Chip pin contact detection assembly and integrated circuit testing apparatus

CN224861725UActive Publication Date: 2026-10-16SHANGHAI XINMO MICROELECTRONICS CO LTD
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Patent Information

Application Number
CN202522226762.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-10-22
Publication Date
2026-10-16
Estimated Expiration
2035-10-22

AI Technical Summary

Technical Problem

[0004]本实用新型的目的是为了解决现有技术中存在部分检测设备定位精度低,拆装繁琐,且按压结构兼容性差且压力控制不佳,同时其不便进行芯片的取片,易损伤芯片等缺点,而提出的一种芯片引脚接触检测组件及集成电路测试设备

Benefits of technology

[0012]本申请中,在芯片引脚接触检测组件的使用过程中,检测机构通过安装板放置在支撑座的安装槽内,固定组件中的限位杆在扭簧作用下抵接检测座一侧,限位杆底部的垫块与安装板顶部滑动配合,从而限制安装板在安装槽内的垂直移动。安装板的定位槽与定位柱配合,可辅助完成安装板的放置定位。

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Abstract

The utility model relates to integrated circuit test technical field, concretely is a kind of chip pin contact detection subassembly and integrated circuit test equipment. The component includes support seat, replaceable detection mechanism, fixed component, pressing assembly and ejector assembly. Detection mechanism is placed in the mounting groove of support seat by mounting plate. Fixed component includes limit rod with torsion spring, and its end is equipped with cushion block. Pressing assembly includes rotating rod, connecting rod and lift rod with first spring, and lift rod bottom end is equipped with pressing plate. Ejector assembly includes ejector rod and second spring, and ejector rod bottom end is equipped with second abutting block with inclined surface, and it is cooperated with the first abutting block on the bottom end of rotating rod lever, can link when rotating pressing assembly ejector rod, chip is ejected from detection groove. The structure improves the dismounting and positioning efficiency, enhances the pressing adaptability, and realizes the automatic ejection of chip after detection, helps to improve test accuracy and operation convenience.
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Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing technology, and in particular to a chip pin contact detection component and integrated circuit testing equipment. Background Technology

[0002] In the integrated circuit manufacturing and testing process, chip pin contact detection is a crucial step in ensuring the effectiveness of chip functionality. Dedicated detection components are needed to achieve stable contact between the chip pins and the detection electrodes to obtain accurate detection data. However, currently available chip pin contact detection components suffer from several inconveniences in practical applications: Firstly, the assembly and positioning accuracy of the testing mechanism and the support base is low, and the fixing structure relies heavily on fasteners such as bolts. When it is necessary to replace the testing mechanism with a suitable one for different specifications of chips, the disassembly and assembly process is cumbersome and consumes a lot of time. Secondly, the pressing structure used to ensure contact between the chip and the detection electrode is mostly only compatible with chips of a single specification. If chips of different sizes or thicknesses are to be tested, the corresponding pressing component needs to be replaced, resulting in poor compatibility. Furthermore, improper pressure control in some pressing structures can easily lead to insufficient contact between the chip pins, affecting the accuracy of the test results. Third, after the test is completed, the chip usually needs to be manually removed from the test slot. This is not only inconvenient and inefficient, but manual contact may also damage the chip pins or contaminate them with impurities, further affecting the subsequent use of the chip.

[0003] To address the aforementioned issues, this utility model document proposes a chip pin contact detection component and an integrated circuit testing device. Utility Model Content

[0004] The purpose of this invention is to address the shortcomings of existing testing equipment, such as low positioning accuracy, cumbersome disassembly and assembly, poor compatibility of the pressing structure and poor pressure control, inconvenience in chip removal, and easy damage to the chip. Therefore, this invention proposes a chip pin contact detection component and integrated circuit testing equipment.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: A chip pin contact detection component, comprising: The support base has a mounting groove on its top and grooves on both sides of the mounting groove. The testing mechanism includes a mounting plate and a testing seat. The mounting plate is disposed in a mounting groove, and the testing seat is fixedly installed on the top of the mounting plate. A testing groove is opened on the top of the testing seat, and a connecting electrode is disposed in the testing groove. Two sets of fixing components are used to stably place the mounting plate in the mounting slot; The pressing component is used to make the chip body in stable contact with the connection electrode in the detection slot; An ejection assembly is used to eject the chip body from the detection slot after the detection is completed; The mounting plate has positioning grooves at two corners, and a positioning post is fixedly embedded in the top of the support base. The positioning grooves and positioning posts cooperate to achieve rapid positioning of the mounting plate.

