Adjustable probe support for chip testing

Abstract

The utility model relates to chip testing technical field discloses an adjustable probe support for chip test, including base, the upper surface of base is opened with sliding slot, the inside of sliding slot is provided with drive screw, installs movable stand on drive screw, is provided with lifting ring on movable stand, is provided with locking bolt on lifting ring, is provided with fixed bolster on lifting ring. In the utility model, through the thread transmission of drive screw and movable stand, horizontal position adjustment is realized, lifting ring and locking bolt cooperate and realize height adjustment, the linkage of rotating shaft, connecting gear, limit block and return spring realizes angle adjustment and locking, can carry out accurate adjustment from three dimensions of level, height, angle, can adapt to different size, different test demand's chip, satisfy the chip test scene of diversification, improve test efficiency greatly, reduce the time cost of equipment replacement because of the inadaptation of support.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to an adjustable probe holder for chip testing. Background Technology

[0002] In the field of chip testing, the probe holder, as a key component connecting the testing equipment and the chip, directly affects the accuracy and reliability of the test results. Traditional chip testing probe holders have many shortcomings, such as limited adjustment functions, difficulty in achieving precise multi-dimensional adjustments of horizontal position, height, and angle, inability to adapt to chips of different sizes and testing requirements, and the need for frequent holder replacements when facing diverse chip testing scenarios, thus reducing testing efficiency.

[0003] Therefore, there is an urgent need for a new type of adjustable probe holder to solve the above problems and meet the growing demand for high precision and high efficiency in chip testing. Utility Model Content

[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing an adjustable probe holder for chip testing.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: an adjustable probe holder for chip testing, comprising a base, a sliding groove formed on the upper surface of the base, a drive screw disposed inside the sliding groove, a movable column mounted on the drive screw, a lifting ring disposed on the movable column, a locking bolt disposed on the lifting ring, and a fixed bracket disposed on the lifting ring.

[0006] As a further description of the above technical solution: a rotating shaft is installed on the lifting ring, a connecting gear is provided on the rotating shaft, a sliding rod is provided on the fixed bracket, a limit block is provided at the end of the sliding rod away from the fixed bracket, a return spring is connected between the limit block and the fixed bracket, an mounting plate is installed at the end of the rotating shaft away from the movable column, a limit groove is opened on the mounting plate, a bidirectional lead screw is provided inside the limit groove, and a clamping plate is installed on the bidirectional lead screw.

[0007] As a further description of the above technical solution: the drive screw is rotatably connected to the base, the movable column is slidably connected to the sliding groove, the movable column is threadedly connected to the drive screw, the lifting ring is slidably connected to the movable column, and the locking bolt passes through and is threadedly connected to the lifting ring.

[0008] As a further description of the above technical solution: the fixed bracket is fixedly connected to the lifting ring, the rotating shaft is rotatably connected to the fixed bracket, the connecting gear is fixedly connected to the rotating shaft, the sliding rod passes through and is rotatably connected to the fixed bracket, and the limiting block is fixedly connected to the sliding rod.

[0009] As a further description of the above technical solution: the limiting block is provided with a toothed protrusion structure, and the position of the limiting block corresponds to the position of the connecting gear, and the limiting block meshes with the connecting gear.

[0010] As a further description of the above technical solution: one end of the reset spring is fixedly connected to the limiting block, and the other end of the reset spring is fixedly connected to the fixing bracket.

[0011] As a further description of the above technical solution: the mounting plate is fixedly connected to the rotating shaft, the limiting groove is symmetrically opened on the rotating shaft, the bidirectional lead screw passes through and is rotatably connected to the mounting plate, the clamping plate is slidably connected in the limiting groove, and the clamping plate is threadedly connected to the bidirectional lead screw.

[0012] This utility model has the following beneficial effects:

[0013] 1. In this utility model, the horizontal position is adjusted by the threaded transmission between the drive screw and the movable column, the height is adjusted by the cooperation of the lifting ring and the locking bolt, and the angle is adjusted and locked by the linkage of the rotating shaft, the connecting gear, the limit block and the return spring. It can be precisely adjusted in three dimensions: horizontal, height and angle, and can adapt to chips of different sizes and different testing requirements. It can meet diverse chip testing scenarios, greatly improve testing efficiency and reduce the time cost of replacing equipment due to incompatible brackets.

[0014] 2. In this utility model, the clamping structure composed of the bidirectional lead screw and the clamping plate can firmly clamp probes of different specifications by adjusting the spacing between the clamping plates, thereby enhancing the adaptability of the probe holder to different probes, improving the versatility of the testing equipment, and reducing the cost of replacing the holder due to changes in testing requirements. Attached Figure Description

[0015] Figure 1 This utility model proposes a three-dimensional adjustable probe holder for chip testing. Figure 1 ;

[0016] Figure 2 Partial explosion of an adjustable probe holder for chip testing proposed in this utility model Figure 1 ;

[0017] Figure 3 Partial explosion of an adjustable probe holder for chip testing proposed in this utility model Figure 2 ;

[0018] Figure 4 Partial explosion of an adjustable probe holder for chip testing proposed in this utility model Figure 3 .

