A laser aging test apparatus, system, and device

Abstract

The utility model provides a kind of laser aging test device, system and device, it is related to optical communication technical field.The laser aging test device in the application includes: multi-channel conversion circuit, multi-channel conversion circuit includes multiple conversion channels, each conversion channel corresponds a laser unit, each conversion channel is connected with laser unit by corresponding high-speed signal transmission line.When laser device is in non-working state, multi-channel conversion circuit is used to transmit current signal to corresponding laser unit by each conversion channel, and the corresponding laser unit is turned on, to complete the aging test of laser device.Based on this, the laser aging test device provided in the application can effectively control the module power consumption during aging, to facilitate the temperature control of aging, and further overcome the technical problem of low precision of aging temperature control in the prior art.

Description

Technical Field

[0001] This utility model relates to the field of optical communication technology, and in particular to a laser aging test device, system and component. Background Technology

[0002] Lasers, as core components of modern optoelectronic technology, are widely used in communications, medical applications, and industrial processing. In the manufacturing process of semiconductor lasers, inherent fluctuations exist in processes such as epitaxial growth and cleavage coating. This can lead to microstructural damage in some devices, such as lattice defects or interface states. These potential defects, under initial electrical stress, may evolve into dark line defects (DLD) or catastrophic optical damage (COD), ultimately resulting in early device failure. To ensure the reliability of devices leaving the factory, the industry commonly employs high-temperature aging screening (burn-in) technology. This involves applying the rated operating current in conjunction with an ambient temperature above 85°C to accelerate the exposure of potential defects.

[0003] Currently, aging solutions are mainly divided into two modes: external power supply and internal power supply. The external power supply system uses a precision probe station with a multi-channel programmable power supply to directly apply bias current to the laser pads via contact probes. This solution requires a high-precision temperature control platform, multi-channel power management modules, and automated testing equipment, resulting in high overall system construction costs and a large footprint. The internal power supply solution utilizes the current source module integrated in the laser driver, reusing the bias circuit of the driver chip to supply the aging current. While this significantly simplifies the hardware structure, it is limited by the power consumption design of the driver chip. For example, when the aging current reaches hundreds of milliamps, the conduction loss of the MOSFET inside the driver may generate more than 10W of heat dissipation. Under high-temperature aging conditions, this additional heat load will be conducted to the laser package through the PCB copper foil, causing distortion of the heat sink temperature field distribution. In severe cases, it may even cause oscillations in the temperature feedback control system, making it impossible to maintain the precise temperature control requirement of ±0.5℃.

[0004] Therefore, there is an urgent need for a new laser aging scheme that can overcome the technical problem of low accuracy in aging temperature control in existing technologies. Utility Model Content

[0005] The purpose of this invention is to provide a laser aging test device, system and device that can effectively control the power consumption of the module during aging, so as to facilitate the temperature control of aging, thereby overcoming the technical problem of low accuracy of aging temperature control in the prior art.

[0006] In a first aspect, this application provides a laser aging test device for use in laser devices. The laser device includes multiple laser units, each laser unit corresponding to a high-speed signal transmission line to receive a driving signal through the high-speed signal transmission line. The laser aging test device includes a multi-channel conversion circuit, which includes multiple conversion channels, each conversion channel corresponding to a laser unit, and each conversion channel connected to the laser unit through a corresponding high-speed signal transmission line. When the laser device is in a non-working state, the multi-channel conversion circuit is used to transmit the current signal to the corresponding laser unit through each conversion channel, and turn on the corresponding laser unit to complete the aging test of the laser device. The non-working state is used to characterize the state when the driving signal of the laser device is cut off.

[0007] Optionally, the laser aging test device also includes a control module, and the multi-channel conversion circuit includes a digital-to-analog conversion circuit, with the control module connected to the input terminal of each conversion channel; When the laser device is not in operation, for any conversion channel, the conversion channel is used to receive and convert the digital signal sent by the control module into a current signal, and transmit the current signal to the corresponding laser unit to turn on the corresponding laser unit, so as to complete the aging test of the laser device.

