Probe magnetization handpiece for atomic force microscope

Abstract

The utility model discloses a kind of probe magnetization hand-held device for atomic force microscope, it is related to the technical field of atomic force microscope, including substrate, the side of the substrate is grip area, the other side is needle mounting area, probe adhesion part is fixedly arranged on the surface of needle mounting area, the probe adhesion part is used to adsorb probe and make the needle tip of probe upward, probe anti-collision part is fixedly arranged on the both sides of the probe adhesion part, the upper end of the probe anti-collision part is higher than the needle tip of the adsorbed probe.The probe magnetization hand-held device for atomic force microscope provided by the utility model can improve stability, safety and convenience in the process of magnetizing probe, reduce probe loss.

Description

Technical Field

[0001] This utility model relates to the field of atomic force microscopy technology, and in particular to a probe magnetization handheld device for atomic force microscopy. Background Technology

[0002] Among various methods for characterizing the morphology and properties of micro-areas, atomic force microscopy (AFM) is not only highly inclusive of sample types, capable of detecting soft biological samples, hard materials, chemically synthesized polymers, and magnetic samples, but it can also perform nanoscale morphology and property characterization under various atmospheres. Especially in the fields of surface magnetism, electricity, and mechanics, it can conveniently and non-destructively characterize the surface morphological structural units and their physical properties of materials.

[0003] The atomic force microscope (AFM) probe is the core component in the entire AFM imaging and performance characterization process. The probe consists of a tip, a microcantilever, and a substrate. The tip, located at the very front of the probe, typically has a radius of 10 to tens of nanometers and interacts with the sample surface to detect its surface morphology and physical properties. The microcantilever is usually made of silicon or silicon nitride wafers, with a length typically ranging from 100 to 500 μm, while its width and thickness vary depending on the specific application and design. The elastic modulus of the microcantilever is generally less than 1 N / m to ensure that the probe can sensitively respond to the sample's surface features upon contact. The substrate is commonly made of silicon or silicon nitride wafers, with a length and width typically ranging from 2 to 4 mm and a thickness of less than 1 mm. It serves as the force-bearing surface for gripping the probe and also as the fixing surface for placing it on the detector. Due to the precision and functionality of the probe structure, and its small and lightweight design, the installation process requires a high level of hand-eye coordination, gripping technique, and stability of the probe. It is necessary to spend some time practicing and mastering these skills before the formal test.

[0004] In electromagnetic research, samples undergoing AFM testing require performance testing before and after magnetic field reversal. This magnetic field reversal is achieved through the magnetic assimilation of the probe. The conventional method involves holding the probe substrate with tweezers, inserting it into the magnet cavity or gap, keeping the probe tip facing the N or S pole of the magnet, and holding it stably for a period to achieve directional magnetization. The entire magnetization time varies from seconds to minutes, and can even reach up to two hours, depending on experimental requirements. Because the magnetization process is entirely performed by the tester holding the substrate with tweezers, the substrate itself is very smooth, and the tweezers tips are not perfectly flat due to long-term experiments. This easily causes the probe to slip, or the probe to be damaged or its performance degraded due to hand tremors. Even experienced testers, with utmost care, may slip and require remagnetization. Students operating independently often spend a considerable amount of time on the magnetization process. Furthermore, students generally experience a sense of difficulty and hope for a simple and easy-to-use tool to assist in testing during initial learning and actual testing. In view of this, we propose a probe magnetization handheld device to solve the existing technical problems. Utility Model Content

[0005] The purpose of this invention is to provide a probe magnetization handheld device for atomic force microscopes to solve the problems existing in the prior art, thereby improving the stability, safety and convenience of the probe magnetization process and reducing probe wear.