[0006] In one possible design, the fixing assembly includes a positioning post fixedly embedded in the top of the support base, a fixing post fixedly mounted on the top of the positioning post, a limiting rod rotatably sleeved on the outer wall of the fixing post, a torsion spring sleeved on the outer wall of the fixing post, one end of the torsion spring being fixedly connected to the top of the limiting rod, and the other end of the torsion spring being fixedly connected to the outer wall of the fixing post; the end of the limiting rod away from the fixing post abuts against one side of the detection base, and a pad is fixedly mounted on the bottom end of the limiting rod away from the fixing post; the pad slides in engagement with the top of the mounting plate to restrict the movement of the mounting plate within the mounting groove.

[0007] In one possible design, the pressing assembly includes a rotating rod that rotatably passes through the top of the support base. A connecting rod is rotatably sleeved on the outer wall of the rotating rod. A fixing ring is fixedly installed at the other end of the connecting rod. A lifting rod slides through the inside of the fixing ring. A pressing plate is fixedly installed at the bottom end of the lifting rod. The pressing plate abuts against the top of the chip body. A first spring is sleeved on the outer wall of the lifting rod. One end of the first spring is fixedly connected to the top of the pressing plate, and the other end of the first spring is fixedly connected to the bottom of the fixing ring, so that the pressing plate can adapt to chip bodies of different sizes and apply stable pressure through the elastic force of the first spring.

[0008] In one possible design, the ejection assembly includes an ejection rod that slides through the top of the support base. Both the mounting plate and the detection base have through holes. The top end of the ejection rod slides through the through holes, passing through the mounting plate and the detection base and extending into the detection slot. A fixing plate is fixedly installed at the bottom end of the ejection rod. A second spring is sleeved on the outer wall of the ejection rod. One end of the second spring is fixedly connected to the bottom of the support base, and the other end is fixedly connected to the top of the fixing plate. A lever is fixedly installed at the bottom end of the rotating rod. A first abutment block is fixedly installed at the top end of the lever away from the rotating rod. A second abutment block is fixedly installed at the bottom of the fixing plate. The first and second abutment blocks are at the same horizontal height. Inclined surfaces are provided on both sides of the first and second abutment blocks. When the rotating rod rotates, the first and second abutment blocks interact through the inclined surfaces, pushing the ejection rod upward to eject the chip body.

[0009] In one possible design, a fixing rod is fixedly installed on the top of the lever, a limiting block is fixedly installed on the top of the fixing rod, and an arc-shaped bracket is fixedly installed on the bottom of the support base. A limiting groove is formed inside the arc-shaped bracket, and the limiting block slides with the inner wall of the limiting groove to limit the rotation range of the lever.

[0010] In one possible design, the top of the limiting rod has a mounting hole with two annular grooves inside. A pin slides through the mounting hole, and the bottom end of the pin passes through the mounting hole, passes through the limiting rod, and extends below the limiting rod. Four rubber protrusions are fixedly installed on the outer wall of the pin. The four rubber protrusions are paired up and engage with the two annular grooves to position the pin in its raised or lowered state. When the pin falls, its bottom end abuts against the side wall of the support base to maintain the open state of the limiting rod.

[0011] An integrated circuit testing device includes: a chip pin contact detection component as described in any one of the preceding claims.

[0012] In this application, during the use of the chip pin contact detection assembly, the detection mechanism is placed in the mounting groove of the support base via a mounting plate. A limiting rod in the fixing assembly abuts against one side of the detection base under the action of a torsion spring. A pad at the bottom of the limiting rod slides against the top of the mounting plate, thereby restricting the vertical movement of the mounting plate within the mounting groove. The positioning groove of the mounting plate cooperates with the positioning post to assist in placing and positioning the mounting plate.

[0013] The chip body is placed in the detection slot of the detection holder, with the connecting electrodes corresponding to the chip pins. The interface on the connection panel is used to connect external data cables for transmitting detection signals. The pressing assembly moves the connecting rod via the rotation of the rotating rod, adjusting the position of the fixing ring until the pressing plate moves above the chip body. Under the elastic force of the first spring, it drives the lifting rod to slide within the fixing ring, thereby pressing the pressing plate downwards onto the top of the chip body, ensuring full contact between the chip pins and the connecting electrodes. The elasticity of the first spring and the sliding mechanism of the lifting rod allow the pressing assembly to accommodate chips of various sizes.