[0008] Optionally, when the laser aging test device includes a human-machine interface module, the human-machine interface module is connected to the control module. The human-machine interface module is used to send interactive commands to the control module, so that the control module adjusts the digital signals according to the interactive commands.

[0009] Optionally, the laser device also includes a high-speed drive chip. When each output pin of the high-speed drive chip is connected to a laser unit through a high-speed signal transmission line, the laser aging test device includes a carrier PCB board, the high-speed drive chip, the multi-channel conversion circuit, and each laser unit are all mounted on the carrier PCB board. In this circuit, each conversion channel is connected to a high-speed signal transmission line via metal bonding wires.

[0010] Optionally, the carrier PCB board also includes a GND solder pad, and each laser unit is connected to the GND solder pad via metal bonding wires.

[0011] Optionally, the laser aging test device also includes a test module, which is connected to each laser unit; When the high-speed drive chip is turned off, the test module is used to collect the aging parameters of each laser unit in the on state, so as to complete the aging test of the laser device based on the aging parameters.

[0012] Optionally, when the laser aging test apparatus includes a display module, the test module is also connected to the display module; When the aging parameters include power change values, for any laser unit, the test module is also used to send a first signal to the display module when the power change value of the current laser unit is lower than the preset power drop parameter, so as to drive the display module to show that the corresponding laser unit is in normal state.

[0013] Optionally, when the laser device includes four laser units, the multi-channel conversion circuit includes four conversion channels, each of which is connected to a high-speed signal transmission line via a metal bonding wire to connect to the corresponding laser unit.

[0014] Secondly, this application provides a laser aging test system, which includes the laser aging test device of any of the first aspects described above.

[0015] Thirdly, this application also provides a laser device, which includes multiple laser units and a laser aging test device according to any one of the first aspects, wherein each laser unit corresponds to a high-speed signal transmission line, and the laser aging test device is connected to the corresponding laser unit through the high-speed signal transmission line.

[0016] The laser aging test device, system, and component provided by this utility model have the following beneficial effects: The laser aging test apparatus of this application includes a multi-channel conversion circuit, which comprises multiple conversion channels, each corresponding to a laser unit. Each conversion channel is connected to the laser unit via a corresponding high-speed signal transmission line. When the laser device is in a non-operating state, the multi-channel conversion circuit transmits current signals to the corresponding laser unit through each conversion channel, thereby turning on the corresponding laser unit to complete the aging test of the laser device. Based on this, the laser aging test apparatus provided in this application can effectively control the module power consumption during aging, facilitating temperature control during aging and overcoming the technical problem of low accuracy in aging temperature control in the prior art. Attached Figure Description

[0017] To more clearly illustrate the specific embodiments of this utility model or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0018] Figure 1 This is one of the structural schematic diagrams of the laser device provided in the embodiments of this utility model; Figure 2 A second schematic diagram of the structure of the laser device provided in this embodiment of the present invention; Figure 3 The third schematic diagram of the structure of the laser device provided in the embodiment of this utility model; Figure 4 Fourth schematic diagram of the structure of the laser device provided in the embodiment of this utility model; Figure 5 Fifth schematic diagram of the structure of the laser device provided in the embodiment of this utility model; Figure 6 Sixth schematic diagram of the structure of the laser device provided in the embodiment of this utility model; Figure 7 The seventh schematic diagram of the structure of the laser device provided in the embodiment of this utility model; Figure 8 This is the eighth schematic diagram of the structure of the laser device provided in the embodiment of this utility model.

[0019] Icons: 100-Laser device; 101-Laser unit; 102-Laser aging test device; 103-High-speed signal transmission line; 201-Multi-channel conversion circuit; 202-Control module; 203-Human-machine interaction module; 206-Carrier PCB board; 207-Test module; 208-Display module. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0021] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0022] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0023] In the description of this utility model, it should be noted that the terms "first", "second", "third", etc. are used only for distinguishing descriptions and should not be construed as indicating or implying relative importance.

