X-ray based metal composite plate delamination thickness and defect detection device

CN224906073UActive Publication Date: 2026-10-27HENAN YOUZHUN NEW MATERIAL TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202522653244.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-12-15
Publication Date
2026-10-27
Estimated Expiration
2035-12-15

AI Technical Summary

Technical Problem

[0008]为了克服背景技术中的不足,本实用新型公开了基于X射线的金属复合板材分层厚度及缺陷检测装置,用以解决金属复合板材生产过程中,现有无损检测装置无法对金属复合板材中各金属层和界面层厚度同时实现在线精确检测的技术难题

Benefits of technology

[0016]由于采用如上所述的技术方案,本实用新型具有如下有益效果:本实用新型公开的基于X射线的金属复合板材分层厚度及缺陷检测装置,通过将若干组X射线管、探测器阵列以不同角度设置在金属复合板材两侧,对金属复合板材进行X射线穿透检测,测量出若干探测器阵列接收到的穿透金属复合板材的辐射强度;根据若干探测器阵列接收到的辐射强度,列出X射线穿透金属复合板材的衰减方程组,求解衰减方程组,计算出金属复合板材中某一断面处各金属层和界面层厚度,从而解决了现有无损检测技术无法同时对金属复合板材中各金属层和界面层厚度和缺陷进行在线精确检测的技术难题。

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Abstract

A kind of X-ray-based metal composite board material layered thickness and defect detection device, including several groups of X-ray tube, detector array and data processing system, X-ray tube, detector array and data processing system are electrically connected;Several groups of X-ray tube, detector array are set at the two sides of metal composite board material at different angles, carry out X-ray penetration detection to metal composite board material, measure the radiation intensity received by several detector arrays penetrating metal composite board material;According to the radiation intensity received by several detector arrays, list the attenuation equation group of X-ray penetrating metal composite board material, solve attenuation equation group, calculate the thickness of each metal layer and interface layer in the section of metal composite board material, complete scanning detection to the whole board surface of metal composite board material along with the movement of metal composite board material, thereby solve the technical problem that existing nondestructive testing technique cannot simultaneously carry out online accurate detection to the thickness of each metal layer and interface layer in metal composite board material.
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Description

Technical Field

[0001] This utility model relates to the technical field of online testing equipment for metal composite sheet production, specifically to an X-ray-based device for detecting the layer thickness and defects of metal composite sheets. Background Technology

[0002] Metal composite sheets are a new type of material that combines two metal materials through a specific process, such as copper-aluminum composite sheets. Copper-aluminum composite sheets combine some of the properties of copper and aluminum, such as good conductivity, low cost, and low specific gravity. In industrial applications, they can replace pure copper in the manufacture of components such as busbars, parallel groove clamps, heat dissipation substrates, and composite gaskets. They are widely used in electric vehicles, energy storage power stations, photovoltaic power generation, substations, and other fields to reduce costs and weight.

[0003] However, during the composite manufacturing process, metal composite sheets are prone to uneven material thickness, uneven thickness of the interface layer (also known as the bonding layer), and interface layer defects such as pores, inclusions, and cracks. Among these, interface layer defects such as pores, inclusions, and cracks are mainly found in the interface layer. These defects can easily cause serious quality problems in metal composite sheets, such as local stress concentration, reduced bonding strength, reduced material strength, and reduced electrical or thermal conductivity.

[0004] Currently, the detection of the aforementioned defects in metal composite panels can only be performed after product manufacturing is completed. This can be done through destructive testing of the cross-section of the metal composite panels by laboratory sampling. Only then can the thickness of various metal layers and interface layers in the metal composite panels be accurately measured, and whether interface layer defects such as porosity, inclusions, and cracks exist. Furthermore, the probability of product quality defects can be predicted based on the sampling test results. However, since the above detection method is destructive sampling testing, it cannot be applied to the production line for dynamic monitoring of the product manufacturing process. At the same time, it cannot completely avoid the existence of defects in the manufactured products, making the products unsuitable for applications with high reliability requirements. This, in turn, affects the market competitiveness of metal composite panels and the economic benefits of enterprises.

