A test apparatus employing a multi-channel probe

Abstract

The utility model discloses a kind of test devices using multi-channel probe, including mounting seat, guide seat, movable part, at least two probe components, deviation correction elastic component, needle elastic component and reset elastic piece;Guide seat is located below mounting seat, movable part is movably arranged in guide seat, probe component is installed in movable part and its lower end passes through movable part, deviation correction elastic component connects mounting seat and guide seat, needle elastic component passes through mounting seat and connects movable part, reset elastic piece is located between movable part and guide seat, the lower end of guide seat is provided with guide slot and needle slot, ensure the accurate positioning of measured piece and probe needle down. The device realizes high-precision, non-destructive, stable testing process through triple elastic collaborative mechanism, with compact structure, convenient to disassemble and assemble, long service life, low maintenance cost and other advantages.

Description

Technical Field

[0001] This application belongs to the field of radio frequency testing technology, and in particular relates to a testing device using a multi-channel probe. Background Technology

[0002] With the rapid iteration of consumer electronics products (such as smartphones and wearable devices), the integration of product functions continues to increase, while the overall size of the device continues to shrink. This trend leads to a dual challenge for motherboard design: on the one hand, more electronic components (such as RF modules and sensors) need to be integrated, and on the other hand, the available layout space continues to shrink. Taking RF devices as an example, the mainstream single-channel signal ports of the 4G era can no longer meet the transmission requirements of multiple frequency bands and multiple modes in the 5G era, and the component density per unit area of ​​the motherboard has increased significantly.

[0003] Against this backdrop, board-to-board (BTB) connectors have been widely adopted due to their unique advantages. These connectors achieve parallel transmission of multiple signals through a high-density pin array and can define differentiated transmission channels according to signal type, significantly improving motherboard integration within a limited space. However, the large-scale application of BTB connectors presents new challenges to testing technologies:

[0004] 1. Tolerance matching challenges

[0005] In actual production, there are multiple levels of tolerance accumulation: assembly deviation between the BTB connector and the motherboard, positioning error between the motherboard and the test fixture, and installation tolerance between the test probe and the fixture. These factors cause significant misalignment between the probe and the BTB connector contact point during testing. Traditional rigid probes, lacking a correction mechanism, are prone to three types of problems: false tests due to poor signal contact, physical damage to the BTB connector caused by excessive probe pressure, and structural deformation or breakage of the probe itself due to off-center loading.

[0006] 2. Lifespan bottleneck is prominent.

[0007] Most existing BTB test probes use a spring-loaded pin structure, which focuses on single-contact stability but lacks long-term reliability. The average lifespan of mainstream products is only about 10,000 insertion / removal cycles, far below the million-cycle testing requirements of consumer electronics production lines. Frequent probe replacements not only increase maintenance costs but also impact production line efficiency due to downtime.

[0008] 3. Constraints on testing efficiency

[0009] To circumvent tolerance issues, existing solutions often employ methods such as increasing the probe contact area (sacrificing test density) or adding calibration steps (reducing test efficiency). Such compromises fail to meet the "high precision, zero false positives, and fast-paced" testing requirements of consumer electronics production lines.

[0010] In summary, existing technologies have not effectively resolved the contradiction between tolerance adaptation, lifespan improvement, and efficiency optimization in BTB connector testing. There is an urgent need for a new probe device that combines high-precision correction capability, ultra-long service life, and high-efficiency testing characteristics. Utility Model Content

[0011] The purpose of this invention is to provide a testing device using a multi-channel probe, which solves the problems of poor tolerance adaptability, short service life, and low testing efficiency in the prior art.

[0012] To achieve the above objectives, the present invention provides the following technical solution:

[0013] A testing device employing a multi-channel probe includes:

[0014] Mounting base;

[0015] A guide seat is located below the mounting base;

[0016] The movable component is vertically movable within the guide seat.

[0017] At least two probe assemblies are disposed within the movable member and are movable accordingly, with the lower ends of the probe assemblies extending out of the movable member;

[0018] The corrective elastic component is connected to the mounting base and the guide seat at its upper and lower ends, respectively.

