Test probe with axial limiting structure

Abstract

The utility model discloses a test probe with axial limit structure, including shell subassembly, center conductor, outer conductor, spring body and limit ring, shell subassembly includes shell and sleeve, and the outer surface of outer conductor is equipped with accommodating groove, and the inner wall of shell subassembly is equipped with limit groove, and limit ring is embedded between accommodating groove and limit groove, and the inner surface of limit ring is in abutment in the inner wall of accommodating groove, and the outer surface is in abututment in the inner wall of limit groove to limit the axial relative displacement between shell subassembly and outer conductor. The utility model discloses through setting up limit ring forms axial limit, avoids product assembly not to be in place or overpressure extrusion to insulator, and the stability product size guarantees product assembly's consistency, improves the yield of product batch production, simultaneously, the force that the sleeve repeatedly rebounds produces is accepted, effectively avoids shell and outer conductor to come off, and the reliability and service life of probe structure have been greatly improved.

Description

Technical Field

[0001] This utility model relates to the field of test probe technology, and in particular to a test probe with an axial limiting structure. Background Technology

[0002] When designing test probes, it is necessary not only to meet the electrical performance requirements of radio frequency transmission, but also to consider the reliability of mechanical structures and the consistency of batch assembly, as well as other production and usage requirements. Currently, radio frequency test probes are gradually becoming miniaturized. Under the constraint of small structural dimensions, the shell and outer conductor of existing small radio frequency test probes are usually assembled by riveting or threading. In order to achieve a stable 50Ω coaxial characteristic impedance, the inner diameter of the shell connected to the outer conductor and the outer diameter of the outer conductor need to be close to or even basically equal. The gap between the two is extremely small, and there is no limiting structure during the assembly process. Problems such as incomplete assembly and excessive pressing that squeezes the internal insulator are prone to occur during assembly. Ultimately, this results in the overall size of the finished product being unqualified, the mass production yield being low, and the elasticity and electrical performance being unstable.

[0003] Furthermore, during probe operation, the sleeve or flange repeatedly presses down and springs back to its original position. The springback force generated during this process is directly concentrated at the connection point between the outer shell and the outer conductor. Under long-term operation, the fixed positions of the riveted or threaded connections are prone to loosening and separation, damaging the overall coaxial structure of the probe, further affecting RF transmission performance, and shortening the probe's lifespan.

[0004] Therefore, there is an urgent need for a test probe with an axial limiting structure that can be adapted to a 50Ω coaxial characteristic impedance, achieve assembly limiting, distribute reciprocating reset stress, and prevent the outer shell from becoming loose from the outer conductor. Utility Model Content

[0005] The purpose of this invention is to design a test probe with an axial limiting structure to solve the problems of the prior art.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows:

[0007] A test probe with an axial limiting structure is provided, comprising:

[0008] A hollow housing assembly, the housing assembly comprising an outer shell and a sleeve arranged sequentially along the axial direction;

[0009] The center conductor is coaxially fixed within the housing assembly via an insulator;

[0010] An outer conductor is disposed between the housing assembly and the central conductor;

[0011] A spring body, disposed between the housing assembly and the outer conductor, is used to provide axial elastic force; and

[0012] Limiting ring;

[0013] The outer surface of the outer conductor is provided with a receiving groove along the circumferential direction. The inner wall of the housing assembly is provided with a limiting groove corresponding to the position of the receiving groove. The limiting ring is embedded between the receiving groove and the limiting groove, and the inner surface of the limiting ring abuts against the inner wall of the receiving groove and the outer surface abuts against the inner wall of the limiting groove, so as to limit the axial relative displacement between the housing assembly and the outer conductor.

[0014] Furthermore, the limiting ring includes a first limiting ring, the outer conductor is provided with a first receiving groove for accommodating the first limiting ring, the inner wall of the outer shell is provided with a corresponding first limiting groove for adapting to the first limiting ring, the end of the sleeve at least partially abuts against the first limiting ring, and the first limiting ring limits the outer shell axially.

