Flip test fixture for patch filters

CN224873634UActive Publication Date: 2026-10-20CHENGDU HONGMING ELECTRONICS CO LTD
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Patent Information

Application Number
CN202522289260.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-10-29
Publication Date
2026-10-20
Estimated Expiration
2035-10-29

AI Technical Summary

Technical Problem

这种贴片滤波器在完成加工后需要对其性能进行测试,传统的测试方式多采用将测试仪器的测试信号线与贴片滤波器的贴片焊接或人工将测试信号线按压在贴片上的方式进行,这些传统测试方式存在如下缺陷:采用焊接方式,测试完解焊后会在贴片上留下残锡,影响产品外观,所以只能在研发阶段使用,不能用于出厂前测试,而且测试效率低下;采用人工按压方式,易在按压时出现接触不良的现象,不利于测试完整性,且多个测试端口需要同时引出信号时较难操作,需要频繁调整测试设备,增加测试成本和时间,而且易在贴片上留下压痕,会对产品后期的焊接过程留下隐患,同时也存在测试效率低下的问题

Benefits of technology

本实用新型通过在测试底座上安装测试盖板、限位柱和下卡扣并设置安装内腔,在安装内腔内安装测试台,在测试台上设置工件内腔,在测试盖板上安装测试板和上卡扣,在测试板上安装金属柱,在金属柱上安装金属针,最终实现将待测试的贴片滤波器即工件安装在测试底座上,将测试盖板旋转下压即可实现将工件的贴片信号引出的功能,不需要焊接贴片和测试信号线,避免了焊接产生残锡、影响美观的问题,同时避免了人工按压测试信号线存在的接触不良、难以操作、留下压痕的问题,操作简单方便,提高了测试效率。

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Abstract

The utility model discloses a kind of flip type test tool for patch filter, including test base, further including test cover, the test base is equipped with workpiece inner cavity on the upper middle part test table, one end of test cover is rotatably connected with one end of test base, the other end middle part of test base is equipped with lower buckle, the upper surface of test base is equipped with limit post, the middle part of test cover is equipped with test plate, multiple metal columns are installed on test plate, the lower end of metal column is equipped with metal needle, metal column is equipped with inner cavity and the inner cavity is equipped with compression spring for making metal needle away from metal column, the other end middle part of test cover is equipped with upper buckle.The utility model rotates test cover and presses down, the function of the patch signal of workpiece can be realized to lead out, avoid the problem that residual tin is generated during welding, affect the problem of appearance, avoid the problem of poor contact, difficult to operate, leave the problem of indentation existing in artificial pressing test signal line simultaneously, it is easy to operate, improve test efficiency.
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Description

Technical Field

[0001] This utility model relates to a testing fixture for patch filters, and more particularly to a flip-type testing fixture for patch filters. Background Technology

[0002] Electronic component testing is an important part of the product design process. The basic method of electronic product testing is to use various methods to extract the signals from the test points of electronic components and read them with specific testing instruments to determine whether the electronic components are working properly.

[0003] A patch filter is a type of filter that uses patches as signal output terminals. (Reference) Figure 1 The patch 10 of the surface mount filter 9 is located on one side surface of the housing, and the filter core is encapsulated in epoxy resin inside. After the surface mount filter is manufactured, its performance needs to be tested. Traditional testing methods often involve soldering the test signal lines of the test instrument to the patch of the surface mount filter or manually pressing the test signal lines onto the patch. These traditional testing methods have the following drawbacks: When using soldering, residual solder will be left on the patch after desoldering, affecting the product appearance. Therefore, it can only be used in the R&D stage and cannot be used for pre-shipment testing. Moreover, the testing efficiency is low. When using manual pressing, poor contact is prone to occur during pressing, which is not conducive to the integrity of the test. It is also difficult to operate when multiple test ports need to output signals at the same time. Frequent adjustments to the test equipment are required, increasing the testing cost and time. Indentations are also prone to be left on the patch, which may cause hidden dangers in the later soldering process. In addition, the testing efficiency is low. Utility Model Content

[0004] The purpose of this invention is to provide a flip-type test fixture for patch filters that is easy to operate, does not damage the product, and has high testing efficiency in order to solve the above problems.

[0005] This utility model achieves the above objectives through the following technical solutions: A flip-type testing fixture for surface mount filters includes a test base and a test cover. The test base has an open-top mounting cavity in its upper center for mounting workpieces. A test platform is mounted within the mounting cavity, and the test platform has an open-top workpiece cavity for mounting workpieces. One end of the test cover is rotatably connected to one end of the test base. The other end of the test base has a lower latch in its center. A limiting post is located on the upper surface of the test base between the mounting cavity and the lower latch. The test cover plate has a through hole in the middle and a test plate is installed in the through hole. Multiple metal pillars are installed on the test plate. The upper end of each metal pillar is connected to a test signal line. A metal needle that cannot be detached from the metal pillar is installed at the lower end of each metal pillar. Each metal pillar has an inner cavity and a compression spring is installed in the inner cavity to keep the metal needle away from the metal pillar. The multiple metal needles are located directly above the inner cavity of the workpiece. The other end of the test cover plate has an upper buckle in the middle. When the test cover plate is rotated downwards, the upper buckle can connect with the lower buckle.