[0019] The lower needle elastic component has its upper end passing through the mounting base and its lower end connected to the movable part;

[0020] A reset elastic element is disposed between the movable element and the guide seat, for resetting the movable element upward;

[0021] The guide seat has a guide groove at its lower end and a needle slot that extends from the guide groove to the lower end of the probe assembly.

[0022] Furthermore, the corrective elastic component includes a corrective guide post and a corrective elastic element sleeved thereon. The lower end of the corrective guide post is connected to the guide seat, and the upper end passes through the mounting seat and is provided with an anti-detachment part. The two ends of the corrective elastic element abut against the mounting seat and the guide seat, respectively.

[0023] Furthermore, the lower needle elastic component includes a lower needle guide post and a lower needle elastic element sleeved thereon. The lower end of the lower needle guide post is connected to the movable member, and the upper end passes through the mounting base. The lower end of the lower needle elastic element abuts against the movable member, and the upper end leaves a gap between itself and the mounting base when the mounting base is in its initial position, and gradually abuts against the mounting base when the mounting base moves downward.

[0024] Furthermore, the mounting base has a through hole for the correction guide post to pass through, and the radial dimension of the anti-detachment part is larger than the diameter of the through hole to prevent the correction guide post from falling out downwards; the diameter of the through hole is larger than the outer diameter of the rod end of the correction guide post to reserve correction space; the lower end of the correction guide post is threadedly connected to the guide seat.

[0025] Furthermore, the movable part is provided with a connecting part, and the lower end of the lower needle guide post is threadedly connected to the connecting part; the mounting base has a limiting groove through which the upper end of the lower needle guide post passes, and the opening size of the limiting groove is larger than the outer size of the upper end of the lower needle guide post.

[0026] Furthermore, the lower needle elastic component also includes a fastener, which serves as an intermediate connector between the lower needle guide post and the movable component, and the lower end of the lower needle elastic component abuts against the fastener.

[0027] Furthermore, the movable component includes a slider and a receiving body disposed on the slider, and the slider and the receiving body are respectively provided with coaxial mounting holes for mounting the probe assembly.

[0028] Furthermore, the probe assembly includes:

[0029] Spring needle;

[0030] A center pin is inserted and connected above the spring pin;

[0031] A coaxial line is inserted and connected above the central pin;

[0032] The spring pin, center pin, and coaxial line are electrically connected to each other;

[0033] An insulating post is embedded in the mounting hole of the sliding body, and the spring pin is fixedly connected to the insulating post by adhesive bonding or interference fit, thereby fixing it in the mounting hole of the sliding body; an insulating post is embedded in the mounting hole of the receiving body, and the center pin and coaxial line are fixedly connected to the insulating post by adhesive bonding or interference fit, thereby fixing it in the mounting hole of the receiving body.

[0034] Furthermore, the guide seat includes a guide head and an upper cover fixed above the guide head, and the guide groove is provided at the lower end of the guide head; the upper cover is provided with a first slot, the guide head is provided with a second slot, the second slot is connected to the lower needle slot, the sliding body is slidably received in the second slot, the opening of the second slot is larger than the opening of the lower needle slot, and the opening of the first slot is smaller than the opening of the second slot, so as to limit the vertical sliding range of the sliding body.

[0035] Furthermore, the guide head has multiple positioning holes on the bottom wall surface of the second groove, and the sliding body has an equal number of positioning holes below it. The reset elastic element is installed between the positioning holes of the guide head and the sliding body. The sliding body has a protrusion below it, which is movably inserted into the lower needle groove.

[0036] Compared with existing technologies, the beneficial effects of this technology are:

[0037] 1. The probe assembly, combining the compression and reset functions of the secondary elastic component and the reset elastic element, perfectly integrates automatic alignment and testing. During alignment, the spring pin is cleverly concealed within the moving parts, avoiding mistesting caused by premature pin insertion in traditional testing. When the spring pin contacts the BTB connector, the elastic component provides precise elastic cushioning, allowing the spring pin to automatically adjust its position upon contact, achieving high-precision alignment. More importantly, the spring pin's own elastic properties ensure that the contact force is always controlled within a safe range, far below the damage threshold of the BTB connector pins, fundamentally avoiding physical damage to the ultra-fine pins and truly achieving non-destructive testing.