[0024] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set" and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0025] The following detailed description, in conjunction with the accompanying drawings, outlines some embodiments of the present invention. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0026] Please refer to Figure 1 , Figure 1 The diagram shows the structure of a laser device in an embodiment of this application. The laser device 100 includes a plurality of laser units 101 and a laser aging test device 102. Each laser unit 101 corresponds to a high-speed signal transmission line 103 to receive a driving signal through the high-speed signal transmission line 103. Correspondingly, the laser aging test device 102 is connected to the corresponding laser unit 101 through the high-speed signal transmission line 103.

[0027] Based on this, this application can realize aging test based on laser aging test device by reusing the high-speed signal transmission line corresponding to each laser unit.

[0028] Please refer to Figure 2 , Figure 2 The diagram shows the structure of the laser aging test device in this embodiment. The laser aging test device 102 in this embodiment includes a multi-channel conversion circuit 201. The multi-channel conversion circuit 201 includes multiple conversion channels, each conversion channel corresponds to a laser unit 101, and each conversion channel is connected to the laser unit 101 through a corresponding high-speed signal transmission line 103. When the laser device is not in operation, the multi-channel conversion circuit 201 is used to transmit current signals to the corresponding laser units through each conversion channel, thereby turning on the corresponding laser units to complete the aging test of the laser device.

[0029] In this embodiment, the laser aging test device reuses the high-speed signal channels of each laser unit on the laser device. Through the multi-channel conversion circuit, each conversion channel sends a current signal to the corresponding laser unit to conduct the corresponding laser unit and perform the aging test of the laser device.

[0030] It should be noted that in this embodiment, the non-working state is used to characterize the state in which the normal working drive signal of the current laser device is switched.

[0031] Please refer to Figure 3 , Figure 3 This paper shows another structural schematic diagram of the laser aging test device in an embodiment of the present application. The laser aging test device 102 also includes a control module 202, a multi-channel conversion circuit 201 including a digital-to-analog converter (DAC), and the control module 202 is connected to the input terminal of each conversion channel.

[0032] When the laser device 100 is in a non-working state, each conversion channel is used to receive and convert the digital signal sent by the control module 202 into a current signal, and transmit the current signal to the corresponding laser unit to turn on the corresponding laser unit in order to complete the aging test of the laser device.

[0033] In this embodiment, the control module can send different digital signals to the digital-to-analog converter (DAC), and then output different current signals through each conversion channel to control the temperature of the laser unit through different current signals.

[0034] In this embodiment, the control module can send different digital signals to the digital-to-analog converter (DAC) to achieve different current signals output by the corresponding conversion channels; alternatively, the control module can send digital signals to the DAC to achieve the same current signal output by the corresponding conversion channels.

[0035] It should be noted that this embodiment does not limit the specific value of the digital signal sent by the control module. In one possible implementation, the control module may also send an enable signal to the digital-to-analog converter (DAC) to adjust the conduction state of the corresponding conversion channel of the DAC.

[0036] Please refer to Figure 4 , Figure 4 This is another structural schematic diagram of the laser aging test device in an embodiment of this application. When the laser aging test device 102 includes a human-machine interaction module 203, the human-machine interaction module 203 is connected to the control module 202.

[0037] In this embodiment, the human-computer interaction module 203 is used to send interaction commands to the control module, so that the control module adjusts the digital signals according to the interaction commands.

[0038] When the laser device also includes a high-speed driver chip, and each output pin of the high-speed driver chip is connected to a laser unit via a high-speed signal transmission line, please refer to... Figure 5 , Figure 5 This is another schematic diagram of the laser aging test device in the embodiment of this application. The laser aging test device 102 includes a carrier PCB board 206, a high-speed drive chip, a multi-channel conversion circuit 201, and each laser unit 101 are all disposed on the carrier PCB board 206.

[0039] Each conversion channel on the multi-channel conversion circuit 201 is connected to a high-speed signal transmission line 103 via a metal bonding wire.

[0040] In this embodiment, the multi-channel conversion circuit uses gold wire bonding, that is, the output end of each conversion channel is connected to the corresponding laser unit via metal bonding wires.

[0041] It should be noted that the high-speed driver chip needs to be turned off during gold wire bonding. Similarly, when the laser device needs to operate normally, the aforementioned metal bonding wires can be directly removed to ensure the normal operation of the laser device.