[0014] After testing, the user can rotate the pressing component to move the pressing plate above the chip body. At this time, the rotating rod can drive the lever at its bottom to rotate synchronously. When the rotating rod rotates 45°, the first abutment block on the lever can contact the second abutment block at the bottom of the fixing plate. The inclined surfaces of the first and second abutment blocks interact, thereby pushing the fixing plate upward. The ejector rod can simultaneously overcome the elastic force of the second spring and rise, passing through the through hole and extending into the testing slot to eject the chip body, facilitating the removal of the tested chip body.

[0015] When users need to test chip bodies of different specifications, the testing mechanism can be replaced accordingly. Simply move the two limit levers away from the top of the mounting plate. After the limit levers move, pressing the pin will extend its bottom end, and the pin engages with the annular groove in the mounting hole via a rubber protrusion, thus achieving positioning during lifting or lowering. When the pin extends and falls, the limit levers, under the return action of the torsion spring, can abut against the side wall of the support base, thereby maintaining the open state of the limit levers.

[0016] Beneficial effects: In this utility model, the chip pin contact detection component and integrated circuit testing equipment, when the detection mechanism is placed in the mounting groove of the support base via the mounting plate, the positioning groove of the mounting plate and the positioning post of the support base cooperate with each other to quickly and accurately position the detection mechanism; the limiting rod in the fixing component can automatically abut against one side of the detection base under the action of the torsion spring, and the pad at the bottom of the limiting rod slides against the top of the mounting plate, so that the detection mechanism can be stably fixed without additional fasteners; when the detection mechanism needs to be replaced, simply move the limiting rod away from the top of the mounting plate, and then maintain the open state of the limiting rod by the abutment of the pin against the side wall of the support base, without the need for continuous manual fixing of the limiting rod, greatly simplifying the disassembly and assembly process of the detection mechanism and reducing labor time consumption; In this invention, a chip pin contact detection component and integrated circuit testing equipment are described. The lifting rod in the pressing component can slide within the fixed ring. Combined with the elastic pressure of the first spring, it can provide a continuous and appropriate pressing force to the top of the chip, ensuring full contact between the chip pin and the connection electrode in the detection slot, thus avoiding detection errors caused by poor contact. Furthermore, it can automatically adjust the height of the pressing plate according to the thickness of chips of different specifications, adapting to chips of various sizes without replacing the pressing components. This improves the versatility of the detection component and reduces the operating cost of the testing equipment. In this invention, a chip pin contact detection component and integrated circuit testing equipment are provided. The ejector component and the pressing component are linked. After the test is completed, the rotating rod of the pressing component is rotated, causing the pressing plate to move out of the chip. At the same time, the lever at the bottom of the rotating rod rotates synchronously. The first abutting block on the lever interacts with the second abutting block at the bottom of the fixed plate through the inclined surface, which can push the ejector rod to rise against the elastic force of the second spring, automatically ejecting the chip from the test slot. The chip can be quickly removed without manually picking up the chip, which avoids damage to the chip pins that may be caused by manual removal, reduces operation steps, and improves testing efficiency. In the static state, the second spring can pull the ejector rod to reset, ensuring that the top of the ejector rod does not extend into the test slot and does not affect the normal placement and testing of the chip. In this invention, the device achieves rapid and accurate positioning of the detection mechanism through the cooperation of the positioning groove and the positioning column. The limiting rod and pad structure ensure the stable fixation of the detection mechanism. The pressing component can adapt to chips of different thicknesses to ensure reliable pin contact. The ejection mechanism is linked with the pressing component, and the chip can be quickly ejected after detection to avoid damage caused by manual handling, effectively improving detection efficiency and ease of operation. Attached Figure Description

[0017] Figure 1 This is a three-dimensional structural schematic diagram of a chip pin contact detection component and integrated circuit testing equipment proposed in this utility model. Figure 2 This is a schematic diagram of the detection mechanism structure of a chip pin contact detection component and integrated circuit testing equipment proposed in this utility model; Figure 3 This is a schematic diagram of the pressing component structure of a chip pin contact detection component and an integrated circuit testing equipment proposed in this utility model; Figure 4 This is a schematic diagram of the fixed component structure of a chip pin contact detection component and an integrated circuit testing equipment proposed in this utility model; Figure 5 This is a schematic diagram of a limiting rod structure for a chip pin contact detection component and an integrated circuit testing equipment proposed in this utility model; Figure 6 This is a schematic diagram of the ejector assembly structure of a chip pin contact detection component and an integrated circuit testing equipment proposed in this utility model.