[0038] 2. The connections between components utilize a threaded, detachable mechanism, facilitating easy assembly and disassembly. In particular, the spring pin, a vulnerable component, can be replaced without restriction, eliminating the need to replace the entire probe assembly. This modular design not only significantly reduces maintenance costs but also revolutionizes the lifespan of the entire device, completely resolving the production line downtime caused by frequent probe replacements in traditional systems.

[0039] 3. This device can be adapted to BTB connectors with different pitches by simply replacing the spring pins and adjusting the elastic parameters, meeting the needs of rapid iteration in the consumer electronics industry. Its unique compression-reset mechanism provides stable and reliable contact for various signals (RF, power, data), eliminating the need to redesign test schemes for different signal types. Attached Figure Description

[0040] The accompanying drawings described below are merely some embodiments. Those skilled in the art can obtain other drawings based on these drawings without any creative effort. In the drawings:

[0041] Figure 1 This is a schematic diagram of the probe testing device of this utility model;

[0042] Figure 2 This is an exploded view of the probe testing device of this utility model;

[0043] Figure 3 This is a cross-sectional view of the probe testing device of this utility model;

[0044] Figure 4 for Figure 3 A magnified view of a section at point A in the middle;

[0045] Figure 5 This is a structural diagram of the correction elastic component in the probe testing device of this utility model;

[0046] Figure 6 This is a schematic diagram of the testing and correction process of the probe testing device of this utility model;

[0047] Figure 7 This is a schematic diagram of the probe testing device of this utility model during the needle insertion process.

[0048] The attached diagram lists the components represented by each number as follows:

[0049] 1. Mounting base; 2. Guide seat; 3. Moving part; 4. Probe assembly; 5. Correction elastic assembly; 6. Lower needle elastic assembly; 7. Reset elastic component; 11. Through hole; 12. Limiting groove; 21. Guide head; 22. Top cover; 221. First groove; 211. Lower needle groove; 212. Second groove; 213. Guide groove; 214. Positioning hole; 31. Sliding body; 32. Receiving body; 311. Mounting hole; 312. Protrusion; 313. Connecting part; 41. Spring needle; 42. Center needle; 43. Coaxial line; 44. Insulating post; 51. Correction guide post; 511. Anti-detachment part; 52. Correction elastic component; 61. Lower needle guide post; 62. Lower needle elastic component; 63. Fastener; 64. Gasket; 8. Connector. Detailed Implementation

[0050] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0051] like Figures 1 to 7 As shown, this embodiment of the present invention provides a testing device employing a multi-channel probe, comprising:

[0052] Mounting base 1, serving as a top connector, connects to other components. During testing, a downward pressure test is completed by continuously applying external force to mounting base 1. It is a plate-shaped component of uniform thickness, and as the core load-bearing component, it is made of a material with good rigidity, preferably SUS304 stainless steel plate.

[0053] Guide seat 2 is located below mounting seat 1;

[0054] Movable component 3 is movably mounted within guide seat 2.

[0055] At least two probe assemblies 4 are located within the movable part 3 and can move with it, with the lower end of the probe assembly 4 protruding from the movable part 3, so that it can directly contact the pin of the BTB connector 8 for testing;

[0056] The correction elastic component 5 is connected to the mounting base 1 and the guide base 2 at its upper and lower ends, respectively, and serves as a correction-level elastic component to provide primary buffering.

[0057] The lower needle elastic component 6 has its upper end passing through the mounting base 1 and its lower end connected to the movable part 3, serving as a lower needle-level elastic component to achieve secondary buffering.

[0058] The reset elastic element 7 is located between the movable element 3 and the guide seat 2, and is used to reset the movable element 3 upward to ensure that the probe assembly 4 is accurately reset after the test.

