Detection device

Abstract

The application relates to the technical field of detection equipment, and specifically discloses a detection device which comprises a machine table, a positioning assembly, a supporting piece, a moving piece, a lifting driving piece, a first probe, a second probe and an impedance detection module. The positioning assembly is arranged on the machine table and is used for bearing and positioning a display screen module. The supporting piece is arranged on the machine table and is located on one side of the positioning assembly. The moving piece is arranged on the supporting piece and slides in the vertical direction. The lifting driving piece is arranged on the machine table or the supporting piece and is connected with the moving piece. The first probe and the second probe are arranged on the moving piece and are spaced apart. The second probe and the first probe are used for being in contact with two measuring points on a circuit board of the display screen module under the driving of the moving piece. The impedance detection module is electrically connected with the first probe and the second probe respectively, is used for acquiring the impedance between the two measuring points, and detects whether a thin film transistor array substrate is broken according to the impedance between the two measuring points. The detection device improves the detection efficiency and reduces the risk of damaging the display screen module.

Description

Technical Field

[0001] This application relates to the field of testing equipment technology, specifically to a testing device. Background Technology

[0002] Currently, display modules are increasingly widely used in mobile terminals, such as mobile phones, tablets, and smartwatches. During the assembly process of mobile terminals, the display module is prone to breakage of the thin-film transistor array substrate (TFT glass substrate) due to handling, placement, and testing, which can lead to abnormal display in the assembled mobile terminal.

[0003] Because cracks in the thin-film transistor array substrate are difficult to detect visually, the current practice is to disassemble the display module and examine it under a microscope when a mobile terminal displays an abnormality. However, this method is inefficient and carries a significant risk of damaging the display module after disassembly. Utility Model Content

[0004] In view of the above, it is necessary to propose a detection device to improve detection efficiency and reduce the risk of damaging the display module.

[0005] This application provides a detection device for detecting whether a thin-film transistor array substrate of a display module is cracked. The detection device includes: a machine base; a positioning component disposed on the machine base for supporting and positioning the display module; a support member disposed on the machine base and located on one side of the positioning component; a moving member slidably disposed on the support member in a vertical direction and corresponding to the positioning component; a lifting drive member disposed on the machine base or the support member and connected to the moving member for driving the moving member to move closer to or away from the positioning component in the vertical direction; a first probe disposed on the moving member; a second probe disposed on the moving member and spaced apart from the first probe, wherein the second probe and the first probe are respectively used to contact two measurement points on the circuit board of the display module under the drive of the moving member; and an impedance detection module electrically connected to the first probe and the second probe respectively for acquiring the impedance between the two measurement points and detecting whether the thin-film transistor array substrate is cracked based on the impedance between the two measurement points.

[0006] In some embodiments, the positioning component includes: a positioning base disposed on the machine tool and located on one side of the support member, for supporting the display module; and a plurality of positioning members connected in a circular array to the side of the positioning base opposite to the machine tool, for positioning the display module by abutting it from all sides.

[0007] In some embodiments, the sidewalls of the plurality of positioning members that are close to each other have guide ramps, each guide ramp extending from the sidewall of the corresponding positioning member away from the positioning seat toward the positioning seat.

[0008] In some embodiments, the positioning assembly further includes an adsorption element connected to the side of the positioning seat away from the machine base and located among the plurality of positioning elements, the adsorption element being used to adsorb and fix the display module.

[0009] In some embodiments, the support member is provided with a slide rail extending along the vertical direction, and the moving member is slidably disposed on the slide rail.

[0010] In some embodiments, the detection device further includes a buffer element disposed on the positioning component and located on the movement path of the moving component.

[0011] In some embodiments, the detection device further includes a limiting member disposed on the positioning component and located on the movement path of the moving member. The limiting member is used to abut against and limit the moving member to restrict the distance the moving member moves close to the positioning component.

