A rotating observation tool for high and low temperature test of uncooled infrared detector

Abstract

The application belongs to the technical field of infrared detector equipment, and discloses a rotating observation tool for high and low temperature test of uncooled infrared detector, which has a first direction and comprises a bottom plate, a blackbody radiation source and a mounting seat; the blackbody radiation source and the mounting seat are arranged on the bottom plate in a spaced manner along the first direction; the mounting seat comprises a mounting plate, a rotating assembly and a lens mounting assembly; the mounting plate is arranged on the bottom plate; the rotating assembly is arranged on the mounting plate; the lens mounting assembly is arranged on the rotating assembly; the lens mounting assembly is electrically connected with a power supply of external equipment and a display device; the lens mounting assembly is used for mounting a chip to be tested and a lens; the rotating assembly is used for rotating the lens to face the blackbody radiation source or an observation object. The rotating observation tool has the characteristics of quickly switching between performance test and imaging observation modes, solves the problem of frequent disassembly and installation during high and low temperature test, greatly shortens the test period, and improves the production efficiency.

Description

Technical Field

[0001] This application belongs to the field of infrared detector equipment technology, and more specifically, relates to a rotating observation fixture for high and low temperature testing of uncooled infrared detectors. Background Technology

[0002] Uncooled infrared detectors must undergo rigorous environmental adaptability testing before leaving the factory. High and low temperature testing is a crucial step in verifying the stability of the detector's performance under different temperature conditions. Currently, a common testing method involves fixing the infrared detector inside a high and low temperature chamber to simulate its actual working conditions, and then using a blackbody radiation source as a standard to verify the detector's performance stability under extreme temperature environments. However, this method has a limitation: a single fixed fixture can typically only be used for performance testing or imaging testing. If it is necessary to switch to lens observation imaging tests to detect abnormalities such as dead pixels or image blurring, the infrared detector or lens must be disassembled and reinstalled. This is not only cumbersome and inefficient, but also results in a fixed viewing angle once the detector is fitted with a lens. If it is necessary to observe objects outside the high and low temperature chamber in different directions to verify the imaging effect, the position of the entire detector or the target object outside the chamber needs to be adjusted, which is very inconvenient and may affect the accuracy and continuity of the test data. Summary of the Invention

[0003] The main objective of this application is to provide a rotating observation fixture for high and low temperature testing of uncooled infrared detectors. This rotating observation fixture features rapid switching between performance testing and imaging observation modes, solving the problem of frequent disassembly and installation during high and low temperature testing, greatly shortening the testing cycle and improving production efficiency.

[0004] According to a first aspect of this application, a rotating observation fixture for high and low temperature testing of an uncooled infrared detector is provided, having a first direction, including: a base plate, a blackbody radiation source, and a mounting base; the blackbody radiation source and the mounting base are spaced apart on the base plate along the first direction;

[0005] The mounting base includes a mounting plate, a rotating assembly, and a lens mounting assembly; the mounting plate is mounted on the base plate; the rotating assembly is mounted on the mounting plate; the lens mounting assembly is mounted on the rotating assembly; the lens mounting assembly is electrically connected to the power supply and display device of the peripheral device; the lens mounting assembly is used to mount the chip to be tested and the lens; the rotating assembly is used to rotate the lens toward a blackbody radiation source or toward the object being observed.

[0006] In one particular embodiment of this application, the mounting plate is detachably mounted on the base plate, and the mounting plate is capable of horizontal movement along a first direction.

[0007] In a specific embodiment of this application, the mounting plate is provided with at least two spaced T-shaped grooves; the length direction of the T-shaped grooves extends along a first direction; the base plate is provided with a first mounting hole; the first mounting hole and the T-shaped groove correspond one-to-one; the mounting plate and the base plate are fixedly connected by fastening bolts passing through the T-shaped grooves and the first mounting holes, and the mounting plate can move horizontally along the first direction.