[0005] To address the aforementioned issues, some enterprises and universities are currently researching online non-destructive testing (NDT) technology for metal composite panels. A utility model patent with application number 202510446740.6 discloses a NDT device for internal defects in copper-aluminum composite panels. This device utilizes X-ray principles to irradiate the metal composite panel, reflecting internal density differences through X-ray imaging. An algorithm automatically identifies internal defects. Because X-rays penetrate the panel without causing any damage, this non-contact testing method solves the problem of product damage during inspection, enabling online testing. However, this utility model's NDT device for internal defects in copper-aluminum composite panels does not address the issue of detecting the thickness of delamination within the metal composite panel.

[0006] In the article "Research on Laser Ultrasonic Testing Method for Composite Quality of Metal Laminates," Ji Baoping confirmed the effectiveness of ultrasonic body waves and guided waves in detecting delamination in copper-aluminum laminates by studying the propagation law of ultrasonic body waves and Lamb waves induced by the thermoelastic mechanism of pulsed lasers. However, the article did not explain whether the above methods are effective for detecting the thickness of delamination in copper-aluminum laminates. In addition, the author also studied the measurement of the thickness of copper and aluminum layers in copper-aluminum laminates using the longitudinal wave pulse reflection method and the pulse projection method. Based on experimental data and corresponding thickness calculation formulas, the calculated thickness of copper layer, aluminum layer, and total thickness of the experimental sample were basically consistent with the true values. However, the article also did not explain whether the above methods are effective for calculating the thickness of the interface layer in copper-aluminum laminates.

[0007] Based on the above, current online non-destructive testing of metal composite sheets can only qualitatively determine internal defects and detect the thickness of each metal layer using X-rays and pulsed lasers. It is not yet possible to accurately detect the thickness of each metal layer and interface layer in the metal composite sheet simultaneously. Therefore, this is a technical problem that urgently needs to be solved in the metal composite sheet processing industry. Utility Model Content

[0008] To overcome the shortcomings of the prior art, this utility model discloses an X-ray-based device for detecting the layer thickness and defects of metal composite plates, which solves the technical problem that existing non-destructive testing devices cannot simultaneously and accurately detect the thickness of each metal layer and interface layer in metal composite plates during the production process.

[0009] To achieve the aforementioned objective, this utility model adopts the following technical solution: an X-ray-based device for detecting the layer thickness and defects of metal composite plates, comprising several sets of X-ray tubes, detector arrays, and a data processing system; several X-ray tubes with different wavelengths are arranged on one side of the metal composite plate, and corresponding detector arrays are arranged on the other side of the metal composite plate; the lines connecting each set of X-ray tubes and detector arrays have unequal angles with the direction of movement of the metal composite plate, and the lines connecting several sets of X-ray tubes and detector arrays intersect at the same point in the thickness direction of the metal composite plate; the X-ray tubes, detector arrays, and data processing system are electrically connected.

[0010] Furthermore, among the several sets of X-ray tube and detector arrays, the line connecting one set of X-ray tube and detector arrays is perpendicular to the direction of movement of the metal composite plate, and the included angle between the lines connecting two adjacent sets of X-ray tube and detector arrays is between 1.0° and 10.0°.

[0011] Furthermore, it also includes a thickness measuring device, which is located at the front end of several sets of X-ray tubes and detector arrays; the thickness measuring device is electrically connected to the data processing system.

[0012] Furthermore, the thickness measuring device can be either contact or non-contact.

[0013] Furthermore, the X-ray beam emitted from the X-ray tube is fan-shaped; the detector array is a linear array or an arc-shaped linear array.

[0014] Furthermore, it also includes protective covers, which are fixedly installed outside several sets of X-ray tubes and detector arrays.

[0015] Furthermore, it also includes clamping rollers; there are two sets of clamping rollers, which are respectively set at the front and rear ends of several sets of X-ray tubes and detector arrays.

