A display screen burn-in test cabinet

Abstract

The utility model discloses a display screen ageing test cabinet, display screen ageing test cabinet includes cabinet, test frame and test integrated component, is equipped with test cavity in the cabinet, test frame sets up in the test cavity, is used for bearing the tool of preloading display screen, test integrated component includes drive mechanism and test integrated board, and test integrated board is located the bottom of drive mechanism in the test cavity, and is located the top of signal integrated board on the tool, and drive mechanism sets up in the test cavity, and drive mechanism is connected with test integrated board and drives test integrated board to move down. The signal integrated board on test integrated board and tool is docked together to realize quick and display screen tool docking, and test integrated board, signal integrated board upper and lower side by side, two integrated board's high frequency needle, signal contact docking, keep the stability of high frequency signal connection, transmission in the process such as detection, ageing test, improve the speed of detection, and accuracy, stability.

Description

Technical Field

[0001] This utility model relates to the technical field of display screen testing equipment, and more particularly to a display screen aging test cabinet. Background Technology

[0002] The core component of electronic products is the motherboard. Motherboard production involves surface mount technology (SMT) machines. Soldering defects generated during the SMT process are often invisible to the naked eye and difficult to detect with visual equipment. Therefore, electronic products often need to undergo testing and aging tests before leaving the factory.

[0003] For displays, the core structure is the video driver board, which also has defects that are difficult to detect. Before leaving the factory, displays need to undergo testing and aging tests to ensure that all functions are normal, that they can start up and operate, and that they have a certain degree of stability. In a display, high-frequency signals drive the display; the video driver board receives these signals and drives the display, thereby controlling the refresh rate and image output. A stable connection and transmission of the high-frequency signal is a prerequisite for the normal operation of the display. Current display docking tests suffer from unstable docking and high-frequency signal instability, leading to display failures and test malfunctions. Utility Model Content

[0004] In order to solve the technical problem of unstable signal transmission leading to display screen test failure in the existing technology, one of the objectives of this utility model is to provide a display screen aging test cabinet.

[0005] One of the objectives of this utility model is achieved through the following technical solution: A display screen aging test cabinet, the display screen aging test cabinet includes a cabinet body, a test rack and a test integration component; The cabinet is equipped with a test chamber; The test fixture is disposed inside the test cavity and is used to support the fixture with the pre-installed display screen. The test integration component includes a drive mechanism and a test integration board. The test integration board is located inside the test cavity and above the signal integration board on the fixture. The drive mechanism is disposed inside the test cavity and is connected to the test integration board, driving the test integration board to move downward toward the signal integration board.

[0006] Optionally, the test integration component further includes a guide mechanism disposed within the test cavity, the test integration plate being slidably disposed on the guide mechanism, and the drive mechanism driving the test integration plate to move along the guide mechanism.

[0007] Optionally, the guiding mechanism includes a guide post and a docking plate, wherein the guide post is vertically disposed within the test chamber, and the docking plate is slidably disposed on the guide post; The number of test integration boards is at least one, the test integration boards are disposed on the docking plate, and the driving mechanism is connected to the docking plate to drive the docking plate to move.

[0008] Optionally, the test fixture is provided with several load-bearing layers distributed along the height direction, which are used to support the fixture. The number of the docking plates is several layers, and the docking plates are arranged in a one-to-one correspondence with the bearing layers; The test integration component also includes several support members, which are disposed between adjacent docking plates. The two ends of the support members are respectively connected to two adjacent docking plates to maintain the spacing between the docking plates and to ensure synchronous docking. The drive mechanism is connected to one of the docking plates.

[0009] Optionally, the bearing layer is provided with a limiting plate for restricting the position of the fixture, and the limiting plate is provided with a first positioning pin for positioning and cooperating with the fixture.

[0010] Optionally, the left and right sides of the bearing layer are provided with roller strips and limiting strips, the roller strips are located at the bottom of the fixture, and the limiting strips are located on the side of the fixture.

