A test fixture

Abstract

The application discloses a test tool with intersecting first and second directions, comprising: a substrate with a first surface; first and second pin assemblies are oppositely arranged in the first direction, and each pin assembly comprises a test probe, and the interval between the two pin assemblies forms a test site; a carrying device comprises a carrying shell extending in the second direction, and the carrying shell is provided with a receiving cavity for accommodating a product to be tested; in the first direction, detection openings are formed in the opposite side walls of the carrying shell and are in communication with the receiving cavity, and are used for exposing the detection pins of the product to be tested in the receiving cavity; when the product to be tested is tested, the carrying shell is located in the test site, and the test probe is in abutment with the detection pin of the product to be tested through the detection opening. The application avoids the bending moment and shearing force generated on the detection pin during the "plug-in and top pressing" process, fundamentally reduces the risk of pin bending, deformation or fracture, and improves the detection efficiency.

Description

Technical Field

[0001] This application relates to the field of testing fixtures, and more particularly to a testing fixture. Background Technology

[0002] As an important sensor for measuring gas pressure, barometers are widely used in industrial automation, environmental monitoring, and medical equipment.

[0003] Existing barometer products typically have multiple pins for electrical connections on opposite sides of the housing, as well as an air inlet on the housing. During batch testing, each pin of each barometer must be inserted into the socket of the test board one by one, and a hose must be manually connected to the air inlet. The test system then pressurizes the system and records the output data. After the test, the pins must be disconnected from the socket.

[0004] Existing testing methods are inefficient, and the barometer pins are prone to bending, deformation, and other damage during testing. In addition, the pressurization process is cumbersome and inefficient. Utility Model Content

[0005] This application provides a testing fixture designed to reduce the risk of pin bending or deformation during barometer testing.

[0006] To achieve the above objectives, according to a first aspect of this application, a testing fixture is provided, having intersecting first and second directions, comprising: The substrate has a first surface; The first pin assembly and the second pin assembly are both located on the first surface and are arranged at a distance from each other in the first direction. Each pin assembly includes a test probe, and the interval between the first pin assembly and the second pin assembly constitutes a test position. The carrier device includes a carrier housing extending in a second direction, wherein the carrier housing has a cavity for accommodating the product to be tested, and in a first direction, detection openings communicating with the cavity are provided on opposite side walls of the carrier housing for exposing the detection pins of the product to be tested located in the cavity. When testing the product under test, the carrier housing is located at the test position, and the test probe abuts against the test pin of the product under test through the test opening.

[0007] Optionally, in the second direction, the accommodating cavity can sequentially accommodate multiple products under test, and the detection pins of each product under test in the first direction are exposed from the corresponding detection opening.

[0008] Optionally, both the first pin assembly and the second pin assembly include a plurality of test probes, and the test probes in each pin assembly are spaced apart along the second direction.

[0009] Optionally, the first support plate and the second support plate are located on the first surface, are disposed opposite to each other in the first direction, and are respectively located on both sides of the test position in the first direction; The test probe of the first pin assembly is fixedly connected to one side of the first support plate relative to the second support plate, and the test probe of the second pin assembly is fixedly connected to one side of the second support plate relative to the first support plate.

[0010] Optionally, it also includes: The first track and the second track are both located on the first surface and extend along the first direction, and are respectively located on both sides of the test position in the first direction. The first support plate is slidably connected to the first track, and the second support plate is slidably connected to the second track. When testing the product under test, the first support plate can slide along the first direction toward the direction closer to the second support plate, so as to drive the test probe of the first pin assembly to abut against the detection pin of the product under test on the side closer to the first support plate in the first direction. The second support plate can slide along the first direction toward the direction closer to the first support plate, so as to drive the test probe of the second pin assembly to abut against the detection pin of the product under test on the side closer to the second support plate in the first direction.

[0011] Optionally, it also includes: The material handling device includes a positioning structure and a storage tube extending along a second direction. The storage tube passes through the positioning structure, which is used to connect with the bearing housing in the second direction. The storage tube has a through-hole in the middle to form a storage cavity. The storage cavity is adapted to the receiving cavity. The storage cavity is used to sequentially accommodate multiple products to be tested along the second direction and to send the multiple products to be tested into the receiving cavity.