[0019] Legend:

[0020] 1. Base; 2. Sliding groove; 3. Drive screw; 4. Movable column; 5. Lifting ring; 6. Locking bolt; 7. Fixed bracket; 8. Rotating shaft; 9. Connecting gear; 10. Sliding rod; 11. Limit block; 12. Return spring; 13. Mounting plate; 14. Limit groove; 15. Two-way lead screw; 16. Clamping plate. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Reference Figures 1-4 One embodiment of this utility model is an adjustable probe holder for chip testing, including a base 1. A sliding groove 2 is provided on the upper surface of the base 1. A drive screw 3 is provided inside the sliding groove 2. A movable column 4 is installed on the drive screw 3. A lifting ring 5 is provided on the movable column 4. A locking bolt 6 is provided on the lifting ring 5. A fixed bracket 7 is provided on the lifting ring 5.

[0023] A rotating shaft 8 is installed on the lifting ring 5, and a connecting gear 9 is provided on the rotating shaft 8. A sliding rod 10 is provided on the fixed bracket 7. A limit block 11 is provided at the end of the sliding rod 10 away from the fixed bracket 7. A return spring 12 is connected between the limit block 11 and the fixed bracket 7. An installation plate 13 is installed at the end of the rotating shaft 8 away from the movable column 4. A limit groove 14 is opened on the installation plate 13. A two-way screw 15 is provided inside the limit groove 14. A clamping plate 16 is installed on the two-way screw 15.

[0024] The drive screw 3 is rotatably connected to the base 1, the movable column 4 is slidably connected to the sliding groove 2, the movable column 4 is threadedly connected to the drive screw 3, the lifting ring 5 is slidably connected to the movable column 4, and the locking bolt 6 passes through and is threadedly connected to the lifting ring 5.

[0025] When the drive screw 3 rotates, the movable column 4 moves along the sliding groove 2 due to the threaded transmission; after the lifting ring 5 slides on the movable column 4 to adjust its height, the locking bolt 6 is tightened and fixed.

[0026] In this embodiment, the movable column 4 is ensured to move smoothly horizontally and remain in a fixed position, and the height of the lifting ring 5 is easily adjustable and reliably fixed, providing stable support for chip testing.

[0027] The fixed bracket 7 is fixedly connected to the lifting ring 5, the rotating shaft 8 is rotatably connected to the fixed bracket 7, the connecting gear 9 is fixedly connected to the rotating shaft 8, the sliding rod 10 passes through and is rotatably connected to the fixed bracket 7, and the limiting block 11 is fixedly connected to the sliding rod 10.

[0028] The rotating shaft 8 can rotate freely on the fixed bracket 7, driving the connecting gear 9 to rotate; the sliding rod 10 can rotate and slide on the fixed bracket 7.

[0029] In this embodiment, a stable rotational support is provided for the rotating shaft 8, so that the connecting gear 9 can transmit power normally, while ensuring that the sliding rod 10 and the limiting block 11 can move flexibly, thereby realizing the control of the angle of the rotating shaft 8.

[0030] The limiting block 11 is provided with a toothed protrusion structure, and the position of the limiting block 11 corresponds to the position of the connecting gear 9, and the limiting block 11 meshes with the connecting gear 9.

[0031] Under the action of the return spring 12, the toothed protrusion of the limiting block 11 of the sliding rod 10 meshes with the tooth groove of the connecting gear 9, restricting the rotation of the connecting gear 9; when the external force pulls the sliding rod 10, the limiting block 11 disengages from the connecting gear 9, and the rotating shaft 8 can rotate freely.

[0032] In this embodiment, the rotation axis 8 angle is locked and unlocked to ensure the probe angle is stable during chip testing and to facilitate operation when adjustment is required.

[0033] One end of the reset spring 12 is fixedly connected to the limiting block 11, and the other end of the reset spring 12 is fixedly connected to the fixing bracket 7.

[0034] The reset spring 12 is always in a stretched state, applying a pulling force to the limit block 11 in the direction of the connecting gear 9.

[0035] In this embodiment, the limiting block 11 is automatically engaged with the connecting gear 9 to ensure that the angle of the rotating shaft 8 is locked stably, and can overcome the elastic force to unlock when external force is applied.

[0036] Mounting plate 13 is fixedly connected to rotating shaft 8. Limiting groove 14 is symmetrically opened on rotating shaft 8. Bidirectional screw 15 passes through and is rotatably connected to mounting plate 13. Clamping plate 16 is slidably connected in limiting groove 14 and threadedly connected to bidirectional screw 15.

[0037] When rotating the bidirectional lead screw 15, since the threads at both ends of the bidirectional lead screw 15 are in opposite directions, the two clamping plates 16 slide relative to each other or in opposite directions within the limiting groove 14.

