A device for detecting the form and position tolerances of a component

Abstract

The present disclosure relates to the field of part detection, and particularly relates to a kind of part shape and position tolerance detection device, the detection device includes: pedestal, for the bottom of the part to be measured is fixed, so that the bottom of the part to be measured axis is located at predetermined position;Light source, above the part to be measured;Scale is located below pedestal, scale is shown with multiple different radius concentric circles and multiple angle lines, angle line is marked with scale;When detecting the shape and position tolerance of the part to be measured, the bottom axis of the part to be measured is located on the line connecting the center of scale and the optical axis of light source, light source irradiates the projection of the part to be measured on scale, based on the scale on the concentric circle and the scale marked on multiple angle lines, the shape information and position information of projection are measured, so as to determine the shape and position tolerance of the upper and lower parts of the part to be measured based on the shape information and position information of projection.The technical scheme can accurately detect the shape and position tolerance of large parts simply and efficiently.

Description

Technical Field

[0001] This disclosure relates to the field of component inspection, specifically to a device for inspecting the form and position tolerances of components. Background Technology

[0002] Form and position tolerances (FMTs) of components are key indicators controlling the geometric characteristics of components. Their accuracy directly affects the functionality and assembly relationships of components, making FMT inspection a core aspect of component inspection. Currently, FMTs of some small components can be measured using micrometers, dividing heads, or even coordinate measuring machines (CMMs). However, for larger components, there are currently no good inspection methods. For example, large CMMs could be purchased, but these are not only expensive but also complex in terms of operation and tooling fabrication. Therefore, a simple, efficient, and accurate inspection method is urgently needed. Utility Model Content

[0003] To address the problems in the related technologies, this disclosure provides a device for detecting the form and position tolerances of components.

[0004] In a first aspect, this disclosure provides a device for detecting the form and position tolerances of components, comprising: A base is used to fix the bottom of the component to be tested, so that the bottom axis of the component to be tested is located in a predetermined position; A light source is positioned above the component under test via a supporting structure; A scale is located below the base. The scale displays multiple concentric circles of different radii and multiple angle lines, with graduations marked on the angle lines. In the process of detecting the form and position tolerance of the component under test, the bottom axis of the component under test is located on the line connecting the center of the scale and the optical axis of the light source. The light source illuminates the component under test and forms a projection on the scale. The shape and position information of the projection are measured based on the concentric circles and the scale markings on multiple angle lines on the scale, so as to determine the form and position tolerance of the upper and lower parts of the component under test based on the shape and position information of the projection.

[0005] In one possible implementation, a stop plate is provided on the base, which is used to limit the bottom axis of the component to be tested to the predetermined position.

[0006] In one possible implementation, a clamp is provided on the base; The fixture includes multiple adjustable sliders, and the positions of the multiple sliders are adjusted synchronously using the indexing principle to clamp the component to be tested.

[0007] In one possible implementation, the base is provided with a pose adjustment component, which includes a height adjustment component and / or a rotation component; The height adjustment component is used to adjust the height of the component to be tested; The rotating component is used to drive the component under test to rotate around the bottom axis of the component under test.

[0008] In one possible implementation, the support structure further includes a light source height adjustment component; The light source height adjustment component is used to adjust the height of the light source.

[0009] In one possible implementation, the light source includes a light source with variable focus size or a point light source.

[0010] In one possible implementation, the scale includes four angle lines, wherein each angle line is at a 90-degree angle with the adjacent angle line.

[0011] In one possible implementation, the detection device further includes: A camera is used to capture the projection on the scale to obtain a projected image. The processing device is communicatively connected to the imaging device and is used to calculate the form and position tolerances of the upper and lower parts of the component under test based on the projected image captured by the imaging device. The form and position tolerances include parallelism and coaxiality.