[0018] In the diagram: 1. Support base; 2. Mounting plate; 3. Detection base; 4. Chip body; 5. Detection groove; 6. Connecting panel; 7. Positioning groove; 8. Through hole; 9. Rotating rod; 10. Connecting rod; 11. Fixing ring; 12. Lifting rod; 13. Pressing plate; 14. First spring; 15. Mounting groove; 16. Positioning post; 17. Fixing post; 18. Torsion spring; 19. Limiting rod; 20. Groove; 21. Ejector rod; 22. Pad; 23. Mounting hole; 24. Annular groove; 25. Pin; 26. Rubber protrusion; 27. Toggle lever; 28. Fixing rod; 29. ​​Limiting block; 30. Arc-shaped bracket; 31. Limiting groove; 32. First abutment block; 33. Fixing plate; 34. Second spring; 35. Second abutment block. Detailed Implementation

[0019] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0020] In one embodiment: Refer to Figure 1-6A detection component for achieving stable contact detection between four pins of a chip body and detection electrodes, comprising: a support base 1, a detection mechanism, two sets of fixing components, a pressing component, and an ejecting component. In this embodiment, a mounting groove 15 is formed on the top of the support base 1, and grooves 20 are formed on both sides of the mounting groove 15. The mounting groove 15 is used to install the detection mechanism. The detection mechanism consists of a mounting plate 2 and a detection base 3. The mounting plate 2 is placed in the mounting groove 15, and the detection base 3 is fixed on the top of the mounting plate 2. A detection groove 5 is formed on the top of the detection base 3, and corresponding connection electrodes are set in the detection groove 5. The chip body 4 is placed in the detection groove 5, and the pin contact detection is completed through the connection electrodes.

[0021] In this embodiment, two sets of fixing components correspond to the two sides of the detection seat 3, respectively, and are used to stably fix the mounting plate 2 in the mounting groove 15. The positioning post 16 in the fixing component is fixedly embedded in the top of the support seat 1, and the fixing post 17 is fixedly installed on the top of the positioning post 16. The limiting rod 19 is rotatably sleeved on the outer wall of the fixing post 17. The outer wall of the fixing post 17 is also sleeved with a torsion spring 18. One end of the torsion spring 18 is fixedly connected to the top of the limiting rod 19 through a spring seat, and the other end is fixedly connected to the outer wall of the fixing post 17 through a spring seat. The end of the limiting rod 19 away from the fixing post 17 abuts against one side of the detection seat 3, and the bottom end of the limiting rod 19 away from the fixing post 17 is fixedly installed with a pad 22. The pad 22 slides with the top of the mounting plate 2. Under the elastic force of the torsion spring 18, the limiting rod 19 applies downward pressure to the mounting plate 2 through the pad 22, thereby restricting the movement of the mounting plate 2 in the mounting groove 15. A mounting hole 23 is provided at the top of the limiting rod 19. Two annular grooves 24 are provided inside the mounting hole 23. The pin 25 slides through the mounting hole 23, and the bottom end of the pin 25 extends through the limiting rod 19 to the bottom of the limiting rod 19. Four rubber protrusions 26 are fixedly installed on the outer wall of the pin 25. The four rubber protrusions 26 are paired up and respectively engage with the two annular grooves 24. When it is necessary to open the limiting rod 19 to remove the mounting plate 2, pull the pin 25 upward so that the lower pair of rubber protrusions 26 engage in the upper annular groove 24. At this time, the bottom end of the pin 25 is away from the support base 1. After rotating the limiting rod 19 to the open state, push the pin 25 downward so that the bottom end of the pin 25 abuts against the side wall of the support base 1, and the lower pair of rubber protrusions 26 engage in the lower annular groove 24, thus maintaining the open state of the limiting rod 19.