[0012] Optionally, the supporting housing has a top plate on the side away from the substrate, and a ventilation groove extending in a second direction is formed on the surface of the top plate away from the substrate. A plurality of ventilation holes are formed at intervals along the second direction on the surface of the top plate facing the substrate, and each ventilation hole is connected to the ventilation groove. The supporting device further includes: a sealing plate, which is connected to the side surface of the top plate away from the substrate, and the sealing plate has a test port that passes through itself, which is connected to the ventilation groove; When testing the product under test, the air inlet of each product under test is connected to the corresponding vent.

[0013] Optionally, the supporting housing further includes: The base includes a base plate and side plates arranged opposite each other in a first direction. The detection opening is provided on both side plates. The base plate is used to support the product to be tested. A top plate is disposed opposite to the base in the thickness direction of the bottom plate, and together with the base, they enclose the receiving cavity. The top plate and the base are detachably connected. In the second direction, the receiving cavity is closed on one side and open on the other side. A sealing structure is located on the opening side of the accommodating cavity and is detachably connected to the base.

[0014] Optionally, in the first direction, each of the test probes can be elastically compressed or extended.

[0015] Optionally, the substrate has a groove at the detection position, the groove extends along the second direction, and the carrier housing is located in the groove when the product to be tested is tested.

[0016] Optionally, it further includes: a limiting block, which is rotatably connected to the substrate and disposed at one end of the slide in the second direction.

[0017] In the test fixture of this application embodiment, when testing the product under test (DUT), the DUT is located in the accommodating cavity. The DUT has detection pins on both sides in a first direction, with the detection pins protruding through detection openings. When the supporting housing is in the test position, the test probe can abut against the detection pins of the DUT through the detection openings. This configuration, by accommodating the DUT in the accommodating cavity and exposing the sides of the detection pins in the detection openings, allows for direct electrical contact between the test probe and the detection pins in the first direction. This avoids the bending moment and shear force generated on the detection pins during the traditional "insertion-pull-press" process, fundamentally reducing the risk of pin bending, deformation, or breakage, and improving testing efficiency. Simultaneously, the accommodating cavity can accommodate multiple DUTs. This configuration of the test fixture disclosed in this application enables simultaneous testing of multiple DUTs, further improving the testing efficiency.

[0018] Other features and advantages of this application will be described in detail in the following detailed description section. Attached Figure Description To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] To gain a more complete understanding of this application and its beneficial effects, the following description will be provided in conjunction with the accompanying drawings, wherein the same reference numerals in the following description denote the same parts.

[0020] Figure 1 This is a schematic diagram of the structure of a substrate disclosed in an embodiment of this application; Figure 2 This is a schematic diagram of the structure of a support device disclosed in an embodiment of this application; Figure 3 This is a schematic diagram of the structure of a test fixture disclosed in an embodiment of this application; Figure 4 This is a top view of a support device disclosed in an embodiment of this application; Figure 5 yes Figure 4 Cross-sectional view at point AA; Figure 6 yes Figure 5 Enlarged view of point B in the middle; Figure 7 This is a schematic diagram of the structure of a material handling device disclosed in an embodiment of this application. Figure 1 ; Figure 8 This is a schematic diagram of the structure of a material handling device disclosed in an embodiment of this application. Figure 2 ; Figure 9 This is a structural schematic diagram of the product to be tested.

[0021] Explanation of reference numerals in the attached figures: 1. Substrate; 101. First surface; 102. Groove; 2. First pin assembly; 201. Test probe 3. Second pin assembly; 4. Bearing device; 40. Bearing housing; 401. Receiving cavity; 402. Detection opening; 403. Top plate; 404. Vent groove; 405. Vent hole; 406. Base; 4061. Bottom plate; 4062. Side plate; 41. Sealing plate; 411. Test port; 407. Sealing structure; 408. Knob plunger; 409. Spring clip; 5. Material handling device; 501. Material storage pipe; 502. Material storage cavity; 503. Positioning structure; 5031. Positioning pin hole; 6. First support plate; 7. Second support plate; 8. First track; 9. Second track; 10. Limit block; 11. Product under test; 111. Detection pin; 112. Air inlet; 12. First drive structure; 13. Second drive structure. Detailed Implementation

[0022] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the protection scope of this application.