[0012] According to the technical solution provided in this embodiment, the detection device includes a base, a light source, and a scale. Its structure is simple. When detecting a component to be tested, it is only necessary to fix the bottom axis of the component in a predetermined position, so that the bottom axis of the component is located on the line connecting the center of the scale and the optical axis of the light source. When the light source directly above illuminates the component and projects a projection onto the scale, the form and position tolerances (mainly parallelism and coaxiality) of the upper and lower parts of the component can be determined based on the shape and position of the projection detected by the scale. The operation is simple. Furthermore, existing coordinate measuring machines (CMMs) are significantly affected by high points during detection if there are any high points. The detection device provided in this embodiment is not affected by local high points, avoiding inaccurate measurements caused by local high points. Moreover, for more precise form and position tolerance measurements, the projection resolution can be improved, such as by adding photosensitive fixtures to the component, making the projection effect more obvious, clear, and accurate, thereby improving the accuracy of the detection results.

[0013] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0014] Figure 1 This diagram illustrates the structure of a component form and position tolerance detection device provided in an embodiment of the present disclosure.

[0015] Figure 2 A schematic diagram of a scale provided in an embodiment of this disclosure is shown.

[0016] Figure 3 This diagram illustrates a test schematic of a component to be tested according to an embodiment of the present disclosure.

[0017] Figure 4 This diagram illustrates another test component provided in an embodiment of the present disclosure.

[0018] Figure 5 This diagram illustrates another test component provided in an embodiment of the present disclosure.

[0019] Figure 6A This diagram illustrates a portion of the process for calculating the parallelism deviation when the upper and lower parts of a component under test are not parallel, according to an embodiment of this disclosure.

[0020] Figure 6B This diagram illustrates another part of the process for calculating the parallelism deviation when the upper and lower parts of a component under test are not parallel, according to an embodiment of this disclosure.

[0021] Figure 7 This diagram illustrates the structure of a base provided in an embodiment of the present disclosure.

[0022] Figure 8 The flowchart illustrates a method for detecting the form and position tolerances of a component according to an embodiment of this disclosure. Detailed Implementation

[0023] In the following, exemplary embodiments of the present disclosure will be described in detail with reference to the accompanying drawings to enable those skilled in the art to readily implement them. Furthermore, for clarity, portions unrelated to the description of exemplary embodiments have been omitted from the drawings.

[0024] In this disclosure, it should be understood that terms such as “comprising” or “having” are intended to indicate the presence of features, figures, steps, behaviors, components, parts or combinations thereof disclosed in this specification, and are not intended to exclude the possibility of the presence or addition of one or more other features, figures, steps, behaviors, components, parts or combinations thereof.

[0025] It should also be noted that, unless otherwise specified, the embodiments and features described in this disclosure can be combined with each other. This disclosure will now be described in detail with reference to the accompanying drawings and embodiments.

[0026] Figure 1 This diagram illustrates the structure of a component form and position tolerance detection device according to an embodiment of the present disclosure. Figure 1 As shown, the detection device includes: a base 11, a light source 12, and a scale 13.

[0027] like Figure 1 As shown, the base 11 is used to fix the component 10 to be tested. When testing the component 10, it needs to be securely fixed to the base 11 to prevent light and shadow fluctuations caused by instability. Simultaneously, the bottom axis of the component 10 needs to be positioned at a predetermined location. The light source 12 is positioned above the component 10 via a support structure (not shown in the figure). The light 121 emitted by the light source 12 illuminates the component 10 fixed on the base 11 to form a projection. A scale 13 is located below the base 11. The scale 13 displays multiple concentric circles of different radii and multiple angle lines, with graduations marked on the angle lines. For example... Figure 2 The diagram illustrates a scale provided in an embodiment of this disclosure, such as... Figure 2 As shown, scale 13 displays four angle lines. Of course, in other embodiments, there may be six, eight, or other angle lines; this is not a limitation. Figure 2 As shown, the scale unit on this angle line is cm. The scale on this angle line can indicate the distance between concentric circles. In this way, the shape information of the projection on the scale 13 can be measured by combining the concentric circles with these angle lines. In some possible embodiments, in order to distinguish each angle line, it can be marked with the angle represented by each angle line. In order to better distinguish each concentric circle, different marks can also be used to identify each concentric circle, such as using numbers to mark the concentric circles. It should be noted that the scale 13 can be a separate component, or it can be detachably installed as an integral part with the base 11 or directly fixed together; there is no limitation here.