[0011] Optionally, the docking plate is provided with a downwardly extending floating connection mechanism, the floating connection mechanism including a connecting column and an elastic element, the lower end of the connecting column is connected to the test integrated plate, the upper end of the connecting column is slidably engaged with the docking plate, and one end of the elastic element abuts against the test integrated plate and the other end abuts against the docking plate.

[0012] Optionally, the test integrated board is provided with a downwardly extending connector positioning pin, which is positioned and engaged with the signal integrated board on the fixture; The docking plate is provided with a downwardly extending second positioning pin. The lower end of the second positioning pin is lower than the lower end of the joint positioning pin, and the second positioning pin is positioned and engaged with the fixture.

[0013] Optionally, the test chamber is provided with a temperature control component, which includes a hot air duct, a first fan, and a heater. The hot air duct has an air inlet and an air outlet. The first fan is located at the air inlet to pump air from the test chamber into the hot air duct. The heater is located inside the hot air duct and between the air inlet and the air outlet.

[0014] Optionally, the top of the cabinet is provided with an exhaust duct, one end of which is connected to the test chamber and the other end is connected to the outside. A second fan is provided inside the exhaust duct, and several air inlets are provided on the inner wall of the test chamber.

[0015] Compared with the prior art, the beneficial effects of this utility model are as follows: In this invention, a test rack supports a fixture inside the display screen aging test cabinet, and a test integrated component connects the display screen aging test cabinet to the fixture. A drive mechanism moves the test integrated board, aligning it with the signal integrated board on the fixture, thus achieving rapid docking. The test and signal integrated boards are arranged side-by-side, with their high-frequency pins and signal contacts connected via a connector. This connection maintains the stability of high-frequency signal connection and transmission during testing and aging, improving testing speed, accuracy, and stability, and effectively preventing display screen testing failures due to unstable signal transmission. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the display screen aging test cabinet of this utility model; Figure 2 This is an exploded view of the display screen aging test cabinet of this utility model; Figure 3 This is a schematic diagram of the test rack and test integration components in the display screen aging test cabinet of this utility model; Figure 4 This is an exploded view of the test rack and test integration components in the display screen aging test cabinet of this utility model; Figure 5 This is a structural schematic diagram of the test integrated component in the display screen aging test cabinet of this utility model, viewed from an upward angle. Figure 6 for Figure 5 A magnified view of a local area A in the middle.

[0017] Explanation of reference numerals in the attached diagram: 1. Cabinet; 11. Hot air duct; 12. Exhaust duct; 2. Test frame; 21. Bearing layer; 22. Limiting plate; 23. First positioning pin; 24. Roller strip; 25. Limiting strip; 3. Test integration components; 31. Drive mechanism; 32. Test integration board; 321. Connector positioning pin; 33. Guide column; 34. Docking plate; 341. Floating connection mechanism; 342. Second positioning pin; 35. Support component; 36. Mounting plate. Detailed Implementation

[0018] The following will refer to the appendices in the embodiments of this application. Figure 1 To be continued Figure 6 The technical solutions in the embodiments of this application are clearly and completely described. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0019] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of this application are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indication will also change accordingly.

[0020] Furthermore, the use of terms such as "first" and "second" in this application is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed in this application.

[0021] like Figure 1-3 The illustration shows a display screen aging test cabinet used for display screen testing and aging tests. In this invention, the fixture is equipped with a signal integration board for test docking and signal output. The display screen is mounted on the fixture, and the fixture is then fed into the display screen aging test cabinet, which can dock with the fixture to perform testing and aging tests. The display screen aging test cabinet includes a cabinet body 1, a test rack 2, and a test integration component 3.

[0022] Cabinet 1 contains a test chamber. The front of cabinet 1 has a main door assembly for opening and closing the test chamber; this assembly can be opened when a loading fixture is needed. Test rack 2 is located inside the test chamber and is used to support a fixture pre-installed with a display screen. Test integration assembly 3 includes a drive mechanism 31 and a test integration board 32. The test integration board 32 is located inside the test chamber and faces the signal integration board on the fixture. The test integration board 32 is positioned above the signal integration board, and its bottom has downward-extending high-frequency pins. The upper surface of the signal integration board has signal contacts. The drive mechanism 31 is located inside the test chamber, connected to the test integration board 32, and drives the test integration board 32 to move downwards towards the signal integration board.

