A high voltage impulse tester with multiple outputs

Abstract

The utility model provides a kind of high voltage turn-to-turn impulse tester with multiple output, it is related to motor measurement and control technical field, comprising: multiple output tester, the upper portion of multiple output tester is equipped with display panel and control panel, three multiple partition test benches are fixedly connected in the upper portion of the test bench of multiple output tester, and multiple output tester is equipped with three groups of test wiring port, test wire can be automatically retracted to the inside of partition wire slot and hidden under the stretching of traction wheel, improve the neatness of test area, can avoid the situation that wiring knot, confusion or even misconnection is caused due to wiring too long, solve the problem that if simultaneously test multiple groups of experimental devices, it will increase wire consumption, wiring station wiring confusion can lead to wiring knot, entanglement, increase the difficulty of wiring station arrangement, reduce aesthetic appearance, it will increase the incidence of wiring error, affect test result, it is not conducive to the implementation and accurate record of test.

Description

Technical Field

[0001] This utility model relates to the field of motor measurement and control technology, and in particular to a high-voltage inter-turn impact tester with multiple outputs. Background Technology

[0002] The high-voltage inter-turn impulse tester is a specialized device for testing the inter-turn insulation quality of motor and transformer windings. It generates a multi-kilovolt adjustable pulse voltage through a high-voltage pulse generator and applies it to the winding under test. An oscilloscope is used to capture and compare the damped oscillation waveforms of different windings. When there are defects such as inter-turn short circuits, open circuits, or poor insulation in the winding, the abnormal impedance will cause waveform distortion or attenuation differences, thereby quickly identifying the fault point. It is widely used for safety testing in the manufacturing and maintenance of motors, power tools, and transformers.

[0003] When using existing high-voltage inter-turn impulse testers, if multiple sets of experimental devices are tested simultaneously, the amount of wires used will increase. The messy wiring on the wiring dock will lead to knots and tangles, increasing the difficulty of tidying up the wiring dock, reducing its aesthetics, increasing the incidence of wiring errors, affecting the test results, and hindering the implementation and accurate recording of the test. Utility Model Content

[0004] This invention provides a high-voltage inter-turn impulse tester with multiple outputs to solve the problems of existing high-voltage inter-turn impulse testers, which increase the amount of wires used when testing multiple sets of experimental devices at the same time. The messy wiring on the terminal block can lead to knots and tangles, increasing the difficulty of tidying up the terminal block, reducing its aesthetics, increasing the incidence of wiring errors, affecting test results, and hindering the implementation and accurate recording of tests.

[0005] This utility model provides a high-voltage inter-turn impulse tester with multiple outputs, specifically including: a multi-output tester, a display panel and a control panel on the top of the multi-output tester, three multi-section test benches fixedly connected above the test bench of the multi-output tester, the multi-output tester having three sets of test wiring ports, the three sets of test wiring ports being located behind the three multi-section test benches respectively, and a section wire groove fixedly connected to each of the two sides inside the multi-section test bench, with test wires passing through the section wire grooves, and test electrical clamps fixedly connected to the ends of the test wires.

[0006] Furthermore, the partitioned cable tray has a wiring inlet and a wiring outlet on the side facing the center of the multi-way partitioned test bench. The test wires are passed into the partitioned cable tray through the wiring inlet and out through the wiring outlet.

[0007] Furthermore, a disc-shaped wire clamp limiting end plate is fixedly connected to the tail end of the test electrical clamp.

[0008] Furthermore, a reversing support shaft is rotatably connected inside the partitioned groove, and the reversing support shaft is located inside the wiring inlet hole. A shrinking rotating shaft is rotatably connected inside the partitioned groove, and the shrinking rotating shaft is located inside the wiring outlet hole.

[0009] Furthermore, an inner guide rod is fixedly connected to the front end of the upper and lower surfaces inside the partition groove.

[0010] Furthermore, a built-in pull plate is slidably connected inside the partition groove, and pull plate grooves are respectively opened on the upper and lower edges of the built-in pull plate, and the two pull plate grooves are slidably connected to two inner guide rods respectively.

[0011] Furthermore, a pull wheel is rotatably connected to the rear of the built-in pull plate, and the pull wheel is tactilely connected to the test lead wire. A reset spring is fixedly connected to the front of the built-in pull plate, and the front end of the reset spring is fixedly connected to the front end of the partition groove.

[0012] This invention provides a high-voltage inter-turn impulse tester with multiple outputs, which has the following advantages:

[0013] The high-voltage inter-turn impulse tester of this utility model is equipped with multiple sets of multi-channel partition test benches, which can simultaneously test multiple devices. The partition test benches can also achieve partition separation, which can avoid wiring confusion and crossover during device testing, improve test accuracy and efficiency, and facilitate test recording.