[0042] In one possible implementation, the gold wire bonding and debonding methods in this embodiment can be the traditional wire bonding method for packaging.

[0043] Please refer to Figure 6 , Figure 6 This is another schematic diagram of the laser aging test device in the embodiment of this application. When the laser device 100 includes four laser units 101, the multi-channel conversion circuit 201 includes four conversion channels. Each conversion channel is connected to a high-speed signal transmission line 103 through a metal bonding wire to connect to the corresponding laser unit 101.

[0044] Based on this, this application can realize current transmission between the multi-channel conversion circuit and the laser device by reusing the high-speed drive chip and the high-speed transmission line of the corresponding laser unit, so as to realize the simultaneous aging of multiple channels. At the same time, the operation of the high-speed drive chip can be cut off during the aging test, thereby reducing the power consumption of the device during the aging period.

[0045] Please continue to refer to this. Figure 5 In this embodiment, a GND soldering pad can also be provided on the carrier PCB board 206, and each laser unit 101 is also connected to the GND soldering pad through a metal bonding wire.

[0046] Based on this, this embodiment can achieve the formation of a current path after the corresponding laser unit 101 receives the current signal through the above-mentioned GND welding pad, thus ensuring that the laser unit 101 is in a conducting state.

[0047] It should be noted that this embodiment does not limit the specific method of aging test of laser device 100. In one possible implementation, the multi-channel conversion circuit 201 in this embodiment only provides a current signal to the corresponding laser unit 101 so that the laser unit 101 emits light and heats up, thereby collecting the corresponding aging parameters to realize aging measurement.

[0048] Please refer to Figure 7 , Figure 7This is another schematic diagram of the laser aging test device in the embodiment of this application. The laser aging test device 102 also includes a test module 207, which is connected to each laser unit 101.

[0049] When the high-speed drive chip is turned off, the test module 207 is used to collect the aging parameters of each laser unit 101 in the on state, so as to complete the aging test of the laser device 100 based on the aging parameters.

[0050] In this embodiment, the state corresponding to the high-speed drive chip being turned off is equivalent to the state when the drive signal of the laser device is cut off. In one possible implementation, this embodiment turns off the high-speed drive chip by cutting off the drive signal of the laser device. After the high-speed drive chip is turned off, the corresponding laser units are turned on through the conversion channels of the multi-channel conversion circuit for aging testing.

[0051] Please refer to Figure 8 , Figure 8 This is another schematic diagram of the laser aging test device in an embodiment of the present application. When the laser aging test device 102 includes a display module 208, the test module 207 is also connected to the display module 208.

[0052] When the aging parameters include power change values, for any laser unit, the test module 207 is also used to send a first signal to the display module 208 when the power change value of the current laser unit is lower than the preset power drop parameter, so as to drive the display module to show that the corresponding laser unit is in a normal state.

[0053] Similar to the previous embodiment, the test module 207 is also used to send a second signal to the display module when the power change value of the current laser unit exceeds the preset power drop parameter, so as to drive the display module to show that the corresponding laser unit is in an abnormal state.

[0054] It should be noted that in this embodiment, the first signal can be a high-level signal, thereby driving the display module to show that the corresponding laser unit is in a normal state. Correspondingly, in this embodiment, the second signal can be a low-level signal.

[0055] In this embodiment, anomaly detection can be performed by comparing the difference in power values ​​before and after the change in each laser unit. In one possible implementation, the power change value can be characterized by a power attenuation percentage. Correspondingly, the preset power drop parameter can be set to a fixed attenuation percentage value, such as 10%.

[0056] Based on this, if the attenuation percentage of the current laser unit is less than 10%, it is determined that the current laser unit is in a normal state and can send a first signal to the display module to show that the current laser unit is in a normal state; if the attenuation percentage of the current laser unit exceeds 10%, it is determined that the current laser unit is in an abnormal state and can send a second signal to the display module to show that the current laser unit is in an abnormal state.

[0057] Following the same approach as the previous embodiment, this application also provides a laser aging test system, which includes the laser aging test device described above.