[0023] In this invention, a fixture supports the display screen inside the display screen aging test cabinet to ensure its stability during placement. A test rack 2 supports the fixture, and a test integration component 3 connects the display screen aging test cabinet to the fixture. A drive mechanism 31 moves the test integration board 32, aligning it with the signal integration board on the fixture. This allows for rapid connection between the test integration board and the signal integration board, arranged side-by-side with the fixture. The high-frequency pins and signal contacts of the two boards are connected, enabling rapid and stable transmission of high-frequency signals. This invention uses a connector to connect the display screen and the test rack 2, maintaining stable signal connection and transmission during testing and aging tests. This improves testing speed, stability, and accuracy, effectively preventing display screen testing failures due to signal transmission issues.

[0024] In some further embodiments of test integration component 3, such as Figure 4 , Figure 5 As shown, the test integration component 3 also includes a guiding mechanism, which is disposed within the test cavity. The test integration board 32 is slidably disposed on the guiding mechanism, and the driving mechanism 31 drives the test integration board 32 to move along the guiding mechanism. The guiding mechanism guides the test integration board 32 to move stably and accurately, making it easier and more accurate for the test integration board 32 to interface with the signal integration board, thereby improving the stability of signal transmission.

[0025] Specifically, the guiding mechanism includes a guide post 33 and a docking plate 34. The guide post 33 is vertically disposed within the test chamber and located on the back of the test frame 2, and the docking plate 34 is slidably disposed on the guide post 33. The number of test integration plates 32 is at least one, and the number of test integration plates 32 may be one, two, three, four, or more. Figure 6 Four test integrated plates 32 are provided on the intermediate docking plate 34. Preferably, two guide pillars 33 are provided, arranged side-by-side inside the test chamber, with their tops and bottoms abutting against the cabinet 1 and fixedly connected to the cabinet 1 by fasteners. The docking plate 34 and the two guide pillars 33 are in a sliding engagement. For example, a flange sleeve is slidably fitted onto the guide pillar 33, and the docking plate 34 is fixedly connected to the flange sleeve, thus allowing the docking plate 34 to slide and move through the flange sleeve and guide pillars 33. The test integrated plates 32 are mounted on the docking plate 34, and a drive mechanism 31 is connected to the docking plate 34 to drive its movement.

[0026] In addition, the top and bottom of the guide post 33 are provided with mounting plates 36, the guide post 33 is connected to the mounting plates 36, and the mounting plates 36 are connected to the inner wall of the test chamber.

[0027] The drive mechanism 31 can be a cylinder, a push rod, or a linear motor.

[0028] In some embodiments of test fixture 2, such as Figures 3 to 5 As shown, the test fixture 2 has several layers of support layers 21 distributed along the height direction, each used to support the fixture. The number of mating plates 34 is several layers, and the mating plates 34 are arranged in a one-to-one correspondence with the support layers 21.

[0029] The test integration component 3 also includes several support members 35, which are disposed between adjacent mating plates 34. Each end of a support member 35 is connected to two adjacent mating plates 34 to maintain the spacing between the mating plates 34 and ensure synchronous mating. A drive mechanism 31 is connected to one of its mating plates 34. Figure 5 As shown, the drive mechanism 31 is located on the bottom docking plate 34. The drive mechanism 31 is connected to the bottom docking plate 34 and transmits power upward through the docking plate 34 and the support member.

[0030] In this way, the load-bearing capacity of the fixture can be expanded on test rack 2, increasing the number of inspections and aging tests.

[0031] Meanwhile, multiple test racks 2 and corresponding sets of test integration components 3 can be set inside the cabinet 1, which can further increase the number of inspection and aging tests.