[0059] Through the triple elastic synergy, the unique micro-offset compensation and long lifespan requirements in BTB testing are solved.

[0060] The correction elastic component 5 includes a correction guide post 51 and a correction elastic element 52 sleeved on the correction guide post 51. The lower end of the correction guide post 51 is connected to the guide seat 2, and the upper end passes through the mounting seat 1 and is provided with an anti-detachment part 511. The two ends of the correction elastic element 52 abut against the mounting seat 1 and the guide seat 2 respectively.

[0061] The mounting base 1 has a through hole 11 for the guide post 51 to pass through. In this embodiment, the anti-detachment part 511 is a block structure with a cross-section of hexagonal shape and a certain height. The radial dimension of the anti-detachment part 511 is larger than the diameter of the through hole 11 to prevent the guide post 51 from detaching downwards. The diameter of the through hole 11 is larger than the outer diameter of the rod end of the guide post 51 to reserve space for correction. The guide post 51 will tilt at a certain angle during the correction process, so a gap is maintained between the outer side of its rod end and the inner wall of the through hole 11. The lower end of the guide post 51 is provided with an external thread, and the guide seat 2 is provided with a corresponding internal thread. The lower end of the guide post 51 is threadedly connected to the guide seat 2 for easy disassembly and assembly.

[0062] Furthermore, the through hole 11 is a countersunk hole with a tapered chamfer, and the lower end of the anti-detachment part 511 is provided with an inclined surface that matches the tapered chamfer of the countersunk hole. The tapered chamfer is 45 degrees, and the inclined surface at the lower end of the anti-detachment part 511 contacts it. The purpose of this design is to facilitate the tilting of the correction guide post 51 during the correction process so as to adapt to self-adaptation.

[0063] During the automatic correction process in the test, the guide seat 2 will tilt at a certain angle. The lower end of the correction guide post 51 is fixedly connected to the guide seat 2, so the correction guide post 51 will also tilt accordingly. In order to ensure that the correction guide post 51 can tilt freely, the outer diameter of the rod end of the correction guide post 51 is set to be smaller than the inner diameter of the through hole 11. In addition, the tapered chamfer of the through hole 11 and the inclined surface of the lower end of the anti-detachment part 511 are also designed to meet the requirements for free tilting of the correction guide post 51.

[0064] The lower needle elastic component 6 includes a lower needle guide post 61 and a lower needle elastic element 62 sleeved on the lower needle guide post 61. The lower end of the lower needle guide post 61 is connected to the movable part 3, and the upper end passes through the mounting base 1. The lower end of the lower needle elastic element 62 abuts against the movable part 3, and the upper end leaves a gap between the upper end and the mounting base 1 at the initial position of the mounting base 1. As the mounting base 1 moves downward, it gradually abuts against the mounting base 1. The purpose of leaving a gap is to allow the correction elastic component 5 to first cooperate with the guide seat 2 to complete the automatic correction during the test, and then gradually compress the lower needle elastic element 62, thereby driving the probe component 4 on the movable body to move downward for testing.

[0065] The upper end of the needle guide post 61 is provided with a cylindrical part with an end face, the outer diameter of which is larger than the outer diameter of the lower rod end. The mounting base 1 has a limiting groove 12 through which the needle guide post 61 passes. In this embodiment, the limiting groove 12 is a racetrack-shaped groove. The opening size of the limiting groove 12 is larger than the outer size of the cylindrical part with an end face at the upper end of the needle guide post 61. Its purpose is also to meet the automatic correction during testing, so that it can follow the tilt at a certain angle.

[0066] A notch is provided on the guide seat 2, the height of which is greater than the thickness of the connecting part 313 to allow for the movement of the connecting part 313. A block-shaped connecting part 313 is correspondingly protruding from the notch on the movable part 3. The connecting part 313 is provided with an internal thread, and the lower end of the lower needle guide post 61 is provided with an external thread. The lower end of the lower needle guide post 61 is threadedly connected to the connecting part 313 for easy assembly and disassembly.