[0012] In some embodiments, the detection device further includes: a first flexible fixing member disposed on the movable member, the first probe being inserted into the first flexible fixing member along the vertical direction, and the first probe being connected to the movable member through the first flexible fixing member; and a second flexible fixing member disposed on the movable member and located on one side of the first flexible fixing member, the second probe being inserted into the second flexible fixing member along the vertical direction, and the second probe being connected to the movable member through the second flexible fixing member.

[0013] In some embodiments, both the first flexible fastener and the second flexible fastener are movably disposed on the movable member.

[0014] In some embodiments, both the first probe and the second probe are elastically stretchable structures.

[0015] The detection device in this embodiment comprises a machine base, a positioning component, a support component, a moving component, a lifting drive component, a first probe, a second probe, and an impedance detection module. When detecting whether the thin-film transistor array substrate of the display module is broken, the display module is placed on the positioning component for positioning. The lifting drive component is controlled to drive the moving component to move vertically closer to the positioning component. The second probe and the first probe, driven by the moving component, respectively contact two measurement points on the circuit board of the display module. The impedance detection module obtains the impedance value between the two measurement points and determines whether the thin-film transistor array substrate is broken based on whether the impedance value exceeds a preset range. Since this method does not require disassembling the display module, it improves detection efficiency and reduces the risk of damaging the display module. Attached Figure Description

[0016] Figure 1 This is a three-dimensional structural diagram of the detection device provided in this application embodiment and its matching display module.

[0017] Figure 2 yes Figure 1 The diagram shows a three-dimensional view of the detection device after the impedance detection module has been removed.

[0018] Figure 3 yes Figure 1 The diagram shows a partial exploded view of the support, moving part, lifting drive part, first probe, second probe, first flexible fixing part and second flexible fixing part in the detection device shown.

[0019] Key component symbols: Detection device 100, machine base 10, control button 11, positioning assembly 20, positioning seat 21, positioning component 22, guide ramp 221, suction component 23, support component 30, slide rail 31, moving component 40, moving seat 41, first oblong hole 411, second oblong hole 412, first fixing block 42, third oblong hole 421, second fixing block 43, fourth oblong hole 431, lifting drive component 50, first probe 61, second probe 62, impedance detection module 70, first flexible fixing component 81, second flexible fixing component 82, buffer component 91, limit component 92, display module 200, circuit board 210. Detailed Implementation

[0020] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar components or components having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0021] In the description of this application, it should be understood that the terms indicating orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, it should be noted that "a plurality of" means two or more, unless otherwise explicitly specified.

[0022] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the term "connection" should be interpreted broadly. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or a connection that allows communication between components; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal communication between two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0023] The following will describe some embodiments of this application in detail with reference to the accompanying drawings.

[0024] Please see Figure 1 This application provides a detection device 100 for detecting whether the thin-film transistor array substrate (not shown) of a display module 200 is cracked. The display module 200 can be applied to mobile terminals such as mobile phones, tablets, and smartwatches. For ease of understanding, this application uses the application of the display module 200 in a mobile phone as an example for illustration; however, this is not intended to limit the scope of this application.

[0025] Please see Figure 1 and Figure 2 In this embodiment, the detection device 100 includes a machine base 10, a positioning component 20, a support component 30, a moving component 40, a lifting drive component 50, a first probe 61, a second probe 62, and an impedance detection module 70.

[0026] A positioning component 20 is mounted on the machine base 10 and is used to support and position the display module 200. A support member 30 is mounted on the machine base 10 and located on one side of the positioning component 20. A movable member 40 is slidably mounted on the support member 30 in the vertical direction and corresponds to the positioning component 20. A lifting drive member 50 is mounted on the machine base 10 and connected to the movable member 40. The lifting drive member 50 is used to drive the movable member 40 to move closer to or away from the positioning component 20 in the vertical direction. A first probe 61 is mounted on the movable member 40. A second probe 62 is mounted on the movable member 40 and spaced apart from the first probe 61. The second probe 62 and the first probe 61 are used to contact two measurement points (not shown) on the circuit board 210 of the display module 200, respectively, under the drive of the movable member 40. An impedance detection module 70 is electrically connected to the first probe 61 and the second probe 62, respectively. The impedance detection module 70 is used to obtain the impedance between the two measurement points and detect whether the thin-film transistor array substrate is broken based on the impedance between the two measurement points.

