Test apparatus and system

Abstract

The application relates to a testing device and system, the testing device comprising a machine table and a transfer mechanism, a turnover mechanism and a testing mechanism arranged on the machine table; the machine table has an upper and lower loading position, a receiving position and a testing position; the transfer mechanism can move between the upper and lower loading position and the receiving position, and is used for transferring a product to be tested; the turnover mechanism is located at the receiving position, is used for overturning the product to be tested, and can feed the product to be tested to the testing position; the testing mechanism is located at the testing position and comprises an IV testing module, which is used for analog testing of the product to be tested. The testing device provided by the application can automatically complete the loading and unloading operations of the product to be tested through the transfer mechanism, reduces the labor intensity of the loading and unloading of the product to be tested, improves the consistency of the loading and unloading of the product to be tested, the turnover mechanism can overturn the product to be tested to a preset angle position, facilitates wiring of the product to be tested during electrical property testing, and IV analog testing of the product to be tested at different angle positions can be performed.

Description

Technical Field

[0001] This application relates to the field of product testing technology, and in particular to a testing device and system. Background Technology

[0002] The IV curve simulator is a professional device for testing the performance of photovoltaic devices. By measuring the IV characteristic curves, it can obtain key parameters such as open-circuit voltage (Voc), short-circuit current (Isc), fill factor (FF), efficiency (η), series resistance (Rs), and parallel resistance (Rsh), accurately evaluating the performance of solar cells. Its standard module can be expanded to 10kW, supports EN50530 standard testing, and its operating voltage range of 600Voc and 1000Voc covers short-circuit currents from 10A to 1800A. It is programmable to generate dynamic / static IV curves for photovoltaic inverter testing.

[0003] To meet power generation efficiency requirements, existing photovoltaic (PV) modules are becoming increasingly larger, with current PV modules reaching sizes of 2.6m x 1.4m and weighing up to 45kg. Typically, PV modules are manually lifted and placed during testing. However, manual handling of PV modules presents a series of problems, including heavy weight, high difficulty, and low safety, increasing the labor intensity of manual loading and unloading. Furthermore, the inconsistent loading of PV modules can introduce errors into the test results. Utility Model Content

[0004] Therefore, it is necessary to provide a testing device and system to address the problems of high labor intensity and poor consistency in manual loading and unloading of photovoltaic modules.

[0005] A testing apparatus, the testing apparatus comprising a machine base and a transfer mechanism, a flipping mechanism and a testing mechanism, all disposed on the machine base;

[0006] The machine has loading and unloading positions, receiving positions, and testing positions. The transfer mechanism can move between the loading and unloading positions and the receiving positions for transferring the product to be tested. The flipping mechanism is located at the receiving position for flipping the product to be tested and can also feed the product to be tested to the testing position. The testing mechanism is located at the testing position and includes an IV testing module for simulating testing of the product to be tested.

[0007] In one embodiment, the testing device further includes a light source dark chamber, which includes a main body, a curtain, and a control module. The main body is disposed outside the flipping mechanism and the testing mechanism. The curtain is sealed at the opening end of the main body. The control module is communicatively connected to the curtain and is used to control the opening and closing of the curtain.

[0008] In one embodiment, the flipping mechanism includes a mounting frame and a flipping table. The mounting frame is disposed on the machine base, and the flipping table is used to carry the product to be tested. The flipping table is rotatably disposed on the mounting frame and can move between the receiving position and the testing position.

[0009] In one embodiment, the flipping mechanism further includes two sliding modules and two rotating modules. The two sliding modules are spaced apart from each other on the mounting frame, and the two rotating modules are correspondingly slidably disposed on the two sliding modules. The two opposite sides of the flipping table are respectively rotatably disposed on the two rotating modules.

[0010] In one embodiment, the flipping mechanism further includes an adjustment member and at least one position detection member, the adjustment member being able to adjust the size of the bearing space of the flipping table, and the position detection member being used to sense the position of the product to be tested.

[0011] In one embodiment, the transfer mechanism includes a transfer slide rail and a transfer arm. The transfer slide rail extends between the upper and lower material positions and the receiving position, and the transfer arm is slidably disposed on the transfer slide rail for transferring the product to be tested.

[0012] In one embodiment, the transfer mechanism further includes a drive source, a lubrication module, and at least one position sensor. The drive source is connected to the transfer arm, the lubrication module is used to lubricate the transfer slide rail, and the position sensor is used to sense the position information of the transfer arm.