[0032] The load-bearing layer 21 can be a frame formed by connecting crossbars, or it can be a shelf structure set on the test frame 2.

[0033] Furthermore, such as Figure 4 As shown, on the test fixture 2, the front side is the material inlet / outlet side, and the back side is the side where the test integrated assembly 3 is installed. A limiting plate 22 is provided on the support layer 21 to restrict the position of the fixture. Specifically, the limiting plate 22 is located near the back side, positioning the fixture at a specific position between the front and back sides. The limiting plate 22 has a first positioning pin 23 for engaging with the fixture. When the fixture is pushed into the moving position, the fixture aligns with the first positioning pin 23 on the limiting plate 22, thus allowing for precise positioning of the fixture via the first positioning pin 23.

[0034] In addition, roller strips 24 and limiting strips 25 are provided on the left and right sides of the support layer 21. The roller strips 24 are located at the bottom of the fixture, and the limiting strips 25 are located on the sides of the fixture. The fixture is inserted from the front of the support layer 21 and moves towards the back on the roller strips 24 until the fixture abuts against the limiting plate 22. At the same time, as the fixture moves, the fiber strips also restrict and guide the movement of the fixture from both sides.

[0035] In some embodiments of the mating plate 34, such as Figure 4 , Figure 5As shown, the docking plate 34 is provided with a downwardly extending floating connection mechanism 341. The floating connection mechanism 341 includes a connecting post and an elastic element. The lower end of the connecting post is connected to the test integrated plate 32, and the upper end of the connecting post is slidably engaged with the docking plate 34. One end of the elastic element abuts against the test integrated plate 32, and the other end abuts against the docking plate 34. The test integrated plate 32 is slidably engaged with the docking plate 34 through the connecting post. When the test integrated plate 32 docks with the signal integrated plate, the test integrated plate 32 can retract with the help of the connecting post, which can avoid hard impact between the test integrated plate and the signal integrated plate and buffer the impact during docking. In addition, the elastic element can maintain appropriate pressure between the test integrated plate 32 and the signal integrated plate, preventing loosening during testing and improving the stability of signal transmission during detection and aging tests.

[0036] The elastic element is specifically a compression spring, which is sleeved on the connecting post.

[0037] In addition, the test integrated board 32 and the signal integrated board are connected via probes and contacts to achieve signal transmission and power supply. For example... Figure 5 , Figure 6 As shown, the test integrated board 32 is provided with a downwardly extending connector positioning pin 321, which engages with the signal integrated board on the fixture to improve the accuracy of docking. The docking plate 34 is provided with a downwardly extending second positioning pin 342, which engages with the fixture. The lower end of the second positioning pin 342 is lower than the lower part of the test integrated board 32. When the docking plate 34 moves downward, the second positioning pin 342 positions itself before the connector positioning pin 321. The docking plate 34 is first precisely positioned with the fixture by the second positioning pin 342, and then the test integrated board 32 and the signal integrated board are positioned, forming a multi-level positioning, which improves the accuracy of docking between different components during docking.

[0038] In some embodiments of the cabinet 1, a temperature control component is provided inside the test chamber. This component includes a hot air duct 11, a first fan, and a heater. The hot air duct 11 has an inlet and an outlet. The first fan is located at the inlet to pump air from the test chamber into the hot air duct 11. The heater is located inside the hot air duct 11, between the inlet and outlet. Thus, the temperature of the cabinet 1 can be controlled by the temperature control component to perform testing and aging tests at different operating temperatures. When the first fan operates, air enters the hot air duct 11 from the test chamber through the inlet. After being heated by the heater inside the duct 11, the air is discharged into the test chamber from the outlet, thereby increasing the temperature of the test chamber.

[0039] Of course, in addition to the heating structure, the cabinet 1 also has a corresponding cooling structure. The top of the cabinet 1 has an exhaust duct 12, one end of which connects to the test chamber and the other end to the outside. A second fan is installed inside the exhaust duct 12, and several air inlets are located on the inner wall of the test chamber. When the exhaust fan is working, the warmer air inside the test chamber is drawn into the exhaust duct 12 and discharged to the outside. Simultaneously, the cabinet 1 draws in air through the air inlets, thereby lowering the temperature inside the test chamber.