[0027] Specifically, a conductive loop (not shown) is arranged on the circuit board 210 of the display module 200, forming an impedance circuit. When the thin-film transistor array substrate of the display module 200 breaks, the conductive loop will break, causing its resistance to rise abnormally or become open. Understandably, the measurement point is located on the conductive loop.

[0028] When the detection device 100 of this embodiment detects whether the thin-film transistor array substrate of the display module 200 is broken, it first places the display module 200 on the positioning component 20 for positioning. Then, it controls the lifting drive component 50 to drive the moving component 40 to move vertically towards the positioning component 20. The second probe 62 and the first probe 61, driven by the moving component 40, respectively contact two measurement points on the circuit board 210 of the display module 200. The impedance detection module 70 obtains the impedance value between the two measurement points and determines whether the thin-film transistor array substrate is broken based on whether the impedance value exceeds a preset range. Since this method does not require disassembling the display module 200, it improves the detection efficiency and reduces the risk of damaging the display module.

[0029] In some other embodiments, the lifting drive 50 may also be disposed on the support 30 and connected to the moving member 40, in which case the lifting drive 50 can also drive the moving member 40 to move closer to or away from the positioning component 20 in the vertical direction. This application does not specifically limit this aspect.

[0030] In this embodiment, the lifting drive component 50 can be a telescopic cylinder. In other embodiments, the lifting drive component 50 can also be an electric push rod, a linear slide, etc., and this application does not specifically limit it in this way.

[0031] In this embodiment, the impedance detection module 70 can be a dual-display digital meter, a multimeter, an impedance tester, etc., and this application embodiment does not specifically limit it.

[0032] In this embodiment, the positioning component 20 includes a positioning base 21 and multiple positioning elements 22. The positioning base 21 is disposed on the machine base 10 and located on one side of the support member 30, and is used to support the display module 200. The multiple positioning elements 22 are connected in a circular array to the side of the positioning base 21 opposite to the machine base 10, and are used to abut against the display module 200 from all sides. Thus, by setting the specific structure of the positioning component 20, the accuracy of the positioning component 20 in supporting and positioning the display module 200 is improved.

[0033] In this embodiment, the shapes and structures of the multiple positioning elements 22 may be the same or different, and this application embodiment does not make specific limitations in this regard.

[0034] In this embodiment, the sidewalls of the multiple positioning members 22 that are close to each other have guide slopes 221, and each guide slope 221 extends from the sidewall of the corresponding positioning member 22 away from the positioning seat 21 toward the positioning seat 21.

[0035] When placing the display module 200 between multiple positioning members 22, without the guide ramp 221, the small gap between the display module 200 and the positioning members 22 makes it inconvenient to quickly place the display module 200. By setting the guide ramp 221, when placing the display module 200 between the positioning members 22, the display module 200 only needs to be placed on the guide ramp 221. Under its own gravity, the display module 200 falls, and the guide ramp 221 quickly guides the display module 200 between the positioning members 22, thereby improving the convenience and efficiency of placing the display module 200 between the positioning members 22.

[0036] In this embodiment, the positioning component 20 further includes an adsorption member 23, which can be a vacuum suction head. The adsorption member 23 is connected to the side of the positioning base 21 away from the machine base 10 and is located among multiple positioning members 22. The adsorption member 23 is used to adsorb and fix the display screen module 200. By setting the adsorption member 23, the stability and accuracy of the positioning component 20 in positioning the display screen module 200 are improved.

[0037] In this embodiment, the support member 30 is provided with a slide rail 31 extending in the vertical direction, and the moving member 40 is slidably disposed on the slide rail 31.

[0038] By setting the slide rail 31, the accuracy of the lifting drive 50 driving the moving part 40 to move in the vertical direction is improved, and the probability of the moving part 40 causing the first probe 61 and the second probe 62 to shake is reduced, thereby improving the accuracy of the detection device 100 in detecting whether the thin film transistor array substrate of the display module 200 is broken.