[0013] In one embodiment, the testing device further includes an alignment mechanism, which is disposed on the machine base and located at the receiving position, for acquiring the positional information of the product to be tested.

[0014] In one embodiment, the testing device further includes a sensing module disposed on the machine and located at the loading / unloading position, the sensing module being used to sense the presence and position of the product to be tested.

[0015] A testing system, the testing system comprising:

[0016] The testing device as described in any of the above technical solutions.

[0017] In the aforementioned testing apparatus and system, the transfer mechanism moves to the loading / unloading position and picks up the product under test (DUT) from the loading / unloading position. The transfer mechanism carries the DUT from the loading / unloading position towards the receiving position. The DUT is then placed on the flipping mechanism, which flips the DUT to a preset angle position for wiring and position adjustment. After the DUT is flipped to the test position, the flipping mechanism feeds the DUT to the test position, where it undergoes IV simulation testing via an IV test module. This testing apparatus automates the loading / unloading of the DUT through the transfer mechanism, reducing labor intensity and improving the consistency of loading / unloading. The flipping mechanism can flip the DUT to a preset angle position, facilitating wiring during electrical testing and enabling IV simulation testing at different angles. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the test apparatus provided in some embodiments.

[0019] Figure 2 This is a schematic diagram of the structure of the light source darkroom provided in some embodiments.

[0020] Figure 3 This is a schematic diagram of the flipping mechanism provided in some embodiments.

[0021] Figure 4 This is a schematic diagram of the transfer mechanism provided in some embodiments.

[0022] Figure 5 This is a schematic diagram of the transfer mechanism provided in another embodiment.

[0023] Figure 6 This is a schematic diagram of the alignment mechanism provided in some embodiments.

[0024] Figure 7 This is a schematic diagram of the structure of the sensing module provided in some embodiments.

[0025] Figure label:

[0026] 100. Testing equipment;

[0027] 110. Machine base; 111. Loading / unloading position; 112. Receiving position; 113. Testing position; 120. Transfer mechanism; 121. Transfer slide rail; 122. Transfer arm; 123. Drive source; 124. Lubrication module; 125. Position sensor; 130. Tilting mechanism; 131. Mounting bracket; 132. Tilting table; 133. Sliding module; 134. Rotating module; 135. Adjustment component; 136. Position detection component; 140. Testing mechanism; 150. Darkroom; 151. Main body; 152. Curtain; 153. Control module; 160. Alignment mechanism; 161. Fixing frame; 162. Alignment camera; 163. Light source; 170. Sensing module; 171. Bracket; 172. Position sensor; 173. Status sensor; 180. Guardrail mechanism;

[0028] 200. Product to be tested. Detailed Implementation

[0029] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0030] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0031] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0032] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0033] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0034] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0035] The technical solutions provided by the embodiments of this application are described below with reference to the accompanying drawings.

[0036] See Figures 1-3 As shown, this application provides a testing apparatus 100, which includes a machine base 110, a transfer mechanism 120, a flipping mechanism 130, and a testing mechanism 140, all of which are mounted on the machine base 110. The testing apparatus 100 is used to perform IV simulation testing on a product under test 200 (such as a solar cell) to obtain the electrical performance of the product under test 200.

[0037] The machine tool 110 has a loading / unloading position 111, a receiving position 112, and a testing position 113. The loading / unloading position 111 is used for loading and unloading the product under test 200. The receiving position 112 is used to feed the product under test 200 to the testing mechanism 140. The testing position 113 is used to perform IV simulation testing on the product under test 200. A transfer mechanism 120 can move between the loading / unloading position 111 and the receiving position 112, and is used for transferring the product under test 200. A flipping mechanism 130 is located at the receiving position 112 and is used to flip the product under test 200, and can also feed the product under test 200 to the testing position 113. The testing mechanism 140 is located at the testing position 113 and includes an IV testing module, which is used for simulation testing of the product under test 200. For example, the IV test module performs a bright field IV data scan on the product under test 200, calculates the standard light intensity IV correction compensation, plots the IV curve, and calculates key parameters of the product under test 200 such as the short-circuit open-circuit voltage Voc, short-circuit current Isc, fill factor FF, efficiency η, series resistance Rs, and parallel resistance Rsh, so as to accurately evaluate the electrical performance of the product under test 200.