[0008] In a specific embodiment of this application, the rotating assembly includes a fixed plate, a rotating plate, and a connecting plate; the fixed plate is disposed on the mounting plate; the rotating plate and the fixed plate are rotatably connected; the connecting plate and the rotating plate are fixedly connected; the lens mounting assembly is disposed on the connecting plate; the rotating plate is used to drive the lens toward a blackbody radiation source or toward the object being observed.

[0009] In one particular embodiment of this application, the rotating assembly is an R-axis rotary platform with micrometer knob adjustment.

[0010] In one specific embodiment of this application, the lens mounting assembly includes a socket and a PCB board; the PCB board is disposed on the rotating assembly; the PCB board is electrically connected to the power supply of the peripheral device and the display device; the socket is disposed on the PCB board and is used to mount the chip to be tested and the lens.

[0011] In a specific embodiment of this application, the lens mounting assembly further includes a bracket; the bracket includes a support plate and extension columns; the support plate and the PCB board are arranged at intervals; there are multiple extension columns, and the two ends of the multiple extension columns are respectively connected to the support plate and the PCB board; the support plate is disposed on the rotating assembly.

[0012] In a specific embodiment of this application, the rotating assembly further includes a horizontal plate and a vertical plate; the horizontal plate is disposed on the connecting plate; one end of the vertical plate is rotatably connected to the horizontal plate; and the lens mounting assembly is disposed on the vertical plate.

[0013] One of the above-mentioned technical solutions in this application has at least one of the following advantages or beneficial effects:

[0014] This application uses a lens mounting assembly to mount the chip and lens of the infrared detector to be tested and fix them in a high and low temperature chamber. Then, by rotating the assembly, the lens is driven to face either the blackbody radiation source or the object being observed, thereby quickly switching between performance testing and imaging testing. This avoids the disadvantages of frequent disassembly and installation when switching between performance testing and imaging testing in a high and low temperature chamber, greatly shortening the testing cycle and improving production efficiency. Attached Figure Description

[0015] The present application will be further described below with reference to the accompanying drawings and embodiments;

[0016] Figure 1 This is a three-dimensional structural schematic diagram of Embodiment 1 of this application;

[0017] Figure 2 This is a side view of Embodiment 1 of this application;

[0018] Figure 3 This is a top view of the infrared detector performance test of Embodiment 1 of this application;

[0019] Figure 4 This is a top view of the infrared detector imaging of Embodiment 1 of this application;

[0020] Figure 5 This is a three-dimensional structural diagram of Embodiment 2 of this application.

[0021] The figure labels for each figure are as follows:

[0022] Base plate 1; first mounting hole 101; T-slot 102; blackbody radiation source 2; mounting base 3; mounting plate 31; rotating assembly 32; fixed plate 321; rotating plate 322; connecting plate 323; horizontal plate 324; vertical plate 325; lens mounting assembly 33; socket 331; PCB board 332; bracket 333; support plate 3331; extension column 3332; first direction A. Detailed Implementation

[0023] The embodiments of this application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0024] The following provides many different implementation methods or examples for different schemes of implementing this application.

[0025] Example 1

[0026] like Figures 1-4 As shown, a rotating observation fixture for high and low temperature testing of uncooled infrared detectors has a first direction and includes: a base plate 1, a blackbody radiation source 2, and a mounting base 3; the blackbody radiation source 2 and the mounting base 3 are spaced apart on the base plate 1 along the first direction.

[0027] Mounting base 3 includes mounting plate 31, rotating assembly 32, and lens mounting assembly 33; mounting plate 31 is mounted on base plate 1; rotating assembly 32 is mounted on mounting plate 31; lens mounting assembly 33 is mounted on rotating assembly 32; lens mounting assembly 33 is electrically connected to the power supply and display device of peripherals; lens mounting assembly 33 is used to mount the chip to be tested and the lens; rotating assembly 32 is used to rotate the lens toward the blackbody radiation source 2 or toward the object to be observed.

