A ceramic tile defect marking system

Abstract

The utility model relates to a kind of ceramic tile defect identification system, including defect identification device, encoder, control device and spotlight module, defect identification device is configured as the optical image of obtaining ceramic tile in first position, and according to optical image identification the defect information of ceramic tile;Encoder is configured as the line speed of obtaining ceramic tile on growth line;Control device is configured as receiving defect information, and according to defect information and line speed obtains control signal;Spotlight module includes N spotlight, N spotlight according to control signal is identified to the defect position of ceramic tile in second position and emits light rays.This application identifies the defect information of ceramic tile by defect identification device, control device obtains control signal according to defect information and line speed, after spotlight module receives control signal, corresponding spotlight is lighted up and irradiates the corresponding defect position of ceramic tile, let worker irradiate ceramic tile on production line by spotlight, see the surface defect identified, to reduce defect missed detection.

Description

Technical Field

[0001] This utility model relates to the field of ceramic tile production technology, and in particular to a ceramic tile defect identification system. Background Technology

[0002] As an important material for building decoration, the surface quality of ceramic tiles directly affects the aesthetics and market value of the final product. On increasingly automated ceramic tile production lines, products flow continuously and at high speeds. However, due to the complexity of the production process (such as the influence of raw material proportioning, pressing, glazing, and firing), various types of surface defects (such as cracks, spots, color differences, edge chipping, and uneven glaze) inevitably occur during tile production. These defects are random and frequent, posing a serious challenge to product quality control.

[0003] Currently, the industry widely uses automated online inspection systems based on machine vision to identify defects on tile surfaces. These systems typically utilize high-resolution industrial cameras to capture tile images in real time and employ advanced image processing and artificial intelligence algorithms (such as deep learning models) to identify and locate defects. The identified defect information and its location results are displayed to production line operators in real time via a defect notification screen. For example, the defect location and type are indicated on the tile image displayed on the screen using highlighted boxes, markers, or text annotations.

[0004] However, this "screen prompt" method faces a key bottleneck in practical applications: in high-speed assembly line production scenarios, operators need to simultaneously focus on two key information sources—the physical tiles themselves moving rapidly on the assembly line, and the prompt screen displaying defect location information. This requires workers to frequently switch visual focus, quickly compare information, and make decisions (such as confirmation, sorting, or marking) within a very short time. Due to the limited visual attention and information processing capacity of the human eye, under high-speed production rhythms, workers often find it difficult to efficiently and accurately observe the physical tiles and interpret the screen prompts simultaneously. This problem of "distraction" and "cognitive overload" can easily lead to missed defects, misjudgments, or operational delays, which not only affects the final product quality but may also reduce overall production efficiency. Utility Model Content

[0005] Therefore, it is necessary to provide a tile defect identification system to address the problem that workers often cannot simultaneously view the defect warning screen and the tiles on the production line when the production speed of existing tiles is relatively fast.

[0006] A tile defect identification system includes a defect identification device configured to acquire an optical image of the tile at a first position and identify defect information of the tile based on the optical image.

[0007] An encoder configured to acquire the linear velocity of the tiles on the production line;

[0008] A control device configured to receive the defect information and obtain a control signal based on the defect information and the linear velocity;

[0009] The spotlight module includes N spotlights, which emit light to mark the defect locations of the tiles at a second position according to the control signal.

[0010] In one embodiment, the control device is electrically connected to N spotlights via N relays; the control signal includes a conduction signal and a delay signal, the relay drives the corresponding spotlight to power on according to the conduction signal, and the relay controls the delayed power-on of the spotlight according to the delay signal.

[0011] In one embodiment, at two defect locations on the same row of the marked grid, the interval between the power-on times of the spotlight is not less than a first set time.

[0012] In one embodiment, the control device calculates the delay signal according to the formula T=X / V, where T is the delay signal, X is the X-axis coordinate of the defect location, and V is the linear velocity of the tile on the production line.

[0013] In one embodiment, the encoder is configured to calculate the linear velocity by capturing pulse signals from the production line where the tiles are located, combined with the rotation ratio of the production line and the diameter of the rotating wheel.

[0014] In one embodiment, the value of B satisfies: B = L / K; where L is the length of the tile and K is the resolution size.

[0015] In one embodiment, the defect identification device communicates with the control device via a CAN bus.

[0016] In one embodiment, the aperture size of the spotlight is adjustable.