[0038] The aforementioned testing device 100 includes a transfer mechanism 120 that moves to the loading / unloading position 111 and picks up the product to be tested 200 from the loading / unloading position 111. The transfer mechanism 120 carries the product to be tested 200 from the loading / unloading position 111 toward the receiving position 112. The product to be tested 200 moves to the receiving position 112 and is placed on the flipping mechanism 130. The flipping mechanism 130 flips the product to be tested 200 to a preset angle position for wiring, position adjustment, and other operations. After the product to be tested 200 is flipped to the test position, the flipping mechanism 130 feeds the product to be tested 200 to the test position 113. The product to be tested 200 undergoes IV simulation testing at the test position 113 through the IV test module. Thus, the loading and unloading operations of the product under test (DUT) 200 are automated through the transfer mechanism 120, reducing the labor intensity of loading and unloading the DUT 200 and improving the consistency of loading and unloading. Furthermore, the flipping mechanism 130 can flip the DUT 200 to a preset angle position, facilitating wiring during electrical testing and enabling IV simulation testing at different angles. For example, the flipping mechanism 130 can flip the DUT 200 so that its front faces the IV test module for front simulation testing, or flip it so that its back faces the IV test module for back simulation testing, or flip it so that the test surface forms an angle of 30°, 60°, 120°, 150°, or other values ​​with the test direction of the IV test module, to perform IV simulation testing at different angles.

[0039] In one embodiment, see Figures 1-3As shown, the testing device 100 also includes a light source dark chamber 150, which includes a main body 151, a curtain 152, and a control module 153. The main body 151 is covered outside the flipping mechanism 130 and the testing mechanism 140, and the main body 151 has an opening for operators to enter the light source dark chamber 150 to perform wiring operations on the product under test 200. The curtain 152 is sealed at the opening of the main body 151. The control module 153 is communicatively connected to the curtain 152 and is used to control the opening and closing of the curtain 152. The control module 153 may include, but is not limited to, control elements such as PLC (Programmable Logic Controller) and MCU (Micro Control Unit). For example, if the control module 153 controls the curtain 152 to open the opening of the main body 151 by means of rolling, pivoting, etc., the operator can enter the light source dark chamber 150 to perform wiring operations on the product under test 200, and can also perform maintenance operations on the flipping mechanism 130 and the testing mechanism 140 inside the light source dark chamber 150. Alternatively, the control module 153 controls the curtain 152 to close the opening of the main body 151 in the opposite direction to the above actions to ensure the airtightness of the environment inside the light source dark chamber 150.

[0040] In this way, the light source dark chamber 150 is placed outside the flipping mechanism 130 and the testing mechanism 140 to ensure the airtightness of the environment in which the flipping mechanism 130 and the testing mechanism 140 are located, and to eliminate the interference of external light on the electrical performance testing of the product under test 200, thereby obtaining accurate, reliable and repeatable test data.

[0041] In one embodiment, see Figure 1 and Figure 3As shown, the flipping mechanism 130 includes a mounting frame 131 and a flipping table 132. The mounting frame 131 is installed on the machine base 110 by means of screws, welding, etc., to realize the installation and fixation of the flipping mechanism 130 on the machine base 110. The flipping table 132 is used to carry the product under test 200, such as having a bearing position for carrying the product under test 200. The flipping table 132 is rotatably mounted on the mounting frame 131, and the flipping table 132 can move between the receiving position 112 and the testing position 113. Thus, when the flipping table 132 rotates around the mounting frame 131, the flipping table 132 drives the product under test 200 to rotate to a preset angle for wiring operations, facilitating the wiring operations of the product under test 200, and the flipping table 132 can rotate the product under test 200 to a preset angle position for IV simulation testing of the product under test 200. Furthermore, the flip table 132 can also move the product under test 200 between the receiving position 112 and the testing position 113, so as to send the product under test 200 from the receiving position 112 to the testing position 113 for IV simulation testing, and send the product under test 200 from the testing position 113 to the receiving position 112 for unloading operation through the transfer mechanism 120.

[0042] Specifically, see Figures 1-3 As shown, the flipping mechanism 130 also includes two sliding modules 133 and two rotating modules 134. The two sliding modules 133 are spaced apart on the mounting frame 131, and the two rotating modules 134 are correspondingly positioned on the two sliding modules 133, with the rotating modules 134 capable of sliding relative to the sliding modules 133. The flipping table 132 is rotatably mounted on the two rotating modules 134 on opposite sides. The sliding modules 133 are automated motion units composed of linear guides, ball screws, and other components. The rotating modules 134 may include, but are not limited to, power components such as rotary motors and rotary cylinders. Bearings are provided at the connection point between the rotating modules 134 and the flipping table 132 to improve the rotational accuracy of the flipping table 132 during rotation and reduce wear on the flipping table 132 during repeated rotation.

