An integrated circuit test probe card

Abstract

The utility model discloses an integrated circuit test probe seat, including test frame, the inside top of test frame is installed with telescopic ware, the lower extreme of telescopic ware is provided with replacement auxiliary mechanism, replacement auxiliary mechanism includes the fixed frame of installation in telescopic ware lower extreme, the inside inner wall of fixed frame is opened and is limited to the hole, the inside slide of limited hole is connected with the sliding block. The utility model discloses a kind of integrated circuit test probe seat, by pulling sliding block and moving upwards, and make sliding block drive mounting frame move upwards, further make spring block push limited ball into new limited hole, and make sliding block have damping effect in fixed frame, probe main body is limited in higher position, and rotate threaded head again, make contact block separate from mounting seat, reach the purpose of probe main body is convenient to take out, and make probe main body is disassembled at higher position, so the probability that probe main body touches the inside bottom of test frame can be reduced.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing technology, and in particular to an integrated circuit test probe holder. Background Technology

[0002] With the updating and development of modern science and technology, microelectronics has become an important branch of electronics, realizing the integration of circuit systems and concentrating the functions of various devices on a small chip, thus making the circuit more portable. Integrated circuits often require probe pin testing equipment to measure and collect circuit signal data. Traditional integrated circuit test probe sockets have some drawbacks. An integrated circuit test probe socket typically includes a printed circuit board and multiple probes arranged on it. The probes perform functional tests by contacting the pins of the integrated circuit. However, the common probe socket structure has the problem of inconvenient maintenance: after a period of use, the probe tips will fail due to wear. Because the probes themselves are small and precise and are usually integrated into the module, it is extremely difficult to repair a single probe. Often, the entire probe module needs to be replaced. However, if the entire probe socket is replaced, the disassembly method is too complicated due to its installation method, and the cost is too high, resulting in huge waste. Utility Model Content

[0003] The main objective of this invention is to provide an integrated circuit test probe holder that can effectively solve the problems in the background art.

[0004] To achieve the above objectives, the technical solution adopted by this utility model is as follows: An integrated circuit test probe holder includes a test frame. A telescopic device is mounted on the top inner side of the test frame. A replacement auxiliary mechanism is provided at the lower end of the telescopic device. The replacement auxiliary mechanism includes a fixed frame mounted at the lower end of the telescopic device. A limiting hole is formed on the inner wall of the fixed frame. A sliding block is slidably connected to the inner side of the limiting hole. A connecting block is fixedly connected to the front end of the sliding block. A mounting bracket is fixedly connected to the front end of the connecting block. A threaded head is threaded into the mounting bracket. A contact block is fixedly connected to the lower end of the threaded head. A mounting seat is placed inside the mounting bracket. A probe body is mounted at the lower end of the mounting seat. A baffle is fixedly connected to the inner side of the sliding block. A spring block is fixedly connected to one end of the baffle. A limiting ball is fixedly connected to one end of the spring block.

[0005] Preferably, a control plate is fixedly connected to the rear end of the sliding block, and there are multiple sets of limiting holes.

[0006] Preferably, the connecting block is in contact with the fixing frame, and the contact block is located inside the mounting frame.

[0007] Preferably, the lower end of the contact block contacts the upper end of the mounting base, and the outer side of the limiting ball contacts one of the sets of limiting holes.

[0008] Preferably, a placement seat is installed on the inner bottom of the test frame, and an indicator light is installed on the upper end of the test frame.

[0009] Preferably, the lower end of the test frame is fixedly connected to a support leg, and there are four sets of support legs, which are distributed at the four corners of the lower end of the test frame.

[0010] Compared with the prior art, the present invention has the following beneficial effects: By pulling the slider upwards and causing it to move the mounting bracket upwards, the spring block pushes the limiting ball into the new limiting hole. The slider also has a damping effect within the mounting bracket, thus limiting the probe body to a higher position. By rotating the threaded head, the contact block is disengaged from the mounting base, making it easier to remove the probe body and disassemble it from a higher position. This reduces the probability of the probe body touching the bottom of the inner side of the test frame. Attached Figure Description

[0011] Figure 1 This is a schematic diagram of the overall structure of an integrated circuit test probe holder according to the present invention. Figure 1 ; Figure 2 This is a schematic diagram of the overall structure of an integrated circuit test probe holder according to the present invention. Figure 2 ; Figure 3 This is a schematic diagram of the auxiliary mechanism for replacing an integrated circuit test probe holder according to the present invention. Figure 4 This is a partial structural diagram of an auxiliary mechanism for replacing an integrated circuit test probe holder according to the present invention.