[0017] In one embodiment, the brightness of the spotlight is adjustable.

[0018] The tile defect identification system in the above embodiments has at least the following beneficial effects: In this application, the defect identification device takes pictures of the tiles on the production line, obtains optical images of the tiles, and compares the optical images with a pre-set standard tile database to identify the defect information of the tiles and feeds it back to the control device; the control device obtains control signals based on the defect information and the linear speed of the tiles on the production line obtained through the encoder; after receiving the control signal, the spotlight module lights up the corresponding spotlight to illuminate the corresponding defect position of the tile, so that workers can see the identified surface defects by illuminating the tiles on the production line with the spotlight, thereby reducing the missed detection of defects. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the structure of a tile defect identification system in one embodiment;

[0020] Figure 2 A structural frame of a tile defect identification system in one embodiment. Figure 1 ;

[0021] Figure 3 A structural frame of a tile defect identification system in one embodiment. Figure 2 ;

[0022] Figure 4 This is a schematic diagram of a tile defect identification system in one embodiment.

[0023] The correspondence between the reference numerals and the component names is as follows:

[0024] 10 Defect identification device, 20 Control device, 30 Encoder, 40 Spotlight module, 41 Spotlight, 50 Relay. Detailed Implementation

[0025] To better understand the above-mentioned objectives, features, and advantages of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0026] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and therefore the scope of protection of the invention is not limited to the specific embodiments disclosed below.

[0027] The following describes some embodiments of the collision detection device of the present invention with reference to the accompanying drawings.

[0028] like Figures 1 to 4As shown, this embodiment discloses a tile defect identification system and a defect identification device 10. The defect identification device 10 is configured to acquire an optical image of the tile at a first position and identify the defect information of the tile based on the optical image.

[0029] Encoder 30, encoder 30 is configured to acquire the linear velocity of the tile on the production line;

[0030] Control device 20 is configured to receive defect information and obtain control signals based on the defect information and linear velocity;

[0031] The spotlight module 40 includes N spotlights 51, which emit light to mark the defective positions of the tiles in a second position according to the control signal.

[0032] This application discloses a tile defect identification system. The defect identification device 10 takes pictures of the tiles on the production line to obtain optical images of the tiles and compares them with a pre-set standard tile database to identify the defect information of the tiles and feeds it back to the control device 20. The control device 20 obtains control signals based on the defect information and the linear speed of the tiles on the production line obtained through the encoder 30. After receiving the control signals, the spotlight module 40 lights up the corresponding spotlight 51 to illuminate the corresponding defect position of the tile, allowing workers to see the identified surface defects by illuminating the tiles on the production line with the spotlight, thereby reducing the number of defects missed.

[0033] The defect identification device 10 can photograph the tiles on the production line to obtain optical images of the tiles, and compare these images with a standard tile database to obtain defect information. The standard tile database can be pre-established by the defect identification device 10 and may include several standard tile images. For example, standard tiles corresponding to various defects can be manually defined, optical images of these standard tiles can be photographed, and the images can be entered into the standard tile database. It should be noted that defects can be one or a combination of color differences, spots, scratches, pinholes, glaze defects, and pattern anomalies.

[0034] The defect identification device 10 can trigger the taking of a picture of the tile when the tile reaches a first position. The first position can be triggered by the photoelectric sensor when the tile reaches a designated position, generating a position signal and transmitting it to the defect identification device 10, which then drives the defect identification device 10 to take a picture of the tile immediately or after a certain delay.

[0035] The control device 20 can receive defect information and linear velocity sent by the defect identification device 10 and the encoder 30, and output a control signal according to the defect information and linear velocity to drive the corresponding spotlight 51 to emit light to mark the defective location on the tile. For example, the control device 20 can calculate the delay conduction time of the corresponding spotlight 51 based on the defective location information and the speed of the tile on the production line, so that when the tile reaches the second position, the corresponding spotlight 51 emits light to mark the channel and the defective location after a certain delay. It should be noted that the second position can be the starting point of the light projection range of the spotlight 51 or a set distance from the starting point. The identification of the second position can be confirmed by the control device 20 acquiring pulse signals from the production line.