[0028] In this embodiment, the chip and lens of the infrared detector to be tested are mounted on the lens mounting assembly 33 and fixed in the high and low temperature chamber. Then, the lens is driven towards the blackbody radiation source 2 by the rotating assembly 32 for performance testing. When imaging testing is required, the high and low temperature chamber is opened, and the operator drives the lens towards the window of the high and low temperature chamber by rotating the assembly 32 to observe external objects and perform imaging testing by observing the external display device. This allows for quick switching between performance testing and imaging testing, avoiding the disadvantages of frequent disassembly and installation when switching between performance testing and imaging testing in the high and low temperature chamber, greatly shortening the testing cycle and improving production efficiency.

[0029] In this embodiment, the mounting plate 31 is detachably mounted on the base plate 1, and the mounting plate 31 can move horizontally along the first direction. Specifically, the mounting plate 31 has two spaced T-shaped grooves 102; the length direction of the T-shaped grooves 102 extends along the first direction; the base plate 1 has two first mounting holes 101, and the first mounting holes 101 correspond one-to-one with the T-shaped grooves 102; the mounting plate 31 and the base plate 1 are fixedly connected by fastening bolts passing through the T-shaped grooves 102 and the first mounting holes 101, and the mounting plate 31 can move horizontally along the first direction. In practical applications, when it is necessary to adjust the front and rear position of the mounting base 3, the operator can push the mounting plate 31 to the required position along the first direction by loosening the T-shaped fastening bolts, and then tighten the fastening bolts to fix the mounting plate 31 on the base plate 1. Under this design, the tooling of this embodiment realizes front and rear adjustment, and with the above-mentioned rotation adjustment, the tooling can flexibly adapt to the internal layout of different high and low temperature chambers and the needs of different test scenarios, and has the characteristics of strong versatility.

[0030] In this embodiment, the rotating assembly 32 includes a fixed plate 321, a rotating plate 322, and a connecting plate 323. The fixed plate 321 is mounted on the mounting plate 31. The rotating plate 322 is rotatably connected to the fixed plate 321, and the connecting plate 323 is fixedly connected to the rotating plate 322. The lens mounting assembly 33 is mounted on the connecting plate 323, and the rotating plate 322 is used to drive the lens toward the blackbody radiation source 2 or toward the object being observed. Specifically, the rotating assembly 32 is an R-axis rotating platform with a micrometer knob for adjustment, such as the RSP90 rotating platform. With this option, the rotating platform has coarse and fine adjustment modes, which can increase the accuracy of the adjustment angle. It should be noted that the method of using the R-axis rotating platform is well known in the art, so it will not be described in detail. Of course, in order to adapt to infrared detectors of different sizes, those skilled in the art can choose similar rotating platforms with different diameters.

[0031] In this embodiment, the lens mounting assembly 33 includes a socket 331 and a PCB board 332; the PCB board 332 is disposed on the rotating assembly 32; the PCB board 332 is electrically connected to the power supply of the peripheral device and the display device; the socket 331 is disposed on the PCB board 332, and the socket 331 is used to mount the chip and lens to be tested. In fact, the socket 331 is a "SCOKET" well known in the art, for example, a socket for detecting the resistance of a camera module disclosed in CN105431741A.

[0032] In this embodiment, specifically, the lens mounting assembly 33 further includes a bracket 333; the bracket 333 includes a support plate 3331 and extension posts 3332; the support plate 3331 and the PCB board 332 are arranged at intervals; there are four extension posts 3332, which are respectively arranged at the four corners of the support plate 3331, and the two ends of the four extension posts 3332 are respectively connected to the support plate 3331 and the PCB board 332; the support plate 3331 is mounted on the rotating assembly 32. With the above design, one end of the support plate 3331 extends into a plate body for connecting to the rotating assembly 32 and is bolted to the rotating assembly 32. Then, the extension posts 3332 are used to connect the support plate 3331 and the PCB board 332, thereby providing a certain space between the support plate 3331 and the PCB board 332 for wiring.