[0015] Furthermore, the limiting ring also includes a second limiting ring, and the outer surface of the outer conductor is provided with a second receiving groove for accommodating the second limiting ring. The second receiving groove and the first receiving groove are spaced apart along the axial direction. The inner wall of the sleeve is provided with a corresponding second limiting groove for fitting the second limiting ring, and the second limiting ring limits the sleeve along the axial direction.

[0016] Furthermore, the outer casing and the outer conductor are fixed together by riveting.

[0017] Furthermore, the inner wall of the outer casing is provided with an internal thread, and the outer surface of the outer conductor is provided with an external thread adapted to the internal thread. The outer casing and the outer conductor are fixed by a threaded connection.

[0018] Furthermore, the inner wall of the sleeve is provided with a first annular limiting platform, and the outer conductor placed inside the sleeve extends outward to provide a second annular limiting platform. One end of the spring body abuts against the first annular limiting platform, and the other end of the spring body abuts against the second annular limiting platform.

[0019] Furthermore, the outer conductor includes a first outer conductor and a second outer conductor. One end of the second outer conductor is embedded inside the first outer conductor, and the other end of the second outer conductor has a insertion cavity inside. The inner wall of the opening end of the insertion cavity expands outward to form a guide slope for guiding the product to be tested to be inserted.

[0020] Furthermore, the inner side of the second outer conductor is provided with an annular spring for connecting the product to be tested, and the peripheral wall of the insertion cavity is provided with a mounting groove, in which the annular spring is installed.

[0021] Furthermore, the insulator includes a first insulator disposed between the outer shell and the central conductor, a second insulator disposed between the first outer conductor and the central conductor, and a third insulator disposed between the second outer conductor and the central conductor.

[0022] Furthermore, the annular spring is a helical spring or a wave spring.

[0023] The beneficial effects of this utility model are as follows: This utility model provides a test probe with an axial limiting structure. To meet the 50Ω coaxial characteristic impedance, the outer diameter of the outer conductor is close to the inner diameter of the outer shell. By adding a limiting ring between the shell assembly and the outer conductor to form an axial limit, the problem of probe misassembly or overpressure squeezing of the insulator is avoided. This stabilizes the product size, elasticity, and electrical properties, ensures product assembly consistency, and improves the yield of mass production. At the same time, the force generated by the reciprocating springback of the sleeve is borne by the limiting ring, avoiding concentrated force at the connection and fixing point between the shell and the outer conductor. This effectively prevents the shell and the outer conductor from loosening, ensures the stability of the probe's coaxial structure, and prevents RF performance from easily attenuating, significantly improving the reliability and service life of the probe structure. Attached Figure Description

[0024] The accompanying drawings described below are merely some embodiments. Those skilled in the art can obtain other drawings based on these drawings without any creative effort. In the drawings:

[0025] Figure 1 This is a schematic diagram of the overall structure of a test probe with an axial limiting structure according to the present invention;

[0026] Figure 2 This is a cross-sectional view of a test probe with an axial limiting structure according to a first embodiment of the present invention;

[0027] Figure 3 This is an exploded view of a first embodiment of a test probe with an axial limiting structure according to the present invention;

[0028] Figure 4 This is a cross-sectional view of a second embodiment of the test probe with an axial limiting structure according to the present invention;

[0029] Figure 5 This is an exploded view of a second embodiment of the test probe with an axial limiting structure according to the present invention;

[0030] Figure 6 This is a cross-sectional view of the sleeve in Embodiment 2 of the test probe with an axial limiting structure of this utility model;

[0031] Figure 7This is a cross-sectional view of the outer shell of a test probe with an axial limiting structure according to this utility model;

[0032] Figure 8 This is a cross-sectional view of the second outer conductor in a test probe with an axial limiting structure according to this utility model.