[0036] like Figure 4 As shown, in addition to the features of the above embodiments, this embodiment further specifies that: the defect information includes the defect location coordinates and the number of defects;

[0037] The defect identification device 10 is also configured to establish a rectangular coordinate system with two adjacent sides of the optical image. The rectangular coordinate system is divided into A*B identification grids, where A is the number of rows of the identification grids and B is the number of columns of the identification grids. The value of A is the same as the value of N. Each row of identification grids is configured with a spotlight 51. The control device 20 determines the identification grid illuminated by the spotlight 51 according to the defect position coordinates.

[0038] The defect identification device 10 can also process the acquired optical image. Specifically, the defect identification device 10 establishes a rectangular coordinate system using two adjacent sides of the optical image as the X-axis and Y-axis, respectively, and divides the rectangular coordinate system into A*B identification grids. Based on N spotlights 51 arranged in an array along the Y-axis, the number of rows A of the identification grids is the same as the number of spotlights 51. Each spotlight 51 illuminates a defect in one row of identification grids. For example, if the defect location coordinates on the tile are 2,3, the control device 20 controls the second spotlight 51 to illuminate the defect location in the second row of the rectangular coordinate system, thereby identifying the defect.

[0039] It should be noted that different spotlights 51 can illuminate defect locations in different rows of the Cartesian coordinate system at the same time, and each spotlight 51 is controlled independently. In addition, the number of defects refers to the number of defect locations on the tile, and the control device 20 can control a single spotlight 51 to illuminate defect locations appearing in different marked grids in the same row at different times.

[0040] like Figure 3As shown, in addition to the features of the above embodiments, this embodiment further specifies that: the control device 20 is electrically connected to N spotlights 51 through N relays 50; the control signal includes a conduction signal and a delay signal, the relays 50 drive the corresponding spotlights 51 to be energized according to the conduction signal, and the relays 50 control the delayed energization of the spotlights 51 according to the delay signal.

[0041] Each spotlight 51 is connected to the signal output terminal of the control device 20 via a relay 50. The relay 50 can receive a conduction signal and a delay signal from the control device 20 to control the power supply of the spotlight 51. For example, the conduction signal can be a high-level signal. When the relay 50 receives a high-level signal, it conducts and establishes a power supply circuit with the corresponding spotlight 51. The delay signal can be a signal that controls the relay 50 to conduct with a delay. For example, when the tile reaches the second position, the timer in the control device 20 starts counting. The required delay time is calculated based on the defect position coordinates and the linear velocity of the tile on the production line. Only after the timer counts to the delay time does the control device 20 output a high-level signal to the relay 50 corresponding to the spotlight 51 that needs to be lit, thereby illuminating and marking the defect position.

[0042] In addition to the features of the above embodiments, this embodiment further specifies that: the gap between the power-on time of the spotlight 51 at two defect positions on the same row of identifier grids is not less than a first set time.

[0043] Specifically, when tile defects appear at different locations within the same row on a Cartesian coordinate system, the illumination time between two adjacent defect locations needs to be spaced out by a first set time. This prevents the spotlight 51 from continuously illuminating the tile, which could mislead workers into believing that all illuminated locations are defective, leading to incorrect judgments. Based on this design, the reliability of the marking system is ensured. It should be noted that the first set time should be set according to the size of the marking grid and the linear speed of the tile on the production line. It should not be too small, as this would result in too small an opening between the spotlight 51 and the worker's naked eye being unable to effectively detect whether the light emitted by the spotlight 51 is extinguishing. Similarly, the first set time should not be too large, as this would prevent some defect locations from receiving light from the spotlight 51, causing missed detections.

[0044] In addition to the features of the above embodiments, this embodiment further specifies that: the control device 20 calculates the delay signal according to the formula T=X / V, where T is the delay signal, X is the X-axis coordinate of the defect position coordinate, and V is the linear velocity of the tile on the production line.

[0045] The control device 20 extracts the X-axis value from the coordinates of the defect location and obtains the control delay signal according to the calculation formula T = X / V. By obtaining the delay signal, the timing time of the timer in the control device 20 can be determined. When the tile reaches the second position, after the delay time corresponding to the delay signal, the defective part of the tile enters the illumination range of the spotlight 51, and the corresponding spotlight is lit to illuminate the defective part of the tile.

[0046] In addition to the features of the above embodiments, this embodiment further specifies that: the encoder 30 is configured to obtain the linear velocity by capturing the pulse signal of the production line where the tile is located, and combining the rotation ratio of the production line and the diameter of the rotating wheel.