[0014] In addition, an automatic partitioned cable management function is provided. Each multi-channel partitioned test bench has partitioned cable slots to store two test cables respectively. During the test, the test cable hidden inside the partitioned cable slot is pulled out, and the two ends of the device under test are connected to the two test ports of the output circuit of the impact tester through the test electrical clamp and the test cable, thus connecting the device under test to the tester. At this time, the test cable extending out of the partitioned cable slot is taut under the tension of the pull wheel. After the test is completed, the test electrical clamp is separated from the end of the device under test, and the test cable can automatically retract into the partitioned cable slot under the tension of the pull wheel for hiding, improving the cleanliness of the test area and avoiding the situation of knotted, messy or even incorrectly connected cables due to excessively long cables. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings of the embodiments will be briefly described below.

[0016] The accompanying drawings described below are only related to some embodiments of the present invention and are not intended to limit the scope of the present invention.

[0017] In the attached diagram:

[0018] Figure 1A schematic diagram of the overall structure of this application is shown;

[0019] Figure 2 A schematic diagram of the structure of the multi-channel partition test bench of this application is shown;

[0020] Figure 3 This invention provides a schematic diagram of the internal structure of the partition groove.

[0021] Figure 4 A schematic diagram of the structure of the pull wheel of this application is shown;

[0022] Figure 5 This paper shows a schematic diagram of the structure of the test lead during contraction.

[0023] Figure 6 This application shows Figure 3 A magnified structural diagram of point A in the middle;

[0024] Figure 7 This application shows Figure 4 A magnified structural diagram of point B in the middle.

[0025] Figure label:

[0026] 1. Multi-output tester; 2. Display panel; 3. Control panel; 4. Multi-channel zoned test bench; 5. Zoned cable tray; 501. Wiring inlet hole; 502. Wiring outlet hole; 503. Reversing support shaft; 504. Retraction shaft; 505. Inner guide rod; 6. Test lead wire; 7. Test electrical clamp; 701. Clamp limiting end plate; 8. Built-in pull plate; 801. Pull plate slide groove; 802. Pull wheel; 803. Reset spring. Detailed Implementation

[0027] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the described embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0028] Example 1: Please refer to Figures 1 to 7 :

[0029] This utility model proposes a high-voltage inter-turn impulse tester with multiple outputs, comprising: a multi-output tester 1, a display panel 2 and a control panel 3 on the top of the multi-output tester 1, three multi-section test benches 4 fixedly connected to the top of the test bench of the multi-output tester 1, the multi-output tester 1 having three sets of test wiring ports, the three sets of test wiring ports being located behind the three multi-section test benches 4 respectively, a section wire groove 5 fixedly connected to each of the two sides inside the multi-section test benches 4, test wires 6 passing through the section wire grooves 5, and test electrical clips 7 fixedly connected to the ends of the test wires 6; among the three sets of test wiring ports of the multi-output tester 1... Each group of test wiring ports has a test lead 6 plugged into its input and output terminals. The ends of the test leads 6 are electrically connected to test clips 7. When testing the device under test, the two test clips 7 from the same group of test wiring ports are clamped to the metal parts of the test terminals of the device under test, so that the device under test is connected to the test instrument. The multi-output tester 1 is turned on through the control panel 3 and the test parameters are set, and the device under test can be tested. The test data and results are displayed through the display panel 2. The setting of three multi-channel partition test benches 4 realizes the partition separation function in the test process, which can avoid the phenomenon of wiring confusion and crossover during device testing.

[0030] In this embodiment, the partitioned cable tray 5 has a wiring inlet 501 and a wiring outlet 502 on the side facing the center of the multi-channel partitioned test bench 4. The test wire 6 enters the partitioned cable tray 5 through the wiring inlet 501 and exits through the wiring outlet 502. The partitioned cable tray 5 hides the test wire 6, concealing the excessively long part of the test wire 6, and avoiding the excessively long test wire 6 from getting tangled or knotted, which would cause the multi-channel partitioned test bench 4 to become messy.

[0031] In this embodiment of the present disclosure, a disc-shaped wire clamp limiting end plate 701 is fixedly connected to the tail end of the test electrical clamp 7; by setting the wire clamp limiting end plate 701, the test wire 6 can be prevented from being completely hidden into the partition wire groove 5 under the action of tension.

[0032] In this embodiment, a reversing support shaft 503 is rotatably connected inside the partitioned wire groove 5. The reversing support shaft 503 is located inside the wiring inlet hole 501. A shrinking shaft 504 is rotatably connected inside the partitioned wire groove 5. The shrinking shaft 504 is located inside the wiring outlet hole 502. The reversing support shaft 503 and the shrinking shaft 504 serve as reversing supports, improving the flexibility of the test lead 6 in extending and retracting inside the partitioned wire groove 5.