[0028] The testing device provided in this embodiment mainly detects components that require their upper and lower parts to be parallel and coaxial, such as components with a rotating structure. This testing device can detect whether there are form and position tolerances in the upper and lower parts of these components. These form and position tolerances mainly refer to parallelism and coaxiality. When detecting the form and position tolerances of the component under test, the bottom axis of the component needs to be located on the line connecting the center of the scale 13 and the optical axis of the light source 12. After this placement, if the upper and lower parts of the component under test are parallel and coaxial, the projection of the component on the scale 13 will be a perfect circle concentric with the concentric circles on the scale 13. If the upper and lower parts of the component under test are not parallel and / or not coaxial, the projection of the component on the scale 13 will not be a perfect circle concentric with the concentric circles on the scale 13.

[0029] Example, Figure 3 This diagram illustrates a testing schematic of a component under test according to an embodiment of the present disclosure, such as... Figure 3 As shown, the upper and lower parts of the component under test are parallel and coaxial. The center of the scale 13 of the testing device is located on the optical axis of the light source 12 of the testing device. When the component under test is fixed in the predetermined position on the base 11, the bottom axis of the component under test will be located on the line connecting the center of the scale 13 and the optical axis of the light source 12. After placing the component under test in this way, the component under test will be... Figure 3 Under the illumination of light source 12 shown in the left image, it will be as follows: Figure 3 As shown in the right figure, a perfect circle concentric with the concentric circle on scale 13 is projected onto scale 13.

[0030] Figure 4 This illustration shows another detection diagram of a component to be tested according to an embodiment of this disclosure, such as... Figure 4 As shown, the upper and lower parts of the component under test are parallel but not coaxial. The center of the scale 13 of the testing device is located on the optical axis of the light source 12 of the testing device. When the component under test is fixed in the predetermined position on the base 11, the bottom axis of the component under test will be located on the line connecting the center of the scale 13 and the optical axis of the light source 12. After placing the component under test in this way, the component under test will be... Figure 4 Under the illumination of light source 12 shown in the left image, it will be as follows: Figure 4As shown in the right figure, a perfect circle with a different center than the concentric circles on scale 13 is projected onto scale 13. The deviation distance between the center of the projected circle and the center of the concentric circles on scale 13 can be measured based on the scale markings on the angle lines of scale 13. Specifically, the intersection point of the projection and the 0° angle line can be selected as a reference point. The projection intersection points at 90°, 180°, and 270° angle lines can be found. The deviation distance between the center of the projected circle and the center of the concentric circles on scale 13 can be measured based on the scale markings corresponding to these four intersection points. Simultaneously, the ratio between the projection and the actual dimensions of the upper part of the component needs to be obtained. Then, based on this deviation distance and this ratio, the axial deviation of the upper and lower parts can be calculated.

[0031] Figure 5 This illustration shows another detection diagram of a component to be tested according to an embodiment of this disclosure, such as... Figure 5 As shown, the upper and lower parts of the component under test are not parallel but coaxial. The center of the scale 13 of the testing device is located on the optical axis of the light source 12 of the testing device. When the component under test is fixed in the predetermined position on the base 11, the bottom axis of the component under test will be located on the line connecting the center of the scale 13 and the optical axis of the light source 12. After placing the component under test in this way, the component under test will be... Figure 5 Under the illumination of light source 12 shown in the left image, it will be as follows: Figure 5 The right figure shows a non-circular symmetrical shape projected onto scale 13. This can also be determined based on... Figure 5 The projection shape and position shown in the right figure determine the parallelism deviation of the component under test. Figure 6A This diagram illustrates a portion of the process for calculating the parallelism deviation when the upper and lower parts of a component under test are not parallel, according to an embodiment of this disclosure. Figure 6B This diagram illustrates another part of the parallelism deviation calculation process for a test component whose upper and lower parts are not parallel, according to an embodiment of this disclosure. The specific calculation process for this parallelism deviation can be found in [reference needed]. Figure 6A and Figure 6B , Figure 6A In the diagram, triangle △ABO represents the projection of the part to be measured, with its upper and lower parts parallel and coaxial, while triangle △AB'O represents the projection of the part, with its top and bottom parts not parallel but coaxial. These projections can be obtained through actual measurement. Figure 6A Given S1, S2, H1 (center height of the part), H2, and X2 (radius of the upper part of the part to be measured), X1 can be calculated using the principle of triangle similarity, i.e., X1 / S1 = X2 / S2; similarly, in... Figure 6B The triangles △Ab'O' and △bb'c shown also have a similar relationship, where △H=H2-H1 and △X=X1-X2. According to the principle of triangle similarity, i.e., d / △H=△X / X2, the horizontal deviation of the radius of the part to be measured can be obtained as d, and the actual value of the parallelism deviation is 2d.