[0023] As described in the background section, barometers, as important sensors for measuring gas pressure, are widely used in industrial automation, environmental monitoring, and medical equipment. Existing barometer products typically have multiple pins for electrical connections on opposite sides of the housing, as well as an air inlet on the housing. During batch testing, each pin of each barometer must be inserted one by one into the socket of the test board, and a flexible hose must be manually connected to the air inlet. The test system then pressurizes the system and records the output data. After the test, the pins must be disconnected from the socket.

[0024] Existing testing methods are inefficient, and the barometer pins are prone to bending, deformation, and other damage during testing. In addition, the pressurization process is cumbersome and inefficient.

[0025] Therefore, in order to reduce the risk of pin bending or deformation during barometer testing and to improve barometer testing efficiency, this application discloses a testing fixture.

[0026] Reference Figure 1 and Figure 2 The test fixture disclosed in this application has intersecting first and second directions, and includes a substrate 1, a first pin assembly 2, a second pin assembly 3, and a support device 4. The substrate 1 has a first surface 101. The first pin assembly 2 and the second pin assembly 3 are both located on the first surface 101 and are arranged at a distance from each other in the first direction, and each pin assembly includes a test probe 201, and the interval between the first pin assembly 2 and the second pin assembly 3 constitutes a test position.

[0027] Reference Figure 2 and Figure 5 The carrier device 4 includes a carrier housing 40 extending in the second direction. The carrier housing 40 has a receiving cavity 401 for accommodating the product to be tested 11. In the first direction, detection openings 402 communicating with the receiving cavity 401 are provided on the opposite side walls of the carrier housing 40 for exposing the detection pins 111 of the product to be tested 11 located in the receiving cavity 401.

[0028] In the embodiments disclosed in this application, when the product under test 11 is tested, the product under test 11 is located in the accommodating cavity 401, and the product under test 11 has detection pins 111 on both sides in the first direction (the product under test 11 is shown in the figure). Figure 9 As shown, the detection pin 111 is exposed in the detection opening 402. When the carrier housing 40 is in the test position, the test probe 201 can abut against the detection pin 111 of the product under test 11 through the detection opening 402. With this configuration, the product under test 11 is accommodated by the receiving cavity 401, and the side of the detection pin 111 is exposed in the detection opening 402. The test probe 201 abuts against the detection pin 111 in the first direction, which can directly achieve electrical contact. This avoids the bending moment and shear force generated on the detection pin 111 during the traditional "insertion-pull-press" process, fundamentally reducing the risk of pin bending, deformation or breakage, and improving the detection efficiency.

[0029] Furthermore, in this embodiment, in the second direction, the accommodating cavity 401 can sequentially accommodate multiple products under test 11, and the detection pins 111 of each product under test 11 are exposed from the corresponding detection openings 402 in the first direction. The first pin assembly 2 and the second pin assembly 3 both include multiple test probes 201, and the test probes 201 in each pin assembly are spaced apart along the second direction.

[0030] This setting is for reference. Figure 3 When the cavity 401 contains multiple products under test 11, each product under test 11 located in the cavity 401 has a corresponding test probe 201 on its detection pin 111, so as to enable multiple products under test 11 to be detected simultaneously and significantly improve the testing efficiency of the products under test 11.

[0031] In some embodiments, the test fixture further includes a first support plate 6 and a second support plate 7. The first support plate 6 and the second support plate 7 are located on the first surface 101, are disposed opposite each other in a first direction, and are respectively located on both sides of the test position in the first direction. The test probe 201 of the first pin assembly 2 is fixedly connected to one side of the first support plate 6 relative to the second support plate 7, and the test probe 201 of the second pin assembly 3 is fixedly connected to one side of the second support plate 7 relative to the first support plate 6.

[0032] Furthermore, the testing fixture also includes a first track 8 and a second track 9. Both the first track 8 and the second track 9 are located on the first surface 101 and extend along a first direction, respectively located on opposite sides of the test position in the first direction. A first support plate 6 is slidably connected to the first track 8, and a second support plate 7 is slidably connected to the second track 9. When testing the product under test 11, the first support plate 6 can slide along the first direction toward the direction closer to the second support plate 7, thereby causing the test probe 201 of the first pin assembly 2 to abut against the detection pin 111 of the product under test 11 on the side closer to the first support plate 6 in the first direction. Similarly, the second support plate 7 can slide along the first direction toward the direction closer to the first support plate 6, thereby causing the test probe 201 of the second pin assembly 3 to abut against the detection pin 111 of the product under test 11 on the side closer to the second support plate 7 in the first direction.