[0039] In this embodiment, both the first probe 61 and the second probe 62 are elastic telescopic structures.

[0040] Thus, when there is an error in the distance that the lifting drive 50 drives the moving part 40 to move, or when there is an error in the size of the display module 200, by setting the first probe 61 and the second probe 62 as elastic telescopic structures, the first probe 61 and the second probe 62 can appropriately compensate for the corresponding error by telescopic movement, thereby improving the stability of the contact between the first probe 61 and the second probe 62 and the corresponding measurement point, and reducing the probability of damaging the first probe 61, the second probe 62 and the display module 200.

[0041] In this embodiment, both the first probe 61 and the second probe 62 may include a needle tip (not shown), a needle tube (not shown), and an elastic element (not shown). The needle tube is connected to the moving part 40, and the needle tip is slidably inserted into the needle tube. The elastic element may be a spring or a spring sheet. The elastic element is disposed in the needle tube and is connected to the needle tip and the needle tube respectively.

[0042] When the moving part 40 drives the first probe 61 and the second probe 62 to contact the corresponding measurement point, the needle tip contacts the corresponding measurement point and extends and retracts in the needle tube, and the elastic element provides clamping force, thereby improving the stability of the contact between the first probe 61 and the second probe 62 and the corresponding measurement point.

[0043] In this embodiment, the compression distance between the first probe 61 and the second probe 62 ranges from 2mm to 5mm. This setting improves the stability of the contact between the first probe 61 and the second probe 62 and the corresponding measurement points, and reduces the probability of damaging the first probe 61, the second probe 62, and the display module 200.

[0044] In one embodiment, the compression distance between the first probe 61 and the second probe 62 is 4 mm. This setting improves the stability of the contact between the first probe 61 and the second probe 62 and the corresponding measurement points, and reduces the probability of damaging the first probe 61, the second probe 62, and the display module 200.

[0045] In this embodiment, the detection device 100 further includes a first flexible fixing member 81 and a second flexible fixing member 82. The first flexible fixing member 81 is disposed on the movable member 40, and a first probe 61 is inserted vertically into the first flexible fixing member 81, and the first probe 61 is connected to the movable member 40 through the first flexible fixing member 81. The second flexible fixing member 82 is disposed on the movable member 40 and located on one side of the first flexible fixing member 81, and the second probe 62 is inserted vertically into the second flexible fixing member 82, and the second probe 62 is connected to the movable member 40 through the second flexible fixing member 82.

[0046] This design effectively protects the first probe 61 and the second probe 62, thereby reducing the likelihood of damage to them. Furthermore, this design can appropriately compensate for errors in the movement of the lifting drive 50 and the moving component 40, as well as dimensional errors in the display module 200, thus improving the stability of the contact between the first probe 61 and the second probe 62 and their corresponding measurement points.

[0047] In this embodiment, both the first flexible fastener 81 and the second flexible fastener 82 are made of foam. In other embodiments, the first flexible fastener 81 and the second flexible fastener 82 may also be made of flexible materials such as rubber, and this application does not specifically limit this.

[0048] Please refer to the following: Figure 3 In this embodiment, both the first flexible fixing member 81 and the second flexible fixing member 82 are movably disposed on the movable member 40.

[0049] Thus, when the first probe 61 and the second probe 62 do not make accurate contact with the corresponding measurement points, the positions of the first flexible fixing member 81 and the second flexible fixing member 82 on the moving member 40 can be adjusted accordingly, thereby improving the accuracy of the contact between the first probe 61 and the second probe 62 and the corresponding measurement points, and further improving the accuracy of the detection device 100 in detecting whether the thin film transistor array substrate of the display module 200 is broken.