[0032] The detection device provided in this embodiment includes a base, a light source, and a scale. Its structure is simple. When detecting a component, it is only necessary to fix the bottom axis of the component in a predetermined position, ensuring that the bottom axis of the component lies on the line connecting the center of the scale and the optical axis of the light source. The light source, positioned directly above, illuminates the component, projecting it onto the scale. The shape and position tolerances (mainly parallelism and coaxiality) of the upper and lower parts of the component can then be determined based on the shape and position of the projection detected by the scale. The operation is simple. Furthermore, existing coordinate measuring machines are susceptible to problems if there are high points in the monitoring area, which significantly affects the detection results. The detection device provided in this embodiment is not affected by local high points, avoiding inaccurate measurements caused by them. Moreover, for more precise form and position tolerance measurements, the projection resolution can be improved, such as by adding photosensitive fixtures to the component, making the projection effect more obvious, clear, and accurate, thus resulting in more accurate detection results.

[0033] In one possible implementation, Figure 7 This diagram illustrates a structural schematic of a base provided in an embodiment of the present disclosure, as shown below. Figure 7 As shown, a stop plate is provided on the base, which is used to limit the bottom axis of the component to be tested to the predetermined position.

[0034] In this embodiment, the base can be of different shapes such as circular or square. If it is a regular axisymmetric shape, the axis of the stop platform can be set on the axis of the base. At the same time, the optical axis of the light source and the center of the scale are fixed on the axis of the base. In this way, the stop platform limits the bottom axis of the part to be measured to the axis of the base (i.e., the predetermined position), which can ensure that the bottom axis of the part to be measured is located on the line connecting the center of the scale and the optical axis of the light source.

[0035] Of course, in other embodiments, the base may be irregular in shape. In this case, after setting the stop platform, the optical axis of the light source and the center of the scale can be fixed on the central axis of the stop platform. In this way, the stop platform can limit the bottom axis of the part to be measured on the central axis of the stop platform, ensuring that the bottom axis of the part to be measured is located on the line connecting the center of the scale and the optical axis of the light source.

[0036] In one possible implementation, such as Figure 7 As shown, a clamp is provided on the base, and the clamp includes multiple adjustable sliders. Figure 7 As shown, there are 3 sliders. The positions of multiple sliders can be adjusted synchronously using the indexing principle to clamp the part to be tested. This fixture can be adjusted manually or automatically.

[0037] The detection device component provided in this embodiment can detect large devices, as well as achieve batch and rapid detection of small parts. It only requires adjusting the position of the clamps on the base to fix the parts to be tested of different sizes, saving time such as programming of coordinate measuring machines.

[0038] In one possible implementation, the base is provided with a posture adjustment component, which includes a height adjustment component and / or a rotation component.

[0039] In this embodiment, the pose adjustment component can adjust the position and / or posture of the part to be measured that is fixed by the fixture. The pose adjustment component can be adjusted manually or automatically.