[0067] Furthermore, the lower pin elastic component 6 also includes a fastener 63, which serves as an intermediate connector between the lower pin guide post 61 and the movable part 3. The lower end of the lower pin elastic component 62 abuts against the fastener 63. Specifically, the fastener 63 has an internal thread at the connection point with the lower pin guide post 61 and an external thread at the connection point with the movable part 3, allowing for a detachable connection between the two. The fastener 63 can be tightened or loosened along the axial direction of the lower pin guide post 61, thereby changing the effective compression of the lower pin elastic component 62. When the thickness of the BTB connector 8 or the test stroke requirements change, there is no need to replace the entire elastic component; simply rotating the fastener 63 allows for quick adjustment. In addition, the fastener 63 uses a threaded connection, making the lower pin guide post 61, the elastic component, and the gasket 64 independent sub-modules. When the elastic component fails or a different stiffness specification is required, only the fastener 63 needs to be removed for complete replacement, avoiding the need to disassemble and reassemble the entire movable part 3, thus shortening maintenance time.

[0068] In this embodiment, the correction elastic element 52 and the lower needle elastic element 62 are compression springs of different specifications. The specific specifications of the compression springs can be selected according to the actual test scenario, which is flexible and convenient.

[0069] The correction elastic component 5 and the lower needle elastic component 6 also include gaskets 64, which are respectively disposed between the correction elastic component 52 and the mounting base 1, and between the lower needle elastic component 62 and the mounting base 1. The gaskets 64 protect the mounting base 1, preventing the elastic component from damaging the surface of the mounting base 1. Additionally, because the openings of the through hole 11 and the limiting groove 12 on the mounting base 1 are relatively large, they also prevent the elastic component from sinking into them, causing damage to the elastic component and affecting the normal operation of the entire device.

[0070] In this embodiment, the pad 64 on the lower needle guide post 61 is specifically installed between the lower needle elastic member 62 and the cylindrical portion with end face of the lower needle guide post 61. Due to the elastic force of the lower needle elastic member 62, the pad 64 is tightly attached to the bottom end of the cylindrical portion. By replacing the pad with a washer of different thickness or adjusting the height of the lower needle guide post 61, the total height of the spring or the preload can be finely adjusted without replacing the spring, so as to quickly adapt to different BTB connector thicknesses or test force requirements.

[0071] The movable component 3 includes a slider 31 and a receiving body 32 disposed above the slider 31. The slider 31 and the receiving body 32 are respectively provided with mounting holes 311 for mounting the probe assembly 4 at the same axis position. The slider 31 can slide up and down in the guide seat 2, and the receiving body 32 moves up and down with the slider 31. Specifically, the top of the slider 31 is provided with a rectangular mounting groove of a certain depth, and the bottom of the receiving body 32 is embedded in the mounting groove.

[0072] In this embodiment, the connecting portion 313 on the movable part 3 is divided into two parts: one part is disposed on the sliding body 31, and the other part is disposed on the receiving body 32, with the outer contours of the upper and lower parts overlapping. When connected with the fastener 63, the connecting portion 313 on the receiving body 32 has a round hole, and the connecting portion 313 on the sliding body 31 has a threaded hole, thereby ensuring quick alignment and connection between the fastener 63 and the receiving body 32 and the sliding body 31. After installation, the stepped surface of the fastener 63 presses against the receiving body 32 to prevent loosening.

[0073] Probe component 4 includes:

[0074] The spring pin 41, as the end actuator of the probe assembly 4, forms a low-impedance, high-reliability electrical path with the pins of the BTB connector 8 under test. It can simultaneously carry RF, digital, power and control signals. It absorbs the assembly tolerance and downward impact between the fixture and the motherboard by its own compression stroke, preventing damage to the BTB connector 8. Its pin tip can swing slightly in the XY plane. With the cooperation of two-stage elastic components, it can achieve position self-adaptation and ensure test yield.