[0050] In this embodiment, the movable member 40 includes a movable base 41, a first fixing block 42, and a second fixing block 43. The movable base 41 is slidably disposed on the support member 30 and connected to the lifting drive member 50. The first fixing block 42 and the second fixing block 43 are movably disposed on the movable base 41 and spaced apart. A first flexible fixing member 81 is movably disposed on the first fixing block 42, and a second flexible fixing member 82 is movably disposed on the second fixing block 43. The direction in which the first flexible fixing member 81 moves on the first fixing block 42 is perpendicular to the direction in which the first fixing block 42 moves on the movable base 41 and is perpendicular to the vertical direction. The direction in which the second flexible fixing member 82 moves on the second fixing block 43 is perpendicular to the direction in which the second fixing block 43 moves on the movable base 41 and is perpendicular to the vertical direction.

[0051] In this way, the positions of the first probe 61 and the second probe 62 can be adjusted in two mutually perpendicular directions, thereby further improving the accuracy of the contact between the first probe 61 and the second probe 62 and the corresponding measurement points, and further improving the accuracy of the detection device 100 in detecting whether the thin-film transistor array substrate of the display module 200 is broken.

[0052] In this embodiment, the detection device 100 further includes a first bolt (not shown), a second bolt (not shown), a third bolt (not shown), and a fourth bolt (not shown). The movable base 41 has a first oblong hole 411 and a second oblong hole 412. The first bolt passes through the first oblong hole 411 and is fixedly connected to the first fixing block 42. The second bolt passes through the second oblong hole 412 and is fixedly connected to the second fixing block 43, thereby allowing the first fixing block 42 and the second fixing block 43 to be movably disposed on the movable base 41. The first fixing block 42 has a third oblong hole 421, and the second fixing block 43 has a fourth oblong hole 431. The extension direction of the third oblong hole 421 is perpendicular to the extension direction of the first oblong hole 411 and perpendicular to the vertical direction. The extension direction of the fourth oblong hole 431 is perpendicular to the extension direction of the second oblong hole 412 and perpendicular to the vertical direction. The third bolt passes through the third oblong hole 421 and is fixedly connected to the first flexible fixing member 81, so that the first flexible fixing member 81 is movably disposed on the first fixing block 42. The fourth bolt passes through the fourth oblong hole 431 and is fixedly connected to the second flexible fixing member 82, so that the second flexible fixing member 82 is movably disposed on the second fixing block 43.

[0053] Please refer to it again. Figure 1 In this embodiment, the detection device 100 further includes a buffer 91, which is disposed on the positioning component 20 and located on the movement path of the moving component 40.

[0054] When the moving part 40 moves the first probe 61 and the second probe 62 closer to the display module 200, the buffer 91 abuts against the moving part 40 and provides cushioning, so that the first probe 61 and the second probe 62 smoothly contact the corresponding measurement points, thereby reducing the probability of damaging the first probe 61, the second probe 62 and the display module 200, and improving the accuracy of the first probe 61 and the second probe 62 contacting the corresponding measurement points.

[0055] In this embodiment, the buffer 91 is a hydraulic buffer. In other embodiments, the buffer 91 may also be a spring buffer, a pneumatic buffer, etc., and this application does not specifically limit it in this way.

[0056] In this embodiment, the detection device 100 further includes a limiting member 92, which is disposed on the positioning component 20 and located on the moving path of the moving member 40.

[0057] When the moving part 40 drives the first probe 61 and the second probe 62 closer to the display module 200, the limiting part 92 abuts against the limiting moving part 40 to limit the distance of the moving part 40 to the positioning component 20. This improves the accuracy of the moving part 40 driving the first probe 61 and the second probe 62 to abut against the corresponding measurement points and reduces the probability of damaging the first probe 61, the second probe 62 and the display module 200.

[0058] In this embodiment, the detection device 100 also includes a controller (shown in the figure) and a control button 11. The controller is located inside the machine base 10 and is electrically connected to the lifting drive component 50. The control button 11 is located on the machine base 10 and is electrically connected to the controller.

[0059] When using the detection device 100 to detect whether the thin-film transistor array substrate of the display module 200 is broken, simply pressing the control button 11 controls the lifting drive 50 to drive the moving part 40 to move closer to or further away from the positioning component 20 in the vertical direction, thereby realizing the operation of detecting whether the thin-film transistor array substrate is broken. This improves the convenience of using the detection device 100 to detect whether the thin-film transistor array substrate of the display module 200 is broken.