[0022] In this embodiment, the pressing assembly is used to press the chip body 4 firmly into the detection groove 5, ensuring stable contact between the pins of the chip body 4 and the connecting electrode. The rotating rod 9 rotates through the top of the support base 1, and the connecting rod 10 is rotatably sleeved on the outer wall of the rotating rod 9. A fixing ring 11 is fixedly installed at the other end of the connecting rod 10. The lifting rod 12 slides through the inside of the fixing ring 11, and a pressing plate 13 is fixedly installed at the bottom of the lifting rod 12, contacting the top of the chip body 4. A first spring 14 is sleeved on the outer wall of the lifting rod 12. One end of the first spring 14 is fixedly connected to the top of the pressing plate 13 via a spring seat, and the other end is fixedly connected to the bottom of the fixing ring 11 via a spring seat. Rotating the connecting rod 10 moves the pressing plate 13 above the chip body 4. The elastic force of the first spring 14 pushes the pressing plate 13 downward to press the chip body 4. Simultaneously, because the lifting rod 12 can slide within the fixing ring 11, even if the chip body 4 has different specifications, the pressing plate 13 can adapt to different heights of the chip body 4 under the action of the first spring 14, always maintaining stable pressing.

[0023] In this embodiment, the ejection assembly is used to eject the chip body 4 from the detection slot 5 after the test is completed, facilitating the removal of the chip body 4. The ejection rod 21 slides through the top of the support base 1. Both the mounting plate 2 and the detection base 3 have through holes 8. The top end of the ejection rod 21 slides through the through holes 8 through the mounting plate 2 and the detection base 3 and extends into the detection slot 5. The bottom end of the ejection rod 21 is fixedly mounted with a fixing plate 33. A second spring 34 is sleeved on the outer wall of the ejection rod 21. One end of the second spring 34 is fixedly connected to the bottom of the support base 1 through a spring seat, and the other end is fixedly connected to the top of the fixing plate 33 through a spring seat. In the static state, the thrust of the second spring 34 causes the fixing plate 33 to push the ejection rod 21 downward, ensuring that the top end of the ejection rod 21 does not extend into the detection slot 5, thus avoiding affecting the placement of the chip body 4.

[0024] In this embodiment, a lever 27 is fixedly installed at the bottom of the rotating rod 9. A first abutment block 32 is fixedly installed at the top end of the lever 27 away from the rotating rod 9. A second abutment block 35 is fixedly installed at the bottom of the fixing plate 33. The first abutment block 32 and the second abutment block 35 are at the same horizontal height, and both have inclined surfaces on both sides. A fixing rod 28 is fixedly installed at the top of the lever 27. A limiting block 29 is fixedly installed at the top of the fixing rod 28. An arc-shaped bracket 30 is fixedly installed at the bottom of the support base 1. A limiting groove 31 is opened inside the arc-shaped bracket 30, and the limiting block 29 slides in cooperation with the inner wall of the limiting groove 31. After the test is completed, the rotating rod 9 is rotated, which drives the lever 27 to rotate. The limiting block 29 slides in the limiting groove 31 to ensure that the lever 27 rotates stably. During the rotation of lever 27, the first abutment block 32 moves with lever 27 and contacts the second abutment block 35. Their inclined surfaces cooperate. As lever 27 continues to rotate, the first abutment block 32 pushes the second abutment block 35 upwards. The second abutment block 35 then drives the fixing plate 33 and the ejector rod 21 upwards, compressing the second spring 34. When the tip of the ejector rod 21 extends into the detection groove 5 and pushes the chip body 4 upwards, the chip body 4 can be ejected from the detection groove 5 for easy removal. After removing the chip body 4, rotating lever 9 reverses the direction of rotation. The first abutment block 32 separates from the second abutment block 35, the second spring 34 returns to its original state, and then pushes the fixing plate 33 and the ejector rod 21 downwards. The tip of the ejector rod 21 returns to its initial position and no longer extends into the detection groove 5.

[0025] This application can be used in the field of integrated circuit testing technology, or in other fields applicable to this application.

[0026] In another embodiment: Reference Figure 1 , 2 4. A chip pin contact detection component and integrated circuit testing equipment, which are applied to the field of integrated circuit testing technology; In this embodiment, positioning grooves 7 are provided at two corners of the mounting plate 2. The two positioning grooves 7 respectively cooperate with the outer wall of the corresponding positioning post 16. When the mounting plate 2 is placed into the mounting groove 15, the positioning post 16 is embedded in the positioning groove 7, realizing the rapid positioning of the mounting plate 2 and ensuring the accurate installation position of the detection seat 3.

[0027] In this embodiment, a connection panel 6 is fixedly installed on one side of the detection base 3. Multiple interfaces are provided on the connection panel 6. External data cables are connected to the connection electrodes in the detection slot 5 through these interfaces to realize the transmission and processing of detection signals.