[0075] The center pin 42, which is connected above the spring pin 41, serves as the "central hub" of the probe assembly 4. The center pin 42 seamlessly transfers the test signal picked up by the spring pin 41 to the coaxial line 43, realizing low-loss transmission of multiple signals such as radio frequency / high-speed digital / power. The spring pin 41 has a limited stroke, and the center pin 42 provides rigid extension, allowing the coaxial line 43 to be kept away from the test surface, avoiding cable bending that could interfere with probe floating.

[0076] The coaxial cable 43 is plugged into the center pin 42. Part of the coaxial cable 43 is mounted on the movable part 3, and the rest extends to the signal interface of the test host. Specifically, the upper end of the coaxial cable 43 is firmly connected to the tail end of the center pin 42 by laser welding, and the lower end is directly welded to the interface board of the test machine, realizing an integrated signal transmission path.

[0077] The spring pin 41, the center pin 42, and the coaxial line 43 are electrically connected to form a signal path, and the spring pin 41, the center pin 42, and the coaxial line 43 are embedded and connected to each other as a whole.

[0078] The sliding body 31 has an insulating post 44 embedded in its mounting hole 311. The spring pin 41 is fixedly connected to the insulating post 44 by adhesive bonding or interference fit, thus fixing it in the mounting hole 311 of the sliding body 31. The receiving body 32 has an insulating post 44 embedded in its mounting hole 311. The center pin 42 and the coaxial line 43 are fixedly connected to the insulating post 44 by adhesive bonding or interference fit, thus fixing them in the mounting hole 311 of the receiving body 32. This design facilitates the disassembly and maintenance of the probe assembly 4, greatly shortening the maintenance time.

[0079] The spring pin 41 is completely hidden inside the guide seat 2 in its initial position. It only contacts the BTB connector 8 after the slider 31 moves down a certain distance, thus avoiding the problem of mistesting caused by premature pin insertion.

[0080] This modular design allows for individual replacement of damaged parts without disassembling the entire moving part.

[0081] The guide seat 2 includes a guide head 21 and an upper cover 22 fixed above the guide head 21. Similarly, the position on the guide seat 2 that connects to the correction guide post 51 is also divided into two overlapping parts, which are respectively set on the guide head 21 and the upper cover 22. Specifically, the upper cover 22 has a round hole and the guide head 21 has a threaded hole, which facilitates the quick alignment and connection of the correction guide post 51 with the upper cover 22 and the guide head 21.

[0082] The guide head 21 of the guide seat 2 is provided with a guide groove 213 at the lower end. The guide groove 213 has a floating margin in the X and Y directions, so that the guide seat 2 can initially adapt to the assembly tolerance of the BTB connector 8, the motherboard and the fixture, and complete automatic correction.

[0083] The top cover 22 has a first slot 221 through it. The first slot 221 is mainly to provide space for the upper and lower movement of the receiving body 32 to prevent it from rubbing and colliding with the top cover 22.

[0084] The guide head 21 of the guide seat 2 has a lower needle groove 211 that extends from the guide groove 213 to the lower end of the probe assembly 4 and a second groove 212 that communicates with the lower needle groove 211. That is, the second groove 212 communicates with the guide groove 213, thereby forming a stepped limiting structure. The slider 31 is slidably received in the second groove 212. The opening of the second groove 212 is larger than the opening of the lower needle groove 211, and the opening of the first groove 221 is smaller than the opening of the second groove 212, so as to limit the vertical sliding range of the slider 31.

[0085] Multiple positioning holes 214 are provided on the bottom wall surface of the guide head 21 located at the second slot 212. A corresponding number of positioning holes 214 are provided below the sliding body 31. A reset elastic element 7 is installed between the positioning holes 214 of the guide head 21 and the sliding body 31. Both ends of the reset elastic element 7 extend a certain distance into the upper and lower positioning holes 214 located on the same axis to provide positioning and prevent positional displacement during operation. When the stress applied to the mounting base 1 is released after the BTB connector 8 test is completed, the reset elastic element 7 resets the movable part 3 upwards, thereby causing the spring pin 41 to retract into the guide seat 2, protecting the spring pin 41 from external environmental influences. Specifically, the reset elastic element 7 is also a compression spring.