[0016] Due to the adoption of the above-described technical solution, this utility model has the following beneficial effects: The X-ray-based metal composite plate layer thickness and defect detection device disclosed in this utility model, by setting several sets of X-ray tubes and detector arrays at different angles on both sides of the metal composite plate, performs X-ray penetration detection on the metal composite plate and measures the radiation intensity received by the detector arrays penetrating the metal composite plate; based on the radiation intensity received by the detector arrays, a set of attenuation equations for X-ray penetration of the metal composite plate is listed, the attenuation equations are solved, and the thickness of each metal layer and interface layer at a certain cross section in the metal composite plate is calculated, thereby solving the technical problem that existing non-destructive testing technology cannot simultaneously perform online accurate detection of the thickness and defects of each metal layer and interface layer in the metal composite plate. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of an X-ray-based metal composite plate layer thickness and defect detection device system.

[0018] Figure 2 This is a schematic diagram of the principle of the X-ray-based metal composite plate layer thickness and defect detection device in Example 1.

[0019] Figure 3 A schematic diagram of a linear detector array arrangement;

[0020] Figure 4 A schematic diagram of the arrangement structure of an arc-shaped linear detector array;

[0021] Figure 5 This is a schematic diagram of the principle of the X-ray-based metal composite plate layer thickness and defect detection device in Example 2.

[0022] Figure 6 This is a schematic diagram of the principle of the X-ray-based metal composite plate layer thickness and defect detection device in Example 3.

[0023] Figure 7Schematic diagram of the impact of the intersection of the X-ray tube and detector array lines on detection accuracy. Figure 1 ;

[0024] Figure 8 Schematic diagram of the impact of the intersection of the X-ray tube and detector array lines on detection accuracy. Figure 2 .

[0025] In the figure: 1. Metal composite sheet; 1.1. Metal plate A; 1.2. Interface layer; 1.3. Metal plate B; 2. Data processing system; 3. X-ray tube A; 4. Detector array A; 5. X-ray tube B; 6. Detector array B; 7. X-ray tube C; 8. Detector array C; 9. Displacement sensor; 10. Clamping roller; 11. Protective cover; 12. Lifting roller; 13. Interface layer defect. Detailed Implementation

[0026] The present invention will be explained in detail through the following embodiments. The purpose of disclosing the present invention is to protect all technical improvements within the scope of the present invention.

[0027] Example 1, see appendix to the instruction manual. Figure 1 , 2 :

[0028] An X-ray-based device for detecting the thickness and defects of metal composite plates is disclosed. During the production of metal composite plates 1, it is used to detect online the thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3, as well as interface layer defects such as porosity, inclusions, and cracks in interface layer 1.2. The device includes three sets of X-ray tubes, a detector array, and a data processing system 2. The three X-ray tubes A3, B5, and C7 are fixedly mounted on the upper side of the metal composite plate 1. Each X-ray tube has a different operating voltage; for example, the operating voltage of X-ray tube A3 is set to 40KV. The operating voltage of X-ray tube B5 is set to 80KV. The operating voltage of X-ray tube C7 is set to 150KV. To adjust the X-rays emitted from the three X-ray tubes to have different penetrating abilities, corresponding detector arrays A4, B6, and C8 are fixedly installed on the underside of the metal composite plate 1. Each of detector arrays A4, B6, and C8 contains 100 detectors. Viewed from the side of the metal composite plate 1, the line connecting the first group of X-ray tubes A3 and detector array A4 is perpendicular to the direction of movement of the metal composite plate 1 (i.e., perpendicular to the surface of the metal composite plate 1), and the angle between the line connecting the X-ray tubes A3 and detector array A4 and the surface of the metal composite plate 1 is... (90°); the line connecting the second X-ray tube B5 and the detector array B6 is at an angle to the moving direction of the metal composite plate 1. (That is, the angle between the line connecting X-ray tube B5 and detector array B6 and the surface of metal composite plate 1). Take 85°; the line connecting the third X-ray tube C7 and the detector array C8 is at an angle to the moving direction of the metal composite plate 1. (That is, the angle between the line connecting X-ray tube B5 and detector array B6 and the surface of metal composite plate 1). The angle is set to 75°. In this embodiment, the maximum angle between the line connecting the X-ray tube and detector array groups and the moving direction of the metal composite plate 1 is set to 75°. This is to prevent the angle difference between the lines connecting the first and third X-ray tube and detector array groups from being too large (in this embodiment, the angle between the lines connecting the first and third X-ray tube and detector array groups is 15°), which would result in an excessively large detection width and thus an excessively large detection error. When setting up the three X-ray tube and detector array groups, the lines connecting the X-ray tubes and detector arrays intersect at a single point, and this point should be located as close as possible to the interface layer 1.2 in the metal composite plate 1. All three X-ray tube and detector array groups are electrically connected to the data processing system 2. See the appendix to the specification. Figure 3 , 4 The X-ray tube used in this invention emits a fan-shaped X-ray beam that covers the width of the metal composite plate 1. During the detection process, as the metal composite plate 1 moves, the fan-shaped X-ray beam scans the metal composite plate 1, allowing for full-width detection. The detector array can be a linear array, which has the advantage of simple structure, or an arc-shaped linear array, ensuring that each detector in the array is at the same distance from the X-ray tube. This guarantees the uniformity of the X-ray intensity received by each detector in the array before penetrating the metal composite plate 1, simplifying the data processing complexity of the data processing system 2. The X-ray-based metal composite plate layer thickness and defect detection device is externally fixed with a protective cover 11 to prevent X-rays from escaping into the external space and causing radiation hazards to nearby workers.