[0028] In this embodiment, the integrated circuit testing equipment includes any of the above-mentioned chip pin contact detection components. By using this detection component to detect the contact status of the integrated circuit chip pins, it can ensure that the pins of the integrated circuit chip are stably connected to the detection circuit during the testing process, thereby improving the accuracy and efficiency of the test.

[0029] The working principle and usage process of this technical solution are as follows: During the use of the chip pin contact detection component, the detection mechanism is placed in the mounting groove 15 of the support base 1 via the mounting plate 2. The limiting rod 19 in the fixing component abuts against one side of the detection base 3 under the action of the torsion spring 18. The pad 22 at the bottom of the limiting rod 19 slides with the top of the mounting plate 2, thereby restricting the vertical movement of the mounting plate 2 within the mounting groove 15. The positioning groove 7 of the mounting plate 2 cooperates with the positioning post 16 to assist in the placement and positioning of the mounting plate 2.

[0030] The chip body 4 is placed in the detection slot 5 of the detection base 3, with the connecting electrodes corresponding to the chip pins. The interface on the connecting panel 6 is used to connect external data cables and can transmit detection signals. The pressing assembly moves the connecting rod 10 by rotating the rotating rod 9, and the fixing ring 11 adjusts its position accordingly until the pressing plate 13 moves above the chip body 4. Under the elastic force of the first spring 14, it can drive the lifting rod 12 to slide within the fixing ring 11, thereby causing the pressing plate 13 to press down on the top of the chip body 4, ensuring that the chip pins are in full contact with the connecting electrodes. The elasticity of the first spring 14 and the sliding setting of the lifting rod 12 allow the pressing assembly to adapt to chips of various specifications.

[0031] After the test is completed, the user can rotate the pressing component to move the pressing plate 13 above the chip body 4. At this time, the rotating rod 9 can drive the lever 27 at its bottom to rotate synchronously. When the rotating rod 9 rotates 45°, the first abutting block 32 on the lever 27 can contact the second abutting block 35 at the bottom of the fixing plate 33. The inclined surfaces of the first abutting block 32 and the second abutting block 35 interact with each other, thereby pushing the fixing plate 33 to move upward. The ejector rod 21 can simultaneously overcome the elastic force of the second spring 34 and rise, passing through the through hole 8 and extending into the test groove 5 to eject the chip body 4, which can facilitate the removal of the tested chip body 4.

[0032] When users need to test chip bodies 4 of different specifications, the testing mechanism can be replaced accordingly. In this case, simply move the two limiting rods 19 away from the top of the mounting plate 2. After the limiting rods 19 move, pressing the pin 25 will extend its bottom end, and the pin 25 will engage with the annular groove 24 in the mounting hole 23 via the rubber protrusion 26, thus achieving its positioning when raised or lowered. When the pin 25 extends and falls, it can abut against the side wall of the support base 1 under the return action of the torsion spring 18, thereby maintaining the open state of the limiting rods 19.

[0033] The accompanying drawings in this application are for illustrative purposes only. The dimensions and shapes of the components shown are not actual limitations but are merely schematic representations. In actual implementation, the components can be reasonably configured and adjusted according to specific needs and actual conditions.

[0034] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. A chip pin contact detection component, characterized in that, include: The support base (1) has an installation groove (15) on its top and grooves (20) on both sides of the installation groove (15). The testing mechanism includes a mounting plate (2) and a testing seat (3). The mounting plate (2) is disposed in a mounting groove (15). The testing seat (3) is fixedly installed on the top of the mounting plate (2). A testing groove (5) is opened on the top of the testing seat (3). A connecting electrode is disposed in the testing groove (5). Two sets of fixing components are used to stably place the mounting plate (2) in the mounting slot (15); The pressing component is used to make the chip body (4) make stable contact with the connection electrode in the detection groove (5); An ejection assembly is used to eject the chip body (4) from the detection slot (5) after the detection is completed; The mounting plate (2) has positioning grooves (7) at two corners, and the top of the support base (1) is fixedly embedded with positioning posts (16). The positioning grooves (7) and positioning posts (16) cooperate to achieve rapid positioning of the mounting plate (2).