[0040] The above embodiments are merely preferred embodiments of this utility model and should not be construed as limiting the scope of protection of this utility model. Any non-substantial changes and substitutions made by those skilled in the art based on this utility model shall fall within the scope of protection claimed by this utility model.

Claims

1. A display screen aging test cabinet, characterized in that, The display screen aging test cabinet includes a cabinet, a test rack, and integrated test components; The cabinet is equipped with a test chamber; The test fixture is disposed inside the test cavity and is used to support the fixture with the pre-installed display screen. The test integration component includes a drive mechanism and a test integration board. The test integration board is located inside the test cavity and above the signal integration board on the fixture. The drive mechanism is disposed inside the test cavity and is connected to the test integration board, driving the test integration board to move downward toward the signal integration board.

2. The display screen aging test cabinet as described in claim 1, characterized in that, The test integration component also includes a guide mechanism disposed within the test cavity, the test integration plate being slidably disposed on the guide mechanism, and the drive mechanism driving the test integration plate to move along the guide mechanism.

3. The display screen aging test cabinet as described in claim 2, characterized in that, The guiding mechanism includes a guide post and a docking plate. The guide post is vertically disposed within the test chamber, and the docking plate is slidably disposed on the guide post. The number of test integration boards is at least one, the test integration boards are disposed on the docking plate, and the driving mechanism is connected to the docking plate to drive the docking plate to move.

4. The display screen aging test cabinet as described in claim 3, characterized in that, The test fixture is provided with several load-bearing layers distributed along the height direction, which are used to support the fixture. The number of the docking plates is several layers, and the docking plates are arranged in a one-to-one correspondence with the bearing layers; The test integration component also includes several support members, which are disposed between adjacent docking plates. The two ends of the support members are respectively connected to two adjacent docking plates to maintain the spacing between the docking plates and to ensure synchronous docking. The drive mechanism is connected to one of the docking plates.

5. The display screen aging test cabinet as described in claim 4, characterized in that, The bearing layer is provided with a limiting plate for restricting the position of the fixture, and the limiting plate is provided with a first positioning pin for positioning and cooperating with the fixture.

6. The display screen aging test cabinet as described in claim 4, characterized in that, The bearing layer is provided with roller strips and limiting strips on the left and right sides. The roller strips are located at the bottom of the fixture, and the limiting strips are located on the side of the fixture.

7. The display screen aging test cabinet as described in claim 3, characterized in that, The docking plate is provided with a downwardly extending floating connection mechanism, which includes a connecting column and an elastic element. The lower end of the connecting column is connected to the test integration plate, and the upper end of the connecting column is slidably engaged with the docking plate. One end of the elastic element abuts against the test integration plate, and the other end abuts against the docking plate.

8. The display screen aging test cabinet as described in claim 5, characterized in that, The test integration board is provided with a downwardly extending connector positioning pin, which is positioned and engaged with the signal integration board on the fixture. The docking plate is provided with a downwardly extending second positioning pin. The lower end of the second positioning pin is lower than the lower end of the joint positioning pin, and the second positioning pin is positioned and engaged with the fixture.

9. The display screen aging test cabinet as described in claim 1, characterized in that, The test chamber is equipped with a temperature control component, which includes a hot air duct, a first fan, and a heater. The hot air duct has an air inlet and an air outlet. The first fan is located at the air inlet to pump air from the test chamber into the hot air duct. The heater is located inside the hot air duct and between the air inlet and the air outlet.

10. The display screen aging test cabinet as described in claim 1, characterized in that, The top of the cabinet is equipped with an exhaust duct, one end of which is connected to the test chamber and the other end is connected to the outside. A second fan is installed inside the exhaust duct, and several air inlets are provided on the inner wall of the test chamber.

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