[0029] In this embodiment, the detection of the layer thickness and defect detection device based on X-rays for metal composite plates is divided into layer thickness scanning detection and interface layer abnormal defect scanning detection.

[0030] The layer thickness scanning detection method is as follows: A metal composite plate 1 passes through three sets of X-ray tubes and detector arrays at a set velocity V. X-rays emitted from the three X-ray tubes penetrate the metal composite plate 1 at incident angles of 90°, 85°, and 75°, respectively. A portion of the X-rays is absorbed upon penetration, and the remaining X-rays are received by the corresponding detector arrays. The intensity of the X-rays after penetration is measured. Taking a specific detector in the three detector arrays as an example, the data processing system 2 establishes a set of attenuation equations for X-ray penetration of the metal composite plate 1 based on the measured radiation intensity. Solve the attenuation equations to calculate the thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3 at a certain point on a certain cross section of the metal composite plate 1. Establish and solve the equations for all corresponding detectors in the three detector arrays using the same method to calculate the thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3 at a certain cross section of the metal composite plate 1. As the metal composite plate 1 passes through the three sets of X-ray tubes and detector arrays at a set speed V, a layer thickness scan of the entire surface of the metal composite plate 1 is completed, resulting in a thickness distribution map of each metal layer and interface layer of the metal composite plate 1.

[0031] The specific form of the attenuation equations for X-ray penetration of metal composite plate 1 is as follows:

[0032] (1)

[0033] (2)

[0034] (3)

[0035] Formula 1 is the attenuation equation for the first group of X-ray tubes A3 and detector array A4. In this equation: The radiation intensity of X-ray tube 3; The intensity of X-rays received by a detector in detector array 4; Let A1.1 be the attenuation coefficient of metal plate A1.1 in metal composite plate 1 for X-rays; The actual thickness of metal plate A1.1 at the corresponding measurement point in metal composite plate 1; The attenuation coefficient of X-rays for the interface layer 1.2 in the metal composite plate 1; The actual thickness of the interface layer 1.2 at the corresponding measurement point in the metal composite sheet 1; The attenuation coefficient of metal plate B1.3 in metal composite plate 1 for X-rays; The actual thickness of metal plate B1.3 at the corresponding measurement point in metal composite plate 1;