2. The chip pin contact detection component according to claim 1, characterized in that, The fixing assembly includes a positioning post (16) fixedly embedded in the top of the support base (1), a fixing post (17) fixedly installed on the top of the positioning post (16), a limiting rod (19) rotatably sleeved on the outer wall of the fixing post (17), a torsion spring (18) sleeved on the outer wall of the fixing post (17), one end of the torsion spring (18) fixedly connected to the top of the limiting rod (19), and the other end of the torsion spring (18) fixedly connected to the outer wall of the fixing post (17); the end of the limiting rod (19) away from the fixing post (17) abuts against one side of the detection seat (3), and a pad (22) is fixedly installed on the bottom of the limiting rod (19) away from the fixing post (17). The pad (22) slides with the top of the mounting plate (2) to restrict the movement of the mounting plate (2) in the mounting groove (15).

3. The chip pin contact detection component according to claim 1, characterized in that, The pressing assembly includes a rotating rod (9) that rotates through the top of the support base (1). A connecting rod (10) is rotatably sleeved on the outer wall of the rotating rod (9). A fixing ring (11) is fixedly installed at the other end of the connecting rod (10). A lifting rod (12) slides through the inside of the fixing ring (11). A pressing plate (13) is fixedly installed at the bottom end of the lifting rod (12). The pressing plate (13) abuts against the top of the chip body (4). A first spring (14) is sleeved on the outer wall of the lifting rod (12). One end of the first spring (14) is fixedly connected to the top of the pressing plate (13). The other end of the first spring (14) is fixedly connected to the bottom of the fixing ring (11). The pressing plate (13) is adapted to different specifications of chip bodies (4) and applies stable pressure through the elastic force of the first spring (14).

4. The chip pin contact detection component according to claim 3, characterized in that, The ejection assembly includes an ejection rod (21) that slides through the top of the support base (1). Both the mounting plate (2) and the detection seat (3) have through holes (8). The top end of the ejection rod (21) slides through the through holes (8) through the mounting plate (2) and the detection seat (3) and extends into the detection groove (5). A fixing plate (33) is fixedly installed at the bottom end of the ejection rod (21). A second spring (34) is sleeved on the outer wall of the ejection rod (21). One end of the second spring (34) is fixedly connected to the bottom of the support base (1), and the other end of the second spring (34) is fixedly connected to the top of the fixing plate (33). The bottom end of the rotating rod (9) is fixedly equipped with a lever (27), and the top end of the lever (27) away from the rotating rod (9) is fixedly equipped with a first abutting block (32). The bottom of the fixed plate (33) is fixedly equipped with a second abutting block (35). The first abutting block (32) and the second abutting block (35) are at the same horizontal height. Both sides of the first abutting block (32) and the second abutting block (35) are provided with inclined surfaces. When the rotating rod (9) rotates, the first abutting block (32) and the second abutting block (35) interact through the inclined surfaces to push the ejector rod (21) up to eject the chip body (4).

5. A chip pin contact detection component according to claim 4, characterized in that, A fixed rod (28) is fixedly installed on the top of the lever (27), and a limiting block (29) is fixedly installed on the top of the fixed rod (28). An arc-shaped bracket (30) is fixedly installed on the bottom of the support base (1). A limiting groove (31) is opened inside the arc-shaped bracket (30). The limiting block (29) slides with the inner wall of the limiting groove (31) to limit the rotation range of the lever (27).

6. A chip pin contact detection component according to claim 2, characterized in that, The top of the limiting rod (19) is provided with a mounting hole (23). The mounting hole (23) has two annular grooves (24) inside. A pin (25) slides through the mounting hole (23). The bottom end of the pin (25) passes through the mounting hole (23) through the limiting rod (19) and extends to the bottom of the limiting rod (19). Four rubber protrusions (26) are fixedly installed on the outer wall of the pin (25). The four rubber protrusions (26) are paired up and engaged with the two annular grooves (24) respectively to position the pin (25) in the raised or lowered state. When the pin (25) falls, its bottom end abuts against the side wall of the support base (1) to maintain the open state of the limiting rod (19).

7. A chip pin contact detection component according to claim 1, characterized in that, The mounting plate (2) has positioning grooves (7) at two corners. Both positioning grooves (7) are matched with the outer wall of the corresponding positioning post (16) to position the mounting plate (2) during installation.

8. A chip pin contact detection assembly according to claim 1, characterized in that, A connection panel (6) is fixedly installed on one side of the detection base (3). The connection panel (6) has multiple interfaces for connecting external data cables.

9. An integrated circuit testing device, characterized in that, include: A chip pin contact detection component according to any one of claims 1-8.