[0033] In some embodiments, multiple first tracks 8 are provided, arranged at intervals along a second direction, and a first support plate 6 is slidably connected to each first track 8; multiple second tracks 9 are provided, arranged at intervals along a second direction, and a second support plate 7 is slidably connected to each second track 9. Through the distributed guidance of multiple tracks, the first support plate 6 and the second support plate 7 can remain parallel and the load can be distributed during the approach process, thereby ensuring that the test probe 201 can smoothly abut against the detection pin 111. (Refer to...) Figure 1 In this embodiment of the application, there are two of each of the first track 8 and the second track 9.

[0034] Furthermore, in some embodiments, a first driving structure 12 is connected to the side of the first support plate 6 away from the test probe 201. The first driving structure 12 is used to push the first support plate 6 to reciprocate along the first track 8. A second driving structure 13 is connected to the side of the second support plate 7 away from the test probe 201. The second driving structure 13 is used to push the second support plate 7 to reciprocate along the second track 9.

[0035] It should be noted that the first drive structure 12 and the second drive structure 13 can be side-push type toggle chucks. The side-push guide rod of the side-push type toggle chuck is fixedly connected to the support plate. By pushing the handle of the side-push type toggle chuck upward, the support plate can be pushed along the track closer to the test position and locked. By pressing down the handle of the side-push type toggle chuck downward, the clamping force can be released and the support plate can be pushed along the track away from the test position. The first drive structure 12 and the second drive structure 13 can also be cylinders. The piston rod end of the cylinder is fixedly connected to the corresponding support plate. When the working medium (such as compressed air) enters the cylinder cavity and pushes the piston rod to extend, the piston rod pushes the support plate towards the test position in the second direction, realizing the lateral contact and locking of the test probe 201 and the detection pin 111. When the other side cavity of the cylinder exhausts air and the piston rod retracts, the support plate can be driven to move along the track away from the test position.

[0036] In some embodiments, the substrate 1 has a groove 102 and a limiting block 10 at the detection position. The groove 102 extends along a second direction, and the limiting block 10 is connected to the substrate 1 and disposed at one end of the groove 102 in the second direction. When the product 11 to be tested is tested, the carrier housing 40 is located in the groove 102, and the limiting block 10 rotates to a first position, that is, abuts against one end face of the carrier device 4 in the second direction. The abutment between the limiting block 10 and the end face of the carrier device 4 ensures that the carrier housing 40 stops at the same position each time, thereby achieving consistency of the test position and avoiding misalignment or interference between the test probe 201 and the detection pin 111 due to overtravel.

[0037] In some embodiments, to further enhance positioning reliability and ease of operation, the limiting block 10 is rotatably connected to the base plate 1. After the supporting housing 40 slides to the slide groove 102, the limiting block 10 is rotated to the first position, that is, the limiting block 10 abuts against one end face of the supporting device 4 in the second direction. After the detection is completed, the limiting block 10 is rotated away from the first position.

[0038] After the supporting housing 40 slides into the slide groove 102 and abuts against the other end of the slide groove 102, the limiting block 10 can be rotated clockwise (or counterclockwise) at a predetermined angle to reach the first position, abutting against the end face of the supporting device 4, and positioning the supporting device 4. After the test is completed, the limiting block 10 is rotated in the opposite direction to the retracted position to release the abutment against the supporting device 4, so that the supporting device 4 can exit along the slide groove 102.

[0039] In some embodiments, each test probe 201 can elastically compress or extend in the first direction. The elastic extension and contraction of the test probe 201 during contact allows for adaptive adjustment of its pressure on the detection pin 111 while maintaining good electrical contact. This avoids excessive pressure applied by the test probe 201 to the detection pin 111, preventing damage and effectively preventing bending or deformation of the detection pin 111 during the testing process.

[0040] Furthermore, referring to Figure 4 and Figure 5In some embodiments, the supporting housing 40 further includes a base 406, a top plate 403, and a sealing structure 407. The base 406 includes a bottom plate 4061 and side plates 4062 arranged opposite each other in a first direction. Both side plates 4062 have detection openings 402. The bottom plate 4061 is used to support the product 11 to be tested. The top plate 403 is arranged opposite to the base 406 in the thickness direction of the bottom plate 4061, and together with the base 406, forms a receiving cavity 401. In the second direction, the receiving cavity 401 is closed on one side and open on the other. The top plate 403 is detachably connected to the base 406. The sealing structure 407 is located on the open side of the receiving cavity 401 and is detachably connected to the base 406. It should be noted that the cross-section of the receiving cavity 401 formed by the top plate 403 and the base 406 in the second direction is adapted to the shape of the product 11 to be tested.