[0033] The attached diagram lists the components represented by each number as follows:

[0034] Housing assembly-1, outer shell-11, first limiting groove-111, internal thread-112, sleeve-12, second limiting groove-121, first annular limiting platform-122, center conductor-2, outer conductor-3, first outer conductor-31, first receiving groove-311, second receiving groove-312, external thread-313, second annular limiting platform-314, second outer conductor-32, insertion cavity-321, guide slope-3211, mounting groove-3212, spring body-4, limiting ring-5, first limiting ring-51, second limiting ring-52, annular spring-6, first insulator-7, second insulator-8, third insulator-9. Detailed Implementation

[0035] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0036] like Figures 1 to 8 The following is an embodiment of this application:

[0037] This utility model discloses a test probe with an axial limiting structure, including a hollow shell assembly 1, a central conductor 2, an outer conductor 3, a spring body 4, and a limiting ring 5. Specifically:

[0038] The housing assembly 1 includes an outer shell 11 and a sleeve 12 arranged sequentially along the axial direction. The center conductor 2 is coaxially fixed inside the housing assembly 1 through an insulator. The spring body 4 is disposed between the housing assembly 1 and the outer conductor 3 to provide axial elastic force. The outer conductor 3 is disposed between the housing assembly 1 and the center conductor 2. The outer surface of the outer conductor 3 is provided with a receiving groove along the circumferential direction. The inner wall of the housing assembly 1 is provided with a limiting groove corresponding to the position of the receiving groove. The limiting ring 5 is embedded between the receiving groove and the limiting groove, and the inner surface of the limiting ring 5 abuts against the inner wall of the receiving groove, and the outer surface of the limiting ring 5 abuts against the inner wall of the limiting groove, so as to limit the axial relative displacement between the housing assembly 1 and the outer conductor 3. This solves the problem that the small radio frequency test probe is not properly assembled with the outer shell 11 and the outer conductor 3 or the insulator is squeezed due to lack of positioning during assembly to meet 50Ω impedance matching, and the defect that the connection between the outer shell 11 and the outer conductor 3 is loosened due to the force generated by the reciprocating reset of the sleeve 12 after long-term use.

[0039] Example 1:

[0040] This embodiment is a single limiting ring scheme. The limiting ring 5 includes a first limiting ring 51, which is designed as a "C"-shaped ring. The outer conductor 3 includes a first outer conductor 31 and a second outer conductor 32. The first outer conductor 31 is provided with a first receiving groove 311 for accommodating the first limiting ring 51. The inner wall of the outer shell 11 is correspondingly provided with a first limiting groove 111 for fitting the first limiting ring 51. The end of the sleeve 12 at least partially abuts against the first limiting ring 51. The first limiting ring 51 limits the outer shell 11 axially, forming an axial limiting structure. This avoids improper assembly of the outer shell 11 and the first outer conductor 31 or excessive compression of the insulator during assembly, ensuring the consistency of the test probe product assembly and improving the yield of mass production.

[0041] In this embodiment, the inner surface of the outer shell 11 is provided with an internal thread 112, and the outer surface of the first outer conductor 31 is provided with an external thread 313 that is adapted to the internal thread 112. The outer shell 11 and the first outer conductor 31 are fixed by a threaded connection. When the test probe is working, the force generated by the repeated rebound of the sleeve 12 is borne and dispersed by the first limiting ring 51, and the force acting on the outer shell 11 is small. The connection between the outer shell 11 and the first outer conductor 31 is fixed by a thread, which is stable and prevents the connection between the outer shell 11 and the first outer conductor 31 from loosening. This ensures the stability of the coaxial structure of the test probe and increases the service life of the test probe.

[0042] Furthermore, the inner wall of the sleeve 12 is provided with a first annular limiting platform 122, and the first outer conductor 31 placed inside the sleeve 12 extends outward to provide a second annular limiting platform 314. One end of the spring body 4 abuts against the first annular limiting platform 122, and the other end of the spring body 4 abuts against the second annular limiting platform 314. When the test probe is working, the spring body 4 drives the sleeve 12 to perform repeated rebound motion.