[0012] In the diagram: 1. Test frame; 2. Telescopic device; 3. Placement seat; 4. Indicator light; 5. Support leg; 6. Replacement auxiliary mechanism; 61. Fixing frame; 62. Limiting hole; 63. Sliding block; 64. Connecting block; 65. Mounting bracket; 66. Threaded head; 67. Contact block; 68. Mounting seat; 69. Probe body; 610. Baffle; 611. Spring block; 612. Limiting ball; 613. Control board. Detailed Implementation

[0013] To make the technical means, creative features, objectives and effects of this utility model easier to understand, the present utility model will be further described below in conjunction with specific embodiments.

[0014] like Figure 1-4As shown, an integrated circuit test probe holder includes a test frame 1. A telescopic device 2 is installed on the top inner side of the test frame 1. A replacement auxiliary mechanism 6 is provided at the lower end of the telescopic device 2. The replacement auxiliary mechanism 6 includes a fixed frame 61 installed at the lower end of the telescopic device 2. A limiting hole 62 is opened on the inner wall of the fixed frame 61. A sliding block 63 is slidably connected to the inner side of the limiting hole 62. A connecting block 64 is fixedly connected to the front end of the sliding block 63. A mounting bracket 65 is fixedly connected to the front end of the connecting block 64. A threaded head 66 is threadedly connected to the inside of the mounting bracket 65. A contact block 67 is fixedly connected to the lower end of the threaded head 66. A mounting seat 68 is placed inside the mounting bracket 65. A probe body 69 is installed at the lower end of the mounting seat 68. A baffle 610 is fixedly connected to the inner side of the sliding block 63. A spring block 611 is fixedly connected to one end of the baffle 610. A limiting ball 612 is fixedly connected to one end of the spring block 611.

[0015] In this embodiment, a control plate 613 is fixedly connected to the rear end of the sliding block 63, and there are multiple sets of limiting holes 62. The connecting block 64 is in contact with the fixing frame 61, the contact block 67 is located inside the mounting frame 65, the lower end of the contact block 67 is in contact with the upper end of the mounting base 68, and the outer side of the limiting ball 612 is in contact with one set of limiting holes 62.

[0016] Specifically, after prolonged use, when the probe body 69 becomes severely worn, the control plate 613 is pulled upwards. This causes the control plate 613 to move the sliding block 63 upwards, which in turn moves the mounting bracket 65 upwards. Consequently, the mounting base 68 moves the probe body 69 upwards, and simultaneously, the limiting ball 612 disengages from the inner side of the limiting hole 62. This causes the fixing bracket 61 to push the limiting ball 612 into the sliding block 63, causing the limiting ball 612 to compress the spring block 611. As the sliding block 63 moves upwards, the limiting ball 612 aligns with a new set of limiting holes 62. The spring block 611 then pushes the limiting ball 612 into the new limiting hole 62, giving the sliding block 63 damping efficiency within the fixing bracket 61. This effectively limits the probe body 69 to the inner side of the test frame 1. The higher part at the bottom is the shaft. Then, the threaded head 66 is rotated, causing the threaded head 66 to move the contact block 67 upward. This allows the mounting base 68 to be removed from the mounting base 68, and the probe body 69 can then be replaced. By pulling the sliding block 63 upward and causing the sliding block 63 to move the mounting bracket 65 upward, the spring block 611 pushes the limiting ball 612 into the new limiting hole 62. The sliding block 63 also has a damping effect within the fixing bracket 61, thus limiting the probe body 69 to a higher position. Then, the threaded head 66 is rotated again, causing the contact block 67 to disengage from the mounting base 68. This facilitates the removal of the probe body 69 and allows for disassembly of the probe body 69 from a higher position, thereby reducing the probability that the probe body 69 will touch the bottom inner side of the test frame 1.

[0017] In this embodiment, a placement seat 3 is installed on the inner bottom of the test frame 1, an indicator light 4 is installed on the upper end of the test frame 1, and a support leg 5 is fixedly connected to the lower end of the test frame 1. There are four sets of support legs 5, and the four sets of support legs 5 are distributed at the four corners of the lower end of the test frame 1.