[0040] In this embodiment, the height adjustment component is used to adjust the height of the component to be tested. During the testing of the component to be tested, the height of the component to be tested can be adjusted by the height adjustment component so that the projected size of the component to be tested is appropriate and can be displayed on the scale for measurement.

[0041] In this embodiment, the rotating component is used to drive the component under test to rotate around its bottom axis. During the testing of the component under test, any position on the scale can be selected as a reference point (preferably a point on an angle line), marked, and the light source kept stationary. The component under test is rotated, and the change in the projection of the reference point (magnitude and direction of change) after one rotation is recorded. Based on this projection change, the form and position tolerance values ​​of the upper and lower parts of the component under test, i.e., the axis deviation and parallelism deviation, are calculated. If the upper and lower parts of the component under test are parallel and coaxial, the projection of the reference point remains unchanged. If the upper and lower parts of the component under test are parallel but not coaxial, or if the upper and lower parts of the component under test are not parallel but coaxial, the projection of the reference point changes. The form and position tolerance values ​​of the upper and lower parts of the component under test can be calculated based on this projection change. The specific calculation method can be found above. Figure 4 and Figure 5 The calculation method described above is for reference by those skilled in the art. Figure 4 and Figure 5 The calculation method described in the corresponding section is clear and will not be repeated here.

[0042] In one possible implementation, the support structure further includes a light source height adjustment component; the light source height adjustment component is used to adjust the height of the light source.

[0043] In this embodiment, during the testing of the component to be tested, the height of the light source can be adjusted by the light source height adjustment component so that the projected size of the component to be tested is appropriate and can be displayed on the scale for measurement.

[0044] It should be noted that the detection device may include only a light source height adjustment component, only a height adjustment component, or both a light source height adjustment component and a height adjustment component. The combined action of the light source height adjustment component and the height adjustment component can make the projected size of the component under test appropriate.

[0045] In one possible implementation, the light source includes a light source with variable focus size or a point light source.

[0046] In this embodiment, a variable-focus light source is an illumination device that can dynamically change the output spot size (i.e., the diameter of the focused spot or the illumination range) by adjusting the optical system or the light source itself. For example, it can be a simple searchlight or a high-precision projector. To ensure that the projected edges are clear, sharp, and the size is stable, this embodiment typically reduces the focus of the light source. Alternatively, to ensure that the projected edges are clear, sharp, and the size is stable, the light source can also be a point light source.

[0047] In one possible implementation, such as Figure 2 As shown, the scale includes four angle lines, wherein the angle between each angle line and the adjacent angle line is 90 degrees, and can be marked as 0°, 90°, 180° and 270° respectively.

[0048] Of course, in other embodiments, the scale may also have six angle lines, in which case the angle between each angle line and the adjacent angle line is 60 degrees, or the scale may also have eight angle lines, in which case the angle between each angle line and the adjacent angle line is 45 degrees, and so on.

[0049] In one possible implementation, the detection device further includes: A camera is used to capture the projection on the scale to obtain a projected image. The processing device is communicatively connected to the imaging device and is used to calculate the form and position tolerances of the upper and lower parts of the component under test based on the projected image captured by the imaging device. The form and position tolerances include parallelism and coaxiality.

[0050] In this embodiment, multiple imaging devices can be installed around the base, capable of capturing multiple projected images from different angles to ensure that all parts of the projection are captured. The processing device can communicate with the imaging devices via a wired connection or a wireless connection such as Bluetooth or WiFi. This allows the processing device to acquire the projected images captured by the imaging devices. These images display the projection and a scale, enabling the identification of intersections between the projected image and various angle lines. The corresponding scale values ​​at these intersections can be identified, and based on these values, the form and position tolerances of the upper and lower parts of the component under test can be calculated. Specific calculation methods can be found above. Figure 4 and Figure 5 The calculation method described above is for reference by those skilled in the art. Figure 4 and Figure 5 The calculation method described in the corresponding section is clear and will not be repeated here.