[0036] Formula 2 is the attenuation equation for the second group of X-ray tubes B5 and detector array B6. In this equation: The radiation intensity of X-ray tube B5; The intensity of X-rays received by a detector in detector array B6; , , The X-rays emitted from X-ray tube B5, with an incident angle of 85°, penetrate the thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3 near the corresponding measurement points in the metal composite plate 1. These thicknesses are related to the 85° incident angle of the second set of X-rays and the actual thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3 at the corresponding measurement points in the metal composite plate 1. The specific conversion formula is as follows: , , ;in Let A1.1 be the attenuation coefficient of metal plate A1.1 in metal composite plate 1 for X-rays; The attenuation coefficient of X-rays for the interface layer 1.2 in the metal composite plate 1; Let be the attenuation coefficient of metal plate B1.3 in metal composite plate 1 for X-rays; it should be noted that the above conversion formula is valid under the condition that, under normal circumstances, the thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3 in metal composite plate 1 will not change significantly within a narrow measurement range.

[0037] Formula 3 is the attenuation equation for the third group of X-ray tubes C7 and detector array C8. In this equation: The radiation intensity of X-ray tube C7; The intensity of X-rays received by a detector in detector array C8; , , The X-rays emitted from X-ray tube C7, with an incident angle of 75°, penetrate the thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3 near the corresponding measurement point of metal composite plate 1. These thicknesses are related to the 75° incident angle of the third set of X-rays and the actual thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3 near the measurement point of metal composite plate 1. The specific conversion formula is as follows: , , ;in Let A1.1 be the attenuation coefficient of metal plate A1.1 in metal composite plate 1 for X-rays; The attenuation coefficient of X-rays for the interface layer 1.2 in the metal composite plate 1; Let be the attenuation coefficient of metal plate B1.3 in metal composite plate 1 for X-rays; it should be noted that, similarly, the above conversion formula holds true under the condition that, under normal circumstances, the thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3 in metal composite plate 1 will not change significantly within a narrow measurement range.

[0038] Substituting the above thickness conversion formula into the attenuation equations for X-ray penetration of the metal composite plate 1, we obtain the following transformation of the attenuation equations:

[0039] (4)

[0040] (5)

[0041] (6)

[0042] In the transformed system of equations, , , , , , , , , , , , , , , All are known (of which) , , This is determined by setting the operating parameters of the X-ray tube, among which , , Determined by the measurement results of the detector array, where , , , , , , , , (Calibration needs to be performed through actual measurements in the laboratory, the specific method of which will be detailed later). Data processing system 2 can calculate the actual thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3 at the detection point in metal composite plate 1 by calculating the above-described deformed equations. If there are actually 100 detectors in the detector array, then the above 100 equations need to be solved at any cross-section during the detection of metal composite plate 1. As metal composite plate 1 passes through three sets of X-ray tubes and detector array at a set speed V, the layer thickness scanning detection of the entire surface of metal composite plate 1 is completed. Data processing system 2 repeats the above calculation process to obtain the thickness distribution map of metal plate A1.1, interface layer 1.2, and metal plate B1.3 of metal composite plate 1, thereby completing the online detection of the layer thickness of metal composite plate 1.

[0043] The method for detecting abnormal defects in the interface layer is as follows: The metal composite plate 1 passes through the three sets of X-ray tubes and detector arrays at a set speed V. The X-ray intensity detected by detector array A4, detector array B6, or detector array C8 is converted into a grayscale image to obtain a perspective view of the defects in the metal composite plate 1. The thickness distribution map of each metal layer and interface layer of the metal composite plate 1 is superimposed on the perspective view of the defects. If the thickness distribution map of each metal layer and interface layer of the metal composite plate 1 coincides with the abnormal distribution area of ​​the perspective view of the defects, it is determined that there are abnormal defects in the interface layer 1.2 of the metal composite plate 1.

[0044] Preferably, the metal composite plate 1 passes through the three sets of X-ray tubes and the detector array at a set speed V. The X-ray intensity detected by the detector array A4 is converted into a grayscale image to obtain a defect perspective view of the metal composite plate 1. The thickness distribution map of each metal layer and interface layer of the metal composite plate 1 is superimposed on the defect perspective view. If the abnormal distribution area of ​​each metal layer and interface layer of the metal composite plate 1 coincides with the abnormal distribution area of ​​the defect perspective view, it is determined that there is an abnormal defect in the interface layer 1.2 of the metal composite plate 1.