[0043] Thus, the rotating module 134 outputs power to the tilting table 132, driving the tilting table 132 to rotate. This allows the product under test (DUT) 200 to rotate to a preset angle for wiring operations, and also allows the DUT 200 to rotate to a preset angle position for IV simulation testing. The rotating module 134 slides relative to the sliding module 133, causing the tilting table 132 to move between the receiving position 112 and the testing position 113. This allows the DUT 200 to be transferred from the receiving position 112 to the testing position 113 for IV simulation testing, and vice versa. The transfer mechanism 120 can then unload the DUT 200 from the testing position 113 to the receiving position 112. Since the tilting table 132 is supported by two rotating modules 134 on opposite sides, the two rotating modules 134 together support the tilting table 132, improving the stability of the tilting table 132 during rotation and sliding.

[0044] Further, see Figure 1 and Figure 3 As shown, the flipping mechanism 130 also includes an adjustment member 135 and at least one position detection member 136. The adjustment member 135 is disposed on the flipping table 132 and can adjust the size of the bearing space of the flipping table 132 to accommodate testing operations of products 200 of different sizes. The position detection member 136 is used to sense the position of the product 200 under test, thereby controlling the movement of the sliding module 133 and the rotating module 134 to control the flipping angle and position adjustment of the product 200 under test. The position detection member 136 can be a position sensing element such as an infrared sensor or a position sensor; this application does not limit the specific type of element used in the position detection member 136.

[0045] In one embodiment, see Figure 1 , Figure 4 and Figure 5 As shown, the transfer mechanism 120 includes a transfer slide rail 121 and a transfer arm 122. The transfer slide rail 121 extends between the loading / unloading position 111 and the receiving position 112. The transfer arm 122 is slidably disposed on the transfer slide rail 121 and is used for transferring the product 200 to be tested. For example, when the transfer arm 122 moves from the loading / unloading position 111 to the receiving position 112 on the transfer slide rail 121, the transfer arm 122 can carry the product 200 to be tested to the flipping mechanism 130 for flipping operation; or, when the transfer arm 122 moves from the receiving position 112 to the loading / unloading position 111 on the transfer slide rail 121, the transfer arm 122 can carry the tested product 200 to be tested for unloading operation.

[0046] The transfer slide rail 121 includes a gear and rack transmission structure, which controls the movement of the transfer arm 122 through gear meshing. The transfer arm 122 can be a six-axis, eight-axis, or other number of robotic arms, and an actuator is provided at the end of the transfer arm 122. The actuator of the transfer arm 122 can realize the transfer operation of the product to be tested 200 through negative pressure adsorption, electric clamping, or other methods.

[0047] Specifically, see Figure 1 , Figure 4 and Figure 5 As shown, the transfer mechanism 120 also includes a drive source 123, a lubrication module 124, and at least one position sensor 125. The drive source 123 is connected to the transfer arm 122 and can output power to the transfer arm 122 to drive the transfer arm 122 to move between the loading / unloading position 111 and the receiving position 112, thereby realizing the loading / unloading operation of the product under test 200. The lubrication module 124 is used to lubricate the transfer slide rail 121. For example, the lubrication module 124 can inject lubricating oil, grease, or other lubricating media into the transfer slide rail 121 to improve the smoothness of the sliding of the transfer arm 122 on the transfer slide rail 121 and ensure the movement stability of the transfer arm 122, so as to avoid the product under test 200 from falling or being scratched due to the large shaking of the transfer arm 122 during the transfer process. The position sensor 125 is used to sense the position information of the material transfer arm 122 and can feed back the position information of the material transfer arm 122 to the drive source 123, so as to achieve precise position control of the material transfer arm 122 during its movement through the drive source 123.

[0048] In one embodiment, see Figure 1 , Figure 3 and Figure 6 As shown, the testing device 100 also includes an alignment mechanism 160. The alignment mechanism 160 is disposed on the machine base 110 and located at the receiving position 112. The alignment mechanism 160 is used to acquire the position and orientation information of the product under test 200. Thus, by acquiring the position and orientation information of the product under test 200 that has moved to the receiving position 112 through the alignment mechanism 160, and when the position and orientation of the product under test 200 deviates from the preset position and orientation state, the transfer mechanism 120 adjusts the position and orientation of the product under test 200 so that the product under test 200 is placed in the flipping mechanism 130 in the preset position and orientation state, which facilitates the subsequent control of the flipping operation of the product under test 200.

