiving cavity, the microscopic sample receiving cavity being used to receive the microscopic sample; the camera component is used to acquire a magnified microscopic image of the microscopic sample; Component B includes a sample preparation module, a sample transfer device, and a B carrier component; the B carrier component is used to hold the sample preparation box. The sample preparation module is used to manipulate the sample in the sample preparation box to prepare the sample into a microscopic sample; the sample transfer device is used to transfer the microscopic sample to the formed element detection chip; Component C is the detection and control component. Component C is electrically connected to component A; Component C is also electrically connected to component B. Component C is used to control the detection process.

2. The formed element detection device with sample preparation according to claim 1, characterized in that, The sample transfer device includes a gantry crane transfer assembly and a pipette assembly; the gantry crane transfer assembly includes a horizontal lifting rail (B). The pipette assembly includes a pipette, the pipette assembly is mounted on the B horizontal rail, and the pipette assembly is capable of moving in the horizontal direction; The pipette assembly is used to transfer the microscopic sample to the formed element detection chip.

3. The formed element detection device with sample preparation according to claim 1, characterized in that, The sample transfer device includes a pendant transfer assembly and a pipette assembly; the pendant transfer assembly includes a rotating support column and a horizontal arm; The pipette assembly includes a pipette, which is mounted on the horizontal arm, and the rotating support column can drive the horizontal arm to rotate in the horizontal direction.

4. The formed element detection device with sample preparation according to claim 3, characterized in that, The horizontal arm includes a C-shaped horizontal rail, on which the pipette assembly is mounted and can move horizontally.

5. The formed element detection device with sample preparation according to any one of claims 2 to 3, characterized in that, The sample preparation box includes a sampling stirring spoon, one end of which includes a stirring shaft head. The sample preparation module includes a rotation drive shaft and a drive motor. The drive motor is used to drive the rotation drive shaft to rotate. The rotation drive shaft can be coupled with the stirring shaft head to drive the sampling stirring spoon to rotate.

6. The formed element detection device with sample preparation according to claim 5, characterized in that, The sample preparation module includes a B1 support frame; the B1 support frame is mounted on the B bearing assembly, and the rotation drive shaft and drive motor are mounted on the B1 support frame.

7. The formed element detection device with sample preparation according to claim 5, characterized in that, The sample preparation module includes a B2 support frame; the B2 support frame is used to support the pipette, the rotation drive shaft, and the drive motor.

8. The formed element detection device with sample preparation according to claim 5, characterized in that, The sample preparation box includes a pipette tip receiving cavity; or the B support assembly includes a pipette tip receiving cavity, the pipette tip receiving cavity accommodating a pipette tip.

9. The formed element detection device with sample preparation according to claim 5, characterized in that, The sample preparation box includes a light-transmitting detection cavity for containing the detection sample.

10. The formed element detection device with sample preparation according to claim 1, characterized in that, The A-type support component includes a support platform and an X-axis slide. The support platform is mounted on the X-axis slide and includes a detection chip receiving slot.

11. The formed element detection device with sample preparation according to claim 10, characterized in that, The A-type support component includes a Y-axis slide, and the X-axis slide support platform is mounted on the Y-axis slide.

Images