[0033] In Example 2, based on Example 1, an inner guide rod 505 is fixedly connected to the front end of the upper and lower surfaces inside the partitioned wire groove 5, respectively. An internal pull plate 8 is slidably connected inside the partitioned wire groove 5. Pull plate grooves 801 are opened on the upper and lower edges of the internal pull plate 8, and the two pull plate grooves 801 are slidably connected to the two inner guide rods 505, respectively. A pull wheel 802 is rotatably connected to the rear of the internal pull plate 8. The pull wheel 802 is slidably connected to the test lead 6. A reset spring 803 is fixedly connected to the front of the internal pull plate 8. The front end of the reset spring 803 is fixedly connected to the front end inside the partitioned wire groove 5. Under normal conditions, the internal pull plate 8 is pulled forward by the reset spring 803, the test lead 6 passes through the pull wheel 802, and the test lead 6 is stretched, so that the test lead 6 is in a taut state. This pulls the excessively long test lead 6 and hides it inside the partitioned wire groove 5, improving the cleanliness of the test area and avoiding wiring knots, confusion, or even misconnections due to excessive wiring length.

[0034] The working principle of this embodiment is as follows: First, when testing the device under test (DUT), three DUTs are placed on three multi-channel partition test benches 4. Two test electrical clips 7, led out from the same group of test wiring ports, are respectively clamped to the metal parts of the test terminals of the DUTs, thus connecting the DUTs with the test instrument. The multi-channel output tester 1 is turned on through the control panel 3 and the test parameters are set, and the DUTs can be tested. The test data and results are displayed through the display panel 2. During the test, the test wires 6 hidden inside the partition wire groove 5 are pulled out. The two ends of the DUTs are connected to the two test ports of the output circuit of the impact tester through the test electrical clips 7 and the test wires 6, thus connecting the DUTs with the test instrument. At this time, the test wires 6 extending out of the partition wire groove 5 are taut under the tension of the pull wheel 802. After the test is completed, the test electrical clips 7 are separated from the ends of the DUTs. The test wires 6 can automatically retract into the partition wire groove 5 under the tension of the pull wheel 802 to hide, avoiding tangling and mess due to excessive wiring length.

[0035] The following points should be noted in this article:

[0036] 1. The accompanying drawings of the embodiments disclosed herein only relate to the structures involved in the embodiments disclosed herein; other structures can be referred to in general design.

[0037] 2. Where there is no conflict, the embodiments of this disclosure and the features in the embodiments can be combined with each other to obtain new embodiments.

[0038] The above are merely specific embodiments of this disclosure, but the scope of protection of this disclosure is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this disclosure should be included within the scope of protection of this disclosure. Therefore, the scope of protection of this disclosure should be determined by the scope of the claims.

Claims

1. A high-voltage inter-turn impulse tester with multiple outputs, comprising: A multi-output tester (1) is provided with a display panel (2) and a control panel (3) on its top. The multi-output tester (1) is characterized in that three multi-partition test benches (4) are fixedly connected above the test bench of the multi-output tester (1). The multi-output tester (1) is provided with three sets of test wiring ports. The three sets of test wiring ports are located behind the three multi-partition test benches (4). A partition cable groove (5) is fixedly connected to each of the two sides inside the multi-partition test bench (4). Test wires (6) are passed through the partition cable groove (5). Test electrical clips (7) are fixedly connected to the end of the test wires (6).

2. The high-voltage inter-turn impulse tester with multiple outputs according to claim 1, characterized in that, The partitioned cable tray (5) has a wiring inlet (501) and a wiring outlet (502) on the side facing the center of the multi-way partitioned test bench (4). The test wire (6) is passed into the partitioned cable tray (5) through the wiring inlet (501) and passes out through the wiring outlet (502).

3. The high-voltage inter-turn impulse tester with multiple outputs according to claim 1, characterized in that, The tail end of the test electrical clamp (7) is fixedly connected to a disc-shaped wire clamp limiting end plate (701).

4. A high-voltage inter-turn impulse tester with multiple outputs according to claim 1, characterized in that, The partition groove (5) is rotatably connected to a reversing support shaft (503), which is located inside the wiring inlet hole (501). The partition groove (5) is rotatably connected to a shrinking shaft (504), which is located inside the wiring outlet hole (502).

5. A high-voltage inter-turn impulse tester with multiple outputs according to claim 4, characterized in that, An inner guide rod (505) is fixedly connected to the front end of the upper and lower surfaces inside the partition groove (5).

6. A high-voltage inter-turn impulse tester with multiple outputs according to claim 5, characterized in that, The partition groove (5) is slidably connected to a built-in pull plate (8). The upper and lower edges of the built-in pull plate (8) are respectively provided with pull plate grooves (801), and the two pull plate grooves (801) are respectively slidably connected to two inner guide rods (505).

7. A high-voltage inter-turn impulse tester with multiple outputs according to claim 6, characterized in that, The rear of the built-in pull plate (8) is rotatably connected to a pull wheel (802), which is tumbled to connect to the test wire (6). The front of the built-in pull plate (8) is fixedly connected to a reset spring (803), and the front end of the reset spring (803) is fixedly connected to the front end of the partition groove (5).

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