[0049] Of course, in other feasible embodiments, the alignment mechanism 160 can also obtain the position and orientation information of the product to be tested 200 at the upper and lower material positions 111, so that the transfer mechanism 120 can adaptively adjust the alignment posture with the product to be tested 200, and the transfer mechanism 120 picks up the product to be tested 200 in a preset state.

[0050] Specifically, see Figure 1 , Figure 3 and Figure 6 As shown, the alignment mechanism 160 includes a mounting frame 161, an alignment camera 162, and at least one light source 163. The mounting frame 161 is mounted on the machine base 110 by means of screws, welding, or other methods to achieve the installation and fixation of the alignment mechanism 160 on the machine base 110. Both the alignment camera 162 and the light source 163 are mounted on the mounting frame 161. The alignment camera 162 is used to acquire the pose information of the product under test 200. The light source 163 can supply light towards the alignment camera 162 to reduce the interference of ambient light on the visual alignment process of the alignment camera 162 and improve the alignment image quality of the alignment camera 162.

[0051] In one embodiment, see Figure 1 and Figure 7 As shown, the testing device 100 also includes a sensing module 170. The sensing module 170 is mounted on the machine base 110 and located at the loading / unloading position 111. The sensing module 170 is used to sense the presence and position of the product under test 200. Specifically, the sensing module 170 includes a bracket 171, at least one position sensor 172, and at least one status sensor 173. The bracket 171 is mounted on the machine base 110 by screwing, welding, or other means to secure the sensing module 170 to the machine base 110. The position sensor 172 is mounted on the bracket 171 and is used to sense the position information of the product under test 200 at the loading / unloading position 111. The status sensor 173 is used to sense the presence or absence of the product under test 200 at the loading / unloading position 111. For example, if the state sensor 173 senses whether the product under test 200 exists in the loading / unloading position 111, and there is no untested product under test 200 in the loading / unloading position 111, the product under test 200 is moved to the loading / unloading position 111 for subsequent IV simulation testing; if there is a product under test 200 in the loading / unloading position 111, the position sensor 172 senses the position information of the product under test 200 in the loading / unloading position 111, so as to control the transfer mechanism 120 to move to the position corresponding to the product under test 200 to perform the picking operation of the product under test 200; if there is a tested product under test 200 in the loading / unloading position 111, the loading / unloading position 111 performs the unloading operation of the product under test 200.

[0052] In one embodiment, see Figure 1 As shown, the testing device 100 also includes a guardrail mechanism 180, which covers the outside of the machine base 110. In this way, the testing device 100 is isolated by the guardrail mechanism 180, and the testing device 100 establishes a physical and safety management boundary, which can ensure the operational safety of the operator while ensuring the stability of the testing environment of the product under test 200.

[0053] Specifically, the guardrail mechanism 180 is composed of multiple mesh panels spliced ​​together. At least two adjacent mesh panels are connected by connectors such as door locks and bolts. An operation button is provided to control the door locks and bolts to control at least one mesh panel to rotate relative to its adjacent mesh panel, opening an entrance for operators to pass through, so that operators can enter the testing device 100 to perform testing operations on the product under test 200.

[0054] Additionally, see Figures 1-3 As shown, this application also provides a testing system, which includes the testing device 100 as described above. The testing system automates the loading and unloading of the product under test 200 via a transfer mechanism 120, reducing the labor intensity of loading and unloading the product under test 200 and improving the consistency of loading and unloading. Furthermore, the flipping mechanism 130 can flip the product under test 200 to a preset angle position, facilitating wiring of the product under test 200 during electrical testing and enabling IV simulation testing of the product under test 200 at different angle positions.

[0055] The following combination Figures 1-7 The testing operation of the testing device 100 is described in detail.