[0006] Preferably, to facilitate the engagement and disengagement of the upper and lower buckles under external force, both the upper and lower buckles are L-shaped buckles with beveled surfaces, and the upper and lower buckles can be automatically engaged through the beveled surfaces. The test base has a buckle cavity corresponding to the lower buckle, and a tension spring is installed in the buckle cavity. The lower end of the lower buckle is installed in the buckle cavity and connected to one end of the tension spring.

[0007] Preferably, to facilitate operation of the lower buckle, an unhooking handle is provided at the end of the lower buckle away from the tension spring.

[0008] Preferably, to facilitate the processing and assembly of the metal column and the metal needle, the lower end of the metal needle is a pointed tip, and the upper end has an increased outer diameter to form a convex ring. The convex ring is placed inside the inner cavity of the metal column and contacts the lower end of the compression spring. The lower end cavity wall of the metal column is bent inward to form a retaining ring to prevent the convex ring from detaching from the inner cavity of the metal column.

[0009] Preferably, in order to achieve a reliable buffering function when the test cover plate contacts the upper end of the limiting post, the limiting post has an inner cavity with an upper opening and the inner cavity is filled with vibration damping foam. The upper end of the vibration damping foam is higher than the upper end of the limiting post. There are two limiting posts, which are located on both sides of the lower buckle.

[0010] The beneficial effects of this utility model are as follows: This invention involves installing a test cover plate, limiting posts, and a lower buckle on a test base, and setting an installation cavity. A test stage is installed inside the installation cavity, and a workpiece cavity is set on the test stage. A test plate and an upper buckle are installed on the test cover plate, and metal posts are installed on the test plate. Metal pins are installed on the metal posts. Ultimately, the surface mount filter (workpiece) to be tested is installed on the test base. Rotating and pressing down the test cover plate enables the surface mount signal of the workpiece to be brought out. There is no need to solder the surface mount and test signal lines, avoiding the problems of residual solder and affecting the appearance caused by soldering. At the same time, it avoids the problems of poor contact, difficulty in operation, and leaving indentations caused by manually pressing the test signal lines. The operation is simple and convenient, and the testing efficiency is improved. Attached Figure Description

[0011] Figure 1 This is a partial sectional perspective view of the flip-type test fixture for patch filters described in this utility model; Figure 2 This is a front sectional view of the metal pillars and metal pins of the flip-type test fixture for patch filters described in this utility model. Detailed Implementation

[0012] The present invention will be further described below with reference to the accompanying drawings: like Figure 1 and Figure 2 As shown, the flip-type test fixture for patch filters of this utility model includes a test base 1 and a test cover 13. The test base 1 has an installation cavity (not marked in the figure) with an open top for mounting workpieces in the middle of its upper surface. A test platform 8 is installed inside the installation cavity. The test platform 8 has a workpiece cavity (not marked in the figure) with an open top for mounting workpieces. One end of the test cover 13 is rotatably connected to one end of the test base 1 via a hinge 15. A lower latch 5 is provided in the middle of the other end of the test base 1. A limiting post 4 is provided on the upper surface of the test base 1 at a position between the installation cavity and the lower latch 5. A through hole is provided in the middle of the test cover 13, and a test plate 12 is installed in the through hole. Multiple metal pillars 14 are installed on the test plate 12. The upper end of the metal pillar 14 (the upper end here is based on the premise that the test plate 12 and the test cover plate 13 are both in the horizontal position, that is, when they are fastened to the test base 1; the same applies to the lower end of the metal pillar 14 below) is connected to the test signal line (not visible in the figure). The lower end of the metal pillar 14 is equipped with a metal needle 19 that cannot be detached from the metal pillar 14. The metal pillar 14 has an inner cavity and a compression spring 16 for moving the metal needle 19 away from the metal pillar 14 is installed in the inner cavity. Multiple metal needles 19 are located directly above the inner cavity of the workpiece. The other end of the test cover plate 13 is provided with an upper buckle 33 in the middle. When the test cover plate 13 is rotated downward, the upper buckle 33 can be connected to the lower buckle 5.

[0013] like Figure 1As shown, this utility model also discloses the following more optimized specific structures: To facilitate the engagement and disengagement of the upper buckle 11 and lower buckle 5 under external force, both the upper buckle 11 and lower buckle 5 are L-shaped buckles with beveled surfaces. The upper buckle 11 and lower buckle 5 can be automatically engaged through the beveled surfaces. The test base 1 has a buckle cavity 7 at the position corresponding to the lower buckle 5. A tension spring 6 is installed in the buckle cavity 7. The lower end of the lower buckle 5 is installed in the buckle cavity 7 and connected to one end of the tension spring 6.

[0014] To facilitate operation of the lower buckle 5, an unhooking handle 2 is provided at the end of the lower buckle 5 away from the tension spring 6.