[0058] In summary, the laser aging test apparatus of this application includes a multi-channel conversion circuit, which comprises multiple conversion channels, each corresponding to a laser unit. Each conversion channel is connected to the laser unit via a corresponding high-speed signal transmission line. When the laser device is in a non-operating state, the multi-channel conversion circuit transmits current signals to the corresponding laser unit through each conversion channel, thereby turning on the corresponding laser unit to complete the aging test of the laser device.

[0059] Based on this, the laser aging test device provided in this application can effectively control the power consumption of the module during aging, so as to facilitate the temperature control during aging, thereby overcoming the technical problem of low accuracy of aging temperature control in the prior art.

[0060] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this utility model.

Claims

1. A laser aging test apparatus, applied to a laser device, the laser device comprising multiple laser units, each laser unit corresponding to a high-speed signal transmission line for receiving a driving signal through the high-speed signal transmission line, characterized in that, The laser aging test device includes: a multi-channel conversion circuit, which includes multiple conversion channels, each conversion channel corresponding to a laser unit, and each conversion channel is connected to the laser unit through a corresponding high-speed signal transmission line; When the laser device is in a non-operating state, the multi-channel conversion circuit is used to transmit current signals to the corresponding laser units through each conversion channel, thereby turning on the corresponding laser units to complete the aging test of the laser device; the non-operating state is used to characterize the state when the driving signal of the laser device is cut off.

2. The laser aging test apparatus according to claim 1, characterized in that, The laser aging test device also includes a control module, the multi-channel conversion circuit includes a digital-to-analog conversion circuit, and the control module is connected to the input terminal of each of the conversion channels; When the laser device is in a non-operating state, for any conversion channel, the conversion channel is used to receive and convert the digital signal sent by the control module into the current signal, and transmit the current signal to the corresponding laser unit to turn on the corresponding laser unit, so as to complete the aging test of the laser device.

3. The laser aging test apparatus according to claim 2, characterized in that, When the laser aging test device includes a human-machine interaction module, the human-machine interaction module is connected to the control module. The human-machine interaction module is used to send interaction commands to the control module, so that the control module adjusts the digital signals according to the interaction commands.

4. The laser aging test apparatus according to claim 1, characterized in that, The laser device also includes a high-speed driving chip. When each output pin of the high-speed driving chip is connected to a laser unit through a high-speed signal transmission line, the laser aging test device includes a carrier PCB board. The high-speed driving chip, the multi-channel conversion circuit, and each of the laser units are all mounted on the carrier PCB board. Each conversion channel of the multi-channel conversion circuit is connected to a high-speed signal transmission line via metal bonding wires.

5. The laser aging test apparatus according to claim 4, characterized in that, The carrier PCB board also includes a GND solder pad, and each of the laser units is connected to the GND solder pad via metal bonding wires.

6. The laser aging test apparatus according to claim 4, characterized in that, The laser aging test device further includes a test module, which is connected to each of the laser units. When the high-speed drive chip is turned off, the test module is used to collect the aging parameters of each laser unit in the on state, so as to complete the aging test of the laser device based on the aging parameters.

7. The laser aging test apparatus according to claim 6, characterized in that, When the laser aging test device includes a display module, the test module is also connected to the display module; When the aging parameters include power change values, for any laser unit, the test module is further configured to send a first signal to the display module when the power change value of the current laser unit is lower than a preset power drop parameter, so as to drive the display module to show that the corresponding laser unit is in a normal state.

8. The laser aging test apparatus according to claim 1, characterized in that, When the laser device includes four laser units, the multi-channel conversion circuit includes four conversion channels, each of which is connected to a high-speed signal transmission line via a metal bonding wire to connect to the corresponding laser unit.

9. A laser aging test system, characterized in that, The laser aging test system includes the laser aging test apparatus according to any one of claims 1 to 8.

10. A laser device, characterized in that, The laser device includes multiple laser units and the laser aging test device according to any one of claims 1 to 8, wherein each laser unit corresponds to a high-speed signal transmission line, and the laser aging test device is connected to the corresponding laser unit through the high-speed signal transmission line.

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