[0041] In this embodiment, the top plate 403 and the base 406 are detachably connected on the closed side of the accommodating cavity 401 via a knob plunger 408. The sealing structure 407 is detachably connected to the base 406 via a spring clip 409, and the sealing structure 407 can press and fix the product under test 11 through the spring clip 409. After the test, if a defective product is found, simply slide the carrier housing 40 off the base plate 1, and then disassemble the sealing structure 407 and the top plate 403 to easily remove the product under test 11 with the corresponding number, facilitating rapid sorting and subsequent processing.

[0042] Reference Figure 6 In some embodiments, a ventilation groove 404 extending in a second direction is formed on the surface of the top plate 403 facing away from the substrate 1, and a plurality of ventilation holes 405 are spaced apart along the second direction on the surface of the top plate 403 facing the substrate 1, each ventilation hole 405 being connected to the ventilation groove 404. Furthermore, each ventilation hole 405 penetrates the top plate 403. The supporting device 4 also includes a sealing plate 41, which is connected to the surface of the top plate 403 facing away from the substrate 1. The sealing plate 41 has a test port 411 penetrating through it, which is connected to the ventilation groove 404.

[0043] In this embodiment, the ventilation slot 404 forms a main air passage on the surface of the top plate 403. Multiple ventilation holes 405 correspond one-to-one with the air inlets 112 of each product under test 11. The sealing plate 41 seals the ventilation slot 404 into an integrated air chamber, and the test port 411 serves as the sole external air inlet. All air inlets 112 of the products under test 11 are connected to the same ventilation slot 404 through their respective ventilation holes 405. During testing, only a single flexible hose needs to be connected to the test port 411 to apply consistent air pressure to multiple products under test 11 simultaneously. This design not only simplifies the testing process and improves testing efficiency but also ensures that each product under test 11 receives the same test pressure, further enhancing the comparability and reliability of the test data.

[0044] Reference Figure 7 and Figure 8 In some embodiments, the testing fixture further includes a material handling device 5, which includes a storage tube 501 extending along a second direction and a positioning structure 503. The storage tube 501 passes through the positioning structure 503, which is used to connect with the supporting housing 40 in the second direction. The storage tube 501 has a through-hole in the middle to form a storage cavity 502, which is adapted to the receiving cavity 401. The positioning structure 503 is used to connect with the supporting housing 40 in the second direction, and the storage cavity 502 is used to sequentially accommodate multiple products 11 to be tested along the second direction.

[0045] In this embodiment, during loading, the positioning structure 503 is connected to the supporting housing 40 via positioning pin holes 5031 to ensure precise alignment between the storage cavity 502 and the receiving cavity 401. By tilting the storage tube 501, the products to be tested 11 in the storage cavity 502 can slide sequentially into the receiving cavity 401; after testing, the products can also be quickly exported by tilting the storage tube 501, eliminating the need for manual loading and unloading. This design significantly shortens the loading and unloading time, further improving the testing efficiency of the products to be tested 11.

[0046] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0047] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0048] The embodiments, implementation methods, and related technical features of this application can be combined and substituted for each other without conflict.

[0049] The above are merely preferred embodiments of this application and are not intended to limit this application in any way. Any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of this application without departing from the scope of the technical solution of this application shall still fall within the scope of the technical solution of this application.

Claims

1. A testing fixture, characterized in that, Having intersecting first and second directions, including: The substrate (1) has a first surface (101); The first pin assembly (2) and the second pin assembly (3) are both located on the first surface (101) and are arranged at a relative distance in the first direction. Each pin assembly includes a test probe (201), and the interval between the first pin assembly (2) and the second pin assembly (3) constitutes a test position. The carrier device (4) includes a carrier housing (40) extending in a second direction. The carrier housing (40) has a receiving cavity (401) for accommodating the product to be tested (11). In a first direction, detection openings (402) communicating with the receiving cavity (401) are provided on the opposite side walls of the carrier housing (40) for exposing the detection pins (111) of the product to be tested (11) located in the receiving cavity (401). When testing the product under test (11), the carrier housing (40) is located at the test position, and the test probe (201) abuts against the detection pin (111) of the product under test (11) through the detection opening (402).