[0045] The specific defect type needs to be judged based on experience. Combining the results of online detection of the layer thickness of metal plate A1.1, interface layer 1.2 and metal plate B1.3 of metal composite sheet 1 can improve the accuracy of the specific defect type judgment.

[0046] Example 2, see appendix to the instruction manual. Figure 5 :

[0047] In this embodiment, the X-ray-based metal composite plate layer thickness and defect detection device further includes a thickness measuring device for measuring the total thickness of the metal composite plate 1. The thickness measuring device can be a displacement sensor 9 (contact measuring device) or a gamma-ray thickness gauge (non-contact measuring device). When the displacement sensor 9 is used, a clamping roller 10 should be provided on the side of the metal composite plate 1 opposite to the side where the displacement sensor 9 is located to support the pressure applied to the metal composite plate 1 by the displacement sensor 9 during measurement. The thickness measuring device is located at the front end of the three sets of X-ray tubes and detector arrays, and the distance between the thickness measuring device and the three sets of X-ray tubes and detector arrays is S. The thickness measuring device is electrically connected to the data processing system 2. When the thickness measuring device is included in the X-ray-based metal composite plate layer thickness and defect detection device, the attenuation equation set also includes the thickness calculation equation of the metal composite plate 1, the specific form of which is as follows:

[0048] (7)

[0049] in: The total thickness of the metal composite sheet 1; , , The actual thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3 in metal composite sheet 1 are given. This refers to the thickness of interface layer defects 13, or the thickness of inclusions, etc.

[0050] The purpose of introducing the metal composite plate thickness calculation equation into the attenuation equation set is to solve the problem in Example 1, where the sum of the thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3 calculated according to the attenuation equation set is less than the total thickness of the metal composite plate when there are pore defects in the interface layer. The calculation results of Example 2 are closer to the actual situation when defects occur in the metal composite plate.

[0051] After adding a thickness measuring device to the X-ray-based metal composite plate layer thickness and defect detection device, since the measurement results of the thickness measuring device are ahead of the measurement results of the three sets of X-ray tubes and detector arrays, a time shift correction is required when establishing the attenuation equation set for X-ray penetration of metal composite plate 1. That is, in the attenuation equation set for X-ray penetration of metal composite plate 1, the measurement time of L in formula (7) should be ahead of formulas (4), (5), and (6). The time advance calculation formula is as follows: , where S is the distance between the thickness measuring device and the intersection of the lines connecting the three sets of X-ray tubes and detector arrays; and V is the moving speed of the metal composite plate 1.

[0052] Example 3, see appendix to the instruction manual. Figure 6 , 7 8:

[0053] In this embodiment, five sets of X-ray tube and detector arrays are arranged, four of which are symmetrically arranged about the line connecting the first set of X-ray tube and detector arrays. This aims to improve detection accuracy by introducing redundant measurement results. Additionally, in this embodiment, lifting rollers 12 are provided at the front and rear ends of each of the five sets of X-ray tube and detector arrays. The lifting rollers 12 hold the metal composite plate 1, and their adjustment adjusts the horizontal height of the metal composite plate 1. Before production, based on the theoretical design thickness of metal plate A1.1, interface layer 1.2, and metal plate B1.3 in the metal composite plate 1, the horizontal position of the metal composite plate 1 is adjusted by adjusting the lifting rollers 12, ensuring that the intersection of the lines connecting the X-ray tubes and detector arrays is located in the interface layer 1.2 of the metal composite plate 1. (See appendix to the specification.) Figure 7 , 8 The image vividly illustrates the detection situation when the intersection of the line connecting the X-ray tube and the detector array is located in or deviates from the interface layer 1.2 in the metal composite plate 1. Since interface layer defects such as pores, inclusions, and cracks usually appear in the interface layer 1.2, the detection accuracy can be improved when the intersection of the line connecting the X-ray tube and the detector array is located in the interface layer 1.2 in the metal composite plate 1.