[0015] To facilitate the processing and assembly of the metal column 14 and the metal needle 19, the lower end of the metal needle 19 is a pointed tip, and the outer diameter of the upper end is increased to form a convex ring 17. The convex ring 17 is placed in the inner cavity of the metal column 14 and contacts the lower end of the compression spring 16. The lower end cavity wall of the metal column 14 is bent inward to form a retaining ring 18 to prevent the convex ring 17 from detaching from the inner cavity of the metal column 14.

[0016] In order to achieve a reliable buffering function when the test cover 13 contacts the upper end of the limiting post 4, the limiting post 4 is provided with an inner cavity with an upper opening and the inner cavity is filled with vibration damping foam 3. The upper end of the vibration damping foam 3 is higher than the upper end of the limiting post 4. There are two limiting posts 4, which are located on both sides of the lower buckle 5 respectively.

[0017] like Figure 1 As shown, during application, first connect the test signal line to the test instrument (not shown in the figure), then rotate the test cover 13 upwards to open it. Figure 1 As shown, the patch filter 9 to be tested, i.e., the workpiece, is placed inside the workpiece cavity of the test bench 8. Then, the test cover 13 is rotated downwards until the upper latch 11 and the lower latch 5 automatically engage and interlock. The upper latch 11 and the lower latch 5 maintain a stable connection under the action of the tension spring 6, and the bottom of the test cover 13 and the upper end of the limiting post 4 are in close contact through the vibration damping foam 3 to reliably support the test cover 13. The test cover 13 and the test base 1 are in a closed state. At this time, the patches 10 of the patch filter 9 are connected to the test instrument through the corresponding metal pins 19 and metal posts 14. In this way, the relevant data of the patch filter 9 can be read by the test instrument to determine whether the working status of the patch filter 9 is normal, thus achieving the test purpose. Note: The closed structure between the test cover 13 and the test base 1 is not shown in the figure, but according to Figure 1 Easy to understand.

[0018] After the test is completed, press the release handle 2 on the lower buckle 5 by hand. The upper end of the lower buckle 5 will rotate outward against the tension of the tension spring 6. Under the slight elasticity of the damping foam 3, the upper buckle 11 will separate from the lower buckle 5 as the test cover plate 13 moves upward. Continue to rotate and move the test cover plate 13 upward to open the test cover plate 13. Then remove the patch filter 9 that has been tested and put the next patch filter 9 to be tested into the inner cavity of the workpiece. Repeat the above process to complete the testing of all the patch filters 9 to be tested.

[0019] The above embodiments are merely preferred embodiments of this utility model and are not intended to limit the technical solutions of this utility model. Any technical solution that can be implemented based on the above embodiments without creative effort should be considered to fall within the scope of protection of this utility model patent.

Claims

1. A flip-type test fixture for patch filters, comprising a test base, characterized in that: The test base also includes a test cover plate. The test base has an upper-opening mounting cavity in its upper center. A test platform is installed within the mounting cavity. The test platform has a workpiece cavity with an upper opening for mounting the workpiece. One end of the test cover plate is rotatably connected to one end of the test base. The other end of the test base has a lower latch in its center. A limiting post is located on the upper part of the test base between the mounting cavity and the lower latch. The test cover plate has a through hole in its center, and a test plate is installed in this through hole. Multiple metal posts are installed on the test plate. The upper end of each metal post is connected to a test signal line. A metal pin that cannot detach from the metal post is installed at the lower end of each metal post. Each metal post has an inner cavity, and a compression spring is installed within this cavity to keep the metal pin away from the metal post. The multiple metal pins are located directly above the workpiece cavity. The other end of the test cover plate has an upper latch in its center. When the test cover plate is rotated downwards, the upper latch can connect with the lower latch.

2. The flip-type test fixture for patch filters according to claim 1, characterized in that: Both the upper and lower buckles are L-shaped buckles with beveled surfaces, and the upper and lower buckles can be automatically fastened together through the beveled surfaces. The test base has a buckle cavity at the position corresponding to the lower buckle, and a tension spring is installed in the buckle cavity. The lower end of the lower buckle is installed in the buckle cavity and connected to one end of the tension spring.

3. The flip-type test fixture for patch filters according to claim 2, characterized in that: The lower buckle is provided with an unfastening handle at the end away from the tension spring.

4. The flip-type test fixture for patch filters according to any one of claims 1-3, characterized in that: The lower end of the metal needle is a pointed tip, and the upper end has an increased outer diameter to form a convex ring. The convex ring is placed inside the inner cavity of the metal column and contacts the lower end of the compression spring. The lower end cavity wall of the metal column is bent inward to form a retaining ring to prevent the convex ring from detaching from the inner cavity of the metal column.

5. The flip-type test fixture for patch filters according to any one of claims 1-3, characterized in that: The limiting post has an inner cavity with an upper opening and is filled with vibration damping foam. The upper end of the vibration damping foam is higher than the upper end of the limiting post. There are two limiting posts, which are located on both sides of the lower buckle.