A sample placement assist jig for a spectrophotometer

Abstract

The utility model discloses a kind of sample placement auxiliary jigs for spectrophotometer, including sample placing platform, the both sides of sample placing platform are provided with positioning hole, for connecting spectrophotometer, the extension platform is externally extended to the sample placing platform, extension platform can be stretched horizontally relative to sample placing platform, the length of extension sample placing platform is expanded, and the upper end of sample placing platform is vertically provided with positioning baffle, and the positioning baffle is provided with light hole.The utility model increases the extension platform, significantly increases the length range of sample placement area, so that it is possible to measure long size sample, widen the application range of spectrophotometer, and it is strong in versatility;Jig is tightly matched with original platform by base, and in combination with positioning baffle and light hole, can ensure that sample is accurately positioned in optical path, ensure the accuracy and reliability of measured data;Overall structure is stable, anti-skid design effectively prevents sliding and overturning, protects the safety of instrument and sample.

Description

Technical Field

[0001] This utility model relates to the field of analytical instrument auxiliary equipment technology, and in particular to a sample placement auxiliary fixture for a spectrophotometer. Background Technology

[0002] A spectrophotometer is an instrument that uses the absorption characteristics of substances to light of specific wavelengths for quantitative or qualitative analysis. The sample chamber of a conventional spectrophotometer typically contains a standard-sized sample platform for placing cuvettes or small samples, such as... Figure 1 As shown.

[0003] However, in practical applications, it is often necessary to measure rod-shaped, strip-shaped, or specially shaped samples that exceed the dimensions of the standard sample platform, such as long glass strips, plastic rods, special test tubes, or certain customized long rod-shaped components. Due to the limited length of the standard sample platform, these long samples cannot be placed stably in the optical path, or the portion to be measured cannot be accurately covered by the optical path, resulting in measurement failure or inaccurate measurement results.

[0004] Currently, operators often use temporary and unstable methods, such as placing books or foam blocks under the samples, but these methods have the following obvious drawbacks: The inability to guarantee height and levelness leads to a shift in the optical path of the sample, non-parallel measurement optical paths, and introduces huge errors.

[0005] Poor stability: The sample is prone to rolling or sliding and cannot be accurately positioned.

[0006] Low safety: Unstable support may cause the sample to fall, damaging expensive sample chambers or optical components.

[0007] Unreproducible and unstandardized: Inconsistent conditions in each measurement lead to unreliable experimental results and a lack of reproducibility.

[0008] Therefore, there is an urgent need for a dedicated auxiliary fixture that can safely, stably, and accurately extend the length of the spectrophotometer sample platform. Utility Model Content

[0009] To solve the above-mentioned technical problems, this utility model designs an auxiliary fixture for sample placement in a spectrophotometer.

[0010] The present invention adopts the following technical solution: A sample placement auxiliary fixture for a spectrophotometer includes a placement platform with positioning holes on both sides for connecting to the spectrophotometer. An extension platform extends outward from the placement platform and can be horizontally stretched relative to the placement platform to expand its length. A positioning baffle is vertically installed at the upper end of the placement platform, and a light-transmitting hole is provided on the positioning baffle.

[0011] Preferably, a tension guide column is fixedly connected to the extension platform, and a guide groove is correspondingly provided on the layout platform. The extension platform extends the length of the layout platform by translating along the guide groove on the layout platform through the tension guide column.

[0012] Preferably, the surface of the layout platform is provided with an anti-slip layer.

[0013] Preferably, the anti-slip layer is a silicone layer.

[0014] Preferably, a tension handle is fixedly connected to the extension platform.

[0015] Preferably, a level is provided on the surface of the layout platform.

[0016] Preferably, the layout platform is made of black POM through CNC precision machining, with the machining accuracy required to be controlled within ±0.05mm, and the surface of the layout platform is required to be smooth and burr-free.

[0017] Preferably, the positioning hole is an oval hole.