[0043] The second outer conductor 32 has a hollow structure. One end of the second outer conductor 32 is embedded inside the first outer conductor 31, and the other end of the second outer conductor 32 has a insertion cavity 321. The opening end of the insertion cavity 321 expands outward to form a guide slope 3211 with a certain angle, which is used to guide the product under test to be inserted and reduce wear. An annular spring 6, which is a helical spring or a wave spring, is also provided inside the second outer conductor 32, surrounding the central conductor 2. The peripheral wall of the insertion cavity 321 has a mounting groove 3212, and the annular spring 6 is installed in the mounting groove 3212. Because the annular spring 6 can deform, it has a buffering effect, making the connection between the annular spring 6 and the connector under test soft, which can reduce the wear between the annular spring 6 and the connector under test, thereby improving the service life of the test probe.

[0044] Furthermore, the center conductor 2 is made of metal and is needle-shaped. The insulator includes a first insulator 7, a second insulator 8, and a third insulator 9. The first insulator 7 is located between the outer shell 11 and the center conductor 2, and the first limiting ring 51 limits the outer shell 11 to prevent excessive compression of the first insulator 7 during assembly with the first outer conductor 31. The second insulator 8 is located between the first outer conductor 31 and the center conductor 2 to fix the position of the center conductor 2. The third insulator 9 is located between the second outer conductor 32 and the center conductor 2. The three insulators coaxially insulate and isolate the center conductor 2, preventing the center conductor 2 from swaying during insertion and ensuring stable RF impedance performance during the operation of the test probe, thus significantly improving the service life of the test probe.

[0045] Example 2:

[0046] This embodiment employs a double-limiting ring limiting structure design. Based on the first limiting ring 51 of Embodiment 1, the limiting ring 5 in this embodiment further includes a second limiting ring 52. The second limiting ring 52 is also designed as a "C"-shaped ring. The outer conductor 3 includes a first outer conductor 31 and a second outer conductor 32. The outer surface of the first outer conductor 31 is also provided with a second receiving groove 312 for accommodating the second limiting ring 52. The second receiving groove 312 and the first receiving groove 311 are spaced apart axially. The inner wall of the sleeve 12 is correspondingly provided with a second limiting groove 121 for fitting the second limiting ring 52. The second limiting ring 52 is embedded between the second receiving groove 312 and the second limiting groove 121. The second limiting ring 52 limits the sleeve 12 along the axial direction. When the test probe is working, the force of the sleeve 12 repeatedly pressing down and rebounding acts on the second limiting ring 52, which will not affect the connection position between the outer shell 11 and the first outer conductor 31. The first outer conductor 31 is partially assembled inside the outer shell 11. In addition, the first limiting ring 51 limits the outer shell along the axial direction. The first limiting ring 51 and the second limiting ring 52 form a front and rear double-point axial limiting along the axial direction. Compared to a single-point limiting scheme using only a single limiting ring, the front and rear dual-point axial limiting structure can form two independent axial constraint fulcrums, effectively suppressing relative deflection and tilting between the outer shell 11 and the first outer conductor 31, ensuring the coaxiality of the components; the axial force can be shared by the first limiting ring 51 and the second limiting ring 52, avoiding force concentration that causes extrusion and wear of the limiting structure, significantly improving the structure's impact resistance and service life; at the same time, bidirectional constraint of axial displacement can better suppress axial movement, loosening and abnormal noise of components under reciprocating motion.

[0047] Furthermore, the limiting structure design of the double limiting ring means that the force generated by the repeated rebound of the sleeve 12 acts on the second limiting ring 52 and has no force on the outer shell 11. Therefore, the outer shell 11 and the first outer conductor 31 can be fixed by riveting or by threading, which further enhances the stability of the connection and prevents the connection between the outer shell and the first outer conductor from loosening.

[0048] In this embodiment, the first annular limiting stage 122, the second annular limiting stage 314, the spring body 4, the second outer conductor 32, the insertion cavity 321, the guide slope 3211, the annular spring 6, the mounting groove 3212, the first insulator 7, the second insulator 8, and the third insulator 9 are all consistent with those in Embodiment 1, ensuring the floating reset, insertion conduction performance, and coaxial limiting insulation characteristics of the test probe, and adapting to miniaturized test probe scenarios.