[0018] Specifically, the worker first places the integrated circuit to be tested on the placement seat 3, and then activates the telescopic device 2, which pushes the mounting seat 68 downward and causes the probe body 69 to follow the mounting seat 68 downward, so that the probe body 69 contacts the pins of the integrated circuit and can then be tested.

[0019] Working principle: In use, the worker first places the integrated circuit to be tested onto the placement seat 3, then activates the telescopic device 2, causing the mounting seat 68 to move downwards and the probe body 69 to follow the mounting seat 68 downwards, allowing the probe body 69 to contact the pins of the integrated circuit for testing. After prolonged use, when the probe body 69 becomes severely worn, the control plate 613 is pulled upwards, causing the control plate 613 to move the sliding block 63 upwards and the sliding block 63 to move the mounting bracket 65 upwards. This, in turn, causes the mounting seat 68 to move the probe body 69 upwards, simultaneously disengaging the limiting ball 612 from the inside of the limiting hole 62. The fixing bracket 61 then pushes the limiting ball 612 into the sliding block 63, causing the limiting ball 612 to compress the spring block 611. As the sliding block 63 moves upwards, the limiting ball 612 aligns with a new set of limiting holes 62, causing the spring block 611 to push the limiting ball 612 towards the new... Pushing the slider 63 into the limiting hole 62 creates a damping effect within the mounting bracket 61, thus limiting the probe body 69 to a position higher than the bottom of the inner side of the test frame 1. Then, rotating the threaded head 66 causes the contact block 67 to move upward, allowing the mounting base 68 to be removed. The probe body 69 can then be replaced. By pulling the slider 63 upward and causing it to move the mounting bracket 65 upward, the spring block 611 pushes the limiting ball 612 into the new limiting hole 62, creating a damping effect within the mounting bracket 61. This limits the probe body 69 to a higher position. Rotating the threaded head 66 further disengages the contact block 67 from the mounting base 68, facilitating the removal of the probe body 69 and allowing for disassembly from a higher position. This reduces the probability of the probe body 69 touching the bottom of the inner side of the test frame 1.

[0020] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claims. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. An integrated circuit test probe holder, comprising a test rack (1), characterized in that: A telescopic device (2) is installed on the top inner side of the test frame (1). A replacement auxiliary mechanism (6) is provided at the lower end of the telescopic device (2). The replacement auxiliary mechanism (6) includes a fixed frame (61) installed at the lower end of the telescopic device (2). A limiting hole (62) is opened on the inner wall of the fixed frame (61). A sliding block (63) is slidably connected to the inner side of the limiting hole (62). A connecting block (64) is fixedly connected to the front end of the sliding block (63). A mounting bracket (64) is fixedly connected to the front end of the connecting block (64). 5) The mounting bracket (65) has a threaded head (66) inside, and a contact block (67) is fixedly connected to the lower end of the threaded head (66). A mounting seat (68) is placed inside the mounting bracket (65), and a probe body (69) is installed at the lower end of the mounting seat (68). A baffle (610) is fixedly connected to the inner side of the sliding block (63), and a spring block (611) is fixedly connected to one end of the baffle (610). A limiting ball (612) is fixedly connected to one end of the spring block (611).

2. The integrated circuit test probe holder according to claim 1, characterized in that: The rear end of the sliding block (63) is fixedly connected to a control plate (613), and there are multiple sets of limiting holes (62).

3. The integrated circuit test probe holder according to claim 2, characterized in that: The connecting block (64) is in contact with the fixing frame (61), and the contact block (67) is located inside the mounting frame (65).

4. An integrated circuit test probe holder according to claim 2, characterized in that: The lower end of the contact block (67) contacts the upper end of the mounting base (68), and the outer side of the limiting ball (612) contacts one of the limiting holes (62).

5. An integrated circuit test probe holder according to claim 1, characterized in that: The test frame (1) has a placement seat (3) installed on the bottom inner side, and an indicator light (4) installed on the top of the test frame (1).

6. An integrated circuit test probe holder according to claim 5, characterized in that: The lower end of the test frame (1) is fixedly connected to a support leg (5). There are four sets of support legs (5), and the four sets of support legs (5) are distributed at the four corners of the lower end of the test frame (1).

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