[0018] The beneficial effects of this utility model are: (1) By adding an extension platform, the length range of the sample placement area is significantly increased, making it possible to measure long-sized samples, broadening the application range of the spectrophotometer, and making it highly versatile; (2) The fixture is closely matched with the original platform through the base, and combined with the positioning baffle and the light-transmitting hole, it can ensure that the sample is accurately positioned in the optical path, ensuring the accuracy and reliability of the measurement data; (3) The overall structure is stable, and the anti-slip design effectively prevents sliding and tipping, protecting the safety of the instrument and the sample; (4) The structure is simple, the manufacturing process is not complicated, the cost is low, and it is easy to popularize and apply in the laboratory. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of a sample placement auxiliary fixture for an existing spectrophotometer; Figure 2 This is a schematic diagram of the structure of this utility model; Figure 3 This is a diagram showing one usage state of this utility model; Figure 4 This is a diagram showing an actual usage state of this utility model; In the figure: 1. Layout platform, 2. Extension platform, 3. Positioning baffle, 4. Light transmission hole, 5. Positioning hole, 6. Guide groove, 7. Tension guide post, 8. Sample to be tested. Detailed Implementation

[0020] The technical solution of this utility model will be further described in detail below through specific embodiments and with reference to the accompanying drawings: Example: Figures 2-3 As shown, a sample placement auxiliary fixture for a spectrophotometer includes a placement platform 1, with positioning holes 5 on both sides of the placement platform for connecting to the spectrophotometer. An extension platform 2 extends outward from the placement platform and can be horizontally stretched relative to the placement platform to expand the length of the placement platform. A positioning baffle 3 is vertically arranged at the upper end of the placement platform, and a light-transmitting hole 4 is opened on the positioning baffle.

[0021] A tension guide column 7 is fixedly connected to the extension platform, and a guide groove 6 is correspondingly provided on the layout platform. The extension platform moves along the guide groove on the layout platform through the tension guide column to extend the length of the layout platform.

[0022] The surface of the layout platform is covered with an anti-slip layer. The anti-slip layer is made of silicone. A tension handle is fixedly connected to the extension platform. A level is installed on the surface of the layout platform.

[0023] The layout platform is made of black POM through CNC precision machining, with a machining accuracy required to be controlled within ±0.05mm. The surface of the layout platform must be smooth and burr-free. The positioning holes are oval holes.

[0024] like Figure 4 As shown, when using this utility model, the sample placement auxiliary fixture for the spectrophotometer is placed into the spectrophotometer and fixed according to the positioning hole. Then, the sample 8 to be tested is taken out and gently placed on the placement platform according to the position for observation to determine whether its length exceeds the placement platform. The excess part is placed by adjusting the extension platform to ensure that the sample to be tested is placed horizontally and flat. When placing the sample to be tested, the end is placed close to the positioning baffle, and the detection surface of the sample to be tested is aligned with the light transmission hole.

[0025] The embodiments described above are merely preferred solutions of this utility model and are not intended to limit this utility model in any way. Other variations and modifications are possible without departing from the technical solutions described in the claims.

Claims

1. A sample placement auxiliary fixture for a spectrophotometer, comprising a placement platform, wherein positioning holes are provided on both sides of the placement platform for connecting the spectrophotometer, characterized in that, An extension platform is provided outside the layout platform. The extension platform can be stretched horizontally relative to the layout platform to expand the length of the layout platform. A positioning baffle is vertically provided at the upper end of the layout platform, and a light-transmitting hole is provided on the positioning baffle.

2. The sample placement auxiliary fixture for a spectrophotometer according to claim 1, characterized in that, The extension platform is fixedly connected to a tension guide column, and the layout platform is provided with a corresponding guide groove. The extension platform moves along the guide groove on the layout platform through the tension guide column to extend the length of the layout platform.

3. The sample placement auxiliary fixture for a spectrophotometer according to claim 1, characterized in that, The surface of the layout platform is provided with an anti-slip layer.

4. A sample placement auxiliary fixture for a spectrophotometer according to claim 3, characterized in that, The anti-slip layer is a silicone layer.

5. A sample placement auxiliary fixture for a spectrophotometer according to claim 1, characterized in that, A tension handle is fixedly connected to the extension platform.

6. A sample placement auxiliary fixture for a spectrophotometer according to claim 1, characterized in that, A level is installed on the surface of the layout platform.

7. A sample placement auxiliary fixture for a spectrophotometer according to claim 1, characterized in that, The layout platform is made of black POM through CNC precision machining, with the machining accuracy required to be controlled within ±0.05mm, and the surface of the layout platform is required to be smooth and burr-free.

8. A sample placement auxiliary fixture for a spectrophotometer according to claim 1, characterized in that, The positioning hole is an oval hole.

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