[0051] This disclosure also provides a method for detecting the form and position tolerances of components. Figure 8 The flowchart illustrates a method for detecting the form and position tolerances of a component according to an embodiment of this disclosure. The component to be tested is fixed on the base of the aforementioned testing device, with the bottom axis of the component positioned on the line connecting the center of the scale of the testing device and the optical axis of the light source. The light source illuminates the component to be tested, projecting it onto the scale. Figure 8 As shown, the method includes: In step S801, the projection on the scale is acquired to obtain a projected image; In step S802, based on the projected image, the form and position tolerances of the upper and lower parts of the component to be tested are calculated, and the form and position tolerances include parallelism and coaxiality.

[0052] In one possible implementation, a projection on the scale can be captured by an imaging device to obtain a projected image. Multiple imaging devices can be installed around the base to capture projection images from multiple different angles, ensuring that all parts of the projection are captured. A processing device can communicate with the imaging devices via a wired connection or a wireless connection such as Bluetooth or WiFi. This allows the processing device to acquire the projected images captured by the imaging devices, which display the projection and the scale. The intersection points of the projected image with various angle lines can be identified, and the corresponding scale values ​​can be determined. Based on these scale values, the form and position tolerances of the upper and lower parts of the measured component can be calculated. Specific calculation methods can be found above. Figure 4 and Figure 5 The calculation method described above is for reference by those skilled in the art. Figure 4 and Figure 5The calculation method described in the corresponding section is clear and will not be repeated here.

[0053] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of this disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0054] The units or modules described in the embodiments of this disclosure can be implemented in software or programmable hardware. The described units or modules can also be located in a processor, and the names of these units or modules do not necessarily constitute a limitation on the unit or module itself.

[0055] The above description is merely a preferred embodiment of this disclosure and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of the utility model involved in this disclosure is not limited to the technical solutions formed by specific combinations of the above-described technical features, but should also cover other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalent features without departing from the inventive concept. For example, technical solutions formed by substituting the above-described features with (but not limited to) technical features disclosed in this disclosure that have similar functions.

Claims

1. A device for detecting the form and position tolerances of components, characterized in that, include: A base is used to fix the bottom of the component to be tested, so that the bottom axis of the component to be tested is located in a predetermined position; A light source is positioned above the component under test via a supporting structure; A scale is located below the base. The scale displays multiple concentric circles of different radii and multiple angle lines, with graduations marked on the angle lines. In the process of detecting the form and position tolerance of the component under test, the bottom axis of the component under test is located on the line connecting the center of the scale and the optical axis of the light source. The light source illuminates the component under test and forms a projection on the scale. The shape and position information of the projection are measured based on the concentric circles and the scale markings on multiple angle lines on the scale, so as to determine the form and position tolerance of the upper and lower parts of the component under test based on the shape and position information of the projection.

2. The detection device according to claim 1, characterized in that, The base is provided with a stop plate, which is used to limit the bottom axis of the component to be tested to the predetermined position.

3. The detection device according to claim 1, characterized in that, The base is equipped with a clamp; The fixture includes multiple adjustable sliders, and the positions of the multiple sliders are adjusted synchronously using the indexing principle to clamp the component to be tested.

4. The detection device according to claim 1, characterized in that, The base is provided with a posture adjustment component, which includes a height adjustment component and / or a rotation component; The height adjustment component is used to adjust the height of the component to be tested; The rotating component is used to drive the component under test to rotate around the bottom axis of the component under test.

5. The detection device according to claim 1, characterized in that, The support structure also includes a light source height adjustment component; The light source height adjustment component is used to adjust the height of the light source.

6. The detection device according to claim 1, characterized in that, The light source includes a light source with variable focus size or a point light source.

7. The detection device according to claim 1, characterized in that, The scale includes four angle lines, wherein the angle between each angle line and the adjacent angle line is 90 degrees.

8. The detection device according to claim 1, characterized in that, The detection device further includes: A camera is used to capture the projection on the scale to obtain a projected image. The processing device is communicatively connected to the imaging device and is used to calculate the form and position tolerances of the upper and lower parts of the component under test based on the projected image captured by the imaging device. The form and position tolerances include parallelism and coaxiality.

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