[0086] The slider 31 has a protrusion 312 below it. The protrusion 312 is movably inserted into the lower needle groove 211. The protrusion 312 is mainly used to support the spring needle 41, so as to prevent it from protruding too far from the slider 31 and to prevent it from bending or breaking during the test.

[0087] In this embodiment, two correction elastic components 5 are symmetrically arranged at the left and right ends of the mounting base 1, two lower needle elastic components 6 are symmetrically arranged at the front and rear ends of the mounting base 1, two probe components 4 are arranged side by side within the movable body, and four reset elastic components 7 are arranged at the four corners of the bottom of the movable body. This symmetrical design ensures more balanced and reliable stress during operation, further improving testing accuracy.

[0088] The working process of this device is as follows:

[0089] Testing Phase: Mounting base 1 moves downwards under external driving force. First, the alignment elastic component 5 is compressed, buffering the initial impact between mounting base 1 and guide seat 2. Simultaneously, the guide groove 213 at the bottom of guide seat 2 contacts the BTB connector 8 and automatically corrects alignment, providing initial buffering. (See [link]). Figure 6 When the displacement reaches the threshold (the gap between the lower needle elastic element 62 and the mounting base 1 closes), the lower needle elastic element 6 begins to compress. Simultaneously, the movable element 3 moves downwards within the guide seat 2 due to the reaction force of the lower needle elastic element 62. The spring pin 41 of the probe assembly 4 extends out of the movable element 3 and contacts the pin of the BTB connector 8 for automatic correction, providing secondary buffering. The reset elastic element 7 is compressed. See [link to documentation]. Figure 7 Multiple elastic synergies keep the contact force stably controlled within the range of 0.8-1.5N, preventing damage to the ultra-fine pins.

[0090] Signal transmission stage: The spring pin 41, center pin 42 and coaxial line 43 of probe assembly 4 form an electrical path to complete the synchronous testing of multiple signals such as radio frequency, power supply and data.

[0091] Reset Phase: With the external driving force withdrawn, the corrective elastic element 52 and the lower needle elastic element 62 gradually release their elastic force, pushing the mounting base 1 upwards; simultaneously, the reset elastic element 7 releases, precisely pushing the movable part 3 back to its initial position, and the spring needle 41 retracts into the guide seat 2. The gap design of the lower needle elastic component 6 ensures a smooth reset process, and the movement range of the movable part 3 is strictly limited by the slot structure of the guide seat 2.

[0092] This invention is particularly applicable to production lines for consumer electronics products such as smartphones and wearable devices, which have stringent requirements for testing accuracy and equipment lifespan. Through innovative designs featuring intelligent automatic correction, a fully detachable structure, and an ultra-long service life, it completely solves the core pain points in BTB connector testing, providing reliable technical support for quality assurance of high-density electronic products.

[0093] The embodiments described above merely illustrate the implementation of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A testing device employing a multi-channel probe, characterized in that, include: Mounting base (1); Guide seat (2) is located below the mounting seat (1); The movable part (3) is movably disposed within the guide seat (2). At least two probe assemblies (4) are disposed within the movable member (3) and can move with it, and the lower end of the probe assembly (4) extends out of the movable member (3). The upper and lower ends of the correction elastic component (5) are connected to the mounting base (1) and the guide seat (2) respectively; The lower needle elastic component (6) has its upper end passing through the mounting base (1) and its lower end connected to the movable part (3); A reset elastic element (7) is provided between the movable element (3) and the guide seat (2) for resetting the movable element (3) upward. The guide seat (2) has a guide groove (213) at its lower end, and a needle slot (211) extending from the guide groove (213) to the lower end of the probe assembly (4).

2. The testing device using a multi-channel probe according to claim 1, characterized in that: The correction elastic component (5) includes a correction guide post (51) and a correction elastic element (52) sleeved thereon. The lower end of the correction guide post (51) is connected to the guide seat (2), and the upper end passes through the mounting seat (1) and is provided with an anti-detachment part (511). The two ends of the correction elastic element (52) abut against the mounting seat (1) and the guide seat (2) respectively.