2. The test fixture according to claim 1, characterized in that, In the second direction, the accommodating cavity (401) can sequentially accommodate a plurality of products under test (11), and the detection pin (111) of each product under test (11) in the first direction is exposed from the corresponding detection opening (402).

3. The testing fixture according to claim 2, characterized in that, The first pin assembly (2) and the second pin assembly (3) each include a plurality of test probes (201), and the test probes (201) in each pin assembly are spaced apart along the second direction.

4. The testing fixture according to claim 3, characterized in that, Also includes: The first support plate (6) and the second support plate (7) are located on the first surface (101), are arranged opposite to each other in the first direction, and are respectively located on both sides of the test position in the first direction; The test probe (201) of the first pin assembly (2) is fixedly connected to one side of the first support plate (6) relative to the second support plate (7), and the test probe (201) of the second pin assembly (3) is fixedly connected to one side of the second support plate (7) relative to the first support plate (6).

5. The testing fixture according to claim 4, characterized in that, Also includes: The first track (8) and the second track (9) are both located on the first surface (101) and extend along the first direction, and are respectively located on both sides of the test position in the first direction. The first support plate (6) is slidably connected to the first track (8), and the second support plate (7) is slidably connected to the second track (9). When testing the product under test (11), the first support plate (6) can slide along the first direction toward the direction close to the second support plate (7) to drive the test probe (201) of the first pin assembly (2) to abut against the detection pin (111) of the product under test (11) on the side of the first support plate (6) in the first direction. The second support plate (7) can slide along the first direction toward the direction close to the first support plate (6) to drive the test probe (201) of the second pin assembly (3) to abut against the detection pin (111) of the product under test (11) on the side of the second support plate (7) in the first direction.

6. The test fixture according to claim 1, characterized in that, Also includes: The material handling device (5) includes a positioning structure (503) and a storage tube (501) extending along a second direction. The storage tube (501) passes through the positioning structure (503), which is used to splice with the bearing housing (40) in the second direction. The storage tube (501) forms a storage cavity (502) through the middle. The storage cavity (502) is adapted to the receiving cavity (401). The storage cavity (502) is used to sequentially accommodate multiple products to be tested (11) along the second direction and send the multiple products to be tested (11) into the receiving cavity (401).

7. The test fixture according to claim 1, characterized in that, The supporting housing (40) has a top plate (403) on the side away from the substrate (1). The top plate (403) has a ventilation groove (404) extending in a second direction on the surface of the side away from the substrate (1). The top plate (403) has a plurality of ventilation holes (405) spaced apart along the second direction on the surface of the side facing the substrate (1). Each ventilation hole (405) is connected to the ventilation groove (404). The supporting device (4) further includes: a sealing plate (41), the sealing plate (41) is connected to the side surface of the top plate (403) away from the substrate (1), the sealing plate (41) has a test port (411) that passes through it, and the test port (411) is connected to the ventilation groove (404); When testing the product under test (11), the air inlet (112) of each product under test (11) is connected to the corresponding vent (405).

8. The test fixture according to claim 1, characterized in that, The supporting housing (40) further includes: The base (406) includes a base plate (4061) and side plates (4062) arranged opposite each other in a first direction. The detection opening (402) is provided on both side plates (4062). The base plate (4061) is used to support the product to be tested (11). The top plate (403) is disposed opposite to the base (406) in the thickness direction of the bottom plate (4061), and together with the base (406) forms the receiving cavity (401). The top plate (403) and the base (406) are detachably connected. In the second direction, the receiving cavity (401) is closed on one side and open on the other side. A sealing structure (407) is located on the opening side of the accommodating cavity (401) and is detachably connected to the base (406).

9. The test fixture according to claim 1, characterized in that, In the first direction, each of the test probes (201) is capable of elastic compression or extension.

10. The test fixture according to claim 1, characterized in that, The substrate (1) has a groove (102) at the detection position. The groove (102) extends along the second direction. When the product to be tested (11) is tested, the bearing housing (40) is located in the groove (102).

11. The test fixture according to claim 10, characterized in that, Also includes: A limiting block (10) is rotatably connected to the substrate (1) and is disposed at one end of the slide groove (102) in the second direction.

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