[0033] Example 2

[0034] like Figure 5 As shown, this embodiment is basically the same as Embodiment 1, except that: in this embodiment, the rotating assembly 32 further includes a horizontal plate 324 and a vertical plate 325; a connecting plate 323 is disposed on the rotating plate 322; the horizontal plate 324 is disposed on the connecting plate 323; one end of the vertical plate 325 is rotatably connected to the horizontal plate 324; and the lens mounting assembly 33 is disposed on the vertical plate 325, which in this embodiment means that the support plate 3331 is disposed on the vertical plate 325. In this embodiment, the support plate 3331 and the rotating plate 322 are fixedly connected by bolts. When the angle needs to be adjusted, the bolts are loosened, adjusted to the required angle, and then the bolts are tightened again to press the rotating plate 323 against the fixed plate 321, thus completing the fixed connection. Under the above design, the vertical plate 325 can be rotated a certain angle around the end connected to the horizontal plate 324, increasing the flexibility of adjustment.

Claims

1. A rotating observation fixture for high and low temperature testing of uncooled infrared detectors, having a first direction, characterized in that, include: A base plate, a blackbody radiation source, and a mounting base; the blackbody radiation source and the mounting base are spaced apart on the base plate along a first direction. The mounting base includes a mounting plate, a rotating assembly, and a lens mounting assembly; the mounting plate is disposed on the base plate; the rotating assembly is disposed on the mounting plate; the lens mounting assembly is disposed on the rotating assembly; the lens mounting assembly is electrically connected to the power supply and display device of the peripheral device; the lens mounting assembly is used to mount the chip to be tested and the lens; the rotating assembly is used to rotate the lens toward a blackbody radiation source or toward the object being observed.

2. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 1, characterized in that, The mounting plate is detachably mounted on the base plate, and the mounting plate is capable of horizontal movement along a first direction.

3. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 2, characterized in that, The mounting plate is provided with at least two T-shaped grooves arranged at intervals; the length direction of the T-shaped grooves extends along a first direction; the base plate is provided with a first mounting hole; the first mounting hole and the T-shaped grooves correspond one-to-one; the mounting plate and the base plate are fixedly connected by fastening bolts passing through the T-shaped grooves and the first mounting holes, and the mounting plate can move horizontally along the first direction.

4. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 1, characterized in that, The rotating assembly includes a fixed plate, a rotating plate, and a connecting plate; the fixed plate is disposed on the mounting plate; the rotating plate and the fixed plate are rotatably connected; the connecting plate and the rotating plate are fixedly connected; the lens mounting assembly is disposed on the connecting plate; the rotating plate is used to drive the lens toward a blackbody radiation source or toward the object being observed.

5. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 1, characterized in that, The rotating assembly is an R-axis rotating platform with micrometer knob adjustment.

6. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 1, characterized in that, The lens mounting assembly includes a socket and a PCB board; the PCB board is disposed on the rotating assembly; the PCB board is electrically connected to the power supply of the peripheral device and the display device; the socket is disposed on the PCB board and is used to mount the chip and lens to be tested.

7. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 6, characterized in that, The lens mounting assembly further includes a bracket; the bracket includes a support plate and extension columns; the support plate and the PCB board are arranged at intervals; there are multiple extension columns, and the two ends of the multiple extension columns are respectively connected to the support plate and the PCB board; the support plate is disposed on the rotating assembly.

8. The rotating observation fixture for high and low temperature testing of uncooled infrared detectors according to claim 4, characterized in that, The rotating assembly further includes a horizontal plate and a vertical plate; the horizontal plate is disposed on the connecting plate; one end of the vertical plate is rotatably connected to the horizontal plate; the lens mounting assembly is disposed on the vertical plate.

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