[0047] The encoder 30 provides highly accurate angular displacement or angular velocity measurements. By precisely measuring the rotation angle or speed of the drive wheel, combined with a known and fixed wheel diameter, the linear displacement or linear velocity of the conveyor belt or production line can be calculated directly and accurately, with a precision far exceeding that of contact speed measuring wheels that rely on friction. In addition, the encoder 30 can generate high-frequency pulse signals, which the control device 20 can quickly capture and process, making the calculation and feedback of linear velocity almost real-time. This facilitates the control device 20 in quickly calculating delay signals and determining when the tile reaches the second position, ensuring that the corresponding spotlight 51 is reliably illuminated.

[0048] like Figure 4 As shown, in addition to the features of the above embodiments, this embodiment further defines that the value of B satisfies: B=L / K; where L is the length of the tile and K is the resolution size.

[0049] For example, taking an 800*800mm tile as an example, the defect identification device 10 acquires an optical image of the tile measuring 800*800mm and establishes a Cartesian coordinate system based on two adjacent sides of the optical image. The number of spotlights 51 is 8, the tile length L is 800mm, the resolution is set to 100, and B equals 8. The Cartesian coordinate system is then divided into 64 grids. It should be noted that the value of K can be adjusted according to the size of the tile and / or the aperture size of the spotlights 51.

[0050] In addition to the features of the above embodiments, this embodiment further specifies that the defect identification device 10 and the control device 20 communicate via a CAN bus.

[0051] Among them, the defect identification device 10 establishes a connection with the control device 20 through CAN bus communication. When the defect identification device 10 detects a defect on the tile, the control device 20 can immediately take over the bus to ensure that the defect information is delivered to the control device 20 within milliseconds. This is suitable for scenarios that require rapid linkage control and is crucial for tiles on high-speed production lines.

[0052] In addition to the features of the above embodiments, this embodiment further specifies that the aperture size of the spotlight 51 is adjustable.

[0053] In addition to the features of the above embodiments, this embodiment further specifies that the brightness of the spotlight 51 is adjustable.

[0054] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0055] The above embodiments only illustrate several implementation methods of this utility model, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A ceramic tile defect identification system, characterized in that, include: A defect identification device (10) is configured to acquire an optical image of the tile at a first position and identify defect information of the tile based on the optical image. The defect information includes the defect location coordinates and the number of defects; Encoder (30), the encoder (30) is configured to acquire the linear velocity of the tile on the production line; A control device (20) is configured to receive the defect information and obtain a control signal based on the defect information and the linear velocity; The spotlight module (40) includes N spotlights (51), which emit light to mark the defect positions of the tiles at the second position according to the control signal. The defect identification device (10) is further configured to establish a rectangular coordinate system with two adjacent sides of the optical image. The rectangular coordinate system is divided into A*B identification grids, where A is the number of rows of the identification grids and B is the number of columns of the identification grids. The value of A is the same as the value of N. Each row of the identification grids corresponds to one spotlight (51). The control device (20) determines the identification grid illuminated by the spotlight (51) according to the defect position coordinates. The control device (20) is electrically connected to N spotlights (51) via N relays (50); the control signal includes a conduction signal and a delay signal. The relay (50) drives the corresponding spotlight (51) to be energized according to the conduction signal, and the relay (50) controls the delayed energization of the spotlight (51) according to the delay signal; the gap between the energization time of the spotlight (51) at two defect positions on the same row of the marking grid is not less than a first set time.

2. The tile defect identification system according to claim 1, characterized in that, The control device (20) calculates the delay signal according to the formula T=X / V, where T is the delay signal, X is the X-axis coordinate of the defect location coordinate, and V is the linear velocity of the tile on the production line.

3. The tile defect identification system according to claim 2, characterized in that, The encoder (30) is configured to obtain the linear velocity by capturing the pulse signal of the production line where the tile is located, and by combining the rotation ratio of the production line and the diameter of the rotating wheel.

4. The ceramic tile defect identification system according to claim 1, characterized in that, The value of B satisfies: B = L / K; where L is the length of the tile and K is the resolution.

5. The ceramic tile defect identification system according to claim 1, characterized in that, The defect identification device (10) communicates with the control device (20) via a CAN bus.

6. The ceramic tile defect identification system according to claim 1, characterized in that, The aperture size of the spotlight (51) is adjustable; And / or, The brightness of the spotlight (51) is adjustable.

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