[0006] To achieve the above objectives, this utility model provides the following solution: This utility model provides a probe magnetization handheld device for atomic force microscopes, including a substrate. One side of the substrate is a gripping area, and the other side is a needle loading area. A probe adhesion part is fixedly provided on the surface of the needle loading area. The probe adhesion part is used to adsorb the probe and make the probe tip face upward. Probe anti-collision parts are fixedly provided on both sides of the needle loading area of ​​the probe adhesion part. The upper end of the probe anti-collision part is higher than the tip of the adsorbed probe.

[0007] In one embodiment, the probe adhesion portion is located at the middle position in the width direction of the substrate.

[0008] In one embodiment, the probe adhesion portion has a square structure.

[0009] In one embodiment, the probe adhesion part is a self-adhesive silicone sheet.

[0010] In one embodiment, the substrate is a glass substrate.

[0011] In one embodiment, an anti-slip tape is fixedly adhered to the surface of the gripping area.

[0012] In one embodiment, the probe anti-collision part has a cuboid structure, and the upper surface of the probe anti-collision part is parallel to the upper surface of the substrate.

[0013] In one embodiment, the probe anti-collision part is made of glass.

[0014] In one embodiment, the probe anti-collision part is fixed to the substrate by adhesive.

[0015] The present invention achieves the following technical advantages over the prior art: This invention provides a probe magnetizing handheld device for atomic force microscopes, comprising a substrate, a gripping area on one side and a probe loading area on the other side. The gripping area is the part held by the operator and is made of a non-slip material. A probe adhesion part is fixedly provided on the surface of the probe loading area, which is used to attract the probe and keep the probe tip facing upward. Probe anti-collision parts are fixedly provided on both sides of the probe adhesion part in the probe loading area, with the upper end of the probe anti-collision part higher than the tip of the attracted probe. The operator can hold the gripping area and insert the substrate into the magnetic cavity or the gap of the magnet, keeping the probe tip facing the N or S pole of the magnet. Compared with the traditional method of holding the probe substrate with tweezers and inserting it into the magnetic cavity or the gap of the magnet, this greatly improves the stability of the probe magnetization process and is more convenient to use. Moreover, the probe anti-collision parts on both sides of the probe adhesion part can protect the probe. When the hand holding the substrate touches the magnet due to hand tremors, the upper end of the probe anti-collision part will contact the magnet first, avoiding the probe from colliding with the magnet, thus protecting the probe, improving the safety of the probe magnetization process, and effectively reducing probe wear. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of the structure of the probe magnetization handheld device for an atomic force microscope in this embodiment of the present invention; Figure 2 This is a top view of the probe magnetization handheld device for an atomic force microscope according to an embodiment of the present invention; Figure 3 This is a front view of the probe magnetization handheld device for an atomic force microscope according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the use of the probe magnetization handheld device for the atomic force microscope in this embodiment of the present invention.

[0018] In the figure: 1-substrate, 2-gripping area, 3-needle loading area, 4-probe adhesion part, 5-probe anti-collision part, 6-anti-slip tape, 7-magnet. Detailed Implementation

[0019] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0020] The purpose of this invention is to provide a probe magnetization handheld device for atomic force microscopes to solve the problems existing in the prior art, improve the stability, safety and convenience of the probe magnetization process, and reduce probe wear.

[0021] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, the utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0022] like Figures 1-4 As shown, this embodiment provides a probe magnetization handheld device for atomic force microscopes, including a substrate 1. One side of the substrate 1 is a gripping area 2, and the other side is a needle loading area 3. A probe adhesion part 4 is fixedly provided on the surface of the needle loading area 3. The probe adhesion part 4 is used to adsorb the probe and make the probe tip face upward. Probe anti-collision parts 5 are fixedly provided on both sides of the needle loading area 3 of the probe adhesion part 4. The upper end of the probe anti-collision part 5 is higher than the tip of the adsorbed probe.