[0054] , , , , , , , , The specific calibration method for actual measurement in the laboratory is as follows:

[0055] S1: Prepare standard thickness samples of metal plate A, metal plate B, and metal composite plate; the cross-section of the standard thickness sample of metal composite plate must be mirror polished.

[0056] S2: The attenuation coefficients of standard thickness samples of metal plates A and B are measured using X-ray tubes A3, B5, and C7, respectively, to obtain the attenuation coefficients. , , , , , ;

[0057] S3: Using SEM (Scanning Electron Microscopy) + EDS (Energy Dispersive Spectroscopy) line scanning, the cross-section of the metal composite plate was scanned in 0.05 μm increments along the direction perpendicular to the interface layer to obtain the thicknesses of metal plate A1.1, interface layer 1.2, and metal plate B1.3, respectively. , , and the total thickness of the metal composite plate The thickness of the interface layer 1.2 is defined as the width of the metal A content in the range of 95%-5% (or the width of the metal B content in the range of 5%-95%).

[0058] S4: The attenuation of the standard thickness sample of the metal composite plate was measured using X-ray tubes A3, B5, and C7 respectively, and the results were obtained. , , ;

[0059] S5: Substitute the results obtained in steps S2, S3, and S5 into formulas (1), (2), and (3) to calculate the attenuation coefficients of X-ray tubes A3, B5, and C7 at interface layer 1.2. , , .

[0060] The parts of this utility model not described in detail are existing technologies.

[0061] Those skilled in the art should understand that variations can be implemented by combining existing technology and the above embodiments. Such variations do not affect the substantive content of this solution and will not be elaborated here.

[0062] It should be understood that this solution is not limited to the specific embodiments described above. Structures and construction methods not described in detail should be understood as being implemented using common methods in the art. Any person skilled in the art can make many possible variations and modifications to this solution, or modify it into equivalent embodiments, without departing from the scope of this solution, using the disclosed methods and techniques. This does not affect the substantive content of this solution. Therefore, any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of this solution, without departing from its scope, still fall within the protection scope of this solution.

Claims

1. An X-ray-based device for detecting the delamination thickness and defects of metal composite plates, characterized in that: It includes several sets of X-ray tubes, detector arrays, and a data processing system; several X-ray tubes are set on one side of the metal composite plate, and corresponding several detector arrays are set on the other side of the metal composite plate; the line connecting each set of X-ray tubes and detector arrays has unequal angles with the direction of movement of the metal composite plate, and the line connecting several sets of X-ray tubes and detector arrays intersects at the same point in the thickness direction of the metal composite plate; the X-ray tubes, detector arrays and data processing system are electrically connected.

2. The X-ray-based metal composite plate delamination thickness and defect detection device according to claim 1, characterized in that: In a plurality of X-ray tube and detector arrays, the line connecting one of the X-ray tube and detector arrays is perpendicular to the direction of movement of the metal composite plate, and the angle between the lines connecting two adjacent X-ray tube and detector arrays is between 1.0° and 10.0°.

3. The X-ray-based metal composite plate delamination thickness and defect detection device according to claim 1, characterized in that: It also includes a thickness measuring device, which is located at the front end of several sets of X-ray tubes and detector arrays; The thickness measuring device is electrically connected to the data processing system.

4. The X-ray-based metal composite plate delamination thickness and defect detection device according to claim 3, characterized in that: The thickness measuring device can be either contact or non-contact.

5. The X-ray-based metal composite plate delamination thickness and defect detection device according to claim 1, characterized in that: The X-ray beam emitted from the X-ray tube is fan-shaped; the detector array is either a linear array or an arc-shaped linear array.

6. The X-ray-based metal composite plate delamination thickness and defect detection device according to claim 1, characterized in that: It also includes protective covers, which are fixedly installed outside several sets of X-ray tubes and detector arrays.

7. The X-ray-based metal composite plate delamination thickness and defect detection device according to claim 1, characterized in that: It also includes clamping rollers; there are two sets of clamping rollers, which are respectively set at the front and rear ends of several sets of X-ray tubes and detector arrays.

Citation Information

Patent Citations

  • Nondestructive testing device for internal defects of copper-aluminum composite board

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