[0060] In summary, the detection device 100 of this application embodiment comprises a machine base 10, a positioning component 20, a support component 30, a moving component 40, a lifting drive component 50, a first probe 61, a second probe 62, and an impedance detection module 70. When detecting whether the thin-film transistor array substrate of the display module 200 is broken, the display module 200 is placed on the positioning component 20 for positioning. The lifting drive component 50 drives the moving component 40 to move vertically towards the positioning component 20. The second probe 62 and the first probe 61, driven by the moving component 40, respectively contact two measurement points on the circuit board 210 of the display module 200. The impedance detection module 70 obtains the impedance value between the two measurement points and determines whether the thin-film transistor array substrate is broken based on whether the impedance value exceeds a preset range. Since this method does not require disassembling the display module 200, it improves detection efficiency and reduces the risk of damaging the display module.

[0061] It will be apparent to those skilled in the art that this application is not limited to the details of the exemplary embodiments described above, and that this application can be implemented in other specific forms without departing from the spirit or essential characteristics of this application. Therefore, the embodiments should be regarded as exemplary and non-limiting in all respects, and the scope of this application is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be embraced within this application.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application.

Claims

1. A detection device, characterized in that, The detection device for detecting whether the thin-film transistor array substrate of a display module is cracked includes: Machine tool; A positioning component, located on the machine base, is used to support and position the display module; A support member is provided on the machine base and located on one side of the positioning assembly; A movable component is slidably disposed on the support component in the vertical direction and corresponds to the positioning component; A lifting drive component is disposed on the machine base or the support component and connected to the moving component, for driving the moving component to move closer to or away from the positioning component along the vertical direction; A first probe is located on the moving part; A second probe is disposed on the movable component and spaced apart from the first probe. The second probe and the first probe are used to contact two measurement points on the circuit board of the display module, respectively, under the movement of the movable component. An impedance detection module is electrically connected to the first probe and the second probe, respectively, for acquiring the impedance between the two measurement points and detecting whether the thin-film transistor array substrate is broken based on the impedance between the two measurement points.

2. The detection device as described in claim 1, characterized in that, The positioning component includes: A positioning seat, located on the machine base and on one side of the support member, is used to support the display module; Multiple positioning components are connected in a circular array to the side of the positioning seat away from the machine base, for positioning the display module from all sides.

3. The detection device as described in claim 2, characterized in that, Each of the sidewalls of the plurality of positioning elements that are close to each other has a guide ramp, and each guide ramp extends from the sidewall of the corresponding positioning element away from the positioning seat toward the positioning seat.

4. The detection device as described in claim 2, characterized in that, The positioning component further includes an adsorption element, which is connected to the side of the positioning seat away from the machine base and located among the multiple positioning elements. The adsorption element is used to adsorb and fix the display module.

5. The detection device as described in claim 1, characterized in that, The support member is provided with a slide rail extending along the vertical direction, and the moving member is slidably disposed on the slide rail.

6. The detection device as described in claim 1, characterized in that, The detection device further includes a buffer element, which is disposed on the positioning component and located on the movement path of the moving component.

7. The detection device as described in claim 1, characterized in that, The detection device further includes a limiting member, which is disposed on the positioning component and located on the movement path of the moving component. The limiting member is used to abut against and limit the moving component to restrict the distance of the moving component from approaching the positioning component.

8. The detection device as described in claim 1, characterized in that, The detection device further includes: A first flexible fixing member is disposed on the movable member, and the first probe is inserted into the first flexible fixing member along the vertical direction. The first probe is connected to the movable member through the first flexible fixing member. A second flexible fastener is disposed on the movable member and located on one side of the first flexible fastener. The second probe is inserted into the second flexible fastener along the vertical direction, and the second probe is connected to the movable member through the second flexible fastener.

9. The detection device as described in claim 8, characterized in that, Both the first flexible fastener and the second flexible fastener are movably disposed on the movable member.

10. The detection device as described in claim 1, characterized in that, Both the first probe and the second probe are elastically stretchable structures.

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