[0038] In this embodiment, by adjusting the spacing of the clamping plates 16, probes of different sizes can be firmly clamped to meet the diverse needs of chip testing for probe installation.

[0039] Working principle: Rotating the drive screw 3 causes the movable column 4 to move horizontally along the sliding groove 2 due to its threaded connection to the drive screw 3 and its sliding connection within the sliding groove 2, thereby adjusting the horizontal position of the bracket. The lifting ring 5 can slide freely on the movable column 4. After adjusting the lifting ring 5 to a suitable height, tightening the locking bolt 6 makes it press against the movable column 4, thereby locking the height of the lifting ring 5 and adjusting the overall height of the components fixed on the lifting ring 5.

[0040] The rotating shaft 8 is rotatably connected to the fixed bracket 7, allowing it to rotate freely and drive the connecting gear 9 to rotate. The sliding rod 10 passes through the fixed bracket 7 and can rotate and slide. The limiting block 11 is fixedly connected to the sliding rod 10. The return spring 12 always applies a pulling force to the limiting block 11 in the direction of the connecting gear 9, keeping the toothed protrusion structure of the limiting block 11 engaged with the tooth groove of the connecting gear 9, thus restricting the rotation of the connecting gear 9 and locking the angle of the rotating shaft 8. When the angle needs to be adjusted, an external force pulls the sliding rod 10, overcoming the elastic force of the return spring 12, causing the limiting block 11 to disengage from the connecting gear 9. At this time, the rotating shaft 8 can rotate freely. After adjusting to the target angle, the sliding rod 10 is released, and the limiting block 11 re-engages with the connecting gear 9 under the action of the return spring 12, completing the angle locking.

[0041] Mounting plate 13 is fixed to one end of rotating shaft 8. Bidirectional lead screw 15 passes through mounting plate 13 and is rotatable. Clamping plate 16 is slidably connected to limiting groove 14 and threadedly connected to bidirectional lead screw 15. Rotating bidirectional lead screw 15 causes the two clamping plates 16 to slide relative to or opposite to each other in limiting groove 14 due to the opposite direction of their threads. By adjusting the distance between clamping plates 16, probes of different sizes can be firmly clamped.

[0042] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. An adjustable probe holder for chip testing, comprising a base (1), characterized in that: The upper surface of the base (1) is provided with a sliding groove (2), and a drive screw (3) is provided inside the sliding groove (2). A movable column (4) is installed on the drive screw (3), a lifting ring (5) is provided on the movable column (4), a locking bolt (6) is provided on the lifting ring (5), and a fixed bracket (7) is provided on the lifting ring (5).

2. The adjustable probe holder for chip testing according to claim 1, characterized in that: A rotating shaft (8) is installed on the lifting ring (5), a connecting gear (9) is provided on the rotating shaft (8), a sliding rod (10) is provided on the fixed bracket (7), a limit block (11) is provided at the end of the sliding rod (10) away from the fixed bracket (7), a reset spring (12) is connected between the limit block (11) and the fixed bracket (7), an mounting plate (13) is installed at the end of the rotating shaft (8) away from the movable column (4), a limit groove (14) is opened on the mounting plate (13), a double-acting screw (15) is provided inside the limit groove (14), and a clamping plate (16) is installed on the double-acting screw (15).

3. The adjustable probe holder for chip testing according to claim 1, characterized in that: The drive screw (3) is rotatably connected to the base (1), the movable column (4) is slidably connected to the sliding groove (2), the movable column (4) is threadedly connected to the drive screw (3), the lifting ring (5) is slidably connected to the movable column (4), and the locking bolt (6) passes through and is threadedly connected to the lifting ring (5).

4. The adjustable probe holder for chip testing according to claim 2, characterized in that: The fixed bracket (7) is fixedly connected to the lifting ring (5), the rotating shaft (8) is rotatably connected to the fixed bracket (7), the connecting gear (9) is fixedly connected to the rotating shaft (8), the sliding rod (10) passes through and is rotatably connected to the fixed bracket (7), and the limiting block (11) is fixedly connected to the sliding rod (10).

5. The adjustable probe holder for chip testing according to claim 2, characterized in that: The limiting block (11) is provided with a toothed protrusion structure, and the position of the limiting block (11) corresponds to the position of the connecting gear (9), and the limiting block (11) meshes with the connecting gear (9).

6. The adjustable probe holder for chip testing according to claim 2, characterized in that: One end of the reset spring (12) is fixedly connected to the limiting block (11), and the other end of the reset spring (12) is fixedly connected to the fixing bracket (7).

7. The adjustable probe holder for chip testing according to claim 2, characterized in that: The mounting plate (13) is fixedly connected to the rotating shaft (8), the limiting groove (14) is symmetrically opened on the rotating shaft (8), the bidirectional screw (15) passes through and is rotatably connected to the mounting plate (13), the clamping plate (16) is slidably connected in the limiting groove (14), and the clamping plate (16) is threadedly connected to the bidirectional screw (15).

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