[0023] The gripping area 2 is the part held by the operator. It is made of a non-slip material and uses the probe adhesion part 4 on the surface of the needle loading area 3 to attract the probe. When the probe is attached to the probe adhesion part 4, its tip faces upwards. The operator can hold the gripping area to insert the substrate 1 into the magnet cavity or magnet gap (e.g., Figure 3 As shown in magnet 7, keeping the probe tip facing the N or S pole of the magnet greatly improves the stability of the magnetization process compared to the traditional method of holding the probe substrate with tweezers and inserting it into the magnetic cavity or gap of the magnet. It is more convenient to use, reduces the difficulty of learning and training, and increases the rate of independent use. Moreover, the upper ends of the probe anti-collision parts 5 on both sides of the probe adhesion part 4 are higher than the tip of the adsorbed probe, which can protect the probe. When the hand holding the substrate 1 touches the magnet due to hand tremors, the upper end of the probe anti-collision part 5 will contact the magnet first, avoiding the probe from colliding with the magnet and protecting the probe. This improves the safety of the magnetization process and can effectively reduce probe wear.

[0024] In this embodiment, the probe adhesion part 4 is located at the middle position in the width direction of the substrate 1. The probe adhesion part 4 has a square structure. The probe adhesion part 4 is a square self-adhesive silicone sheet, which is bonded to the upper surface of the substrate 1 by its own adhesiveness or by additional adhesive backing. The probe is adsorbed by the adhesiveness of the self-adhesive silicone sheet itself, and the probe is easy to remove. After repeated use, dirt on the surface of the self-adhesive silicone sheet can be washed off with water, and the suction power is restored after natural drying. In addition to using a self-adhesive silicone sheet, other self-adhesive adsorption materials can also be used for the probe adhesion part 4.

[0025] In this embodiment, substrate 1 is a glass substrate, which can be made from glass slides commonly used in laboratories.

[0026] In this embodiment, anti-slip tape 6 is fixedly adhered to the surface of the gripping area 2 to improve the stability during gripping.

[0027] In this embodiment, the probe anti-collision part 5 has a cuboid structure, and its upper surface is parallel to the upper surface of the substrate 1. The probe anti-collision part 5 is made of glass, but it can also be made of rigid plastic. The probe anti-collision part 5 can be glued and fixed to the upper surface of the substrate 1.

[0028] The probe magnetizing handheld device for atomic force microscopy provided in this embodiment can stably and safely assist in the probe magnetization process, minimizing probe wear caused by the operation. Due to its advantages of convenient operation, high efficiency, and strong adaptability, this handheld device can be precisely applied to atomic force microscopy platforms to assist in the debugging of related experiments.

[0029] In the description of this utility model, it should be understood that the terms "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this utility model. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0030] In the description of this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to the internal communication between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0031] This utility model uses specific examples to illustrate its principles and implementation methods. The above description of the embodiments is only for the purpose of helping to understand the method and core idea of ​​this utility model. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the idea of ​​this utility model. In summary, the content of this specification should not be construed as a limitation of this utility model.

Claims

1. A probe magnetizing handheld device for an atomic force microscope, characterized in that: The device includes a substrate, one side of which is a gripping area and the other side is a needle loading area. A probe adhesion part is fixedly provided on the surface of the needle loading area. The probe adhesion part is used to adsorb the probe and make the tip of the probe face upward. Probe anti-collision parts are fixedly provided on both sides of the needle loading area of ​​the probe adhesion part. The upper end of the probe anti-collision part is higher than the tip of the adsorbed probe.

2. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The probe adhesion portion is located at the middle position in the width direction of the substrate.

3. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The probe adhesion part has a square structure.

4. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The probe adhesion part is a self-adhesive silicone sheet.

5. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The substrate is a glass substrate.

6. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The gripping area surface is fixedly bonded with anti-slip tape.

7. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The probe anti-collision part has a cuboid structure, and the upper surface of the probe anti-collision part is parallel to the upper surface of the substrate.

8. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The probe's anti-collision part is made of glass.

9. The probe magnetizing handheld device for atomic force microscopy according to claim 1, characterized in that: The probe anti-collision part is fixed to the substrate by adhesive.

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