[0049] Assembly stage: The limiting ring is embedded between the receiving groove and the limiting groove to form an axial limit. This can prevent the outer shell and the outer conductor from being improperly assembled, and also prevent the outer shell and the outer conductor from being over-assembled and squeezing the first insulator. This stabilizes the product size, elasticity and electrical properties, ensures the consistency of the test probe product assembly, and improves the yield of mass production.

[0050] During operation: The axial force generated by the repeated floating and rebounding of the sleeve is entirely applied to the limiting ring and no longer to the connection position between the outer shell and the outer conductor. During long-term use, there will be no loosening or offset between the outer shell and the outer conductor, ensuring the stability of the coaxial structure of the test probe, making the RF performance less prone to attenuation, and greatly improving the reliability and service life of the test probe.

[0051] The embodiments described above merely illustrate the implementation of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A test probe with an axial limiting structure, characterized in that, include: A hollow housing assembly, the housing assembly comprising an outer shell and a sleeve arranged sequentially along the axial direction; The center conductor is coaxially fixed within the housing assembly via an insulator; An outer conductor is disposed between the housing assembly and the central conductor; A spring body, disposed between the housing assembly and the outer conductor, is used to provide axial elastic force; and Limiting ring; The outer surface of the outer conductor is provided with a receiving groove along the circumferential direction. The inner wall of the housing assembly is provided with a limiting groove corresponding to the position of the receiving groove. The limiting ring is embedded between the receiving groove and the limiting groove, and the inner surface of the limiting ring abuts against the inner wall of the receiving groove and the outer surface abuts against the inner wall of the limiting groove, so as to limit the axial relative displacement between the housing assembly and the outer conductor.

2. The test probe with an axial limiting structure according to claim 1, characterized in that, The limiting ring includes a first limiting ring, the outer conductor is provided with a first receiving groove for accommodating the first limiting ring, the inner wall of the outer shell is provided with a corresponding first limiting groove for adapting to the first limiting ring, the end of the sleeve at least partially abuts against the first limiting ring, and the first limiting ring limits the outer shell axially.

3. A test probe with an axial limiting structure according to claim 2, characterized in that, The limiting ring further includes a second limiting ring, and the outer surface of the outer conductor is also provided with a second receiving groove for accommodating the second limiting ring. The second receiving groove and the first receiving groove are spaced apart along the axial direction. The inner wall of the sleeve is correspondingly provided with a second limiting groove for adapting to the second limiting ring. The second limiting ring limits the sleeve along the axial direction.

4. A test probe with an axial limiting structure according to claim 1, characterized in that, The outer shell and the outer conductor are fixed together by riveting.

5. A test probe with an axial limiting structure according to claim 1, characterized in that, The inner wall of the outer casing is provided with an internal thread, and the outer surface of the outer conductor is provided with an external thread that matches the internal thread. The outer casing and the outer conductor are fixed together by a threaded connection.

6. A test probe with an axial limiting structure according to claim 1, characterized in that, The inner wall of the sleeve is provided with a first annular limiting platform, and the outer conductor placed inside the sleeve extends outward to provide a second annular limiting platform. One end of the spring body abuts against the first annular limiting platform, and the other end of the spring body abuts against the second annular limiting platform.

7. A test probe with an axial limiting structure according to claim 1, characterized in that, The outer conductor includes a first outer conductor and a second outer conductor. One end of the second outer conductor is embedded inside the first outer conductor, and the other end of the second outer conductor has a insertion cavity. The inner wall of the opening end of the insertion cavity expands outward to form a guide slope for guiding the product to be tested to be inserted.

8. A test probe with an axial limiting structure according to claim 7, characterized in that, The inner side of the second outer conductor is also provided with an annular spring for connecting the product to be tested, and the peripheral wall of the insertion cavity is provided with a mounting groove, in which the annular spring is installed.

9. A test probe with an axial limiting structure according to claim 7, characterized in that, The insulator includes a first insulator disposed between the outer shell and the central conductor, a second insulator disposed between the first outer conductor and the central conductor, and a third insulator disposed between the second outer conductor and the central conductor.

10. A test probe with an axial limiting structure according to claim 8, characterized in that, The ring spring is either a helical spring or a wave spring.

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