[0056] First, if the test surface of the product under test 200 is parallel to the transfer reference surface (such as the transfer ground), the operator manually feeds the product under test 200 to the upper / lower material position 111 using a manual forklift. If the test surface of the product under test 200 is perpendicular to the transfer reference surface (such as the transfer ground), the operator manually feeds the product under test 200 to the upper / lower material position 111 using a vertical material trolley. Then, the transfer mechanism 120 picks up the product under test 200 from the upper / lower material position 111 and carries it with it from the upper / lower material position. 111 Moves to receiving position 112; then, the product to be tested 200 is placed on the flipping mechanism 130. The flipping mechanism 130 rotates the product to be tested 200 clockwise or counterclockwise to an angle α (0 < α ≤ 180°), and the curtain 152 of the light source dark chamber 150 opens. The operator enters the testing device 100 to perform wiring operations on the product to be tested 200. After the wiring operations on the product to be tested 200 are completed, the operator exits the testing device 100, and at the same time, the light source dark chamber 150... Curtain 152 is closed; then, the flipping mechanism 130 rotates the product under test 200 to angle a in the opposite direction; continuing, the flipping mechanism 130 flips the product under test 200 so that the test surface faces the IV test module, and the flipping mechanism 130 moves the product under test 200 from the receiving position 112 to the test position 113 to perform IV simulation testing on the product under test 200; continuing, after the product under test 200 has been tested, curtain 152 of the light source dark chamber 150 is opened. The operator enters the testing device 100 to disconnect the wires of the product under test 200. The flipping mechanism 130 moves the tested product under test 200 from the testing position 113 to the receiving position 112. Finally, the transfer mechanism 120 picks up the tested product under test 200 from the flipping mechanism 130 and moves it from the receiving position 112 toward the upper and lower material positions 111. The unloading operation of the tested product 200 is then performed at the upper and lower material positions 111.

[0057] It should be noted that when testing small-sized test products 200, the test products 200 can be manually moved to the loading and unloading positions 111 to realize the loading and unloading operations of the test products 200 at the loading and unloading positions 111.

[0058] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0059] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A testing device, characterized in that, The testing device includes a machine base and a transfer mechanism, a flipping mechanism and a testing mechanism, all of which are installed on the machine base; The machine has loading and unloading positions, receiving positions, and testing positions. The transfer mechanism can move between the loading and unloading positions and the receiving positions for transferring the product to be tested. The flipping mechanism is located at the receiving position for flipping the product to be tested and can also feed the product to be tested to the testing position. The testing mechanism is located at the testing position and includes an IV testing module for simulating testing of the product to be tested.

2. The testing apparatus according to claim 1, characterized in that, The testing device also includes a light source dark chamber, which includes a main body, a curtain, and a control module. The main body is covered on the outside of the flipping mechanism and the testing mechanism. The curtain is sealed at the opening end of the main body. The control module is communicatively connected to the curtain and is used to control the opening and closing of the curtain.

3. The testing apparatus according to claim 1, characterized in that, The flipping mechanism includes a mounting frame and a flipping table. The mounting frame is disposed on the machine base, and the flipping table is used to carry the product to be tested. The flipping table is rotatably disposed on the mounting frame and can move between the receiving position and the testing position.

4. The testing apparatus according to claim 3, characterized in that, The flipping mechanism further includes two sliding modules and two rotating modules. The two sliding modules are spaced apart on the mounting frame, and the two rotating modules are correspondingly slidably disposed on the two sliding modules. The two opposite sides of the flipping table are respectively rotatably disposed on the two rotating modules.

5. The testing apparatus according to claim 4, characterized in that, The flipping mechanism further includes an adjustment component and at least one position detection component. The adjustment component can adjust the size of the bearing space of the flipping table, and the position detection component is used to sense the position of the product to be tested.

6. The testing apparatus according to claim 1, characterized in that, The transfer mechanism includes a transfer slide rail and a transfer arm. The transfer slide rail extends between the upper and lower material positions and the receiving position. The transfer arm is slidably disposed on the transfer slide rail for transferring the product to be tested.

7. The testing apparatus according to claim 6, characterized in that, The transfer mechanism further includes a drive source, a lubrication module, and at least one position sensor. The drive source is connected to the transfer arm, the lubrication module is used to lubricate the transfer slide rail, and the position sensor is used to sense the position information of the transfer arm.

8. The testing apparatus according to claim 1, characterized in that, The testing device also includes an alignment mechanism, which is disposed on the machine base and located at the receiving position, and is used to acquire the position and orientation information of the product to be tested.

9. The testing apparatus according to claim 1, characterized in that, The testing device also includes a sensing module, which is installed on the machine and located at the loading and unloading positions. The sensing module is used to sense the presence and position of the product to be tested.

10. A testing system, characterized in that, The testing system includes: The testing apparatus as described in any one of claims 1-9.

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