3. The testing device employing a multi-channel probe according to claim 1, characterized in that: The lower needle elastic component (6) includes a lower needle guide post (61) and a lower needle elastic element (62) sleeved thereon. The lower end of the lower needle guide post (61) is connected to the movable part (3), and the upper end passes through the mounting seat (1). The lower end of the lower needle elastic element (62) abuts against the movable part (3), and the upper end leaves a gap between the mounting seat (1) and the mounting seat (1) when the mounting seat (1) is in the initial position, and gradually abuts against the mounting seat (1) when the mounting seat (1) moves downward.

4. The testing device using a multi-channel probe according to claim 2, characterized in that: The mounting base (1) has a through hole (11) through which the correction guide post (51) passes. The radial dimension of the anti-detachment part (511) is larger than the diameter of the through hole (11) to prevent the correction guide post (51) from falling out downwards. The diameter of the through hole (11) is larger than the outer diameter of the rod end of the correction guide post (51) to reserve correction space. The lower end of the correction guide post (51) is threadedly connected to the guide seat (2).

5. A testing device employing a multi-channel probe according to claim 3, characterized in that: The movable part (3) is provided with a connecting part (313) protruding out, and the lower end of the needle guide post (61) is threadedly connected to the connecting part (313); the mounting base (1) has a limiting groove (12) through which the upper end of the needle guide post (61) passes, and the opening size of the limiting groove (12) is larger than the outer size of the upper end of the needle guide post (61).

6. The testing device employing a multi-channel probe according to claim 3, characterized in that: The lower needle elastic component (6) also includes a fastener (63), which is disposed as an intermediate connector between the lower needle guide post (61) and the movable part (3), and the lower end of the lower needle elastic component (62) abuts against the fastener (63).

7. A testing device employing a multi-channel probe according to claim 1, characterized in that: The movable part (3) includes a sliding body (31) and a receiving body (32) disposed on the sliding body (31). The sliding body (31) and the receiving body (32) are respectively provided with coaxial mounting holes (311) for mounting the probe assembly (4).

8. A testing device employing a multi-channel probe according to claim 7, characterized in that, The probe assembly (4) includes: Spring needle (41); A center pin (42) is inserted and connected above the spring pin (41); The coaxial line (43) is inserted and connected above the center pin (42); The spring pin (41), the center pin (42), and the coaxial line (43) are electrically connected to each other; An insulating post (44) is embedded in the mounting hole (311) of the sliding body (31). The spring pin (41) is fixedly connected to the insulating post (44) by adhesive bonding or interference fit, thereby fixing it in the mounting hole (311) of the sliding body (31). An insulating post (44) is embedded in the mounting hole (311) of the receiving body (32). The center pin (42) and the coaxial line (43) are fixedly connected to the insulating post (44) by adhesive bonding or interference fit, thereby fixing it in the mounting hole (311) of the receiving body (32).

9. A testing device employing a multi-channel probe according to claim 7, characterized in that: The guide seat (2) includes a guide head (21) and an upper cover (22) fixed above the guide head (21). The guide groove (213) is located at the lower end of the guide head (21). The upper cover (22) has a first slot (221) through it. The guide head (21) has a second slot (212) connected to the needle slot (211). The sliding body (31) is slidably accommodated in the second slot (212). The opening of the second slot (212) is larger than the opening of the needle slot (211). The opening of the first slot (221) is smaller than the opening of the second slot (212) to limit the vertical sliding range of the sliding body (31).

10. A testing device employing a multi-channel probe according to claim 9, characterized in that: The guide head (21) has multiple positioning holes (214) on the bottom wall surface of the second groove (212), and the sliding body (31) has an equal number of positioning holes (214) below it. The reset elastic element (7) is installed between the guide head (21) and the positioning holes (214) of the sliding body (31). The sliding body (31) has a protrusion (312) below it, and the protrusion (312) is movably inserted into the lower needle groove (211).

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